MCP6V03T-E/SN [MICROCHIP]
300 μA, Auto-Zeroed Op Amps; 300 μA ,自动调零运算放大器型号: | MCP6V03T-E/SN |
厂家: | MICROCHIP |
描述: | 300 μA, Auto-Zeroed Op Amps |
文件: | 总44页 (文件大小:1034K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
MCP6V01/2/3
300 µA, Auto-Zeroed Op Amps
Features
Description
• High DC Precision:
The Microchip Technology Inc. MCP6V01/2/3 family of
operational amplifiers has input offset voltage
correction for very low offset and offset drift. These
devices have a wide gain bandwidth product (1.3 MHz,
typical) and strongly reject switching noise. They are
unity gain stable, have no 1/f noise, and have good
PSRR and CMRR. These products operate with a
single supply voltage as low as 1.8V, while drawing
300 µA/amplifier (typical) of quiescent current.
- VOS Drift: ±50 nV/°C (maximum)
- VOS: ±2 µV (maximum)
- AOL: 130 dB (minimum)
- PSRR: 130 dB (minimum)
- CMRR: 130 dB (minimum)
- Eni: 2.5 µVP-P (typical), f = 0.1 Hz to 10 Hz
- Eni: 0.79 µVp-p (typical), f = 0.01 Hz to 1 Hz
• Low Power and Supply Voltages:
- IQ: 300 µA/amplifier (typical)
- Wide Supply Voltage Range: 1.8V to 5.5V
• Easy to Use:
The Microchip Technology Inc. MCP6V01/2/3 op amps
are offered in single (MCP6V01), single with Chip
Select (CS) (MCP6V03), and dual (MCP6V02). They
are designed in an advanced CMOS process.
- Rail-to-Rail Input/Output
Package Types (top view)
- Gain Bandwidth Product: 1.3 MHz (typical)
- Unity Gain Stable
MCP6V01
SOIC
MCP6V01
2x3 TDFN *
- Available in Single and Dual
- Single with Chip Select (CS): MCP6V03
• Extended Temperature Range: -40°C to +125°C
NC
NC
NC
NC
1
8
7
1
2
8
7
VIN
–
+
VDD
2
VIN–
VDD
EP
9
VIN
VOUT
NC
3
4
6
5
VIN
+
VOUT
NC
3
4
6
5
VSS
VSS
Typical Applications
• Portable Instrumentation
• Sensor Conditioning
MCP6V02
4x4 DFN *
MCP6V02
SOIC
• Temperature Measurement
• DC Offset Correction
VDD
1
2
3
4
8
7
6
5
VOUTA
VOUTA
VDD
1
8
7
VOUTB
VINA
–
+
VINA
–
+
VOUTB
2
EP
9
• Medical Instrumentation
VINB
VINB
–
+
VINA
VINA
VINB
VINB
–
+
3
4
6
5
VSS
VSS
Design Aids
MCP6V03
SOIC
MCP6V03
2x3 TDFN *
• SPICE Macro Models
• FilterLab® Software
NC
CS
1
2
8
7
NC
CS
1
2
8
7
• Mindi™ Circuit Designer & Simulator
• Microchip Advanced Part Selector (MAPS)
• Analog Demonstration and Evaluation Boards
• Application Notes
VIN
–
+
VDD
VIN
VIN
VSS
–
VDD
EP
9
VIN
VOUT
NC
3
4
6
5
+
VOUT
NC
3
4
6
5
VSS
* Includes Exposed Thermal Pad (EP); see Table 3-1.
Related Parts
• MCP6V06/7/8: Non-spread clock, lower noise
© 2008 Microchip Technology Inc.
DS22058C-page 1
MCP6V01/2/3
Typical Application Circuit
R1
R3
VIN
VOUT
R2
C2
MCP6XXX
3 kΩ
R2
VDD/2
MCP6V01
Offset Voltage Correction for Power Driver
DS22058C-page 2
© 2008 Microchip Technology Inc.
MCP6V01/2/3
1.0
1.1
ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings †
VDD – VSS .......................................................................6.5V
† Notice: Stresses above those listed under “Absolute
Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of
the device at those or any other conditions above those
indicated in the operational listings of this specification is not
implied. Exposure to maximum rating conditions for extended
periods may affect device reliability.
Current at Input Pins ....................................................±2 mA
Analog Inputs (VIN+ and VIN–) †† ... VSS – 1.0V to VDD+1.0V
All other Inputs and Outputs ............ VSS – 0.3V to VDD+0.3V
Difference Input voltage ...................................... |VDD – VSS
|
Output Short Circuit Current ................................Continuous
Current at Output and Supply Pins ............................±30 mA
Storage Temperature ...................................-65°C to +150°C
Max. Junction Temperature ........................................+150°C
ESD protection on all pins (HBM, MM) ................≥ 4 kV, 300V
†† See Section 4.2.1 “Rail-to-Rail Inputs”.
1.2
Specifications
TABLE 1-1:
DC ELECTRICAL SPECIFICATIONS
Electrical Characteristics: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to +5.5V, VSS = GND, VCM = VDD/3,
V
OUT = VDD/2, VL = VDD/2, RL = 20 kΩ to VL, and CS = GND (refer to Figure 1-5 and Figure 1-6).
Parameters
Sym
Min
Typ
Max
Units
Conditions
Input Offset
Input Offset Voltage
VOS
TC1
-2.0
-50
—
—
+2.0
+50
µV
TA = +25°C (Note 1)
Input Offset Voltage Drift with Temperature
(linear Temp. Co.)
nV/°C TA = -40 to +125°C
(Note 1)
Input Offset Voltage Quadratic Temp. Co.
Power Supply Rejection
TC2
—
±0.1
143
—
—
nV/°C2 TA = -40 to +125°C
PSRR
130
dB
(Note 1)
Input Bias Current and Impedance
Input Bias Current
IB
IB
—
—
±1
60
—
—
pA
pA
Input Bias Current across Temperature
TA = +85°C
IB
—
600
5000
—
pA
TA = +125°C
Input Offset Current
IOS
IOS
IOS
ZCM
ZDIFF
—
-30
pA
Input Offset Current across Temperature
—
-50
—
pA
TA = +85°C
-1000
—
-75
1000
—
pA
TA = +125°C
Common Mode Input Impedance
Differential Input Impedance
Common Mode
1013||6
1013||6
Ω||pF
Ω||pF
—
—
Common-Mode Input Voltage Range
Common-Mode Rejection
VCMR
VSS − 0.20
—
VDD + 0.20
—
V
(Note 2)
CMRR
130
142
dB
VDD = 1.8V,
V
CM = -0.2V to 2.0V
(Note 1, Note 2)
CMRR
140
152
—
dB
VDD = 5.5V,
V
CM = -0.2V to 5.7V
(Note 1, Note 2)
Open-Loop Gain
DC Open-Loop Gain (large signal)
AOL
AOL
130
140
145
156
—
—
dB
dB
VDD = 1.8V,
V
OUT = 0.2V to 1.6V (Note 1)
VDD = 5.5V,
OUT = 0.2V to 5.3V (Note 1)
V
Note 1: Set by design and characterization. Due to thermal junction and other effects in the production environment, these parts
can only be screened in production (except TC1; see Appendix B: “Offset Related Test Screens”).
2: Figure 2-18 shows how VCMR changed across temperature for the first three production lots.
© 2008 Microchip Technology Inc.
DS22058C-page 3
MCP6V01/2/3
TABLE 1-1:
DC ELECTRICAL SPECIFICATIONS (CONTINUED)
Electrical Characteristics: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to +5.5V, VSS = GND, VCM = VDD/3,
V
OUT = VDD/2, VL = VDD/2, RL = 20 kΩ to VL, and CS = GND (refer to Figure 1-5 and Figure 1-6).
Parameters
Sym
Min
Typ
Max
Units
Conditions
Output
Maximum Output Voltage Swing
Output Short Circuit Current
V
OL, VOH VSS + 15
—
±7
VDD − 15
mV
mA
mA
G = +2, 0.5V input overdrive
VDD = 1.8V
ISC
ISC
—
—
—
—
±22
VDD = 5.5V
Power Supply
Supply Voltage
VDD
IQ
1.8
200
1.15
—
300
—
5.5
400
1.65
V
µA
V
Quiescent Current per amplifier
POR Trip Voltage
IO = 0
VPOR
Note 1: Set by design and characterization. Due to thermal junction and other effects in the production environment, these parts
can only be screened in production (except TC1; see Appendix B: “Offset Related Test Screens”).
2: Figure 2-18 shows how VCMR changed across temperature for the first three production lots.
TABLE 1-2:
AC ELECTRICAL SPECIFICATIONS
Electrical Characteristics: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to +5.5V, VSS = GND, VCM = VDD/3,
OUT = VDD/2, VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND (refer to Figure 1-5 and Figure 1-6).
V
Parameters
Sym Min Typ Max Units
Conditions
Amplifier AC Response
Gain Bandwidth Product
Slew Rate
GBWP
SR
—
—
—
1.3
0.5
65
—
—
—
MHz
V/µs
°
Phase Margin
PM
G = +1
Amplifier Noise Response
Input Noise Voltage
Eni
Eni
eni
eni
ini
—
—
—
—
—
0.79
2.5
120
45
—
—
—
—
—
µVP-P f = 0.01 Hz to 1 Hz
µVP-P f = 0.1 Hz to 10 Hz
nV/√Hz f < 2.5 kHz
nV/√Hz f = 100 kHz
fA/√Hz
Input Noise Voltage Density
Input Noise Current Density
Amplifier Distortion (Note 1)
Intermodulation Distortion (AC)
0.6
IMD
IMD
—
—
<1
<1
—
—
µVPK VCM tone = 50 mVPK at 1 kHz, GN = 1, VDD = 1.8V
µVPK VCM tone = 50 mVPK at 1 kHz, GN = 1, VDD = 5.5V
Amplifier Step Response
Start Up Time
tSTR
tSTL
—
—
500
300
—
—
µs
µs
VOS within 50 µV of its final value
G = +1, VIN step of 2V,
Offset Correction Settling Time
V
OS within 50 µV of its final value
G = -100, ±0.5V input overdrive to VDD/2,
IN 50% point to VOUT 90% point (Note 2)
Output Overdrive Recovery Time
tODR
—
100
—
µs
V
Note 1: These parameters were characterized using the circuit in Figure 1-7. Figure 2-37 and Figure 2-38 show both an IMD
tone at DC and a residual tone at1 kHz; all other IMD and clock tones are spread by the randomization circuitry.
