AT28HC64B-70JU-T [MICROCHIP]

EEPROM, 8KX8, 70ns, Parallel, CMOS, PQCC32;
AT28HC64B-70JU-T
型号: AT28HC64B-70JU-T
厂家: MICROCHIP    MICROCHIP
描述:

EEPROM, 8KX8, 70ns, Parallel, CMOS, PQCC32

可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器 内存集成电路
文件: 总17页 (文件大小:388K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Features  
Fast Read Access Time – 70 ns  
Automatic Page Write Operation  
– Internal Address and Data Latches for 64 Bytes  
Fast Write Cycle Times  
– Page Write Cycle Time: 10 ms Maximum (Standard)  
2 ms Maximum (Option – Ref. AT28HC64BF Datasheet)  
– 1 to 64-byte Page Write Operation  
Low Power Dissipation  
64K (8K x 8)  
High-speed  
Parallel  
– 40 mA Active Current  
– 100 µA CMOS Standby Current  
Hardware and Software Data Protection  
DATA Polling and Toggle Bit for End of Write Detection  
High Reliability CMOS Technology  
– Endurance: 100,000 Cycles  
EEPROM with  
Page Write and  
Software Data  
Protection  
– Data Retention: 10 Years  
Single 5 V ±10% Supply  
CMOS and TTL Compatible Inputs and Outputs  
JEDEC Approved Byte-wide Pinout  
Industrial Temperature Ranges  
Green (Pb/Halide-free) Packaging Option Only  
1. Description  
AT28HC64B  
The AT28HC64B is a high-performance electrically-erasable and programmable read-  
only memory (EEPROM). Its 64K of memory is organized as 8,192 words by 8 bits.  
Manufactured with Atmel’s advanced nonvolatile CMOS technology, the device offers  
access times to 55 ns with power dissipation of just 220 mW. When the device is  
deselected, the CMOS standby current is less than 100 µA.  
The AT28HC64B is accessed like a Static RAM for the read or write cycle without the  
need for external components. The device contains a 64-byte page register to allow  
writing of up to 64 bytes simultaneously. During a write cycle, the addresses and 1 to  
64 bytes of data are internally latched, freeing the address and data bus for other  
operations. Following the initiation of a write cycle, the device will automatically write  
the latched data using an internal control timer. The end of a write cycle can be  
detected by DATA polling of I/O7. Once the end of a write cycle has been detected, a  
new access for a read or write can begin.  
Atmel’s AT28HC64B has additional features to ensure high quality and manufactura-  
bility. The device utilizes internal error correction for extended endurance and  
improved data retention characteristics. An optional software data protection mecha-  
nism is available to guard against inadvertent writes. The device also includes an  
extra 64 bytes of EEPROM for device identification or tracking.  
0274L–PEEPR–2/3/09  
2.2  
32-lead PLCC Top View  
2. Pin Configurations  
Pin Name  
A0 - A12  
CE  
Function  
Addresses  
A6  
A5  
A4  
A3  
A2  
5
6
7
8
9
29 A8  
28 A9  
27 A11  
26 NC  
25 OE  
24 A10  
23 CE  
22 I/O7  
21 I/O6  
Chip Enable  
Output Enable  
Write Enable  
Data Inputs/Outputs  
No Connect  
OE  
WE  
A1 10  
A0 11  
I/O0 - I/O7  
NC  
NC 12  
I/O0 13  
DC  
Don’t Connect  
Note:  
PLCC package pins 1 and 17 are Don’t Connect.  
