W3EG72126S262D3SG [MICROSEMI]
DDR DRAM Module, 128MX72, 0.75ns, CMOS, ROHS COMPLIANT, DIMM-184;
| 型号： | W3EG72126S262D3SG |
| 厂家： | 
Microsemi |
| 描述： | DDR DRAM Module, 128MX72, 0.75ns, CMOS, ROHS COMPLIANT, DIMM-184 动态存储器 双倍数据速率 内存集成电路 |
| 文件： | 总15页 (文件大小：263K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY*
1GB-128Mx72 DDR SDRAM REGISTERED ECC w/PLL
FEATURES
DESCRIPTION
ꢀ
Double-data-rate architecture
The W3EG72126S is a 128Mx72 Double Data Rate
SDRAM memory module based on 512Mb DDR SDRAM
components. The module consists of eighteen 128Mx4
DDR SDRAMs in 66 pin TSOP packages mounted on a
184 pin FR4 substrate.
ꢀ
DDR200, DDR266 and DDR333:
• JEDEC design specifications
ꢀ
ꢀ
ꢀ
ꢀ
ꢀ
ꢀ
ꢀ
ꢀ
ꢀ
ꢀ
Bi-directional data strobes (DQS)
Differential clock inputs (CK & CK#)
Programmable Read Latency 2,2.5 (clock)
Programmable Burst Length (2,4,8)
Programmable Burst type (sequential & interleave)
Edge aligned data output, center aligned data input.
Auto and self refresh
Synchronous design allows precise cycle control with the
use of system clock. Data I/O transactions are possible on
both edges and Burst Lengths allow the same device to be
useful for a variety of high bandwidth, high performance
memory system applications.
* This product is under development, is not qualified or characterized and is subject to
change without notice.
Serial presence detect
Power supply: VCC = 2.5V ± 0.20V
JEDEC standard 184 pin DIMM package
• Package height options:
JD3: 30.48mm (1.20") and
AJD3: 28.70mm (1.13")
• Consult factory for availability of lead-free
products.
OPERATING FREQUENCIES
DDR333 @CL=2.5
166MHz
DDR266 @CL=2
133MHz
2-2-2
DDR266 @CL=2
133MHz
2-3-3
DDR266 @CL=2.5
133MHz
DDR200 @CL=2
100MHz
Clock Speed
CL-tRCD-tRP
2.5-3-3
2.5-3-3
2-2-2
November 2004
Rev. 3
1
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
PIN CONFIGURATION
PIN NAMES
A0-A12
BA0-BA1
DQ0-DQ63
CB0-CB7
DQS0-DQS17
CK0
CK0#
CKE0
CS0#
RAS#
CAS#
WE#
VCC
VCCQ
VSS
VREF
VCCSPD
SDA
SCL
Address input (Multiplexed)
Bank Select Address
Data Input/Output
Check bits
Data Strobe Input/Output
Clock Input
PIN SYMBOL PIN SYMBOL PIN SYMBOL PIN SYMBOL
1
VREF
DQ0
VSS
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
DQS8
A0
93
VSS
DQ4
DQ5
VCCQ
DQS9
DQ6
DQ7
VSS
139
140
141
142
143
144
145
146
147
148
149
150
151
152
153
154
155
156
157
158
159
160
161
162
163
164
165
166
167
168
169
170
171
172
173
174
175
176
177
178
179
180
181
182
183
184
VSS
DQS17
A10
2
94
3
CB2
95
4
5
6
7
8
9
DQ1
DQS0
DQ2
VCC
DQ3
NC
VSS
CB3
BA1
DQ32
VCCQ
DQ33
DQS4
DQ34
VSS
96
97
98
99
CB6
VCCQ
CB7
Clock Input
Clock Enable input
Chip Select Input
Row Address Strobe
Column Address Strobe
Write Enable
Power Supply
Power Supply for DQS
Ground
VSS
