MX26LV160ATTC-70_技术文档

MX26LV160AT/AB

Macronix NBit^TMMemory Family

16M-BIT [2Mx8/1Mx16] CMOS SINGLE VOLTAGE

3V ONLY BOOT SECTOR HIGH SPEED eLiteFlash^TMMEMORY

FEATURES

• Extended single - supply voltage range 3.0V to 3.6V

• 2,097,152 x 8 / 1,048,576 x 16 switchable

• Singlepowersupplyoperation

-Providesahardwaremethodofdetectingprogramor

eraseoperationcompletion

• Sectorprotection

- 3.0V only operation for read, erase and program

operation

• Fast access time: 55/70ns

- Hardware method to disable any combination of

sectors from program or erase operations

-Temporarysectorunprotectallowscodechangesin

previously locked sectors

• Lowpowerconsumption

- 30mA maximum active current

- 30uA typical standby current

• CFI (Common Flash Interface) compliant

- Flash device parameters stored on the device and

provide the host system to access

• 2K minimum erase/program cycles

• Latch-up protected to 100mA from -1V to VCC+1V

• Boot Sector Architecture

- T = Top Boot Sector

- B = Bottom Boot Sector

• Package type:

• Commandregisterarchitecture

- Byte/word Programming (55us/70us typical)

- Sector Erase (Sector structure 16K-Bytex1,

8K-Bytex2, 32K-Bytex1, and 64K-Byte x31)

• Auto Erase (chip & sector) and Auto Program

-Automaticallyeraseanycombinationofsectorswith

erase verify capability

- Automatically program and verify data at specified

address

- 44-pin SOP

- 48-pin TSOP

• Status Reply

- 48-ball CSP

- Data# polling & Toggle bit for detection of program

anderaseoperationcompletion

• Ready/Busy# pin (RY/BY#)

• Compatibility with JEDEC standard

- Pinout and software compatible with single-power

supply Flash

• 20 years data retention

GENERAL DESCRIPTION

The MX26LV160AT/AB is a 16-mega bit high speed Flash

memory organized as 2M bytes of 8 bits or 1M words of

16 bits. MXIC's high speed Flash memories offer the

most cost-effective and reliable read/write non-volatile

random access memory. The MX26LV160AT/AB is pack-

aged in 44-pin SOP, 48-pinTSOP, and 48-ball CSP. It is

designed to be reprogrammed and erased in system or

in standard EPROM programmers.

lows for 100% TTL level control inputs and fixed power

supply levels during erase and programming, while main-

taining maximum EPROM compatibility.

MXIC high speed Flash technology reliably stores

memory contents even after 2K erase and program

cycles. The MXIC cell is designed to optimize the erase

and programming mechanisms. In addition, the combi-

nation of advanced tunnel oxide processing and low in-

ternal electric fields for erase and program operations

produces reliable cycling. The MX26LV160AT/AB uses

a 3.0V~3.6VVCC supply to perform the High Reliability

Erase and auto Program/Erase algorithms.

The standard MX26LV160AT/AB offers access time as

fast as 55ns, allowing operation of high-speed micropro-

cessors without wait states. To eliminate bus conten-

tion, the MX26LV160AT/AB has separate chip enable

(CE#) and output enable (OE#) controls.

The highest degree of latch-up protection is achieved

with MXIC's proprietary non-epi process. Latch-up pro-

tection is proved for stresses up to 100 milliamperes on

address and data pin from -1V to VCC + 1V.

MXIC's high speed Flash memories augment EPROM

functionality with in-circuit electrical erasure and program-

ming. The MX26LV160AT/AB uses a command register

to manage this functionality. The command register al-

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1

MX26LV160AT/AB

PIN CONFIGURATIONS

PIN DESCRIPTION

SYMBOL PIN NAME

44 SOP

44

43

42

41

40

39

38

37

36

35

34

33

32

31

30

29

28

27

26

25

24

23

WE#

A19

A8

RESET#

2

3

4

A18

A17

A7

A0~A19

Address Input

A9

Q0~Q14 Data Input/Output

5

A10

A11

A12

A13

A14

A15

A16

BYTE#

GND

Q15/A-1

Q7

Q14

Q6

Q13

Q5

Q12

Q4

VCC

A6

6

A5

Q15/A-1

CE#

Q15(Word mode)/LSB addr(Byte mode)

7

A4

8

A3

Chip Enable Input

9

A2

10

11

12

13

14

15

16

17

18

19

20

21

22

A1

A0

CE#

GND

OE#

Q0

Q8

Q1

Q9

Q2

WE#

Write Enable Input

BYTE#

Word/Byte Selection input

RESET# Hardware Reset Pin

OE#

Output Enable Input

Ready/Busy Output

Power Supply Pin (3.0V~3.6V)

Ground Pin

RY/BY#

VCC

Q10

Q3

Q11

GND

48 TSOP (Standard Type) (12mm x 20mm)

A15

A14

A13

A12

A11

A10

A9

1

48

47

46

45

44

43

42

41

40

39

38

37

36

35

34

33

32

31

30

29

28

27

26

25

A16

BYTE#

GND

Q15/A-1

Q7

2

3

4

5

6

Q14

Q6

7

A8

8

Q13

Q5

A19

NC

9

10

11

12

13

14

15

16

17

18

19

20

21

22

23

24

Q12

Q4

WE#

RESET#

NC

VCC

Q11

Q3

MX26LV160AT/AB

NC

RY/BY#

A18

A17

A7

Q10

Q2

Q9

Q1

A6

Q8

A5

Q0

A4

OE#

GND

CE#

A0

A3

A2

A1

48-Ball CSP Ball Pitch = 0.8 mm,Top View, Balls Facing Down

A

B

C

D

E

F

G

H

6

5

4

3

2

1

A13

A9

A12

A8

A14

A10

NC

A18

A6

A15

A11

A19

NC

A5

A16

Q7

Q5

Q2

Q0

A0

BYTE# Q15/A-1 GND

Q14

Q12

Q10

Q8

Q13

Vcc

Q11

Q9

Q6

Q4

WE# RESET#

RY/BY#

A7

NC

A17

A4

Q3

Q1

A3

A2

A1

CE#

OE#

GND

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2

MX26LV160AT/AB

BLOCK STRUCTURE

TABLE 1: MX26LV160AT SECTOR ARCHITECTURE

Sector

Sector Size

Address range

Sector Address

Byte Mode Word Mode Byte Mode(x8) Word Mode(x16) A19 A18 A17 A16 A15 A14 A13 A12

SA0

SA1

SA2

SA3

SA4

SA5

SA6

SA7

SA8

SA9

64Kbytes

32Kwords 000000-00FFFF 00000-07FFF

32Kwords 010000-01FFFF 08000-0FFFF

32Kwords 020000-02FFFF 10000-17FFF

32Kwords 030000-03FFFF 18000-1FFFF

32Kwords 040000-04FFFF 20000-27FFF

32Kwords 050000-05FFFF 28000-2FFFF

32Kwords 060000-06FFFF 30000-37FFF

32Kwords 070000-07FFFF 38000-3FFFF

32Kwords 080000-08FFFF 40000-47FFF

32Kwords 090000-09FFFF 48000-4FFFF

32Kwords 0A0000-0AFFFF 50000-57FFF

32Kwords 0B0000-0BFFFF 58000-5FFFF

32Kwords 0C0000-0CFFFF 60000-67FFF

32Kwords 0D0000-0DFFFF 68000-6FFFF

32Kwords 0E0000-0EFFFF 70000-77FFF

32Kwords 0F0000-0FFFFF 78000-7FFFF

32Kwords 100000-10FFFF 80000-87FFF

32Kwords 110000-11FFFF 88000-8FFFF

32Kwords 120000-12FFFF 90000-97FFF

32Kwords 130000-13FFFF 98000-9FFFF

32Kwords 140000-14FFFF A0000-A7FFF

32Kwords 150000-15FFFF A8000-AFFFF

32Kwords 160000-16FFFF B0000-B7FFF

32Kwords 170000-17FFFF B8000-BFFFF

32Kwords 180000-18FFFF C0000-C7FFF

32Kwords 190000-19FFFF C8000-CFFFF

32Kwords 1A0000-1AFFFF D0000-D7FFF

32Kwords 1B0000-1BFFFF D8000-DFFFF

32Kwords 1C0000-1CFFFF E0000-E7FFF

32Kwords 1D0000-1DFFFF E8000-EFFFF

32Kwords 1E0000-1EFFFF F0000-F7FFF

16Kwords 1F0000-1F7FFF F8000-FBFFF

4Kwords 1F8000-1F9FFF FC000-FCFFF

4Kwords 1FA000-1FBFFF FD000-FDFFF

8Kwords 1FC000-1FFFFF FE000-FFFFF

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

X

0

X

0

X

0

SA10 64Kbytes

SA11 64Kbytes

SA12 64Kbytes

SA13 64Kbytes

SA14 64Kbytes

SA15 64Kbytes

SA16 64Kbytes

SA17 64Kbytes

SA18 64Kbytes

SA19 64Kbytes

SA20 64Kbytes

SA21 64Kbytes

SA22 64Kbytes

SA23 64Kbytes

SA24 64Kbytes

SA25 64Kbytes

SA26 64Kbytes

SA27 64Kbytes

SA28 64Kbytes

SA29 64Kbytes

SA30 64Kbytes

SA31 32Kbytes

SA32

SA33

8Kbytes

1

0

1

SA34 16Kbytes

1

X

Note:Byte mode:address range A19:A-1, word mode:address range A19:A0.

