AT28HC256E-12TU [MICROCHIP]
IC EEPROM 256KBIT 120NS 28TSOP;型号: | AT28HC256E-12TU |
厂家: | MICROCHIP |
描述: | IC EEPROM 256KBIT 120NS 28TSOP 可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器 光电二极管 内存集成电路 |
文件: | 总24页 (文件大小:467K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Features
• Fast Read Access Time – 70 ns
• Automatic Page Write Operation
– Internal Address and Data Latches for 64 Bytes
– Internal Control Timer
• Fast Write Cycle Times
– Page Write Cycle Time: 3 ms or 10 ms Maximum
– 1 to 64-byte Page Write Operation
• Low Power Dissipation
256K (32K x 8)
High-speed
Parallel
– 80 mA Active Current
– 3 mA Standby Current
• Hardware and Software Data Protection
• DATA Polling for End of Write Detection
• High Reliability CMOS Technology
– Endurance: 104 or 105 Cycles
– Data Retention: 10 Years
EEPROM
• Single 5V 10% Supply
• CMOS and TTL Compatible Inputs and Outputs
• JEDEC Approved Byte-wide Pinout
• Full Military and Industrial Temperature Ranges
• Green (Pb/Halide-free) Packaging Option
AT28HC256
1. Description
The AT28HC256 is a high-performance electrically erasable and programmable read-
only memory. Its 256K of memory is organized as 32,768 words by 8 bits. Manufac-
tured with Atmel’s advanced nonvolatile CMOS technology, the AT28HC256 offers
access times to 70 ns with power dissipation of just 440 mW. When the AT28HC256
is deselected, the standby current is less than 5 mA.
The AT28HC256 is accessed like a Static RAM for the read or write cycle without the
need for external components. The device contains a 64-byte page register to allow
writing of up to 64 bytes simultaneously. During a write cycle, the address and 1 to 64
bytes of data are internally latched, freeing the addresses and data bus for other oper-
ations. Following the initiation of a write cycle, the device will automatically write the
latched data using an internal control timer. The end of a write cycle can be detected
by DATA Polling of I/O7. Once the end of a write cycle has been detected a new
access for a read or write can begin.
Atmel’s 28HC256 has additional features to ensure high quality and manufacturability.
The device utilizes internal error correction for extended endurance and improved
data retention characteristics. An optional software data protection mechanism is
available to guard against inadvertent writes. The device also includes an extra
64 bytes of EEPROM for device identification or tracking.
0007N–PEEPR–9/09
2. Pin Configurations
Pin Name
A0 - A14
CE
Function
Addresses
Chip Enable
Output Enable
Write Enable
Data Inputs/Outputs
No Connect
OE
WE
I/O0 - I/O7
NC
DC
Don’t Connect
2.3
32-pad LCC, 32-lead PLCC Top View
2.1
28-lead TSOP Top View
OE
1
28
27
26
25
24
23
22
21
20
19
18
17
16
15
A10
CE
A11
A9
2
A6
A5
A4
A3
A2
5
6
7
8
9
29 A8
28 A9
27 A11
26 NC
25 OE
24 A10
23 CE
22 I/O7
21 I/O6
3
I/O7
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
I/O0
A0
A8
4
A13
WE
VCC
A14
A12
A7
5
6
7
A1 10
A0 11
8
9
NC 12
I/O0 13
10
11
12
13
14
A6
A5
A4
A1
A3
A2
Note:
PLCC package pins 1 and 17 are Don’t Connect.
2.4
28-lead Cerdip/Flatpack/SOIC –
Top View
2.2
28-lead PGA Top View
A14
A12
A7
1
2
3
4
5
6
7
8
9
28 VCC
27 WE
26 A13
25 A8
A6
A5
24 A9
A4
23 A11
22 OE
21 A10
20 CE
19 I/O7
18 I/O6
17 I/O5
16 I/O4
15 I/O3
A3
A2
A1
A0 10
I/O0 11
I/O1 12
I/O2 13
GND 14
2
AT28HC256
0007N–PEEPR–9/09
AT28HC256
3. Block Diagram
4. Device Operation
4.1
Read
The AT28HC256 is accessed like a Static RAM. When CE and OE are low and WE is high, the
data stored at the memory location determined by the address pins is asserted on the outputs.
