MM5451YN [MICREL]

LED Display Driver; LED显示驱动器
MM5451YN
型号: MM5451YN
厂家: MICREL SEMICONDUCTOR    MICREL SEMICONDUCTOR
描述:

LED Display Driver
LED显示驱动器

显示驱动器
文件: 总6页 (文件大小:742K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PRELIMINARY  
SemiWell Semiconductor  
2N7000  
Logic N-Channel MOSFET  
Features  
3. Drain  
Symbol  
{
RDS(on) (Max 5 )@VGS=10V  
RDS(on) (Max 5.3)@VGS=4.5V  
Gate Charge (Typical 0.5nC)  
Maximum Junction Temperature Range (150°C)  
2. Gate  
{
{
1. Source  
TO-92  
General Description  
This Power MOSFET is produced using planar DMOS technology.  
And this Power MOSFET is well suited for Battery switch, Load  
switch, Motor controller and other small signal switches.  
1
2
3
Absolute Maximum Ratings  
Symbol  
VDSS  
ID  
Parameter  
Value  
60  
Units  
V
Drain to Source Voltage  
Continuous Drain Current(@TA = 25°C)  
Drain Current Pulsed  
200  
mA  
mA  
V
IDM  
(Note 1)  
500  
VGS  
Gate to Source Voltage  
±20  
0.4  
Total Power Dissipation Single Operation (TA=25°C)  
Total Power Dissipation Single Operation (TA=70°C)  
Operating Junction Temperature & Storage Temperature  
W
mW  
°C  
PD  
3.2  
T
STG, TJ  
- 55 ~ 150  
Maximum Lead Temperature for soldering purpose,  
1/8 from Case for 10 seconds.  
TL  
300  
°C  
Thermal Characteristics  
Value  
Typ.  
Symbol  
Parameter  
Units  
Min.  
Max.  
RθJA  
Thermal Resistance, Junction-to-Ambient  
-
-
312.5  
°C/W  
January, 2003. Rev. 0.  
1/6  
Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved.  
2N7000  
Electrical Characteristics ( TJ = 25 °C unless otherwise noted )  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BVDSS  
VGS = 0V, ID = 250uA  
D = 250uA, referenced to 25 °C  
Drain-Source Breakdown Voltage  
60  
-
-
-
-
V
Δ BVDSS  
Δ TJ  
/
Breakdown Voltage Temperature  
coefficient  
I
48  
mV/°C  
VDS = 60V, VGS = 0V  
VDS = 60V, VGS = 0V, TJ = 125 °C  
1
IDSS  
Drain-Source Leakage Current  
-
-
uA  
1000  
VGS = 20V, VDS = 0V  
Gate-Source Leakage, Forward  
Gate-Source Leakage, Reverse  
100  
nA  
nA  
IGSS  
V
GS = -20V, VDS = 0V  
-
-
-
-100  
On Characteristics  
VGS(th)  
VDS = VGS, ID = 250uA  
GS = 10 V, ID = 500mA  
VGS = 4.5 V, ID = 75mA  
Gate Threshold Voltage  
1.0  
2.5  
V
V
Static Drain-Source On-state  
Resistance  
-
-
1.55  
1.9  
5
5.3  
RDS(ON)  
Dynamic Characteristics  
Ciss  
Input Capacitance  
-
-
-
20  
11  
3
25  
14  
4
pF  
Coss  
Crss  
Output Capacitance  
V
GS =0 V, VDS =25V, f = 1MHz  
Reverse Transfer Capacitance  
Dynamic Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-on Delay Time  
-
-
-
-
-
-
4
2.5  
17  
18  
15  
44  
24  
0.65  
-
VDD =30V, ID =200mA, RG =50Ω  
VGS = 10 V  
Rise Time  
ns  
Turn-off Delay Time  
Fall Time  
(Note 2,3)  
7
Qg  
Total Gate Charge  
Gate-Source Charge  
0.5  
0.15  
V
DS =30V, VGS =4.5V, ID =200mA  
(Note 2,3)  
Qgs  
nC  
Qgd  
Gate-Drain Charge(Miller Charge)  
-
0.2  
-
Source-Drain Diode Ratings and Characteristics  
Symbol  
IS  
Parameter  
Maximum Continuous Diode Forward Current  
Test Conditions  
Min.  
-
Typ.  
-
Max.  
200  
Unit.  
