N25Q256A [MICRON]
Micron Serial NOR Flash Memory; 美光的串行NOR闪存型号: | N25Q256A |
厂家: | MICRON TECHNOLOGY |
描述: | Micron Serial NOR Flash Memory |
文件: | 总90页 (文件大小:987K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
3V, 256Mb: Multiple I/O Serial Flash Memory
Features
Micron Serial NOR Flash Memory
3V, Multiple I/O, 4KB Sector Erase
N25Q256A
• Write protection
– Software write protection applicable to every
64KB sector via volatile lock bit
– Hardware write protection: protected area size
defined by five nonvolatile bits (BP0, BP1, BP2,
BP3, and TB)
– Additional smart protections, available upon re-
quest
Features
• SPI-compatible serial bus interface
• Double transfer rate (DTR) mode
• 2.7–3.6V single supply voltage
• 108 MHz (MAX) clock frequency supported for all
protocols in single transfer rate (STR) mode
• 54 MHz (MAX) clock frequency supported for all
protocols in DTR mode
• Dual/quad I/O instruction provides increased
throughput up to 54 MB/s
• Supported protocols
– Extended SPI, dual I/O, and quad I/O
– DTR mode supported on all
• Execute-in-place (XIP) mode for all three protocols
– Configurable via volatile or nonvolatile registers
– Enables memory to work in XIP mode directly af-
ter power-on
• Electronic signature
– JEDEC-standard 2-byte signature (BA19h)
– Unique ID of 17 read-only bytes including: addi-
tional extended device ID (EDID) to identify de-
vice factory options; customized factory data
• Minimum 100,000 ERASE cycles per sector
• More than 20 years data retention
• Packages JEDEC standard, all RoHS compliant
– V-PDFN-8/8mm x 6mm (also known as SON,
DFPN, MLP, MLF)
• PROGRAM/ERASE SUSPEND operations
• Continuous read of entire memory via a single com-
mand
– Fast read
– Quad or dual output fast read
– Quad or dual I/O fast read
– SOP2-16/300mils (also known as SO16W, SO16-
Wide, SOIC-16)
– T-PBGA-24b05/6mm x 8mm (also known as
TBGA24)
• Flexible to fit application
– Configurable number of dummy cycles
– Output buffer configurable
• Software reset
• 3-byte and 4-byte addressability mode supported
• 64-byte, user-lockable, one-time programmable
(OTP) dedicated area
• An additional reset pin is available on the following
devices
– N25Q256A83ESF40x, N25Q256A83E1240x
• Erase capability
– Subsector erase 4KB uniform granularity blocks
– Sector erase 64KB uniform granularity blocks
– Full-chip erase
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n25q_256mb_65nm.pdf - Rev. P 01/13 EN
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Products and specifications discussed herein are subject to change by Micron without notice.
3V, 256Mb: Multiple I/O Serial Flash Memory
Features
Contents
Device Description ........................................................................................................................................... 6
Features ....................................................................................................................................................... 6
3-Byte Address and 4-Byte Address Modes ..................................................................................................... 6
Operating Protocols ...................................................................................................................................... 6
XIP Mode ..................................................................................................................................................... 6
Device Configurability .................................................................................................................................. 7
Signal Assignments ........................................................................................................................................... 8
Signal Descriptions ......................................................................................................................................... 10
Memory Organization .................................................................................................................................... 12
Memory Configuration and Block Diagram .................................................................................................. 12
Memory Map – 256Mb Density ....................................................................................................................... 13
Device Protection ........................................................................................................................................... 14
Serial Peripheral Interface Modes .................................................................................................................... 17
SPI Protocols .................................................................................................................................................. 19
Nonvolatile and Volatile Registers ................................................................................................................... 20
Status Register ............................................................................................................................................ 21
Nonvolatile and Volatile Configuration Registers .......................................................................................... 22
Extended Address Register .......................................................................................................................... 25
Enhanced Volatile Configuration Register .................................................................................................... 26
Flag Status Register ..................................................................................................................................... 26
Command Definitions .................................................................................................................................... 28
READ REGISTER and WRITE REGISTER Operations ........................................................................................ 32
READ STATUS REGISTER or FLAG STATUS REGISTER Command ................................................................ 32
READ NONVOLATILE CONFIGURATION REGISTER Command ................................................................... 32
READ VOLATILE or ENHANCED VOLATILE CONFIGURATION REGISTER Command .................................. 33
READ EXTENDED ADDRESS REGISTER Command ..................................................................................... 33
WRITE STATUS REGISTER Command ......................................................................................................... 33
WRITE NONVOLATILE CONFIGURATION REGISTER Command ................................................................. 34
WRITE VOLATILE or ENHANCED VOLATILE CONFIGURATION REGISTER Command ................................. 34
WRITE EXTENDED ADDRESS REGISTER Command ................................................................................... 35
READ LOCK REGISTER Command .............................................................................................................. 35
WRITE LOCK REGISTER Command ............................................................................................................ 36
CLEAR FLAG STATUS REGISTER Command ................................................................................................ 37
READ IDENTIFICATION Operations ............................................................................................................... 38
READ ID and MULTIPLE I/O READ ID Commands ...................................................................................... 38
READ SERIAL FLASH DISCOVERY PARAMETER Command ......................................................................... 39
READ MEMORY Operations ............................................................................................................................ 43
3-Byte Address ........................................................................................................................................... 43
4-Byte Address ........................................................................................................................................... 45
READ MEMORY Operations Timing – Single Transfer Rate ........................................................................... 46
READ MEMORY Operations Timing – Double Transfer Rate ......................................................................... 49
PROGRAM Operations .................................................................................................................................... 52
WRITE Operations .......................................................................................................................................... 57
WRITE ENABLE Command ......................................................................................................................... 57
WRITE DISABLE Command ........................................................................................................................ 57
ERASE Operations .......................................................................................................................................... 59
SUBSECTOR ERASE Command ................................................................................................................... 59
SECTOR ERASE Command ......................................................................................................................... 59
BULK ERASE Command ............................................................................................................................. 60
PROGRAM/ERASE SUSPEND Command ..................................................................................................... 61
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3V, 256Mb: Multiple I/O Serial Flash Memory
Features
PROGRAM/ERASE RESUME Command ...................................................................................................... 63
RESET Operations .......................................................................................................................................... 64
RESET ENABLE and RESET MEMORY Command ........................................................................................ 64
ONE TIME PROGRAMMABLE Operations ....................................................................................................... 65
READ OTP ARRAY Command ...................................................................................................................... 65
PROGRAM OTP ARRAY Command .............................................................................................................. 65
ADDRESS MODE Operations – Enter and Exit 4-Byte Address Mode ................................................................. 68
ENTER or EXIT 4-BYTE ADDRESS MODE Command ................................................................................... 68
ENTER or EXIT QUAD Command ................................................................................................................ 68
XIP Mode ....................................................................................................................................................... 69
Activate or Terminate XIP Using Volatile Configuration Register ................................................................... 69
Activate or Terminate XIP Using Nonvolatile Configuration Register ............................................................. 69
Confirmation Bit Settings Required to Activate or Terminate XIP .................................................................. 70
Terminating XIP After a Controller and Memory Reset ................................................................................. 71
Power Up and Power Down ............................................................................................................................. 72
Power Up and Power Down Requirements ................................................................................................... 72
Power Loss Recovery Sequence ................................................................................................................... 73
AC Reset Specifications ................................................................................................................................... 74
Absolute Ratings and Operating Conditions ..................................................................................................... 79
DC Characteristics and Operating Conditions .................................................................................................. 81
AC Characteristics and Operating Conditions .................................................................................................. 82
Package Dimensions ....................................................................................................................................... 84
Part Number Ordering Information ................................................................................................................. 87
Revision History ............................................................................................................................................. 89
Rev. P – 01/2013 .......................................................................................................................................... 89
Rev. O – 12/2012 ......................................................................................................................................... 89
Rev. N – 11/2012 ......................................................................................................................................... 89
Rev. M – 09/12 ............................................................................................................................................ 89
Rev. L – 08/12 ............................................................................................................................................. 89
Rev. K – 07/12 ............................................................................................................................................. 89
Rev. J – 06/12 .............................................................................................................................................. 89
Rev. I – 01/12 .............................................................................................................................................. 89
Rev. H, Preliminary – 11/11 ......................................................................................................................... 89
Rev. G, Preliminary – 07/11 ......................................................................................................................... 90
Rev. F, Preliminary – 07/11 ........................................................................................................................... 90
Rev. E, Preliminary – 05/11 .......................................................................................................................... 90
Rev. D, Preliminary – 05/11 ......................................................................................................................... 90
Rev. C – 11/10 ............................................................................................................................................. 90
Rev. B – 08/10 ............................................................................................................................................. 90
Rev. A – 06/10 ............................................................................................................................................. 90
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3V, 256Mb: Multiple I/O Serial Flash Memory
Features
List of Figures
Figure 1: Logic Diagram ................................................................................................................................... 7
Figure 2: 8-Lead, VDFPN8 – MLP8 (Top View) .................................................................................................. 8
Figure 3: 16-Lead, Plastic Small Outline – SO16 (Top View) ............................................................................... 8
Figure 4: 24-Ball TBGA (Balls Down) ................................................................................................................ 9
Figure 5: Block Diagram ................................................................................................................................ 12
Figure 6: Bus Master and Memory Devices on the SPI Bus ............................................................................... 18
Figure 7: SPI Modes ....................................................................................................................................... 18
Figure 8: Internal Configuration Register ........................................................................................................ 20
Figure 9: Upper and Lower 128Mb Memory Array Segments ........................................................................... 25
Figure 10: READ REGISTER Command .......................................................................................................... 32
Figure 11: WRITE REGISTER Command ......................................................................................................... 34
Figure 12: READ LOCK REGISTER Command ................................................................................................. 36
Figure 13: WRITE LOCK REGISTER Command ............................................................................................... 37
Figure 14: READ ID and MULTIPLE I/O Read ID Commands .......................................................................... 39
Figure 15: READ Command ........................................................................................................................... 46
Figure 16: FAST READ Command ................................................................................................................... 46
Figure 17: DUAL OUTPUT FAST READ Command – STR ................................................................................. 47
Figure 18: DUAL INPUT/OUTPUT FAST READ Command – STR ..................................................................... 47
Figure 19: QUAD OUTPUT FAST READ Command – STR ................................................................................ 48
Figure 20: QUAD INPUT/OUTPUT FAST READ Command – STR .................................................................... 48
Figure 21: FAST READ Command – DTR ......................................................................................................... 49
Figure 22: DUAL OUTPUT FAST READ Command – DTR ................................................................................ 50
Figure 23: DUAL INPUT/OUTPUT FAST READ Command – DTR .................................................................... 50
Figure 24: QUAD OUTPUT FAST READ Command – DTR ............................................................................... 51
Figure 25: QUAD INPUT/OUTPUT FAST READ Command – DTR ................................................................... 51
Figure 26: PAGE PROGRAM Command .......................................................................................................... 53
Figure 27: DUAL INPUT FAST PROGRAM Command ...................................................................................... 54
Figure 28: EXTENDED DUAL INPUT FAST PROGRAM Command ................................................................... 54
Figure 29: QUAD INPUT FAST PROGRAM Command ..................................................................................... 55
Figure 30: EXTENDED QUAD INPUT FAST PROGRAM Command ................................................................... 56
Figure 31: WRITE ENABLE and WRITE DISABLE Command Sequence ............................................................ 58
Figure 32: SUBSECTOR and SECTOR ERASE Command .................................................................................. 60
Figure 33: BULK ERASE Command ................................................................................................................ 61
Figure 34: RESET ENABLE and RESET MEMORY Command ........................................................................... 64
Figure 35: READ OTP Command .................................................................................................................... 65
Figure 36: PROGRAM OTP Command ............................................................................................................ 67
Figure 37: XIP Mode Directly After Power-On .................................................................................................. 70
Figure 38: Power-Up Timing .......................................................................................................................... 72
Figure 39: Reset AC Timing During PROGRAM or ERASE Cycle ........................................................................ 75
Figure 40: Reset Enable ................................................................................................................................. 75
Figure 41: Serial Input Timing ........................................................................................................................ 75
Figure 42: Write Protect Setup and Hold During WRITE STATUS REGISTER Operation (SRWD = 1) ................... 76
Figure 43: Hold Timing .................................................................................................................................. 77
Figure 44: Output Timing .............................................................................................................................. 78
Figure 45: VPPH Timing .................................................................................................................................. 78
Figure 46: AC Timing Input/Output Reference Levels ...................................................................................... 80
Figure 47: V-PDFN-8/8mm x 6mm ................................................................................................................. 84
Figure 48: SOP2-16/300 mils .......................................................................................................................... 85
Figure 49: T-PBGA-24b05/6mm x 8mm .......................................................................................................... 86
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3V, 256Mb: Multiple I/O Serial Flash Memory
Features
List of Tables
Table 1: Signal Descriptions ........................................................................................................................... 10
Table 2: Sectors[511:0] ................................................................................................................................... 13
Table 3: Data Protection using Device Protocols ............................................................................................. 14
Table 4: Memory Sector Protection Truth Table .............................................................................................. 14
Table 5: Protected Area Sizes – Upper Area ..................................................................................................... 14
Table 6: Protected Area Sizes – Lower Area ...................................................................................................... 15
Table 7: SPI Modes ........................................................................................................................................ 17
Table 8: Extended, Dual, and Quad SPI Protocols ............................................................................................ 19
Table 9: Status Register Bit Definitions ........................................................................................................... 21
Table 10: Nonvolatile Configuration Register Bit Definitions ........................................................................... 22
Table 11: Volatile Configuration Register Bit Definitions .................................................................................. 23
Table 12: Sequence of Bytes During Wrap ....................................................................................................... 24
Table 13: Supported Clock Frequencies – STR ................................................................................................. 24
Table 14: Supported Clock Frequencies – DTR ................................................................................................ 24
Table 15: Extended Address Register Bit Definitions ........................................................................................ 25
Table 16: Enhanced Volatile Configuration Register Bit Definitions .................................................................. 26
Table 17: Flag Status Register Bit Definitions .................................................................................................. 26
Table 18: Command Set ................................................................................................................................. 28
Table 19: Lock Register .................................................................................................................................. 35
Table 20: Data/Address Lines for READ ID and MULTIPLE I/O READ ID Commands ....................................... 38
Table 21: Read ID Data Out ............................................................................................................................ 38
Table 22: Extended Device ID, First Byte ......................................................................................................... 38
Table 23: Serial Flash Discovery Parameter Data Structure .............................................................................. 40
Table 24: Parameter ID .................................................................................................................................. 41
Table 25: Command/Address/Data Lines for READ MEMORY Commands ....................................................... 43
Table 26: Command/Address/Data Lines for READ MEMORY Commands – 4-Byte Address ............................. 45
Table 27: Data/Address Lines for PROGRAM Commands ................................................................................ 52
Table 28: Suspend Parameters ....................................................................................................................... 62
Table 29: Operations Allowed/Disallowed During Device States ...................................................................... 63
Table 30: OTP Control Byte (Byte 64) .............................................................................................................. 66
Table 31: XIP Confirmation Bit ....................................................................................................................... 70
Table 32: Effects of Running XIP in Different Protocols .................................................................................... 70
Table 33: Power-Up Timing and VWI Threshold ............................................................................................... 73
Table 34: AC RESET Conditions ...................................................................................................................... 74
Table 35: Absolute Ratings ............................................................................................................................. 79
Table 36: Operating Conditions ...................................................................................................................... 79
Table 37: Input/Output Capacitance .............................................................................................................. 79
Table 38: AC Timing Input/Output Conditions ............................................................................................... 80
Table 39: DC Current Characteristics and Operating Conditions ...................................................................... 81
Table 40: DC Voltage Characteristics and Operating Conditions ...................................................................... 81
Table 41: AC Characteristics and Operating Conditions ................................................................................... 82
Table 42: Part Number Information ................................................................................................................ 87
Table 43: Package Details ............................................................................................................................... 88
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3V, 256Mb: Multiple I/O Serial Flash Memory
Device Description
Device Description
The N25Q is the first high-performance multiple input/output serial Flash memory de-
vice manufactured on 65nm NOR technology. It features execute-in-place (XIP) func-
tionality, advanced write protection mechanisms, and a high-speed SPI-compatible bus
interface. The innovative, high-performance, dual and quad input/output instructions
enable double or quadruple the transfer bandwidth for READ and PROGRAM opera-
tions.
Features
The memory is organized as 512 (64KB) main sectors that are further divided into 16
subsectors each (8192 subsectors in total). The memory can be erased one 4KB subsec-
tor at a time, 64KB sectors at a time, or as a whole.
The memory can be write protected by software through volatile and nonvolatile pro-
tection features, depending on the application needs. The protection granularity is of
64KB (sector granularity) for volatile protections
The device has 64 one-time programmable (OTP) bytes that can be read and program-
med with the READ OTP and PROGRAM OTP commands. These 64 bytes can also be
permanently locked with a PROGRAM OTP command.
The device also has the ability to pause and resume PROGRAM and ERASE cycles by us-
ing dedicated PROGRAM/ERASE SUSPEND and RESUME instructions.
3-Byte Address and 4-Byte Address Modes
The device features 3-byte or 4-byte address modes to access memory beyond 128Mb.
When 4-byte address mode is enabled, all commands requiring an address must be en-
tered and exited with a 4-byte address mode command: ENTER 4-BYTE ADDRESS
MODE command and EXIT 4-BYTE ADDRESS MODE command. The 4-byte address
mode can also be enabled through the nonvolatile configuration register. See Registers
for more information.
Operating Protocols
The memory can be operated with three different protocols:
• Extended SPI (standard SPI protocol upgraded with dual and quad operations)
• Dual I/O SPI
• Quad I/O SPI
The standard SPI protocol is extended and enhanced by dual and quad operations. In
addition, the dual SPI and quad SPI protocols improve the data access time and
throughput of a single I/O device by transmitting commands, addresses, and data
across two or four data lines.
Each protocol contains unique commands to perform READ operations in DTR mode.
This enables high data throughput while running at lower clock frequencies.
XIP Mode
XIP mode requires only an address (no instruction) to output data, improving random
access time and eliminating the need to shadow code onto RAM for fast execution.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Device Description
All protocols support XIP operation. For flexibility, multiple XIP entry and exit methods
are available. For applications that must enter XIP mode immediately after powering
up, XIP mode can be set as the default mode through the nonvolatile configuration reg-
ister bits.
Device Configurability
The N25Q family offers additional features that are configured through the nonvolatile
configuration register for default and/or nonvolatile settings. Volatile settings can be
configured through the volatile and volatile-enhanced configuration registers. These
configurable features include the following:
• Number of dummy cycles for the fast READ commands
• Output buffer impedance
• SPI protocol types (extended SPI, DIO-SPI, or QIO-SPI)
• Required XIP mode
• Enabling/disabling HOLD (RESET function)
• Enabling/disabling wrap mode
Figure 1: Logic Diagram
VCC
DQ0
DQ1
C
S#
RESET2
V
PP/W#/DQ2
HOLD#/DQ3
VSS
1. Reset functionality is available in devices with a dedicated part number. See Part Num-
ber Ordering Information for more details.
