JANTX1N3348B [MICROSEMI]
Zener Diode, 175V V(Z), 5%, 50W, Silicon, Unidirectional, DO-5, DO-5, 1 PIN;型号: | JANTX1N3348B |
厂家: | Microsemi |
描述: | Zener Diode, 175V V(Z), 5%, 50W, Silicon, Unidirectional, DO-5, DO-5, 1 PIN |
文件: | 总12页 (文件大小:82K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
The documentation and process conversion
measures necessary to comply with this
revision shall be completed by 23 October 1999.
INCH-POUND
MIL-PRF-19500/358E
23 July 1999
SUPERSEDING
MIL-S-19500/358D
26 May 1994
PERFORMANCE SPECIFICATION SHEET
SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR
TYPES 1N3305 THROUGH 1N3350, B AND RB, 1N4549 THROUGH 1N4554, B AND RB,
JAN, JANTX, JANTXV, AND JANS
This specification is approved for use by all Depart-
ments and Agencies of the Department of Defense.
1. SCOPE
1.1 Scope. This specification covers the performance requirements for B type (standard polarity) and RB type (reverse polarity), 50
watt, silicon, voltage regulator diodes. Four levels of product assurance are provided for each device type as specified in MIL-PRF-
19500.
1.2 Physical dimensions. See figure 1 (D0-5).
1.3 Maximum ratings. Maximum ratings are as shown in columns 3, 7, and 9 of table II herein and as follows:
Derate P = 50 W at T ³ +75°C at 0.5 W/°C above T ³ +75°C.
T
C
C
-65°C £ T £ +150°C; -65°C £ T
£ +175°C.
STG
C
1.4 Primary electrical characteristics. Primary electrical characteristics are as shown in columns 1, 8, 11, and 12 of table II herein,
and as follows:
Thermal resistance (R ) = 2.0°C/W maximum.
qJC
Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document
should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAC, 3990 East Broad St., Columbus, OH
43216-5000, by using the addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this
document or by letter.
AMSC N/A
FSC 5961
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
MIL-PRF-19500/358E
Dimensions
Millimeters
Min Max
Ltr
Notes
Inches
Min
----
----
----
----
Max
.375
.080
.667
.450
.687
----
b
C
----
----
9.53
2.03
CD
CH
HF
HT
OAH
SL
----
----
16.94
1.52
----
16.94
11.43
17.45
----
25.40
11.51
.667
.060
----
.422
.220
----
1.000
.453
.249
.175
10.72
2, 3, 6
UD
F T
----
4.45
NOTES:
1. Dimensions are in inches.
2. Maximum pitch diameter of plated threads shall be basic pitch diameter; (.2268). .250-28 UNF-2B UNF-2A THD NF optional.
3. Complete threads to extend to within 2-½ threads of seating plane.
4. Angular orientation of this terminal is undefined.
5. Metric equivalents are given for general information only.
6. Diameter of unthreaded portion shall be .249 maximum and .220 minimum.
FIGURE 1. Physical dimensions.
2
MIL-PRF-19500/358E
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include
documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has
been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements
documents cited in sections 3 and 4 of this specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document
to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department
of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2).
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-19500
STANDARD
MILITARY
MIL-STD-750
- Semiconductor Devices, General Specification for.
-
Test Methods for Semiconductor Devices.
(Unless otherwise indicated, copies of the above specifications, standards, and handbooks are available from the Defense Automated
Printing Service, Building 4D (NPM-DODSSP), 700 Robbins Avenue, Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited herein (except for
related associated specifications or specification sheets), the text of this document takes precedence. Nothing in this document,
however, supersedes applicable laws and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Associated specification. The individual item requirements shall be in accordance with MIL-PRF-19500 and as specified herein.
3.2 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as specified in MIL-PRF-
19500.
3.3 Interface requirements and physical dimensions. The Interface requirements and physical dimensions shall be as specified in
MIL-PRF-19500 and herein.
3.3.1 Lead material and finish. Lead finish shall be solderable as defined in MIL-PRF-19500, MIL-STD-750, and herein. Where a
choice of lead finish is desired, it shall be specified in the acquisition document (see 6.2).
3.3.2 Polarity. Standard units (B) shall have the anode connected to the stud. Reversed units (RB) shall have the cathode connected
to the stud.