mA  
V
VSD  
Diode Forward Voltage  
IS =200mA, VGS =0V  
(Note 2)  
-
-
1.2  
NOTES  
1. Repeativity rating : pulse width limited by junction temperature  
2. Pulse Test : Pulse Width 300us, Duty Cycle 2%  
3. Essentially independent of operating temperature.  
2/6  
Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved.  
2N7000  
Fig 2. Transfer Characteristics  
Fig 1. On-State Characteristics  
VGS  
10.0 V  
8.0 V  
6.0 V  
5.0 V  
4.5 V  
4.0 V  
3.5 V  
Top :  
100  
10-1  
100  
10-1  
100 Bottom : 3.0 V  
150oC  
-55oC  
4
Notes :  
Notes :  
1. 250µ s Pulse Test  
2. TC = 25℃  
25oC  
1. VDS = 10V  
2. 250µ s Pulse Test  
100  
101  
0
2
6
8
10  
VGS, Gate-Source Voltage [V]  
VDS, Drain-Source Voltage [V]  
Fig 4. On State Current vs.  
Allowable Case Temperature  
Fig 3. On Resistance Variation vs.  
Drain Current and Gate Voltage  
3.0  
2.5  
2.0  
1.5  
1.0  
VGS = 4.5V  
VGS = 10V  
150  
25℃  
Notes :  
1. VGS = 0V  
Note : T = 25℃  
2. 250µ s Pulse Test  
J
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
1.6  
1.8  
2.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
ID, Drain Current [A]  
VSD, Source-Drain voltage [V]  
Fig 6. Gate Charge Characteristics  
Fig 5. Capacitance Characteristics  
50  
40  
30  
20  
10  
0
12  
10  
8
C
iss=Cgs+Cgd(Cds=shorted)  
oss=Cds+Cgd  
Crss=Cgd  
C
VDS = 30V  
VDS = 48V  
Notes :  
1. VGS = 0V  
2. f=1MHz  
6
C
iss  
Coss  
4
2
C
rss  
Note : ID = 200 mA  
1.0  
0
0
5
10  
15  
20  
25  
30  
0.0  
0.2  
0.4  
0.6  
0.8  
1.2  
QG, Total Gate Charge [nC]  
VDS, Drain-Source Voltage [V]  
3/6  
Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved.  
2N7000  
Fig 8. On-Resistance Variation  
vs. Junction Temperature  
Fig 7. Breakdown Voltage Variation  
vs. Junction Temperature  
1.2  
1.1  
1.0  
0.9  
0.8  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
Notes :  
1. VGS = 0 V  
Notes :  
1. VGS = 10 V  
2. ID = 500 mA  
2. ID = 250 µ A  
-100  
-50  
0
50  
100  
150  
200  
-100  
-50  
0
50  
100  
150  
200  
TJ, Junction Temperature [oC]  
TJ, Junction Temperature [oC]  
4/6  
Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved.  
2N7000  
Fig. 9. Gate Charge Test Circuit & Waveforms  
VGS  
Same Type  
50K  
Ω
as DUT  
Qg  
12V  
200nF  
V
4.5  
300nF  
VDS  
VGS  
Qgs  
Qgd  
DUT  
1mA  
Charge  
Fig 10. Switching Time Test Circuit & Waveforms  
RL  
VDS  
90%  
VDS  
VDD  
( 0.5 rated VDS  
)
10%  
10V  
Vin  
DUT  
RG  
Pulse  
td(on)  
tr  
td(off)  
tf  
Generator  
t on  
t off  
5/6  
Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved.  
2N7000  
TO-92 Package Dimension  
mm  
Typ.  
4.2  
Inch  
Typ.  
Dim.  
Min.  
Max.  
Min.  
Max.  
A
B
C
D
E
F
G
H
I
0.165  
3.7  
4.83  
14.87  
0.4  
0.146  
0.190  
0.585  
0.016  
0.190  
0.017  
4.43  
0.174  
0.554  
14.07  
4.43  
0.33  
4.83  
0.45  
0.174  
2.54  
2.54  
0.100  
0.100  
J
0.48  
0.013  
0.019  
A
F
E
B
C
G
1
2
3
D
1. Source  
2. Gate  
3. Drain  
J
H
I
6/6  
Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved.  

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