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
DQ36
DQ37
VCC
DQS13
DQ38
DQ39
VSS
DQ44
RAS#
DQ45
VCCQ
CS0#
NC
DQS14
VSS
DQ46
DQ47
NC
VCCQ
DQ52
DQ53
NC
NC
NC
NC
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
RESET#
VSS
DQ8
DQ9
DQS1
VCCQ
NC
VCCQ
DQ12
DQ13
DQS10
VCC
DQ14
DQ15
NC
VCCQ
NC
DQ20
A12
VSS
DQ21
A11
DQS11
VCC
DQ22
A8
DQ23
VSS
A6
DQ28
DQ29
VCCQ
DQS12
A3
BA0
DQ35
DQ40
VCCQ
WE#
DQ41
CAS#
VSS
DQS5
DQ42
DQ43
VCC
Power Supply for Reference
Serial EEPROM Power Supply
Serial data I/O
NC
VSS
Serial clock
SA0-SA2
VCCID
NC
Address in EEPROM
VCC Indentification Flag
No Connect
DQ10
DQ11
CKE0
VCCQ
DQ16
DQ17
DQS2
VSS
A9
DQ18
A7
VCCQ
DQ19
A5
DQ24
VSS
RESET#
Reset Enable
NC
DQ48
DQ49
VSS
NC
NC
VCC
VCCQ
DQS6
DQ50
DQ51
VSS
VCCID
DQ56
DQ57
VCC
DQS7
DQ58
DQ59
VSS
DQS15
DQ54
DQ55
VCCQ
NC
DQ60
DQ61
VSS
DQS16
DQ62
DQ63
VCCQ
SA0
DQ25
DQS3
A4
VCC
DQ26
DQ27
A2
VSS
A1
CB0
CB1
VCC
DQ30
VSS
DQ31
CB4
CB5
VCCQ
CK0
CK0#
NC
SDA
SCL
SA1
SA2
VCCSPD
November 2004
Rev. 3
2
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
FUNCTIONAL BLOCK DIAGRAM
V
SS
RCS0#
DQS0
DQS9
DQS CS#
I/O 3
I/O 2
I/O 1
I/O 0
DM
DQS CS#
I/O 3
I/O 2
I/O 1
I/O 0
DM
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQS1
DQS2
DQS3
DQS10
DQS CS#
DM
DM
DM
DQS CS#
DM
DM
DM
I/O 3
I/O 2
I/O 1
I/O 0
I/O 3
I/O 2
I/O 1
I/O 0
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQS11
DQS CS#
DQS CS#
I/O 3
I/O 2
I/O 1
I/O 0
I/O 3
I/O 2
I/O 1
I/O 0
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQS12
DQS CS#
DQS CS#
I/O 3
I/O 2
I/O 1
I/O 0
I/O 3
I/O 2
I/O 1
I/O 0
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
CKO
SDRAM
PLL
DQS4
DQS13
CKO#
REGISTER
DQS CS#
DM
DM
DM
DQS CS#
DM
DM
DM
I/O 3
I/O 2
I/O 1
I/O 0
I/O 3
I/O 2
I/O 1
I/O 0
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DQS14
DQS5
DQS6
DQS CS#
DQS CS#
I/O 3
I/O 2
I/O 1
I/O 0
I/O 3
I/O 2
I/O 1
I/O 0
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
Serial PD
SCL
WP
SDA
A0
A1
A2
DQS15
DQS CS#
DQS CS#
SA0 SA1 SA2
I/O 3
I/O 2
I/O 1
I/O 0
I/O 3
I/O 2
I/O 1
I/O 0
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DQS16
DQS7
DQS8
DQS CS#
DM
DM
DQS CS#
DM
DM
VCCSPD
VCC/VCCQ
VREF
SPD
I/O 3
I/O 2
I/O 1
I/O 0
DQ60
DQ61
DQ62
DQ63
I/O 3
I/O 2
I/O 1
I/O 0
DQ56
DQ57
DQ58
DQ59
DDR SDRAMs
DDR SDRAMs
DDR SDRAMs
DQS17
DQS CS#
DQS CS#
CB4
CB5
CB6
CB7
I/O 3
I/O 2
I/O 1
I/O 0
I/O 3
I/O 2
I/O 1
I/O 0
CB0
CB1
CB2
CB3
VSS
R
E
G
I
S
T
E
R
CS0#
BA0-BA1
RAS#
A0-A12
CAS#
CKE0
WE#
RCS0#
RBA0 - RBA1
RA0 - RA12
RRAS#
BA0 - BA1: DDR SDRAMs
A0 - A12: DDR SDRAMs
RAS#: DDR SDRAMs
CAS#: DDR SDRAMs
CKE: DDR SDRAMs
WE: DDR SDRAMs
RCAS#
RCKE0
RWE#
PCK
PCK#
RESET#
Notes:
1.
2.
DQ-to-I/O wiring is shown as recommended but may be changed.
DQ/DQS/DM/CKE/S relationships must be maintained as shown.