2:
tODR includes some uncertainty due to clock edge timing.
DS22058C-page 4
© 2008 Microchip Technology Inc.
MCP6V01/2/3
TABLE 1-3:
DIGITAL ELECTRICAL SPECIFICATIONS
Electrical Characteristics: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to +5.5V, VSS = GND, VCM = VDD/3,
OUT = VDD/2, VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND (refer to Figure 1-5 and Figure 1-6).
V
Parameters
Sym
Min
Typ
Max Units
Conditions
CS Pull-Down Resistor (MCP6V03)
CS Pull-Down Resistor
RPD
3
5
—
MΩ
CS Low Specifications (MCP6V03)
CS Logic Threshold, Low
VIL
VSS
—
—
5
0.3VDD
—
V
CS Input Current, Low
ICSL
pA
CS = VSS
CS = VDD
CS High Specifications (MCP6V03)
CS Logic Threshold, High
VIH
0.7VDD
—
—
VDD
—
V
CS Input Current, High
ICSH
VDD/RPD
pA
CS Input High, GND Current per
amplifier
ISS
ISS
—
—
—
-0.7
-2.3
20
—
—
—
µA
µA
pA
CS = VDD, VDD = 1.8V
CS = VDD, VDD = 5.5V
CS = VDD
Amplifier Output Leakage, CS High IO_LEAK
CS Dynamic Specifications (MCP6V03)
CS Low to Amplifier Output On
Turn-on Time
tON
—
—
—
11
10
100
—
µs
µs
V
CS Low = VSS+0.3 V, G = +1 V/V,
VOUT = 0.9 VDD/2
CS High to Amplifier Output High-Z
tOFF
CS High = VDD – 0.3 V, G = +1 V/V,
VOUT = 0.1 VDD/2
Internal Hysteresis
VHYST
0.25
—
TABLE 1-4:
TEMPERATURE SPECIFICATIONS
Electrical Characteristics: Unless otherwise indicated, all limits are specified for: VDD = +1.8V to +5.5V, VSS = GND.
Parameters
Temperature Ranges
Sym
Min
Typ
Max
Units
Conditions
Specified Temperature Range
Operating Temperature Range
Storage Temperature Range
TA
TA
TA
-40
-40
-65
—
—
—
+125
+125
+150
°C
°C
°C
(Note 1)
Thermal Package Resistances
Thermal Resistance, 8L-2x3 TDFN
Thermal Resistance, 8L-4x4 DFN
Thermal Resistance, 8L-SOIC
θJA
θJA
θJA
—
—
—
41
44
—
—
—
°C/W
°C/W (Note 2)
150
°C/W
Note 1: Operation must not cause TJ to exceed Maximum Junction Temperature specification (150°C).
2: Measured on a standard JC51-7, four layer printed circuit board with ground plane and vias.
© 2008 Microchip Technology Inc.
DS22058C-page 5
MCP6V01/2/3
1.3
Timing Diagrams
1.4
Test Circuits
The circuits used for the DC and AC tests are shown in
Figure 1-5 and Figure 1-6. Lay the bypass capacitors
out as discussed in Section 4.3.8 “Supply Bypassing
and Filtering”. RN is equal to the parallel combination
of RF and RG to minimize bias current effects.
1.8V to 5.5V
VOS + 50 µV
1.8V
0V
VDD
tSTR
VOS
VDD
VOS – 50 µV
1 µF
RN
MCP6V0X
VDD/3
VIN
RISO
CL
VOUT
FIGURE 1-1:
Amplifier Start Up.
RL
100 nF
RF
VIN
VL
RG
tSTL
VOS + 50 µV
VOS + 50 µV
FIGURE 1-5:
Most Non-Inverting Gain Conditions.
AC and DC Test Circuit for
VOS
VDD
1 µF
FIGURE 1-2:
Time.
Offset Correction Settling
RN
VDD/3
MCP6V0X
VIN
RISO
CL
VOUT
RL
VIN
100 nF
RF
tODR
VL
RG
VDD
FIGURE 1-6:
AC and DC Test Circuit for
Most Inverting Gain Conditions.
tODR
VOUT
The circuit in Figure 1-7 tests the op amp input’s
dynamic behavior (i.e., IMD, tSTR, tSTL and tODR). The
potentiometer balances the resistor network (VOUT
should equal VREF at DC). The op amp’s common
mode input voltage is VCM = VIN/2. The error at the
input (VERR) appears at VOUT with a noise gain of
10 V/V.
VDD/2
VSS
FIGURE 1-3:
Output Overdrive Recovery.
CS
VIL
VIH
tON
tOFF
20.0 kΩ 20.0 kΩ 50Ω
0.1%
0.1% 25 turn
VREF
VOUT
High-Z
1 µA
High-Z
1 µA
VDD
1 µF
(typical)
(typical)
300 µA
IDD
(typical)
300 µA
RISO
CL
VOUT
RL
VIN
(typical)
-2 µA
(typical)
-2 µA
100 nF
ISS
(typical)
5 pA
(typical)
MCP6V0X
VL
ICS
VDD/5 MΩ
(typical)
VDD/5 MΩ
(typical)
20.0 kΩ
0.1%
20.0 kΩ 24.9 Ω
0.1%
FIGURE 1-4:
Chip Select (MCP6V03).
FIGURE 1-7:
Test Circuit for Dynamic
Input Behavior.
DS22058C-page 6
© 2008 Microchip Technology Inc.
MCP6V01/2/3
2.0
TYPICAL PERFORMANCE CURVES
Note:
The graphs and tables provided following this note are a statistical summary based on a limited number of
samples and are provided for informational purposes only. The performance characteristics listed herein
are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified
operating range (e.g., outside specified power supply range) and therefore outside the warranted range.
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
2.1
DC Input Precision
4
3
20%
VCM = VCMR_L
Representative Part
78 Samples
A = +25°C
VDD = 1.8V and 5.5V
Soldered on PCB
18%
16%
14%
12%
10%
8%
T
2
1
0
-1
-2
-3
-4
6%
+125°C
+85°C
+25°C
-40°C
4%
2%
0%
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5
Power Supply Voltage (V)
Input Offset Voltage (µV)
FIGURE 2-1:
Input Offset Voltage.
FIGURE 2-4:
Input Offset Voltage vs.
Power Supply Voltage with V
= V
.
CM
CMR_L
22%
4
3
78 Samples
VDD = 1.8V and 5.5V
Soldered on PCB
VCM = VCMR_H
Representative Part
20%
18%
16%
14%
12%
10%
8%
6%
4%
2%
0%
2
1
0
-1
+125°C
+85°C
+25°C
-40°C
-2
-3
-4
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5
Power Supply Voltage (V)
Input Offset Voltage Drift; TC1 (nV/°C)
FIGURE 2-2:
Input Offset Voltage Drift.
FIGURE 2-5:
Input Offset Voltage vs.
Power Supply Voltage with V
= V
.
CM
CMR_H
22%
4
78 Samples
VDD = 1.8V and 5.5V
Soldered on PCB
Representative Part
20%
18%
16%
14%
12%
10%
8%
3
2
VDD = 1.8V
VDD = 5.5V
1
0
6%
4%
2%
0%
-1
-2
-3
-4
Input Offset Voltage's Quadratic Temp Co;
TC2 (nV/°C2)
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5
Output Voltage (V)
FIGURE 2-3:
Quadratic Temp Co.
Input Offset Voltage
FIGURE 2-6:
Output Voltage.
Input Offset Voltage vs.
© 2008 Microchip Technology Inc.
DS22058C-page 7
MCP6V01/2/3
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
4
3
14%
12%
10%
8%
VDD = 1.8V
Representative Part
40 Samples
A = +25°C
Soldered on PCB
T
2
1
0
6%
+125°C
+85°C
+25°C
-40°C
-1
-2
-3
-4
4%
2%
0%
1/PSRR (µV/V)
Input Common Mode Voltage (V)
FIGURE 2-7:
Input Offset Voltage vs.
FIGURE 2-10:
PSRR.
Common Mode Voltage with V = 1.8V.
DD
4
55%
VDD = 5.5V
+125°C
40 Samples
TA = +25°C
50%
45%
40%
35%
30%
25%
20%
15%
10%
5%
3
2
Representative Part
+85°C
+25°C
-40°C
VDD = 5.5V
1
0
-1
-2
-3
-4
VDD = 1.8V
0%
1/AOL (µV/V)
Input Common Mode Voltage (V)
FIGURE 2-8:
Input Offset Voltage vs.
FIGURE 2-11:
DC Open-Loop Gain.
Common Mode Voltage with V = 5.5V.
DD
160
35%
VDD = 5.5V
VDD = 1.8V
39 Samples
155
150
145
140
135
130
125
120
TA = +25°C
30%
25%
20%
15%
10%
5%
VDD = 5.5V
Soldered on PCB
PSRR
CMRR
VDD = 1.8V
0%
-50
-25
0
25
50
75
100
125
1/CMRR (µV/V)
Ambient Temperature (°C)
FIGURE 2-9:
CMRR.
FIGURE 2-12:
CMRR and PSRR vs.
Ambient Temperature.
DS22058C-page 8
© 2008 Microchip Technology Inc.
MCP6V01/2/3
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
160
155
150
145
140
135
130
125
120
1,000
100
10
VDD = 5.5V
VDD = 5.5V
VDD = 1.8V
-IOS
IB
1
-50
-25
0
25
50
75
100
125
25 35 45 55 65 75 85 95 105 115 125
Ambient Temperature (°C)
Ambient Temperature (°C)
FIGURE 2-13:
Ambient Temperature.
DC Open-Loop Gain vs.
FIGURE 2-16:
Currents vs. Ambient Temperature with
= +5.5V.
Input Bias and Offset
V
DD
160
140
120
100
80
1.E1-00m2
TA = +85°C
VDD = 5.5V
1.E-10m3
1.E10-004µ
10µ
1.E-05
1µ
1.E-06
100n
1.E- 7
IB
60
40
10n
1.E-08
20
0
-20
-40
-60
+125°C
+85°C
+25°C
-40°C
1n
1.E-09
100p
1.E-10
10p
1.E-11
IOS
1p
1.E-12
-1.0 -0.9 -0.8 -0.7 -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 0.0
Input Voltage (V)
Common Mode Input Voltage (V)
FIGURE 2-14:
Input Bias and Offset
FIGURE 2-17:
Input Bias Current vs. Input
Currents vs. Common Mode Input Voltage with
Voltage (below V ).