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3

MX26LV160AT/AB

TABLE 2: MX26LV160AB SECTOR ARCHITECTURE

Sector

Sector Size

Address range

Sector Address

Byte Mode Word Mode Byte Mode (x8) Word Mode (x16) A19 A18 A17 A16 A15 A14 A13 A12

SA0

SA1

SA2

SA3

SA4

SA5

SA6

SA7

SA8

SA9

16Kbytes

8Kbytes

8Kwords 000000-003FFF 00000-01FFF

4Kwords 004000-005FFF 02000-02FFF

4Kwords 006000-007FFF 03000-03FFF

16Kwords 008000-00FFFF 04000-07FFF

32Kwords 010000-01FFFF 08000-0FFFF

32Kwords 020000-02FFFF 10000-17FFF

32Kwords 030000-03FFFF 18000-1FFFF

32Kwords 040000-04FFFF 20000-27FFF

32Kwords 050000-05FFFF 28000-2FFFF

32Kwords 060000-06FFFF 30000-37FFF

32Kwords 070000-07FFFF 38000-3FFFF

32Kwords 080000-08FFFF 40000-47FFF

32Kwords 090000-09FFFF 48000-4FFFF

32Kwords 0A0000-0AFFFF 50000-57FFF

32Kwords 0B0000-0BFFFF 58000-5FFFF

32Kwords 0C0000-0CFFFF 60000-67FFF

32Kwords 0D0000-0DFFFF 68000-6FFFF

32Kwords 0E0000-0EFFFF 70000-77FFF

32Kwords 0F0000-0FFFFF 78000-7FFFF

32Kwords 100000-10FFFF 80000-87FFF

32Kwords 110000-11FFFF 88000-8FFFF

32Kwords 120000-12FFFF 90000-97FFF

32Kwords 130000-13FFFF 98000-9FFFF

32Kwords 140000-14FFFF A0000-A7FFF

32Kwords 150000-15FFFF A8000-AFFFF

32Kwords 160000-16FFFF B0000-B7FFF

32Kwords 170000-17FFFF B8000-BFFFF

32Kwords 180000-18FFFF C0000-C7FFF

32Kwords 190000-19FFFF C8000-CFFFF

32Kwords 1A0000-1AFFFF D0000-D7FFF

32Kwords 1B0000-1BFFFF D8000-DFFFF

32Kwords 1C0000-1CFFFF E0000-E7FFF

32Kwords 1D0000-1DFFFF E8000-EFFFF

32Kwords 1E0000-1EFFFF F0000-FFFFF

32Kwords 1F0000-1FFFFF F8000-FFFFF

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

X

0

8Kbytes

0

1

32Kbytes

64Kbytes

1

X

SA10 64Kbytes

SA11 64Kbytes

SA12 64Kbytes

SA13 64Kbytes

SA14 64Kbytes

SA15 64Kbytes

SA16 64Kbytes

SA17 64Kbytes

SA18 64Kbytes

SA19 64Kbytes

SA20 64Kbytes

SA21 64Kbytes

SA22 64Kbytes

SA23 64Kbytes

SA24 64Kbytes

SA25 64Kbytes

SA26 64Kbytes

SA27 64Kbytes

SA28 64Kbytes

SA29 64Kbytes

SA30 64Kbytes

SA31 64Kbytes

SA32 64Kbytes

SA33 64Kbytes

SA34 64Kbytes

Note:Byte mode:address range A19:A-1, word mode:address range A19:A0.

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REV. 1.1, NOV. 18, 2004

4

MX26LV160AT/AB

BLOCK DIAGRAM

WRITE

CE#

OE#

WE#

CONTROL

INPUT

PROGRAM/ERASE

STATE

HIGH VOLTAGE

MACHINE

RESET#

LOGIC

(WSM)

STATE

REGISTER

FLASH

ADDRESS

LATCH

ARRAY

A0-A19

SOURCE

HV

AND

COMMAND

DATA

BUFFER

Y-PASS GATE

DECODER

PGM

DATA

HV

SENSE

AMPLIFIER

COMMAND

DATA LATCH

PROGRAM

DATA LATCH

I/O BUFFER

Q0-Q15/A-1

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REV. 1.1, NOV. 18, 2004

5

MX26LV160AT/AB

provides the erase verification, and counts the number of

sequences. A status bit toggling between consecutive

read cycles provides feedback to the user as to the sta-

tus of the erasing operation.

AUTOMATIC PROGRAMMING

The MX26LV160AT/AB is word/byte programmable us-

ing the Automatic Programming algorithm. The Auto-

matic Programming algorithm makes the external sys-

tem do not need to have time out sequence nor to verify

the data programmed.

Register contents serve as inputs to an internal state-

machine which controls the erase and programming cir-

cuitry. During write cycles, the command register inter-

nally latches address and data needed for the program-

ming and erase operations. During a system write cycle,

addresses are latched on the falling edge, and data are

latched on the rising edge of WE# or CE#, whichever

happens first.

AUTOMATIC PROGRAMMING ALGORITHM

MXIC's Automatic Programming algorithm requires the

user to only write program set-up commands (including

2 unlock write cycle and A0H) and a program command

(program data and address). The device automatically

times the programming pulse width, provides the pro-

gram verification, and counts the number of sequences.

A status bit similar to DATA# polling and a status bit

toggling between consecutive read cycles, provide feed-

back to the user as to the status of the programming

operation.Refer to write operation status, table 7, for more

information on these status bits.

MXIC's high speed Flash technology combines years of

EPROM experience to produce the highest levels of

quality, reliability, and cost effectiveness. The

MX26LV160AT/AB electrically erases all bits simulta-

neously using Fowler-Nordheim tunneling. The bytes are

programmed by using the EPROM programming mecha-

nism of hot electron injection.

During a program cycle, the state-machine will control

the program sequences and command register will not

respond to any command set. After the state machine

has completed its task, it will allow the command regis-

ter to respond to its full command set.

AUTOMATIC CHIP ERASE

The entire chip is bulk erased using 10 ms erase pulses

according to MXIC's Automatic Chip Erase algorithm.

The Automatic Erase algorithm automatically programs

the entire array prior to electrical erase. The timing and

verification of electrical erase are controlled internally

within the device.

AUTOMATIC SELECT

The auto select mode provides manufacturer and de-

vice identification, protection verification, through identi-

fier codes output on Q7~Q0.This mode is mainly adapted

for programming equipment on the device to be pro-

grammed with its programming algorithm.When program-

ming by high voltage method, automatic select mode re-

quires VID (11V to 12V) on address pin A9 and other

address pin A6, A1 and A0 as referring to Table 3. In

addition, to access the automatic select codes in-sys-

tem, the host can issue the automatic select command

through the command register without requiring VID, as

shown in table 4.

AUTOMATIC SECTOR ERASE

The MX26LV160AT/AB is sector(s) erasable using MXIC's

Auto Sector Erase algorithm. The Automatic Sector

Erase algorithm automatically programs the specified

sector(s) prior to electrical erase. The timing and verifi-

cation of electrical erase are controlled internally within

the device. An erase operation can erase one sector,

multiple sectors, or the entire device.

To verify whether or not sector being protected, the sec-

tor address must appear on the appropriate highest order

address bit (seeTable 1 andTable 2).The rest of address

bits, as shown inTable 3, are don't care. Once all neces-

sary bits have been set as required, the programming

equipment may read the corresponding identifier code on

Q7~Q0.

AUTOMATIC ERASE ALGORITHM

MXIC's Automatic Erase algorithm requires the user to

write commands to the command register using stan-

dard microprocessor write timings. The device will auto-

matically pre-program and verify the entire array. Then

the device automatically times the erase pulse width,

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6

MX26LV160AT/AB

TABLE 3. MX26LV160AT/AB AUTO SELECT MODE OPERATION

A19 A11 A9 A8 A6 A5 A1 A0

Description

Mode CE# OE# WE#

|

A7

X

|

A2

X

Q15~Q0

A12 A10

Manufacturer Code

L

H

X

VID

L

C2H

Read Device ID

Word

Byte

Word

X

H

22C4H

XXC4H

2249H

XX49H

XX01H

Silicon (Top Boot Block)

X

ID

Device ID

X

(Bottom Boot Block) Byte

X

Sector Protection Verification

L

H

SA

X

VID

X

L

X

H

L

(protected)

XX00H

(unprotected)

NOTE:SA=Sector Address, X=Don't Care, L=Logic Low, H=Logic High

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7

MX26LV160AT/AB

in the improper sequence will reset the device to the

read mode. Table 5 defines the valid register command

sequences.

COMMAND DEFINITIONS

Device operations are selected by writing specific ad-

dress and data sequences into the command register.

Writing incorrect address and data values or writing them

TABLE 4. MX26LV160AT/AB COMMAND DEFINITIONS

First Bus

Bus Cycle

Cycle Addr Data Addr

XXXH F0H

RA RD

Second Bus Third Bus

Fourth Bus

Cycle

Fifth Bus

Cycle

Sixth Bus

Cycle

Command

Cycle

Data Addr

Data Addr Data

Addr

Data Addr Data

Reset

1

Read

1

Read Silicon ID Word

Byte

4

555H AAH 2AAH 55H 555H 90H ADI DDI

AAAH AAH 555H 55H AAAH 90H ADI DDI

555H AAH 2AAH 55H 555H 90H (SA) XX00H

x02H XX01H

Sector Protect

Verify

Word

Byte

4

AAAH AAH 555H 55H AAAH 90H (SA) 00H

x04H 01H

Program

Word

Byte

Word

Byte

Word

Byte

Word

Byte

4

6

1

555H AAH 2AAH 55H 555H A0H PA

AAAH AAH 555H 55H AAAH A0H PA

PD

Chip Erase

Sector Erase

CFI Query

555H AAH 2AAH 55H 555H 80H 555H AAH

AAAH AAH 555H 55H AAAH 80H AAAH AAH

555H AAH 2AAH 55H 555H 80H 555H AAH

AAAH AAH 555H 55H AAAH 80H AAAH AAH

555H 98

2AAH 55H

555H 55H

2AAH 55H

555H 55H

555H 10H

AAAH 10H

SA

30H

AAAH 98

Note:

1. ADI = Address of Device identifier; A1=0, A0 = 0 for manufacturer code,A1=0, A0 = 1 for device code. A2-A19=do not care.

(Refer to table 3)

DDI = Data of Device identifier : C2H for manufacture code, 22DA/DA(Top), and 225B/5B(Bottom) for device code.

X = X can be VIL or VIH

RA=Address of memory location to be read.

RD=Data to be read at location RA.

2. PA = Address of memory location to be programmed.

PD = Data to be programmed at location PA.

SA = Address of the sector.

3. The system should generate the following address patterns: 555H or 2AAH to Address A10~A0 in word mode/AAAH or

555H to Address A10~A-1 in byte mode.

Address bit A11~A19=X=Don't care for all address commands except for Program Address (PA) and Sector Address (SA).

Write Sequence may be initiated with A11~A19 in either state.

4. For Sector Protect Verify operation: If read out data is 01H, it means the sector has been protected. If read out data is 00H, it

means the sector is still not being protected.

5. Any number of CFI data read cycles are permitted.

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8

MX26LV160AT/AB

COMMAND DEFINITIONS

Device operations are selected by writing specific address and data sequences into the command register. Writing

incorrect address and data values or writing them in the improper sequence will reset the device to the read mode.

