SAV-541-D+ [MINI]

E-PHEMT Die;
SAV-541-D+
型号: SAV-541-D+
厂家: MINI-CIRCUITS    MINI-CIRCUITS
描述:

E-PHEMT Die

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Ultra Low Noise, Medium Current  
E-PHEMT Die  
SAV-541-D+  
50Ω  
0.45 to 6 GHz  
Product Features  
• Low Noise Figure, 0.4 dB  
• Gain, 17 dB at 2 GHz  
• High Output IP3, +33 dBm  
• Output Power at 1dB comp., +21 dBm  
• High Current, 15 to 60mA  
• Wide bandwidth  
• External biasing and matching required  
+RoHS Compliant  
The +Suffix identifies RoHS Compliance. See our web site  
for RoHS Compliance methodologies and qualifications  
Typical Applications  
• Cellular  
Ordering Information: Refer to Last Page  
• ISM  
• GSM  
• WCDMA  
• WiMax  
• WLAN  
• UNII and HIPERLAN  
General Description  
SAV-541-D+ is an ultra-low noise, high IP3 transistor die, manufactured using E-PHEMT* technology  
enabling it to work with a single positive supply voltage. It has outstanding Noise Figure, particularly  
below 2.5 GHz, and when combining this noise figure with high IP3 performance in a single device it  
makes it an ideal amplifier for demanding base station applications.  
Simplified Schematic and Pad description  
DRAIN  
GATE  
SOURCE  
Pad  
Source  
Gate  
Description  
Ground  
RF-IN  
Drain  
RF-OUT  
* Enhancement mode Pseudomorphic High Electron Mobility Transistor.  
REV. OR  
M155842  
SAV-541-D+  
RS/CP  
160407  
Page 1 of 5  
®
Mini-Circuits  
www.minicircuits.com P.O. Box 350166, Brooklyn, NY 11235-0003 (718) 934-4500 sales@minicircuits.com  
SAV-541-D+  
E-PHEMT Die  
DC Electrical Specifications1 at TAMB=25°C, Frequency 0.45 to 6 GHz  
Symbol  
Parameter  
Condition  
Typical  
Units  
IDSS  
VGS  
VTH  
IDSS  
Drain Current  
15  
30  
60  
mA  
V
Operational Gate Voltage  
Threshold Voltage  
VDS=3V, at respective IDS  
VDS=3V, IDS=4 mA  
0.34  
0.26  
1.0  
0.39  
0.26  
1.0  
0.48  
0.26  
1.0  
V
Saturated Drain Current  
VDS=3V, VGS=0 V  
µA  
VDS=3V, Gm=IDS/VGS  
VGS=VGS1-VGS2  
VGS1=VGS at respective IDS  
VGS2=VGS1+0.05V  
GM  
Transconductance  
251  
327  
392  
mS  
RF Electrical Specifications2  
VDS=3V  
VDS=4V,  
IDS=15mA IDS=30mA IDS=60mA IDS=15mA IDS=30mA IDS=60mA  
Symbol  
Parameter  
Condition (GHz)  
Typ.  
Typ.  
Typ.  
Typ.  
Typ.  
Typ.  