SS
T = +85°C.
A
1600
1400
1200
1000
800
600
400
200
0
TA = +125°C
VDD = 5.5V
IB
IOS
-200
-400
Common Mode Input Voltage (V)
FIGURE 2-15:
Input Bias and Offset
Currents vs. Common Mode Input Voltage with
T = +125°C.
A
© 2008 Microchip Technology Inc.
DS22058C-page 9
MCP6V01/2/3
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
2.2
Other DC Voltages and Currents
0.05
40
30
3 Lots
-40°C
+25°C
+85°C
+125°C
0.00
-0.05
-0.10
-0.15
20
10
0
Lower (VCMR – VSS
)
-10
-20
-30
-40
-0.20
-0.25
-0.30
-0.35
+125°C
+85°C
+25°C
-40°C
Upper ( VDD – VCMR
)
-50
-25
0
25
50
75
100 125
Ambient Temperature (°C)
Power Supply Voltage (V)
FIGURE 2-18:
Input Common Mode
FIGURE 2-21:
Output Short Circuit Current
Voltage Headroom (Range) vs. Ambient
Temperature.
vs. Power Supply Voltage.
1000
450
400
350
300
250
VDD = 5.5V
VDD = 1.8V
100
+125°C
200
150
100
50
+85°C
+25°C
-40°C
VDD – VOH
VOL – VSS
0
10
0.1
1
10
Power Supply Voltage (V)
Output Current Magnitude (mA)
FIGURE 2-22:
Supply Current vs. Power
FIGURE 2-19:
Output Voltage Headroom
Supply Voltage.
vs. Output Current.
30%
12
11
93 Samples
3 Lots
RL = 20 kΩ
25%
20%
15%
10%
5%
TA = +25°C
10
9
8
7
6
5
4
3
2
VDD = 5.5V
VOL – VSS
VDD – VOH
VDD = 1.8V
1
0
0%
-50
-25
0
25
50
75
100
125
Ambient Temperature (°C)
POR Trip Voltage (V)
FIGURE 2-23:
Power On Reset Trip
FIGURE 2-20:
Output Voltage Headroom
Voltage.
vs. Ambient Temperature.
DS22058C-page 10
© 2008 Microchip Technology Inc.
MCP6V01/2/3
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
-50
-25
0
25
50
75
100
125
Ambient Temperature (°C)
FIGURE 2-24:
Power On Reset Voltage vs.
Ambient Temperature.
© 2008 Microchip Technology Inc.
DS22058C-page 11
MCP6V01/2/3
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
2.3
Frequency Response
110
100
90
80
70
60
50
40
30
20
10
0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
130
120
110
100
90
VDD = 5.5V
GBWP
CMRR
80
70
60
PM
VDD = 1.8V
PSRR+
PSRR-
50
40
-50 -25
0
25
50
75 100 125
10
100
1k
10k
100k
1M
1.E+01 1.E+02 1.E+03 1.E+04 1.E+05 1.E+06
Frequency (Hz)
Ambient Temperature (°C)
FIGURE 2-25:
CMRR and PSRR vs.
FIGURE 2-28:
Gain Bandwidth Product
Frequency.
and Phase Margin vs. Ambient Temperature.
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
130
120
110
100
90
60
50
40
30
20
10
0
0
GBWP
VDD = 1.8V
CL = 60 pF
-30
-60
-90
VDD = 5.5V
∠AOL
-120
-150
-180
-210
-240
-270
VDD = 1.8V
80
| AOL
|
70
60
-10
-20
50
PM
40
-30
1k
10k
1.E+04
100k
1.E+05
Frequency (Hz)
1M
1.E+06
10M
1.E+03
1.E+07
Common Mode Input Voltage (V)
FIGURE 2-26:
Open-Loop Gain vs.
FIGURE 2-29:
Gain Bandwidth Product
Frequency with V = 1.8V.
and Phase Margin vs. Common Mode Input
Voltage.
DD
60
50
40
30
20
10
0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
130
120
110
100
90
VDD = 5.5V
CL = 60 pF
GBWP
-30
-60
-90
∠AOL
VDD = 5.5V
-120
-150
-180
-210
-240
-270
VDD = 1.8V
80
| AOL
|
70
0
-10
-20
-30
60
50
PM
40
1k
10k
1.E+04
100k
1.E+05
Frequency (Hz)
1M
1.E+06
10M
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5
Output Voltage (V)
1.E+03
1.E+07
FIGURE 2-27:
Open-Loop Gain vs.
FIGURE 2-30:
Gain Bandwidth Product
Frequency with V = 5.5V.
and Phase Margin vs. Output Voltage.
DD
DS22058C-page 12
© 2008 Microchip Technology Inc.
MCP6V01/2/3
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
100
90
80
70
60
50
40
30
20
10
0
1+00k4
RTI
VDD = 1.8V
1k
+03
VDD = 5.5V
100
+02
VDD = 1.8V
G = 1 V/V
G = 10 V/V
G = 100 V/V
10
+01
1
+00
100k
1M
1.0E+06
10M
1.0E+07
100M
1.0E+08
100k
1M
10M
1.0E+05
1.E+05
1.E+06
Frequency (Hz)
1.E+07
Frequency (Hz)
FIGURE 2-31:
Closed-Loop Output
FIGURE 2-33:
Channel-to-Channel
Impedance vs. Frequency with V = 1.8V.
Separation vs. Frequency.
DD
+1004k
10
VDD = 5.5V
VDD = 5.5V
1k
+03
VDD = 1.8V
100
+02
1
G = 1 V/V
G = 10 V/V
G = 100 V/V
10
+01
1
+00
0.1
1k
10k
1.E+04
100k
Frequency (Hz)
1M
100k
1M
1.0E+06
10M
1.0E+07
100M
1.0E+08
1.0E+05
1.E+03
1.E+05
1.E+06
Frequency (Hz)
FIGURE 2-32:
Closed-Loop Output
FIGURE 2-34:
Maximum Output Voltage
Impedance vs. Frequency with V = 5.5V.
Swing vs. Frequency.
DD
© 2008 Microchip Technology Inc.
DS22058C-page 13
MCP6V01/2/3
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
2.4
Input Noise and Distortion
1000
1000
100
10
100
10
1
GDM = 1 V/V
VDD tone = 50 mVP-P, f = 1 kHz
IMD tone at DC
VDD = 5.5V
1 kHz tone
eni
100
10
VDD = 1.8V
VDD = 1.8V
VDD = 5.5V
Eni(0 Hz to f)
10
100
1k
10k
100k
100
1k
1.E+03
10k
1.E+04
100k
1.E+05
1.E+02
1.E+01 1.E+02 1.E+03 1.E+04 1.E+05
Frequency (Hz)
Frequency (Hz)
FIGURE 2-35:
Input Noise Voltage Density
FIGURE 2-38:
Inter-Modulation Distortion
vs. Frequency.
vs. Frequency with V Disturbance (see
DD
Figure 1-7).
160
140
120
VDD = 1.8V
VDD = 5.5V
VDD = 1.8V
100
80
60
40
20
0
NPBW = 10 Hz
NPBW = 1 Hz
0
10 20 30 40 50 60 70 80 90 100
t (s)
Common Mode Input Voltage (V)
FIGURE 2-36:
Input Noise Voltage Density
FIGURE 2-39:
Input Noise vs. Time with
vs. Input Common Mode Voltage.
1 Hz and 10 Hz Filters and V =1.8V.
DD
100
VDD = 5.5V
IMD tone at DC
GDM = 1 V/V
VCM tone = 50 mVPK, f = 1 kHz
residual 1 kHz tone
10
NPBW = 10 Hz
NPBW = 1 Hz
VDD = 1.8V
VDD = 5.5V
1
100
1k
1.E+03
10k
1.E+04
100k
1.E+05
0
10 20 30 40 50 60 70 80 90 100
t (s)
1.E+02
Frequency (Hz)
FIGURE 2-37:
vs. Frequency with V
Figure 1-7).
Inter-Modulation Distortion
FIGURE 2-40:
1 Hz and 10 Hz Filters and V =5.5V.
Input Noise vs. Time with
Disturbance (see
CM
DD
DS22058C-page 14
© 2008 Microchip Technology Inc.
MCP6V01/2/3
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
2.5
Time Response
5
4
70
65
60
55
50
45
40
35
30
25
20
VDD = 5.5V
G = 1
Temperature increased by
using heat gun for 8 seconds.
TPCB
3
2
1
0
-1
-2
-3
-4
-5
VOS
0
20 40 60 80 100 120 140 160 180
Time (s)
0
2
4
6
8
10 12 14 16 18 20
Time (µs)
FIGURE 2-41:
Input Offset Voltage vs.
FIGURE 2-44:
Non-inverting Small Signal
Time with Temperature Change.
Step Response.
5.5
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
10
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
VDD = 5.5V
G = 1
POR Trip
Point
8
6
VDD
4
2
0
-2
VOS
-4
-6
-8
-10
0
5
10 15 20 25 30 35 40 45 50
Time (µs)
0.0 0.2 0.4 0T.6im0e.8(210.0 µ1s.2/di1v.)4 1.6 1.8 2.0
FIGURE 2-42:
Time at Power Up.
Input Offset Voltage vs.
FIGURE 2-45:
Step Response.
Non-inverting Large Signal
7
6
5
VDD = 5.5V
G = -1
VDD = 5.5V
G = 1
VIN
VOUT
4
3
2
1
0
-1
0
1
2
3
4
5
6
7
8
9
10
0
1
2
3
4
5
6
7
8
9
10
Time (ms)
Time (µs)
FIGURE 2-43:
shows no input phase reversal with overdrive.
The MCP6V01/2/3 family
FIGURE 2-46:
Response.
Inverting Small Signal Step
© 2008 Microchip Technology Inc.
DS22058C-page 15
MCP6V01/2/3
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
6.0
6
5
4
3
2
1
0
-1
5.5
5.0
VDD = 5.5V
G = -1
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
G VIN
VOUT
4.0
3.0
2.0
1.0
0.0
-1.0
VOUT
G VIN VDD = 5.5V
G = -100 V/V
0.5V Overdrive
0
5
10 15 20 25 30 35 40 45 50
Time (µs)
Time (50 µs/div)
FIGURE 2-49:
vs. Time with G = -100 V/V.
Output Overdrive Recovery
FIGURE 2-47:
Response.