Table 5 defines the valid register command sequences.

TABLE 5. MX26LV160AT/AB BUS OPERATION

ADDRESS

Q8~Q15

DESCRIPTION

CE# OE# WE# RE- A19 A11 A9 A8 A6 A5 A1 A0 Q0~Q7 BYTE BYTE

SET# A12 A10

A7

A2

=VIH

=VIL

Read

L

H

AIN

Dout

Dout Q8~Q14

=High Z

Q15=A-1

DIN

Write

L

X

H

X

H

X

L

X

H

X

H

L

AIN

X

DIN(3)

Reset

High Z High Z High Z

Output Disable

Standby

L

H

X

Vcc±

0.3V

L

Vcc±

0.3V

X

Sector Protect

Chip Unprotect

Sector Protection

Verify

H

L

VID

H

SA

X

L

H

L

X

H

L

DIN

X

L

H

SA X VID X

CODE(5)

NOTES:

1. Manufacturer and device codes may also be accessed via a command register write sequence. Refer to Table 4.

2. VID is the Silicon-ID-Read high voltage, 11V to 12V.

3. Refer to Table 5 for valid Data-In during a write operation.

4. X can be VIL or VIH.

5. Code=00H/XX00H means unprotected.

Code=01H/XX01H means protected.

6. A19~A12=Sector address for sector protect.

7. The sector protect and chip unprotect functions may also be implemented via programming equipment.

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9

MX26LV160AT/AB

Characteristics" section contains timing specification

table and timing diagrams for write operations.

REQUIREMENTS FOR READING ARRAY

DATA

To read array data from the outputs, the system must

drive the CE# and OE# pins to VIL. CE# is the power

control and selects the device. OE# is the output control

and gates array data to the output pins.WE# should re-

main at VIH.

STANDBY MODE

When using both pins of CE# and RESET#, the device

enter CMOS Standby with both pins held atVCC ±0.3V.

If CE# and RESET# are held at VIH, but not within the

range ofVCC ±0.3V, the device will still be in the standby

mode, but the standby current will be larger.During Auto

Algorithm operation,Vcc active current (Icc2) is required

even CE# = "H" until the operation is completed. The

device can be read with standard access time (tCE) from

either of these standby modes, before it is ready to read

data.

The internal state machine is set for reading array data

upon device power-up, or after a hardware reset. This

ensures that no spurious alteration of the memory con-

tent occurs during the power transition. No command is

necessary in this mode to obtain array data. Standard

microprocessor read cycles that assert valid address on

the device address inputs produce valid data on the de-

vice data outputs. The device remains enabled for read

access until the command register contents are altered.

OUTPUT DISABLE

With the OE# input at a logic high level (VIH), output

from the devices are disabled.This will cause the output

pins to be in a high impedance state.

WRITE COMMANDS/COMMAND SEQUENCES

To program data to the device or erase sectors of memory

, the system must drive WE# and CE# to VIL, and OE#

to VIH.

RESET# OPERATION

The "Word/byte Program Command Sequence" section

has details on programming data to the device.

The RESET# pin provides a hardware method of reset-

ting the device to reading array data.When the RESET#

pin is driven low for at least a period of tRP, the device

immediately terminates any operation in progress, tri-

states all output pins, and ignores all read/write com-

mands for the duration of the RESET# pulse. The de-

vice also resets the internal state machine to reading

array data.The operation that was interrupted should be

reinitiated once the device is ready to accept another

command sequence, to ensure data integrity

An erase operation can erase one sector, multiple sec-

tors , or the entire device. Table indicates the address

space that each sector occupies. A "sector address"

consists of the address bits required to uniquely select a

sector.The "Writing specific address and data commands

or sequences into the command register initiates device

operations. Table 1 defines the valid register command

sequences.Writing incorrect address and data values or

writing them in the improper sequence resets the device

to reading array data. Section has details on erasing a

sector or the entire chip.

Current is reduced for the duration of the RESET# pulse.

When RESET# is held at VSS±0.3V, the device draws

CMOS standby current (ICC4).If RESET# is held atVIL

but not within VSS±0.3V, the standby current will be

greater.

After the system writes the autoselect command se-

quence, the device enters the autoselect mode.The sys-

tem can then read autoselect codes from the internal

register (which is separate from the memory array) on

Q7-Q0. Standard read cycle timings apply in this mode.

Refer to the Autoselect Mode and Autoselect Command

Sequence section for more information.

The RESET# pin may be tied to system reset circuitry.

A system reset would that also reset the high speed

Flash, enabling the system to read the boot-up firmware

from the high speed Flash.

ICC2 in the DC Characteristics table represents the ac-

tive current specification for the write mode. The "AC

If RESET# is asserted during a program or erase opera-

tion, the RY/BY# pin remains a "0" (busy) until the inter-

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10

MX26LV160AT/AB

nal reset operation is complete, which requires a time of

tREADY (during Embedded Algorithms).The system can

thus monitor RY/BY# to determine whether the reset

operation is complete. If RESET# is asserted when a

program or erase operation is completed within a time of

tREADY (not during Embedded Algorithms). The sys-

tem can read data tRH after the RESET# pin returns to

VIH.

"set-up" command 80H. Two more "unlock" write cycles

are then followed by the chip erase command 10H or

sector erase command 30H.

The Automatic Chip Erase does not require the device

to be entirely pre-programmed prior to executing the Au-

tomatic Chip Erase. Upon executing the Automatic Chip

Erase, the device will automatically program and verify

the entire memory for an all-zero data pattern. When the

device is automatically verified to contain an all-zero

pattern, a self-timed chip erase and verify begin. The

erase and verify operations are completed when the data

on Q7 is "1" at which time the device returns to the

Read mode. The system is not required to provide any

control or timing during these operations.

Refer to the AC Characteristics tables for RESET#

parameters and to Figure 21 for the timing diagram.

READ/RESET COMMAND

The read or reset operation is initiated by writing the

read/reset command sequence into the command reg-

ister. Microprocessor read cycles retrieve array data.

The device remains enabled for reads until the command

register contents are altered.

When using the Automatic Chip Erase algorithm, note

that the erase automatically terminates when adequate

erase margin has been achieved for the memory array

(no erase verification command is required).

If program-fail or erase-fail happen, the write of F0H will

reset the device to abort the operation. A valid com-

mand must then be written to place the device in the

desired state.

If the Erase operation was unsuccessful, the data on

Q5 is "1" (see Table 7), indicating the erase operation

exceed internal timing limit.

The automatic erase begins on the rising edge of the

last WE# or CE# pulse, whichever happens first in the

command sequence and terminates when the data on

Q7 is "1" at which time the device returns to the Read

mode, or the data on Q6 stops toggling for two consecu-

tive read cycles at which time the device returns to the

Read mode.

SILICON-ID READ COMMAND

High speed Flash memories are intended for use in ap-

plications where the local CPU alters memory contents.

As such, manufacturer and device codes must be ac-

cessible while the device resides in the target system.

PROM programmers typically access signature codes

by raising A9 to a high voltage (VID). However, multi-

plexing high voltage onto address lines is not generally

desired system design practice.

The MX26LV160AT/AB contains a Silicon-ID-Read op-

eration to supple traditional PROM programming meth-

odology. The operation is initiated by writing the read

silicon ID command sequence into the command regis-

ter.

SET-UP AUTOMATIC CHIP/SECTOR ERASE

COMMANDS

Chip erase is a six-bus cycle operation. There are two

"unlock" write cycles. These are followed by writing the

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MX26LV160AT/AB

TABLE 6. SILICON ID CODE

Pins

A0

A1 Q15~Q8 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Code (Hex)

Manufacture code Word VIL VIL 00H

Byte VIL VIL

Word VIH VIL 22H

for MX26LV160AT Byte VIH VIL

Device code Word VIH VIL 22H

for MX26LV160AB Byte VIH VIL

1

0

1

0

1

0

1

0

1

0

1

0

00C2H

X

C2H

Device code

22C4H

X

C4H

2249H

X

49H

Sector Protection

Verification

Word X

Byte X

VIH X

01H (Protected)

00H (Unprotected)

READING ARRAY DATA

RESET COMMAND

The device is automatically set to reading array data

after device power-up.No commands are required to re-

trieve data.The device is also ready to read array data

after completing an Automatic Program or Automatic

Erase algorithm.

Writing the reset command to the device resets the de-

vice to reading array data.Address bits are don't care for

this command.

The reset command may be written between the se-

quence cycles in an erase command sequence before

erasing begins. This resets the device to reading array

data.Once erasure begins, however, the device ignores

reset commands until the operation is complete.

The system must issue the reset command to re-en-

able the device for reading array data if Q5 goes high, or

while in the "read silicon-ID" and "sector protect verify"

mode. See the "Reset Command" section, next.

The reset command may be written between the se-

quence cycles in a program command sequence before

programming begins. This resets the device to reading

array data Once programming begins, however, the de-

vice ignores reset commands until the operation is com-

plete.

The reset command may be written between the se-

quence cycles in an SILICON ID READ command se-

quence.Once in the SILICON ID READ mode, the reset

command must be written to return to reading array data.

If Q5 goes high during a program or erase operation, writ-

ing the reset command returns the device to read-ing

array data.

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MX26LV160AT/AB

address and data are written next, which in turn initiate

the Embedded Program algorithm.The system is not re-

quired to provide further controls or timings.The device

automatically generates the program pulses and verifies

the programmed cell margin.Table 1 shows the address

and data requirements for the word/byte program com-

mand sequence.

SECTOR ERASE COMMANDS

The Automatic Sector Erase does not require the de-

vice to be entirely pre-programmed prior to executing

the Automatic Sector Erase Set-up command and Au-

tomatic Sector Erase command. Upon executing the

Automatic Sector Erase command, the device will auto-

matically program and verify the sector(s) memory for

an all-zero data pattern. The system is not required to

provide any control or timing during these operations.

When the Embedded Program algorithm is complete, the

device then returns to reading array data and addresses

are no longer latched. The system can determine the

status of the program operation by using Q7, Q6, or RY/

BY#.See "Write Operation Status" for information on these

status bits.

When the sector(s) is automatically verified to contain

an all-zero pattern, a self-timed sector erase and verify

begin. The erase and verify operations are complete

when either the data on Q7 is "1" at which time the de-

vice returns to the Read mode, or the data on Q6 stops

toggling for two consecutive read cycles at which time

the device returns to the Read mode. The system is not

required to provide any control or timing during these

operations.