2.1  
28-lead SOIC Top View  
2.3  
28-lead TSOP Top View  
NC  
A12  
A7  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
VCC  
WE  
NC  
OE  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
A10  
CE  
2
A11  
A9  
2
3
3
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
GND  
I/O2  
I/O1  
I/O0  
A0  
A6  
4
A8  
A8  
4
A5  
5
A9  
NC  
WE  
VCC  
NC  
A12  
A7  
5
A4  
6
A11  
OE  
6
A3  
7
7
A2  
8
A10  
CE  
8
A1  
9
9
A0  
10  
11  
12  
13  
14  
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
10  
11  
12  
13  
14  
I/O0  
I/O1  
I/O2  
GND  
A6  
A5  
A4  
A1  
A3  
A2  
2
AT28HC64B  
0274L–PEEPR–2/3/09  
AT28HC64B  
3. Block Diagram  
DATA INPUTS/OUTPUTS  
VCC  
GND  
I/O0 - I/O7  
OE  
DATA LATCH  
OE, CE and WE  
LOGIC  
WE  
INPUT/OUTPUT  
BUFFERS  
CE  
Y-GATING  
Y DECODER  
X DECODER  
ADDRESS  
INPUTS  
CELL MATRIX  
IDENTIFICATION  
4. Device Operation  
4.1  
Read  
The AT28HC64B is accessed like a Static RAM. When CE and OE are low and WE is high,  
the data stored at the memory location determined by the address pins is asserted on the out-  
puts. The outputs are put in the high-impedance state when either CE or OE is high. This dual  
line control gives designers flexibility in preventing bus contention in their systems.  
4.2  
Byte Write  
A low pulse on the WE or CE input with CE or WE low (respectively) and OE high initiates a  
write cycle. The address is latched on the falling edge of CE or WE, whichever occurs last.  
The data is latched by the first rising edge of CE or WE. Once a byte write has been started, it  
will automatically time itself to completion. Once a programming operation has been initiated  
and for the duration of tWC, a read operation will effectively be a polling operation.  
4.3  
Page Write  
The page write operation of the AT28HC64B allows 1 to 64 bytes of data to be written into the  
device during a single internal programming period. A page write operation is initiated in the  
same manner as a byte write; after the first byte is written, it can then be followed by 1 to 63  
additional bytes. Each successive byte must be loaded within 150 µs (tBLC) of the previous  
byte. If the tBLC limit is exceeded, the AT28HC64B will cease accepting data and commence  
the internal programming operation. All bytes during a page write operation must reside on the  
same page as defined by the state of the A6 to A12 inputs. For each WE high-to-low transition  
during the page write operation, A6 to A12 must be the same.  
The A0 to A5 inputs specify which bytes within the page are to be written. The bytes may be  
loaded in any order and may be altered within the same load period. Only bytes which are  
specified for writing will be written; unnecessary cycling of other bytes within the page does  
not occur.  
4.4  
DATA Polling  
The AT28HC64B features DATA Polling to indicate the end of a write cycle. During a byte or  
page write cycle, an attempted read of the last byte written will result in the complement of the  
written data to be presented on I/O7. Once the write cycle has been completed, true data is  
valid on all outputs, and the next write cycle may begin. DATA Polling may begin at any time  
during the write cycle.  
3
0274L–PEEPR–2/3/09  
4.5  
Toggle Bit  
In addition to DATA Polling, the AT28HC64B provides another method for determining the end  
of a write cycle. During the write operation, successive attempts to read data from the device  
will result in I/O6 toggling between one and zero. Once the write has completed, I/O6 will stop  
toggling, and valid data will be read. Toggle bit reading may begin at any time during the write  
cycle.  
4.6  
Data Protection  
If precautions are not taken, inadvertent writes may occur during transitions of the host system  
power supply. Atmel® has incorporated both hardware and software features that will protect  
the memory against inadvertent writes.  
4.6.1  
Hardware Protection  
Hardware features protect against inadvertent writes to the AT28HC64B in the following ways:  
(a) VCC sense – if VCC is below 3.8 V (typical), the write function is inhibited; (b) VCC power-on  
delay – once VCC has reached 3.8 V, the device will automatically time out 5 ms (typical)  
before allowing a write; (c) write inhibit – holding any one of OE low, CE high or WE high inhib-  
its write cycles; and (d) noise filter – pulses of less than 15 ns (typical) on the WE or CE inputs  
will not initiate a write cycle.  
4.6.2  
Software Data Protection  
A software-controlled data protection feature has been implemented on the AT28HC64B.  
