5962-8756001XA [MICROSS]
TTL to ECL Translator, 4 Func, Complementary Output, CDFP16, CERAMIC, DFP-16;
| 型号： | 5962-8756001XA |
| 厂家： | 
MICROSS COMPONENTS |
| 描述： | TTL to ECL Translator, 4 Func, Complementary Output, CDFP16, CERAMIC, DFP-16 CD 接口集成电路 锁存器 |
| 文件： | 总16页 (文件大小：116K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
B
C
D
E
Made technical changes in Table I. Editorial changes throughout. mlp
Changes in accordance with NOR 5962-R268-92. tvn
Add package CDFP4-F16. Use new boilerplate. ljs
92-01-27
92-08-04
98-02-04
98-08-12
98-10-20
Monica L. Poelking
Monica L. Poelking
Raymond Monnin
Raymond Monnin
Raymond Monnin
Figure 4 modified to be consistent with Table I. ljs
Add VCC positive supply voltage specifications to para. 1.3 and 1.4. ljs
The original first page of this drawing has been replaced.
REV
SHEET
REV
E
SHEET
15
REV STATUS
OF SHEETS
REV
E
1
E
2
E
3
E
4
E
5
E
6
E
7
E
8
E
9
E
E
E
E
E
SHEET
10
11
12
13
14
PMIC N/A
PREPARED BY
David Queenan
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
CHECKED BY
D. A. Dicenzo
STANDARD
MICROCIRCUIT
DRAWING
APPROVED BY
Robert P. Evans
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
MICROCIRCUIT, DIGITAL, TTL-TO-ECL
TRANSLATOR, MONOLITHIC SILICON
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
87-11-24
AMSC N/A
REVISION LEVEL
E
SIZE
A
CAGE CODE
5962-87560
67268
SHEET
1
OF
15
DSCC FORM 2233
APR 97
5962-E019-99
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1. SCOPE
1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in
accordance with MIL-PRF-38535, appendix A.
1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:
5962-87560
01
E
X
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
Drawing number
Device type
(see 1.2.1)
Case outline
(see 1.2.2)
Lead finish
(see 1.2.3)
1.2.1 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
Generic number
10H524
Circuit function
Quad TTL-to-ECL translator
1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
Package style
E
F
X
2
GDIP1-T16 or CDIP2-T16
GDFP2-F16 or CDFP3-F16
CDFP4-F16
16
16
16
20
Dual -in-line
Flat package
Flat-package
CQCC1-N20
Square chip carrier
1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.
1.3 Absolute maximum ratings.
Positive supply voltage range (VCC) .....................................................
Negative supply voltage range (VEE)....................................................
Total supply voltage range (VCC + | VEE |) ............................................
Input voltage range.................................................................................
Storage temperature range....................................................................
Lead temperature (soldering, 10 seconds)............................................
Junction temperature (TJ) ....................................................................
Maximum power dissipation (PD) .........................................................
Thermal resistance, junction-to-case (QJC)...........................................
0.0 V dc to 7.0 V dc
-8.0 V dc to 0.0 V dc
12 V dc
-5.2 V dc to 0.0 V dc
-65EC to +165EC
+300EC
+165EC
530 mW
See MIL-STD-1835
1.4 Recommended operating conditions.
Positive supply voltage range (VCC) .....................................................
Negative supply voltage range (VEE)....................................................
Case operating temperature range (TC)...............................................
Minimum high level input voltage (VIH):
4.5 V dc minimum to 5.5 V dc maximum
-5.46 V dc minimum to -4.94 V dc maximum
-55EC to +125EC
TA = +25EC.......................................................................................
TA = +125EC.....................................................................................
TA = -55EC........................................................................................
Maximum low level input voltage (VIL)..................................................
-0.780 V dc
-0.650 V dc
-0.840 V dc
-1.950 V dc
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
2
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the
issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883
MIL-STD-973
-
-
Test Method Standard Microcircuits.
Configuration Management.
MIL-STD-1835 - Interface Standard For Microcircuit Case Outlines.