Notes:
2. RESET is valid only for the N25Q256A83ESF40x and N25Q256A83E1240x devices. On
these devices, the additional RESET pin must be connected to an external pull-up.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Signal Assignments
Signal Assignments
Figure 2: 8-Lead, VDFPN8 – MLP8 (Top View)
S#
DQ1
1
2
3
4
8
7
6
5
VCC
HOLD#/DQ3
W#/VPP/DQ2
VSS
C
DQ0
1. On the underside of the MLP8 package, there is an exposed central pad that is pulled
Notes:
internally to VSS and must not be connected to any other voltage or signal line on the
PCB.
2. Reset functionality is available in devices with a dedicated part number. See Part Num-
ber Ordering Information for complete package names and details.
Figure 3: 16-Lead, Plastic Small Outline – SO16 (Top View)
HOLD#/DQ3
VCC
RESET/DNU2
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
C
DQ0
DNU
DNU
DNU
DNU
VSS
DNU
DNU
DNU
S#
DQ1
W#/VPP/DQ2
1. Reset functionality is available in devices with a dedicated part number. See Part Num-
ber Ordering Information for complete package names and details.
Notes:
2. Pin 3 is DNU, except for the N25Q256A83ESF40x device, where it is used as RESET.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Signal Assignments
Figure 4: 24-Ball TBGA (Balls Down)
1
2
3
4
5
A
B
NC
C
NC RESET/NC NC
NC
NC
NC
NC
VSS
VCC
NC
C
S#
NC W#/VPP/DQ2 NC
DQ0 HOLD#/DQ3 NC
D
E
DQ1
NC
NC
NC
NC
1. See Part Number Ordering Information for complete package names and details.
2. Ball A4 is NC, except for the N25Q256A83E1240x device, where it is used as RESET.
Notes:
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3V, 256Mb: Multiple I/O Serial Flash Memory
Signal Descriptions
Signal Descriptions
The signal description table below is a comprehensive list of signals for the N25 family
devices. All signals listed may not be supported on this device. See Signal Assignments
for information specific to this device.
Table 1: Signal Descriptions
Symbol
Type
Description
C
Input
Clock: Provides the timing of the serial interface. Commands, addresses, or data present at se-
rial data inputs are latched on the rising edge of the clock. Data is shifted out on the falling
edge of the clock.
S#
Input
Chip select: When S# is HIGH, the device is deselected and DQ1 is at High-Z. When in exten-
ded SPI mode, with the device deselected, DQ1 is tri-stated. Unless an internal PROGRAM,
ERASE, or WRITE STATUS REGISTER cycle is in progress, the device enters standby power mode
(not deep power-down mode). Driving S# LOW enables the device, placing it in the active pow-
er mode. After power-up, a falling edge on S# is required prior to the start of any command.
DQ0
Input
and I/O
Serial data: Transfers data serially into the device. It receives command codes, addresses, and
the data to be programmed. Values are latched on the rising edge of the clock. DQ0 is used for
input/output during the following operations: DUAL OUTPUT FAST READ, QUAD OUTPUT FAST
READ, DUAL INPUT/OUTPUT FAST READ, and QUAD INPUT/OUTPUT FAST READ. When used for
output, data is shifted out on the falling edge of the clock.
In DIO-SPI, DQ0 always acts as an input/output.
In QIO-SPI, DQ0 always acts as an input/output, with the exception of the PROGRAM or ERASE
cycle performed with VPP. The device temporarily enters the extended SPI protocol and then re-
turns to QIO-SPI as soon as VPP goes LOW.
DQ1
Output
and I/O
Serial data:Transfers data serially out of the device. Data is shifted out on the falling edge of
the clock. DQ1 is used for input/output during the following operations: DUAL INPUT FAST
PROGRAM, QUAD INPUT FAST PROGRAM, DUAL INPUT EXTENDED FAST PROGRAM, and QUAD
INPUT EXTENDED FAST PROGRAM. When used for input, data is latched on the rising edge of
the clock.
In DIO-SPI, DQ1 always acts as an input/output.
In QIO-SPI, DQ1 always acts as an input/output, with the exception of the PROGRAM or ERASE
cycle performed with the enhanced program supply voltage (VPP). In this case the device tem-
porarily enters the extended SPI protocol and then returns to QIO-SPI as soon as VPP goes LOW.
DQ2
Input
and I/O
DQ2: When in QIO-SPI mode or in extended SPI mode using QUAD FAST READ commands, the
signal functions as DQ2, providing input/output.
All data input drivers are always enabled except when used as an output. Micron recommends
customers drive the data signals normally (to avoid unnecessary switching current) and float
the signals before the memory device drives data on them.
DQ3
Input
and I/O
DQ3: When in quad SPI mode or in extended SPI mode using quad FAST READ commands, the
signal functions as DQ3, providing input/output. HOLD# is disabled and RESET# is disabled if
the device is selected.
RESET#
Control
Input
RESET: This is a hardware RESET# signal. When RESET# is driven HIGH, the memory is in the
normal operating mode. When RESET# is driven LOW, the memory enters reset mode and out-
put is High-Z. If RESET# is driven LOW while an internal WRITE, PROGRAM, or ERASE operation
is in progress, data may be lost.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Signal Descriptions
Table 1: Signal Descriptions (Continued)
Symbol
Type
Description
HOLD#
Control
Input
HOLD: Pauses any serial communications with the device without deselecting the device. DQ1
(output) is High-Z. DQ0 (input) and the clock are "Don't Care." To enable HOLD, the device
must be selected with S# driven LOW.
HOLD# is used for input/output during the following operations: QUAD OUTPUT FAST READ,
QUAD INPUT/OUTPUT FAST READ, QUAD INPUT FAST PROGRAM, and QUAD INPUT EXTENDED
FAST PROGRAM.
In QIO-SPI, HOLD# acts as an I/O (DQ3 functionality), and the HOLD# functionality is disabled
when the device is selected. When the device is deselected (S# is HIGH) in parts with RESET#
functionality, it is possible to reset the device unless this functionality is not disabled by means
of dedicated registers bits.
The HOLD# functionality can be disabled using bit 4 of the NVCR or bit 4 of the VECR.
On devices that include DTR mode capability, the HOLD# functionality is disabled as soon as a
DTR operation is recognized.
W#
Control
Input
Write protect: W# can be used as a protection control input or in QIO-SPI operations. When in
extended SPI with single or dual commands, the WRITE PROTECT function is selectable by the
voltage range applied to the signal. If voltage range is low (0V to VCC), the signal acts as a
write protection control input. The memory size protected against PROGRAM or ERASE opera-
tions is locked as specified in the status register block protect bits 3:0.
W# is used as an input/output (DQ2 functionality) during QUAD INPUT FAST READ and QUAD
INPUT/OUTPUT FAST READ operations and in QIO-SPI.
VPP
Power
Supply voltage: If VPP is in the voltage range of VPPH, the signal acts as an additional power
supply, as defined in the AC Measurement Conditions table.
During QIFP, QIEFP, and QIO-SPI PROGRAM/ERASE operations, it is possible to use the addition-
al VPP power supply to speed up internal operations. However, to enable this functionality, it is
necessary to set bit 3 of the VECR to 0.
In this case, VPP is used as an I/O until the end of the operation. After the last input data is shif-
ted in, the application should apply VPP voltage to VPP within 200ms to speed up the internal
operations. If the VPP voltage is not applied within 200ms, the PROGRAM/ERASE operations
start at standard speed.
The default value of VECR bit 3 is 1, and the VPP functionality for quad I/O modify operations is
disabled.
VCC
VSS
Power
Device core power supply: Source voltage.
Ground: Reference for the VCC supply voltage.
Do not use.
Ground
DNU
NC
–
–
No connect.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Memory Organization
Memory Organization
Memory Configuration and Block Diagram
Each page of memory can be individually programmed. Bits are programmed from one
through zero. The device is subsector, sector, or bulk-erasable, but not page-erasable.
Bits are erased from zero through one. The memory is configured as 33,554,432 bytes (8
bits each); 512 sectors (64KB each); 8192 subsectors (4KB each); and 131,072 pages (256
bytes each); and 64 OTP bytes are located outside the main memory array.
Figure 5: Block Diagram
HOLD#
High voltage
Control logic
generator
W#/V
PP
64 OTP bytes
S#
C
DQ0
DQ1
DQ2
DQ3
I/O shift register
Address register
and counter
256 byte
data buffer
Status
register
01FFFFFFh
0000000h
00000FFh
256 bytes (page size)
X decoder
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3V, 256Mb: Multiple I/O Serial Flash Memory
Memory Map – 256Mb Density
Memory Map – 256Mb Density
Table 2: Sectors[511:0]
Address Range
Sector
Subsector
Start
End
511
8191
01FF F000h
01FF FFFFh
⋮
⋮
⋮
8176
01FF 0000h
01FF 0FFFh
⋮
⋮
⋮
⋮
255
4095
00FF F000h
00FF FFFFh
⋮
⋮
⋮
4080
00FF 0000h
00FF 0FFFh
⋮
⋮
⋮
⋮
127
2047
007F F000h
007F FFFFh
⋮
⋮
⋮
2032
007F 0000h
007F 0FFFh
⋮
⋮
⋮
⋮
63
1023
003F F000h
003F FFFFh
⋮
⋮
⋮
1008
003F 0000h
003F 0FFFh
⋮
⋮
15
⋮
⋮
⋮
0
0000 F000h
⋮
0000 FFFFh
⋮
0
0000 0000h
0000 0FFFh
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3V, 256Mb: Multiple I/O Serial Flash Memory
Device Protection
Device Protection
Table 3: Data Protection using Device Protocols
Note 1 applies to the entire table
Protection by:
Description
Power-on reset and internal timer Protects the device against inadvertent data changes while the power supply is out-
side the operating specification.
Command execution check
Ensures that the number of clock pulses is a multiple of one byte before executing a
PROGRAM or ERASE command, or any command that writes to the device registers.
WRITE ENABLE operation
Ensures that commands modifying device data must be preceded by a WRITE ENABLE
command, which sets the write enable latch bit in the status register.
1. Extended, dual, and quad SPI protocol functionality ensures that device data is protec-
ted from excessive noise.
Note:
Table 4: Memory Sector Protection Truth Table
Note 1 applies to the entire table
Sector Lock Register
Sector Lock
Down Bit
Sector Write Lock
Bit
Memory Sector Protection Status
0
0
1
1
0
1
0
1
Sector unprotected from PROGRAM and ERASE operations. Protection status re-
versible.
Sector protected from PROGRAM and ERASE operations. Protection status rever-
sible.
Sector unprotected from PROGRAM and ERASE operations. Protection status not
reversible except by power cycle or reset.
Sector protected from PROGRAM and ERASE operations. Protection status not
reversible except by power cycle or reset.
1. Sector lock register bits are written to when the WRITE LOCK REGISTER command is exe-
cuted. The command will not execute unless the sector lock down bit is cleared (see the
WRITE LOCK REGISTER command). The sector lock register is programmed to have all
protection registers activated at power-up.
Note:
Table 5: Protected Area Sizes – Upper Area
Note 1 applies to the entire table
Status Register Content
Memory Content
Top/
Bottom
Bit
BP3
0
BP2
0
BP1
0
BP0
0
Protected Area
Unprotected Area
All sectors
0
None
0
0
0
0
1
Sector 512
Sectors (0 to 511)
Sectors (0 to 510)
Sectors (0 to 508)
Sectors (0 to 504)
0
0
0
1
0
Sectors (511 to 512)
Sectors (509 to 512)
Sectors (505 to 512)
0
0
0
1
1
0
0
1
0
0
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3V, 256Mb: Multiple I/O Serial Flash Memory
Device Protection
Table 5: Protected Area Sizes – Upper Area (Continued)
Note 1 applies to the entire table
Status Register Content
Memory Content
Top/
Bottom
Bit
BP3
0
BP2
1
BP1
0
BP0
1
Protected Area
Unprotected Area
Sectors (0 to 496)
Sectors (0 to 480)
Sectors (0 to 448)
Sectors (0 to 384)
Sectors (0 to 256)
None
0
0
0
0
0
0
0
0
0
0
0
Sectors (497 to 512)
Sectors (481 to 512)
Sectors (449 to 512)
Sectors (385 to 512)
Sectors (257 to 512)
All sectors
0
1
1
0
0
1
1
1
1
0
0
0
1
0
0
1
1
0
1
0
1
0
1
1
All sectors
None
1
1
0
0
All sectors
None
1
1
0
1
All sectors
None
1
1
1
0
All sectors
None
1
1
1
1
All sectors
None
1. See the Status Register for details on the top/bottom bit and the BP 3:0 bits.
Note:
Table 6: Protected Area Sizes – Lower Area
Note 1 applies to the entire table
Status Register Content
Memory Content
Top/
Bottom
Bit
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
BP3
0
BP2
0
BP1
0
BP0
0
Protected Area
Unprotected Area
All sectors
None
0
0
0
1
Sector 0
Sectors (1 to 511)
Sectors (2 to 511)
Sectors (4 to 511)
Sectors (8 to 511)
Sectors (16 to 511)
Sectors (32 to 511)
Sectors (64 to 511)
Sectors (128 to 511)
Sectors (256 to 511)
None
0
0
1
0
Sectors (0 to 1)
Sectors (0 to 3)
Sectors (0 to 7)
Sectors (0 to 15)
Sectors (0 to 31)
Sectors (0 to 63)
Sectors (0 to 127)
Sectors (0 to 255)
All sectors
0
0
1
1
0
1
0
0
0
1
0
1
0
1
1
0
0
1
1
1
1
0
0
0
1
0
0
1
1
0
1
0
1
0
1
1
All sectors
None
1
1
0
0
All sectors
None
1
1
0
1
All sectors
None
1
1
1
0
All sectors
None
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3V, 256Mb: Multiple I/O Serial Flash Memory
Device Protection
Table 6: Protected Area Sizes – Lower Area (Continued)
Note 1 applies to the entire table
Status Register Content
Memory Content
Top/
Bottom
Bit
BP3
BP2
BP1
BP0
Protected Area
All sectors
Unprotected Area
1
1
1
1
1
None
1. See the Status Register for details on the top/bottom bit and the BP 3:0 bits.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
Serial Peripheral Interface Modes
Serial Peripheral Interface Modes
The device can be driven by a microcontroller while its serial peripheral interface is in
either of the two modes shown here. The difference between the two modes is the clock
polarity when the bus master is in standby mode and not transferring data. Input data is
latched in on the rising edge of the clock, and output data is available from the falling
edge of the clock.
Table 7: SPI Modes
Note 1 applies to the entire table
SPI Modes
Clock Polarity
CPOL = 0, CPHA = 0
CPOL = 1, CPHA = 1
C remains at 0 for (CPOL = 0, CPHA = 0)
C remains at 1 for (CPOL = 1, CPHA = 1)
1. The listed SPI modes are supported in extended, dual, and quad SPI protocols.
Note:
Shown below is an example of three memory devices in extended SPI protocol in a sim-
ple connection to an MCU on an SPI bus. Because only one device is selected at a time,
that one device drives DQ1, while the other devices are High-Z.
Resistors ensure the device is not selected if the bus master leaves S# High-Z. The bus
master might enter a state in which all input/output is High-Z simultaneously, such as
when the bus master is reset. Therefore, the serial clock must be connected to an exter-
nal pull-down resistor so that S# is pulled HIGH while the serial clock is pulled LOW.
This ensures that S# and the serial clock are not HIGH simultaneously and that tSHCH
is met. The typical resistor value of 100kΩ, assuming that the time constant R × Cp (Cp =
parasitic capacitance of the bus line), is shorter than the time the bus master leaves the
SPI bus in High-Z.
Example: Cp = 50pF, that is R × Cp = 5μs. The application must ensure that the bus mas-
ter never leaves the SPI bus High-Z for a time period shorter than 5μs. W# and HOLD#
should be driven either HIGH or LOW, as appropriate.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Serial Peripheral Interface Modes
Figure 6: Bus Master and Memory Devices on the SPI Bus
VSS
VCC
R
SDO
SDI
SPI interface:
(CPOL, CPHA) =
(0, 0) or (1, 1)
SCK
C
VCC
VCC
VCC
C
C
VSS
VSS
VSS
SPI bus master
DQ1 DQ0
DQ1 DQ0
DQ1 DQ0
SPI memory
device
SPI memory
device
SPI memory
device
R
R
R
CS3
CS2 CS1
S#
S#
S#
W# HOLD#
W# HOLD#
W# HOLD#
Figure 7: SPI Modes
CPOL CPHA
0
1
0
1
C
C
MSB
DQ0
MSB
DQ1
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3V, 256Mb: Multiple I/O Serial Flash Memory
SPI Protocols
SPI Protocols
Table 8: Extended, Dual, and Quad SPI Protocols
Com-
Protocol
Name
mand
Input
Address
Input
Data
Input/Output Description
Multiple DQn Device default protocol from the factory. Additional com-
Extended
Dual
DQ0
Multiple DQn
lines, depending lines, depending mands extend the standard SPI protocol and enable address
on the command on the command or data transmission on multiple DQn lines.
DQ[1:0]
DQ[1:0]
DQ[1:0]
Volatile selectable: When the enhanced volatile configu-
ration register bit 6 is set to 0 and bit 7 is set to 1, the de-
vice enters the dual SPI protocol immediately after the
WRITE ENHANCED VOLATILE CONFIGURATION REGISTER
command. The device returns to the default protocol after
the next power-on. In addition, the device can return to de-
fault protocol using the rescue sequence or through new
WRITE ENHANCED VOLATILE CONFIGURATION REGISTER
command, without power-off or power-on.
Nonvolatile selectable: When nonvolatile configuration
register bit 2 is set, the device enters the dual SPI protocol
after the next power-on. Once this register bit is set, the de-
vice defaults to the dual SPI protocol after all subsequent
power-on sequences until the nonvolatile configuration
register bit is reset to 1.
Quad1
DQ[3:0]
DQ[3:0]
DQ[3:0]
Volatile selectable: When the enhanced volatile configu-
ration register bit 7 is set to 0, the device enters the quad
SPI protocol immediately after the WRITE ENHANCED VOL-
ATILE CONFIGURATION REGISTER command. The device re-
turns to the default protocol after the next power-on. In ad-
dition, the device can return to default protocol using the
rescue sequence or through new WRITE ENHANCED VOLA-
TILE CONFIGURATION REGISTER command, without power-
off or power-on.
Nonvolatile selectable: When nonvolatile configuration
register bit 3 is set to 0, the device enters the quad SPI pro-
tocol after the next power-on. Once this register bit is set,
the device defaults to the quad SPI protocol after all subse-
quent power-on sequences until the nonvolatile configura-
tion register bit is reset to 1.
1. In quad SPI protocol, all command/address input and data I/O are transmitted on four
lines except during a PROGRAM and ERASE cycle performed with VPP. In this case, the
device enters the extended SPI protocol to temporarily allow the application to perform
a PROGRAM/ERASE SUSPEND operation or to check the write-in-progress bit in the sta-
tus register or the program/erase controller bit in the flag status register. Then, when
VPP goes LOW, the device returns to the quad SPI protocol.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Nonvolatile and Volatile Registers
The device features the following volatile and nonvolatile registers that users can access
to store device parameters and operating configurations:
• Status register
• Nonvolatile and volatile configuration registers
• Extended address register
• Enhanced volatile configuration register
• Flag status register
• Lock register
Note: The lock register is defined in READ LOCK REGISTER Command.
