JAN1N3345B_技术文档

The documentation and process conversion

measures necessary to comply with this

revision shall be completed by 23 October 1999.

INCH-POUND

MIL-PRF-19500/358E

23 July 1999

SUPERSEDING

MIL-S-19500/358D

26 May 1994

PERFORMANCE SPECIFICATION SHEET

SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR

TYPES 1N3305 THROUGH 1N3350, B AND RB, 1N4549 THROUGH 1N4554, B AND RB,

JAN, JANTX, JANTXV, AND JANS

This specification is approved for use by all Depart-

ments and Agencies of the Department of Defense.

1. SCOPE

1.1 Scope. This specification covers the performance requirements for B type (standard polarity) and RB type (reverse polarity), 50

watt, silicon, voltage regulator diodes. Four levels of product assurance are provided for each device type as specified in MIL-PRF-

19500.

1.2 Physical dimensions. See figure 1 (D0-5).

1.3 Maximum ratings. Maximum ratings are as shown in columns 3, 7, and 9 of table II herein and as follows:

Derate P = 50 W at T ³ +75°C at 0.5 W/°C above T ³ +75°C.

T

C

-65°C £ T £ +150°C; -65°C £ T

£ +175°C.

STG

C

1.4 Primary electrical characteristics. Primary electrical characteristics are as shown in columns 1, 8, 11, and 12 of table II herein,

and as follows:

Thermal resistance (R ) = 2.0°C/W maximum.

qJC

Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document

should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAC, 3990 East Broad St., Columbus, OH

43216-5000, by using the addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this

document or by letter.

AMSC N/A

FSC 5961

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

MIL-PRF-19500/358E

Dimensions

Millimeters

Min Max

Ltr

Notes

Inches

Min

----

Max

.375

.080

.667

.450

.687

----

b

C

----

9.53

2.03

CD

CH

HF

HT

OAH

SL

----

16.94

1.52

----

16.94

11.43

17.45

----

25.40

11.51

.667

.060

----

.422

.220

----

1.000

.453

.249

.175

10.72

2, 3, 6

UD

F T

----

4.45

NOTES:

1. Dimensions are in inches.

2. Maximum pitch diameter of plated threads shall be basic pitch diameter; (.2268). .250-28 UNF-2B UNF-2A THD NF optional.

3. Complete threads to extend to within 2-½ threads of seating plane.

4. Angular orientation of this terminal is undefined.

5. Metric equivalents are given for general information only.

6. Diameter of unthreaded portion shall be .249 maximum and .220 minimum.

FIGURE 1. Physical dimensions.

2

MIL-PRF-19500/358E

2. APPLICABLE DOCUMENTS

2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include

documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has

been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements

documents cited in sections 3 and 4 of this specification, whether or not they are listed.

2.2 Government documents.

2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document

to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department

of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2).

SPECIFICATION

DEPARTMENT OF DEFENSE

MIL-PRF-19500

STANDARD

MILITARY

MIL-STD-750

- Semiconductor Devices, General Specification for.

-

Test Methods for Semiconductor Devices.

(Unless otherwise indicated, copies of the above specifications, standards, and handbooks are available from the Defense Automated

Printing Service, Building 4D (NPM-DODSSP), 700 Robbins Avenue, Philadelphia, PA 19111-5094.)

2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited herein (except for

related associated specifications or specification sheets), the text of this document takes precedence. Nothing in this document,

however, supersedes applicable laws and regulations unless a specific exemption has been obtained.

3. REQUIREMENTS

3.1 Associated specification. The individual item requirements shall be in accordance with MIL-PRF-19500 and as specified herein.

3.2 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as specified in MIL-PRF-

19500.

3.3 Interface requirements and physical dimensions. The Interface requirements and physical dimensions shall be as specified in

MIL-PRF-19500 and herein.

3.3.1 Lead material and finish. Lead finish shall be solderable as defined in MIL-PRF-19500, MIL-STD-750, and herein. Where a

choice of lead finish is desired, it shall be specified in the acquisition document (see 6.2).

3.3.2 Polarity. Standard units (B) shall have the anode connected to the stud. Reversed units (RB) shall have the cathode connected

to the stud.

3.4 Marking. Marking shall be in accordance with MIL-PRF-19500. At the option of the manufacturer, the marking of the country of

origin may be omitted from the body of the semiconductor.