The outputs are put in the high impedance state when either CE or OE is high. This dual-line
control gives designers flexibility in preventing bus contention in their system.
4.2
Byte Write
A low pulse on the WE or CE input with CE or WE low (respectively) and OE high initiates a
write cycle. The address is latched on the falling edge of CE or WE, whichever occurs last.
The data is latched by the first rising edge of CE or WE. Once a byte write has been started it
will automatically time itself to completion. Once a programming operation has been initiated
and for the duration of tWC, a read operation will effectively be a polling operation.
4.3
Page Write
The page write operation of the AT28HC256 allows 1 to 64 bytes of data to be written into the
device during a single internal programming period. A page write operation is initiated in the
same manner as a byte write; the first byte written can then be followed by 1 to 63 additional
bytes. Each successive byte must be written within 150 µs (tBLC) of the previous byte. If the
tBLC limit is exceeded the AT28C256 will cease accepting data and commence the internal
programming operation. All bytes during a page write operation must reside on the same page
as defined by the state of the A6 - A14 inputs. That is, for each WE high to low transition dur-
ing the page write operation, A6 - A14 must be the same.
The A0 to A5 inputs are used to specify which bytes within the page are to be written. The
bytes may be loaded in any order and may be altered within the same load period. Only bytes
which are specified for writing will be written; unnecessary cycling of other bytes within the
page does not occur.
4.4
DATA Polling
The AT28HC256 features DATA Polling to indicate the end of a write cycle. During a byte or
page write cycle an attempted read of the last byte written will result in the complement of the
written data to be presented on I/O7. Once the write cycle has been completed, true data is
valid on all outputs, and the next write cycle may begin. DATA Polling may begin at anytime
during the write cycle.
3
0007N–PEEPR–9/09
4.5
Toggle Bit
In addition to DATA Polling the AT28HC256 provides another method for determining the end
of a write cycle. During the write operation, successive attempts to read data from the device
will result in I/O6 toggling between one and zero. Once the write has completed, I/O6 will stop
toggling and valid data will be read. Testing the toggle bit may begin at any time during the
write cycle.
4.6
Data Protection
If precautions are not taken, inadvertent writes to any 5-volt-only nonvolatile memory may
occur during transition of the host system power supply. Atmel® has incorporated both hard-
ware and software features that will protect the memory against inadvertent writes.
4.6.1
Hardware Protection
Hardware features protect against inadvertent writes to the AT28HC256 in the following ways:
(a) VCC sense – if VCC is below 3.8V (typical) the write function is inhibited; (b) VCC power-on
delay – once VCC has reached 3.8V the device will automatically time out 5 ms typical) before
allowing a write; (c) write inhibit – holding any one of OE low, CE high or WE high inhibits write
cycles; and (d) noise filter – pulses of less than 15 ns (typical) on the WE or CE inputs will not
initiate a write cycle.
4.6.2
Software Data Protection
A software controlled data protection feature has been implemented on the AT28HC256.
When enabled, the software data protection (SDP), will prevent inadvertent writes. The SDP
feature may be enabled or disabled by the user; the AT28HC256 is shipped from Atmel with
SDP disabled.
SDP is enabled by the host system issuing a series of three write commands; three specific
bytes of data are written to three specific addresses (refer to “Software Data Protection” algo-
rithm). After writing the 3-byte command sequence and after tWC the entire AT28HC256 will be
protected against inadvertent write operations. It should be noted, that once protected the host
may still perform a byte or page write to the AT28HC256. This is done by preceding the data to
be written by the same 3-byte command sequence.
Once set, SDP will remain active unless the disable command sequence is issued. Power
transitions do not disable SDP and SDP will protect the AT28HC256 during power-up and
power-down conditions. All command sequences must conform to the page write timing spec-
ifications. It should also be noted that the data in the enable and disable command sequences
is not written to the device and the memory addresses used in the sequence may be written
with data in either a byte or page write operation.
After setting SDP, any attempt to write to the device without the three byte command
sequence will start the internal write timers. No data will be written to the device; however, for
the duration of tWC, read operations will effectively be polling operations.
4.7
Device Identification
An extra 64 bytes of EEPROM memory are available to the user for device identification. By
raising A9 to 12V 0.5V and using address locations 7FC0H to 7FFFH the additional bytes
may be written to or read from in the same manner as the regular memory array.