Inverting Large Signal Step
1000
0.9
0.8
0.7
0.6
0.5
0.4
0.5V Output Overdrive
VDD = 5.5V
Rising Edge
VDD = 5.5V
100
tODR, high
VDD = 1.8V
Falling Edge
10
0.3
0.2
0.1
0.0
VDD = 1.8V
tODR, low
1
1
10
100
1000
-50
-25
0
25
50
75
100
125
Inverting Gain Magnitude (V/V)
Ambient Temperature (°C)
FIGURE 2-50:
Time vs. Inverting Gain.
Output Overdrive Recovery
FIGURE 2-48:
Temperature.
Slew Rate vs. Ambient
DS22058C-page 16
© 2008 Microchip Technology Inc.
MCP6V01/2/3
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
2.6
Chip Select Response (MCP6V03 only)
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0.0
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0.0
VDD = 5.5V
CS = VDD
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5
Chip Select Voltage (V)
Power Supply Voltage (V)
FIGURE 2-51:
Chip Select Current vs.
FIGURE 2-54:
Chip Select Current vs. Chip
Power Supply Voltage.
Select Voltage.
400
350
1.8
1.6
1.4
VDD = 1.8V
G = 1
VOUT On
V
IN = 0.9V
300
250
200
150
100
50
Op Amp
turns on
here
Op Amp
turns off
here
VL = 0V
1.2
VOUT Off
VOUT Off
1.0
0.8
VDD = 1.8V
G = +1 V/V
VIN= VDD
RL = 10 kΩ tied to VDD/2
0.6
0.4
Hysteresis
0.2
2
1
0
0.0
CS
0
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
Chip Select Voltage (V)
Time (5 µs/div)
FIGURE 2-52:
Power Supply Current vs.
FIGURE 2-55:
Chip Select Voltage, Output
Chip Select Voltage with V = 1.8V.
Voltage vs. Time with V = 1.8V.
DD
DD
600
5.5
5.0
4.5
4.0
39
VDD = 5.5V
G = 1
VOUT On
500
V
IN = 2.75V
Op Amp
turns off
Op Amp
here
VL = 0V
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
VOUT Off
VOUT Off
400
turns on
here
300
200
100
0
VDD = 5.5V
G = +1 V/V
VIN= VDD
Hysteresis
RL = 10 kΩ tied to VDD/2
6
3
0
CS
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5
Chip Select Voltage (V)
0
5
10 15 20 25 30 35 40 45 50
Time (5 µs/div)
FIGURE 2-53:
Power Supply Current vs.
FIGURE 2-56:
Chip Select Voltage, Output
Chip Select Voltage with V = 5.5V.
Voltage vs. Time with V = 5.5V.
DD
DD
© 2008 Microchip Technology Inc.
DS22058C-page 17
MCP6V01/2/3
Note: Unless otherwise indicated, TA = +25°C, VDD = +1.8V to 5.5V, VSS = GND, VCM = VDD/3, VOUT = VDD/2,
VL = VDD/2, RL = 20 kΩ to VL, CL = 60 pF, and CS = GND.
70%
65%
60%
55%
50%
45%
40%
35%
30%
7
6
5
4
3
2
1
0
VIH/VDD
VDD = 5.5V
VIL/VDD
VDD = 1.8V
-50
-25
0
25
50
75
100
125
-50
-25
0
25
50
75
100 125
Ambient Temperature (°C)
Ambient Temperature (°C)
FIGURE 2-57:
Chip Select Relative Logic
FIGURE 2-60:
Chip Select’s Pull-down
Thresholds vs. Ambient Temperature.
Resistor (R ) vs. Ambient Temperature.
PD
2.0
0.40
0.35
0.30
CS = VDD
Representative Part
1.8
1.6
1.4
VDD = 5.5V
+125°C
0.25
0.20
0.15
0.10
0.05
0.00
1.2
1.0
0.8
0.6
0.4
0.2
0.0
+85°C
+25°C
-40°C
VDD = 1.8V
-50
-25
0
25
50
75
100
125
Ambient Temperature (°C)
Power Supply Voltage (V)
FIGURE 2-58:
Chip Select Hysteresis.
FIGURE 2-61:
Quiescent Current in
Shutdown vs. Power Supply Voltage.
16
14
12
10
8
VDD = 5.5V
VDD = 1.8V
6
4
2
0
-50
-25
0
25
50
75
100
125
Ambient Temperature (°C)
FIGURE 2-59:
Chip Select Turn On Time
vs. Ambient Temperature.
DS22058C-page 18
© 2008 Microchip Technology Inc.
MCP6V01/2/3
3.0
PIN DESCRIPTIONS
Descriptions of the pins are listed in Table 3-1.
TABLE 3-1:
MCP6V01
PIN FUNCTION TABLE
MCP6V02
MCP6V03
Symbol
VOUT, VOUTA
Description
TDFN
SOIC
DFN
SOIC
TDFN
SOIC
6
2
3
6
2
3
1
2
3
1
2
3
6
2
3
6
2
3
Output (op amp A)
VIN–, VINA
–
+
Inverting Input (op amp A)
VIN+, VINA
Non-inverting Input
(op amp A)
4
4
4
5
4
5
4
4
VSS
Negative Power Supply
—
—
—
—
VINB
+
Non-inverting Input
(op amp B)
—
—
7
—
—
7
6
7
6
7
—
—
7
—
—
7
VINB
–
Inverting Input (op amp B)
Output (op amp B)
VOUTB
VDD
8
8
Positive Power Supply
—
—
—
—
—
8
CS
Chip Select (op amp A)
No Internal Connection
1, 5, 8
9
1, 5, 8
—
—
9
—
—
1, 5, 8
9
1, 5
—
NC
EP
Exposed Thermal Pad (EP);
must be connected to VSS
3.1
Analog Outputs
3.4
Chip Select (CS) Digital Input
The analog output pins (VOUT) are low-impedance
voltage sources.
This pin (CS) is a CMOS, Schmitt-triggered input that
places the MCP6V03 op amps into a low power mode
of operation.
3.2
Analog Inputs
3.5
Exposed Thermal Pad (EP)
The non-inverting and inverting inputs (VIN+, VIN–, …)
are high-impedance CMOS inputs with low bias
currents.
There is an internal connection between the Exposed
Thermal Pad (EP) and the VSS pin; they must be con-
nected to the same potential on the Printed Circuit
Board (PCB).
3.3
Power Supply Pins
This pad can be connected to a PCB ground plane to
provide a larger heat sink. This improves the package
thermal resistance (θJA).
The positive power supply (VDD) is 1.8V to 5.5V higher
than the negative power supply (VSS). For normal
operation, the other pins are between VSS and VDD
.
Typically, these parts are used in a single (positive)
supply configuration. In this case, VSS is connected to
ground and VDD is connected to the supply. VDD will
need bypass capacitors.
© 2008 Microchip Technology Inc.
DS22058C-page 19
MCP6V01/2/3
NOTES:
DS22058C-page 20
© 2008 Microchip Technology Inc.
MCP6V01/2/3
4.1
Overview of Auto-zeroing
Operation
4.0
APPLICATIONS
The MCP6V01/2/3 family of auto-zeroed op amps is
manufactured using Microchip’s state of the art CMOS
process. It is designed for low cost, low power and high
precision applications. Its low supply voltage, low
quiescent current and wide bandwidth makes the
MCP6V01/2/3 ideal for battery-powered applications.
Figure 4-1 shows
a
simplified diagram of the
MCP6V01/2/3 auto-zeroed op amps. This will be used
to explain how the DC voltage errors are reduced in this
architecture.
VIN+
VIN–
Main
Amp.
NC
Output
Buffer
VOUT
CFW
VREF
Null
Input
Switches
Null
Output
Switches
φ1
Null
Amp.
CH
POR
Oscillator
Null
Correct
Switches
φ1
φ2
Digital
Control
Clock
Randomization
φ2
CS
FIGURE 4-1:
Simplified Auto-zeroed Op Amp Functional Diagram.
The internal POR ensures the part starts up in a known
good state. It also provides protection against power
supply brown out events.
4.1.1
BUILDING BLOCKS
The Null Amp. and Main Amp. are designed for high
gain and accuracy using a differential topology. They
have an auxiliary input (bottom left) used for correcting
the offset voltages. Both inputs are added together
internally. The capacitors at the auxiliary inputs (CFW
and CH) hold the corrected values during normal
operation.
The Chip Select input places the op amp in a low power
state when it is high. When it goes low, it powers the op
amp at its normal level and starts operation properly.
The Digital Control circuitry takes care of all of the
housekeeping details of the switching operation. It also
takes care of Chip Select and POR events.
The Output Buffer is designed to drive external loads at
the VOUT pin. It also produces a single ended output
voltage (VREF is an internal reference voltage).
All of these switches are make-before-break in order to
minimize glitch-induced errors. They are driven by two
clock phases (φ1 and φ2) that select between normal
mode and auto-zeroing mode.
The clock is derived from an internal R-C oscillator
running at a rate of fOSC1 = 300 kHz. The oscillator’s
output is divided down to the desired rate. It is also
randomized to minimize (spread) undesired clock
tones in the output.
© 2008 Microchip Technology Inc.
DS22058C-page 21
MCP6V01/2/3
offset voltage on overall performance. Essentially, the
Null Amplifier and Main Amplifier behave as a regular
op amp with very high gain (AOL) and very low offset
voltage (VOS).
4.1.2
AUTO-ZEROING ACTION
Figure 4-2 shows the connections between amplifiers
during the Normal Mode of operation (φ1). The hold
capacitor (CH) corrects the Null Amplifier’s input offset.
Since the Null Amplifier has very high gain, it
dominates the signal seen by the Main Amplifier. This
greatly reduces the impact of the Main Amplifier’s input
VIN+
VIN–
Main
Amp.
NC
Output
Buffer
VOUT
CFW
VREF
Null
Amp.
CH
FIGURE 4-2:
Normal Mode of Operation (φ ); Equivalent Amplifier Diagram.
1
Figure 4-3 shows the connections between amplifiers
during the Auto-zeroing Mode of operation (φ2). The
signal goes directly through the Main Amplifier, and the
flywheel capacitor (CFW) maintains a constant correc-
tion on the Main Amplifier’s offset.
Since these corrections happen every 100 µs, or so,
we also minimize slow errors, including offset drift with
temperature (ΔVOS/ΔTA), 1/f noise, and input offset
aging.
The Null Amplifier uses its own high open loop gain to
drive the voltage across CH to the point where its input
offset voltage is almost zero. Because the principal
input is connected to VIN+, the auto-zeroing action
corrects the offset at the current common mode input
voltage (VCM) and supply voltage (VDD). This makes
the DC CMRR and PSRR very high also.