3.4.1 RB types. Reverse (cathode to stud) units shall be marked with an "R" preceding the "B" in the type designation.

3.5 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as

specified in 1.3, 1.4, and table I.

3.6 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table I.

3.7 Qualification. Devices furnished under this specification shall be products that are authorized by the qualifying activity for listing

on the applicable qualified products list before contract award (see 4.2 and 6.4).

3

MIL-PRF-19500/358E

4. VERIFICATION

4.1 Classification of Inspections. The inspection requirements specified herein are classified as follows:

a. Qualification inspection (see 4.2).

b. Screening (see 4.3)

c. Conformance inspection (see 4.4).

4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500.

4.3 Screening (JANS, JANTX, and JANTXV levels only). Screening shall be in accordance with table IV of MIL-PRF-19500, and as

specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table I

herein shall not be acceptable.

Screen (see

table IV of

MIL-PRF-19500)

Measurement

JANTX and JANTXV levels

Not applicable

JANS level

and V (for devices with

9

I

R

Z

V

Z(nom)

³ 10 V dc; see

column 1 of table II)

11

and V ;

I and V

R1 Z

R

Z

DI = 100 percent of initial value or

R

2 mA dc, whichever is greater;

DV = ±1 percent of initial value (for

Z

devices with V

³ 10 V dc;

Z(nom)

see column 1 of table II)

12

13

See 4.3.1

Subgroup 2, (except forward voltage Subgroup 2 (except forward voltage

test) and 3 of table I herein; test) of table I herein;

DI = 100 percent of initial value or

R1

DI = 100 percent of initial value or 2 mA

R1

dc, whichever is greater;

2 mA dc, whichever is greater;

DV = ±1 percent of initial value

DV = ±1% of initial value

Z

4.3.1 Power burn-in conditions. Power burn-in conditions are as follows:

= Column 4 of table II at a T = +150°C.

I

Z

C

4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as specified herein. Group A

inspection shall be performed on each sublot.

4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I herein. End point

electrical measurements shall be in accordance with table I, group A, subgroup 2 herein.

4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in

tables VIa (JANS) and VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and paragraphs 4.4.2.1 and 4.4.2.2 herein. Electrical

measurements (end-points) shall be in accordance with table I, group A, subgroup 2 herein. Delta measurements shall be in accordance

with table III herein.

4

MIL-PRF-19500/358E

4.4.2.1 Group B inspection, table VIa (JANS) of MIL-PRF-19500.

Subgroup

B3

Method

4066

Condition

Not required.

B4

B5

B6

1037

1027

4081

I

= column 7 of table II T = 30°C ±3°C, t = t = 3 minutes minimum for 2,000 cycles.

C on off

Z

I

= column 4 of table II for 168 hours, T = 125°C or adjusted as required, to give an average lot T = 225°C.

A

J

R

= 2.0°C/W maximum. For purposes of this test, junction-to-case shall be used in lieu of junction-to-

qJC

lead and R

shall be used in lieu of R . The case shall be the reference point for calculation of

qJL

qJC

junction-to-case thermal resistance (R ). The mounting arrangement shall be with heat sink to case.

qJC

4.4.2.2 Group B inspection, table VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500.

Subgroup

Method

1051

----

Condition

T = +175°C

high

B2

B3

Surge (see 4.5.1) I

= column 9 or table II.

ZSM

1027

I = column 4 of table II min., adjust I or T to achieve T = 150°C min.

Z Z A J

B5

4081

R

= 2.0°C/W maximum. For purposes of this test, junction-to-case shall be used in lieu of junction-to-

qJC

lead and R

shall be used in lieu of R . The case shall be the reference point for calculation of

qJL

qJC

junction-to-case thermal resistance (R ). The mounting arrangement shall be with heat sink to case.

qJC

B6

1032

T

= +175°C.

A

4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in

table VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) and delta requirements shall be in accordance with

table I, group A, subgroup 2 and table III herein.

Subgroup

C2

Method

2036

Condition

Tension: test condition A, 20 pounds, t = 15 seconds; Torque (stud): Test condition D2,

mounting = normal mounting means, 30 lb-in, t = 30 seconds; bending stress:

Test condition F; 3 pounds, 15 seconds.