Any commands written to the device during the Embed-

ded Program Algorithm are ignored.Note that a hardware

reset immediately terminates the programming operation.

The word/byte Program command sequence should be

reinitiated once the device has reset to reading array

data, to ensure data integrity.

When using the Automatic sector Erase algorithm, note

that the erase automatically terminates when adequate

erase margin has been achieved for the memory array

(no erase verification command is required). Sector

erase is a six-bus cycle operation. There are two "un-

lock" write cycles. These are followed by writing the

set-up command 80H. Two more "unlock" write cycles

are then followed by the sector erase command 30H.

The sector address is latched on the falling edge of WE#

or CE#, whichever happens later, while the command

(data) is latched on the rising edge of WE# or CE#,

whichever happens first. Sector addresses selected are

loaded into internal register on the sixth falling edge of

WE# or CE#, whichever happens later. Each succes-

sive sector load cycle started by the falling edge of WE#

or CE#, whichever happens later must begin within 50us

from the rising edge of the preceding WE# or CE#, which-

ever happens first. Otherwise, the loading period ends

and internal auto sector erase cycle starts. (Monitor Q3

to determine if the sector erase timer window is still open,

see section Q3, Sector EraseTimer.) Any command other

than Sector Erase (30H) during the time-out period re-

sets the device to read mode.

Programming is allowed in any sequence and across

sector boundaries. A bit cannot be programmed from a

"0" back to a "1". Attempting to do so may halt the op-

eration and set Q5 to "1", or cause the Data# Polling

algorithm to indicate the operation was successful.How-

ever, a succeeding read will show that the data is still

"0". Only erase operations can convert a "0" to a "1".

WRITE OPERATION STATUS

The device provides several bits to determine the sta-

tus of a write operation: Q2, Q3, Q5, Q6, Q7, and RY/

BY#.Table 7 and the following subsections describe the

functions of these bits.Q7, RY/BY#, and Q6 each offer a

method for determining whether a program or erase op-

eration is complete or in progress. These three bits are

discussed first.

Q7: Data# Polling

The Data# Polling bit, Q7, indicates to the host system

whether an Automatic Algorithm is in progress or com-

pleted. Data# Polling is valid after the rising edge of the

final WE# pulse in the program or erase command se-

quence.

WORD/BYTE PROGRAM COMMAND SEQUENCE

The device programs one byte of data for each program

operation. The command sequence requires four bus

cycles, and is initiated by writing two unlock write cycles,

followed by the program set-up command.The program

During the Automatic Program algorithm, the device out-

puts on Q7 the complement of the datum programmed to

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13

MX26LV160AT/AB

Q7.When the Automatic Program algorithm is complete,

the device outputs the datum programmed to Q7. The

system must provide the program address to read valid

status information on Q7.

gram or Erase algorithm is in progress or complete. Toggle

Bit I may be read at any address, and is valid after the

rising edge of the final WE# or CE#, whichever happens

first, in the command sequence (prior to the program or

erase operation), and during the sector time-out.

During the Automatic Erase algorithm, Data# Polling pro-

duces a "0" on Q7.When the Automatic Erase algorithm

is complete, Data# Polling produces a "1" on Q7.This is

analogous to the complement/true datum out-put de-

scribed for the Automatic Program algorithm: the erase

function changes all the bits in a sector to "1" prior to

this, the device outputs the "complement," or "0". The

system must provide an address within any of the sec-

tors selected for erasure to read valid status information

on Q7.

During an Automatic Program or Erase algorithm opera-

tion, successive read cycles to any address cause Q6

to toggle. The system may use either OE# or CE# to

control the read cycles.When the operation is complete,

Q6 stops toggling.

When the device is actively erasing (that is, the Auto-

matic Erase algorithm is in progress), Q6 toggling.How-

ever, the system must also use Q2 to determine which

sectors are erasing. Alternatively, the system can use

Q7.

After an erase command sequence is written, if all sec-

tors selected for erasing are protected, Data# Polling on

Q7 is active for approximately 100 us, then the device

returns to reading array data. If not all selected sectors

are protected, the Automatic Erase algorithm erases the

unprotected sectors, and ignores the selected sectors

that are protected.

Q6 stops toggling once the Automatic Program algorithm

is complete.

Table 7 shows the outputs for Toggle Bit I on Q6.

When the system detects Q7 has changed from the

complement to true data, it can read valid data at Q7-Q0

on the following read cycles. This is because Q7 may

change asynchronously with Q0-Q6 while Output Enable

(OE#) is asserted low.

Q2:Toggle Bit II

The "Toggle Bit II" on Q2, when used with Q6, indicates

whether a particular sector is actively erasing (that is,

the Automatic Erase algorithm is in process).Toggle Bit

II is valid after the rising edge of the final WE# or CE#,

whichever happens first, in the command sequence.

RY/BY# : Ready/Busy

Q2 toggles when the system reads at addresses within

those sectors that have been selected for erasure. (The

system may use either OE# or CE# to control the read

cycles.) But Q2 cannot distinguish when the sector is

actively erasing or is in Erase Suspend. Q6, by com-

parison, indicates when the device is actively erasing

but cannot distinguish which sectors are selected for era-

sure. Thus, both status bits are required for sectors and

mode information. Refer to Table 7 to compare outputs

for Q2 and Q6.

The RY/BY# is a dedicated, open-drain output pin that

indicates whether an Automatic Erase/Program algorithm

is in progress or complete. The RY/BY# status is valid

after the rising edge of the final WE# or CE#, whichever

happens first, in the command sequence.Since RY/BY#

is an open-drain output, several RY/BY# pins can be tied

together in parallel with a pull-up resistor toVCC.

If the output is low (Busy), the device is actively erasing

or programming.If the output is high (Ready), the device

is ready to read array data, or is in the standby mode.

Reading Toggle Bits Q6/ Q2

Table 7 shows the outputs for RY/BY# during write op-

eration.

Whenever the system initially begins reading toggle bit

status, it must read Q7-Q0 at least twice in a row to

determine whether a toggle bit is toggling. Typically, the

system would note and store the value of the toggle bit

after the first read. After the second read, the system

would compare the new value of the toggle bit with the

Q6:Toggle BIT I

Toggle Bit I on Q6 indicates whether an Automatic Pro-

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14

MX26LV160AT/AB

first. If the toggle bit is not toggling, the device has com-

pleted the program or erase operation. The system can

read array data on Q7-Q0 on the following read cycle.

If this time-out condition occurs during the word/byte pro-

gramming operation, it specifies that the entire sector

containing that byte is bad and this sector may not be

reused, (other sectors are still functional and can be re-

used).

However, if after the initial two read cycles, the system

determines that the toggle bit is still toggling, the sys-

tem also should note whether the value of Q5 is high

(see the section on Q5). If it is, the system should then

determine again whether the toggle bit is toggling, since

the toggle bit may have stopped toggling just as Q5 went

high. If the toggle bit is no longer toggling, the device

has successfully completed the program or erase opera-

tion. If it is still toggling, the device did not complete the

operation successfully, and the system must write the

reset command to return to reading array data.

The time-out condition will not appear if a user tries to

program a non blank location without erasing.Please note

that this is not a device failure condition since the device

was incorrectly used.

The remaining scenario is that system initially determines

that the toggle bit is toggling and Q5 has not gone high.

The system may continue to monitor the toggle bit and

Q5 through successive read cycles, determining the sta-

tus as described in the previous paragraph. Alternatively,

it may choose to perform other system tasks. In this

case, the system must start at the beginning of the al-

gorithm when it returns to determine the status of the

operation.

Q5

ExceededTiming Limits

Q5 will indicate if the program or erase time has exceeded

the specified limits (internal pulse count). Under these

conditions Q5 will produce a "1". This time-out condition

indicates that the program or erase cycle was not suc-

cessfully completed. Data# Polling and Toggle Bit are

the only operating functions of the device under this con-

dition.

If this time-out condition occurs during sector erase op-

eration, it specifies that a particular sector is bad and it

may not be reused. However, other sectors are still func-

tional and may be used for the program or erase opera-

tion. The device must be reset to use other sectors.

Write the Reset command sequence to the device, and

then execute program or erase command sequence. This

allows the system to continue to use the other active

sectors in the device.

If this time-out condition occurs during the chip erase

operation, it specifies that the entire chip is bad or com-

bination of sectors are bad.

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MX26LV160AT/AB

TABLE 7. WRITE OPERATION STATUS

Status

Q7

Q6

Q5

(Note2)

0

Q3

Q2 RY/BY#

(Note1)

In Progress Word/Byte Program in Auto Program Algorithm

Q7# Toggle

N/A

No

0

Toggle

No

Auto Erase Algorithm

0

Toggle

0

1

0

Exceeded Word/Byte Program in Auto Program Algorithm

Time

Q7# Toggle

N/A

Toggle

Limits

Auto Erase Algorithm

0

Toggle

1

0

Note:

1. Q7 and Q2 require a valid address when reading status information.Refer to the appropriate subsection for further

details.

2. Q5 switches to '1' when an Auto Program or Auto Erase operation has exceeded the maximum timing limits.

See "Q5 : Exceeded Timing Limits" for more information.

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MX26LV160AT/AB

Q3

POWER SUPPLY DECOUPLING

Sector Erase Timer

In order to reduce power switching effect, each device

should have a 0.1uF ceramic capacitor connected be-

tween itsVCC and GND.

After the completion of the initial sector erase command

sequence, the sector erase time-out will begin. Q3 will

remain low until the time-out is complete. Data# Polling

andToggle Bit are valid after the initial sector erase com-

mand sequence.

POWER-UP SEQUENCE

The MX26LV160AT/AB powers up in the Read only mode.

In addition, the memory contents may only be altered

after successful completion of the predefined command

sequences.

If Data# Polling or the Toggle Bit indicates the device

has been written with a valid erase command, Q3 may

be used to determine if the sector erase timer window is

still open. If Q3 is high ("1") the internally controlled

erase cycle has begun; attempts to write subsequent

commands to the device will be ignored until the erase

operation is completed as indicated by Data# Polling or

Toggle Bit. If Q3 is low ("0"), the device will accept

additional sector erase commands. To insure the com-

mand has been accepted, the system software should

check the status of Q3 prior to and following each sub-

sequent sector erase command. If Q3 were high on the

second status check, the command may not have been

accepted.