The working condition of memory is set by an internal configuration register that is not
directly accessible to users. As shown below, parameters in the internal configuration
register are loaded from the nonvolatile configuration register during each device boot
phase or power-on reset. In this sense, then, the nonvolatile configuration register con-
tains the default settings of memory.
Also, during the life of an application, each time a WRITE VOLATILE or ENHANCED
VOLATILE CONFIGURATION REGISTER command executes to set configuration pa-
rameters in these respective registers, these new settings are copied to the internal con-
figuration register. Therefore, memory settings can be changed in real time. However, at
the next power-on reset, the memory boots according to the memory settings defined
in the nonvolatile configuration register parameters.
Figure 8: Internal Configuration Register
Volatile configuration register
and volatile enhanced
configuration register
Nonvolatile configuration register
Register download is executed after a
WRITE VOLATILE or ENHANCED
VOLATILE CONFIGURATION REGISTER
command, overwriting configuration
register settings on the internal
configuration register.
Register download is executed only
during the power-on phase or after
a reset, overwriting configuration
register settings on the internal
configuration register.
Internal configuration
register
Device behavior
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3V, 256Mb: Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Status Register
Table 9: Status Register Bit Definitions
Note 1 applies to entire table
Bit
Name
Settings
Description
Notes
7
Status register
0 = Enabled
Nonvolatile bit: Used with the W/VPP signal to enable or
3
write enable/disable 1 = Disabled
disable writing to the status register.
5
Top/bottom
0 = Top
1 = Bottom
Nonvolatile bit: Determines whether the protected mem-
ory area defined by the block protect bits starts from the
top or bottom of the memory array.
4
4
6, 4:2 Block protect 3–0
See Protected Area Nonvolatile bit: Defines memory to be software protec-
Sizes – Upper Area ted against PROGRAM or ERASE operations. When one or
and Lower Area ta- more block protect bits is set to 1, a designated memory
bles in Device Pro-
tection
area is protected from PROGRAM and ERASE operations.
1
0
Write enable latch
Write in progress
0 = Cleared (Default) Volatile bit: The device always powers up with this bit
2
2
1 = Set
cleared to prevent inadvertent WRITE STATUS REGISTER,
PROGRAM, or ERASE operations. To enable these opera-
tions, the WRITE ENABLE operation must be executed first
to set this bit.
0 = Ready
1 = Busy
Volatile bit: Indicates if one of the following command cy-
cles is in progress:
WRITE STATUS REGISTER
WRITE NONVOLATILE CONFIGURATION REGISTER
PROGRAM
ERASE
1. Bits can be read from or written to using READ STATUS REGISTER or WRITE STATUS REG-
ISTER commands, respectively.
Notes:
2. Volatile bits are cleared to 0 by a power cycle or reset.
3. The status register write enable/disable bit, combined with the W#/VPP signal as descri-
bed in the Signal Descriptions, provides hardware data protection for the device as fol-
lows: When the enable/disable bit is set to 1, and the W#/VPP signal is driven LOW, the
status register nonvolatile bits become read-only and the WRITE STATUS REGISTER oper-
ation will not execute. The only way to exit this hardware-protected mode is to drive
W#/VPP HIGH.
4. See Protected Area Sizes tables. The BULK ERASE command is executed only if all bits
are 0.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Nonvolatile and Volatile Configuration Registers
Table 10: Nonvolatile Configuration Register Bit Definitions
Note 1 applies to entire table
Bit Name
Settings
Description
Notes
15:12 Number of
0000 (identical to 1111)
Sets the number of dummy clock cycles subse-
quent to all FAST READ commands.
The default setting targets the maximum al-
lowed frequency and guarantees backward com-
patibility.
2, 3
dummy clock 0001
cycles
0010
.
.
1101
1110
1111
11:9 XIP mode at 000 = XIP: Fast Read
Enables the device to operate in the selected XIP
mode immediately after power-on reset.
power-on re- 001 = XIP: Dual Output Fast Read
set
010 = XIP: Dual I/O Fast Read
011 = XIP: Quad Output Fast Read
100 = XIP: Quad I/O Fast Read
101 = Reserved
110 = Reserved
111 = Disabled (Default)
8:6 Output driver 000 = Reserved
Optimizes impedance at VCC/2 output voltage.
strength
001 = 90 Ohms
010 = 60 Ohms
011 = 45 Ohms
100 = Reserved
101 = 20 Ohms
110 = 15 Ohms
111 = 30 (Default)
5
4
Reserved
X
"Don't Care."
Reset/hold
0 = Disabled
Enables or disables hold or reset.
1 = Enabled (Default)
(Available on dedicated part numbers.)
3
2
1
0
Quad I/O pro- 0 = Enabled
tocol 1 = Disabled (Default, Extended SPI prot-
cocol)
Dual I/O pro- 0 = Enabled
Enables or disables quad I/O protocol.
4
4
Enables or disables dual I/O protocol.
tocol
1 = Disabled (Default, Extended SPI pro-
tocol)
128Mb seg-
ment select
0 = Upper 128Mb segment
1 = Lower 128Mb segment (Default)
Selects a 128Mb segment as default for 3B ad-
dress operations. See also the extended address
register.
Address bytes 0 = Enable 4B address
1 = Enable 3B address (Default)
Defines the number of address bytes for a com-
mand.
1. Settings determine device memory configuration after power-on. The device ships from
the factory with all bits erased to 1 (FFFFh). The register is read from or written to by
READ NONVOLATILE CONFIGURATION REGISTER or WRITE NONVOLATILE CONFIGURA-
TION REGISTER commands, respectively.
Notes:
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3V, 256Mb: Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
2. The 0000 and 1111 settings are identical in that they both define the default state,
which is the maximum frequency of fc = 108 MHz. This ensures backward compatibility.
3. If the number of dummy clock cycles is insufficient for the operating frequency, the
memory reads wrong data. The number of cycles must be set according to and sufficient
for the clock frequency, which varies by the type of FAST READ command, as shown in
the Supported Clock Frequencies table.
4. If bits 2 and 3 are both set to 0, the device operates in quad I/O. When bits 2 or 3 are
reset to 0, the device operates in quad I/O or dual I/O respectively, after the next power-
on.
Table 11: Volatile Configuration Register Bit Definitions
Note 1 applies to entire table
Bit
Name
Settings
Description
Notes
7:4
Number of dum- 0000 (identical to 1111)
Sets the number of dummy clock cycles subsequent to
all FAST READ commands.
The default setting targets maximum allowed frequen-
cy and guarantees backward compatibility.
2, 3
my clock cycles
0001
0010
.
.
1101
1110
1111
3
XIP
0
1
Enables or disables XIP. For device part numbers with
feature digit equal to 2 or 4, this bit is always "Don’t
Care," so the device operates in XIP mode without set-
ting this bit.
2
Reserved
Wrap
x = Default
0b = Fixed value.
1:0
00 = 16-byte boundary
aligned
16-byte wrap: Output data wraps within an aligned 16-
byte boundary starting from the 3-byte address issued
after the command code.
4
01 = 32-byte boundary
aligned
32-byte wrap: Output data wraps within an aligned 32-
byte boundary starting from the 3-byte address issued
after the command code.
10 = 64-byte boundary
aligned
64-byte wrap: Output data wraps within an aligned 64-
byte boundary starting from the 3-byte address issued
after the command code.
11 = sequential (default)
Continuous reading (default): All bytes are read se-
quentially.
1. Settings determine the device memory configuration upon a change of those settings by
the WRITE VOLATILE CONFIGURATION REGISTER command. The register is read from or
written to by READ VOLATILE CONFIGURATION REGISTER or WRITE VOLATILE CONFIGU-
RATION REGISTER commands respectively.
Notes:
2. The 0000 and 1111 settings are identical in that they both define the default state,
which is the maximum frequency of fc = 108 MHz. This ensures backward compatibility.
3. If the number of dummy clock cycles is insufficient for the operating frequency, the
memory reads wrong data. The number of cycles must be set according to and be suffi-
cient for the clock frequency, which varies by the type of FAST READ command, as
shown in the Supported Clock Frequencies table.
4. See the Sequence of Bytes During Wrap table.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Table 12: Sequence of Bytes During Wrap
Starting Address
16-Byte Wrap
32-Byte Wrap
64-Byte Wrap
0
0-1-2- . . . -15-0-1- . .
0-1-2- . . . -31-0-1- . .
0-1-2- . . . -63-0-1- . .
1-2- . . . -63-0-1-2- . .
15-16-17- . . . -63-0-1- . .
31-32-33- . . . -63-0-1- . .
63-0-1- . . . -63-0-1- . .
1
1-2- . . . -15-0-1-2- . .
1-2- . . . -31-0-1-2- . .
15
31
63
15-0-1-2-3- . . . -15-0-1- . .
31-16-17- . . . -31-16-17- . .
63-48-49- . . . -63-48-49- . .
15-16-17- . . . -31-0-1- . .
31-0-1-2-3- . . . -31-0-1- . .
63-32-33- . . . -63-32-33- . .
Table 13: Supported Clock Frequencies – STR
Note 1 applies to entire table
Number of Dummy
Clock Cycles
DUAL OUTPUT
FAST READ
DUAL I/O FAST
READ
QUAD OUTPUT QUAD I/O FAST
FAST READ
90
FAST READ
READ
1
2
80
50
70
43
60
30
100
90
40
3
108
100
80
75
50
4
108
105
90
90
60
5
108
108
100
105
108
108
108
108
100
105
108
108
108
108
70
6
108
108
80
7
108
108
86
8
108
108
95
9
108
108
105
108
10
108
108
1. Values are guaranteed by characterization and not 100% tested in production.
Note:
Table 14: Supported Clock Frequencies – DTR
Number of Dummy
Clock Cycles
DUAL OUTPUT
FAST READ
DUAL I/O FAST
READ
QUAD OUTPUT QUAD I/O FAST
FAST READ
FAST READ
READ
1
2
45
50
54
54
54
54
54
54
54
54
40
45
50
53
54
54
54
54
54
54
25
35
40
45
50
53
54
54
54
54
30
38
45
47
50
53
54
54
54
54
15
20
3
25
4
30
5
35
6
40
7
43
8
48
9
53
10
54
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3V, 256Mb: Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Extended Address Register
For devices whose A[MAX:MIN] equals A[23:0], the N25 family includes an extended ad-
dress register that provides a fourth address byte A[31:24], enabling access to memory
beyond 128Mb. Extended address register bit 0 is used to select the upper 128Mb seg-
ment or the lower 128Mb segment of the memory array.
Figure 9: Upper and Lower 128Mb Memory Array Segments
Upper 128Mb
Bottom 128Mb
EAR<0> = A<24> = 1
01FFFFFFh
00FFFFFFh
01000000h
00000000h
EAR<0> = A<24> = 0
The PROGRAM and ERASE operations act upon the 128Mb segment selected in the ex-
tended address register.
The BULK ERASE operation erases the entire device.
The READ operation begins reading in the selected 128Mb segment, but is not bound
by it. In a continuous READ, when the last byte of the segment is read, the next byte out-
put is the first byte of the other segment as the operation wraps to 0000000h; Therefore,
a download of the whole array is possible with one READ operation. The value of the
extended address register does not change when a READ operation crosses the selected
128Mb boundary.
Table 15: Extended Address Register Bit Definitions
Note 1 applies to entire table
Bit Name
Settings
Description
7
6
5
4
3
2
1
0
A[31:25]
0 = Reserved
–
A[24]
0 = Lower 128Mb segment Enables 128Mb segmentation selection.
(default)
The default setting for this bit is determined by the non-
1 = Upper 128Mb segment volatile configuration register bit 1. However, this set-
ting can be changed with the WRITE EXTENDED AD-
DRESS REGISTER command.
1. The extended address register is for an application that supports only 3-byte addressing.
It extends the device's first three address bytes A[23:0] to a fourth address byte A[31:24]
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
to enable memory access beyond 128Mb. The extended address register bit 0 enables
128Mb segmentation selection. If 4-byte addressing is enabled, extended address regis-
ter settings are ignored.
Enhanced Volatile Configuration Register
Table 16: Enhanced Volatile Configuration Register Bit Definitions
Note 1 applies to entire table
Bit
Name
Settings
Description
Notes
7
Quad I/O protocol
0 = Enabled
Enables or disables quad I/O protocol.
2
1 = Disabled (Default,
extended SPI protocol)
6
Dual I/O protocol
0 = Enabled
1 = Disabled (Default,
extended SPI protocol)
Enables or disables dual I/O protocol.
0b = Fixed value.
2
5
4
Reserved
x = Default
Reset/hold
0 = Disabled
Enables or disables hold or reset.
1 = Enabled (Default)
(Available on dedicated part numbers.)
3
VPP accelerator
0 = Enabled
Enables or disables VPP acceleration for QUAD
1 = Disabled (Default) INPUT FAST PROGRAM and QUAD INPUT EX-
TENDED FAST PROGRAM OPERATIONS.
2:0
Output driver strength 000 = Reserved
001 = 90 Ohms
Optimizes impedance at VCC/2 output voltage.
010 = 60 Ohms
011 = 45 Ohms
100 = Reserved
101 = 20 Ohms
110 = 15 Ohms
111 = 30 (Default)
1. Settings determine the device memory configuration upon a change of those settings by
the WRITE ENHANCED VOLATILE CONFIGURATION REGISTER command. The register is
read from or written to in all protocols by READ ENHANCED VOLATILE CONFIGURATION
REGISTER or WRITE ENHANCED VOLATILE CONFIGURATION REGISTER commands, respec-
tively.
Notes:
2. If bits 6 and 7 are both set to 0, the device operates in quad I/O. When either bit 6 or 7 is
reset to 0, the device operates in quad I/O or dual I/O respectively following the next
WRITE ENHANCED VOLATILE CONFIGURATION command.
Flag Status Register
Table 17: Flag Status Register Bit Definitions
Note 1 applies to entire table
Bit Name
Settings
Description
Notes
7
Program or
erase
controller
0 = Busy
1 = Ready
Status bit: Indicates whether a PROGRAM, ERASE,
WRITE STATUS REGISTER, or WRITE NONVOLATILE CON-
FIGURATION command cycle is in progress.
2, 3
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3V, 256Mb: Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Table 17: Flag Status Register Bit Definitions (Continued)
Note 1 applies to entire table
Bit Name Settings
Erase suspend 0 = Not in effect
Description
Notes
6
5
4
3
2
1
Status bit: Indicates whether an ERASE operation has
been or is going to be suspended.
3
1 = In effect
Erase
Program
VPP
0 = Clear
Error bit: Indicates whether an ERASE operation has
4, 5
4, 5
4, 5
3
1 = Failure or protection error succeeded or failed.
0 = Clear
Error bit: An attempt to program a 0 to a 1 when VPP =
1 = Failure or protection error VPPH and the data pattern is a multiple of 64 bits.
0 = Enabled
Error bit: Indicates an invalid voltage on VPP during a
PROGRAM or ERASE operation.
1 = Disabled (Default)
Program sus-
pend
0 = Not in effect
1 = In effect
Status bit: Indicates whether a PROGRAM operation
has been or is going to be suspended.
Protection
0 = Clear
Error bit: Indicates whether a PROGRAM operation has
4, 5
1 = Failure or protection error attempted to modify the protected array sector or ac-
cess the locked OTP space.
0
Addressing
0 = 3 bytes addressing
1 = 4 bytes addressing
Status bit: Indicates whether 3-byte or 4-byte address
mode is enabled.
3
1. Register bits are read by READ STATUS REGISTER command. All bits are volatile.
Notes:
2. These program/erase controller settings apply only to PROGRAM or ERASE command cy-
cles in progress; they do not apply to a WRITE command cycle in progress.
3. Status bits are reset automatically.
4. Error bits must be reset by CLEAR FLAG STATUS REGISTER command.
5. Typical errors include operation failures and protection errors caused by issuing a com-
mand before the error bit has been reset to 0.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Command Definitions
Command Definitions
Table 18: Command Set
Note 1 applies to entire table
Dual
I/O
Quad
I/O
Data
Bytes
Command
Code
Extended
Notes
RESET Operations
RESET ENABLE
66h
99h
Yes
Yes
Yes
0
2
RESET MEMORY
IDENTIFICATION Operations
READ ID
9E/9Fh
AFh
Yes
No
No
Yes
Yes
No
Yes
Yes
1 to 20
1 to 3
1 to ∞
2
2
3
MULTIPLE I/O READ ID
READ SERIAL FLASH
5Ah
Yes
DISCOVERY PARAMETER
READ Operations
READ
03h
0Bh
3Bh
Yes
Yes
Yes
Yes
No
Yes
Yes
Yes
No
Yes
No
No
1 to ∞
1 to ∞
4
5
FAST READ
DUAL OUTPUT FAST READ
DUAL INPUT/OUTPUT FAST READ
5
0Bh
3Bh
BBh
5, 11
QUAD OUTPUT FAST READ
6Bh
Yes
Yes
No
No
Yes
Yes
1 to ∞
5
QUAD INPUT/OUTPUT FAST READ
0Bh
6Bh
EBh
5, 12
FAST READ – DTR
0Dh
3Dh
Yes
Yes
Yes
Yes
Yes
Yes
Yes
No
No
1 to ∞
1 to ∞
1 to ∞
6
6
6
DUAL OUTPUT FAST READ – DTR
DUAL INPUT/OUTPUT FAST READ – DTR
0Dh
3Dh
BDh
QUAD OUTPUT FAST READ – DTR
6Dh
Yes
Yes
No
No
Yes
Yes
1 to ∞
1 to ∞
6
7
QUAD INPUT/OUTPUT FAST READ – DTR
0Dh
3Dh
EDh
4-BYTE READ
13h
0Ch
3Ch
BCh
Yes
Yes
Yes
1 to ∞
1 to ∞
8
9
4-BYTE FAST READ
4-BYTE DUAL OUTPUT FAST READ
Yes
Yes
Yes
Yes
No
No
9
4-BYTE DUAL INPUT/OUTPUT FAST
READ
9, 11
4-BYTE QUAD OUTPUT FAST READ
6Ch
ECh
Yes
Yes
No
No
Yes
Yes
1 to ∞
9
4-BYTE QUAD INPUT/OUTPUT FAST
READ
10, 12
WRITE Operations
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3V, 256Mb: Multiple I/O Serial Flash Memory
Command Definitions
Table 18: Command Set (Continued)
Note 1 applies to entire table
Dual
I/O
Quad
I/O
Data
Bytes
Command
Code
06h
Extended
Notes
WRITE ENABLE
Yes
Yes
Yes
0
2
WRITE DISABLE
04h
REGISTER Operations
READ STATUS REGISTER
WRITE STATUS REGISTER
READ LOCK REGISTER
WRITE LOCK REGISTER
READ FLAG STATUS REGISTER
CLEAR FLAG STATUS REGISTER
05h
01h
E8h
E5h
70h
50h
B5h
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
1 to ∞
2
2, 13
4
1
1 to ∞
1
1 to ∞
0
4, 13
2
READ NONVOLATILE
2
2
CONFIGURATION REGISTER
WRITE NONVOLATILE
CONFIGURATION REGISTER
B1h
85h
81h
65h
61h
2, 13
2
READ VOLATILE
CONFIGURATION REGISTER
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
1 to ∞
WRITE VOLATILE
CONFIGURATION REGISTER
1
1 to ∞
1
2, 13
2
READ ENHANCED VOLATILE
CONFIGURATION REGISTER
WRITE ENHANCED VOLATILE
CONFIGURATION REGISTER
2, 13
READ EXTENDED ADDRESS REGISTER
WRITE EXTENDED ADDRESS REGISTER
PROGRAM Operations
C8h
C5h
0
2
2, 16
PAGE PROGRAM
02h
12h
A2h
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
No
No
1 to 256
1 to 256
1 to 256
4, 13
4, 13, 14
4, 13
4-BYTE PAGE PROGRAM
DUAL INPUT FAST PROGRAM
EXTENDED DUAL INPUT
FAST PROGRAM
02h
A2h
D2h
4, 11, 13
QUAD INPUT FAST PROGRAM
32h
34h
Yes
Yes
Yes
No
No
No
Yes
Yes
Yes
1 to 256
4, 13
4-BYTE QUAD INPUT FAST PROGRAM
4, 13, 14
EXTENDED QUAD INPUT
FAST PROGRAM
02h
32h
4, 12, 13, 15
12h/38h
ERASE Operations
SUBSECTOR ERASE
20h
21h
Yes
29
Yes
Yes
0
4, 13
4-BYTE SUBSECTOR ERASE
4, 13, 14
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3V, 256Mb: Multiple I/O Serial Flash Memory
Command Definitions
Table 18: Command Set (Continued)
Note 1 applies to entire table
Dual
I/O
Quad
I/O
Data
Bytes
Command
Code
D8h
DCh
C7h
Extended
Notes
4, 13
SECTOR ERASE
Yes
Yes
Yes
0
4-BYTE SECTOR ERASE
BULK ERASE
4, 13, 14
4, 13
Yes
Yes
Yes
Yes
Yes
Yes
0
0
PROGRAM/ERASE RESUME
PROGRAM/ERASE SUSPEND
7Ah
75h
2, 13
ONE-TIME PROGRAMMABLE (OTP) Operations
READ OTP ARRAY
4Bh
42h
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
1 to 64
5
PROGRAM OTP ARRAY
4-BYTE ADDRESS MODE Operations
ENTER 4-BYTE ADDRESS MODE
EXIT 4-BYTE ADDRESS MODE
QUAD Operations
4, 13
B7h
E9h
0
0
2, 16
ENTER QUAD
35h
F5h
2, 14
2, 14
EXIT QUAD
1. Yes in the protocol columns indicates that the command is supported and has the same
functionality and command sequence as other commands marked Yes.