C5

C6

C8

4081

1026

4071

Not required.

I

Z

= column 4 of table II min., adjust I or T to achieve T = 150°C min.

Z A J

I

Z

= column 4 of table II, T = 30°C ±3°C, T = T + 100°C each sublot; a V = Col. 12 of table II, %/°C;

1

2

1

Z

(sampling plan = 22 devices, c = 0, small lot = 12 devices, c = 0).

5

MIL-PRF-19500/358E

TABLE I. Group A inspection.

2/

Inspection 1/

Subgroup 1

MIL-STD-750

Conditions

Symbol

Limits

Unit

Method

2071

Min

Max

Visual and mechanical

inspection

Subgroup 2

Forward voltage

4011

4016

1.5

V dc

I

= 10 A dc

V

F

Reverse current

Column

11

mA dc

V

= column 10 of table II,

I

R1

R

dc method

Regulator voltage (see 4.5.3)

Subgroup 3

4022

Column

2

Column

3

V dc

I

Z

= column 4 of table II

V

Z

High-temperature

operation:

T

= 150°C

A

Reverse current

4016

Column

13

mA dc

I

R2

V

= column 10 of table II,

R

dc method

Subgroup 4

Small-signal breakdown

impedance

4051

Column

5

ohms

I

= column 4 of table II,

Z

= 10 percent I

sig

Z

Knee impedance

Column

6

I

ZK

= 5 mA dc, I = 10 percent I

Z

ZK

sig

ZK

Subgroup 5

Not applicable

Subgroup 6

JANS level only

= column 9 of table II

Surge current

(see 4.5.1)

4066

I

ZSM

End point electrical

measurements

Group A, subgroup 2 above.

JANS level only

Subgroup 7

Voltage regulation (see 4.5.2)

Column

8

V dc

V

Z(reg)

Temperature

coefficient of

breakdown voltage

(see 4.5.4)

4071

Column

12

%/°C

I

= column 4 of table II,

a V

Z

T = 30°C ±3°C, T = T +100°C

1

2

1

1/ For sampling plan, see MIL-PRF-19500.

2/ Column references are to table II herein.

6

MIL-PRF-19500/358E

TABLE II. Characteristics and ratings.