NOTE: All resistor values are 22 ohms unless otherwise specified
November 2004
Rev. 3
3
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
ABSOLUTE MAXIMUM RATINGS
Parameter
Symbol
VIN, VOUT
VCC, VCCQ
TSTG
Value
-0.5 to 3.6
-1.0 to 3.6
-55 to +150
27
Units
V
Voltage on any pin relative to VSS
Voltage on VCC supply relative to VSS
Storage Temperature
V
°C
W
Power Dissipation
PD
Short Circuit Current
IOS
50
mA
Note:
Permanent device damage may occur if ‘ABSOLUTE MAXIMUM RATINGS’ are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability
DC CHARACTERISTICS
0°C TA 70°C, VCC = 2.5V ± 0.2V
Parameter
Symbol
VCC
Min
2.3
Max
2.7
Unit
V
Supply Voltage
Supply Voltage
VCCQ
VREF
VTT
2.3
2.7
V
Reference Voltage
Termination Voltage
Input High Voltage
Input Low Voltage
Output High Voltage
Output Low Voltage
1.15
1.35
V
1.15
1.35
V
VIH
VREF + 0.15
-0.3
VCCQ + 0.3
VREF -0.15
—
V
VIL
V
VOH
VTT + 0.76
—
V
VOL
VTT-0.76
V
CAPACITANCE
TA = 25°C. f = 1MHz, VCC = 2.5V ± 0.2V
Parameter
Symbol
CIN1
Max
6.25
6.25
6.25
5.5
6.25
8
Unit
pF
pF
pF
pF
pF
pF
pF
pF
pF
Input Capacitance (A0-A12)
Input Capacitance (RAS#,CAS#,WE#)
Input Capacitance (CKE0)
CIN2
CIN3
Input Capacitance (CK0#,CK0)
Input Capacitance (CS0#)
CIN4
CIN5
Input Capacitance (DQM0-DQM8)
Input Capacitance (BA0-BA1)
Data input/output capacitance (DQ0-DQ63)(DQS)
Data input/output capacitance (CB0-CB7)
CIN6
CIN7
6.25
8
COUT
COUT
8
November 2004
Rev. 3
4
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
IDD SPECIFICATIONS AND TEST CONDITIONS
0°C TA 70°C, VCCQ = 2.5V ± 0.2V, VCC = 2.5V ± 0.2V
Includes DDR SDRAM component only
DDR333@CL=2.5
Max
DDR266@CL=2, 2.5
DDR200@CL=2
Max
Parameter
Symbol Conditions
Max
Units
Operating Current
IDD0
One device bank; Active - Precharge;
tRC=tRC (MIN); tCK=tCK (MIN); DQ,DM
2340
2340
2340
mA
and DQS inputs changing once per
clock cycle; Address and control
inputs changing once every two
cycles.
Operating Current
IDD1
One device bank; Active-Read-
Precharge Burst = 2; tRC=tRC (MIN);
tCK=tCK (MIN); lOUT = 0mA; Address
and control inputs changing once per
clock cycle.
2880
2880
2880
mA
Precharge Power-
Down Standby
Current
IDD2P
All device banks idle; Power-down
mode; tCK=tCK (MIN); CKE=(low)
90
90
90
rnA
mA
Idle Standby Current
IDD2F
CS# = High; All device banks idle;
tCK=tCK (MIN); CKE = high; Address
and other control inputs changing
once per clock cycle. VIN = VREF for
DQ, DQS and DM.
810
810
810
Active Power-Down
Standby Current
IDD3P
IDD3N
One device bank active; Power-Down
mode; tCK (MIN); CKE=(low)
630
900
630
900
630
900
mA
mA
Active Standby
Current
CS# = High; CKE = High; One device
bank; Active-Precharge; tRC=tRAS
(MAX); tCK=tCK (MIN); DQ, DM and
DQS inputs changing twice per clock
cycle; Address and other control
inputs changing once per clock cycle.
Operating Current
Operating Current
IDD4R
Burst = 2; Reads; Continuous burst;
One device bank active; Address
and control inputs changing once
per clock cycle; TCK= TCK (MIN); lOUT
= 0mA.
2970
3150
2970
2790
2970
2790
mA
rnA
IDD4W
Burst = 2; Writes; Continuous burst;
One device bank active; Address
and control inputs changing once per
clock cycle; tCK=tCK (MIN); DQ,DM
and DQS inputs changing once per
clock cycle.
Auto Refresh
Current
IDD5
tRC = tRC (MIN)
5220
5220
5220
mA
Self Refresh Current
Operating Current
IDD6
CKE 0.2V
90
90
90
mA
mA
IDD7A
Four bank interleaving Reads (BL=4)
with auto precharge with tRC=tRC
(MIN); tCK=tCK (MIN); Address and
control inputs change only during
Active Read or Write commands.