TEMPORARY SECTOR UNPROTECT

This feature allows temporary unprotection of previously

protected sector to change data in-system.TheTempo-

rary Sector Unprotect mode is activated by setting the

RESET# pin to VID (11.5V-12.5V). During this mode,

formerly protected sectors can be programmed or erased

as un-protected sector. Once VID is remove from the

RESET# pin.All the previously protected sectors are pro-

tected again.

DATA PROTECTION

SECTOR PROTECTION

The MX26LV160AT/AB is designed to offer protection

against accidental erasure or programming caused by

spurious system level signals that may exist during power

transition. During power up the device automatically re-

sets the state machine in the Read mode. In addition,

with its control register architecture, alteration of the

memory contents only occurs after successful comple-

tion of specific command sequences. The device also

incorporates several features to prevent inadvertent write

cycles resulting fromVCC power-up and power-down tran-

sition or system noise.

The MX29LV160AT/AB features hardware sector protec-

tion. This feature will disable both program and erase

operations for these sectors protected. To activate this

mode, the programming equipment must force VID on

address pin A9 and OE# (suggestVID = 12V). Program-

ming of the protection circuitry begins on the falling edge

of the WE# pulse and is terminated on the rising edge.

Please refer to sector protect algorithm and waveform.

To verify programming of the protection circuitry, the pro-

gramming equipment must forceVID on address pin A9

( with CE# and OE# at VIL and WE# at VIH). When

A1=VIH, A0=VIL, A6=VIL, it will produce a logical "1"

code at device output Q0 for a protected sector. Other-

wise the device will produce 00H for the unprotected sec-

tor. In this mode, the addresses, except for A1, are don't

care. Address locations with A1 = VIL are reserved to

read manufacturer and device codes.(Read Silicon ID)

WRITE PULSE "GLITCH" PROTECTION

Noise pulses of less than 5ns(typical) on CE# or WE#

will not initiate a write cycle.

LOGICAL INHIBIT

It is also possible to determine if the sector is protected

in the system by writing a Read Silicon ID command.

Performing a read operation with A1=VIH, it will produce

a logical "1" at Q0 for the protected sector.

Writing is inhibited by holding any one of OE# = VIL,

CE# = VIH or WE# = VIH. To initiate a write cycle CE#

and WE# must be a logical zero while OE# is a logical

one.

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MX26LV160AT/AB

The system must write the reset command to exit the

"Silicon-ID Read Command" code.

CHIP UNPROTECT

TheMX29LV160AT/ABalsofeaturesthechipunprotect

mode, so that all sectors are unprotected after chip

unprotectiscompletedtoincorporateanychangesinthe

code. It is recommended to protect all sectors before

activating chip unprotect mode.

Toactivatethismode,theprogrammingequipmentmust

force VID on control pin OE# and address pin A9. The

CE# pinsmustbesetatVIL. PinsA6mustbesettoVIH.

Refer to chip unprotect algorithm and waveform for the

chip unprotect algorithm. The unprotection mechanism

begins on the falling edge of the WE# pulse and is

terminated on the rising edge.

It is also possible to determine if the chip is unprotected

in the system by writing the Read Silicon ID command.

PerformingareadoperationwithA1=VIH,itwillproduce

00H at data outputs(Q0-Q7) for an unprotected sector.

It is noted that all sectors are unprotected after the chip

unprotect algorithm is completed.

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MX26LV160AT/AB

ABSOLUTE MAXIMUM RATINGS

OPERATING RATINGS

StorageTemperature

Plastic Packages . . . . . . . . . . . . . ..... -65^oC to +150^oC

Commercial (C) Devices

Ambient Temperature (T^A). . . . . . . . . . . . 0° C to +70°C

AmbientTemperature

with Power Applied. . . . . . . . . . . . . .... -65^oC to +125^oC

Voltage with Respect to Ground

V^CCSupply Voltages

V^CCfor full voltage range. . . . . . . . . . . +3.0 V to 3.6 V

VCC (Note 1) . . . . . . . . . . . . . . . . . -0.5 V to +4.0 V

A9, OE#, and

Operating ranges define those limits between which the

functionality of the device is guaranteed.

RESET# (Note 2) . . . . . . . . . . . . . . . . -0.5 V to +12 V

All other pins (Note 1) . . . . . . . -0.5 V to VCC +0.5 V

Output Short Circuit Current (Note 3) . . . . . . 200 mA

Notes:

1. Minimum DC voltage on input or I/O pins is -0.5 V.

During voltage transitions, input or I/O pins may over-

shoot VSS to -2.0 V for periods of up to 20 ns. Maxi-

mum DC voltage on input or I/O pins is VCC +0.5 V.

During voltage transitions, input or I/O pins may over-

shoot to VCC +2.0 V for periods up to 20 ns.

2.Minimum DC input voltage on pins A9, OE#, and RE-

SET# is -0.5 V. During voltage transitions, A9, OE#,

and RESET# may overshoot VSS to -2.0 V for peri-

ods of up to 20 ns. Maximum DC input voltage on pin

A9 is +12V which may overshoot to 13.5V for periods

up to 20 ns.

3.No more than one output may be shorted to ground at

a time. Duration of the short circuit should not be

greater than one second.

Stresses above those listed under "Absolute Maximum

Ratings" may cause permanent damage to the device.

This is a stress rating only; functional operation of the

device at these or any other conditions above those in-

dicated in the operational sections of this data sheet is

not implied. Exposure of the device to absolute maxi-

mum rating conditions for extended periods may affect

device reliability.

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MX26LV160AT/AB

CAPACITANCE TA = 25^oC, f = 1.0 MHz

SYMBOL PARAMETER

MIN.

TYP

MAX.

8

UNIT

pF

CONDITIONS

VIN = 0V

CIN1

CIN2

COUT

Input Capacitance

Control Pin Capacitance

Output Capacitance

12

pF

VIN = 0V

12

pF

VOUT = 0V

TABLE 8. DC CHARACTERISTICS TA = 0^oC to 70^oC, VCC = 3.0V~3.6V

MX26LV160AT/AB

Symbol PARAMETER

MIN.

TYP

± 1

MAX.

± 3

UNIT

uA

CONDITIONS

ILI

Input Leakage Current

VIN = VSS to VCC

VCC=VCC max;

A9=12V

ILIT

A9 Input Leakage Current

Output Leakage Current

VCC Active Read Current

35

200

uA

ILO

± 1

uA

VOUT = VSS to VCC,

VCC=VCC max

ICC1

20

8

30

14

mA

uA

CE#=VIL,

OE#=VIH

@5MHz

@1MHz

ICC2

ICC3

ICC4

VCC Active write Current

VCC Standby Current

During Reset

26

30

CE#=VIL, OE#=VIH

100

CE#; RESET#=VCC ±0.3V

RESET#=VSS ± 0.3V

uA

VIL

VIH

VID

Input Low Voltage (Note 1)

Input HighVoltage

-0.5

0.7xVCC

11

0.8

VCC+0.3

12

V

Voltage for Automatic Select

andTemporary Sector Unprotect

Output LowVoltage

VCC=3.3V

VOL

0.45

V

IOL = 4.0mA,

VCC= VCC min

IOH = -2mA,

VOH1

VOH2

Output HighVoltage (TTL)

0.85xVCC

VCC-0.4

VCC=VCC min

IOH = -100uA, VCC min

Output HighVoltage

(CMOS)

NOTES:

1. VIL min. = -1.0V for pulse width is equal to or less than 50 ns.

VIL min. = -2.0V for pulse width is equal to or less than 20 ns.

2. VIH max. = VCC + 1.5V for pulse width is equal to or less than 20 ns

If VIH is over the specified maximum value, read operation cannot be guaranteed.

3. Automatic sleep mode enable the low power mode when addresses remain stable for tACC +30ns.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

20

MX26LV160AT/AB

AC CHARACTERISTICS TA = 0^oC to 70^oC, VCC = 3.0V~3.6V

TABLE 9. READ OPERATIONS

26LV160AT/AB-55 26LV160AT/AB-70

SYMBOLPARAMETER

MIN.

MAX. MIN.

MAX. UNIT CONDITIONS

tRC

Read CycleTime (Note 1)

Address to Output Delay

CE# to Output Delay

55

70

ns

tACC

tCE

55

25

70

30

25

ns

CE#=OE#=VIL

OE#=VIL

tOE

tDF

OE# to Output Delay

CE#=VIL

OE# High to Output Float (Note1)

0

25

0

CE#=VIL

tOEH

Output

Read

0

Enable

Toggle and

Data# Polling

10

HoldTime

tOH

Address to Output hold

0

ns

CE#=OE#=VIL

NOTE:

1. Not 100% tested.

2. tDF is defined as the time at which the output achieves

the open circuit condition and data is no longer driven.

TEST CONDITIONS:

• Input pulse levels: 0V/3.0V.

• Input rise and fall times is equal to or less than 5ns.

• Outputload:1TTLgate+100pF(Includingscopeand

jig),for26LV160AT/AB-70.1TTL gate+30pF(Includ-

ing scope and jig) for 26LV160AT/AB-55.

• Reference levels for measuring timing: 1.5V.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

21

MX26LV160AT/AB

SWITCHING TEST CIRCUITS

DEVICE UNDER

TEST

2.7K ohm

+3.3V

CL

6.2K ohm

DIODES=IN3064

OR EQUIVALENT

CL= 100pF Including jig capacitance for MX26LV160T/B-70

(30pF for MX26LV160T/B-55)

SWITCHING TEST WAVEFORMS

3.0V

TEST POINTS

0V

INPUT

OUTPUT

AC TESTING: Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0".

Input pulse rise and fall times are < 5ns.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

22

MX26LV160AT/AB

FIGURE 1. READ TIMING WAVEFORMS

tRC

VIH

ADD Valid

Addresses

VIL

tACC

tCE

VIH

CE#

VIL

VIH

WE#

VIL

tOE

tDF

tOEH

VIH

OE#

VIL

tACC

tOH

HIGH Z

VOH

VOL

Outputs

DATA Valid

VIH

VIL

RESET#

P/N:PM1123

REV. 1.1, NOV. 18, 2004

23

MX26LV160AT/AB

AC CHARACTERISTICS TA = 0^oC to 70^oC, VCC = 3.0V~3.6V

TABLE 10. Erase/Program Operations

26LV160AT/AB-55

26LV160AT/AB-70

SYMBOL

tWC

PARAMETER

MIN.