VIN+
VIN–
Main
Amp.
NC
Output
Buffer
VOUT
CFW
VREF
Null
Amp.
CH
FIGURE 4-3:
Auto-zeroing Mode of Operation (φ ); Equivalent Diagram.
2
response to produce IMD tones at sum and difference
frequencies. IMD distortion tones are generated about
all of the square wave clock’s harmonics.
4.1.3 INTERMODULATION DISTORTION
(IMD)
The MCP6V01/2/3 op amps will show intermodulation
distortion (IMD), products when an AC signal is
present.
Clock randomization spreads the IMD tones across the
frequency spectrum, but cannot eliminate them. The
spread energy is low and is not correlated with the sig-
nal of interest, so it is not of concern for most precision
applications. See Figure 2-37 and Figure 2-38.
The signal and clock can be decomposed into sine
wave tones (Fourier series components). These tones
interact with the auto-zeroing circuitry’s non-linear
DS22058C-page 22
© 2008 Microchip Technology Inc.
MCP6V01/2/3
pins (VIN+ and VIN–) from going too far above VDD, and
dump any currents onto VDD. When implemented as
shown, resistors R1 and R2 also limit the current
through D1 and D2.
4.2
Other Functional Blocks
4.2.1
RAIL-TO-RAIL INPUTS
The input stage of the MCP6V01/2/3 op amps uses two
differential CMOS input stages in parallel. One
operates at low common mode input voltage (VCM
,
VDD
which is approximately equal to VIN+ and VIN– in nor-
mal operation) and the other at high VCM. With this
topology, the input operates with VCM up to 0.2V past
either supply rail at +25°C (see Figure 2-18). The input
offset voltage (VOS) is measured at VCM = VSS – 0.2V
and VDD + 0.2V to ensure proper operation.
D1
R1
V1
D2
VOUT
MCP6V0X
V2
The transition between the input stages occurs when
VCM ≈ VDD – 0.9V (see Figure 2-7 and Figure 2-8). For
the best distortion and gain linearity, with non-inverting
gains, avoid this region of operation.
R2
VSS – (minimum expected V1)
R1 >
R2 >
2 mA
VSS – (minimum expected V2)
2 mA
4.2.1.1
Phase Reversal
The input devices are designed to not exhibit phase
inversion when the input pins exceed the supply
voltages. Figure 2-43 shows an input voltage
exceeding both supplies with no phase inversion.
FIGURE 4-5:
Inputs.
Protecting the Analog
It is also possible to connect the diodes to the left of the
resistor R1 and R2. In this case, the currents through
the diodes D1 and D2 need to be limited by some other
mechanism. The resistors then serve as in-rush current
limiters; the DC current into the input pins (VIN+ and
VIN–) should be very small.
4.2.1.2
Input Voltage and Current Limits
The ESD protection on the inputs can be depicted as
shown in Figure 4-4. This structure was chosen to
protect the input transistors, and to minimize input bias
current (IB). The input ESD diodes clamp the inputs
when they try to go more than one diode drop below
VSS. They also clamp any voltages that go too far
above VDD; their breakdown voltage is high enough to
allow normal operation, and low enough to bypass
quick ESD events within the specified limits.
A significant amount of current can flow out of the
inputs (through the ESD diodes) when the common
mode voltage (VCM) is below ground (VSS); see
Figure 2-17. Applications that are high impedance may
need to limit the usable voltage range.
4.2.2
RAIL-TO-RAIL OUTPUT
Bond
VDD
The output voltage range of the MCP6V01/2/3
auto-zeroed op amps is VDD – 15 mV (minimum) and
Pad
VSS + 15 mV (maximum) when RL = 20 kΩ is
connected to VDD/2 and VDD = 5.5V. Refer to
Figure 2-19 and Figure 2-20 for more information.
Bond
Pad
Bond
Pad
Input
Stage
VIN+
VIN–
These op amps are designed to drive light loads; use
another amplifier to buffer the output from heavy loads.
Bond
Pad
4.2.3
CHIP SELECT (CS)
VSS
The single MCP6V03 has a Chip Select (CS) pin.
When CS is pulled high, the supply current for the
corresponding op amp drops to about 1 µA (typical),
and is pulled through the CS pin to VSS. When this
happens, the amplifier is put into a high impedance
state. By pulling CS low, the amplifier is enabled. If the
CS pin is left floating, the internal pull-down resistor
(about 5 MΩ) will keep the part on. Figure 1-4 shows
the output voltage and supply current response to a CS
pulse.
FIGURE 4-4:
Structures.
Simplified Analog Input ESD
In order to prevent damage and/or improper operation
of these amplifiers, the circuit must limit the currents
(and voltages) at the input pins (see Section 1.1
“Absolute Maximum Ratings †”). Figure 4-5 shows
the recommended approach to protecting these inputs.
The internal ESD diodes prevent the input pins (VIN+
and VIN–) from going too far below ground, and the
resistors R1 and R2 limit the possible current drawn out
of the input pins. Diodes D1 and D2 prevent the input
© 2008 Microchip Technology Inc.
DS22058C-page 23
MCP6V01/2/3
4.3.4
SOURCE CAPACITANCE
4.3
Application Tips
The capacitances seen by the two inputs should be
small and matched. The internal switches connected to
the inputs dump charges on these capacitors; an offset
can be created if the capacitances do not match.
4.3.1
INPUT OFFSET VOLTAGE OVER
TEMPERATURE
Table 1-1 gives both the linear and quadratic tempera-
ture coefficients (TC1 and TC2) of input offset voltage.
The input offset voltage, at any temperature in the
specified range, can be calculated as follows:
4.3.5
CAPACITIVE LOADS
Driving large capacitive loads can cause stability
problems for voltage feedback op amps. As the load
capacitance increases, the feedback loop’s phase
margin decreases and the closed-loop bandwidth is
reduced. This produces gain peaking in the frequency
response, with overshoot and ringing in the step
response. These auto-zeroed op amps have a different
output impedance than most op amps, due to their
unique topology.
EQUATION 4-1:
VOS(TA) = VOS + TC1ΔT + TC2ΔT2
Where:
ΔT
OS(TA)
VOS
=
=
=
=
=
TA – 25°C
V
input offset voltage at TA
input offset voltage at +25°C
linear temperature coefficient
When driving a capacitive load with these op amps, a
series resistor at the output (RISO in Figure 4-6)
improves the feedback loop’s phase margin (stability)
by making the output load resistive at higher frequen-
cies. The bandwidth will be generally lower than the
bandwidth with no capacitive load.
TC1
TC2
quadratic temperature
coefficient
4.3.2
DC GAIN PLOTS
Figure 2-9, Figure 2-10 and Figure 2-11 are histograms
of the reciprocals (in units of µV/V) of CMRR, PSRR
and AOL, respectively. They represent the change in
input offset voltage (VOS) with a change in common
RISO
VOUT
CL
mode input voltage (VCM), power supply voltage (VDD
)
MCP6V0X
and output voltage (VOUT).
The 1/AOL histogram is centered near 0 µV/V because
the measurements are dominated by the op amp’s
input noise. The negative values shown represent
noise, not unstable behavior. We validate the op amps’
FIGURE 4-6:
Stabilizes Capacitive Loads.
Output Resistor, R
,
ISO
Figure 4-7 gives recommended RISO values for
different capacitive loads and is independent of the
gain.
stability by making multiple measurements of VOS
instability would manifest itself as a greater unex-
plained variability in VOS or as the railing of the output.
;
4.3.3
SOURCE RESISTANCES
10000
10k
The input bias currents have two significant
components; switching glitches that dominate at room
temperature and below, and input ESD diode leakage
currents that dominate at +85°C and above.
GN < 2
1k
1000
Make the resistances seen by the inputs small and
equal. This minimizes the output offset caused by the
input bias currents.
100
100
GN
= 5
G
N = 10
The inputs should see a resistance on the order of 10Ω
to 1 kΩ at high frequencies (i.e., above 1 MHz). This
helps minimize the impact of switching glitches, which
are very fast, on overall performance. In some cases, it
may be necessary to add resistors in series with the
inputs to achieve this improvement in performance.
10
10
1p
10p
1.E-11
100p
1.E-10
1n
1.E-09
10n
1.E-08
100n
1.E-12
1.E-07
CL (F)
FIGURE 4-7:
for Capacitive Loads.
Recommended R
values
ISO
DS22058C-page 24
© 2008 Microchip Technology Inc.
MCP6V01/2/3
After selecting RISO for your circuit, double check the
resulting frequency response peaking and step
response overshoot. Modify RISO's value until the
response is reasonable. Bench evaluation and
simulations with the MCP6V01 SPICE macro model
(good for all of the MCP6V01/2/3 op amps) are helpful.
4.3.7
REDUCING UNDESIRED NOISE
AND SIGNALS
Reduce undesired noise and signals with:
• Low bandwidth signal filters:
- Minimizes random analog noise
- Reduces interfering signals
• Good PCB layout techniques:
- Minimizes crosstalk
4.3.6
STABILIZING OUTPUT LOADS
This family of auto-zeroed op amps has an output
impedance (Figure 2-31 and Figure 2-32) that has a
double zero when the gain is low. This can cause a
large phase shift in feedback networks that have low
resistance near the part’s bandwidth. This large phase
shift can cause stability problems.
- Minimizes parasitic capacitances and
inductances that interact with fast switching
edges
• Good power supply design:
- Isolation from other parts
Figure 4-8 shows one circuit example that has low
resistance near the part’s bandwidth. RF and CF set a
pole at 0.16 kHz, so the noise gain (GN) is 1 V/V at the
circuit’s bandwidth (roughly 1.3 MHz). The load seen
by the op amp’s output at 1.3 MHz is RG||RL (99Ω).
This is low enough to be a real concern.
- Filtering of interference on supply line(s)
4.3.8
SUPPLY BYPASSING AND
FILTERING
With this family of operational amplifiers, the power
supply pin (VDD for single supply) should have a local
bypass capacitor (i.e., 0.01 µF to 0.1 µF) within 2 mm
of the pin for good high-frequency performance.
VIN
RN
100Ω
VOUT
MCP6V0X
These parts also need a bulk capacitor (i.e., 1 µF or
larger) within 100 mm to provide large, slow currents.
This bulk capacitor can be shared with other low noise,
analog parts.