7290
7200
7200
November 2004
Rev. 3
5
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
IDD SPECIFICATIONS AND TEST CONDITIONS
0°C TA 70°C, VCCQ = 2.5V ± 0.2V, VCC = 2.5V ± 0.2V
Includes PLL and register power
DDR333@CL=2.5
Max
DDR266@CL=2, 2.5
DDR200@CL=2
Max
Parameter
Symbol Conditions
Max
Units
Operating Current
IDD0
One device bank; Active - Precharge;
tRC=tRC (MIN); tCK=tCK (MIN); DQ,DM
2615
2615
2615
mA
and DQS inputs changing once per
clock cycle; Address and control
inputs changing once every two
cycles.
Operating Current
IDD1
One device bank; Active-Read-
Precharge Burst = 2; tRC=tRC (MIN);
tCK=tCK (MIN); lOUT = 0mA; Address
and control inputs changing once per
clock cycle.
3155
3155
3155
mA
Precharge Power-
Down Standby
Current
IDD2P
All device banks idle; Power-down
mode; tCK=tCK (MIN); CKE=(low)
90
90
90
rnA
mA
Idle Standby Current
IDD2F
CS# = High; All device banks idle;
tCK=tCK (MIN); CKE = high; Address
and other control inputs changing
once per clock cycle. VIN = VREF for
DQ, DQS and DM.
1120
1120
1120
Active Power-Down
Standby Current
IDD3P
IDD3N
One device bank active; Power-Down
mode; tCK (MIN); CKE=(low)
630
630
630
mA
mA
Active Standby
Current
CS# = High; CKE = High; One device
bank; Active-Precharge; tRC=tRAS
(MAX); tCK=tCK (MIN); DQ, DM and
DQS inputs changing twice per clock
cycle; Address and other control
inputs changing once per clock cycle.
1210
1210
1210
Operating Current
Operating Current
IDD4R
Burst = 2; Reads; Continuous burst;
One device bank active; Address
and control inputs changing once
per clock cycle; TCK= TCK (MIN); lOUT
= 0mA.
3245
3425
3245
3065
3245
3065
mA
rnA
IDD4W
Burst = 2; Writes; Continuous burst;
One device bank active; Address
and control inputs changing once per
clock cycle; tCK=tCK (MIN); DQ,DM
and DQS inputs changing once per
clock cycle.
Auto Refresh
Current
IDD5
tRC = tRC (MIN)
5530
5530
5530
mA
Self Refresh Current
Operating Current
IDD6
CKE 0.2V
400
400
400
mA
mA
IDD7A
Four bank interleaving Reads (BL=4)
with auto precharge with tRC=tRC
(MIN); tCK=tCK (MIN); Address and
control inputs change only during
Active Read or Write commands.
7565
7475
7475
November 2004
Rev. 3
6
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
DETAILED TEST CONDITIONS FOR DDR SDRAM IDD1 & IDD7A
IDD1 : OPERATING CURRENT : ONE BANK
IDD7A : OPERATING CURRENT : FOUR BANKS
1. Typical Case : VCC=2.5V, T=25°C
2. Worst Case : VCC=2.7V, T=10°C
1. Typical Case : VCC=2.5V, T=25°C
2. Worst Case : VCC=2.7V, T=10°C
3. Only one bank is accessed with tRC (min), Burst
Mode, Address and Control inputs on NOP edge
are changing once per clock cycle. IOUT = 0mA
3. Four banks are being interleaved with tRC (min),
Burst Mode, Address and Control inputs on NOP
edge are not changing. Iout=0mA
4. Timing Patterns :
4. Timing Patterns :
•
•
•
•
DDR200 (100 MHz, CL=2) : tCK=10ns, CL2,
BL=4, tRCD=2*tCK, tRAS=5*tCK
Read : A0 N R0 N N P0 N A0 N - repeat the
same timing with random address changing;
50% of data changing at every burst
•
DDR200 (100 MHz, CL=2) : tCK=10ns, CL2,
BL=4, tRRD=2*tCK, tRCD=3*tCK, Read with
Autoprecharge
Read : A0 N A1 R0 A2 R1 A3 R2 A0 R3 A1 R0
- repeat the same timing with random address
changing; 100% of data changing at every
burst
DDR266 (133MHz, CL=2.5) : tCK=7.5ns,
CL=2.5, BL=4, tRCD=3*tCK, tRC=9*tCK, tRAS=5*tCK
Read : A0 N N R0 N P0 N N N A0 N - repeat
the same timing with random address
•
DDR266 (133MHz, CL=2.5) : tCK=7.5ns,