When enabled, the software data protection (SDP), will prevent inadvertent writes. The SDP  
feature may be enabled or disabled by the user; the AT28HC64B is shipped from Atmel with  
SDP disabled.  
SDP is enabled by the user issuing a series of three write commands in which three specific  
bytes of data are written to three specific addresses (refer to the “Software Data Protection  
Algorithm” diagram on page 10). After writing the 3-byte command sequence and waiting tWC  
,
the entire AT28HC64B will be protected against inadvertent writes. It should be noted that  
even after SDP is enabled, the user may still perform a byte or page write to the AT28HC64B.  
This is done by preceding the data to be written by the same 3-byte command sequence used  
to enable SDP.  
Once set, SDP remains active unless the disable command sequence is issued. Power transi-  
tions do not disable SDP, and SDP protects the AT28HC64B during power-up and power-  
down conditions. All command sequences must conform to the page write timing specifica-  
tions. The data in the enable and disable command sequences is not actually written into the  
device; their addresses may still be written with user data in either a byte or page write  
operation.  
After setting SDP, any attempt to write to the device without the 3-byte command sequence  
will start the internal write timers. No data will be written to the device, however. For the dura-  
tion of tWC, read operations will effectively be polling operations.  
4.7  
Device Identification  
An extra 64 bytes of EEPROM memory are available to the user for device identification. By  
raising A9 to 12 V ±0.5 V and using address locations 1FC0H to 1FFFH, the additional bytes  
may be written to or read from in the same manner as the regular memory array.  
4
AT28HC64B  
0274L–PEEPR–2/3/09  
AT28HC64B  
5. DC and AC Operating Range  
AT28HC64B-70  
AT28HC64B-90  
-40°C - 85°C  
5 V ±10%  
AT28HC64B-120  
-40°C - 85°C  
5 V ±10%  
Operating Temperature (Case)  
CC Power Supply  
-40°C - 85°C  
V
5 V ±10%  
6. Operating Modes  
Mode  
CE  
VIL  
VIL  
VIH  
X
OE  
WE  
VIH  
VIL  
X
I/O  
DOUT  
DIN  
Read  
VIL  
VIH  
X(1)  
X
Write(2)  
Standby/Write Inhibit  
Write Inhibit  
Write Inhibit  
Output Disable  
High Z  
VIH  
X
X
VIL  
VIH  
X
X
High Z  
High Z  
(3)  
Chip Erase  
VIL  
VH  
VIL  
Notes: 1. X can be VIL or VIH.  
2. See “AC Write Waveforms” on page 8.  
3. VH = 12.0 V ±0.5 V.  
7. Absolute Maximum Ratings*  
*NOTICE:  
Stresses beyond those listed under “Absolute  
Maximum Ratings” may cause permanent dam-  
age to the device. This is a stress rating only and  
functional operation of the device at these or any  
other conditions beyond those indicated in the  
operational sections of this specification is not  
implied. Exposure to absolute maximum rating  
conditions for extended periods may affect  
device reliability  
Temperature Under Bias................................ -55°C to +125°C  
Storage Temperature..................................... -65°C to +150°C  
All Input Voltages  
(including NC Pins)  
with Respect to Ground.................................-0.6 V to +6.25 V  
All Output Voltages  
with Respect to Ground...........................-0.6 V to VCC + 0.6 V  
Voltage on OE and A9  
with Respect to Ground..................................-0.6 V to +13.5V  
8. DC Characteristics  
Symbol  
Parameter  
Condition  
Min  
Max  
10  
Units  
µA  
µA  
µA  
mA  
mA  
V
ILI  
Input Load Current  
Output Leakage Current  
VCC Standby Current CMOS  
VCC Standby Current TTL  
VCC Active Current  
Input Low Voltage  
VIN = 0 V to VCC + 1 V  
VI/O = 0 V to VCC  
ILO  
10  
ISB1  
ISB2  
ICC  
CE = VCC - 0.3 V to VCC + 1 V  
CE = 2.0 V to VCC + 1 V  
f = 5 MHz; IOUT = 0 mA  
100(1)  
2(1)  
40  
VIL  
0.8  
VIH  
Input High Voltage  
Output Low Voltage  
Output High Voltage  
2.0  
2.4  
V
VOL  
VOH  
IOL = 2.1 mA  
IOH = -400 µA  
0.40  
V
V
Note:  