3.4 Marking. Marking shall be in accordance with MIL-PRF-19500. At the option of the manufacturer, the marking of the country of
origin may be omitted from the body of the semiconductor.
3.4.1 RB types. Reverse (cathode to stud) units shall be marked with an "R" preceding the "B" in the type designation.
3.5 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as
specified in 1.3, 1.4, and table I.
3.6 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table I.
3.7 Qualification. Devices furnished under this specification shall be products that are authorized by the qualifying activity for listing
on the applicable qualified products list before contract award (see 4.2 and 6.4).
3
MIL-PRF-19500/358E
4. VERIFICATION
4.1 Classification of Inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3)
c. Conformance inspection (see 4.4).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500.
4.3 Screening (JANS, JANTX, and JANTXV levels only). Screening shall be in accordance with table IV of MIL-PRF-19500, and as
specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table I
herein shall not be acceptable.
Screen (see
table IV of
MIL-PRF-19500)
Measurement
JANTX and JANTXV levels
Not applicable
JANS level
and V (for devices with
9
I
I
R
Z
V
Z(nom)
³ 10 V dc; see
column 1 of table II)
11
and V ;
I and V
R1 Z
R
Z
DI = 100 percent of initial value or
R
2 mA dc, whichever is greater;
DV = ±1 percent of initial value (for
Z
devices with V
³ 10 V dc;
Z(nom)
see column 1 of table II)
12
13
See 4.3.1
See 4.3.1
Subgroup 2, (except forward voltage Subgroup 2 (except forward voltage
test) and 3 of table I herein; test) of table I herein;
DI = 100 percent of initial value or
R1
DI = 100 percent of initial value or 2 mA
R1
dc, whichever is greater;
2 mA dc, whichever is greater;
DV = ±1 percent of initial value
DV = ±1% of initial value
Z
Z
4.3.1 Power burn-in conditions. Power burn-in conditions are as follows:
= Column 4 of table II at a T = +150°C.
I
Z
C
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as specified herein. Group A
inspection shall be performed on each sublot.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I herein. End point
electrical measurements shall be in accordance with table I, group A, subgroup 2 herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in
tables VIa (JANS) and VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and paragraphs 4.4.2.1 and 4.4.2.2 herein. Electrical
measurements (end-points) shall be in accordance with table I, group A, subgroup 2 herein. Delta measurements shall be in accordance
with table III herein.
4
MIL-PRF-19500/358E
4.4.2.1 Group B inspection, table VIa (JANS) of MIL-PRF-19500.
Subgroup
B3
Method
4066
Condition
Not required.
B4
B5
B6
1037
1027
4081
I
= column 7 of table II T = 30°C ±3°C, t = t = 3 minutes minimum for 2,000 cycles.
C on off
Z
Z
I
= column 4 of table II for 168 hours, T = 125°C or adjusted as required, to give an average lot T = 225°C.
A
J
R
= 2.0°C/W maximum. For purposes of this test, junction-to-case shall be used in lieu of junction-to-
qJC
lead and R
shall be used in lieu of R . The case shall be the reference point for calculation of
qJL
qJC
junction-to-case thermal resistance (R ). The mounting arrangement shall be with heat sink to case.
qJC
4.4.2.2 Group B inspection, table VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup
Method
1051
----
Condition
T = +175°C
high
B2
B2
B3
Surge (see 4.5.1) I
= column 9 or table II.
ZSM
1027
I = column 4 of table II min., adjust I or T to achieve T = 150°C min.
Z Z A J
B5
4081
R
= 2.0°C/W maximum. For purposes of this test, junction-to-case shall be used in lieu of junction-to-
qJC
lead and R
shall be used in lieu of R . The case shall be the reference point for calculation of
qJL
qJC
junction-to-case thermal resistance (R ). The mounting arrangement shall be with heat sink to case.
qJC
B6
1032
T
= +175°C.
A
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in
table VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) and delta requirements shall be in accordance with
table I, group A, subgroup 2 and table III herein.
Subgroup
C2
Method
2036
Condition
Tension: test condition A, 20 pounds, t = 15 seconds; Torque (stud): Test condition D2,
mounting = normal mounting means, 30 lb-in, t = 30 seconds; bending stress:
Test condition F; 3 pounds, 15 seconds.
C5
C6
C8
4081
1026
4071
Not required.