4.8
Optional Chip Erase Mode
The entire device can be erased using a 6-byte software code. Please see “Software Chip
Erase” application note for details.
4
AT28HC256
0007N–PEEPR–9/09
AT28HC256
5. DC and AC Operating Range
AT28HC256-70
AT28HC256-90
-40°C - 85°C
-55°C - 125°C
5V 10%
AT28HC256-12
-40°C - 85°C
-55°C - 125°C
5V 10%
Ind.
Mil.
-40°C - 85°C
Operating
Temperature (Case)
VCC Power Supply
5V 10%
6. Operating Modes
Mode
CE
VIL
VIL
VIH
X
OE
VIL
VIH
X(1)
X
WE
VIH
VIL
X
I/O
DOUT
DIN
Read
Write(2)
Standby/Write Inhibit
Write Inhibit
Write Inhibit
Output Disable
High Z
VIH
X
X
VIL
VIH
X
X
High Z
High Z
(3)
Chip Erase
VIL
VH
VIL
Notes: 1. X can be VIL or VIH.
2. Refer to AC programming waveforms.
3. VH = 12.0V 0.5V.
7. Absolute Maximum Ratings*
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
Temperature under Bias ................................ -55°C to +125°C
Storage Temperature..................................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground.............................-0.6V to VCC + 0.6V
Voltage on OE and A9
with Respect to Ground...................................-0.6V to +13.5V
8. DC Characteristics
Symbol
Parameter
Condition
Min
Max
10
Units
µA
µA
mA
mA
µA
mA
V
ILI
Input Load Current
Output Leakage Current
VIN = 0V to VCC + 1V
VI/O = 0V to VCC
ILO
10
AT28HC256-90, -12
AT28HC256-70
3
ISB1
VCC Standby Current TTL
CE = 2.0V to VCC
60
ISB2
ICC
VCC Standby Current CMOS
VCC Active Current
CE = VCC - 0.3V to VCC AT28HC256-90, -12
f = 5 MHz; IOUT = 0 mA
300
80
VIL
Input Low Voltage
0.8
VIH
VOL
VOH
Input High Voltage
2.0
2.4
V
Output Low Voltage
Output High Voltage
IOL = 6.0 mA
IOH = -4 mA
0.45
V
V
5
0007N–PEEPR–9/09
9. AC Read Characteristics
AT28HC256-70
AT28C256-90
AT28HC256-12
Symbol
tACC
Parameter
Address to Output Delay
CE to Output Delay
Min
Max
70
Min
Max
90
Min
Max
120
120
50
Units
ns
(1)
tCE
tOE
70
90
ns
(2)
OE to Output Delay
0
0
35
0
0
40
0
0
ns
(3)(4)
tDF
CE or OE to Output Float
35
40
50
ns
Output Hold from OE, CE or Address,
whichever occurred first
tOH
0
0
0
ns
10. AC Read Waveforms(1)(2)(3)(4)
Notes: 1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC
.
.
3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
6
AT28HC256
0007N–PEEPR–9/09
AT28HC256
11. Input Test Waveforms and Measurement Level
tR, tF < 5 ns
12. Output Test Load
13. Pin Capacitance
f = 1 MHz, T = 25°C(1)
Symbol
CIN
Typ
4
Max
6
Units
pF
Conditions
VIN = 0V
COUT
8
12
pF
VOUT = 0V
Note:
1. This parameter is characterized and is not 100% tested.
7
0007N–PEEPR–9/09
14. AC Write Characteristics
Symbol
tAS, tOES
tAH
Parameter
Min
0
Max
Units
ns
Address, OE Setup Time
Address Hold Time
Chip Select Setup Time
Chip Select Hold Time
Write Pulse Width (WE or CE)
Data Setup Time
50
0
ns
tCS
ns
tCH
0
ns
tWP
100
50
0
ns
tDS
ns
t
DH, tOEH
Data, OE Hold Time
ns
tDV
Time to Data Valid
NR(1)
Note:
1. NR = No Restriction.
15. AC Write Waveforms
15.1 WE Controlled
15.2 CE Controlled
8
AT28HC256
0007N–PEEPR–9/09
AT28HC256
16. Page Mode Write Characteristics
Symbol
Parameter
Min
Typ
5
Max
10
3
Units
ms
ms
ns
AT28HC256
tWC
Write Cycle Time (option available)
AT28HC256F
2
tAS
Address Setup Time
Address Hold Time
Data Setup Time
0
50
50
0
tAH
ns
tDS
ns
tDH
Data Hold Time
ns
tWP
tBLC
tWPH
Write Pulse Width
Byte Load Cycle Time
Write Pulse Width High
100
ns
150
µs
50
ns
17. Page Mode Write Waveforms(1)(2)
Notes: 1. A6 through A14 must specify the same page address during each high to low transition of WE (or CE).