1. ISB1 and ISB2 for the 55 ns part is 40 mA maximum.  
5
0274L–PEEPR–2/3/09  
9. AC Read Characteristics  
AT28HC64B-70  
AT28HC64B-90  
AT28HC64B-120  
Symbol Parameter  
tACC Address to Output Delay  
Min  
Max  
70  
Min  
Max  
90  
Min  
Max  
120  
120  
50  
Units  
ns  
(1)  
tCE  
CE to Output Delay  
OE to Output Delay  
OE to Output Float  
Output Hold  
70  
90  
ns  
(2)  
tOE  
0
0
0
35  
0
0
0
40  
0
0
0
ns  
(3)(4)  
tDF  
tOH  
35  
40  
50  
ns  
ns  
10. AC Read Waveforms(1)(2)(3)(4)  
ADDRESS VALID  
ADDRESS  
CE  
OE  
tCE  
tOE  
tDF  
tOH  
tACC  
HIGH Z  
OUTPUT  
OUTPUT VALID  
Notes: 1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC  
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change  
without impact on tACC  
.
.
3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF).  
4. This parameter is characterized and is not 100% tested.  
6
AT28HC64B  
0274L–PEEPR–2/3/09  
AT28HC64B  
11. Input Test Waveforms and Measurement Level  
tR, tF < 5 ns  
12. Output Test Load  
13. Pin Capacitance  
f = 1 MHz, T = 25°C(1)  
Symbol  
CIN  
Typ  
4
Max  
6
Units  
pF  
Conditions  
VIN = 0 V  
COUT  
8
12  
pF  
VOUT = 0 V  
Note:  
1. This parameter is characterized and is not 100% tested.  
7
0274L–PEEPR–2/3/09  
14. AC Write Characteristics  
Symbol  
tAS, tOES  
tAH  
Parameter  
Min  
0
Max  
Units  
ns  
Address, OE Setup Time  
Address Hold Time  
Chip Select Setup Time  
Chip Select Hold Time  
Write Pulse Width (WE or CE)  
Data Setup Time  
50  
0
ns  
tCS  
ns  
tCH  
0
ns  
tWP  
100  
50  
0
ns  
tDS  
ns  
tDH, tOEH  
Data, OE Hold Time  
ns  
15. AC Write Waveforms  
15.1 WE Controlled  
tOES  
OE  
tOEH  
ADDRESS  
tCH  
tAS  
tAH  
CE  
tCS  
WE  
tWP  
tDS  
tDH  
DATA IN  
15.2 CE Controlled  
tOES  
OE  
tOEH  
ADDRESS  
tCH  
tAS  
tAH  
WE  
CE  
tCS  
tWP  
tDS  
tDH  
DATA IN  
8
AT28HC64B  
0274L–PEEPR–2/3/09  
AT28HC64B  
16. Page Mode Characteristics  
Symbol  
Parameter  
Min  
Max  
Units  
ms  
ms  
ns  
tWC  
Write Cycle Time  
10  
2
tWC  
Write Cycle Time (Use AT28HC64BF))  
Address Setup Time  
Address Hold Time  
Data Setup Time  
tAS  
0
50  
50  
0
tAH  
ns  
tDS  
ns  
tDH  
Data Hold Time  
ns  
tWP  
Write Pulse Width  
100  
ns  
tBLC  
tWPH  
Byte Load Cycle Time  
Write Pulse Width High  
150  
µs  
50  
ns  
17. Page Mode Write Waveforms(1)(2)  
OE  
CE  
tBLC  
tWPH  
tWP  
WE  
tAS  
tDH  
tAH  
A0 -A12  
VALID ADD  
tDS  
VALID DATA  
DATA  
tWC  
Notes: 1. A6 through A12 must specify the same page address during each high to low transition of WE (or CE).  