RL
10.0 kΩ
RG
RF
Additional filtering of high frequency power supply
noise (e.g., switched mode power supplies) can be
achieved using resistors. The resistors need to be
small enough to prevent a large drop in VDD for the op
amp, which would cause a reduced output range and
possible load-induced power supply noise. The resis-
tors also need to be large enough to dissipate little
power when VDD is turned on and off quickly. The cir-
cuit in Figure 4-10 gives good rejection out to 1 MHz for
switched mode power supplies. Smaller resistors and
capacitors are a better choice for designs where the
power supply is reasonably quiet.
100Ω
10.0 kΩ
CF
0.1 µF
FIGURE 4-8:
Output Load Issue.
To solve this problem, increase the resistive load to at
least 3 kΩ. Methods to accomplish this task include:
• Increase RG
• Remove CF (relocate the filter)
• Add a 3 kΩ resistor at the op amp’s output that is
not in the signal path; see Figure 4-9
VS_ANA
143Ω
143Ω
VIN
1/4W
1/10W
RN
100Ω
MCP6V0X
RX
3.01 kΩ
0.1 µF
100 µF
100 µF
VOUT
MCP6V0X
RG
100Ω
RF
10.0 kΩ
RL
10.0 kΩ
to other analog parts
CF
0.1 µF
FIGURE 4-10:
Additional Supply Filtering.
FIGURE 4-9:
One Solution To Output
Load Issue.
© 2008 Microchip Technology Inc.
DS22058C-page 25
MCP6V01/2/3
4.3.9
PCB DESIGN FOR DC PRECISION
4.3.9.2
Non-inverting and Inverting Amplifier
Layout for Thermo-junctions
In order to achieve DC precision on the order of ±1 µV,
many physical errors need to be minimized. The design
of the Printed Circuit Board (PCB), the wiring, and the
thermal environment has a strong impact on the
precision achieved. A poor PCB design can easily be
more than 100 times worse than the MCP6V01/2/3 op
amps minimum and maximum specifications.
Figure 4-11 shows the recommended non-inverting
and inverting gain amplifier circuits on one schematic.
Usually, to minimize the input bias current related off-
set, R1 is chosen to be R2||R3.
The guard traces (with ground vias at the ends) help
minimize the thermal gradients. The resistor layout
cancels the resistor thermal voltages, assuming the
temperature gradient is constant near the resistors:
4.3.9.1
Thermo-junctions
Any time two dissimilar metals are joined together, a
temperature dependent voltage appears across the
junction (the Seebeck or thermo-junction effect). This
effect is used in thermocouples to measure tempera-
ture. The following are examples of thermo-junctions
on a PCB:
EQUATION 4-2:
VOUT ≈ VPGP,
VM = GND
≈ -VMGM, VP = GND
Where:
• Components (resistors, op amps, …) soldered to
a copper pad
GM
GP
=
=
R3/R2, inverting gain magnitude
1 + GM, non-inverting gain
magnitude
• Wires mechanically attached to the PCB
• Jumpers
VOS is neglected
• Solder joints
• PCB vias
Typical thermo-junctions have temperature to voltage
conversion coefficients of 10 to 100 µV/°C (sometimes
higher).
VOUT
R3
U1
R2
There are three basic approaches to minimizing
thermo-junction effects:
VM
VP
R1
• Minimize thermal gradients
• Cancel thermo-junction voltages
• Minimize difference in thermal potential between
metals
R2
R3
VM
VP
U1
MCP6V01
VOUT
R1
FIGURE 4-11:
PCB Layout and Schematic
for Single Non-inverting and Inverting Amplifiers.
Note:
Changing the orientation of the resistors
will usually cause a significant decrease in
the cancellation of the thermal voltages.
DS22058C-page 26
© 2008 Microchip Technology Inc.
MCP6V01/2/3
4.3.9.3
Difference Amplifier Layout for
Thermo-junctions
4.3.9.4
Dual Non-inverting Amplifier Layout
for Thermo-junctions
Figure 4-12 shows the recommended difference ampli-
fier circuit. Usually, we choose R1 = R2 and R3 = R4.
The dual op amp amplifiers shown in Figure 4-16 and
Figure 4-17 produce a non-inverting difference gain
greater than 1, and a common mode gain of 1 .They
can use the layout shown in Figure 4-13. The gain set-
ting resistors (R2) between the two sides are not com-
bined so that the thermal voltages can be canceled.
The guard traces (with ground vias at the ends) help
minimize the thermal gradients. The resistor layout
cancels the resistor thermal voltages, assuming the
temperature gradient is constant near the resistors:
The guard traces (with ground vias at the ends) help
minimize the thermal gradients. The resistor layout
cancels the resistor thermal voltages, assuming the
temperature gradient is constant near the resistors:
EQUATION 4-3:
VOUT ≈ VREF + (VP – VM)GDM
Where:
EQUATION 4-4:
Thermal voltages are approximately equal
(VOA – VOB) ≈ (VIA – VIB)GDM
(VOA + VOB)/2 ≈ (VIA + VIB)/2
GDM
=
R3/R1 = R4/R2, difference gain
VOS is neglected
Where:
Thermal voltages are approximately equal
GDM
GCM
=
=
1 + R3/R2, differential mode gain
1, common mode gain
VOS is neglected
VOUT
R4
R2
U1
VM
VP
R1
R3
VREF
VOB
VOA
U1
R3
R2
R1
R2
R4
R3
R2
R1
VM
U1
VOUT
VREF
MCP6V01
VP
R1
R3
VIA VIB
R1
FIGURE 4-12:
PCB Layout and Schematic
VIA
for Single Difference Amplifier.
VOA
½ MCP6V02
U1
Note:
Changing the orientation of the resistors
will usually cause a significant decrease in
the cancellation of the thermal voltages.
R2
R2
R3
R3
U1
½ MCP6V02
VOB
VIB
R1
FIGURE 4-13:
PCB Layout and Schematic
for Dual Non-inverting Amplifier.
Note: Changing the orientation of the resistors
will usually cause a significant decrease in
the cancellation of the thermal voltages.
© 2008 Microchip Technology Inc.
DS22058C-page 27
MCP6V01/2/3
4.3.9.5
Other PCB Thermal Design Tips
4.3.9.6
Crosstalk
In cases where an individual resistor needs to have its
thermo-junction voltage cancelled, it can be split into
two equal resistors as shown in Figure 4-14. To keep
the thermal gradients near the resistors as small as
possible, the layouts are symmetrical with a ring of
metal around the outside. Make R1A = R1B = R1/2 and
R2A = R2B = 2R2.
DC crosstalk causes offsets that appear as a larger
input offset voltage. Common causes include:
• Common mode noise (remote sensors)
• Ground loops (current return paths)
• Power supply coupling
Interference from the mains (usually 50 Hz or 60 Hz),
and other AC sources, can also affect the DC perfor-
mance. Non-linear distortion can convert these signals
to multiple tones, included a DC shift in voltage. When
the signal is sampled by an ADC, these AC signals can
also be aliased to DC, causing an apparent shift in
offset.
R1A R1B
R2A
R2B
R2A
To reduce interference:
R1A
R1B
- Keep traces and wires as short as possible
- Use shielding (e.g., encapsulant)
- Use ground plane (at least a star ground)
- Place the input signal source near to the DUT
- Use good PCB layout techniques
R2B
FIGURE 4-14:
PCB Layout for Individual
- Use a separate power supply filter (bypass
capacitors) for these auto-zeroed op amps
Resistors.
Note:
Changing the orientation of the resistors
will usually cause a significant decrease in
the cancellation of the thermal voltages.
4.3.9.7
Miscellaneous Effects
Keep the resistances seen by the input pins as small
and as near to equal as possible to minimize bias cur-
rent related offsets.
Minimize temperature gradients at critical components
(resistors, op amps, heat sources, etc.):
• Minimize exposure to gradients
- Small components
Make the (trace) capacitances seen by the input pins
small and equal. This is helpful in minimizing switching
glitch-induced offset voltages.
- Tight spacing
Bending a coax cable with a radius that is too small
causes a small voltage drop to appear on the center or
(the tribo-electric effect). Make sure the bending radius
is large enough to keep the conductors and insulation
in full contact.
- Shield from air currents
• Align with constant temperature (contour) lines
- Place on PCB center line
• Minimize magnitude of gradients
- Select parts with lower power dissipation
Mechanical stresses can make some capacitor types
(such as ceramic) to output small voltages. Use more
appropriate capacitor types in the signal path and
minimize mechanical stresses and vibration.
- Use same metal junctions on thermo-junc-
tions that need to match
- Use metal junctions with low temperature to
voltage coefficients
Humidity can cause electro-chemical potential voltages
to appear in a circuit. Proper PCB cleaning helps, as
does the use of encapsulants.
- Large distance from heat sources
- Ground plane underneath (large area)
- FR4 gaps (no copper for thermal insulation)
- Series resistors inserted into traces (adds
thermal and electrical resistance)
- Use heat sinks
Make the temperature gradient point in one direction:
• Add guard traces
- Constant temperature curves follow the
traces
- Connect to ground plane
• Shape any FR4 gaps
- Constant temperature curves follow the
edges
DS22058C-page 28
© 2008 Microchip Technology Inc.
MCP6V01/2/3
4.4.2
RTD SENSOR
4.4
Typical Applications
The ratiometric circuit in Figure 4-17 conditions a three
wire RTD. It corrects for the sensor’s wiring resistance
by subtracting the voltage across the middle RW. The
top R1 does not change the output voltage; it balances
the op amp inputs. Failure (open) of the RTD is
detected by an out of range voltage.
4.4.1
WHEATSTONE BRIDGE
Many sensors are configured as Wheatstone bridges.
Strain gauges and pressure sensors are two common
examples. These signals can be small and the
common mode noise large. Amplifier designs with high
differential gain are desirable.
Figure 4-15 shows how to interface to a Wheatstone
bridge with a minimum of components. Because the
circuit is not symmetric, the ADC input is single ended,
and there is a minimum of filtering, the CMRR is good
enough for moderate common mode noise.
½ MCP6V02
2.49 kΩ
VDD
100 nF
RT
20 kΩ
R3
100 kΩ
RW
0.01C
100R
VDD
VDD
3 kΩ
3 kΩ
VDD
R
R
R1
ADC
R2
2.55 kΩ
0.2R
0.2R
10 nF
10 nF
2.49 kΩ
1 µF
RRTD
100Ω
ADC
R
R
R2
2.55 kΩ
R1
MCP6V01
2.49 kΩ
3 kΩ
R3
100 kΩ
FIGURE 4-15:
Simple Design.