Notes:
2. Address bytes = 0. Dummy clock cycles = 0.
3. Address bytes = 3. Dummy clock cycles default = 8.
4. Address bytes default = 3; address bytes = 4 (extended address). Dummy clock cycles = 0.
5. Address bytes default = 3; address bytes = 4 (extended address). Dummy clock cycles de-
fault = 8. Dummy clock cycles default = 10 (when quad SPI protocol is enabled). Dummy
clock cycles are configurable by the user.
6. Address bytes default = 3; address bytes = 4 (extended address). Dummy clock cycles de-
fault = 6. Dummy clock cycles default = 8 when quad SPI protocol is enabled. Dummy
clock cycles are configurable by the user.
7. Address bytes default = 3; address bytes = 4 (extended address). Dummy clock cycles de-
fault = 8. Dummy clock cycles are configurable by the user.
8. Address bytes = 4. Dummy clock cycles = 0.
9. Address bytes = 4. Dummy clock cycles default = 8. Dummy clock cycles default = 10
(when quad SPI protocol is enabled). Dummy clock cycles are configurable by the user.
10. Address bytes = 4. Dummy clock cycles default = 10. Dummy clock cycles is configurable
by the user.
11. When the device is in dual SPI protocol, the command can be entered with any of these
three codes. The different codes enable compatibility between dual SPI and extended
SPI protocols.
12. When the device is in quad SPI protocol, the command can be entered with any of these
three codes. The different codes enable compatibility between quad SPI and extended
SPI protocols.
13. The WRITE ENABLE command must be issued first before this command can be execu-
ted.
14. This command is only for part numbers N25Q256A83ESF40x and N25Q256A83E1240x.
15. The code 38h is valid only for part numbers N25Q256A83ESF40x and
N25Q256A83E1240x; the code 12h is valid for the other part numbers.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Command Definitions
16. The WRITE ENABLE command must be issued first before this command can be execu-
ted. Not necessary for part numbers N25Q256A83ESF40x and N25Q256A83E1240x.
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
READ REGISTER and WRITE REGISTER Operations
READ STATUS REGISTER or FLAG STATUS REGISTER Command
To initiate a READ STATUS REGISTER command, S# is driven LOW. For extended SPI
protocol, the command code is input on DQ0, and output on DQ1. For dual SPI proto-
col, the command code is input on DQ[1:0], and output on DQ[1:0]. For quad SPI proto-
col, the command code is input on DQ[3:0], and is output on DQ[3:0]. The operation is
terminated by driving S# HIGH at any time during data output.
The status register can be read continuously and at any time, including during a PRO-
GRAM, ERASE, or WRITE operation.
The flag status register can be read continuously and at any time, including during an
ERASE or WRITE operation.
If one of these operations is in progress, checking the write in progress bit or P/E con-
troller bit is recommended before executing the command.
Figure 10: READ REGISTER Command
Extended
0
7
8
9
10
11
12
13
14
15
C
LSB
DQ0
DQ1
Command
High-Z
MSB
LSB
DOUT
MSB
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
Dual
0
3
4
5
6
7
C
LSB
LSB
DOUT
DOUT
DOUT
DOUT
DOUT
MSB
DQ[1:0]
Command
MSB
Quad
0
1
2
3
C
LSB
LSB
DOUT
DOUT
MSB
DOUT
DQ[3:0]
Command
Don’t Care
MSB
1. Supports all READ REGISTER commands except READ LOCK REGISTER.
Notes:
2. A READ NONVOLATILE CONFIGURATION REGISTER operation will output data starting
from the least significant byte.
READ NONVOLATILE CONFIGURATION REGISTER Command
To execute a READ NONVOLATILE CONFIGURATION REGISTER command, S# is driv-
en LOW. For extended SPI protocol, the command code is input on DQ0, and output on
DQ1. For dual SPI protocol, the command code is input on DQ[1:0], and output on
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
DQ[1:0]. For quad SPI protocol, the command code is input on DQ[3:0], and is output
on DQ[3:0]. The operation is terminated by driving S# HIGH at any time during data
output.
The nonvolatile configuration register can be read continuously. After all 16 bits of the
register have been read, a 0 is output. All reserved fields output a value of 1.
READ VOLATILE or ENHANCED VOLATILE CONFIGURATION REGISTER Command
To execute a READ VOLATILE CONFIGURATION REGISTER command or a READ EN-
HANCED VOLATILE CONFIGURATION REGISTER command, S# is driven LOW. For ex-
tended SPI protocol, the command code is input on DQ0, and output on DQ1. For dual
SPI protocol, the command code is input on DQ[1:0], and output on DQ[1:0]. For quad
SPI protocol, the command code is input on DQ[3:0], and is output on DQ[3:0]. The op-
eration is terminated by driving S# HIGH at any time during data output.
When the register is read continuously, the same byte is output repeatedly.
READ EXTENDED ADDRESS REGISTER Command
To initiate a READ EXTENDED ADDRESS REGISTER command, S# is driven LOW. For
extended SPI protocol, the command code is input on DQ0, and output on DQ1. For
dual SPI protocol, the command code is input on DQ[1:0], and output on DQ[1:0]. For
quad SPI protocol, the command code is input on DQ[3:0], and is output on DQ[3:0].
The operation is terminated by driving S# HIGH at any time during data output.
When the register is read continuously, the same byte is output repeatedly.
WRITE STATUS REGISTER Command
To issue a WRITE STATUS REGISTER command, the WRITE ENABLE command must be
executed to set the write enable latch bit to 1. S# is driven LOW and held LOW until the
eighth bit of the last data byte has been latched in, after which it must be driven HIGH.
For extended SPI protocol, the command code is input on DQ0, followed by the data
bytes. For dual SPI protocol, the command code is input on DQ[1:0], followed by the da-
ta bytes. For quad SPI protocol, the command code is input on DQ[3:0], followed by the
data bytes. When S# is driven HIGH, the operation, which is self-timed, is initiated; its
duration is tW.
This command is used to write new values to status register bits 7:2, enabling software
data protection. The status register can also be combined with the W#/VPP signal to
provide hardware data protection. The WRITE STATUS REGISTER command has no ef-
fect on status register bits 1:0.
When the operation is in progress, the write in progress bit is set to 1. The write enable
latch bit is cleared to 0, whether the operation is successful or not. The status register
and flag status register can be polled for the operation status. When the operation com-
pletes, the write in progress bit is cleared to 0, whether the operation is successful or
not. If S# is not driven HIGH, the command is not executed, flag status register error
bits are not set, and the write enable latch remains set to 1.
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
Figure 11: WRITE REGISTER Command
Extended
0
7
8
9
10
11
12
13
14
15
C
LSB
LSB
DIN
MSB
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DQ0
Command
MSB
MSB
MSB
Dual
0
3
4
5
6
7
C
LSB
LSB
DIN
MSB
DIN
DIN
DIN
DQ[1:0]
Command
0
Quad
1
2
3
C
LSB
LSB
DIN
MSB
DIN
DQ[3:0]
Command
1. Supports all WRITE REGISTER commands except WRITE LOCK REGISTER.
Notes:
2. Waveform must be extended for each protocol, to 23 for extended, 11 for dual, and 5
for quad.
3. A WRITE NONVOLATILE CONFIGURATION REGISTER operation requires data being sent
starting from least significant byte.
WRITE NONVOLATILE CONFIGURATION REGISTER Command
To execute the WRITE NONVOLATILE CONFIGURATION REGISTER command, the
WRITE ENABLE command must be executed to set the write enable latch bit to 1. S# is
driven LOW and held LOW until the 16th bit of the last data byte has been latched in,
after which it must be driven HIGH. For extended SPI protocol, the command code is
input on DQ0, followed by two data bytes. For dual SPI protocol, the command code is
input on DQ[1:0], followed by the data bytes. For quad SPI protocol, the command code
is input on DQ[3:0], followed by the data bytes. When S# is driven HIGH, the operation,
which is self-timed, is initiated; its duration is tNVCR.
When the operation is in progress, the write in progress bit is set to 1. The write enable
latch bit is cleared to 0, whether the operation is successful or not. The status register
and flag status register can be polled for the operation status. When the operation com-
pletes, the write in progress bit is cleared to 0, whether the operation is successful or
not. If S# is not driven HIGH, the command is not executed, flag status register error
bits are not set, and the write enable latch remains set to 1.
WRITE VOLATILE or ENHANCED VOLATILE CONFIGURATION REGISTER Command
To execute a WRITE VOLATILE CONFIGURATION REGISTER command or a WRITE
ENHANCED VOLATILE CONFIGURATION REGISTER command, the WRITE ENABLE
command must be executed to set the write enable latch bit to 1. S# is driven LOW and
held LOW until the eighth bit of the last data byte has been latched in, after which it
must be driven HIGH. For extended SPI protocol, the command code is input on DQ0,
followed by the data bytes. For dual SPI protocol, the command code is input on
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
DQ[1:0], followed by the data bytes. For quad SPI protocol, the command code is input
on DQ[3:0], followed by the data bytes.
Because register bits are volatile, change to the bits is immediate. If S# is not driven
HIGH, the command is not executed, flag status register error bits are not set, and the
write enable latch remains set to 1. Reserved bits are not affected by this command.
WRITE EXTENDED ADDRESS REGISTER Command
To initiate a WRITE EXTENDED ADDRESS REGISTER command, the WRITE ENABLE
command must be executed to set the write enable latch bit to 1. (Note: The WRITE EN-
ABLE command must NOT be executed on the N25Q256A83ESF40x and
N25Q256A83E1240x devices.) S# is driven LOW and held LOW until the eighth bit of the
last data byte has been latched in, after which it must be driven HIGH. The command
code is input on DQ0, followed by the data bytes. For dual SPI protocol, the command
code is input on DQ[1:0], followed by the data bytes. For quad SPI protocol, the com-
mand code is input on DQ[3:0], followed by the data bytes.
Because register bits are volatile, change to the bits is immediate. If S# is not driven
HIGH, the command is not executed, the flag status register error bits are not set, and
the write enable latch remains set to 1. Reserved bits are not affected by this command.
READ LOCK REGISTER Command
To execute the READ LOCK REGISTER command, S# is driven LOW. For extended SPI
protocol, the command code is input on DQ0, followed by address bytes that point to a
location in the sector. For dual SPI protocol, the command code is input on DQ[1:0]. For
quad SPI protocol, the command code is input on DQ[3:0]. Each address bit is latched
in during the rising edge of the clock. For extended SPI protocol, data is shifted out on
DQ1 at a maximum frequency fC during the falling edge of the clock. For dual SPI proto-
col, data is shifted out on DQ[1:0], and for quad SPI protocol, data is shifted out on
DQ[3:0]. The operation is terminated by driving S# HIGH at any time during data out-
put.
When the register is read continuously, the same byte is output repeatedly. Any READ
LOCK REGISTER command that is executed while an ERASE, PROGRAM, or WRITE cy-
cle is in progress is rejected with no affect on the cycle in progress.
Table 19: Lock Register
Note 1 applies to entire table
Bit
7:2
1
Name
Settings
Description
Reserved
0
Bit values are 0.
Sector lock down
0 = Cleared (Default) Volatile bit: the device always powers-up with this bit cleared,
1 = Set
which means sector lock down and sector write lock bits can be
set.
When this bit set, neither of the lock register bits can be written
to until the next power cycle.
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
Table 19: Lock Register (Continued)
Note 1 applies to entire table
Bit
Name
Settings
Description
0
Sector write lock
0 = Cleared (Default) Volatile bit: the device always powers-up with this bit cleared,
1 = Set
which means that PROGRAM and ERASE operations in this sector
can be executed and sector content modified.
When this bit is set, PROGRAM and ERASE operations in this sec-
tor will not be executed.
1. Sector lock register bits 1:0 are written by the WRITE LOCK REGISTER command. The
command will not execute unless the sector lock down bit is cleared.
Note:
Figure 12: READ LOCK REGISTER Command
Extended
0
7
8
Cx
C
LSB
A[MIN]
DQ[0]
DQ1
Command
High-Z
MSB
A[MAX]
LSB
DOUT DOUT
DOUT
MSB
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
Dual
0
3
4
Cx
C
LSB
A[MIN]
LSB
DOUT DOUT
DOUT
MSB
DOUT
DOUT
DQ[1:0]
Command
MSB
A[MAX]
Quad
0
1
2
Cx
C
LSB
A[MIN]
LSB
DOUT
DOUT
MSB
DOUT
DQ[3:0]
Command
Don’t Care
MSB
A[MAX]
1. For extended SPI protocol, Cx = 7 + (A[MAX] + 1).
For dual SPI protocol, Cx = 3 + ((A[MAX] + 1)/2).
For quad SPI protocol, Cx = 1 + ((A[MAX] + 1)/4).
Note:
WRITE LOCK REGISTER Command
To initiate the WRITE LOCK REGISTER command, the WRITE ENABLE command must
be executed to set the write enable latch bit to 1. S# is driven LOW and held LOW until
the eighth bit of the last data byte has been latched in, after which it must be driven
HIGH. The command code is input on DQn, followed by address bytes that point to a
location in the sector, and then one data byte that contains the desired settings for lock
register bits 0 and 1. Each address bit is latched in during the rising edge of the clock.
When execution is complete, the write enable latch bit is cleared within tSHSL2 and no
error bits are set. Because lock register bits are volatile, change to the bits is immediate.
WRITE LOCK REGISTER can be executed when an ERASE SUSPEND operation is in ef-
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
fect. If S# is not driven HIGH, the command is not executed, flag status register error
bits are not set, and the write enable latch remains set to 1.
Figure 13: WRITE LOCK REGISTER Command
Extended
0
7
8
C
x
C
LSB
A[MIN]
LSB
D
D
D
D
D
D
D
D
D
IN
DQ[0]
Command
IN
IN
IN
IN
IN
IN
IN
IN
MSB
A[MAX]
MSB
Dual
0
3
4
C
x
C
LSB
A[MIN]
LSB
D
D
D
D
D
IN
DQ[1:0]
Command
IN
IN
IN
IN
MSB
A[MAX]
MSB
Quad
0
1
2
C
x
C
LSB
A[MIN]
LSB
D
D
D
IN
DQ[3:0]
Command
IN
IN
MSB
A[MAX]
MSB
1. For extended SPI protocol, Cx = 7 + (A[MAX] + 1).
For dual SPI protocol, Cx = 3 + ((A[MAX] + 1)/2).
For quad SPI protocol, Cx = 1 + ((A[MAX] + 1)/4).
Note:
CLEAR FLAG STATUS REGISTER Command
To execute the CLEAR FLAG STATUS REGISTER command and reset the error bits
(erase, program, and protection), S# is driven LOW. For extended SPI protocol, the com-
mand code is input on DQ0. For dual SPI protocol, the command code is input on
DQ[1:0]. For quad SPI protocol, the command code is input on DQ[3:0]. The operation
is terminated by driving S# HIGH at any time.
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ IDENTIFICATION Operations
READ IDENTIFICATION Operations
READ ID and MULTIPLE I/O READ ID Commands
To execute the READ ID or MULTIPLE I/O READ ID commands, S# is driven LOW and
the command code is input on DQn. The device outputs the information shown in the
tables below. If an ERASE or PROGRAM cycle is in progress when the command is exe-
cuted, the command is not decoded and the command cycle in progress is not affected.
When S# is driven HIGH, the device goes to standby. The operation is terminated by
driving S# HIGH at any time during data output.
Table 20: Data/Address Lines for READ ID and MULTIPLE I/O READ ID Commands
Unique ID
is Output
Command Name
READ ID
Data In
DQ0
Data Out
DQ0
Extended
Yes
Dual
No
Quad
No
Yes
No
MULTIPLE I/O READ ID
DQ[3:0]
DQ[1:0]
No
Yes
Yes
1. Yes in the protocol columns indicates that the command is supported and has the same
functionality and command sequence as other commands marked Yes.
Note:
Table 21: Read ID Data Out
Size
(Bytes) Name
Content Value
Assigned by
1
2
Manufacturer ID
20h (selected by READ
MANUFACTURER ID)
JEDEC
Device ID
Memory Type
BAh
Manufacturer
Factory
Memory Capacity
Unique ID
19h (256Mb)
17
1 Byte: Length of data to follow
10h
2 Bytes: Extended device ID and device
configuration information
ID and information such as uniform
architecture, and HOLD
or RESET functionality
14 Bytes: Customized factory data
Optional
1. The 17 bytes of information in the unique ID is read by the READ ID command, but can-
not be read by the MULTIPLE I/O READ ID command.