55

0

MAX.

MIN.

70

0

MAX.

UNIT

ns

Write Cycle Time (Note 1)

Address Setup Time

tAS

ns

tAH

Address Hold Time

45

35

0

45

35

0

ns

tDS

Data Setup Time

ns

tDH

Data Hold Time

ns

tOES

tGHWL

Output Enable Setup Time

Read Recovery Time Before Write

(OE# High to WE# Low)

CE# Setup Time

0

ns

0

ns

tCS

0

ns

us

tCH

CE# Hold Time

0

tWP

Write Pulse Width

35

30

35

30

tWPH

tWHWH1

Write Pulse Width High

ProgrammingOperation(Note2)

(Byte/Wordprogramtime)

Sector Erase Operation (Note 2)

VCC Setup Time (Note 1)

Recovery Time from RY/BY#

Program/Erase Valid to RY/BY# Delay

Write pulse width for sector

protect (A9, OE# Control)

Write pulse width for sector

unprotect (A9, OE# Control)

Voltage transition time

OE# setup time to WE# active

Sector Address Load Time

55/70(TYP.)

tWHWH2

tVCS

2.4(TYP.)

sec

us

50

0

50

0

tRB

ns

tBUSY

tWPP1

90

10us(typ.) 100ns

90

ns

100ns

10us(typ.)

tWPP2

12ms(typ.) 100ns

12ms(typ.)

tVLHT

tOESP

tBAL

4

us

4

50

NOTES:

1. Not 100% tested.

2. See the "Erase and Programming Performance" section for more information.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

24

MX26LV160AT/AB

AC CHARACTERISTICS TA = 0^oC to 70^oC, VCC = 3.0V~3.6V

TABLE 11. Alternate CE# Controlled Erase/Program Operations

26LV160AT/AB-55

26LV160AT/AB-70

SYMBOL

tWC

PARAMETER

MIN.

MAX.

MIN.

MAX.

UNIT

ns

Write Cycle Time (Note 1)

Address SetupTime

Address HoldTime

Data SetupTime

55

70

tAS

0

ns

tAH

45

ns

tDS

35

ns

tDH

Data HoldTime

0

ns

tOES

tGHEL

tWS

Output Enable SetupTime

Read RecoveryTime Before Write

WE# SetupTime

0

ns

0

ns

0

ns

tWH

WE# HoldTime

0

ns

tCP

CE# PulseWidth

35

ns

tCPH

tWHWH1

CE# Pulse Width High

30

ns

Programming

Byte

55(Typ.)

70(Typ.)

2.4(Typ.)

55(Typ.)

70(Typ.)

2.4(Typ.)

us

Operation(note2)

Word

us

tWHWH2

Sector Erase Operation (note2)

sec

NOTE:

1. Not 100% tested.

2. See the "Erase and Programming Performance" section for more information.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

25

MX26LV160AT/AB

FIGURE 2. COMMAND WRITE TIMING WAVEFORM

VCC

3V

VIH

VIL

Addresses

ADD Valid

tAH

tAS

VIH

VIL

WE#

CE#

tOES

tWPH

tWP

tCWC

VIH

VIL

tCS

tCH

tDH

VIH

VIL

OE#

Data

tDS

VIH

VIL

DIN

P/N:PM1123

REV. 1.1, NOV. 18, 2004

26

MX26LV160AT/AB

AUTOMATIC PROGRAMMING TIMING WAVEFORM

ing after automatic programming starts. Device outputs

DATA# during programming and DATA# after program-

ming on Q7. (Q6 is for toggle bit; see toggle bit, DATA#

polling, timing waveform)

One byte data is programmed. Verify in fast algorithm

and additional verification by external control are not re-

quired because these operations are executed automati-

cally by internal control circuit. Programming comple-

tion can be verified by DATA# polling and toggle bit check-

FIGURE 3. AUTOMATIC PROGRAMMING TIMING WAVEFORM

Program Command Sequence(last two cycle)

Read Status Data (last two cycle)

tWC

tAS

PA

555h

PA

Address

CE#

tAH

tCH

tGHWL

OE#

WE#

tWHWH1

tWP

tCS

tWPH

tDS tDH

Status

A0h

PD

DOUT

Data

tBUSY

tRB

RY/BY#

tVCS

VCC

NOTES:

1.PA=Program Address, PD=Program Data, DOUT is the true data the program address

P/N:PM1123

REV. 1.1, NOV. 18, 2004

27

MX26LV160AT/AB

FIGURE 4. AUTOMATIC PROGRAMMING ALGORITHM FLOWCHART

START

Write Data AAH Address 555H

Write Data 55H Address 2AAH

Write Data A0H Address 555H

Write Program Data/Address

Data Poll

Increment

Address

from system

No

Verify Word Ok ?

YES

Last Address ?

YES

Auto Program Completed

P/N:PM1123

REV. 1.1, NOV. 18, 2004

28

MX26LV160AT/AB

FIGURE 5. CE# CONTROLLED PROGRAM TIMING WAVEFORM

PA for program

555 for program

2AA for erase

SA for sector erase

555 for chip erase

Data# Polling

Address

PA

tWC

tWH

tAS

tAH

WE#

OE#

tGHEL

tCP

tWHWH1 or 2

CE#

Data

tWS

tDS

tCPH

tBUSY

tDH

DOUT

DQ7

PD for program

30 for sector erase

10 for chip erase

A0 for program

55 for erase

tRH

RESET#

RY/BY#

NOTES:

1.PA=Program Address, PD=Program Data, DOUT=Data Out, DQ7=complement of data written to device.

2.Figure indicates the last two bus cycles of the command sequence.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

29

MX26LV160AT/AB

AUTOMATIC CHIP ERASE TIMING WAVEFORM

All data in chip are erased. External erase verification is

not required because data is verified automatically by

internal control circuit. Erasure completion can be veri-

fied by DATA# polling and toggle bit checking after auto-

matic erase starts. Device outputs 0 during erasure

and 1 after erasure on Q7. (Q6 is for toggle bit; see toggle

bit, DATA# polling, timing waveform)

FIGURE 6. AUTOMATIC CHIP ERASE TIMING WAVEFORM

Erase Command Sequence(last two cycle)

Read Status Data

VA

tWC

tAS

VA

2AAh

555h

Address

CE#

tAH

tCH

tGHWL

OE#

WE#

tWHWH2

tWP

tCS

tWPH

tDS tDH

In

Progress

55h

10h

Complete

Data

tBUSY

tRB

RY/BY#

tVCS

VCC

NOTES:

SA=sector address(for Sector Erase), VA=Valid Address for reading status data(see "Write Operation Status").

P/N:PM1123

REV. 1.1, NOV. 18, 2004

30

MX26LV160AT/AB

FIGURE 7. AUTOMATIC CHIP ERASE ALGORITHM FLOWCHART

START

Write Data AAH Address 555H

Write Data 55H Address 2AAH

Write Data 80H Address 555H

Write Data AAH Address 555H

Write Data 55H Address 2AAH

Write Data 10H Address 555H

Data Pall from System

NO

Data=FFh ?

YES

Auto Chip Erase Completed

P/N:PM1123

REV. 1.1, NOV. 18, 2004

31

MX26LV160AT/AB

AUTOMATIC SECTOR ERASE TIMING WAVEFORM

Sector indicated by A12 to A19 are erased. External

erase verify is not required because data are verified

automatically by internal control circuit. Erasure comple-

tion can be verified by DATA# polling and toggle bit check-

ing after automatic erase starts. Device outputs 0 dur-

ing erasure and 1 after erasure on Q7. (Q6 is for toggle

bit; see toggle bit, DATA# polling, timing waveform)

FIGURE 8. AUTOMATIC SECTOR ERASE TIMING WAVEFORM

Erase Command Sequence(last two cycle)

Read Status Data

VA

tWC

tAS

Sector

VA

2AAh

Address

CE#

Address 0

Address 1

Address n

tAH

tCH

tGHWL

OE#

WE#

tWHWH2

tBAL

tWP

tCS

tWPH

tDS tDH

In

Progress

55h

30h

Complete

Data

tBUSY

tRB

RY/BY#

tVCS

VCC

NOTES:

SA=sector address(for Sector Erase), VA=Valid Address for reading status data(see "Write Operation Status").

P/N:PM1123

REV. 1.1, NOV. 18, 2004

32

MX26LV160AT/AB

FIGURE 9. AUTOMATIC SECTOR ERASE ALGORITHM FLOWCHART

START

Write Data AAH Address 555H

Write Data 55H Address 2AAH

Write Data 80H Address 555H

Write Data AAH Address 555H

Write Data 55H Address 2AAH

Write Data 30H Sector Address

NO

Last Sector

to Erase

YES

Data Poll from System

NO

Data=FFh

YES

Auto Sector Erase Completed

P/N:PM1123

REV. 1.1, NOV. 18, 2004

33

MX26LV160AT/AB

Figure 10. IN-SYSTEM SECTOR PROTECT/CHIP UNPROTECTTIMINGWAVEFORM (RESET# Con-

trol)

VID

VIH

RESET#

SA, A6

A1, A0

Valid*

Sector Protect or Sector Unprotect

Verify

40h

Status

Data

60h

Sector Protect =150us

chip Unprotect =15ms

1us

CE#

WE#

OE#

Note: When sector protect, A6=0, A1=1, A0=0. When chip unprotect, A6=1, A1=1, A0=0.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

34

MX26LV160AT/AB

Figure 11. SECTOR PROTECT TIMING WAVEFORM (A9, OE# Control)

A1

A6

12V

3V

A9

tVLHT

Verify

12V

3V

OE#

tVLHT

tWPP 1

WE#

CE#

tOESP

Data

01H

F0H

tOE

Sector Address

A19-A12

Notes: tVLHT (Voltage transition time)=4us min.

tOESP (OE# setup time to WE# active)=4us min.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

35

MX26LV160AT/AB

Figure 12. SECTOR PROTECTION ALGORITHM (A9, OE# Control)

START

Set Up Sector Addr

PLSCNT=1

OE#=VID, A9=VID, CE#=VIL

A6=VIL

Activate WE# Pulse

Time Out 150us

Set WE#=VIH, CE#=OE#=VIL

A9 should remain VID

.

Read from Sector

No

Addr=SA, A1=1, A6=0, A0=0

No

Data=01H?

PLSCNT=32?

Yes

Device Failed

Yes

Protect Another

Sector?