2. OE must be high only when WE and CE are both low.  
18. Chip Erase Waveforms  
tS  
tH  
tW  
tS = tH = 5 µs (min.)  
tW = 10 ms (min.)  
VH = 12.0 V ±0.5 V  
9
0274L–PEEPR–2/3/09  
19. Software Data Protection Enable  
Algorithm(1)  
20. Software Data Protection Disable  
Algorithm(1)  
LOAD DATA AA  
TO  
LOAD DATA AA  
TO  
ADDRESS 1555  
ADDRESS 1555  
LOAD DATA 55  
TO  
LOAD DATA 55  
TO  
ADDRESS 0AAA  
ADDRESS 0AAA  
LOAD DATA A0  
TO  
LOAD DATA 80  
TO  
ADDRESS 1555  
ADDRESS 1555  
WRITES ENABLED(2)  
LOAD DATA XX  
TO  
LOAD DATA AA  
TO  
ANY ADDRESS(4)  
ADDRESS 1555  
LOAD LAST BYTE  
TO  
LOAD DATA 55  
TO  
LAST ADDRESS  
ENTER DATA  
ADDRESS 0AAA  
PROTECT STATE  
LOAD DATA 20  
TO  
Notes: 1. Data Format: I/O7 - I/O0 (Hex);  
Address Format: A12 - A0 (Hex).  
ADDRESS 1555  
EXIT DATA  
PROTECT STATE(3)  
2. Write Protect state will be activated at end of write  
even if no other data is loaded.  
LOAD DATA XX  
TO  
ANY ADDRESS(4)  
3. Write Protect state will be deactivated at end of write  
period even if no other data is loaded.  
LOAD LAST BYTE  
TO  
LAST ADDRESS  
4. 1 to 64 bytes of data are loaded.  
Notes: 1. Data Format: I/O7 - I/O0 (Hex);  
Address Format: A12 - A0 (Hex).  
2. Write Protect state will be activated at end of write  
even if no other data is loaded.  
3. Write Protect state will be deactivated at end of write  
period even if no other data is loaded.  
4. 1 to 64 bytes of data are loaded.  
21. Software Protected Write Cycle Waveforms(1)(2)  
OE  
CE  
tBLC  
tWPH  
tWP  
WE  
tAS  
tDH  
tAH  
A0 -A5  
A6 - A12  
tDS  
DATA  
tWC  
Notes: 1. A6 through A12 must specify the same page address during each high to low transition of WE (or CE) after the software  
code has been entered.  
2. OE must be high only when WE and CE are both low.  
10  
AT28HC64B  
0274L–PEEPR–2/3/09  
AT28HC64B  
22. Data Polling Characteristics(1)  
Symbol  
Parameter  
Min  
0
Typ  
Max  
Units  
ns  
tDH  
Data Hold Time  
tOEH  
tOE  
OE Hold Time  
0
ns  
OE to Output Delay(1)  
Write Recovery Time  
ns  
tWR  
0
ns  
Note:  
1. These parameters are characterized and not 100% tested. See “AC Read Characteristics” on page 6.  
23. Data Polling Waveforms  
tOEH  
tDH  
tWR  
tOE  
24. Toggle Bit Characteristics(1)  
Symbol  
Parameter  
Min  
10  
Typ  
Max  
Units  
ns  
tDH  
Data Hold Time  
OE Hold Time  
tOEH  
tOE  
tOEHP  
tWR  
10  
ns  
OE to Output Delay(2)  
ns  
OE High Pulse  
150  
0
ns  
Write Recovery Time  
ns  
Notes: 1. These parameters are characterized and not 100% tested.  
2. See “AC Read Characteristics” on page 6.  
25. Toggle Bit Waveforms(1)(2)(3)  
tOEH  
tOE  
tDH  
(2)  
tWR  
Notes: 1. Toggling either OE or CE or both OE and CE will operate toggle bit.  