Units  
NF2  
0.9  
2.0  
3.9  
5.8  
0.9  
2.0  
3.9  
5.8  
0.9  
2.0  
3.9  
5.8  
0.9  
2.0  
3.9  
5.8  
0.34  
0.46  
0.66  
1.50  
22.0  
17.1  
11.7  
8.4  
0.28  
0.35  
0.62  
1.18  
22.4  
17.1  
12.0  
7.6  
0.25  
0.33  
0.53  
1.40  
24.7  
19.0  
13.4  
10.0  
32.1  
32.9  
32.6  
33.8  
18.5  
19.0  
18.1  
18.9  
0.35  
0.5  
0.27  
0.34  
0.52  
1.29  
23.7  
18.3  
12.8  
9.4  
0.25  
0.38  
0.53  
1.36  
24.7  
19.1  
13.5  
10.1  
32.3  
33.1  
35.7  
35.8  
20.6  
21.0  
20.4  
20.8  
Noise Figure  
dB  
0.63  
1.47  
22.0  
17.1  
11.8  
8.4  
Gain  
OIP3  
Gain  
dB  
22.7  
21.7  
23.9  
22.0  
16.9  
18.5  
17.8  
19.6  
27.7  
27.4  
30.2  
28.3  
17.3  
18.1  
17.7  
18.8  
23.0  
22.1  
24.4  
22.5  
20.0  
21.4  
20.2  
22.3  
27.8  
27.7  
30.0  
28.3  
18.5  
20.3  
20.0  
20.8  
Output IP3  
dBm  
dBm  
Power output at 1 dB  
Compression  
P1dB3  
1. Measured on industry standard SOT-343 (SC-70) package.  
2. Measured on die using GSG (Ground-Signal-Ground) probe. See figure 1.  
3. Drain current was allowed to increase during compression measurements.  
Absolute Maximum Ratings4  
Max.  
Units  
V
V
Symbol  
Parameter  
5
VDS  
Drain-Source Voltage  
Gate-Source Voltage  
Gate-Drain Voltage  
Drain Current  
5
-5 to 0.7  
-5 to 0.7  
120  
5
VGS  
5
VGD  
V
5
IDS  
mA  
mA  
mW  
dBm  
°C  
IGS  
Gate Current  
2
PDISS  
Total Dissipated Power  
RF Input Power  
360  
6
PIN  
17  
TCH  
TOP  
ΘJC  
Channel Temperature  
Operating Temperature  
Thermal Resistance  
150  
-40 to 85  
160  
°C  
°C/W  
4. Operation of this device above any one of these parameters may cause permanent damage.  
5. Assumes DC quiescent conditions.  
6. IGS is limited to 2 mA during test.  
®
Mini-Circuits  
www.minicircuits.com P.O. Box 350166, Brooklyn, NY 11235-0003 (718) 934-4500 sales@minicircuits.com  
Page 2 of 5  
SAV-541-D+  
E-PHEMT Die  
Characterization Test Circuit  
Source  
Source  
Drain  
Gate  
Source  
Source  
RF Reference Plane  
Fig 1. Block Diagram of Test Circuit used.  
Gain, Return loss, Output Power at 1dB compression (P1dB), Output IP3 (OIP3) and Noise figure measured using Agilent’s  
N5242A PNA-X Microwave network analyzer.  
Conditions:  
1. Drain voltage (with reference to source, VDS)=3 or 4V as shown.  
2. Gain voltage (with reference to source, VGS) is set to obtain desired Drain-Source current (IDS) as shown.  
3. Gain:Pin=-25 dBm  
4. Output IP3 (OIP3)= two tones spaced 1 MHz apart. 0 dBm/tone at output.  
5. No external matching components used.  
Die Layout  
Bonding Pad Position  
(Dimensions in µm, Typical)  
Fig 2. Die Layout  
Fig 3. Bonding Pad Positions  
Critical Dimensions  
Parameter  
Values  
100  
Die Thickness, µm  
Die Width, µm  
400  
Die Length, µm  
400  
Bond Pad Size, µm  
75 x 75  
®
Mini-Circuits  
www.minicircuits.com P.O. Box 350166, Brooklyn, NY 11235-0003 (718) 934-4500 sales@minicircuits.com  
Page 3 of 5  
SAV-541-D+  
E-PHEMT Die  
Assembly and Handling Procedure  
1. Storage  
Dice should be stored in a dry nitrogen purged desiccators or equivalent.  
2. ESD  
MMIC EPHEMPT amplifier dice are susceptible to electrostatic and mechanical damage. Die are supplied in  
antistatic protected material, which should be opened in clean room conditions at an appropriately grounded anti-static worksta  
tion. Devices need careful handling using correctly designed collets, vacuum pickup tips or sharp antistatic tweezers to deter  
ESD damage to dice.  