Remove VID from A9

Write Reset Command

Sector Protection

Complete

P/N:PM1123

REV. 1.1, NOV. 18, 2004

36

MX26LV160AT/AB

Figure 13. IN-SYSTEM SECTOR PROTECTION ALGORITHM WITH RESET#=VID

START

PLSCNT=1

RESET#=VID

Wait 1us

No

Temporary Sector

Unprotect Mode

First Write

Cycle=60H

Yes

Set up sector address

Write 60H to sector address

with A6=0, A1=1, A0=0

Wait 150us

Verify sector protect :

write 90H with A6=0,

A1=1, A0=0

Increment PLSCNT

Reset PLSCNT=1

Read from sector address

No

PLSCNT=25?

Data=01H ?

Yes

Device failed

Yes

Protect another

sector?

No

Remove VID from RESET#

Write reset command

Sector protect complete

P/N:PM1123

REV. 1.1, NOV. 18, 2004

37

MX26LV160AT/AB

Figure 14. IN-SYSTEM CHIP UNPROTECTION ALGORITHM WITH RESET#=VID

START

PLSCNT=1

RESET#=VID

Wait 1us

No

Temporary Sector

Unprotect Mode

First Write

Cycle=60H ?

Yes

All sector

Protect all sectors

protected?

Yes

Set up first sector address

Chip unprotect :

write 60H with

A6=1, A1=1, A0=0

Wait 50ms

Verify chip unprotect

write 90H to sector address

with A6=0, A1=1, A0=0

Increment PLSCNT

Read from sector address

with A6=0, A1=1, A0=0

No

Set up next sector address

PLSCNT=1000?

Data=00H ?

Yes

Device failed

Yes

Last sector

verified?

No

Remove VID from RESET#

Write reset command

Chip unprotect complete

P/N:PM1123

REV. 1.1, NOV. 18, 2004

38

MX26LV160AT/AB

Figure 15. TIMING WAVEFORM FOR CHIP UNPROTECTION (A9, OE# Control)

A1

12V

Vcc 3V

A9

A6

tVLHT

Verify

12V

Vcc 3V

OE#

tVLHT

tWPP 2

WE#

CE#

tOESP

Data

00H

F0H

tOE

A19-A12

Sector Address

P/N:PM1123

REV. 1.1, NOV. 18, 2004

39

MX26LV160AT/AB

Figure 16. CHIP UNPROTECTION ALGORITHM (A9, OE# Control)

START

Protect All Sectors

PLSCNT=1

Set OE#=A9=VID, CE#=VIL,

A6=1, A1=1, A0=0

Activate WE# Pulse

Time Out 50ms

Increment

PLSCNT

Set OE#=CE#=VIL, A9=VID,

A1=1, A0=0, A6=0

Set Up First Sector Addr

Read Data from Device

No

Data=00H?

Yes

PLSCNT=1000?

Increment

Sector Addr

Yes

Device Failed

No

All sectors have

been verified?

Yes

Remove VID from A9

Write Reset Command

Chip Unprotect

Complete

* It is recommended before unprotect whole chip, all sectors should be protected in advance.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

40

MX26LV160AT/AB

WRITE OPERATION STATUS

FIGURE 17. DATA# POLLING ALGORITHM

Start

Read Q7~Q0

Add.=VA(1)

Yes

Q7 = Data ?

No

Q5 = 1 ?

Yes

Read Q7~Q0

Add.=VA

Yes

Q7 = Data ?

(2)

No

FAIL

Pass

NOTE : 1.VA=Valid address for programming

2.Q7 should be re-checked even Q5="1" because Q7 may change

simultaneously with Q5.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

41

MX26LV160AT/AB

FIGURE 18. TOGGLE BIT ALGORITHM

Start

Read Q7-Q0

(Note 1)

NO

Toggle Bit Q6 =

Toggle ?

YES

NO

Q5= 1?

YES

Read Q7~Q0 Twice

(Note 1,2)

NO

Toggle bit Q6=

Toggle?

YES

Program/Erase Operation

Not Complete,Write

Reset Command

Program/Erase

operation Complete

Note:1.Read toggle bit twice to determine whether or not it is toggling.

2. Recheck toggle bit because it may stop toggling as Q5 change to "1".

P/N:PM1123

REV. 1.1, NOV. 18, 2004

42

MX26LV160AT/AB

FIGURE 19. Data# Polling Timings (During Automatic Algorithms)

tRC

VA

Address

CE#

tACC

tCE

tCH

tOE

OE#

WE#

tOEH

tDF

tOH

High Z

Complement

Status Data

Complement

Status Data

True

Valid Data

Q7

Q0-Q6

tBUSY

RY/BY#

NOTES:

1. VA=Valid address. Figure shows are first status cycle after command sequence, last status read cycle, and array data read cycle.

2. CE# must be toggled when DATA# polling.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

43

MX26LV160AT/AB

FIGURE 20. Toggle Bit Timings (During Automatic Algorithms)

tRC

VA

Address

CE#

tACC

tCE

tCH

tOE

OE#

tDF

tOEH

WE#

tOH

High Z

Valid Status

(second read)

Valid Status

(first raed)

Valid Data

Q6/Q2

(stops toggling)

tBUSY

RY/BY#

NOTES:

1. VA=Valid address; not required for Q6. Figure shows first two status cycle after command sequence, last status read cycle,

and array data read cycle.

2. CE# must be toggled when toggle bit toggling.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

44

MX26LV160AT/AB

TABLE 12. AC CHARACTERISTICS

Parameter Std Description

Test Setup All Speed Options Unit

tREADY1

RESET# PIN Low (During Automatic Algorithms)

MAX

20

us

to Read or Write (See Note)

tREADY2

RESET# PIN Low (NOT During Automatic

Algorithms) to Read or Write (See Note)

RESET# Pulse Width (During Automatic Algorithms)

RESET# HighTime Before Read (See Note)

RY/BY# Recovery Time (to CE#, OE# go low)

MAX

500

ns

tRP

tRH

tRB

MIN

500

50

0

ns

Note: Not 100% tested

FIGURE 21. RESET# TIMING WAVEFORM

RY/BY#

CE#, OE#

tRH

RESET#

tRP

tReady2

Reset Timing NOT during Automatic Algorithms

tReady1

RY/BY#

tRB

CE#, OE#

RESET#

tRP

Reset Timing during Automatic Algorithms

P/N:PM1123

REV. 1.1, NOV. 18, 2004

45

MX26LV160AT/AB

AC CHARACTERISTICS

TABLE 13. WORD/BYTE CONFIGURATION (BYTE#)

Parameter

Description

Speed Options

Unit

JEDEC Std

-55

-70

tELFL/tELFH CE# to BYTE# Switching Low or High

Max

Min

5

ns

tFLQZ

tFHQV

BYTE# Switching Low to Output HIGH Z

BYTE# Switching High to Output Active

25

55

25

70

FIGURE 22. BYTE# TIMING WAVEFORM FOR READ OPERATIONS (BYTE# switching from byte

mode to word mode)

CE#

OE#

tELFH

BYTE#

DOUT

(Q0-Q7)

DOUT

(Q0-Q14)

Q0~Q14

Q15/A-1

DOUT

(Q15)

VA

tFHQV

P/N:PM1123

REV. 1.1, NOV. 18, 2004

46

MX26LV160AT/AB

FIGURE 23. BYTE# TIMINGWAVEFORM FOR READ OPERATIONS (BYTE# switching from word

mode to byte mode)

CE#

OE#

tELFH

BYTE#

DOUT

(Q0-Q14)

DOUT

(Q0-Q7)

Q0~Q14

Q15/A-1

DOUT

(Q15)

VA

tFLQZ

FIGURE 24. BYTE# TIMING WAVEFORM FOR PROGRAM OPERATIONS

CE#

The falling edge of the last WE# signal

WE#

BYTE#

tAS

tAH

P/N:PM1123

REV. 1.1, NOV. 18, 2004

47

MX26LV160AT/AB

Table 14. TEMPORARY SECTOR UNPROTECT

Parameter Std. Description

Test Setup All Speed Options Unit

tVIDR

tRSP

VID Rise and Fall Time (See Note)

Min

500

4

ns

us

RESET# SetupTime forTemporary Sector Unprotect

Note:

Not 100% tested

Figure 25. TEMPORARY SECTOR UNPROTECT TIMING DIAGRAM

12V

RESET#

0 or Vcc

Program or Erase Command Sequence

tVIDR

CE#

WE#

tRSP

RY/BY#

P/N:PM1123

REV. 1.1, NOV. 18, 2004

48

MX26LV160AT/AB

Figure 26. TEMPORARY SECTOR UNPROTECT ALGORITHM

Start

RESET# = VID (Note 1)

Perform Erase or Program Operation

Operation Completed

RESET# = VIH

Temporary Sector Unprotect Completed(Note 2)

Note :

1. All protected sectors are temporary unprotected.

VID=11.5V~12.5V

2. All previously protected sectors are protected again.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

49

MX26LV160AT/AB

FIGURE 27. ID CODE READ TIMING WAVEFORM

VCC

3V

VID

ADD

A9

VIH

VIL

VIH

VIL

ADD

A0

tACC

VIH

VIL

A1

ADD

A2-A8

VIH

A10-A19 ^VIL

CE#

VIH

VIL

VIH

VIL

tCE

WE#

OE#

tOE

VIH

VIL

tDF

tOH

VIH

VIL

DATA

Q0-Q15

DATA OUT

C4H/49H (Byte)

C2H/00C2H

22C4H/2249H (Word)

P/N:PM1123

REV. 1.1, NOV. 18, 2004

50

MX26LV160AT/AB

described inTable 15.

QUERY COMMAND AND COMMON FLASH

INTERFACE (CFI) MODE

The single cycle Query command is valid only when the

device is in the Read mode, Standby mode, and Auto-

matic Select mode; however, it is ignored otherwise.

MX26LV160AT/AB is capable of operating in the CFI

mode. This mode all the host system to determine the

manufacturer of the device such as operating param-

eters and configuration.Two commands are required in

CFI mode. Query command of CFI mode is placed first,

then the Reset command exits CFI mode. These are

The Reset command exits from the CFI mode to the

Read mode, or Automatic Select mode.The command is

valid only when the device is in the CFI mode.