Note:
Table 22: Extended Device ID, First Byte
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
Reserved
Reserved 1 = Alternate BP Volatile configuration
HOLD#/RESET#:
0 = HOLD
Addressing:
0 = by byte
Architecture:
00 = Uniform
scheme
0 = Standard BP
scheme
register bit setting:
0 = Required
1 = Not required
1 = RESET
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ IDENTIFICATION Operations
Figure 14: READ ID and MULTIPLE I/O Read ID Commands
Extended
0
7
8
15
16
31
32
C
LSB
DQ0
DQ1
Command
MSB
LSB
LSB
LSB
D
D
D
D
D
D
High-Z
OUT
OUT
OUT
OUT
OUT
OUT
MSB
MSB
MSB
Manufacturer
identification
Device
identification
UID
Dual
0
3
4
7
8
15
C
LSB
LSB
LSB
D
D
D
D
DQ[1:0]
Command
OUT
OUT
OUT
OUT
MSB
MSB
MSB
Manufacturer
identification
Device
identification
Quad
0
1
2
3
4
7
C
LSB
LSB
LSB
D
D
D
D
DQ[3:0]
Command
OUT
OUT
OUT
OUT
MSB
MSB
MSB
Manufacturer
identification
Device
identification
Don’t Care
1. The READ ID command is represented by the extended SPI protocol timing shown first.
The MULTIPLE I/O READ ID command is represented by the dual and quad SPI protocols
are shown below extended SPI protocol.
Note:
READ SERIAL FLASH DISCOVERY PARAMETER Command
To execute READ SERIAL FLASH DISCOVERY PARAMETER command, S# is driven
LOW. The command code is input on DQ0, followed by three address bytes and eight
dummy clock cycles (address is always 3 bytes, even for 4-byte address mode). The de-
vice outputs the information starting from the specified address. When the 2048-byte
boundary is reached, the data output wraps to address 0 of the serial Flash discovery
parameter table. The operation is terminated by driving S# HIGH at any time during da-
ta output.
The operation always executes in continuous mode so the read burst wrap setting in the
volatile configuration register does not apply.
Note: Data to be stored in the serial Flash discovery parameter area is still in the defini-
tion phase.
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ IDENTIFICATION Operations
Table 23: Serial Flash Discovery Parameter Data Structure
Compliant with JEDEC standard JC-42.4 1775.03
Address
Description
(Byte Mode)
Address (Bit)
7:00
Data
53h
46h
44h
50h
00h
01h
00h
FFh
00h
00h
01h
09h
30h
00h
00h
FFh
FFh
FFh
FFh
FFh
FFh
FFh
FFh
FFh
FFh
FFh
FFh
FFh
FFh
FFh
FFh
FFh
Serial Flash discoverable parameters signature
00h
01h
02h
03h
04h
05h
06h
07h
08h
09h
0Ah
0Bh
0Ch
0Dh
0Eh
0Fh
10h
11h
12h
13h
14h
15h
16h
17h
18h
19h
1Ah
1Bh
1Ch
1Dh
1Eh
1Fh
15:8
23:16
31:24
7:0
Serial Flash discoverable parameters
Minor revision
Major revision
15:8
Number of parameter headers
Reserved
7:0
15:8
Parameter ID (0) JEDEC-defined parameter table
7:0
Parameter
Minor revision
15:8
Major revision
23:16
31:24
7:0
Parameter length (DW)
Parameter table pointer
15:8
23:16
31:24
7:0
Reserved
Parameter ID (1)
Parameter
Minor revision
Major revision
15:8
23:16
31:24
7:0
Parameter length (DW)
Parameter table pointer
15:8
23:16
31:24
7:0
Reserved
Parameter ID (2)
Parameter
Minor revision
Major revision
15:8
23:16
31:24
7:0
Parameter length (DW)
Parameter table pointer
15:8
23:16
31:24
Reserved
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ IDENTIFICATION Operations
Table 24: Parameter ID
Compliant with JEDEC standard JC-42.4 1775.03
Address
Description
(Byte Mode)
Address (Bit)
Data
Minimum block/sector erase sizes
30h
0
1
10
Write granularity
2
1
0
WRITE ENABLE command required for writing to volatile status reg-
isters
3
4
Reserved
5
1
1
6
7
1
4KB erase command code
31h
32h
15:8
16
20h
1
Supports DUAL OUTPUT FAST READ operation (single input address,
dual output)
Number of address bytes used (3-byte or 4-byte) for array READ,
WRITE, and ERASE commands
17
18
19
20
1
Supports double transfer rate clocking
1
1
Supports DUAL INPUT/OUTPUT FAST READ operation (dual input ad-
dress, dual output)
Supports QUAD INPUT/OUTPUT FAST READ operation (quad input
address, quad output)
21
22
1
1
Supports QUAD OUTPUT FAST READ operation (single input address,
quad output)
Reserved
23
1
Reserved
33h
34h–37h
38h
31:24
31:0
4:00
FFh
Flash size (bits)
0FFFFFFFh
01001b
Number of dummy clock cycles required before valid output from
QUAD INPUT/OUTPUT FAST READ operation
Number of XIP confirmation bits for QUAD INPUT/OUTPUT FAST
READ operation
7:5
001b
Command code for QUAD INPUT/OUTPUT FAST READ operation
39h
3Ah
15:8
EBh
Number of dummy clock cycles required before valid output from
QUAD OUTPUT FAST READ operation
20:16
00111b
Number of XIP confirmation bits for QUAD OUTPUT FAST READ op-
eration
23:21
001b
Command code for QUAD OUTPUT FAST READ operation
3Bh
3Ch
31:24
4:0
6Bh
Number of dummy clock cycles required before valid output from
DUAL OUTPUT FAST READ operation
01000b
Number of XIP confirmation bits for DUAL OUTPUT FAST READ oper-
ation
7:5
000b
3Bh
Command code for DUAL OUTPUT FAST READ operation
3Dh
15:8
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ IDENTIFICATION Operations
Table 24: Parameter ID (Continued)
Compliant with JEDEC standard JC-42.4 1775.03
Address
Description
(Byte Mode)
Address (Bit)
Data
Number of dummy clock cycles required before valid output from
DUAL INPUT/OUTPUT FAST READ operation
3Eh
20:16
00111b
Number of XIP confirmation bits for DUAL INPUT/OUTPUT FAST
READ
23:21
001b
Command code for DUAL INPUT/OUTPUT FAST READ operation
3Fh
40h
31:24
0
BBh
1
Supports FAST READ operation in dual SPI protocol
Reserved
3:1
4
111b
1
Supports FAST READ operation in quad SPI protocol
Reserved
Reserved
Reserved
7:5
–
111b
FFFFFFh
FFFFh
00111b
41h–43h
44h–45h
46h
–
Number of dummy clock cycles required before valid output from
FAST READ operation in dual SPI protocol
4:0
Number of XIP confirmation bits for FAST READ operation in dual SPI
protocol
46h
7:5
001b
Command code for FAST READ operation in dual SPI protocol
Reserved
47h
48h–49h
4Ah
7:0
–
BBh
FFFFh
01001b
Number of dummy clock cycles required before valid output from
FAST READ operation in quad SPI protocol
4:0
Number of XIP confirmation bits for FAST READ operation in quad
SPI protocol
7:5
001b
Command code for FAST READ operation in quad SPI protocol
Sector type 1 size (4k)
4Bh
4Ch
4Ch
4Eh
4Fh
50h
51h
52h
53h
7:0
7:0
7:0
7:0
7:0
7:0
7:0
7:0
7:0
EBh
0Ch
0Ch
10h
D8h
00h
00h
00h
00h
Sector type 1 command code (4k)
Sector type 2 size (64KB)
Sector type 2 command code 64KB)
Sector type 3 size (not present)
Sector type 3 size (not present)
Sector type 4 size (not present)
Sector type 4 size (not present)
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ MEMORY Operations
READ MEMORY Operations
The device supports default reading and writing to an A[MAX:MIN] of A[23:0] (3-byte
address).
Reading and writing to an A[MAX:MIN] of A[31:0] (4-byte address) is also supported. Se-
lection of the 3-byte or 4-byte address range can be enabled in two ways: setting the
nonvolatile configuration register or entering the ENABLE 4-BYTE ADDRESS MODE or
EXIT 4-BYTE ADDRESS MODE commands. Further details for these settings and com-
mands are in the respective register and command sections of the data sheet.
Note: When the device is set to the default address range of A[23:0], another method for
enabling 4-byte addressing is through the extended address register. Details can be
found in Nonvolatile and Volatile Registers.
3-Byte Address
To execute READ MEMORY commands, S# is driven LOW. The command code is input
on DQn, followed by input on DQn of three address bytes. Each address bit is latched in
during the rising edge of the clock. The addressed byte can be at any location, and the
address automatically increments to the next address after each byte of data is shifted
out; therefore, the entire memory can be read with a single command. The operation is
terminated by driving S# HIGH at any time during data output.
Table 25: Command/Address/Data Lines for READ MEMORY Commands
Note 1 applies to entire table
Command Name
DUAL
QUAD
FAST
DUAL OUTPUT INPUT/OUTPUT QUAD OUTPUT INPUT/OUTPUT
READ
03h
–
READ
FAST READ
FAST READ
FAST READ
FAST READ
STR Mode
0Bh
0Dh
3Bh
BBh
6Bh
EBh
DTR Mode
3Dh
BDh
6Dh
EDh
Extended SPI Protocol
Supported
Yes
Yes
Yes
DQ0
Yes
Yes
DQ0
Yes
Command Input
Address Input
Data Output
DQ0
DQ0
DQ1
DQ0
DQ0
DQ1
DQ0
DQ0
DQ0
DQ[1:0]
DQ[1:0]
DQ0
DQ[3:0]
DQ[3:0]
DQ[1:0]
DQ[3:0]
Dual SPI Protocol
Supported
No
–
Yes
Yes
Yes
No
–
No
–
Command Input
Address Input
Data Output
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
–
–
–
–
–
–
Quad SPI Protocol
Supported
No
–
Yes
No
–
No
–
Yes
Yes
Command Input
Address Input
DQ[3:0]
DQ[3:0]
DQ[3:0]
DQ[3:0]
DQ[3:0]
DQ[3:0]
–
–
–
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ MEMORY Operations
Table 25: Command/Address/Data Lines for READ MEMORY Commands (Continued)
Note 1 applies to entire table
Command Name
DUAL
QUAD
FAST
DUAL OUTPUT INPUT/OUTPUT QUAD OUTPUT INPUT/OUTPUT
READ
READ
FAST READ
FAST READ
FAST READ
FAST READ
STR Mode
DTR Mode
Data Output
03h
0Bh
0Dh
3Bh
3Dh
–
BBh
BDh
–
6Bh
EBh
–
6Dh
EDh
–
DQ[3:0]
DQ[3:0]
DQ[3:0]
1. Yes in the "Supported" row for each protocol indicates that the command in that col-
umn is supported; when supported, a command's functionality is identical for the entire
column regardless of the protocol. For example, a FAST READ functions the same for all
three protocols even though its data is input/output differently depending on the pro-
tocol.
Notes:
2. FAST READ is similar to READ, but requires dummy clock cycles following the address
bytes and can operate at a higher frequency (fC).
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ MEMORY Operations
4-Byte Address
To execute 4-byte READ MEMORY commands, S# is driven LOW. The command code is
input on DQn, followed by input on DQn of four address bytes. Each address bit is
latched in during the rising edge of the clock. The addressed byte can be at any location,
and the address automatically increments to the next address after each byte of data is
shifted out; therefore, the entire memory can be read with a single command. The oper-
ation is terminated by driving S# HIGH at any time during data output.
Table 26: Command/Address/Data Lines for READ MEMORY Commands – 4-Byte Address
Notes 1 and 2 apply to entire table
Command Name (4-Byte Address)
DUAL
QUAD
FAST
DUAL OUTPUT INPUT/OUTPUT QUAD OUTPUT INPUT/OUTPUT
READ
03h/13h
–
READ
FAST READ
3Bh/3Ch
3Dh
FAST READ
BBh/BCh
BDh
FAST READ
6Bh/6Ch
6Dh
FAST READ
EBh/ECh
EDh
STR Mode
0Bh/0Ch
0Dh
DTR Mode
Extended SPI Protocol
Supported
Yes
Yes
Yes
DQ0
Yes
Yes
DQ0
Yes
Command Input
Address Input
Data Output
DQ0
DQ0
DQ1
DQ0
DQ0
DQ1
DQ0
DQ0
DQ0
DQ[1:0]
DQ[1:0]
DQ0
DQ[3:0]
DQ[3:0]
DQ[1:0]
DQ[3:0]
Dual SPI Protocol
Supported
No
–
Yes
Yes
Yes
No
–
No
–
Command Input
Address Input
Data Output
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
DQ[1:0]
–
–
–
–
–
–
Quad SPI Protocol
Supported
No
–
Yes
No
–
No
–
Yes
Yes
Command Input
Address Input
Data Output
DQ[3:0]
DQ[3:0]
DQ[3:0]
DQ[3:0]
DQ[3:0]
DQ[3:0]
DQ[3:0]
DQ[3:0]
DQ[3:0]
–
–
–
–
–
–
1. Yes in the "Supported" row for each protocol indicates that the command in that col-
umn is supported; when supported, a command's functionality is identical for the entire
column regardless of the protocol. For example, a FAST READ functions the same for all
three protocols even though its data is input/output differently depending on the pro-
tocol.
Notes:
2. Command codes 13h, 0Ch, 3Ch, BCh, 6Ch, and ECh do not need to be set up in the ad-
dressing mode; they will work directly in 4-byte addressing mode.
3. A 4-BYTE FAST READ command is similar to 4-BYTE READ operation, but requires dum-
my clock cycles following the address bytes and can operate at a higher frequency (fC).
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ MEMORY Operations
Figure 15: READ Command
Extended
0
7
8
Cx
C
LSB
A[MIN]
DQ[0]
DQ1
Command
High-Z
MSB
A[MAX]
LSB
DOUT
DOUT
MSB
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
Don’t Care
1. Cx = 7 + (A[MAX] + 1).
Note:
READ MEMORY Operations Timing – Single Transfer Rate
Figure 16: FAST READ Command
Extended
0
7
8
Cx
C
LSB
A[MIN]
DQ0
Command
MSB
A[MAX]
LSB
DOUT DOUT
DOUT
MSB
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
DQ1
High-Z
Dummy cycles
Dual
0
3
4
Cx
C
LSB
A[MIN]
LSB
DOUT DOUT
DOUT
MSB
DOUT
DOUT
DQ[1:0]
Command
MSB
A[MAX]
Dummy cycles
Quad
0
1
2
Cx
C
LSB
A[MIN]
LSB
DOUT
DOUT
MSB
DOUT
DQ[3:0]
Command
MSB
A[MAX]
Don’t Care
Dummy cycles
1. For extended protocol, Cx = 7 + (A[MAX] + 1).
For dual protocol, Cx = 3 + (A[MAX] + 1)/2.
For quad protocol, Cx = 1 + (A[MAX] + 1)/4.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ MEMORY Operations
Figure 17: DUAL OUTPUT FAST READ Command – STR
0
7
8
Cx
C
LSB
A[MIN]
LSB
DOUT DOUT
DOUT
DOUT
DOUT
DQ0
Command
High-Z
MSB
A[MAX]
DOUT
MSB
DOUT
DOUT
DOUT
DOUT
DQ1
Dummy cycles
1. Cx = 7 + (A[MAX] + 1).
Notes:
2. Shown here is the DUAL OUTPUT FAST READ timing for the extended SPI protocol. The
dual timing shown for the FAST READ command is the equivalent of the DUAL OUTPUT
FAST READ timing for the dual SPI protocol.
Figure 18: DUAL INPUT/OUTPUT FAST READ Command – STR
0
7
8
Cx
C
LSB
A[MIN]
LSB
DOUT DOUT
DOUT
DOUT
DOUT
DQ0
Command
High-Z
MSB
DOUT
MSB
DOUT
DOUT
DOUT
DOUT
DQ1
A[MAX]
Dummy cycles
1. Cx = 7 + (A[MAX] + 1)/2.
Notes:
2. Shown here is the DUAL INPUT/OUTPUT FAST READ timing for the extended SPI proto-
col. The dual timing shown for the FAST READ command is the equivalent of the DUAL
INPUT/OUTPUT FAST READ timing for the dual SPI protocol.
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ MEMORY Operations
Figure 19: QUAD OUTPUT FAST READ Command – STR
0
7
8
Cx
C
LSB
A[MIN]
LSB
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
DQ0
Command
High-Z
‘1’
MSB
A[MAX]
DOUT
DQ[2:1]
DQ3
DOUT
MSB
Dummy cycles
1. Cx = 7 + (A[MAX] + 1).
Notes:
2. Shown here is the QUAD OUTPUT FAST READ timing for the extended SPI protocol. The
quad timing shown for the FAST READ command is the equivalent of the QUAD OUT-
PUT FAST READ timing for the quad SPI protocol.
Figure 20: QUAD INPUT/OUTPUT FAST READ Command – STR
0
7
8
Cx
C
LSB
A[MIN]
LSB
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
DQ0
Command
High-Z
‘1’
MSB
DOUT
DQ[2:1]
DQ3
DOUT
A[MAX]
MSB
Dummy cycles
1. Cx = 7 + (A[MAX] + 1)/4.
Notes:
2. Shown here is the QUAD INPUT/OUTPUT FAST READ timing for the extended SPI proto-
col. The quad timing shown for the FAST READ command is the equivalent of the QUAD
INPUT/OUTPUT FAST READ timing for the quad SPI protocol.
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ MEMORY Operations
READ MEMORY Operations Timing – Double Transfer Rate
Figure 21: FAST READ Command – DTR
Extended
0
7
8
C
x
C
LSB
A[MIN]
DQ0
Command
MSB
A[MAX]
LSB
OUT
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
OUT
DQ1
High-Z
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
MSB
Dummy cycles
Dual
0
3
4
C
x
C
LSB
A[MIN]
LSB
D
D
D
D
D
D
D
D
DQ[1:0]
Command
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
MSB
A[MAX]
MSB
Dummy cycles
Quad
0
1
2
C
x
C
LSB
A[MIN]
LSB
D
D
D
D
DQ[3:0]
Command
OUT
OUT
OUT OUT
MSB
A[MAX]
MSB
Don’t Care
Dummy cycles
1. For extended protocol, Cx = 7 + (A[MAX] + 1)/2.
For dual protocol, Cx = 3 + (A[MAX] + 1)/4.
For quad protocol, Cx = 1 + (A[MAX] + 1)/8.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ MEMORY Operations
Figure 22: DUAL OUTPUT FAST READ Command – DTR
0
7
8
Cx
C
LSB
A[MIN]
LSB
DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
DQ0
Command
High-Z
MSB
A[MAX]
DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
DQ1
MSB
Dummy cycles
1. Cx = 7 + (A[MAX] + 1)/2.
Notes:
2. Shown here is the DUAL OUTPUT FAST READ timing for the extended SPI protocol. The
dual timing shown for the FAST READ command is the equivalent of the DUAL OUTPUT
FAST READ timing for the dual SPI protocol.
Figure 23: DUAL INPUT/OUTPUT FAST READ Command – DTR
0
7
8
Cx
C
LSB
A[MIN]
LSB
DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
DQ0
Command
High-Z
MSB
DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
DQ1
A[MAX]
MSB
Dummy cycles
1. Cx = 7 + (A[MAX] + 1)/4.
Notes:
2. Shown here is the DUAL INPUT/OUTPUT FAST READ timing for the extended SPI proto-
col. The dual timing shown for the FAST READ command is the equivalent of the DUAL
INPUT/OUTPUT FAST READ timing for the dual SPI protocol.