I
Z
= column 4 of table II min., adjust I or T to achieve T = 150°C min.
Z A J
I
Z
= column 4 of table II, T = 30°C ±3°C, T = T + 100°C each sublot; a V = Col. 12 of table II, %/°C;
1
2
1
Z
(sampling plan = 22 devices, c = 0, small lot = 12 devices, c = 0).
5
MIL-PRF-19500/358E
TABLE I. Group A inspection.
2/
Inspection 1/
Subgroup 1
MIL-STD-750
Conditions
Symbol
Limits
Unit
Method
2071
Min
Max
Visual and mechanical
inspection
Subgroup 2
Forward voltage
4011
4016
1.5
V dc
I
= 10 A dc
V
F
F
Reverse current
Column
11
mA dc
V
= column 10 of table II,
I
R1
R
dc method
Regulator voltage (see 4.5.3)
Subgroup 3
4022
Column
2
Column
3
V dc
I
Z
= column 4 of table II
V
Z
High-temperature
operation:
T
= 150°C
A
Reverse current
4016
Column
13
mA dc
I
R2
V
= column 10 of table II,
R
dc method
Subgroup 4
Small-signal breakdown
impedance
4051
4051
Column
5
ohms
ohms
I
I
= column 4 of table II,
Z
Z
Z
= 10 percent I
sig
Z
Knee impedance
Column
6
I
ZK
= 5 mA dc, I = 10 percent I
Z
ZK
sig
ZK
Subgroup 5
Not applicable
Subgroup 6
JANS level only
= column 9 of table II
Surge current
(see 4.5.1)
4066
I
ZSM
End point electrical
measurements
Group A, subgroup 2 above.
JANS level only
Subgroup 7
Voltage regulation (see 4.5.2)
Column
8
V dc
V
Z(reg)
Temperature
coefficient of
breakdown voltage
(see 4.5.4)
4071
Column
12
%/°C
I
= column 4 of table II,
a V
Z
Z
T = 30°C ±3°C, T = T +100°C
1
2
1
1/ For sampling plan, see MIL-PRF-19500.
2/ Column references are to table II herein.
6
MIL-PRF-19500/358E
TABLE II. Characteristics and ratings.
Voltage Col 1 Col 2 Col 3 Col 4 Col 5 Col 6
group
Col 7
Col 8
Col 9
Col 10 Col 11 Col 12 Col 13
a V
Z
V
Z
V
Z
V
Z
I
Z
Z
K
I
Z
V
ZREG
I
V
R
I
R1
I
R2
ZSM
Z
Imped-
ance
max
Nom Min Max Test
current
Knee
Max
Voltage
Reverse Reverse Temper- Reverse
T
C
imped- dc current regulation
ance
voltage current
dc max
ature
co-
current
dc
= 30°C
±3°C max
efficient maximum
T
= 30°C
±3°C
C
max
T
A
= +150°C
mA dc
Subgroup V dc V dc V dc mA dc
I
mA dc
V dc
A dc
V dc
W
W
mA dc
%/°C
1N4549
1N4550
1N4551
1N4552
1N4553
1N4554
Subgroup
II
3.9 3.71 4.09 3200
4.3 4.09 4.51 2900
4.7 4.47 4.93 2650
5.1 4.85 5.35 2450
5.6 5.32 5.88 2250
6.2 5.89 6.51 2000
12400
11050
10100
9300
8500
7650
0.66
0.58
0.40
0.36
0.34
0.36
40.00
38.00
35.00
32.00
30.00
25.00
0.5
0.5
1.0
1.0
1.0
2.0
0.16
0.16
0.12
0.12
0.12
400
500
600
650
900
150
150
100
20
20
20
-.050
-.035
±.015
+.035
+.050
+.055
1/
0.14 1000
1N3305
1N3306
1N3307
1N3308
6.8 6.46 7.14 1850 0.20
7.5 7.13 7.87 1700 0.30
8.2 7.79 8.61 1500 0.40
9.1 8.65 9.55 1370 0.50
750
350
250
250
250
250
250
250
250
250
250
250
250
250
7000
6350
5800
5240
4760
4330
3970
3750
3000
3170
2970
2500
2640
2200
0.40
0.50
0.60
0.70
0.90
1.00
1.10
1.20
1.40
1.50
1.60
1.80
1.90
2.00
37.00
33.00
29.00
26.50
24.00
21.50
20.00
18.50
17.00
15.50
14.75
13.75
12.75
12.75
4.5
5.0
5.4
6.1
6.7
8.4
9.1
9.9
11.4
11.4
12.2
13.0
13.7
13.7
300
125
50
25
25
10
10
10
10
10
10
10
10
10
+.057
+.067
+.070
+.075
+.081
+.085
+.079
+.080
+.080
+.082
+.083
+.085
+.085
+.086
1000
750
500
400
300
200
200
200
200
200
200
200
200
200
1N3309 10.0 9.50 10.50 1200 0.60
1N3310 11.0 10.45 11.55 1100 0.80
1N3311 12.0 11.40 12.60 1000 1.00
1N3312 13.0 12.35 13.65 960 1.10
1N3313 14.0 13.30 14.70 890 1.20
1N3314 15.0 14.25 15.75 830 1.40
1N3315 16.0 15.20 16.80 780 1.60
1N3316 17.0 16.15 17.85 740 1.80
1N3317 18.0 17.10 18.90 700 2.00
1N3318 19.0 18.05 19.95 660 2.20
See footnote at end of table.