2. OE must be high only when WE and CE are both low.
18. Chip Erase Waveforms
tS = tH = 5 µsec (min.)
tW = 10 msec (min.)
VH = 12.0V 0.5V
9
0007N–PEEPR–9/09
19. Software Data Protection
Enable Algorithm(1)
20. Software Data Protection
Disable Algorithm(1)
LOAD DATA AA
TO
LOAD DATA AA
TO
ADDRESS 5555
ADDRESS 5555
LOAD DATA 55
TO
LOAD DATA 55
TO
ADDRESS 2AAA
ADDRESS 2AAA
LOAD DATA A0
TO
LOAD DATA 80
TO
ADDRESS 5555
ADDRESS 5555
WRITES ENABLED(2)
LOAD DATA XX
TO
ANY ADDRESS(4)
LOAD DATA AA
TO
ADDRESS 5555
LOAD LAST BYTE
TO
LOAD DATA 55
TO
LAST ADDRESS
ENTER DATA
ADDRESS 2AAA
PROTECT STATE
LOAD DATA 20
TO
Notes: 1. Data Format: I/O7 - I/O0 (Hex);
Address Format: A14 - A0 (Hex).
ADDRESS 5555
EXIT DATA
PROTECT STATE(3)
2. Write Protect state will be activated at end of write
even if no other data is loaded.
LOAD DATA XX
TO
ANY ADDRESS(4)
3. Write Protect state will be deactivated at end of write
period even if no other data is loaded.
4. 1 to 64 bytes of data are loaded.
LOAD LAST BYTE
TO
LAST ADDRESS
21. Software Protected Write Cycle Waveforms(1)(2)
Notes: 1. A6 through A14 must specify the same page address during each high to low transition of WE (or CE) after the software
code has been entered.
2. OE must be high only when WE and CE are both low.
10
AT28HC256
0007N–PEEPR–9/09
AT28HC256
22. Data Polling Characteristics(1)
Symbol
Parameter
Min
0
Typ
Max
Units
ns
tDH
Data Hold Time
tOEH
tOE
OE Hold Time
0
ns
OE to Output Delay(2)
Write Recovery Time
ns
tWR
0
ns
Notes: 1. These parameters are characterized and not 100% tested.
2. See “AC Read Characteristics” on page 6.
23. Data Polling Waveforms
24. Toggle Bit Characteristics(1)
Symbol
Parameter
Min
10
Typ
Max
Units
ns
tDH
Data Hold Time
tOEH
tOE
tOEHP
tWR
OE Hold Time
10
ns
OE to Output Delay(2)
OE High Pulse
ns
150
0
ns
Write Recovery Time
ns
Notes: 1. These parameters are characterized and not 100% tested.
2. See “AC Read Characteristics” on page 6.
25. Toggle Bit Waveforms
Notes: 1. Toggling either OE or CE or both OE and CE will operate toggle bit.
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the address should not vary.