Table 15-1. CFI mode: Identification Data Values

(All values in these tables are in hexadecimal)

Description

Address

Data

(ByteMode)

(WordMode)

Query-unique ASCII string "QRY"

20

22

24

26

28

2A

2C

2E

30

32

34

10

11

12

13

14

15

16

17

18

19

1A

0051

0052

0059

0002

0000

0040

0000

Primary vendor command set and control interface ID code

Address for primary algorithm extended query table

Alternate vendor command set and control interface ID code (none)

Address for secondary algorithm extended query table (none)

Table 15-2. CFI Mode: System Interface Data Values

(All values in these tables are in hexadecimal)

Description

Address

Data

(ByteMode)

(WordMode)

VCC supply, minimum (3.0V)

36

38

3A

3C

3E

40

42

44

46

48

4A

4C

1B

1C

1D

1E

1F

20

21

22

23

24

25

26

0030

0036

0000

0004

0000

000A

0000

0005

0000

0004

0000

VCC supply, maximum (3.6V)

VPP supply, minimum (none)

VPP supply, maximum (none)

Typical timeout for single word/byte write (2^Nus)

Typical timeout for Minimum size buffer write (2^Nus) (not supported)

Typical timeout for individual sector erase (2^Nms)

Typical timeout for full chip erase (2^Nms)

Maximum timeout for single word/byte write times (2^NX Typ)

Maximum timeout for buffer write times (2^NX Typ)

Maximum timeout for individual sector erase times (2^NX Typ)

Maximum timeout for full chip erase times (not supported)

P/N:PM1123

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MX26LV160AT/AB

Table 15-3. CFI Mode: Device Geometry Data Values

(All values in these tables are in hexadecimal)

Description

Address

Data

(ByteMode)

(WordMode)

Device size (2^Nbytes)

4E

50

52

54

56

58

5A

5C

5E

60

62

64

66

68

6A

6C

6E

70

72

74

76

78

27

28

29

2A

2B

2C

2D

2E

2F

30

31

32

33

34

35

36

37

38

39

3A

3B

3C

0015

0002

0000

0004

0000

0040

0000

0001

0000

0020

0000

0080

0000

001E

0000

0001

Flash device interface code (x8/x16 async.)

Maximum number of bytes in multi-byte write (not supported)

Number of erase sector regions

Erase sector region 1 information (refer to the CFI publication 100)

Erase sector region 2 information

Erase sector region 3 information

Erase sector region 4 information

Table 15-4. CFI Mode: Primary Vendor-Specific Extended Query Data Values

(All values in these tables are in hexadecimal)

Description

Address

Data

(ByteMode)

(WordMode)

Query-unique ASCII string "PRI"

80

82

84

86

88

8A

8C

8E

90

92

94

96

98

40

41

42

43

44

45

46

47

48

49

4A

4B

4C

0050

0052

0049

0031

0030

0000

0004

0000

Major version number, ASCII

Minor version number, ASCII

Address sensitive unlock (0=required, 1= not required)

Erasesuspend(0=notsupported)

Sector protect (0=not supported)

Temporarysectorunprotect(0=notsupported)

Sector protect/chip unprotect scheme (0=not supported)

SimultaneousR/Woperation(0=notsupported)

Burst mode type (0=not supported)

Page mode type (0=not supported)

P/N:PM1123

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MX26LV160AT/AB

TABLE 16. ERASE AND PROGRAMMING PERFORMANCE (1)

LIMITS

TYP. (2)

2.4

PARAMETER

MIN.

MAX. (3)

15

UNITS

sec

Sector Erase Time

Chip Erase Time

80

320

sec

Byte Programming Time

Word Programming Time

Chip Programming Time (Word/Byte Mode)

Erase/Program Cycles

55

220

us

70

280

us

70

140

sec

2K (6)

Cycles

Note:

1. Not 100% tested.

2. Typical program and erase times assume the following conditions : 25° C, 3.3V VCC. Programming spec. assume

that all bits are programmed to checkerboard pattern.

3. Maximum values are measured at VCC=3.0V, worst case temperature. Maximum values are up to including 2K

program/erase cycles.

4. System-level overhead is the time required to execute the command sequences for the all program command.

5. Excludes 00H programming prior to erasure. (In the pre-programming step of the embedded erase algorithm, all bits

are programmed to 00H before erasure)

6. Min.erase/program cycles is under :3.3VVCC, 25°C, checkerboard pattern conditions, and without baking process.

TABLE 17. LATCH-UP CHARACTERISTICS

MIN.

-1.0V

MAX.

12V

Input Voltage with respect to GND on ACC, OE#, RESET#, A9

Input Voltage with respect to GND on all power pins, Address pins, CE# and WE#

Input Voltage with respect to GND on all I/O pins

-1.0V

VCC + 1.0V

+100mA

-1.0V

Current

-100mA

Includes all pins except VCC. Test conditions: VCC = 3.0V, one pin at a time.

P/N:PM1123

REV. 1.1, NOV. 18, 2004

53

MX26LV160AT/AB

ORDERING INFORMATION

PART NO.

ACCESS

OPERATING

STANDBY

PACKAGE

Remark

TIME (ns) Current MAX. (mA) Current MAX. (uA)

MX26LV160ATMC-55

MX26LV160ATMC-70

MX26LV160ABMC-55

MX26LV160ABMC-70

MX26LV160ATTC-55

55

70

55

70

55

30

100

44 Pin SOP

48 Pin TSOP

(NormalType)

48 Pin TSOP

(NormalType)

48 Pin TSOP

(NormalType)

48 Pin TSOP

(NormalType)

48 Ball CSP

MX26LV160ABTC-55

MX26LV160ATTC-70

MX26LV160ABTC-70

MX26LV160ATXBC-55

MX26LV160ABXBC-55

MX26LV160ATXBC-70

MX26LV160ABXBC-70

MX26LV160ATXEC-55

MX26LV160ABXEC-55

MX26LV160ATXEC-70

MX26LV160ABXEC-70

55

70

55

70

55

70

30

100

(Ball size:0.3mm)

48 Ball CSP

(Ball size:0.3mm)

48 Ball CSP

(Ball size:0.3mm)

48 Ball CSP

(Ball size:0.3mm)

48 Ball CSP

(Ball size:0.4mm)

48 Ball CSP

(Ball size:0.4mm)

48 Ball CSP

(Ball size:0.4mm)

48 Ball CSP

(Ball size:0.4mm)

44 Pin SOP

MX26LV160ATMC-55G

MX26LV160ATMC-70G

MX26LV160ABMC-55G

MX26LV160ABMC-70G

MX26LV160ATTC-55G

55

70

55

70

55

30

100

Pb-free

44 Pin SOP

48 Pin TSOP

(NormalType)

48 Pin TSOP

(NormalType)

48 Pin TSOP

(NormalType)

48 Pin TSOP

(NormalType)

MX26LV160ABTC-55G

MX26LV160ATTC-70G

MX26LV160ABTC-70G

55

70

30

100

Pb-free

P/N:PM1123

REV. 1.1, NOV. 18, 2004

54

MX26LV160AT/AB

PART NO.

ACCESS

OPERATING

STANDBY

PACKAGE

Remark

Pb-free

TIME (ns) Current MAX. (mA) Current MAX. (uA)

MX26LV160ATXBC-55G

MX26LV160ABXBC-55G

MX26LV160ATXBC-70G

MX26LV160ABXBC-70G

MX26LV160ATXEC-55G

MX26LV160ABXEC-55G

55

70

55

30

100

48 Ball CSP

(Ball size:0.3mm)

48 Ball CSP

(Ball size:0.3mm)

48 Ball CSP

(Ball size:0.3mm)

48 Ball CSP

(Ball size:0.3mm)

48 Ball CSP

(Ball size:0.4mm)

48 Ball CSP

(Ball size:0.4mm)

48 Ball CSP

(Ball size:0.4mm)

48 Ball CSP

MX26LV160ATXEC-70G

MX26LV160ABXEC-70G

70

30

100

Pb-free

(Ball size:0.4mm)

P/N:PM1123

REV. 1.1, NOV. 18, 2004

55

MX26LV160AT/AB

PACKAGE INFORMATION

P/N:PM1123

REV. 1.1, NOV. 18, 2004

56

MX26LV160AT/AB

P/N:PM1123

REV. 1.1, NOV. 18, 2004

57

MX26LV160AT/AB

48-Ball CSP (for MX26LV160ATXBC/ATXBI/ABXBC/ABXBI)

P/N:PM1123

REV. 1.1, NOV. 18, 2004

58

MX26LV160AT/AB

48-Ball CSP (for MX26LV160ATXEC/ATXEI/ABXEC/ABXEI)

P/N:PM1123

REV. 1.1, NOV. 18, 2004

59

MX26LV160AT/AB

REVISION HISTORY

Revision No. Description

Page

P1

Date

NOV/15/2004

1.0

1. Removed "Preliminary"

2. To added 44-SOP package information

All

3. To modified cycling time from 10K to 2K

1. To corrected protect/unprotect information in CFI table

P1,53

P52

1.1

NOV/18/2004

P/N:PM1123

REV. 1.1, NOV. 18, 2004

60

MX26LV160AT/AB

MACRONIX INTERNATIONALCO., LTD.

Headquarters:

TEL:+886-3-578-6688

FAX:+886-3-563-2888

Europe Office :

TEL:+32-2-456-8020

FAX:+32-2-456-8021

Hong Kong Office :

TEL:+86-755-834-335-79

FAX:+86-755-834-380-78

Japan Office :

Kawasaki Office :

TEL:+81-44-246-9100

FAX:+81-44-246-9105

Osaka Office :

TEL:+81-6-4807-5460

FAX:+81-6-4807-5461

Singapore Office :

TEL:+65-6346-5505

FAX:+65-6348-8096

Taipei Office :

TEL:+886-2-2509-3300

FAX:+886-2-2509-2200

MACRONIX AMERICA, INC.

TEL:+1-408-262-8887

FAX:+1-408-262-8810

http : //www.macronix.com

MACRONIX INTERNATIONAL CO., LTD. reserves the right to change product and specifications without notice.


型号：	MX26LV160ATTC-70
厂家：	MACRONIX INTERNATIONAL
描述：	16M-BIT [2Mx8/1Mx16] CMOS SINGLE VOLTAGE 3V ONLY BOOT SECTOR HIGH SPEED eLiteFlashTM MEMORY 16M - BIT [ 2Mx8 / 1Mx16 ] CMOS单电压3V只引导扇区高速eLiteFlashTM记忆
文件：	总61页 (文件大小：742K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

MX26LV160ATTC-70 [Macronix]

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