7
MIL-PRF-19500/358E
TABLE II. Characteristics and ratings - Continued.
Voltage Col 1 Col 2 Col 3 Col 4 Col 5 Col 6
group
Col 7
Col 8
Col 9
Col 10 Col 11 Col 12 Col 13
a V
Z
V
Z
V
Z
V
Z
I
Z
Z
K
I
Z
V
ZREG
I
V
R
I
R1
I
R2
ZSM
Z
Imped-
ance
max
Nom Min Max Test
current
Knee
Max
Voltage
Reverse Reverse Temper- Reverse
T
C
imped- dc current regulation
ance
voltage current
dc max
ature
co-
current
dc
= 30°C
±3°C max
efficient maximum
T
= 30°C
±3°C
C
max
T
A
= +150°C
mA dc
Subgroup V dc V dc V dc mA dc
II
mA dc
V dc
A dc
V dc
W
W
mA dc
%/°C
1N3319 20.0 19.00 21.00 630
1N3320 22.0 20.90 23.10 570
1N3321 24.0 22.80 25.20 520
1N3322 25.0 23.75 26.25 500
1N3323 27.0 25.65 28.35 460
1N3324 30.0 28.50 31.50 420
1N3325 33.0 31.35 34.65 380
Subgroup
2380
2160
1980
1550
1760
1590
1440
2.30
2.50
2.60
2.80
2.90
3.00
3.20
11.75
10.50
9.75
9.00
8.25
7.75
7.25
15.2
16.7
18.2
18.2
20.6
22.8
25.1
2.40 250
2.50 250
2.60 250
2.70 250
2.80 250
3.00 300
3.20 300
10
10
10
10
10
10
10
+.086
+.087
+.088
+.089
+.090
+.091
+.092
200
200
200
200
200
200
200
III
1N3326 36.0 34.20 37.80 350
1N3327 39.0 37.10 40.90 320
1N3328 43.0 40.90 45.10 290
1N3329 45.0 42.75 47.25 280
1N3330 47.0 44.65 49.35 270
1N3331 50.0 47.50 52.50 250
1N3332 51.0 48.45 53.55 245
1N3333 52.0 49.40 54.60 240
1N3334 56.0 53.20 58.80 220
1N3335 62.0 58.90 65.10 200
1N3336 68.0 64.60 71.40 180
1N3337 75.0 71.25 78.75 170
3.50 300
4.00 350
4.50 400
4.50 400
5.00 400
5.00 500
5.20 500
5.50 500
6.00 500
7.00 600
8.00 600
9.00 600
1320
1220
1110
930
1020
830
930
790
850
770
700
640
580
530
3.40
3.60
3.80
3.90
4.00
4.20
4.40
4.65
4.75
5.00
5.50
5.75
6.25
6.75
6.50
5.88
5.38
5.14
4.90
4.76
4.36
4.38
4.13
3.68
3.35
3.00
2.75
2.35
27.4
29.7
32.7
32.7
35.8
38.8
38.8
42.6
42.6
47.1
51.7
56.0
62.2
69.2
10
10
10
10
10
10
10
10
10
10
10
10
10
10
+.093
+.094
+.095
+.095
+.095
+.096
+.096
+.096
+.096
+.097
+.097
+.098
+.098
+.099
200
200
200
200
200
200
200
200
200
200
200
200
200
200
1N3338 82.0 77.90 86.10 150 11.00 700
1N3339 91.0 86.45 95.55 140 15.00 800
See footnote at end of table.