CL=2.5, BL=4, tRRD=3*tCK, tRCD=3*tCK
Read with Autoprecharge
Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N
A1 R0 - repeat the same timing with random
address changing; 100% of data changing at
every burst
changing; 50% of data changing at every burst
DDR266 (133MHz, CL=2) : tCK=7.5ns, CL=2,
BL=4, tRCD=3*tCK, tRC=9*tCK, tRAS=5*tCK
Read : A0 N N R0 N P0 N N N A0 N - repeat
the same timing with random address
changing; 50% of data changing at every burst
•
•
DDR266 (133MHz, CL=2) : tCK=7.5ns, CL2=2,
BL=4, tRRD=2*tCK, tRCD=2*tCK
Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N
A1 R0 - repeat the same timing with random
address changing; 100% of data changing at
every burst
DDR333 (166MHz, CL=2.5) : tCK=6ns, BL=4,
tRCD=10*tCK, tRAS=7*tCK
Read : A0 N N R0 N P0 N N N A0 N - repeat
the same timing with random address
changing; 50% of data changing at every burst
DDR333 (166MHz, CL=2.5) : tCK=6ns,
BL=4, tRRD=3*tCK, tRCD=3*tCK, Read with
Autoprecharge
Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N
A1 R0 - repeat the same timing with random
address changing; 100% of data changing at
every burst
Legend:
A = Activate, R = Read, W = Write, P = Precharge, N = NOP
A (0-3) = Activate Bank 0-3
R (0-3) = Read Bank 0-3
November 2004
Rev. 3
7
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
DDR SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND
RECOMMENDED AC OPERATING CONDITIONS
0°C ≤ TA ≤ +70°C; VCC = +2.5V ±0.2V, VCCQ = +2.5V ±0.2V
AC Characteristics
335
262
263/265
Min Max
-0.75 +0.75 -0.75 +0.75 -0.75 +0.75
202
Parameter
Symbol Min
Max
+0.7
0.55
0.55
13
Min
Max
Min
Max
Units Notes
Access window of DQs from CK, CK#
CK high-level width
CK low-level width
tAC
tCH
-0.7
0.45
0.45
6
ns
0.45
0.45
7.5
0.55
0.55
13
0.45
0.45
7.5
0.55
0.55
13
0.45
0.45
7.5
0.55
0.55
13
tCK
tCK
ns
ns
ns
ns
ns
ns
tCK
tCK
ns
16
16
tCL
Clock cycle time
CL=2.5
CL=2
t
CK (2.5)
tCK (2)
tDH
22
7.5
13
7.5
13
7.5
13
22
DQ and DM input hold time relative to DQS
DQ and DM input setup time relative to DQS
DQ and DM input pulse width (for each input)
Access window of DQS from CK, CK#
DQS input high pulse width
0.45
0.45
1.75
-0.6
0.5
0.5
0.5
14,17
14,17
17
tDS
0.5
0.5
0.5
tDIPW
tDQSCK
tDQSH
tDQSL
tDQSQ
1.75
1.75
1.75
+0.6
-0.75 +0.75 -0.75 +0.75 -0.75 +0.75
0.35
0.35
0.35
0.35
0.35
0.35
0.35
0.35
DQS input low pulse width
DQS-DQ skew, DQS to last DQ valid, per group,
per access
0.45
1.25
0.5
0.5
0.5
13,14
Write command to first DQS latching transition
DQS falling edge to CK rising - setup time
DQS falling edge from CK rising - hold time
Half clock period
tDQSS
tDSS
tDSH
tHP
0.75
0.2
0.75
0.2
1.25
0.75
0.2
1.25
0.75
0.2
1.25
tCK
tCK
tCK
ns
0.2
0.2
0.2
0.2
tCH
,
tCH
,
tCH
,
tCH
,
18
tCL
tCL
tCL
tCL
Data-out high-impedance window from CK, CK#
Data-out low-impedance window from CK, CK#
Address and control input hold time (fast slew rate)
Address and control input set-up time (fast slew rate)
Address and control input hold time (slow slew rate)
Address and control input setup time (slow slew rate)
Address and control input pulse width (for each input)
LOAD MODE REGISTER command cycle time
tHZ
tLZ
+0.7
+0.75
+0.75
+0.75
ns
ns
ns
ns
ns
ns
ns
ns
ns
8,19
8,20
6
-0.7
0.75
0.75
0.8
-0.75
0.90
0.90
1
-0.75
0.90
0.90
1
-0.75
0.90
0.90
1
tIHf
tISf
6
tIHs
tISs
tIPW
tMRD
tQH
6
0.8
1
1
1
6
2.2
2.2
15
2.2
15
2.2
15
12
DQ-DQS hold, DQS to first DQ to go non-valid, per
access
tHP
-
tHP
-
tHP
-
tHP
-
13,14
15
tQHS
tQHS
tQHS
tQHS
Data hold skew factor