Voltage Col 1 Col 2 Col 3 Col 4 Col 5 Col 6

group

Col 7

Col 8

Col 9

Col 10 Col 11 Col 12 Col 13

a V

Z

V

Z

V

Z

V

Z

I

Z

K

I

Z

V

ZREG

I

V

R

I

R1

I

R2

ZSM

Z

Imped-

ance

max

Nom Min Max Test

current

Knee

Max

Voltage

Reverse Reverse Temper- Reverse

T

C

imped- dc current regulation

ance

voltage current

dc max

ature

co-

current

dc

= 30°C

±3°C max

efficient maximum

T

= 30°C

±3°C

C

max

T

A

= +150°C

mA dc

Subgroup V dc V dc V dc mA dc

I

mA dc

V dc

A dc

V dc

W

mA dc

%/°C

1N4549

1N4550

1N4551

1N4552

1N4553

1N4554

Subgroup

II

3.9 3.71 4.09 3200

4.3 4.09 4.51 2900

4.7 4.47 4.93 2650

5.1 4.85 5.35 2450

5.6 5.32 5.88 2250

6.2 5.89 6.51 2000

12400

11050

10100

9300

8500

7650

0.66

0.58

0.40

0.36

0.34

0.36

40.00

38.00

35.00

32.00

30.00

25.00

0.5

1.0

2.0

0.16

0.12

400

500

600

650

900

150

100

20

-.050

-.035

±.015

+.035

+.050

+.055

1/

0.14 1000

1N3305

1N3306

1N3307

1N3308

6.8 6.46 7.14 1850 0.20

7.5 7.13 7.87 1700 0.30

8.2 7.79 8.61 1500 0.40

9.1 8.65 9.55 1370 0.50

750

350

250

7000

6350

5800

5240

4760

4330

3970

3750

3000

3170

2970

2500

2640

2200

0.40

0.50

0.60

0.70

0.90

1.00

1.10

1.20

1.40

1.50

1.60

1.80

1.90

2.00

37.00

33.00

29.00

26.50

24.00

21.50

20.00

18.50

17.00

15.50

14.75

13.75

12.75

4.5

5.0

5.4

6.1

6.7

8.4

9.1

9.9

11.4

12.2

13.0

13.7

300

125

50

25

10

+.057

+.067

+.070

+.075

+.081

+.085

+.079

+.080

+.082

+.083

+.085

+.086

1000

750

500

400

300

200

1N3309 10.0 9.50 10.50 1200 0.60

1N3310 11.0 10.45 11.55 1100 0.80

1N3311 12.0 11.40 12.60 1000 1.00

1N3312 13.0 12.35 13.65 960 1.10

1N3313 14.0 13.30 14.70 890 1.20

1N3314 15.0 14.25 15.75 830 1.40

1N3315 16.0 15.20 16.80 780 1.60

1N3316 17.0 16.15 17.85 740 1.80

1N3317 18.0 17.10 18.90 700 2.00

1N3318 19.0 18.05 19.95 660 2.20

See footnote at end of table.

7

MIL-PRF-19500/358E

TABLE II. Characteristics and ratings - Continued.

Voltage Col 1 Col 2 Col 3 Col 4 Col 5 Col 6

group

Col 7

Col 8

Col 9

Col 10 Col 11 Col 12 Col 13

a V

Z

V

Z

V

Z

V

Z

I

Z

K

I

Z

V

ZREG

I

V

R

I

R1

I

R2

ZSM

Z

Imped-

ance

max

Nom Min Max Test

current

Knee

Max

Voltage

Reverse Reverse Temper- Reverse

T

C

imped- dc current regulation

ance

voltage current

dc max

ature

co-

current

dc

= 30°C

±3°C max

efficient maximum

T

= 30°C

±3°C

C

max

T

A

= +150°C

mA dc

Subgroup V dc V dc V dc mA dc

II

mA dc

V dc

A dc

V dc

W

mA dc

%/°C

1N3319 20.0 19.00 21.00 630

1N3320 22.0 20.90 23.10 570

1N3321 24.0 22.80 25.20 520

1N3322 25.0 23.75 26.25 500

1N3323 27.0 25.65 28.35 460

1N3324 30.0 28.50 31.50 420

1N3325 33.0 31.35 34.65 380

Subgroup

2380

2160

1980

1550

1760

1590

1440

2.30

2.50

2.60

2.80

2.90

3.00

3.20

11.75

10.50

9.75

9.00

8.25

7.75

7.25

15.2

16.7

18.2

20.6

22.8

25.1

2.40 250

2.50 250

2.60 250

2.70 250

2.80 250

3.00 300

3.20 300

10

+.086

+.087

+.088

+.089

+.090

+.091

+.092

200

III

1N3326 36.0 34.20 37.80 350

1N3327 39.0 37.10 40.90 320

1N3328 43.0 40.90 45.10 290

1N3329 45.0 42.75 47.25 280

1N3330 47.0 44.65 49.35 270

1N3331 50.0 47.50 52.50 250

1N3332 51.0 48.45 53.55 245

1N3333 52.0 49.40 54.60 240

1N3334 56.0 53.20 58.80 220

1N3335 62.0 58.90 65.10 200

1N3336 68.0 64.60 71.40 180

1N3337 75.0 71.25 78.75 170

3.50 300

4.00 350

4.50 400

5.00 400

5.00 500

5.20 500

5.50 500

6.00 500

7.00 600

8.00 600

9.00 600

1320

1220

1110

930

1020

830

930

790

850

770

700

640

580

530

3.40

3.60

3.80

3.90

4.00

4.20

4.40

4.65

4.75

5.00

5.50

5.75

6.25

6.75

6.50

5.88

5.38

5.14

4.90

4.76

4.36

4.38

4.13

3.68

3.35

3.00

2.75

2.35

27.4

29.7

32.7

35.8

38.8

42.6

47.1

51.7

56.0

62.2

69.2

10

+.093

+.094

+.095

+.096

+.097

+.098

+.099

200

1N3338 82.0 77.90 86.10 150 11.00 700

1N3339 91.0 86.45 95.55 140 15.00 800

See footnote at end of table.

8

MIL-PRF-19500/358E

TABLE II. Characteristics and ratings - Continued.