11
0007N–PEEPR–9/09
26. Normalized ICC Graphs
12
AT28HC256
0007N–PEEPR–9/09
AT28HC256
27. Ordering Information
27.1 Military Dual Marked Package
27.1.1
AT28HC256
ICC (mA)
tACC
(ns)
Active
Standby
Ordering Code
Package
Operation Range
AT28HC256-90DM/883
5962-88634 03 XX
28D6
AT28HC256-90FM/883
5962-88634 03 ZX
28F
32L
90
80
0.3
AT28HC256-90LM/883
5962-88634 03 YX
AT28HC256-90UM/883
5962-88634 03 UX
28U
28D6
28F
32L
Military/883C
Class B, Fully Compliant
(-55° C to 125°C)
AT28HC256-12DM/883
5962-88634 01 XX
AT28HC256-12FM/883
5962-88634 01 ZX
120
80
0.3
AT28HC256-12LM/883
5962-88634 01 YX
AT28HC256-12UM/883
5962-88634 01 UX
28U
Package Type
28D6
28-lead, 0.600" Wide, Non-windowed, Ceramic Dual Inline Package (Cerdip)
28-lead, Non-windowed, Ceramic Bottom-brazed Flat Package (Flatpack)
32-pad, Non-windowed, Ceramic Leadless Chip Carrier (LCC)
28-pin, Ceramic Pin Grid Array (PGA)
28F
32L
28U
Options
Blank
Standard Device: Endurance = 10K Write Cycles; Write Time = 10 ms
High Endurance Option: Endurance = 100K Write Cycles
Fast Write Option: Write Time = 3 ms
E
F
13
0007N–PEEPR–9/09
27.1.2
tACC
AT28HC256E(1)
I
CC (mA)
Standby
(ns)
Active
Ordering Code
Package
28D6
28F
Operation Range
AT28HC256E-90DM/883
AT28HC256E-90FM/883
AT28HC256E-90LM/883
AT28HC256E-90UM/883
AT28HC256E-12DM/883
AT28HC256E-12FM/883
AT28HC256E-12LM/883
AT28HC256E-12UM/883
90
80
80
0.3
0.3
32L
Military/883C
Class B, Fully Compliant
(-55° C to 125°C)
28U
28D6
28F
120
32L
28U
Note:
1. No dual marking for this device.
27.1.3
tACC
AT28HC256F
I
CC (mA)
Standby
(ns)
Active
Ordering Code
Package
Operation Range
AT28HC256F-90DM/883
5962-88634 04 XX
28D6
AT28HC256F-90FM/883
5962-88634 04 ZX
28F
32L
90
80
0.3
AT28HC256F-90LM/883
5962-88634 04 YX
AT28HC256F-90UM/883
5962-88634 04 UX
28U
28D6
28F
32L
Military/883C
Class B, Fully Compliant
(-55° C to 125°C)
AT28HC256F-12DM/883
5962-88634 02 XX
AT28HC256F-12FM/883
5962-88634 02 ZX
120
80
0.3
AT28HC256F-12LM/883
5962-88634 02 YX
AT28HC256F-12UM/883
5962-88634 02 UX
28U
Package Type
28D6
28-lead, 0.600" Wide, Non-windowed, Ceramic Dual Inline Package (Cerdip)
28-lead, Non-windowed, Ceramic Bottom-brazed Flat Package (Flatpack)
32-pad, Non-windowed, Ceramic Leadless Chip Carrier (LCC)
28-pin, Ceramic Pin Grid Array (PGA)
28F
32L
28U
Options
Blank
Standard Device: Endurance = 10K Write Cycles; Write Time = 10 ms
High Endurance Option: Endurance = 100K Write Cycles
Fast Write Option: Write Time = 3 ms
E
F
14
AT28HC256
0007N–PEEPR–9/09
AT28HC256
27.2 Industrial Green Package Option (Pb/Halide-free)
27.2.1
AT28HC256
ICC (mA)
tACC
(ns)
Active
Standby
Ordering Code
Package
32J
Operation Range
AT28HC256-70JU
AT28HC256-70SU
AT28HC256-70TU
AT28HC256-90JU
AT28HC256-90SU
AT28HC256-90TU
AT28HC256-12JU
AT28HC256-12SU
AT28HC256-12TU
70
80
80
0.3
28S
28T
32J
Industrial
90
0.3
0.3
28S
28T
(-40°C to 85°C)
32J
120
80
28S
28T
27.2.2
AT28HC256E
I
CC (mA)
tACC
(ns)
Active
Standby
Ordering Code
Package
32J
Operation Range
AT28HC256E-90JU
AT28HC256E-90SU
AT28HC256E-90TU
AT28HC256E-12JU
AT28HC256E-12SU
AT28HC256E-12TU
90
80
0.3
28S
28T
Industrial
(-40°C to 85°C)
32J
120
80
0.3
28S
28T
27.2.3
AT28HC256F
I
CC (mA)
tACC
(ns)
Active
Standby
Ordering Code
Package
32J
Operation Range
AT28HC256F-90JU
AT28HC256F-90SU
AT28HC256F-90TU
Industrial
90
80
0.3
28S
(-40°C to 85°C)
28T
Package Type
32J
32-lead, Plastic J-leaded Chip Carrier (PLCC)
28-lead, 0.300" Wide, Plastic Gull Wing Small Outline (SOIC)
28-lead, Plastic Thin Small Outline Package (TSOP)
Options
28S
28T
Blank
Standard Device: Endurance = 10K Write Cycles; Write Time = 10 ms
High Endurance Option: Endurance = 100K Write Cycles
Fast Write Option: Write Time = 3 ms
E
F
27.3 Ordering Information Note
Previous datasheets included the low power suffixes L, LE and LF on the AT28HC256 for 120 ns and 90 ns speeds.