tQHS
tRAS
tRAP
tRC
0.55
0.75
0.75
0.75
ns
ACTIVE to PRECHARGE command
ACTIVE to READ with Auto precharge command
ACTIVE to ACTIVE/AUTO REFRESH command period
AUTO REFRESH command period
42
15
60
72
70,000
40 120,000 40 120,000 40 120,000 ns
15
60
75
15
60
75
15
60
75
ns
ns
ns
tRFC
21
November 2004
Rev. 3
8
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
DDR SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND
RECOMMENDED AC OPERATING CONDITIONS (continued)
0°C ≤ TA ≤ +70°C; VCC = +2.5V ±0.2V, VCCQ = +2.5V ±0.2V
AC Characteristics
335
262
263/265
202
Parameter
Symbol Min
Max
Min
15
Max
Min
Max
Min
15
Max
Units Notes
ACTIVE to READ or WRITE delay
PRECHARGE command period
DQS read preamble
tRCD
tRP
15
15
0.9
0.4
12
0.25
0
15
15
0.9
0.4
15
0.25
0
ns
ns
15
15
tRPRE
tRPST
tRRD
1.1
0.6
0.9
0.4
15
1.1
0.6
1.1
0.6
0.9
0.4
15
1.1
0.6
tCK
tCK
ns
tCK
ns
tCK
ns
tCK
ns
μs
μs
ns
ns
tCK
19
DQS read postamble
ACTIVE bank a to ACTIVE bank b command
DQS write preamble
tWPRE
tWPRES
tWPST
tWR
0.25
0
0.25
0
DQS write preamble setup time
DQS write postamble
10,11
9
0.4
15
1
0.6
0.4
15
0.6
0.4
15
1
0.6
0.4
15
0.6
Write recovery time
Internal WRITE to READ command delay
Data valid output window
tWTR
NA
1
1
tQH-tDQSQ
70.3
7.8
tQH-tDQSQ
70.3
7.8
tQH-tDQSQ
tQH-tDQSQ
70.3
7.8
13
12
12
REFRESH to REFRESH command interval
Average periodic refresh interval
Terminating voltage delay to VCC
Exit SELF REFRESH to non-READ command
Exit SELF REFRESH to READ command
tREFC
tREFI
tVTD
70.3
7.8
0
0
0
0
tXSNR
tXSRD
75
75
75
75
200
200
200
200
November 2004
Rev. 3
9
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
Notes
11. It is recommended that DQS be valid (HIGH or LOW) on or before
the WRITE command. The case shown (DQS going from High-Z to
logic LOW) applies when no WRITEs were previously in progress
on the bus. If a previous WRITE was in progress, DQS could be
1.
All voltages referenced to VSS
2.
Tests for AC timing, IDD, and electrical AC and DC characteristics
may be conducted at normal reference / supply voltage levels, but
the related specifications and device operations are guaranteed for
the full voltage range specified.
high during this time, depending on tDQSS
.
12. The refresh period is 64ms. This equates to an average refresh
rate of 7.8125μs. However, an AUTO REFRESH command must
be asserted at least once every 70.3μs; burst refreshing or posting
by the DRAM controller greater than eight refresh cycles is not
allowed.
3.
Outputs are measured with equivalent load:
V
TT
50Ω
RReeffeerreennccee
13. The valid data window is derived by achieving other specifications
- tHP (tCK/2), tDQSQ, and tQH (tQH = tHP - tQHS). The data valid
window derates directly proportional with the clock duty cycle
and a practical data valid window can be derived. The clock is
allowed a maximum duty cycled variation of 45/55. Functionality
is uncertain when operating beyond a 45/55 ratio. The data valid
window derating curves are provided below for duty cycles ranging
between 50/50 and 45/55.
Outtppuut
Poiint
(VOUT
)
30pF
4.
AC timing and IDD tests may use a VIL-to-VIH swing of up to 1.5V
in the test environment, but input timing is still referenced to VREF
(or to the crossing point for CK/CK#), and parameter specifications
are guaranteed for the specified AC input levels under normal use
conditions. The minimum slew rate for the input signals used to
test the device is 1V/ns in the range between VIL(AC) and VIH(AC).