Voltage Col 1 Col 2 Col 3 Col 4 Col 5 Col 6

group

Col 7

Col 8

Col 9 Col 10 Col 11 Col 12 Col 13

a V

Z

V

Z

V

Z

V

Z

I

Z

K

I

Z

V

ZREG

I

V

R

I

R1

I

R2

ZSM

Z

Imped-

ance

max

Nom Min

Max

Test

current

Knee

Max

Voltage

Reverse Reverse Temper- Reverse

T

C

imped- dc current regulation

ance

voltage current

dc max

ature

co-

current

dc

= 30°C

±3°C

max

efficient maximum

T

= 30°C

±3°C

C

max

T

A

= +150°C

mA dc

Subgroup V dc V dc V dc mA dc

IV

mA dc

V dc

A dc

V dc

W

mA dc

%/°C

1N3340 100.0 95.00 105.00 120

1N3341 105.0 99.75 110.25 120

1N3342 110.0 104.50 115.50 110

1N3343 120.0 114.00 126.00 100

480

380

430

400

370

325

320

300

230

260

240

7.50

8.25

9.00

2.25

2.15

2.05

1.88

1.73

1.61

1.50

1.43

1.34

1.25

1.10

76.0

83.0

91.2

99.8

114.0

121.6

136.8

152.0

20.00

900

10

+.100

200

25.00 1000

30.00 1100

40.00 1200

50.00 1300

60.00 1400

75.00 1500

80.00 1600

85.00 1700

90.00 1800

100.00 2000

9.50

1N3344 130.0 123.50 136.50

1N3345 140.0 133.00 147.00

1N3346 150.0 142.50 157.50

1N3347 160.0 152.00 168.00

1N3348 175.0 166.25 183.75

1N3349 180.0 171.00 189.00

1N3350 200.0 190.00 210.00

95

90

85

80

70

68

65

10.00

11.00

12.00

13.00

13.75

14.50

16.00

1/ This test is not applicable for devices 1N4549B, RB through 1N4554B, RB.

TABLE III. Groups A, B, C, and E delta measurements. 1/ 2/

Step

1.

Inspection

MIL-STD-750

Conditions

Symbol

Limit

Unit

Method

4011

Forward voltage

±50 mV dc change

from previously

I

F

= 10 A dc

DV 2/

F

measured value.

1/ The delta measurements for table VIa (JANS) of MIL-PRF-19500 are as follows:

a. Subgroups 3, 4, and 5, see table III herein, step 1.

2/ The delta measurements for table VII (JANS only) of MIL-PRF-19500 are as follows:

a. Subgroups 2, 3, and 6, see table III herein, step 1.

9

MIL-PRF-19500/358E

4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.

4.5.1 Surge current I

. The currents specified in column 9 of table II shall be applied in the reverse direction and shall

ZSM

be superimposed on the current (I = column 4 of table II) a total of five surges at 1-minute intervals. Each individual surge shall be one-

Z

half square wave pulse of 1/120-second duration or an equivalent one-half sine wave with the same effective (rms) current.

4.5.2 Voltage regulation V

. A current at 10 percent of I (column 7) shall be maintained until thermal equilibrium is

Z

Z(reg)

obtained, and the V shall then be increased to a level of 50 percent of I (column 7) and maintained at this level for a period of time until

Z

thermal equilibrium is obtained. At which time, the voltage change shall not exceed column 8 of table II. During this test, the case

temperature (T ) of the diode shall be equal to 30°C ±3°C.

C

4.5.3 Regulator voltage. The I test current (column 4 of table II) shall be applied until thermal equilibrium is obtained prior to reading

Z

the regulator voltage. During this test, the case temperature (T ) of the diode shall be equal to 30°C ±3°C.

C

4.5.4 Temperature coefficient of regulator voltage (a V ). The device shall be temperature stabilized with current applied prior

Z

to reading regulator voltage at the specified case temperatures.

4.5.5 Inspection condition. Unless otherwise specified in MIL-PRF-19500 or herein, all inspections shall be made at case temperature

(T ) of 30°C ±3°C.

C

4.5.6 Test ratings. Test ratings shall be as shown in table II. Type numbers with the suffix "RB" shall have identical requirements as

shown in table II for the corresponding B type except the polarity shall be as specified in 3.3.2 herein.