3. Die Attach  
The die mounting surface must be clean and flat. Using conductive silver filled epoxy, recommended epoxies are DieMat  
DM6030HK-PT/H579 or Ablestik 84-1LMISR4. Apply sufficient epoxy to meet required epoxy bond line thickness, epoxy fillet  
height and epoxy coverage around total die periphery. Parts shall be cured in a nitrogen filled atmosphere per manufacturer’s  
cure condition. It is recommended to use antistatic die pick up tools only.  
4. Wire Bonding  
Bond pad openings in the surface passivation above the bond pads are provided to allow wire bonding to the dice gold bond  
pads. Thermosonic bonding is used with minimized ultrasonic content. Bond force, time, ultrasonic power and temperature are  
all critical parameters. Suggested wire is pure gold, 1 mil diameter. Bonds must be made from the bond pads on the die to  
the package or substrate. All bond wires should be kept as short as low as reasonable to minimize performance degradation due  
to undesirable series inductance.  
Assembly Diagram  
Recommended Wire Length, Typical  
Wire  
Wire Length (mm)  
Wire Loop Height (mm)  
GATE, DRAIN  
0.70  
0.30  
0.15  
0.15  
SOURCE (TO GROUND)  
®
Mini-Circuits  
www.minicircuits.com P.O. Box 350166, Brooklyn, NY 11235-0003 (718) 934-4500 sales@minicircuits.com  
Page 4 of 5  
SAV-541-D+  
E-PHEMT Die  
Additional Detailed Technical Information  
additional information is available on our dash board.  
Data Table  
Performance Data  
Case Style  
Swept Graphs  
S-Parameter (S2P Files) Data Set with and without port extension(.zip file)  
Die  
Quantity, Package  
Model No.  
Small, Gel - Pak: 10,50,100 KGD*  
Medium, Partial wafer: KGD*<5K  
SVA-541-DG+  
SVA-541-DP+  
Die Ordering and packaging  
information  
Refer to AN-60-067  
Environmental Ratings  
ENV-80  
ESD Rating  
Human Body Model (HBM): Class 1A (250 V to < 500 V) in accordance with ANSI/ESD STM 5.1 - 2001  
Machine Model (MM): Class M1 (40 V) in accordance with ANSI/ESD STM 5.2 - 1999  
** Tested in industry standard 6-lead 400µmx400µm package.  
Additional Notes  
A. Performance and quality attributes and conditions not expressly stated in this specification document are intended  
to be excluded and do not form a part of this specification document.  
B. Electrical specifications and performance data contained in this specification document are based on Mini-Circuit’s  
applicable established test performance criteria and measurement instructions.  
C. The parts covered by this specification document are subject to Mini-Circuits standard limited warranty and terms  
and conditions (collectively, Standard Terms”); Purchasers of this part are entitled to the rights and benefits  
contained therein. For a full statement of the Standard Terms and the exclusive rights and remedies thereunder,  
please visit Mini-Circuits’ website at www.minicircuits.com/MCLStore/terms.jsp  
D. Mini-Circuits does not warrant the accuracy or completeness of the information, text, graphics and other items  
contained within this document and same are provided as an accommodation and on an “As is” basis, with all faults.  
E. Purchasers of this part are solely responsible for proper storing, handling, assembly and processing of Known  
Good Dice (including, without limitation, proper ESD preventative measures, die preparation, die attach, wire bond  
ing and related assembly and test activities), and Mini-Circuits assumes no responsibility therefor or for environmental  
effects on Known Good Dice.  
F. Mini-Circuits and the Mini-Circuits logo are registered trademarks of Scientific Components Corporation d/b/a Mini-  
Circuits. All other third-party trademarks are the property of their respective owners. A reference to any third-party  
trademark does not constitute or imply any endorsement, affiliation, sponsorship, or recommendation by any such  
third-party of Mini-Circuits or its products.  
®
Mini-Circuits  
www.minicircuits.com P.O. Box 350166, Brooklyn, NY 11235-0003 (718) 934-4500 sales@minicircuits.com  
Page 5 of 5  

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