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3V, 256Mb: Multiple I/O Serial Flash Memory
READ MEMORY Operations
Figure 24: QUAD OUTPUT FAST READ Command – DTR
0
7
8
Cx
C
LSB
A[MIN]
LSB
DOUT DOUT DOUT DOUT
DQ0
Command
High-Z
‘1’
MSB
A[MAX]
DOUT DOUT DOUT DOUT
DQ[2:1]
DQ3
DOUT DOUT DOUT DOUT
MSB
Dummy cycles
1. Cx = 7 + (A[MAX] + 1)/2.
Notes:
2. Shown here is the QUAD OUTPUT FAST READ timing for the extended SPI protocol. The
quad timing shown for the FAST READ command is the equivalent of the QUAD OUT-
PUT FAST READ timing for the quad SPI protocol.
Figure 25: QUAD INPUT/OUTPUT FAST READ Command – DTR
0
7
8
Cx
C
LSB
A[MIN]
LSB
DOUT DOUT DOUT DOUT
DQ0
Command
High-Z
‘1’
MSB
DOUT DOUT DOUT DOUT
DQ[2:1]
DQ3
DOUT DOUT DOUT DOUT
MSB
A[MAX]
Dummy cycles
1. Cx = 7 + (A[MAX] + 1)/8.
Notes:
2. Shown here is the QUAD INPUT/OUTPUT FAST READ timing for the extended SPI proto-
col. The quad timing shown for the FAST READ command is the equivalent of the QUAD
INPUT/OUTPUT FAST READ timing for the quad SPI protocol.
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3V, 256Mb: Multiple I/O Serial Flash Memory
PROGRAM Operations
PROGRAM Operations
PROGRAM commands are initiated by first executing the WRITE ENABLE command to
set the write enable latch bit to 1. S# is then driven LOW and held LOW until the eighth
bit of the last data byte has been latched in, after which it must be driven HIGH. The
command code is input on DQ0, followed by input on DQ[n] of address bytes and at
least one data byte. Each address bit is latched in during the rising edge of the clock.
When S# is driven HIGH, the operation, which is self-timed, is initiated; its duration is
tPP.
If the bits of the least significant address, which is the starting address, are not all zero,
all data transmitted beyond the end of the current page is programmed from the start-
ing address of the same page. If the number of bytes sent to the device exceed the maxi-
mum page size, previously latched data is discarded and only the last maximum page-
size number of data bytes are guaranteed to be programmed correctly within the same
page. If the number of bytes sent to the device is less than the maximum page size, they
are correctly programmed at the specified addresses without any effect on the other
bytes of the same page.
When the operation is in progress, the write in progress bit is set to 1. The write enable
latch bit is cleared to 0, whether the operation is successful or not. The status register
and flag status register can be polled for the operation status. An operation can be
paused or resumed by the PROGRAM/ERASE SUSPEND or PROGRAM/ERASE RESUME
command, respectively. When the operation completes, the write in progress bit is
cleared to 0.
If the operation times out, the write enable latch bit is reset and the program fail bit is
set to 1. If S# is not driven HIGH, the command is not executed, flag status register error
bits are not set, and the write enable latch remains set to 1. When a command is applied
to a protected sector, the command is not executed, the write enable latch bit remains
set to 1, and flag status register bits 1 and 4 are set.
Table 27: Data/Address Lines for PROGRAM Commands
Note 1 applies to entire table
Command Name
Data In
DQ0
Address In
DQ0
Extended
Yes
Dual
Yes
Quad
Yes
PAGE PROGRAM
DUAL INPUT FAST PROGRAM
DQ[1:0]
DQ[1:0]
DQ0
Yes
Yes
No
EXTENDED DUAL INPUT
FAST PROGRAM
DQ[1:0]
Yes
Yes
No
QUAD INPUT FAST PROGRAM
DQ[3:0]
DQ[3:0]
DQ0
Yes
Yes
No
No
Yes
Yes
EXTENDED QUAD INPUT
FAST PROGRAM
DQ[3:0]
1. Yes in the protocol columns indicates that the command is supported and has the same
functionality and command sequence as other commands marked Yes.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
PROGRAM Operations
Figure 26: PAGE PROGRAM Command
Extended
0
7
8
Cx
C
LSB
A[MIN]
LSB
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DQ[0]
Command
MSB
A[MAX]
MSB
Dual
0
3
4
Cx
C
LSB
A[MIN]
LSB
DIN
DIN
DIN
DIN
DIN
DQ[1:0]
Command
MSB
A[MAX]
MSB
Quad
0
1
2
Cx
C
LSB
A[MIN]
LSB
DIN
DIN
DIN
DQ[3:0]
Command
MSB
A[MAX]
MSB
1. For extended SPI protocol, Cx = 7 + (A[MAX] + 1).
For dual SPI protocol, Cx = 3 + (A[MAX] + 1)/2.
For quad SPI protocol, Cx = 1 + (A[MAX] + 1)/4.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
PROGRAM Operations
Figure 27: DUAL INPUT FAST PROGRAM Command
Extended
0
7
8
C
x
C
LSB
A[MIN]
LSB
D
D
D
D
D
D
D
D
D
D
DQ0
DQ1
Command
IN
IN
IN
IN
IN
MSB
A[MAX]
High-Z
IN
IN
IN
IN
IN
MSB
Dual
0
3
4
Cx
C
LSB
A[MIN]
LSB
DIN
DIN
DIN
DIN
DIN
DQ[1:0]
Command
MSB
A[MAX]
MSB
1. For extended SPI protocol, Cx = 7 + (A[MAX] + 1).
For dual SPI protocol, Cx = 3 + (A[MAX] + 1)/2.
Note:
Figure 28: EXTENDED DUAL INPUT FAST PROGRAM Command
Extended
0
7
8
Cx
C
LSB
A[MIN]
LSB
DIN
DIN
DIN
DIN
DIN
DQ0
Command
MSB
DIN
DIN
DIN
DIN
DIN
High-Z
0
DQ1
A[MAX]
MSB
Dual
3
4
Cx
C
LSB
A[MIN]
LSB
DIN
DIN
DIN
DIN
DIN
DQ[1:0]
Command
MSB
A[MAX]
MSB
1. For extended SPI protocol, Cx = 7 + (A[MAX] + 1)/2.
For dual SPI protocol, Cx = 3 + (A[MAX] + 1)/2.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
PROGRAM Operations
Figure 29: QUAD INPUT FAST PROGRAM Command
Extended
0
7
8
C
x
C
LSB
A[MIN]
LSB
D
D
D
D
D
D
DQ0
Command
IN
IN
IN
IN
IN
MSB
A[MAX]
High-Z
0
DQ[3:1]
IN
MSB
Quad
1
2
C
x
C
LSB
A[MIN]
LSB
D
D
D
DQ[3:0]
Command
IN
IN
IN
MSB
A[MAX]
MSB
1. For extended SPI protocol, Cx = 7 + (A[MAX] + 1)/4.
For quad SPI protocol, Cx = 1 + (A[MAX] + 1)/4.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
PROGRAM Operations
Figure 30: EXTENDED QUAD INPUT FAST PROGRAM Command
Extended
0
7
8
C
x
C
LSB
A[MIN]
LSB
D
D
D
D
D
D
D
D
D
Command
DQ0
DQ[2:1]
DQ3
IN
IN
IN
IN
IN
IN
IN
IN
IN
MSB
High-Z
‘1’
0
A[MAX]
MSB
Quad
1
2
C
x
C
LSB
A[MIN]
LSB
D
D
D
Command
DQ[3:0]
IN
IN
IN
MSB
A[MAX]
MSB
1. For extended SPI protocol, Cx = 7 + (A[MAX] + 1)/4.
For quad SPI protocol, Cx = 1 + (A[MAX] + 1)/4.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
WRITE Operations
WRITE Operations
WRITE ENABLE Command
The WRITE ENABLE operation sets the write enable latch bit. To execute a WRITE ENA-
BLE command, S# is driven LOW and held LOW until the eighth bit of the command
code has been latched in, after which it must be driven HIGH. The command code is
input on DQ0 for extended SPI protocol, on DQ[1:0] for dual SPI protocol, and on
DQ[3:0] for quad SPI protocol.
The write enable latch bit must be set before every PROGRAM, ERASE, WRITE, ENTER
4-BYTE ADDRESS MODE, and EXIT 4-BYTE ADDRESS MODE command. If S# is not
driven HIGH after the command code has been latched in, the command is not execu-
ted, flag status register error bits are not set, and the write enable latch remains cleared
to its default setting of 0.
WRITE DISABLE Command
The WRITE DISABLE operation clears the write enable latch bit. To execute a WRITE
DISABLE command, S# is driven LOW and held LOW until the eighth bit of the com-
mand code has been latched in, after which it must be driven HIGH. The command
code is input on DQ0 for extended SPI protocol, on DQ[1:0] for dual SPI protocol, and
on DQ[3:0] for quad SPI protocol.
If S# is not driven HIGH after the command code has been latched in, the command is
not executed, flag status register error bits are not set, and the write enable latch re-
mains set to 1.
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3V, 256Mb: Multiple I/O Serial Flash Memory
WRITE Operations
Figure 31: WRITE ENABLE and WRITE DISABLE Command Sequence
Extended
0
1
2
3
4
5
6
7
C
S#
Command Bits
LSB
DQ[0]
0
0
0
0
0
1
1
0
MSB
DQ1
High-Z
Dual
0
1
2
3
C
S#
Command Bits
LSB
DQ[0]
DQ[1]
0
0
0
1
0
0
0
1
MSB
Quad
0
1
C
S#
Command Bits
LSB
DQ[0]
DQ[1]
DQ[2]
DQ[3]
0
0
0
0
0
1
1
0
Don’t Care
MSB
1. Shown here is the WRITE ENABLE command code, which is 06h or 0000 0110 binary. The
WRITE DISABLE command sequence is identical, except the WRITE DISABLE command
code is 04h or 0000 0100 binary.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
ERASE Operations
ERASE Operations
SUBSECTOR ERASE Command
To execute the SUBSECTOR ERASE command and set the selected subsector bits set to
FFh, the WRITE ENABLE command must be issued to set the write enable latch bit to 1.
S# is driven LOW and held LOW until the eighth bit of the last data byte has been latch-
ed in, after which it must be driven HIGH. The command code is input on DQ0, fol-
lowed by address bytes; any address within the subsector is valid. Each address bit is
latched in during the rising edge of the clock. When S# is driven HIGH, the operation,
which is self-timed, is initiated; its duration is tSSE. The operation can be suspended
and resumed by the PROGRAM/ERASE SUSPEND and PROGRAM/ERASE RESUME
commands, respectively.
If the write enable latch bit is not set, the device ignores the SUBSECTOR ERASE com-
mand and no error bits are set to indicate operation failure.
When the operation is in progress, the write in progress bit is set to 1. The write enable
latch bit is cleared to 0, whether the operation is successful or not. The status register
and flag status register can be polled for the operation status. When the operation com-
pletes, the write in progress bit is cleared to 0.
If the operation times out, the write enable latch bit is reset and the erase error bit is set
to 1. If S# is not driven HIGH, the command is not executed, flag status register error
bits are not set, and the write enable latch remains set to 1. When a command is applied
to a protected subsector, the command is not executed. Instead, the write enable latch
bit remains set to 1, and flag status register bits 1 and 5 are set.
SECTOR ERASE Command
To execute the SECTOR ERASE command (and set selected sector bits to FFh), the
WRITE ENABLE command must be issued to set the write enable latch bit to 1. S# is
driven LOW and held LOW until the eighth bit of the last data byte has been latched in,
after which it must be driven HIGH. The command code is input on DQ0, followed by
address bytes; any address within the sector is valid. Each address bit is latched in dur-
ing the rising edge of the clock. When S# is driven HIGH, the operation, which is self-
timed, is initiated; its duration is tSE. The operation can be suspended and resumed by
the PROGRAM/ERASE SUSPEND and PROGRAM/ERASE RESUME commands, respec-
tively.
If the write enable latch bit is not set, the device ignores the SECTOR ERASE command
and no error bits are set to indicate operation failure.
When the operation is in progress, the write in progress bit is set to 1 and the write ena-
ble latch bit is cleared to 0, whether the operation is successful or not. The status regis-
ter and flag status register can be polled for the operation status. When the operation
completes, the write in progress bit is cleared to 0.
If the operation times out, the write enable latch bit is reset and erase error bit is set to
1. If S# is not driven HIGH, the command is not executed, flag status register error bits
are not set, and the write enable latch remains set to 1. When a command is applied to a
protected sector, the command is not executed. Instead, the write enable latch bit re-
mains set to 1, and flag status register bits 1 and 5 are set.
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3V, 256Mb: Multiple I/O Serial Flash Memory
ERASE Operations
Figure 32: SUBSECTOR and SECTOR ERASE Command
Extended
0
7
8
4
C
x
C
LSB
A[MIN]
DQ0
Command
MSB
A[MAX]
A[MAX]
Dual
0
3
C
x
C
LSB
A[MIN]
DQ0[1:0]
Command
MSB
Quad
0
1
2
C
x
C
LSB
A[MIN]
DQ0[3:0]
Command
MSB
A[MAX]
1. For extended SPI protocol, Cx = 7 + (A[MAX] + 1).
For dual SPI protocol, Cx = 3 + (A[MAX] + 1)/2.
For quad SPI protocol, Cx = 1 + (A[MAX] + 1)/4.
Note:
BULK ERASE Command
To initiate the BULK ERASE command, the WRITE ENABLE command must be issued
to set the write enable latch bit to 1. S# is driven LOW and held LOW until the eighth bit
of the last data byte has been latched in, after which it must be driven HIGH. The com-
mand code is input on DQ0. When S# is driven HIGH, the operation, which is self-
timed, is initiated; its duration is tBE.
If the write enable latch bit is not set, the device ignores the SECTOR ERASE command
and no error bits are set to indicate operation failure.
When the operation is in progress, the write in progress bit is set to 1 and the write ena-
ble latch bit is cleared to 0, whether the operation is successful or not. The status regis-
ter and flag status register can be polled for the operation status. When the operation
completes, the write in progress bit is cleared to 0.
If the operation times out, the write enable latch bit is reset and erase error bit is set to
1. If S# is not driven HIGH, the command is not executed, the flag status register error
bits are not set, and the write enable latch remains set to 1.
The command is not executed if any sector is locked. Instead, the write enable latch bit
remains set to 1, and flag status register bits 1 and 5 are set.
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3V, 256Mb: Multiple I/O Serial Flash Memory
ERASE Operations
Figure 33: BULK ERASE Command
Extended
0
7
C
LSB
DQ0
Command
0
MSB
MSB
Dual
3
C
LSB
DQ0[1:0]
Command
0
Quad
1
C
LSB
DQ0[3:0]
Command
MSB
PROGRAM/ERASE SUSPEND Command
To initiate the PROGRAM/ERASE SUSPEND command, S# is driven LOW. The com-
mand code is input on DQ0. The operation is terminated by the PROGRAM/ERASE RE-
SUME command.
PROGRAM/ERASE SUSPEND command enables the memory controller to interrupt
and suspend an array PROGRAM or ERASE operation within the program/erase latency.
If a SUSPEND command is issued during a PROGRAM operation, then the flag status
register bit 2 is set to 1. After erase/program latency time, the flag status register bit 7 is
also set to 1, showing the device to be in a suspended state, waiting for any operation
(see the Operations Allowed/Disallowed During Device States table).
If a SUSPEND command is issued during an ERASE operation, then the flag status regis-
ter bit 6 is set to 1. After erase/program latency time, the flag status register bit 7 is also
set to 1, showing that device to be in a suspended state, waiting for any operation (see
the Operations Allowed/Disallowed During Device States table).
If the time remaining to complete the operation is less than the suspend latency, the de-
vice completes the operation and clears the flag status register bits 2 or 6, as applicable.
Because the suspend state is volatile, if there is a power cycle, the suspend state infor-
mation is lost and the flag status register powers up as 80h.
During an ERASE SUSPEND operation, a PROGRAM or READ operation is possible in
any sector except the one in a suspended state. Reading from a sector that is in a sus-
pended state will output indeterminate data. The device ignores a PROGRAM com-
mand to a sector that is in an ERASE SUSPEND state; it also sets to 1 the flag status reg-
ister bit 4: program failure/protection error, and leaves the write enable latch bit un-
changed. The WRITE LOCK REGISTER, WRITE VOLATILE CONFIGURATION REGIS-
TER, and WRITE ENHANCED VOLATILE CONFIGURATION REGISTER commands are
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3V, 256Mb: Multiple I/O Serial Flash Memory
ERASE Operations
allowed during an ERASE SUSPEND state. When the ERASE operation resumes, it does
not check the new lock status of the WRITE LOCK REGISTER command.
During a PROGRAM SUSPEND operation, a READ operation is possible in any page ex-
cept the one in a suspended state. Reading from a page that is in a suspended state will
output indeterminate data. The commands allowed during a program suspend state in-
clude the WRITE VOLATILE CONFIGURATION REGISTER command and the WRITE
ENHANCED VOLATILE CONFIGURATION REGISTER command.
It is possible to nest a PROGRAM/ERASE SUSPEND operation inside a PROGRAM/
ERASE SUSPEND operation just once. Issue an ERASE command and suspend it. Then
issue a PROGRAM command and suspend it also. With the two operations suspended,
the next PROGRAM/ERASE RESUME command resumes the latter operation, and a sec-
ond PROGRAM/ERASE RESUME command resumes the former (or first) operation.
Table 28: Suspend Parameters
Parameter
Condition
Typ
700
5
Max
Units Notes
Erase to suspend
Program to suspend
Sector erase or erase resume to erase suspend
Program resume to program suspend
–
–
–
µs
µs
µs
1
1
1
Subsector erase to sus-
pend
Subsector erase or subsector erase resume to erase sus-
pend
50
Suspend latency
Suspend latency
Suspend latency
Program
7
–
–
–
µs
µs
µs
2
2
3
Subsector erase
Erase
15
15
1. Timing is not internally controlled.
2. Any READ command accepted.
Notes:
3. Any command except the following are accepted: SECTOR, SUBSECTOR, or BULK ERASE;
WRITE STATUS REGISTER; WRITE NONVOLATILE CONFIGURATION REGISTER; and PRO-
GRAM OTP.
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3V, 256Mb: Multiple I/O Serial Flash Memory
ERASE Operations
Table 29: Operations Allowed/Disallowed During Device States
Note 1 applies to entire table
Standby
Program or
Erase State
Subsector Erase Suspend or
Program Suspend State
Erase Suspend
State
Operation
State
Yes
Yes
Yes
Yes
Yes
Yes
No
Notes
READ
No
No
No
No
No
Yes
Yes
Yes
No
No
No
Yes
Yes
No
Yes
Yes/No
No
2
3
4
5
6
7
8
PROGRAM
ERASE
WRITE
No
WRITE
Yes
READ
Yes
SUSPEND
No
1. The device can be in only one state at a time. Depending on the state of the device,
some operations are allowed (Yes) and others are not (No). For example, when the de-
vice is in the standby state, all operations except SUSPEND are allowed in any sector. For
all device states except the erase suspend state, if an operation is allowed or disallowed
in one sector, it is allowed or disallowed in all other sectors. In the erase suspend state, a
PROGRAM operation is allowed in any sector except the one in which an ERASE opera-
tion has been suspended.