8
MIL-PRF-19500/358E
TABLE II. Characteristics and ratings - Continued.
Voltage Col 1 Col 2 Col 3 Col 4 Col 5 Col 6
group
Col 7
Col 8
Col 9 Col 10 Col 11 Col 12 Col 13
a V
Z
V
Z
V
Z
V
Z
I
Z
Z
K
I
Z
V
ZREG
I
V
R
I
R1
I
R2
ZSM
Z
Imped-
ance
max
Nom Min
Max
Test
current
Knee
Max
Voltage
Reverse Reverse Temper- Reverse
T
C
imped- dc current regulation
ance
voltage current
dc max
ature
co-
current
dc
= 30°C
±3°C
max
efficient maximum
T
= 30°C
±3°C
C
max
T
A
= +150°C
mA dc
Subgroup V dc V dc V dc mA dc
IV
mA dc
V dc
A dc
V dc
W
W
mA dc
%/°C
1N3340 100.0 95.00 105.00 120
1N3341 105.0 99.75 110.25 120
1N3342 110.0 104.50 115.50 110
1N3343 120.0 114.00 126.00 100
480
380
430
400
370
325
320
300
230
260
240
7.50
8.25
9.00
2.25
2.15
2.05
1.88
1.73
1.61
1.50
1.43
1.34
1.25
1.10
76.0
83.0
83.0
91.2
99.8
114.0
114.0
121.6
121.6
136.8
152.0
20.00
900
10
10
10
10
10
10
10
10
10
10
10
+.100
+.100
+.100
+.100
+.100
+.100
+.100
+.100
+.100
+.100
+.100
200
200
200
200
200
200
200
200
200
200
200
25.00 1000
30.00 1100
40.00 1200
50.00 1300
60.00 1400
75.00 1500
80.00 1600
85.00 1700
90.00 1800
100.00 2000
9.50
1N3344 130.0 123.50 136.50
1N3345 140.0 133.00 147.00
1N3346 150.0 142.50 157.50
1N3347 160.0 152.00 168.00
1N3348 175.0 166.25 183.75
1N3349 180.0 171.00 189.00
1N3350 200.0 190.00 210.00
95
90
85
80
70
68
65
10.00
11.00
12.00
13.00
13.75
14.50
16.00
1/ This test is not applicable for devices 1N4549B, RB through 1N4554B, RB.
TABLE III. Groups A, B, C, and E delta measurements. 1/ 2/
Step
1.
Inspection
MIL-STD-750
Conditions
Symbol
Limit
Unit
Method
4011
Forward voltage
±50 mV dc change
from previously
I
F
= 10 A dc
DV 2/
F
measured value.
1/ The delta measurements for table VIa (JANS) of MIL-PRF-19500 are as follows:
a. Subgroups 3, 4, and 5, see table III herein, step 1.
2/ The delta measurements for table VII (JANS only) of MIL-PRF-19500 are as follows:
a. Subgroups 2, 3, and 6, see table III herein, step 1.
9
MIL-PRF-19500/358E
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Surge current I
. The currents specified in column 9 of table II shall be applied in the reverse direction and shall
ZSM
be superimposed on the current (I = column 4 of table II) a total of five surges at 1-minute intervals. Each individual surge shall be one-
Z
half square wave pulse of 1/120-second duration or an equivalent one-half sine wave with the same effective (rms) current.
4.5.2 Voltage regulation V
. A current at 10 percent of I (column 7) shall be maintained until thermal equilibrium is
Z
Z(reg)
obtained, and the V shall then be increased to a level of 50 percent of I (column 7) and maintained at this level for a period of time until
Z
Z
thermal equilibrium is obtained. At which time, the voltage change shall not exceed column 8 of table II. During this test, the case
temperature (T ) of the diode shall be equal to 30°C ±3°C.