RW
RW
RB
20 kΩ
Figure 4-16 shows a higher performance circuit for
Wheatstone bridges. This circuit is symmetric and has
high CMRR. Using a differential input to the ADC helps
with the CMRR.
100 nF
2.49 kΩ
½ MCP6V02
½ MCP6V02
200 Ω
FIGURE 4-17:
RTD Sensor.
The voltages at the input of the ADC can be calculated
with the following:
VDD
1 µF
R
R
R
R
20 kΩ
3 kΩ
10 nF
GRTD = 1 + 2 ⋅ R3 ⁄ R2
GW = GRTD – R3 ⁄ R1
VDM = GRTD(VT – VB) + GWVW
VDD
200Ω
1 µF
ADC
VT + VB + (GRTD + 1 – GW)VW
VCM = ------------------------------------------------------------------------------
2
Where:
200Ω
3 kΩ
10 nF
20 kΩ
VT
VB
=
=
=
Voltage at the top of RRTD
Voltage at the bottom of RRTD
1 µF
VW
Voltage across top and middle
RW’s
200 Ω
VCM
VDM
=
=
ADC’s common mode input
ADC’s differential mode input
½ MCP6V02
High Performance Design.
FIGURE 4-16:
© 2008 Microchip Technology Inc.
DS22058C-page 29
MCP6V01/2/3
The MCP9700A senses the temperature at its physical
location. It needs to be at the same temperature as the
cold junction (TCJ), and produces V3 (Figure 4-16).
4.4.3
THERMOCOUPLE SENSOR
Figure 4-18 shows a simplified diagram of an amplifier
and temperature sensor used in a thermocouple
application. The type K thermocouple senses the
temperature at the hot junction (THJ), and produces a
voltage at V1 proportional to THJ (in °C). The amplifier’s
gain is is set so that V4/THJ is 10 mV/°C. V3 represents
the output of a temperature sensor, which produces a
voltage proportional to the temperature (in °C) at the
cold junction (TCJ), and with a 0.50V offset. V2 is set so
that V4 is 0.50V when THJ – TCJ is 0°C.
The MCP1541 produces a 4.10V output, assuming
VDD is at 5.0V. This voltage, tied to a resistor ladder of
4.100(RTH) and 1.3224(RTH), would produce a Theve-
nin equivalent of 1.00V and 250(RTH). The
1.3224(RTH) resistor is combined in parallel with the
top right RTH resistor (in Figure 4-18), producing the
0.5696(RTH) resistor.
V4 should be converted to digital, then corrected for the
thermocouple’s non-linearity. The ADC can use the
MCP1541 as its voltage reference. Alternately, an
absolute reference inside a PICmicro® can be used
instead of the MCP1541.
EQUATION 4-5:
V1 ≈ THJ(40 µV/°C)
V2 = (1.00V)
4.4.4
OFFSET VOLTAGE CORRECTION
V3 = TCJ(10 mV/°C) + (0.50V)
V4 = 250V1 + (V2 – V3)
≈ (10 mV/°C) (THJ – TCJ) + (0.50V)
Figure 4-20 shows a MCP6V01 correcting the input
offset voltage of another op amp. R2 and C2 integrate
the offset error seen at the other op amp’s input; the
integration needs to be slow enough to be stable (with
the feedback provided by R1 and R3).
RTH = Thevenin Equivalent Resistance
(hot junction
at THJ
)
(RTH
)
(RTH
)
R1
R2
R3
V2
V1
V3
40 µV/°C
Type K
Thermocouple
VIN
VOUT
C
(RTH)/250
(RTH)/250
C2
MCP6V01
MCP6XXX
V4
3 kΩ
MCP6V01
R2
(cold junction
C
VDD/2
at TCJ
)
(RTH
)
(RTH
)
FIGURE 4-20:
Offset Correction.
FIGURE 4-18:
Simplified Circuit.
Thermocouple Sensor;
4.4.5 PRECISION COMPARATOR
Use high gain before a comparator to improve the
latter’s performance. Do not use MCP6V01/2/3 as a
comparator by itself; the VOS correction circuitry does
not operate properly without a feedback loop.
Figure 4-19 shows a more complete implementation of
this circuit. The dashed red arrow indicates a thermally
conductive connection between the thermocouple and
the MCP9700A; it needs to be very short and have low
thermal resistance.
MCP6V01
VIN
RTH = Thevenin Equivalent Resistance (e.g.: 10 kΩ)
R1
VDD
0.5696(RTH
C
)
4.100(RTH
)
MCP1541
R3
R4
R2
1 kΩ
R5
VOUT
(RTH)/250
(RTH)/250
Type K
VDD/2
MCP6V01
V1
MCP6541
VDD
C
FIGURE 4-21:
Precision Comparator.
MCP9700A
V4
(RTH
)
3 kΩ
(RTH
)
FIGURE 4-19:
Thermocouple Sensor.
DS22058C-page 30
© 2008 Microchip Technology Inc.
MCP6V01/2/3
5.5
Analog Demonstration and
Evaluation Boards
5.0
DESIGN AIDS
Microchip provides the basic design aids needed for
the MCP6V01/2/3 family of op amps.
Microchip offers a broad spectrum of Analog Demon-
stration and Evaluation Boards that are designed to
help customers achieve faster time to market. For a
complete listing of these boards and their correspond-
ing user’s guides and technical information, visit the
Microchip web site at www.microchip.com/analog
tools.
5.1
SPICE Macro Model
The latest SPICE macro model for the MCP6V01/2/3
op amps is available on the Microchip web site at
www.microchip.com. This model is intended to be an
initial design tool that works well in the op amp’s linear
region of operation over the temperature range. See
the model file for information on its capabilities.
Some boards that are especially useful are:
• MCP6V01 Thermocouple Auto-Zeroed Reference
Design
Bench testing is a very important part of any design and
cannot be replaced with simulations. Also, simulation
results using this macro model need to be validated by
comparing them to the data sheet specifications and
characteristic curves.
• MCP6XXX Amplifier Evaluation Board 1
• MCP6XXX Amplifier Evaluation Board 2
• MCP6XXX Amplifier Evaluation Board 3
• MCP6XXX Amplifier Evaluation Board 4
• Active Filter Demo Board Kit
5.2
FilterLab® Software
• P/N SOIC8EV: 8-Pin SOIC/MSOP/TSSOP/DIP
Evaluation Board
Microchip’s FilterLab® software is an innovative
software tool that simplifies analog active filter (using
op amps) design. Available at no cost from the Micro-
chip web site at www.microchip.com/filterlab, the Fil-
ter-Lab design tool provides full schematic diagrams of
the filter circuit with component values. It also outputs
the filter circuit in SPICE format, which can be used
with the macro model to simulate actual filter perfor-
mance.
• P/N SOIC14EV: 14-Pin SOIC/TSSOP/DIP
Evaluation Board
5.6
Application Notes
The following Microchip Application Notes are
available on the Microchip web site at www.microchip.
com/appnotes and are recommended as supplemental
reference resources.
5.3
Mindi™ Circuit Designer &
Simulator
ADN003: “Select the Right Operational Amplifier for
your Filtering Circuits”, DS21821
AN722: “Operational Amplifier Topologies and DC
Specifications”, DS00722
Microchip’s Mindi™ Circuit Designer & Simulator aids
in the design of various circuits useful for active filter,
amplifier and power management applications. It is a
free online circuit designer & simulator available from
the Microchip web site at www.microchip.com/mindi.
This interactive circuit designer & simulator enables
designers to quickly generate circuit diagrams, and
simulate circuits. Circuits developed using the Mindi
Circuit Designer & Simulator can be downloaded to a
personal computer or workstation.
AN723: “Operational Amplifier AC Specifications and
Applications”, DS00723
AN884: “Driving Capacitive Loads With Op Amps”,
DS00884
AN990: “Analog Sensor Conditioning Circuits – An
Overview”, DS00990
These application notes and others are listed in the
design guide:
5.4
Microchip Advanced Part Selector
(MAPS)
“Signal Chain Design Guide”, DS21825
MAPS is a software tool that helps efficiently identify
Microchip devices that fit a particular design require-
ment. Available at no cost from the Microchip website
at www.microchip.com/maps, the MAPS is an overall
selection tool for Microchip’s product portfolio that
includes Analog, Memory, MCUs and DSCs. Using this
tool, a customer can define a filter to sort features for a
parametric search of devices and export side-by-side
technical comparison reports. Helpful links are also
provided for Data sheets, Purchase and Sampling of
Microchip parts.
© 2008 Microchip Technology Inc.
DS22058C-page 31
MCP6V01/2/3
NOTES:
DS22058C-page 32
© 2008 Microchip Technology Inc.
MCP6V01/2/3
6.0
6.1
PACKAGING INFORMATION
Package Marking Information
8-Lead DFN (4x4) (MCP6V02)
Example
XXXXXX
XXXXXX
YYWW
6V02
e
3
E/MD^
0750
256
NNN
8-Lead SOIC (150 mil)
Example:
MCP6VO1E
XXXXXXXX
e
3
SN 0750
XXXXYYWW
256
NNN
Example:
8-Lead TDFN (2x3) (MCP6V01, MCP6V03)
Device
Code
XXX
AAA
838
25
MCP6V01
AAA
AAB
YWW
NN
MCP6V03
Note: Applies to 8-Lead
2x3 TDFN
Legend: XX...X Customer-specific information
Y
YY
WW
NNN
Year code (last digit of calendar year)
Year code (last 2 digits of calendar year)
Week code (week of January 1 is week ‘01’)
Alphanumeric traceability code
e
3
Pb-free JEDEC designator for Matte Tin (Sn)
*
This package is Pb-free. The Pb-free JEDEC designator (
can be found on the outer packaging for this package.
)
e3
Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
© 2008 Microchip Technology Inc.
DS22058C-page 33
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DS22058C-page 34
© 2008 Microchip Technology Inc.
MCP6V01/2/3
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© 2008 Microchip Technology Inc.