Notes:
2. All READ operations except READ STATUS REGISTER and READ FLAG REGISTER. When is-
sued to a sector or subsector that is simultaneously in an erase suspend state, the READ
operation is accepted, but the data output is not guaranteed until the erase has comple-
ted.
3. All PROGRAM operations except PROGRAM OTP. In the erase suspend state, a PROGRAM
operation is allowed in any sector (Yes) except the sector (No) in which an ERASE opera-
tion has been suspended.
4. Applies to the SECTOR ERASE or SUBSECTOR ERASE operation.
5. Applies to the following operations: WRITE STATUS REGISTER, WRITE NONVOLATILE
CONFIGURATION REGISTER, PROGRAM OTP, and BULK ERASE.
6. Applies to the WRITE ENABLE/DISABLE, CLEAR FLAG STATUS REGISTER, WRITE EXTEN-
DED ADDRESS REGISTER, WRITE LOCK REGISTER, ENTER or EXIT 4-BYTE ADDRESS MODE,
WRITE VOLATILE or ENHANCED VOLATILE CONFIGURATION REGISTER operation.
7. Applies to the READ STATUS REGISTER or READ FLAG STATUS REGISTER operation.
8. Applies to the PROGRAM SUSPEND or ERASE SUSPEND operation.
PROGRAM/ERASE RESUME Command
To initiate the PROGRAM/ERASE RESUME command, S# is driven LOW. The command
code is input on DQ0. The operation is terminated by driving S# HIGH.
When this command is executed, the status register write in progress bit is set to 1, and
the flag status register program erase controller bit is set to 0. This command is ignored
if the device is not in a suspended state.
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3V, 256Mb: Multiple I/O Serial Flash Memory
RESET Operations
RESET Operations
RESET ENABLE and RESET MEMORY Command
To reset the device, the RESET ENABLE command must be followed by the RESET
MEMORY command. To execute each command, S# is driven LOW. The command code
is input on DQ0. A minimum de-selection time of tSHSL2 must come between the RE-
SET ENABLE and RESET MEMORY commands or a reset is not guaranteed. When these
two commands are executed and S# is driven HIGH, the device enters a power-on reset
condition. A time of tSHSL3 is required before the device can be re-selected by driving
S# LOW. It is recommended that the device exit XIP mode before executing these two
commands to initiate a reset.
All volatile lock bits, the volatile configuration register, the enhanced volatile configura-
tion register, and the extended address register are reset to the power-on reset default
condition. The power-on reset condition depends on settings in the nonvolatile config-
uration register.
If a reset is initiated while a WRITE, PROGRAM, or ERASE operation is in progress or
suspended, the operation is aborted and data may be corrupted.
Figure 34: RESET ENABLE and RESET MEMORY Command
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
C
S#
Reset enable
Reset memory
DQ0
1. The number of lines and rate for transmission varies with extended, dual, or quad SPI.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
ONE TIME PROGRAMMABLE Operations
ONE TIME PROGRAMMABLE Operations
READ OTP ARRAY Command
To initiate a READ OTP ARRAY command, S# is driven LOW. The command code is in-
put on DQ0, followed by address bytes and dummy clock cycles. Each address bit is
latched in during the rising edge of C. Data is shifted out on DQ1, beginning from the
specified address and at a maximum frequency of fC (MAX) on the falling edge of the
clock. The address increments automatically to the next address after each byte of data
is shifted out. There is no rollover mechanism; therefore, if read continuously, after lo-
cation 0x64, the device continues to output data at location 0x64. The operation is ter-
minated by driving S# HIGH at any time during data output.
Figure 35: READ OTP Command
Extended
0
7
8
Cx
C
LSB
A[MIN]
DQ0
DQ1
Command
MSB
A[MAX]
LSB
DOUT DOUT
DOUT
MSB
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
High-Z
Dummy cycles
Dual
0
3
4
Cx
C
LSB
A[MIN]
LSB
DOUT DOUT
DOUT
MSB
DOUT
DOUT
DQ[1:0]
Command
MSB
A[MAX]
Dummy cycles
Quad
0
1
2
Cx
C
LSB
A[MIN]
LSB
DOUT
DOUT
MSB
DOUT
DQ[3:0]
Command
MSB
A[MAX]
Don’t Care
Dummy cycles
1. For extended SPI protocol, Cx = 7 + (A[MAX] + 1).
For dual SPI protocol, Cx = 3 + (A[MAX] + 1)/2.
For quad SPI protocol, Cx = 1 + (A[MAX] + 1)/4.
Note:
PROGRAM OTP ARRAY Command
To initiate the PROGRAM OTP ARRAY command, the WRITE ENABLE command must
be issued to set the write enable latch bit to 1; otherwise, the PROGRAM OTP ARRAY
command is ignored and flag status register bits are not set. S# is driven LOW and held
LOW until the eighth bit of the last data byte has been latched in, after which it must be
driven HIGH. The command code is input on DQ0, followed by address bytes and at
least one data byte. Each address bit is latched in during the rising edge of the clock.
When S# is driven HIGH, the operation, which is self-timed, is initiated; its duration is
tPOTP. There is no rollover mechanism; therefore, after a maximum of 65 bytes are
latched in and subsequent bytes are discarded.
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3V, 256Mb: Multiple I/O Serial Flash Memory
ONE TIME PROGRAMMABLE Operations
PROGRAM OTP ARRAY programs, at most, 64 bytes to the OTP memory area and one
OTP control byte. When the operation is in progress, the write in progress bit is set to 1.
The write enable latch bit is cleared to 0, whether the operation is successful or not, and
the status register and flag status register can be polled for the operation status. When
the operation completes, the write in progress bit is cleared to 0.
If the operation times out, the write enable latch bit is reset and the program fail bit is
set to 1. If S# is not driven HIGH, the command is not executed, flag status register error
bits are not set, and the write enable latch remains set to 1.
The OTP control byte (byte 64) is used to permanently lock the OTP memory array.
Table 30: OTP Control Byte (Byte 64)
Bit Name
Settings
Description
0
OTP control byte
0 = Locked
1 = Unlocked
(Default)
Used to permanently lock the 64B OTP array. When bit 0 = 1, the 64B OTP
array can be programmed. When bit 0 = 0, the 64B OTP array is read only.
Once bit 0 has been programmed to 0, it can no longer be changed to 1.
PROGRAM OTP ARRAY is ignored, write enable latch bit remains set, and
flag status register bits 1 and 4 are set.
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3V, 256Mb: Multiple I/O Serial Flash Memory
ONE TIME PROGRAMMABLE Operations
Figure 36: PROGRAM OTP Command
Extended
0
7
8
Cx
C
LSB
A[MIN]
LSB
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DQ[0]
Command
MSB
A[MAX]
MSB
Dual
0
3
4
Cx
C
LSB
A[MIN]
LSB
DIN
DIN
DIN
DIN
DIN
DQ[1:0]
Command
MSB
A[MAX]
MSB
Quad
0
1
2
Cx
C
LSB
A[MIN]
LSB
DIN
DIN
DIN
DQ[3:0]
Command
MSB
A[MAX]
MSB
1. For extended SPI protocol, Cx = 7 + (A[MAX] + 1).
For dual SPI protocol, Cx = 3 + (A[MAX] + 1)/2.
For quad SPI protocol, Cx = 1 + (A[MAX] + 1)/4.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
ADDRESS MODE Operations – Enter and Exit 4-Byte Address
Mode
ADDRESS MODE Operations – Enter and Exit 4-Byte Address Mode
ENTER or EXIT 4-BYTE ADDRESS MODE Command
Both ENTER 4-BYTE ADDRESS MODE and EXIT 4-BYTE ADDRESS MODE commands
share the same requirements.
To enter or exit the 4-byte address mode, the WRITE ENABLE command must be execu-
ted to set the write enable latch bit to 1. (Note: The WRITE ENABLE command must
NOT be executed on the N25Q256A83ESF40x and N25Q256A83E1240x devices.) S# must
be driven LOW. The command must be input on DQn. The effect of the command is im-
mediate; after the command has been executed, the write enable latch bit is cleared to
0.
The default address mode is three bytes, and the device returns to the default upon exit-
ing the 4-byte address mode.
ENTER or EXIT QUAD Command
The ENTER or EXIT QUAD (QPI) command is only available on the N25Q256A83ESF40x
and N25Q256A83E1240x devices. To initiate this command, the WRITE ENABLE com-
mand must not be executed. S# must be driven LOW, and the command must be input
on DQn. The effect of the command is immediate.
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3V, 256Mb: Multiple I/O Serial Flash Memory
XIP Mode
XIP Mode
Execute-in-place (XIP) mode allows the memory to be read by sending an address to the
device and then receiving the data on one, two, or four pins in parallel, depending on
the customer requirements. XIP mode offers maximum flexibility to the application,
saves instruction overhead, and reduces random access time.
Activate or Terminate XIP Using Volatile Configuration Register
Applications that boot in SPI and must switch to XIP use the volatile configuration reg-
ister. XIP provides faster memory READ operations by requiring only an address to exe-
cute, rather than a command code and an address.
To activate XIP requires two steps. First, enable XIP by setting volatile configuration reg-
ister bit 3 to 0. Next, drive the XIP confirmation bit to 0 during the next FAST READ op-
eration. XIP is then active. Once in XIP, any command that occurs after S# is toggled re-
quires only address bits to execute; a command code is not necessary, and device oper-
ations use the SPI protocol that is enabled. XIP is terminated by driving the XIP confir-
mation bit to 1. The device automatically resets volatile configuration register bit 3 to 1.
Note: For devices with basic XIP, indicated by a part number feature set digit of 2 or 4, it
is not necessary to set the volatile configuration register bit 3 to 0 to enable XIP. Instead,
it is enabled by setting the XIP confirmation bit to 0 during the first dummy clock cycle
after any FAST READ command.
Activate or Terminate XIP Using Nonvolatile Configuration Register
Applications that must boot directly in XIP use the nonvolatile configuration register. To
enable a device to power-up in XIP using the nonvolatile configuration register, set non-
volatile configuration register bits [11:9]. Settings vary according to protocol, as ex-
plained in the Nonvolatile Configuration Register section. Because the device boots di-
rectly in XIP, the confirmation bit is already set to 0, and after the next power cycle, XIP
is active. Once in XIP, a command code is unnecessary, and device operations use the
SPI protocol currently enabled. XIP is terminated by driving the XIP confirmation bit to
1.
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3V, 256Mb: Multiple I/O Serial Flash Memory
XIP Mode
Figure 37: XIP Mode Directly After Power-On
Mode 3
Mode 0
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16
C
t
VSI (<100µ)
VCC
NVCR check:
XIP enabled
S#
A[MIN]
LSB
DOUT DOUT DOUT DOUT DOUT
Xb
DQ0
DOUT DOUT DOUT DOUT DOUT
MSB
DQ[3:1]
A[MAX]
Dummy cycles
1. Xb is the XIP confirmation bit and should be set as follows: 0 to keep XIP state; 1 to exit
XIP mode and return to standard read mode.
Note:
Confirmation Bit Settings Required to Activate or Terminate XIP
The XIP confirmation bit setting activates or terminates XIP after it has been enabled or
disabled. This bit is the value on DQ0 during the first dummy clock cycle in the FAST
READ operation. XIP requires at least one additional clock cycle to send the XIP confir-
mation bit to the memory on DQ0 during the first dummy clock cycle.
Table 31: XIP Confirmation Bit
Bit Value
Description
0
1
Activates XIP: While this bit is 0, XIP remains activated.
Terminates XIP: When this bit is set to 1, XIP is terminated and the device returns
to SPI.
Table 32: Effects of Running XIP in Different Protocols
Protocol
Effect
Notes
Extended I/O,
Dual I/O
In a device with a dedicated part number where RST# is enabled, a LOW pulse on RST#
resets XIP and the device to the state it was in previous to the last power-up, as defined
by the nonvolatile configuration register.
Dual I/O
Values of DQ1 during the first dummy clock cycle are "Don't Care."
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3V, 256Mb: Multiple I/O Serial Flash Memory
XIP Mode
Table 32: Effects of Running XIP in Different Protocols (Continued)
Protocol
Effect
Notes
Quad I/O
Values of DQ[3:1] during the first dummy clock cycle are "Don't Care."
In a device with a dedicated part number where RST# is enabled, a LOW pulse on RST#
resets XIP and the device to the state it was in previous to the last power-up, as defined
by the nonvolatile configuration register.
1
1. In a device with a dedicated part number, memory can be reset only when the device is
deselected.
Note:
Terminating XIP After a Controller and Memory Reset
The system controller and the device can become out of synchronization if, during the
life of the application, the system controller is reset without the device being reset. In
such a case, the controller can reset the memory to power-on reset if the memory has
reset functionality. (Reset is available in devices with a dedicated part number.)
If reset functionality is not available, has been disabled, or is not supported by the con-
troller, the controller must execute the following sequence to terminate XIP in the
memory device. In quad I/O protocol, drive DQ0 = 1 with S# held LOW for seven clock
cycles; S# must driven HIGH before the eighth clock cycle. In dual I/O protocol, drive
DQ0 = 1 with S# held LOW for 13 clock cycles; S# must driven HIGH before the four-
teenth clock cycle. If the device is in extended protocol, drive DQ0 = 1 with S# held LOW
for 25 clock cycles; S# must driven HIGH before the twenty-sixth clock cycle.
These sequences cause the controller to set the XIP confirmation bit to 1, thereby termi-
nating XIP. However, it does not reset the device or interrupt PROGRAM/ERASE opera-
tions that may be in progress. After terminating XIP, the controller must execute RESET
ENABLE and RESET MEMORY to implement a software reset and reset the device.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Power Up and Power Down
Power Up and Power Down
Power Up and Power Down Requirements
At power-up and power-down, the device must not be selected; that is, S# must follow
the voltage applied on VCC until VCC reaches the correct values: VCC,min at power-up and
VSS at power-down.
To avoid data corruption and inadvertent WRITE operations during power-up, a power-
on reset circuit is included. The logic inside the device is held to RESET while VCC is less
than the power-on reset threshold voltage shown here; all operations are disabled, and
the device does not respond to any instruction. During a standard power-up phase, the
device ignores all commands except READ STATUS REGISTER and READ FLAG STATUS
REGISTER. These operations can be used to check the memory internal state. After
power-up, the device is in standby power mode; the write enable latch bit is reset; the
write in progress bit is reset; and the lock registers are configured as: (write lock bit, lock
down bit) = (0,0).
Normal precautions must be taken for supply line decoupling to stabilize the VCC sup-
ply. Each device in a system should have the VCC line decoupled by a suitable capacitor
(typically 100nF) close to the package pins. At power-down, when VCC drops from the
operating voltage to below the power-on-reset threshold voltage shown here, all opera-
tions are disabled and the device does not respond to any command.
Note: If power-down occurs while a WRITE, PROGRAM, or ERASE cycle is in progress,
data corruption may result.
VPPH must be applied only when VCC is stable and in the VCC,min to VCC,max voltage
range.
Figure 38: Power-Up Timing
VCC
VCC,max
Chip selection not allowed
VCC,min
tVTW = tVTR
Polling allowed
SPI protocol
Chip
reset
Device fully accessible
VWI
Starting protocol
defined by NVCR
WIP = 1
WEL = 0
WIP = 0
WEL = 0
Time
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3V, 256Mb: Multiple I/O Serial Flash Memory
Power Up and Power Down
Table 33: Power-Up Timing and VWI Threshold
Note 1 applies to entire table
Symbol
tVTR
tVTW
Parameter
Min
–
Max
150
150
2.5
Unit
µs
VCC,min to read
VCC,min to device fully accessible
Write inhibit voltage
–
µs
VWI
1.5
V
1. Parameters listed are characterized only.
Note:
Power Loss Recovery Sequence
If a power loss occurs during a WRITE NONVOLATILE CONFIGURATION REGISTER
command, after the next power-on, the device might begin in an undetermined state
(XIP mode or an unnecessary protocol). If this occurs, until the next power-up, a recov-
ery sequence must reset the device to a fixed state (extended SPI protocol without XIP).
After the recovery sequence, the issue should be resolved definitively by running the
WRITE NONVOLATILE CONFIGURATION REGISTER command again. The recovery se-
quence is composed of two parts that must be run in the correct order. During the en-
tire sequence, tSHSL2 must be at least 50ns. The first part of the sequence is DQ0 (PAD
DATA) and DQ3 (PAD HOLD) equal to 1 for the situations listed below:
• 7 clock cycles within S# LOW (S# becomes HIGH before 8th clock cycle)
• + 9 clock cycles within S# LOW (S# becomes HIGH before 10th clock cycle)
• + 13 clock cycles within S# LOW (S# becomes HIGH before 14th clock cycle)
• + 17 clock cycles within S# LOW (S# becomes HIGH before 18th clock cycle)
• + 25 clock cycles within S# LOW (S# becomes HIGH before 26th clock cycle)
• + 33 clock cycles within S# LOW (S# becomes HIGH before 34th clock cycle)
The second part of the sequence is exiting from dual or quad SPI protocol by using the
following FFh sequence: DQ0 and DQ3 equal to 1 for 8 clock cycles within S# LOW; S#
becomes HIGH before 9th clock cycle.
After this two-part sequence the extended SPI protocol is active.