The low power parameters are now standard; therefore, the L, LE and LF suffixes are no longer required.
15
0007N–PEEPR–9/09
27.4 Die Products
Contact Atmel Sales for die sales options.
16
AT28HC256
0007N–PEEPR–9/09
AT28HC256
28. Packaging Information
28.1 28D6 – Cerdip
Dimensions in Millimeters and (Inches).
Controlling dimension: Inches.
MIL-STD 1835 D-10 Config A (Glass Sealed)
37.85(1.490)
36.58(1.440)
PIN
1
15.49(0.610)
12.95(0.510)
33.02(1.300) REF
5.72(0.225)
MAX
0.127(0.005)MIN
SEATING
PLANE
1.52(0.060)
0.38(0.015)
0.66(0.026)
0.36(0.014)
5.08(0.200)
3.18(0.125)
1.65(0.065)
1.14(0.045)
2.54(0.100)BSC
15.70(0.620)
15.00(0.590)
0º~ 15º REF
0.46(0.018)
0.20(0.008)
17.80(0.700) MAX
10/23/03
TITLE
DRAWING NO. REV.
2325 Orchard Parkway
San Jose, CA 95131
28D6, 28-lead, 0.600" Wide, Non-windowed,
Ceramic Dual Inline Package (Cerdip)
28D6
B
R
17
0007N–PEEPR–9/09
28.2 28F – Flatpack
Dimensions in Millimeters and (Inches).
Controlling dimension: Inches.
MIL-STD 1835 F-12 Config B
9.40(0.370)
6.35(0.250)
PIN #1 ID
0.56(0.022)
0.38(0.015)
1.27(0.050) BSC
18.49(0.728)
18.08(0.712)
1.14(0.045) MAX
10.57(0.416)
9.75(0.384)
0.23(0.009)
0.10(0.004)
3.02(0.119)
2.29(0.090)
1.96(0.077)
1.09(0.043)
1.14(0.045)
7.26(0.286)
6.96(0.274)
0.660(0.026)
10/21/03
DRAWING NO. REV.
28F
TITLE
2325 Orchard Parkway
San Jose, CA 95131
28F, 28-lead, Non-windowed, Ceramic Bottom-brazed
Flat Package (FlatPack)
B
R
18
AT28HC256
0007N–PEEPR–9/09
AT28HC256
28.3 32J – PLCC
1.14(0.045) X 45˚
PIN NO. 1
IDENTIFIER
1.14(0.045) X 45˚
0.318(0.0125)
0.191(0.0075)
E2
E1
E
B1
B
e
A2
A1
D1
D
A
0.51(0.020)MAX
45˚ MAX (3X)
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
3.175
1.524
0.381
12.319
11.354
9.906
14.859
13.894
12.471
0.660
0.330
MAX
3.556
2.413
–
NOM
NOTE
SYMBOL
A
–
D2
A1
A2
D
–
–
–
12.573
D1
D2
E
–
11.506 Note 2
10.922
–
Notes:
1. This package conforms to JEDEC reference MS-016, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
–
15.113
E1
E2
B
–
14.046 Note 2
13.487
–
–
–
0.813
3. Lead coplanarity is 0.004" (0.102 mm) maximum.
B1
e
0.533
1.270 TYP
10/04/01
TITLE
DRAWING NO.
REV.
2325 Orchard Parkway
San Jose, CA 95131
32J, 32-lead, Plastic J-leaded Chip Carrier (PLCC)
32J
B
R
19
0007N–PEEPR–9/09
28.4 32L – LCC
Dimensions in Millimeters and (Inches).