2. Beginning and ending state of I/O6 will vary.  
3. Any address location may be used, but the address should not vary.  
11  
0274L–PEEPR–2/3/09  
26. Normalized ICC Graphs  
12  
AT28HC64B  
0274L–PEEPR–2/3/09  
AT28HC64B  
27. Ordering Information  
27.1 Green Package Option (Pb/Halide-free)  
I
CC (mA)  
tACC  
(ns)  
Active  
Standby  
Ordering Code  
AT28HC64B-70TU  
AT28HC64B-70JU  
AT28HC64B-70SU  
AT28HC64B-90JU  
AT28HC64B-90SU  
Package  
28T  
Operation Range  
70  
40  
0.1  
32J  
28S  
32J  
Industrial  
28S  
90  
40  
40  
0.1  
0.1  
(-40°C to 85°C)  
AT28HC64B-90TU  
AT28HC64B-12JU  
AT28HC64B-12SU  
28T  
32J  
28S  
120  
Package Type  
32J  
32-lead, Plastic J-leaded Chip Carrier (PLCC)  
28S  
28T  
28-lead, 0.300" Wide, Plastic Gull Wing Small Outline (SOIC)  
28-lead, Plastic Thin Small Outline Package (TSOP)  
27.2 Die Products  
Contact Atmel Sales for die sales options.  
13  
0274L–PEEPR–2/3/09  
28. Packaging Information  
28.1 32J – PLCC  
1.14(0.045) X 45˚  
PIN NO. 1  
IDENTIFIER  
1.14(0.045) X 45˚  
0.318(0.0125)  
0.191(0.0075)  
E2  
E1  
E
B1  
B
e
A2  
A1  
D1  
D
A
0.51(0.020)MAX  
45˚ MAX (3X)  
COMMON DIMENSIONS  
(Unit of Measure = mm)  
MIN  
3.175  
1.524  
0.381  
12.319  
11.354  
9.906  
14.859  
13.894  
12.471  
0.660  
0.330  
MAX  
3.556  
2.413  
NOM  
NOTE  
SYMBOL  
A
D2  
A1  
A2  
D
12.573  
D1  
D2  
E
11.506 Note 2  
10.922  
Notes:  
1. This package conforms to JEDEC reference MS-016, Variation AE.  
2. Dimensions D1 and E1 do not include mold protrusion.  
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1  
and E1 include mold mismatch and are measured at the extreme  
material condition at the upper or lower parting line.  
15.113  
E1  
E2  
B
14.046 Note 2  
13.487  
0.813  
3. Lead coplanarity is 0.004" (0.102 mm) maximum.  
B1  
e
0.533  
1.270 TYP  
10/04/01  
TITLE  
DRAWING NO.  
REV.  
2325 Orchard Parkway  
San Jose, CA 95131  
32J, 32-lead, Plastic J-leaded Chip Carrier (PLCC)  
32J  
B
R
14  
AT28HC64B  
0274L–PEEPR–2/3/09  
AT28HC64B  
28.2 28S – SOIC  
Dimensions in Millimeters and (Inches).  
Controlling dimension: Millimeters.  
0.51(0.020)  
0.33(0.013)  
7.60(0.2992)  
7.40(0.2914)  
10.65(0.419)  
10.00(0.394)  
PIN 1  
1.27(0.50) BSC  
TOP VIEW  
18.10(0.7125)  
17.70(0.6969)  
2.65(0.1043)  
2.35(0.0926)  
0.30(0.0118)  
0.10(0.0040)  
SIDE VIEWS  
0.32(0.0125)  
0.23(0.0091)  
0º ~ 8º  
1.27(0.050)  
0.40(0.016)  
8/4/03  
TITLE  
DRAWING NO. REV.  
2325 Orchard Parkway  
San Jose, CA 95131  
28S, 28-lead, 0.300" Body, Plastic Gull Wing Small Outline (SOIC)  
JEDEC Standard MS-013  
28S  
B
R
15  
0274L–PEEPR–2/3/09  
28.3 28T – TSOP  
PIN 1  
0º ~ 5º  
c
Pin 1 Identifier Area  
D1  
D
L
b
L1  
e
A2  
E
GAGE PLANE  
A
SEATING PLANE  
COMMON DIMENSIONS  
(Unit of Measure = mm)  
A1  
MIN  
MAX  
1.20  
0.15  
1.05  
13.60  
NOM  
NOTE  
SYMBOL  
A
A1  
A2  
D
0.05  
0.90  
13.20  
11.70  
7.90  
0.50  
1.00  
Notes:  
1. This package conforms to JEDEC reference MO-183.  
2. Dimensions D1 and E do not include mold protrusion. Allowable  
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.  