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3V, 256Mb: Multiple I/O Serial Flash Memory
AC Reset Specifications
AC Reset Specifications
Table 34: AC RESET Conditions
Note 1 applies to entire table
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Reset pulse
width
tRLRH2
50
–
–
ns
Reset recovery
time
tRHSL Device deselected (S# HIGH) and is in XIP mode
Device deselected (S# HIGH) and is in standby mode
–
–
–
–
–
–
40
40
40
ns
ns
ns
Commands are being decoded, any READ operations are
in progress or any WRITE operation to volatile registers
are in progress
Any device array PROGRAM/ERASE/SUSPEND/RESUME,
PROGRAM OTP, NONVOLATILE SECTOR LOCK, and ERASE
NONVOLATILE SECTOR LOCK ARRAY operations are in
progress
–
–
30
µs
While a WRITE STATUS REGISTER operation is in progress
–
–
tW
tWNVCR
–
–
ms
ms
While a WRITE NONVOLATILE CONFIGURATION REGIS-
TER operation is in progress
On completion or suspension of a SUBSECTOR ERASE op-
eration
–
tSSE
–
s
Software reset tSHSL3 Device deselected (S# HIGH) and is in standby mode
–
–
–
–
90
30
ns
µs
recovery time
On completion of any device array PROGRAM/ERASE/
SUSPEND/RESUME, SECTOR ERASE, PROGRAM OTP, PAGE
PROGRAM, DUAL INPUT FAST PROGRAM, EXTENDED
DUAL INPUT FAST PROGRAM, QUAD INPUT FAST PRO-
GRAM, or EXTENDED QUAD INPUT FAST PROGRAM op-
eration
On completion or suspension of a WRITE STATUS REGIS-
TER operation
–
–
–
2
tW
tWNVCR
tSSE
–
–
–
–
ms
ms
s
On completion or suspension of a WRITE NONVOLATILE
CONFIGURATION REGISTER operation
On completion or suspension of a SUBSECTOR ERASE op-
eration
tSHRV Deselect to reset valid in quad output or in QIO-SPI
S# deselect to
reset valid
–
ns
1. Values are guaranteed by characterization; not 100% tested.
2. The device reset is possible but not guaranteed if tRLRH < 50ns.
Notes:
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3V, 256Mb: Multiple I/O Serial Flash Memory
AC Reset Specifications
Figure 39: Reset AC Timing During PROGRAM or ERASE Cycle
S#
t
t
SHRH
RHSL
t
RLRH
RESET#
Don’t Care
Figure 40: Reset Enable
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
C
S#
tSHSL2
tSHSL3
Reset enable
Reset memory
DQ0
Figure 41: Serial Input Timing
tSHSL
S#
tCHSL
tSLCH
tCHSH
tSHCH
C
tCHCL
tDVCH t
CHDX
tCLCH
LSB in
DQ0
DQ1
MSB in
High-Z
High-Z
Don’t Care
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3V, 256Mb: Multiple I/O Serial Flash Memory
AC Reset Specifications
Figure 42: Write Protect Setup and Hold During WRITE STATUS REGISTER Operation (SRWD = 1)
W#/VPP
tWHSL
tSHWL
S#
C
DQ0
DQ1
High-Z
High-Z
Don’t Care
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3V, 256Mb: Multiple I/O Serial Flash Memory
AC Reset Specifications
Figure 43: Hold Timing
S#
C
tCHHL tHLCH
tHHCH
tCHHH
tHLQZ
tHHQX
DQ0
DQ1
HOLD#
Don’t Care
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3V, 256Mb: Multiple I/O Serial Flash Memory
AC Reset Specifications
Figure 44: Output Timing
S#
tCLQV
tCLQV
tCLQX
tCL
tCH
C
tCLQX
tSHQZ
DQ0
LSB out
Address
DQ1
LSB in
Don’t Care
Figure 45: VPPH Timing
End of command
(identified by WIP polling)
S#
C
DQ0
tVPPHSL
VPPH
VPP
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3V, 256Mb: Multiple I/O Serial Flash Memory
Absolute Ratings and Operating Conditions
Absolute Ratings and Operating Conditions
Stresses greater than those listed may cause permanent damage to the device. This is a
stress rating only. Exposure to absolute maximum rating for extended periods may ad-
versely affect reliability. Stressing the device beyond the absolute maximum ratings may
cause permanent damage.
Table 35: Absolute Ratings
Symbol
TSTG
Parameter
Min
–65
Max
150
Units
°C
°C
V
Notes
Storage temperature
TLEAD
VCC
Lead temperature during soldering
Supply voltage
–
See note 1
4.0
–0.6
–0.2
–0.6
–2000
VPP
Fast program/erase voltage
Input/output voltage with respect to ground
10
V
VIO
VCC + 0.6
2000
V
3, 4
2
VESD
Electrostatic discharge voltage
(human body model)
V
1. Compliant with JEDEC Standard J-STD-020C (for small-body, Sn-Pb or Pb assembly),
RoHS, and the European directive on Restrictions on Hazardous Substances (RoHS)
2002/95/EU.
Notes:
2. JEDEC Standard JESD22-A114A (C1 = 100pF, R1 = 1500Ω, R2 = 500Ω).
3. During signal transitions, minimum voltage may undershoot to –1V for periods less than
10ns.
4. During signal transitions, maximum voltage may overshoot to VCC + 1V for periods less
than 10ns.
Table 36: Operating Conditions
Symbol
VCC
Parameter
Min
2.7
Max
3.6
9.5
85
Units
Supply voltage
V
V
VPPH
TA
Supply voltage on VPP
Ambient operating temperature
8.5
–40
°C
Table 37: Input/Output Capacitance
Note 1 applies to entire table
Symbol
Description
Test Condition
Min
Max
Units
CIN/OUT
Input/output capacitance
(DQ0/DQ1/DQ2/DQ3)
VOUT = 0V
–
8
pF
CIN
Input capacitance (other pins)
VIN = 0V
–
6
pF
1. These parameters are sampled only, not 100% tested. TA = 25°C at 54 MHz.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
Absolute Ratings and Operating Conditions
Table 38: AC Timing Input/Output Conditions
Symbol
Description
Min
30
–
Max
30
Units
pF
ns
Notes
CL
–
Load capacitance
1
Input rise and fall times
Input pulse voltages
5
0.2VCC to 0.8VCC
0.3VCC to 0.7VCC
V
2
Input timing reference voltages
Output timing reference voltages
V
VCC/2
VCC/2
V
1. Output buffers are configurable by user.
2. For quad/dual operations: 0V to VCC
Notes:
.
Figure 46: AC Timing Input/Output Reference Levels
Input levels1
I/O timing
reference levels
0.8VCC
0.7VCC
0.5VCC
0.3VCC
0.2VCC
1. 0.8VCC = VCC for dual/quad operations; 0.2VCC = 0V for dual/quad operations.
Note:
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3V, 256Mb: Multiple I/O Serial Flash Memory
DC Characteristics and Operating Conditions
DC Characteristics and Operating Conditions
Table 39: DC Current Characteristics and Operating Conditions
Parameter
Symbol
ILI
Test Conditions
Min
Max
±2
Unit
µA
Input leakage current
Output leakage current
Standby current
–
–
–
–
ILO
±2
µA
ICC1
S = VCC, VIN = VSS or VCC
S = VCC, VIN = VSS or VCC
100
150
µA
Standby current
ICC1
µA
(grade 3)
Operating current
(fast-read extended I/O)
ICC3
C = 0.1VCC/0.9VCC at 108 MHz, DQ1
= open
–
–
15
6
mA
mA
C = 0.1VCC/0.9VCC at 54 MHz, DQ1
= open
Operating current (fast-read dual I/O)
Operating current (fast-read quad I/O)
Operating current (program)
C = 0.1VCC/0.9VCC at 108 MHz
C = 0.1VCC/0.9VCC at 108 MHz
S# = VCC
–
–
–
–
18
20
20
20
mA
mA
mA
mA
ICC4
ICC5
Operating current (write status regis-
ter)
S# = VCC
Operating current (erase)
ICC6
S# = VCC
–
20
mA
Table 40: DC Voltage Characteristics and Operating Conditions
Parameter
Symbol
VIL
Conditions
Min
Max
Unit
V
Input low voltage
Input high voltage
Output low voltage
Output high voltage
–0.5
0.3VCC
VCC + 0.4
0.4
VIH
0.7VCC
–
V
VOL
IOL = 1.6mA
V
VOH
IOH = –100µA
VCC - 0.2
–
V
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3V, 256Mb: Multiple I/O Serial Flash Memory
AC Characteristics and Operating Conditions
AC Characteristics and Operating Conditions
Table 41: AC Characteristics and Operating Conditions
Parameter
Symbol
Min
Typ1
Max
Unit
Notes
Clock frequency for all commands other than
READ (SPI-ER, QIO-SPI protocol)
fC
DC
–
108
MHz
Clock frequency for READ commands
Clock HIGH time
fR
tCH
tCL
DC
4
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
54
–
–
–
–
–
–
–
–
–
–
–
–
8
7
8
5
6
–
–
–
–
–
–
8
8
–
–
–
MHz
ns
2
Clock LOW time
4
ns
1
Clock rise time (peak-to-peak)
Clock fall time (peak-to-peak)
S# active setup time (relative to clock)
S# not active hold time (relative to clock)
Data in setup time
tCLCH
tCHCL
tSLCH
tCHSL
tDVCH
tCHDX
tCHSH
tSHCH
tSHSL1
tSHSL2
tSHQZ
tCLQV
0.1
0.1
4
V/ns
V/ns
ns
3, 4
3, 4
4
ns
2
ns
Data in hold time
3
ns
S# active hold time (relative to clock)
S# not active setup time (relative to clock)
S# deselect time after a READ command
S# deselect time after a nonREAD command
Output disable time
4
ns
4
ns
20
50
–
ns
ns
ns
3
Clock LOW to output valid under 30pF
STR
–
ns
DTR
STR
DTR
–
ns
Clock LOW to output valid under 10pF
–
ns
–
ns
Output hold time (clock LOW)
Output hold time (clock HIGH)
tCLQX
tCHQX
tHLCH
tCHHH
tHHCH
tCHHL
tHHQX
tHLQZ
tWHSL
tSHWL
tVPPHSL
1
ns
1
ns
HOLD command setup time (relative to clock)
HOLD command hold time (relative to clock)
HOLD command setup time (relative to clock)
HOLD command hold time (relative to clock)
HOLD command to output Low-Z
4
ns
4
ns
4
ns
4
ns
–
ns
3
3
5
5
6
HOLD command to output High-Z
Write protect setup time
–
ns
20
100
200
ns
Write protect hold time
ns
Enhanced VPPH HIGH to S# LOW for extended and
dual I/O page program
ns
WRITE STATUS REGISTER cycle time
tW
tWNVCR
–
–
1.3
0.2
8
3
ms
s
Write NONVOLATILE CONFIGURATION REGISTER
cycle time
CLEAR FLAG STATUS REGISTER cycle time
tCFSR
–
40
–
ns
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3V, 256Mb: Multiple I/O Serial Flash Memory
AC Characteristics and Operating Conditions
Table 41: AC Characteristics and Operating Conditions (Continued)
Parameter
Symbol
Min
Typ1
Max
Unit
Notes
WRITE VOLATILE CONFIGURATION REGISTER cycle
time
tWVCR
–
40
–
ns
WRITE VOLATILE ENHANCED CONFIGURATION
REGISTER cycle time
tWRVECR
tWNVCR
–
–
40
–
ns
s
WRITE NONVOLATILE CONFIGURATION REGISTER
cycle time
0.2
3
WRITE EXTENDED ADDRESS REGISTER cycle time
PAGE PROGRAM cycle time (256 bytes)
PAGE PROGRAM cycle time (n bytes)
tWREAR
tPP
–
–
–
40
–
5
5
ns
ms
ms
0.5
7
7
int(n/8) ×
0.158
PAGE PROGRAM cycle time, VPP = VPPH ( 256 bytes)
PROGRAM OTP cycle time (64 bytes)
Subsector ERASE cycle time
–
–
–
–
–
–
–
0.4
0.2
5
–
ms
ms
s
7
7
tSSE
tSE
0.25
0.7
0.8
3
Sector ERASE cycle time
s
Sector ERASE cycle time (with VPP = VPPH
Bulk ERASE cycle time
)
0.6
3
s
tBE
240
200
480
480
s
Bulk ERASE cycle time (with VPP = VPPH
)
s
1. Typical values given for TA = 25°C.
2. tCH + tCL must add up to 1/fC.
Notes:
3. Value guaranteed by characterization; not 100% tested.
4. Expressed as a slew-rate.
5. Only applicable as a constraint for a WRITE STATUS REGISTER command when STATUS
REGISTER WRITE is set to 1.
6. VPPH should be kept at a valid level until the PROGRAM or ERASE operation has comple-
ted and its result (success or failure) is known.
7. When using the PAGE PROGRAM command to program consecutive bytes, optimized
timings are obtained with one sequence including all the bytes versus several sequences
of only a few bytes (1 < n < 256).
8. int(A) corresponds to the upper integer part of A. For example int(12/8) = 2, int(32/8) = 4
int(15.3) = 16.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Package Dimensions
Package Dimensions
Figure 47: V-PDFN-8/8mm x 6mm
A
8.00 TYP
Pin 1 ID
0.15
C
B
Ø0.3
Pin 1 ID R 0.20
8
7
6
5
1
2
3
4
1.27
TYP
6.00 TYP
4.80 TYP
+0.08
-0.05
0.40
0.40 ±0.05
5.16 TYP
0.2
MIN
0.10
0.05
C
C
0.85 TYP/
1 MAX
0.05 MAX
1. All dimensions are in millimeters.
Notes:
2. See Part Number Ordering Information for complete package names and details.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Package Dimensions
Figure 48: SOP2-16/300 mils
10.30 ±0.20
16
h x 45°
9
0.23 MIN/
0.32 MAX
10.00 MIN/
10.65 MAX
7.50 ±0.10
1
8
0° MIN/8° MAX
2.5 ±0.15
0.20 ±0.1
0.1
Z
0.33 MIN/
0.51 MAX
0.40 MIN/
1.27 MAX
1.27 TYP
Z
1. All dimensions are in millimeters.
Notes:
2. See Part Number Ordering Information for complete package names and details.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Package Dimensions
Figure 49: T-PBGA-24b05/6mm x 8mm
0.79 TYP
Seating
plane
A
0.1 A
Ball A1 ID
24X Ø0.40 ±0.05
Ball A1 ID
5
4
3
2
1
A
B
C
D
E
4.00
8 ±0.10
1.00 TYP
1.00 TYP
4.00
6 ±0.10
1. All dimensions are in millimeters.
1.20 MAX
0.20 MIN
Notes:
2. See Part Number Ordering Information for complete package names and details.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Part Number Ordering Information
Part Number Ordering Information
Micron Serial NOR Flash devices are available in different configurations and densities.
Verify valid part numbers by using Micron’s part catalog search at micron.com. To com-
pare features and specifications by device type, visit micron.com/products. Contact the
factory for devices not found.
For more information on how to identify products and top-side marking by the process
identification letter, refer to technical note TN-12-24, "Serial Flash Memory Device
Marking for the M25P, M25PE, M25PX, and N25Q Product Families."
Table 42: Part Number Information
Part Number
Category
Category Details
Notes
Device type
N25Q = Serial NOR Flash memory, Multiple Input/Output (Single, Dual, Quad I/O), XIP
256 = 256Mb
Density
Technology
Feature set
A = 65nm
1 = Byte addressability; HOLD pin; Micron XIP
2 = Byte addressability; HOLD pin; Basic XIP
3 = Byte addressability; RST# pin; Micron XIP
4 = Byte addressability; RST# pin; Basic XIP
7 = Byte addressability; HOLD pin; Micron XIP
8 = Byte addressability; HOLD pin; Micron XIP; RESET pin
3 = VCC = 2.7 to 3.6V
1
1
1
1
2
1
Operating voltage
Block structure
E = Uniform (64KB and 4KB)
Package
(RoHS-compliant)
F8 = V-PDFN-8/8mm x 6mm RP
SF = SOP2-16/300mils
3
12 = T-PBGA-24b05/6mm x 8mm
Temperature and
test flow
4 = IT: –40°C to 85°C; Device tested with standard test flow
A = Automotive temperature range, –40 to 125°C; Device tested with high reliability
certified test flow
H = IT: –40°C to 85°C; Device tested with high reliability certified test flow
Security features
Shipping material
0 = Default
4
E = Tray
F = Tape and reel
G = Tube
1. Enter and exit 4-byte address mode are supported.
Notes:
2. 4-byte address mode is the default at power-up. Enter and exit 4-byte address mode are
not supported.
3. See the table below for additional information.
4. Additional secure options are available upon customer request.
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3V, 256Mb: Multiple I/O Serial Flash Memory
Part Number Ordering Information
Table 43: Package Details
Micron SPI and Shortened
M25P
M25P
JEDEC Package
Name
Package
Name
Package
Description
M45PE N25Q
Symbol Symbol Names
M45PE Package Alternate
Package Name
V-PDFN-8/8mm x DFN-8/8mm Very thin, plastic small-out-
ME
MF
ZM
F8
SF
12
MLP8, VDFPN8
V-PSON1-8/8mm x
6mm, VSON
6mm RP
line, 8 terminal pads (no
leads), 8mm x 6mm
SOP2-16/300 mil
SO16W
Small-outline integrated cir-
cuit, 16-pin, wide (300 mil)
SO16W, SO16
wide 300 mil body SOP 16L 300 mil
width
SOIC-16/300 mil,
T-PBGA-24b05/
6mm x 8mm
TBGA 24
Thin, plastic-ball grid array,
24-ball, 6mm x 8mm
TBGA24 6mm x
8mm
T-PBGA-24b05/6x8
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3V, 256Mb: Multiple I/O Serial Flash Memory
Revision History
Revision History
Rev. P – 01/2013
• Updated the READ ID Operation figure in READ ID Operations
• Updated ERASE Operations
• Added link to part number chart in Part Number Ordering Information
• Updated part numbers in Features
Rev. O – 12/2012
Rev. N – 11/2012
• Revised part numbers to selected notes in the Command Definitions table.
• Typo fix in Command Set table in Command Definitions – Dual I/O FAST READ - DTR
from DBh to BDh
Rev. M – 09/12
Rev. L – 08/12
• Added clarification notes to Signal Assignments
• Additional note to Command Set table in Command Definitions
• Corrections to Commands in Command Definitions
Rev. K – 07/12
Rev. J – 06/12
• Added ICC1 (grade 3) to DC Characteristics and Operating Conditions
• Removed READ FLAG STATUS related notes from Command Definitions
• Added N25Q256A13EF8A0x, N25Q256A13ESFA0x, N25Q256A13ESFH0x,
N25Q256A13E12A0x to Features
• Typo fix in Supported Clock Frequencies – DTR table in Nonvolatile and Volatile Reg-
isters
• Updated tSSE specification in AC Reset Conditions table
• Added N25Q256A83ESF40x and N25Q256A83E1240x to Features
• Added RESET pin and functionality throughout
Rev. I – 01/12
• Updated DUAL INPUT/OUTPUT FAST READ - DTR third code and added note 11;
added note 12 to QUAD INPUT/OUTPUT FAST READ - DTR in the Command Set ta-
ble
• Updated VWI min and max specs in the Power-Up Timing and VWI Threshold table
Rev. H, Preliminary – 11/11
• Updated Supported Clock Frequencies – STR in Nonvolatile and Volatile Registers
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3V, 256Mb: Multiple I/O Serial Flash Memory
Revision History
Rev. G, Preliminary – 07/11
• Added double transfer rate (DTR) mode information
Rev. F, Preliminary – 07/11
• Miscellaneous edits, including correction of V-PDFN 8 x 6 package and clarification of
feature set option 7.
Rev. E, Preliminary – 05/11
• Added W# to logic diagram in Device Description
• Cross-reference update to Status Register Bit Definitions table
• Added dummy clock and quad SPI protocol information to Command Definitions
notes
• Corrected Manufacturer ID values
• Removed extraneous frequency requirement note from READ IDENTIFICATIONS Op-
erations
• Corrected timing diagram notes in READ MEMORY Operations
• Corrected timing diagram notes in PROGRAM Operations
• Changed WIP = 1 to WIP = 0 in Power-Up Timing diagram in Power Up and Power
Down
Rev. D, Preliminary – 05/11
• Micron rebrand
Rev. C – 11/10
• Added Reset Enable; Read Extended Address Register, Dual I/O; Reset Enable and Re-
set Memory, Dual I/O; Read Extended Address Register, Quad I/O; Reset Enable and
Reset Memory, Quad I/O
Rev. B – 08/10
Rev. A – 06/10
• Added information to clarify 4-Byte Address Mode; added reset information, includ-
ing the Reset Enable figure and new rows the Reset Conditions table
• Initial release
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
www.micron.com/productsupport Customer Comment Line: 800-932-4992
Micron and the Micron logo are trademarks of Micron Technology, Inc.
All other trademarks are the property of their respective owners.
This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein.
Although considered final, these specifications are subject to change, as further product development and data characterization some-
times occur.
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