Controlling dimension: Inches.
MIL-STD 1835 C-12
11.63(0.458)
11.23(0.442)
2.54(0.100)
2.16(0.085)
14.22(0.560)
13.72(0.540)
1.91(0.075)
1.40(0.055)
PIN 1
1.40(0.055)
1.14(0.045)
INDEX CORNER
2.41(0.095)
1.91(0.075)
0.635(0.025)
X 45˚
0.381(0.015)
0.305(0.012)
0.178(0.007)
RADIUS
10.16(0.400) BSC
0.737(0.029)
0.533(0.021)
1.27(0.050) TYP
1.02(0.040) X 45˚
2.16(0.085)
1.65(0.065)
7.62(0.300) BSC
10/21/03
TITLE
DRAWING NO. REV.
2325 Orchard Parkway
San Jose, CA 95131
32L, 32-pad, Non-windowed, Ceramic Lid, Leadless Chip
Carrier (LCC)
32L
B
R
20
AT28HC256
0007N–PEEPR–9/09
AT28HC256
28.5 28S – SOIC
Dimensions in Millimeters and (Inches).
Controlling dimension: Millimeters.
0.51(0.020)
0.33(0.013)
7.60(0.2992)
7.40(0.2914)
10.65(0.419)
10.00(0.394)
PIN 1
1.27(0.50) BSC
TOP VIEW
18.10(0.7125)
17.70(0.6969)
2.65(0.1043)
2.35(0.0926)
0.30(0.0118)
0.10(0.0040)
SIDE VIEWS
0.32(0.0125)
0.23(0.0091)
0º ~ 8º
1.27(0.050)
0.40(0.016)
8/4/03
TITLE
DRAWING NO. REV.
2325 Orchard Parkway
San Jose, CA 95131
28S, 28-lead, 0.300" Body, Plastic Gull Wing Small Outline (SOIC)
JEDEC Standard MS-013
28S
B
R
21
0007N–PEEPR–9/09
28.6 28T – TSOP
PIN 1
0º ~ 5º
c
Pin 1 Identifier Area
D1
D
L
b
L1
e
A2
E
GAGE PLANE
A
SEATING PLANE
COMMON DIMENSIONS
(Unit of Measure = mm)
A1
MIN
–
MAX
1.20
0.15
1.05
13.60
NOM
–
NOTE
SYMBOL
A
A1
A2
D
0.05
0.90
13.20
11.70
7.90
0.50
–
1.00
Notes:
1. This package conforms to JEDEC reference MO-183.
2. Dimensions D1 and E do not include mold protrusion. Allowable
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.
3. Lead coplanarity is 0.10 mm maximum.
13.40
11.80
8.00
D1
E
11.90 Note 2
8.10
0.70
Note 2
L
0.60
L1
b
0.25 BASIC
0.22
0.17
0.10
0.27
0.21
c
–
e
0.55 BASIC
12/06/02
DRAWING NO. REV.
28T
TITLE
2325 Orchard Parkway
San Jose, CA 95131
28T, 28-lead (8 x 13.4 mm) Plastic Thin Small Outline
Package, Type I (TSOP)
C
R
22
AT28HC256
0007N–PEEPR–9/09
AT28HC256
28.7 28U – PGA
Dimensions in Millimeters and (Inches).
Controlling dimension: Inches.
7.26(0.286)
6.50(0.256)
13.74(0.540)
13.36(0.526)
2.57(0.101)
2.06(0.081)
1.40(0.055)
1.14(0.045)
0.58(0.023)
0.43(0.017)
15.24(0.600)
14.88(0.586)
3.12(0.123)
2.62(0.103)
1.83(0.072)
1.57(0.062)
14.17(0.558)
13.77(0.542)
2.54(0.100) TYP
16.71(0.658)
16.31(0.642)
12.70(0.500) TYP
2.54(0.100) TYP
10.41(0.410)
9.91(0.390)
10/21/03
TITLE
DRAWING NO. REV.
2325 Orchard Parkway
San Jose, CA 95131
28U, 28-pin, Ceramic Pin Grid Array (PGA)
28U
B
R
23
0007N–PEEPR–9/09
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0007N–PEEPR–9/09
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