14. Referenced to each output group: x4 = DQS with DQ0-DQ3.
15. READs and WRITEs with auto precharge are not allowed to be
issued until tRAS (MIN) can be satisfied prior to the internal precharge
command being issued.
5.
6.
The AC and DC input level specifications are defined in the SSTL_
2 standard (i.e., the receiver will effectively switch as a result of the
signal crossing the AC input level, and will remain in that state as
long as the signal does not ring back above [below] the DC input
LOW [high] level).
16. JEDEC specifies CK and CK# input slew rate must be > 1V/ns
(2V/ns differentially).
17. DQ and DM input slew rates must not deviate from DQS by more
than 10%. If the DQ/DM/DQS slew rate is less than 0.5V/ns,
timing must be derated: 50ps must be added to tDS and tDH for
each 100mV/ns reduction in slew rate. If slew rates exceed 4V/ns,
functionality is uncertain.
For slew rates less than 1V/ns and greater than or equal to 0.5V/
ns. If the slew rate is less than 0.5V/ns, timing must be derated: tIS
has an additional 50ps per each 100mV/ns reduction in slew rate
from the 500mV/ns. tIH has 0ps added, that is, it remains constant.
If the slew rate exceeds 4.5V/ns, functionality is uncertain. For
335, slew rates must be greater than or equal to 0.5V/ns.
18.
tHP min is the lesser of tCL min and tCH min actually applied to the
device CK and CK# inputs, collectively during bank active.
19.
t
HZ (MAX) will prevail over the tDQSCK (MAX) + tRPST (MAX)
7.
8.
Inputs are not recognized as valid until VREF stabilizes. Exception:
during the period before VREF stabilizes, CKE 0.3 x VCCQ is
recognized as LOW.
condition. tLZ (MIN) will prevail over tDQSCK (MIN) + PRE (MAX)
condition.
20. For slew rates greater than 1V/ns the (LZ) transition will start about
310ps earlier.
tHZ and tLZ transitions occur in the same access time windows as
valid data transitions. These parameters are not referenced to a
specific voltage level, but specify when the device output is no
longer driving (HZ) and begins driving (LZ).
21. CKE must be active (High) during the entire time a refresh
command is executed. That is, from the time the AUTO REFRESH
command is registered, CKE must be active at each rising clock
edge, until tRFC has been satisfied.
9.
The intent of the “Don’t Care” state after completion of the
postamble is the DQS-driven signal should either be HIGH, LOW,
or high-Z, and that any signal transition within the input switching
region must follow valid input requirements. That is, if DQS
transitions HIGH (above VIHDC (MIN) then it must not transition
LOW (below VIHDC) prior to tDQSH (MIN).
22. Whenever the operating frequency is altered, not including jitter,
the DLL is required to be reset. This is followed by 200 clock cycles
(before READ commands).
10. This is not a device limit. The device will operate with a negative
value, but system performance could be degraded due to bus
turnaround.
November 2004
Rev. 3
10
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
ORDERING INFORMATION FOR JD3
Part Number
Speed
CAS Latency
tRCD
3
tRP
3
Height*
W3EG72126S335JD3
W3EG72126S262JD3
W3EG72126S263JD3
W3EG72126S265JD3
W3EG72126S202JD3
166MHz/333Mb/s
133MHz/266Mb/s
133MHz/266Mb/s
133MHz/266Mb/s
100MHz/200Mb/s
2.5
2
30.48 (1.20")
30.48 (1.20")
30.48 (1.20")
30.48 (1.20")
30.48 (1.20")
2
2
2
3
3
2.5
2
3
3
2
2
Note: Consult factory for availability of lead-free products. (F = Lead-Free, G = RoHS compliant)
Vendor Code: M = Micron, S = Samsung
PACKAGE DIMENSIONS FOR JD3
133.48
(5.255" MAX.)
131.34
(5.171")
3.81
(0.150 MAX)
128.95
(5.077")
3.99
(0.157 (2x))
3.99
(0.157)
(MIN)
30.48
(1.20 MAX)
17.78
(0.700)
2.31
(0.091)
(2x)
1.27
(0.050 TYP.)