HANDBOOKS
DEPARTMENT OF DEFENSE
MIL-HDBK-103 - List of Standard Microcircuit Drawings (SMD's).
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific
exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN
class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing
(QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535
may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval
in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make
modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These
modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MIL-PRF-38535 is
required to identify when the QML flow option is used.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-PRF-38535, appendix A and herein.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Truth table. The truth table shall be as specified on figure 2.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
3
DSCC FORM 2234
APR 97
3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3.
3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as
specified in table I and shall apply over the full case operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests
for each subgroup are described in table I.
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in
1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For packages
where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not
marking the "5962-" on the device.
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing
as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535, appendix A
and the requirements herein.
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with
each lot of microcircuits delivered to this drawing.
3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535, appendix
A.
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method
1015 of MIL-STD-883.
(2) TA = +125EC, minimum.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of
MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Conditions
-55°C # TC #+125°C
unless otherwise specified
Group A
subgroups
Limits
Unit
Test
Symbol
Min
Max
Cases E, F, 2 and X
Quiescent tests 1/
VR
VF
0.4
High level output voltage
VOH
Outputs terminated
2.4
2.4
2.4
1
2
3
-1.010
-0.860
-1.060
-0.780
-0.650
-0.840
V
V
0.4
0.4
through 100W
to -2 V
Low level output voltage
VOL
VCC = +5.0 V
VEE = -5.2 V
GND = 0.0 V 2/
2.4
2.4
2.4
VIHT
2.0
2.0
2.0
2.0
2.0
2.0
0.4
0.4
0.4
VILT
0.8
0.8
0.8
0.8
0.8
0.8
1
2
3
-1.950
-1.950
-1.950
-1.580
-1.565
-1.610
High level threshold
output voltage
VOHA
VOLA
VD
1
-1.010
-0.860
-1.060
-1.950
-1.950
-1.950
-0.780
-0.650
-0.840
-1.580
-1.565
-1.610
-1.5
V
V
V
2
3
Low level threshold
output voltage
1
2
3
Input clamping voltage
GND = 0.0 V
ID = -10 mA
VCC = +5.0 V
VEE = -5.46 V
GND = 0.0 V
ID = -20 mA
VCC = +5.0 V
VEE = -5.46 V
BVIN = 5.5 V
VEE = -5.46 V
VCC = +5.0 V
GND = 0.0 V
VCC = +5.0 V
VF = 0.4 V
AIN, BIN, CIN DIN
1, 2, 3
Strobe
1, 2, 3
1, 2, 3
1, 2, 3
-1.5
1.0
V
Input breakdown current
IIN
mA
mA
Forward bias input
current
IINF
AIN, BIN, CIN DIN
-3.2
VEE = -4.94 V
GND = 0.0 V
