NFP1003 [MICRONETICS]
HERMETIC MICROWAVE SURFACE MOUNT NOISE SOURCE; HERMETIC微波表面贴装噪声源![NFP1003](http://pdffile.icpdf.com/pdf1/p00146/img/icpdf/NFP10_810687_icpdf.jpg)
型号: | NFP1003 |
厂家: | ![]() |
描述: | HERMETIC MICROWAVE SURFACE MOUNT NOISE SOURCE |
文件: | 总2页 (文件大小:76K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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NFP1003 HERMETIC
MICROWAVE
SURFACE MOUNT NOISE SOURCE
100 MHZ TO 3 GHZ
The NFP1003 Noise Source features
high ENR output in a small SMT
package, ideal for military and other
harsh environment applications.
The high output can allow for signifi-
cant circuit loss such as that caused
by power splitters, switches and
directional couplers, and still have
enough noise signal without addition-
al amplification.
All biasing circuitry is built-in making
it easy to design into your system.
The NFP1003 features a built-in volt-
age regulator for highly stable output
even if your DC supply lines are not.
NFP1003 TYPICAL DATA
SPECIFICATIONS
E N R
• Frequency:
• ENR:
100 MHz to 3GHz
100 MHz - 1 GHz 43 - 48 dB
1 GHz - 2 GHz
2 GHz - 3 GHz
41 - 46 dB
40 - 45 dB
• ENR Temp COEF: 0.04 db/oC max
• VSWR: 2.0:1 max, On or Off state
• BIAS: +12 to +28Vdc @50mA max
COMMON APPLICATIONS:
• Hermetic Seal: 1x10-7 atm cc/s
• Operating Temp: -40 to +85 C
• Storage Temp: -54 to +125 C
Using noise for built-in test:
There are two primary uses for employing a noise signal for built-in test.
1. Noise Temperature (noise figure) or sensitivity testing: This test uses the noise source to supply a
known excess noise ratio (ENR) to a device under test for a Y-factor measurement. By taking two
receiver readings, one with the noise on and one with it off, Y-factor can be determined. By knowing
the ENR and Y-factor, one can calculate noise temperature (figure) or sensitivity.
2. Frequency Response: The noise source being broadband can be used as a replacement of a swept
source to calculate frequency response of a receiver or other device. By putting in a known spectral
signal at the input and taking a reading at the output, one can determine the gain or loss over frequency
of the entire system. Noise sources are inherently extremely stable devices. In addition, the circuitry is
much simpler than a swept source which increases reliability and lowers cost.
For more information on using noise for built-in-test, read the Feb 2004 Microwave Journal article authored
by Patrick Robbins of Micronetics.
MICRONETICS, HUDSON, NH 03051 / TEL: 603-883-2900 / FAX: 603-882-8987 / NOISESALES@MICRONETICS.COM
WWW.MICRONETICS.COM
NFP1003 HERMETIC
MICROWAVE
SURFACE MOUNT NOISE SOURCE
100 MHZ TO 3 GHZ
OUTLINE DRAWING
USEFUL NOISE EQUATIONS
Calculating Y-Factor:
Y
= N / N Where N is measured power output with noise source on and N is the measured
Fact 2 1 2 1
power output with noise source off.
Calculating noise figure from ENR and Y-Factor: NF(dB) = ENR (dB) - 10 log10 (Y
-1)
Fact
Converting ENR to noise spectral density (N ): 0 dB ENR = -174 dBm/Hz
0
Calculating noise power in a given bandwidth (BW) from noise spectral density: Power (dBm) = N + 10log(BW)
0
MICRONETICS, HUDSON, NH 03051 / TEL: 603-883-2900 / FAX: 603-882-8987 / NOISESALES@MICRONETICS.COM
WWW.MICRONETICS.COM
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