3. Lead coplanarity is 0.10 mm maximum.  
13.40  
11.80  
8.00  
D1  
E
11.90 Note 2  
8.10  
0.70  
Note 2  
L
0.60  
L1  
b
0.25 BASIC  
0.22  
0.17  
0.10  
0.27  
0.21  
c
e
0.55 BASIC  
12/06/02  
DRAWING NO. REV.  
28T  
TITLE  
2325 Orchard Parkway  
San Jose, CA 95131  
28T, 28-lead (8 x 13.4 mm) Plastic Thin Small Outline  
Package, Type I (TSOP)  
C
R
16  
AT28HC64B  
0274L–PEEPR–2/3/09  
Headquarters  
International  
Atmel Corporation  
2325 Orchard Parkway  
San Jose, CA 95131  
USA  
Tel: 1(408) 441-0311  
Fax: 1(408) 487-2600  
Atmel Asia  
Atmel Europe  
Le Krebs  
Atmel Japan  
9F, Tonetsu Shinkawa Bldg.  
1-24-8 Shinkawa  
Chuo-ku, Tokyo 104-0033  
Japan  
Tel: (81) 3-3523-3551  
Fax: (81) 3-3523-7581  
Unit 1-5 & 16, 19/F  
BEA Tower, Millennium City 5  
418 Kwun Tong Road  
Kwun Tong, Kowloon  
Hong Kong  
8, Rue Jean-Pierre Timbaud  
BP 309  
78054 Saint-Quentin-en-  
Yvelines Cedex  
France  
Tel: (852) 2245-6100  
Fax: (852) 2722-1369  
Tel: (33) 1-30-60-70-00  
Fax: (33) 1-30-60-71-11  
Product Contact  
Web Site  
Technical Support  
Sales Contact  
www.atmel.com  
p_eeprom@atmel.com  
www.atmel.com/contacts  
Literature Requests  
www.atmel.com/literature  
Disclaimer: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to any  
intellectual property right is granted by this document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN ATMEL’S TERMS AND CONDI-  
TIONS OF SALE LOCATED ON ATMEL’S WEB SITE, ATMEL ASSUMES NO LIABILITY WHATSOEVER AND DISCLAIMS ANY EXPRESS, IMPLIED OR STATUTORY  
WARRANTY RELATING TO ITS PRODUCTS INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY, FITNESS FOR A PARTICULAR  
PURPOSE, OR NON-INFRINGEMENT. IN NO EVENT SHALL ATMEL BE LIABLE FOR ANY DIRECT, INDIRECT, CONSEQUENTIAL, PUNITIVE, SPECIAL OR INCIDEN-  
TAL DAMAGES (INCLUDING, WITHOUT LIMITATION, DAMAGES FOR LOSS OF PROFITS, BUSINESS INTERRUPTION, OR LOSS OF INFORMATION) ARISING OUT  
OF THE USE OR INABILITY TO USE THIS DOCUMENT, EVEN IF ATMEL HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. Atmel makes no  
representations or warranties with respect to the accuracy or completeness of the contents of this document and reserves the right to make changes to specifications  
and product descriptions at any time without notice. Atmel does not make any commitment to update the information contained herein. Unless specifically provided  
otherwise, Atmel products are not suitable for, and shall not be used in, automotive applications. Atmel’s products are not intended, authorized, or warranted for use  
as components in applications intended to support or sustain life.  
© 2009 Atmel Corporation. All rights reserved. Atmel®, logo and combinations thereof, and others are registered trademarks or trademarks of  
Atmel Corporation or its subsidiaries. Other terms and product names may be trademarks of others.  
0274L–PEEPR–2/3/09  

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