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Conditions
-55°C # TC #+125°C
unless otherwise specified
Group A
subgroups
Limits
Unit
mA
Test
Symbol
Min
Max
Cases E, F, 2 and X
Quiescent tests - continued1/
Forward bias input
current
IINF
VCC = +5.0 V
Strobe
1, 2, 3
1, 2, 3
1, 2, 3
-12.8
VR = 2.4 V
VEE = -4.94 V
GND = 0.0 V
VCC = +5.0 V
VR = 2.4 V
Reverse bias input
current
IR
AIN, BIN, CIN, DIN
50
mA
mA
VEE = -5.46 V
GND = 0.0 V
VCC = +5.0 V
VF = 0.4 V
Strobe
200
VEE = -5.46 V
GND = 0.0 V
VEE = -5.46 V
VCC = +5.0 V
GND = 0.0 V
All inputs = 2.4 V
VCC = +5.0 V
VEE = -5.46 V
GND = 0.0 V
Strobe = 0.4 V
VCC = +5.0 V
VEE = -5.46 V
GND = 0.0 V
Supply current negative
Supply current high
IEE 4/
2,3
1
-72
mA
mA
-66
ICCH
1, 3
2
16
18
25
25
mA
mA
mA
mA
Supply current low
ICCL
1, 3
2
Functional tests
See 4.3.1c
7
Cases E, F and X
DC rapid tests 3/
VR
VF
0.4
0.4
0.4
High level output voltage
Low level output voltage
VOH
Outputs terminated
2.4
2.4
2.4
1
2
3
-1.028
-0.879
-1.079
-0.800
-0.671
-0.861
V
V
through
100W to -2 V
VCC = +5.0 V
VEE = -5.2 V
GND = 0.0 V 2/
VOL
2.4
2.4
2.4
0.4
0.4
0.4
1
2
3
-1.950
-1.950
-1.950
-1.586
-1.571
-1.616
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Conditions
-55°C # TC #+125°C
unless otherwise specified
Group A
subgroups
Limits
Unit
Test
Symbol
Min
Max
Cases E, F and X
DC rapid tests - continued 3/
VIHT
VILT
0.8
0.8
0.8
High level threshold
output voltage
VOHA
VOLA
VD
Outputs terminated
through
2.0
2.0
2.0
1
2
3
-1.028
-0.879
-1.079
-0.800
-0.671
-0.861
V
V
V
100W to -2 V
VCC = +5.0 V
VEE = -5.2 V
GND = 0.0 V 2/
VCC = +5.0 V
ID = -10 mA
Low level threshold
output voltage
2.0
2.0
2.0
0.8
0.8
0.8
1
-1.950
-1.950
-1.950
-1.586
-1.571
-1.616
-1.5
2
3
Input clamping voltage
AIN, BIN, CIN DIN
1, 2, 3
VEE = -5.46 V
GND = 0.0 V
VCC = +5.0 V
ID = -20 mA
Strobe
1, 2, 3
-1.5
V
VEE = -5.46 V
GND = 0.0 V
Input breakdown current
IIN
BVIN = 5.5 V
VEE = -5.46 V
VCC = +5.0 V
VF = 0.4 V
VCC = +5.0 V
GND = 0.0 V
AIN, BIN, CIN DIN
1, 2, 3
1, 2, 3
1.0
mA
mA
Forward bias input
current
IINF
-3.2
VEE = -4.94 V
GND = 0.0 V
VCC = +5.0 V
VR = 2.4 V
Strobe
1, 2, 3
1, 2, 3
1, 2, 3
-12.8
50
mA
mA
mA
VEE = -4.94 V
GND = 0.0 V
VCC = +5.0 V
VR = 2.4 V
Reverse bias input
current
IR
AIN, BIN, CIN DIN
VEE = -5.46 V
GND = 0.0 V
VCC = +5.0 V
VF = 0.4 V
Strobe
200
VEE = -5.46 V
GND = 0.0 V
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
7
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics - Continued.
Conditions
-55°C # TC #+125°C
unless otherwise specified
Group A
subgroups
Limits
Unit
Test
Symbol
Min
Max
Cases E, F and X
DC rapid tests - Continued 3/
Supply current negative
IEE
VEE = -5.46 V
2, 3
1
-71
mA
mA
4/
VCC = +5.0 V
GND = 0.0 V
VCC = +5.0 V
All inputs = 2.4 V
VEE = -5.46 V
GND = 0.0 V
VCC = +5.0 V
Strobe = 0.4 V
VEE = -5.46 V
GND = 0.0 V
See 4.3.1c
-65
Supply current high
Supply current low
ICCH
1, 3
2
16
18
25
25
mA
mA
mA
mA
ICCH
1, 3
2
Functional tests
Case 2
7
DC rapid tests 3/
VR
2.4
2.4
2.4
VF
0.4
0.4
0.4
High level output voltage
Low level output voltage
VOH
Outputs terminated
through 100W
to -2 V.