10.01
(0.394)
6.35
(0.250)
49.53
(1.950)
64.77
(2.550)
1.27 0.10
(0.050 0.004)
3.00
(0.118)
(4x)
6.35
(0.250)
1.78
(0.070)
* ALL DIMENSIONS ARE IN MILLIMETERS AND (INCHES)
November 2004
Rev. 3
11
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
ORDERING INFORMATION FOR AJD3
Part Number
Speed
CAS Latency
tRCD
3
tRP
3
Height*
W3EG72126S335AJD3
W3EG72126S262AJD3
W3EG72126S263AJD3
W3EG72126S265AJD3
W3EG72126S202AJD3
166MHz/333Mb/s
133MHz/266Mb/s
133MHz/266Mb/s
133MHz/266Mb/s
100MHz/200Mb/s
2.5
2
28.70 (1.13")
28.70 (1.13")
28.70 (1.13")
28.70 (1.13")
28.70 (1.13")
2
2
2
3
3
2.5
2
3
3
2
2
Note: Consult factory for availability of lead-free products. (F = Lead-Free, G = RoHS compliant)
Vendor Code: M = Micron, S = Samsung
PACKAGE DIMENSIONS FOR AJD3
133.48
(5.255" MAX.)
131.34
(5.171")
3.81
(0.150 MAX)
128.95
(5.077")
3.99
(0.157 (2x))
3.99
(0.157)
(MIN)
28.70
(1.13 MAX)
17.78
(0.700)
2.31
(0.091)
(2x)
1.27
(0.050 TYP.)
10.01
(0.394)
6.35
(0.250)
49.53
(1.950)
64.77
(2.550)
1.27 0.10
(0.050 0.004)
3.00
(0.118)
(4x)
6.35
(0.250)
1.78
(0.070)
* ALL DIMENSIONS ARE IN MILLIMETERS AND (INCHES)
November 2004
Rev. 3
12
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
ORDERING INFORMATION FOR D3
Part Number
Speed
CAS Latency
tRCD
3
tRP
3
Height*
W3EG72126S335D3
W3EG72126S262D3
W3EG72126S263D3
W3EG72126S265D3
W3EG72126S202D3
166MHz/333Mb/s
133MHz/266Mb/s
133MHz/266Mb/s
133MHz/266Mb/s
100MHz/200Mb/s
2.5
2
28.58 (1.125")
28.58 (1.125")
28.58 (1.125")
28.58 (1.125")
28.58 (1.125")
2
2
2
3
3
2.5
2
3
3
2
2
Note: Consult factory for availability of lead-free products. (F = Lead-Free, G = RoHS compliant)
Vendor Code: M = Micron, S = Samsung
PACKAGE DIMENSIONS FOR D3
Not recommended for new designs
133.48
(5.255" MAX.)
131.34
(5.171")
3.81
(0.150 MAX)
128.95
(5.077")
3.99
(0.157 (2x))
3.99
(0.157)
(MIN)
28.58
(1.125 MAX)
17.78
(0.700)
2.31
(0.091)
(2x)
1.27
(0.050 TYP.)
10.01
(0.394)
6.35
(0.250)
49.53
(1.950)
64.77
(2.550)
1.27 0.10
(0.050 0.004)
3.00
(0.118)
(4x)
6.35
(0.250)
1.78
(0.070)
* ALL DIMENSIONS ARE IN MILLIMETERS AND (INCHES)
November 2004
Rev. 3
13
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
PART NUMBERING GUIDE
W 3 E G 72 126M S xxx D3 x F/G
WEDC
SDRAM
DDR
GOLD
BUS WIDTH
DEPTH:
256 = 256Mb
2.5V
SPEED (MHz):
166, 133, 100MHZ
PACKAGE:
JD3, AJD3
COMPONENT VENDOR:
M = Micron, S = Samsung
F = LEAD-FREE,
G = RoHS COMPLIANT
November 2004
Rev. 3
14
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
W3EG72126S-D3
-JD3
White Electronic
-AJD3
PRELIMINARY
Document Title
1GB - 128Mx72, DDR SDRAM Registered Module
Revision History
Rev #
History
Release Date Status
Rev 0
Rev 1
Rev 2
Initial Release
3-18-02
1-30-03
Advanced
Advanced
Preliminary
Added 333MHz Speed
—
Corrected Incidentals (abbreviations, / &
to #, symbols, etc.) 3-3-04
2.1 Corrected pages 1, 2, 4, 5, 6, 8, 9, 10
2.2 Corrected page 7 : Spec Items and Test Conditions
2.3 Added JD3 and AJD3 package options
2.4 Added "Not recommended for New Designs" to D3
2.5 Added document title page
2.6 Removed "ED" for Part Marking
Rev 3
3.1 Added Lead-Free and RoHS note
November 2004
Preliminary
3.2 Added vendor code options
M = Micron
S = Samsung
November 2004
Rev. 3
15
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
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