4.5.7 Lot accumulation. Lot accumulation period shall be six months in lieu of six weeks.

5. PACKAGING

5.1 Packaging. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When

actual packaging of material is to be performed by DoD personnel, these personnel need to contact the responsible packaging activity to

ascertain requisite packaging requirements. Packaging requirements are maintained by the Inventory Control Points' packaging activity

within the Military Department or Defense Agency, or within the Military Departments' System Command. Packaging data retrieval is

available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting

the responsible packaging activity.

6. NOTES

(This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.)

6.1 Notes. The notes specified in MIL-PRF-19500 are applicable to this specification.

6.2 Acquisition requirements. Acquisition documents should specify the following:

a. Issue of DODISS to be cited in the solicitation.

b. Lead material and finish (see 3.3.1).

c. Type designation, polarity type, and product assurance level.

10

MIL-PRF-19500/358E

6.3 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous

issue due to the extensiveness of the changes.

6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of

award of contract, qualified for inclusion in Qualified Manufacturers List QML-19500 whether or not such products have actually been so

listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the

products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded

contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be

obtained from Defense Supply Center Columbus, DSCC-VQE, Columbus, OH 43216.

CONCLUDING MATERIAL

Custodians:

Army - CR

Air Force -11

NASA - NA

DLA - CC

Preparing activity:

DLA - CC

(Project 5961-2179)

Review activities:

Air Force - 80, 99

11

STANDARDIZATION DOCUMENT IMPROVEMENT PROPOSAL

INSTRUCTIONS

1. The preparing activity must complete blocks 1, 2, 3, and 8. In block 1, both the document number and revision

letter should be given.

2. The submitter of this form must complete blocks 4, 5, 6, and 7.

3. The preparing activity must provide a reply within 30 days from receipt of the form.

NOTE: This form may not be used to request copies of documents, nor to request waivers, or clarification of requirements on current

contracts. Comments submitted on this form do not constitute or imply authorization to waive any portion of the referenced document(s)

or to amend contractual requirements.

1. DOCUMENT NUMBER

MIL-PRF-19500/358E

2. DOCUMENT DATE

99/07/23

I RECOMMEND A CHANGE:

3. DOCUMENT TITLE SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR TYPES 1N3305 THROUGH

1N3350, B AND RB, 1N4549 THROUGH 1N4554, B AND RB, JAN, JANTX, JANTXV, AND JANS

4. NATURE OF CHANGE (Identify paragraph number and include proposed rewrite, if possible. Attach extra sheets as needed.)

5. REASON FOR RECOMMENDATION

6. SUBMITTER

a. NAME (Last, First, Middle initial)

b. ORGANIZATION

c. ADDRESS (Include Zip Code)

d. TELEPHONE (Include Area Code)

7. DATE SUBMITTED

Commercial

DSN

FAX

EMAIL

8. PREPARING ACTIVITY

b. TELEPHONE

Commercial

614-692-0510

a. Point of Contact

Alan Barone

DSN

FAX

EMAIL

850-0510

614-692-6939

alan_barone@dscc.dla.mil

c. ADDRESS

Defense Supply Center Columbus

ATTN: DSCC-VAC

IF YOU DO NOT RECEIVE A REPLY WITHIN 45 DAYS, CONTACT:

Defense Standardization Program Office (DLSC -LM)

8725 John J. Kingman Road, Suite 2533

Columbus, OH 43216-5000

Fort Belvior, Virginia 22060-6221

Telephone (703) 767-6888 DSN 427-6888

DD FORM 1426, FEB 99 (EG)

PREVIOUS EDITIONS ARE OBSOLETE

WHS/DIOR, Feb 99


型号：	JAN1N3345B
厂家：	Microsemi
描述：	Zener Diode, 140V V(Z), 5%, 50W, Silicon, Unidirectional, DO-5, DO-5, 1 PIN
文件：	总12页 (文件大小：82K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

JAN1N3345B [MICROSEMI]

相关型号：

JAN1N3345RB

JAN1N3346

JAN1N3346A

JAN1N3346B

JAN1N3346B

JAN1N3346R

JAN1N3346RB

JAN1N3346RC

JAN1N3346RD

JAN1N3347B

JAN1N3347B

JAN1N3347RA