1
2
3
-1.034
-0.886
-1.086
-0.806
-0.678
-0.868
V
V
VOL
VCC = +5.0 V
VEE = -5.2 V
2.4
2.4
2.4
VIHT
2.0
2.0
2.0
2.0
2.0
2.0
0.4
0.4
0.4
VILT
0.8
0.8
0.8
0.8
0.8
0.8
1
2
3
-1.950
-1.950
-1.950
-1.588
-1.574
-1.619
GND = 0.0 V 2/
High level threshold
output voltage
VOHA
1
2
3
1
2
3
-1.034
-0.886
-1.086
-1.950
-1.950
-1.950
-0.806
-0.678
-0.868
-1.588
-1.574
-1.619
V
V
Low level threshold
output voltage
VOLA
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
8
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics - Continued.
Conditions
-55°C # TC #+125°C
unless otherwise specified
Group A
subgroups
Limits
Unit
Test
Symbol
Min
Max
-1.5
-1.5
1.0
Case 2
Input clamping voltage
DC rapid tests - Continued 3/
VD
VCC = +5.0 V
AIN, BIN, CIN DIN
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
V
V
ID = -10 mA
VEE = -5.46 V
GND = 0.0 V
VCC = +5.0 V
ID = -20 mA
VEE = -5.46 V
GND = 0.0 V
BVIN = 5.5 V
VEE = -5.46 V
VCC = +5.0 V
GND = 0.0 V
VCC = +5.0 V
VF = 0.4 V
Strobe
Input breakdown current
IIN
mA
mA
Forward bias input
current
IINF
AIN, BIN, CIN DIN
-3.2
-12.8
50
VEE = -4.94 V
GND = 0.0 V
VCC = +5.0 V
VR = 2.4 V
Strobe
mA
VEE = -4.94 V
GND = 0.0 V
VCC = +5.0 V
VR = 2.4 V
mA
Reverse bias input
current
IR
AIN, BIN, CIN DIN
VEE = -5.46 V
GND = 0.0 V
VCC = +5.0 V
VR = 0.4 V
mA
Strobe
200
VEE = -5.46 V
GND = 0.0 V
VEE = -5.46 V
VCC = +5.0 V
GND = 0.0 V
Supply current negative
IEE
2, 3
1
-71
-65
mA
mA
4/
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
9
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics - Continued.
Conditions
-55°C # TC #+125°C
unless otherwise specified
Group A
subgroups
Limits
Unit
Test
Symbol
Min
Max
16
Case 2
DC Rapid tests - continued 3/
VCC = +5.0 V
Supply current high
ICCH
1, 3
2
mA
mA
mA
mA
All inputs = 2.4 V
VEE = -5.46 V
GND = 0.0 V
VCC = +5.0 V
Strobe = 0.4 V
VEE = -5.46 V
GND = 0.0 V
See 4.3.1c
18
Supply current low
ICCL
1, 3
2
25
25
Functional tests
Cases E, F, X and 2
Transition time
7
AC tests
tTLH
tTHL
VEE = -2.94 V
VCC = +7.0 V
9
0.45
0.5
2.0
2.5
1.8
ns
ns
ns
10
11
0.4
CL £ 5 pF
Propagation delay time,
A, B, C, or D input to
A, B, C, or D output
tPHH1
tPLL1
tPHL1
tPLH1
Load all outputs
through 100W to ground.
GND = +2.0 V
See figure 4
9
0.55
0.50
0.50
2.4
3.5
2.1
ns
ns
ns
10
11
Propagation delay time,
strobe to output
tPHH2
tPLL2
tPHL2
tPLH2
9
0.55
0.85
0.55
2.5
3.6
2.0
ns
ns
ns
10
11
Functional tests
See 4.3.1c
7
1/
The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading
taken with the device in a socket with > 500 LFPM of +25° C, +125° C or -55° C (as applicable) air blowing on the
unit in a transverse direction with power applied for at least 4 minutes before the reading is taken. This method was
used for theoretical limit establishment only. All devices shall be tested to the delta V (rapid test) conditions
specified herein. The rapid test method is an equivalent method of testing quiescent conditions.