DS22058C-page 35
MCP6V01/2/3
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ꢑꢒꢊꢃ% -ꢕꢐꢅꢏꢘꢌꢅꢑꢕꢇꢏꢅꢖꢈꢐꢐꢌꢄꢏꢅꢜꢉꢖꢚꢉꢛꢌꢅꢋꢐꢉꢗꢃꢄꢛꢇꢓꢅꢜꢊꢌꢉꢇꢌꢅꢇꢌꢌꢅꢏꢘꢌꢅ$ꢃꢖꢐꢕꢖꢘꢃꢜꢅꢂꢉꢖꢚꢉꢛꢃꢄꢛꢅ#ꢜꢌꢖꢃꢎꢃꢖꢉꢏꢃꢕꢄꢅꢊꢕꢖꢉꢏꢌꢋꢅꢉꢏꢅ
ꢘꢏꢏꢜ*..ꢗꢗꢗꢁꢑꢃꢖꢐꢕꢖꢘꢃꢜꢁꢖꢕꢑ.ꢜꢉꢖꢚꢉꢛꢃꢄꢛ
DS22058C-page 36
© 2008 Microchip Technology Inc.
MCP6V01/2/3
ꢀꢁꢂꢃꢄꢅꢆꢇꢈꢄꢉꢊꢋꢌꢆꢍꢎꢄꢈꢆꢏꢈꢄꢊꢐꢆꢑꢒꢆꢂꢃꢄꢅꢆꢇꢄꢌꢓꢄꢔꢃꢆꢕꢖꢑꢗꢆMꢆ.ꢙ+ꢙꢚꢛ/0ꢆ ꢆ!ꢒꢅ"ꢆ#1ꢍꢏꢑ$
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© 2008 Microchip Technology Inc.
DS22058C-page 37
MCP6V01/2/3
ꢀꢁꢂꢃꢄꢅꢆꢇꢈꢄꢉꢊꢋꢌꢆꢍꢎꢄꢈꢆꢏꢈꢄꢊꢐꢆꢑꢒꢆꢂꢃꢄꢅꢆꢇꢄꢌꢓꢄꢔꢃꢆꢕꢖꢑꢗꢆMꢆ.ꢙ+ꢙꢚꢛ/0ꢆ ꢆ!ꢒꢅ"ꢆ#1ꢍꢏꢑ$
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DS22058C-page 38
© 2008 Microchip Technology Inc.
MCP6V01/2/3
APPENDIX A: REVISION HISTORY
Revision C (December 2008)
The following is the list of modifications:
1. Added the 8-lead, 2x3 TDFN package for the
MCP6V01 and MCP6V03 devices.
2. Corrected the IMD specification in Table 1-2.
3. Added 8-lead, 2x3 TDFN package information to
Thermal Characteristic table.
4. Added information on the Exposed Thermal Pad
(EP) for the 8-lead, 2x3 TDFN and 8-lead, 4x4
DFN packages.
5. Added Section 4.3.6 “Stabilizing Output
Loads”
6. Other minor typographical corrections.
Revision B (June 2008)
The following is the list of modifications:
1. Updated the specifications and their conditions.
2. Corrected the Timing Diagrams.
3. Added to the Test Circuits.
4. Added RISO (see Figure 4-6) to all circuit
diagrams.
5. Added the Typical Performance Curves.
6. Corrected
Information.
and
expanded
Applications
7. Minor edits due to change in production status.
8. Added Appendix B, Offset Related Test
Screens.
Revision A (September 2007)
• Original Release of this Document.
© 2008 Microchip Technology Inc.
DS22058C-page 41
MCP6V01/2/3
We use production screens to ensure the quality of our
outgoing products. These screens are set at wider lim-
its to eliminate any fliers; see Table B-1.
APPENDIX B: OFFSET RELATED
TEST SCREENS
Input offset voltage related specifications in the DC
spec table (Table 1-1) are based on bench measure-
ments (see Section 2.1 “DC Input Precision”). These
measurements are much more accurate because:
• More compact circuit
• Soldered parts on the PCB
• More time spent averaging (reduces noise)
• Better temperature control
- Reduced temperature gradients
- Greater accuracy
TABLE B-1:
OFFSET RELATED TEST SCREENS
Electrical Characteristics: Unless otherwise indicated, TA = 25°C, VDD = +1.8V to +5.5V, VSS = GND, VCM = VDD/3,
V
OUT = VDD/2, VL = VDD/2, RL = 20 kΩ to VL, and CS = GND (refer to Figure 1-5 and Figure 1-6).
Parameters
Sym Min Max Units
Conditions
Input Offset
Input Offset Voltage
VOS
-10
—
+10
—
µV
TA = +25°C (Note 1, Note 2)
Input Offset Voltage Drift with Temperature TC1
(linear Temp. Co.)
nV/°C TA = -40 to +125°C (Note 3)
Power Supply Rejection
Common Mode
PSRR 115
—
dB
(Note 1)
Common Mode Rejection
CMRR 106
CMRR 116
—
—
dB
dB
VDD = 1.8V, VCM = -0.2V to 2.0V (Note 1)
VDD = 5.5V, VCM = -0.2V to 5.7V (Note 1)
Open-Loop Gain
DC Open-Loop Gain (large signal)
AOL
AOL
114
122
—
—
dB
dB
VDD = 1.8V, VOUT = 0.2V to 1.6V (Note 1)
VDD = 5.5V, VOUT = 0.2V to 5.3V (Note 1)
Note 1: Due to thermal junctions and other errors in the production environment, these specifications are only screened in
production.
2:
VOS is also sample screened at +125°C.
3: TC1 is not measured in production.
DS22058C-page 42
© 2008 Microchip Technology Inc.
MCP6V01/2/3
PRODUCT IDENTIFICATION SYSTEM
To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office.
Examples:
PART NO.
Device
–X
/XXX
a)
MCP6V01T-E/SN: Extended temperature,
Temperature
Range
Package
8LD SOIC package.
MCP6V01-E/MNY:Extended temperature,
8LD 2x3 TDFN package.
b)
a)
b)
MCP6V02-E/MD: Extended temperature,
8LD 4x4 DFN package.
MCP6V02T-E/SN: Tape and Reel,
Extended temperature,
Device:
MCP6V01
Single Op Amp
MCP6V01T Single Op Amp
(Tape and Reel for 2x3 TDFN andSOIC)
Dual Op Amp
MCP6V02T Dual Op Amp
(Tape and Reel for 4×4 DFN and SOIC)
Single Op Amp with Chip Select
MCP6V02
8LD SOIC package.
a)
b)
MCP6V03-E/SN: Extended temperature,
8LD SOIC package.
MCP6V03-E/MNY:Extended temperature,
8LD 2x3 TDFN package.
MCP6V03
MCP6V03T Single Op Amp with Chip Select
(Tape and Reel for SOIC)
Temperature Range:
Package:
E
= -40°C to +125°C
MD
=
=
=
Plastic Dual Flat, No-Lead (4×4x0.9 mm), 8-lead
(MCP6V02 only)
Plastic Dual Flat No Lead (2x3x0.75 mm), 8-lead
(MCP6V01, MCP6V03)
MNY *
SN
Plastic SOIC (150mil Body), 8-lead
* Y = nickel palladium gold manufacturing designator. Only
available on the TDFN package.
© 2008 Microchip Technology Inc.
DS22058C-page 43
MCP6V01/2/3
NOTES:
DS22058C-page 44
© 2008 Microchip Technology Inc.
Note the following details of the code protection feature on Microchip devices:
•
Microchip products meet the specification contained in their particular Microchip Data Sheet.
•
Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
•
There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
•
•
Microchip is willing to work with the customer who is concerned about the integrity of their code.
Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not
mean that we are guaranteeing the product as “unbreakable.”
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts
allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
Information contained in this publication regarding device
applications and the like is provided only for your convenience
and may be superseded by updates. It is your responsibility to
ensure that your application meets with your specifications.
MICROCHIP MAKES NO REPRESENTATIONS OR
WARRANTIES OF ANY KIND WHETHER EXPRESS OR
IMPLIED, WRITTEN OR ORAL, STATUTORY OR
OTHERWISE, RELATED TO THE INFORMATION,
INCLUDING BUT NOT LIMITED TO ITS CONDITION,
QUALITY, PERFORMANCE, MERCHANTABILITY OR
FITNESS FOR PURPOSE. Microchip disclaims all liability
arising from this information and its use. Use of Microchip
devices in life support and/or safety applications is entirely at
the buyer’s risk, and the buyer agrees to defend, indemnify and
hold harmless Microchip from any and all damages, claims,
suits, or expenses resulting from such use. No licenses are
conveyed, implicitly or otherwise, under any Microchip
intellectual property rights.
Trademarks
The Microchip name and logo, the Microchip logo, Accuron,
dsPIC, KEELOQ, KEELOQ logo, MPLAB, PIC, PICmicro,
PICSTART, rfPIC, SmartShunt and UNI/O are registered
trademarks of Microchip Technology Incorporated in the
U.S.A. and other countries.
FilterLab, Linear Active Thermistor, MXDEV, MXLAB,
SEEVAL, SmartSensor and The Embedded Control Solutions
Company are registered trademarks of Microchip Technology
Incorporated in the U.S.A.
Analog-for-the-Digital Age, Application Maestro, CodeGuard,
dsPICDEM, dsPICDEM.net, dsPICworks, dsSPEAK, ECAN,
ECONOMONITOR, FanSense, In-Circuit Serial
Programming, ICSP, ICEPIC, Mindi, MiWi, MPASM, MPLAB
Certified logo, MPLIB, MPLINK, mTouch, PICkit, PICDEM,
PICDEM.net, PICtail, PIC32 logo, PowerCal, PowerInfo,
PowerMate, PowerTool, REAL ICE, rfLAB, Select Mode, Total
Endurance, WiperLock and ZENA are trademarks of
Microchip Technology Incorporated in the U.S.A. and other
countries.
SQTP is a service mark of Microchip Technology Incorporated
in the U.S.A.
All other trademarks mentioned herein are property of their
respective companies.
© 2008, Microchip Technology Incorporated, Printed in the
U.S.A., All Rights Reserved.
Printed on recycled paper.
Microchip received ISO/TS-16949:2002 certification for its worldwide
headquarters, design and wafer fabrication facilities in Chandler and
Tempe, Arizona; Gresham, Oregon and design centers in California
and India. The Company’s quality system processes and procedures
are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping
devices, Serial EEPROMs, microperipherals, nonvolatile memory and
analog products. In addition, Microchip’s quality system for the design
and manufacture of development systems is ISO 9001:2000 certified.
© 2008 Microchip Technology Inc.
DS22058C-page 45
WORLDWIDE SALES AND SERVICE
AMERICAS
ASIA/PACIFIC
ASIA/PACIFIC
EUROPE
Corporate Office
Asia Pacific Office
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Tel: 852-2401-1200
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Technical Support:
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Web Address:
www.microchip.com
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01/02/08
DS22058C-page 46
© 2008 Microchip Technology Inc.
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