C
4.5.3 Regulator voltage. The I test current (column 4 of table II) shall be applied until thermal equilibrium is obtained prior to reading
Z
the regulator voltage. During this test, the case temperature (T ) of the diode shall be equal to 30°C ±3°C.
C
4.5.4 Temperature coefficient of regulator voltage (a V ). The device shall be temperature stabilized with current applied prior
Z
to reading regulator voltage at the specified case temperatures.
4.5.5 Inspection condition. Unless otherwise specified in MIL-PRF-19500 or herein, all inspections shall be made at case temperature
(T ) of 30°C ±3°C.
C
4.5.6 Test ratings. Test ratings shall be as shown in table II. Type numbers with the suffix "RB" shall have identical requirements as
shown in table II for the corresponding B type except the polarity shall be as specified in 3.3.2 herein.
4.5.7 Lot accumulation. Lot accumulation period shall be six months in lieu of six weeks.
5. PACKAGING
5.1 Packaging. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When
actual packaging of material is to be performed by DoD personnel, these personnel need to contact the responsible packaging activity to
ascertain requisite packaging requirements. Packaging requirements are maintained by the Inventory Control Points' packaging activity
within the Military Department or Defense Agency, or within the Military Departments' System Command. Packaging data retrieval is
available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting
the responsible packaging activity.
6. NOTES
(This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.)
6.1 Notes. The notes specified in MIL-PRF-19500 are applicable to this specification.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a. Issue of DODISS to be cited in the solicitation.
b. Lead material and finish (see 3.3.1).
c. Type designation, polarity type, and product assurance level.
10
MIL-PRF-19500/358E
6.3 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous
issue due to the extensiveness of the changes.
6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of
award of contract, qualified for inclusion in Qualified Manufacturers List QML-19500 whether or not such products have actually been so
listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the
products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded
contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be
obtained from Defense Supply Center Columbus, DSCC-VQE, Columbus, OH 43216.
CONCLUDING MATERIAL
Custodians:
Army - CR
Air Force -11
NASA - NA
DLA - CC
Preparing activity:
DLA - CC
(Project 5961-2179)
Review activities:
Air Force - 80, 99
11
STANDARDIZATION DOCUMENT IMPROVEMENT PROPOSAL
INSTRUCTIONS
1. The preparing activity must complete blocks 1, 2, 3, and 8. In block 1, both the document number and revision
letter should be given.
2. The submitter of this form must complete blocks 4, 5, 6, and 7.
3. The preparing activity must provide a reply within 30 days from receipt of the form.
NOTE: This form may not be used to request copies of documents, nor to request waivers, or clarification of requirements on current
contracts. Comments submitted on this form do not constitute or imply authorization to waive any portion of the referenced document(s)
or to amend contractual requirements.
1. DOCUMENT NUMBER
MIL-PRF-19500/358E
2. DOCUMENT DATE
99/07/23
I RECOMMEND A CHANGE:
3. DOCUMENT TITLE SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR TYPES 1N3305 THROUGH
1N3350, B AND RB, 1N4549 THROUGH 1N4554, B AND RB, JAN, JANTX, JANTXV, AND JANS
4. NATURE OF CHANGE (Identify paragraph number and include proposed rewrite, if possible. Attach extra sheets as needed.)
5. REASON FOR RECOMMENDATION
6. SUBMITTER
a. NAME (Last, First, Middle initial)
b. ORGANIZATION
c. ADDRESS (Include Zip Code)
d. TELEPHONE (Include Area Code)
7. DATE SUBMITTED
Commercial
DSN
FAX
EMAIL
8. PREPARING ACTIVITY
b. TELEPHONE
Commercial
614-692-0510
a. Point of Contact
Alan Barone
DSN
FAX
EMAIL
850-0510
614-692-6939
alan_barone@dscc.dla.mil
c. ADDRESS
Defense Supply Center Columbus
ATTN: DSCC-VAC
IF YOU DO NOT RECEIVE A REPLY WITHIN 45 DAYS, CONTACT:
Defense Standardization Program Office (DLSC -LM)
8725 John J. Kingman Road, Suite 2533
Columbus, OH 43216-5000
Fort Belvior, Virginia 22060-6221
Telephone (703) 767-6888 DSN 427-6888
DD FORM 1426, FEB 99 (EG)
PREVIOUS EDITIONS ARE OBSOLETE
WHS/DIOR, Feb 99
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