2/
The high and low level output current varies with temperature and shall be calculated using the following formulas:
IOH = (-2 V - VOH)/100W and IOL = (-2 V - VOL)/100W.
3/
4/
The dc rapid test forcing functions and limits are used for all dc testing. These limits are determined for each
device type based on the power dissipation and package type. The rapid test (delta V) limits and forcing functions
are skewed allowing rapid testing to be performed at standard temperatures without the addition of delta T’s.
IEE limits, although specified in the Min column, shall not be exceeded in magnitude, as a maximum value.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
10
DSCC FORM 2234
APR 97
Case outlines
Terminal number
1
E
F, X
2
Terminal symbol
BOUT
AOUT
BOUT
NC
D OUT
DOUT
COUT
2
3
BOUT
AOUT
4
5
GND
BOUT
AOUT
BOUT
A OUT
AIN
BOUT
A OUT
NC
6
7
STROBE
BIN
AIN
8
VEE
STROBE
A OUT
AIN
9
VCC
CIN
DIN
BIN
VEE
NC
VCC
10
11
12
STROBE
BIN
VEE
C OUT
13
VCC
CIN
DIN
D OUT
DOUT
COUT
14
15
CIN
DIN
C OUT
NC
16
17
GND
- - -
C OUT
- - -
D OUT
DOUT
COUT
GND
18
19
20
- - -
- - -
- - -
- - -
- - -
- - -
NC = No connection
FIGURE 1. Terminal connections.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
11
DSCC FORM 2234
APR 97
Strobe
Input
OUT
OUT
L
H
H
X
L
H
L
L
H
H
H
L
H = High level
Low level
X = Irrelevant
L
=
FIGURE 2. Truth table.
FIGURE 3. Logic diagram.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
12
DSCC FORM 2234
APR 97
NOTES:
1
50 W to ground located in each scope channel input.
2. All input and output cables to the scope are equal lengths of 50 W coaxial cable.
3. CL (test jig) £ 5 pF.
4. Unused outputs connected to 100 W resistor to ground.
5. Pulse generator characteristics:
PRR = 1 MHz, tr and tf = 2.0 ns ± 0.2 ns (20% to 80%), duty cycle = 50%.
FIGURE 4. Test circuit and switching waveforms.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
13
DSCC FORM 2234
APR 97
TABLE II. Electrical test requirements.
MIL-STD-883 test requirements
Subgroups
(in accordance with
MIL-STD-883, method 5005,
table I)
Interim electrical parameters
(method 5004)
1
Final electrical test parameters
(method 5004)
1*, 2, 3, 7*,9
Group A test requirements
(method 5005)
1, 2, 3, 7,
9, 10, 11
Groups C and D end-point
electrical parameters
(method 5005)
1, 2, 3
* PDA applies to subgroup 1 and 7.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, 6, 8A and 8B in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 7 shall include verification of the truth table specified on figure 2 herein.
4.3.2 Groups C and D inspections.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control and
shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of
MIL-STD-883.
(2) TA = +125EC, minimum.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
14
DSCC FORM 2234
APR 97
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared
specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the
individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692,
Engineering Change Proposal.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should
contact DSCC-VA, telephone (614) 692-0525.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone
(614) 692-0674.
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-
103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by
DSCC-VA.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-87560
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
E
SHEET
15
DSCC FORM 2234
APR 97
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 98-10-20
Approved sources of supply for SMD 5962-87560 are listed below for immediate acquisition information only and shall be
added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to
include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of
compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next dated revision of
MIL-HDBK-103 and QML-38535.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-8756001EA
5962-8756001FA
5962-87560012A
5962-8756001XA
0EU86
3/
AS10H524C16/883C
10H524/BFAJC
0EU86
0EU86
AS10H524EC20/883C
AS10H524F16/883C
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
3/ No longer available from the approved source of supply
Vendor CAGE
Vendor name
and address
number
0EU86
Austin Semiconductor Inc.
8701 Cross Park Dr.
Austin, TX 78754-4566
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
相关型号：
©2020 ICPDF网 联系我们和版权申明