M5M5408ATP-10L [MITSUBISHI]

Standard SRAM, 512KX8, 100ns, CMOS, PDSO32, 0.400 INCH, PLASTIC, TSOP2-32;
M5M5408ATP-10L
型号: M5M5408ATP-10L
厂家: Mitsubishi Group    Mitsubishi Group
描述:

Standard SRAM, 512KX8, 100ns, CMOS, PDSO32, 0.400 INCH, PLASTIC, TSOP2-32

静态存储器 光电二极管 内存集成电路
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MITSUBISHI LSIs  
M5M5408AFP,TP,RT-55L, -70L,-10L  
-55LL,-70LL,-10LL  
4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM  
PIN CONFIGURATION (TOP VIEW)  
DESCRIPTION  
The M5M5408A is a 4,194,304-bit CMOS Static RAM organizedas  
524,288-word by 8-bit. This device is fabricated usingMitsubishi's  
high-performance silicon-gate CMOS technology.This state-of-the-art  
process technology, combined withinnovative circuit design  
1
2
32  
31  
A18  
A16  
A14  
A12  
A7  
A6  
A5  
A4  
A3  
VCC(5V)  
A15  
A17  
W
A13  
A8  
A9  
A11  
OE  
A10  
3
4
5
30  
29  
28  
techniques, yields  
high-density and low-power devices. The  
M5M5408A is suitable for memoryapplications where high reliability,  
large storage, simpleinterfacing and battery back-up are important  
design objectives.  
The M5M5408A is available in 32-pin plastic SOP(M5M5408AFP) ,  
32-pin plastic normal-lead-bend TSOP(M5M5408ATP) and 32-pin  
plastic reverse-lead-bend TSOP(M5M5408ART) packages. Two  
types of TSOP's are suitable forSurface Mounting on double-sided  
printed circuit boards.  
6
7
8
27  
26  
25  
9
24  
23  
22  
10  
11  
A2  
A1  
A0  
S
12  
13  
14  
21  
20  
19  
DQ8  
DQ7  
DQ6  
DQ5  
DQ4  
DQ1  
DQ2  
DQ3  
(0V)GND  
FEATURES  
15  
16  
18  
17  
Access Power supply current  
Type name  
time  
(max.)  
55ns  
Active  
(max.)  
Stand-by  
(max.)  
Outline32P2M-A (AFP)  
32P3Y-H (ATP)  
M5M5408AFP, TP, RT -55L  
M5M5408AFP, TP, RT -70L  
M5M5408AFP, TP, RT -10L  
M5M5408AFP, TP, RT -55LL  
M5M5408AFP, TP, RT -70LL  
M5M5408AFP, TP, RT -10LL  
100µA  
70ns  
30mA  
(Vcc=5.5V*)  
100ns  
55ns  
(1MHz)  
20µA  
(Vcc=5.5V*)  
0.4µA  
32  
31  
30  
1
2
3
(5V)VCC  
A15  
A18  
A16  
A14  
A12  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
DQ1  
DQ2  
DQ3  
GND(0V)  
70ns  
30mA  
100ns  
(1MHz)  
A17  
W
A13  
A8  
A9  
A11  
OE  
A10  
S
DQ8  
DQ7  
DQ6  
DQ5  
DQ4  
29  
28  
27  
4
5
6
(Vcc=3V**)  
* at 70°C / **at 25°C  
26  
25  
24  
7
8
9
• Single +5V power supply  
• No clocks, No refresh  
23  
22  
21  
10  
11  
12  
• All inputs and outputs are TTL compatible.  
• Easy memory expansion and power down by S  
• Data retention supply voltage=2.0V to 5.5V  
• Three-state outputs: OR-tie capability  
• OE prevents data contention in the I/O bus  
• Common Data I/O  
20  
19  
18  
13  
14  
15  
• Battery backup capability  
17  
16  
• Small stand-by current…………0.4µA (typical)  
• Package  
M5M5408AFP : 32 pin 525 mil SOP  
M5M5408ATP : 32 pin 400 mil TSOP(II)  
M5M5408ART : 32 pin 400 mil TSOP(II)  
Outline32P3Y-J (ART)  
PIN DISCRIPTION  
A0 ..... A18: ADDRESS INPUTS  
DQ1..... DQ8: DATA INPUTS & OUTPUTS  
S: CHIP SELECT INPUT  
W: WRITE ENABLE INPUT  
OE: OUTPUT ENABLE INPUT  
Vcc: Power supply  
APPLICATION  
Small capacity memory units  
IC card  
Battery operating system  
GND: Ground  
MITSUBISHI  
ELECTRIC  
MITSUBISHI LSIs  
M5M5408AFP,TP,RT-55L, -70L,-10L  
-55LL,-70LL,-10LL  
4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM  
BLOCK DIAGRAM  
5
A7  
A6  
A10  
13  
DQ1  
DQ2  
6
14  
524288 WORDS  
23  
15  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
DQ8  
x 8 BITS  
25  
A11  
17  
512 ROWS  
128 COLUMNS  
x 64 BLOCKS  
A9  
26  
18  
19  
20  
x
A8  
27  
A13 28  
A17  
30  
21  
A15 31  
1
A18  
A16  
A14  
A12  
2
3
CLOCK  
GENERATOR  
4
29  
W
S
7
8
A5  
A4  
22  
24  
A3  
A2  
9
OE  
10  
A1 11  
VCC  
(5V)  
32  
16  
A0  
12  
GND  
(0V)  
FUNCTION  
A read cycle is executed by setting W at a high level andOEat  
a low level while S are in an active state(S=L).  
The operation mode of the M5M5408A is determined by  
acombination of the device control inputs S, Wand OE.Each  
mode is summarized in the truth table.  
When setting S at a high level, the chips are in a  
non-selectable mode in which both reading and writing are  
disabled.In this mode, the output stage is in a high-impedance  
state,allowing OR-tie with other chips and memory expansion  
by S.The power supply current is reduced as low as the  
stand-bycurrent which is specified as Icc3 or Icc4, and the  
memorydata can be held at +2V power supply, enabling battery  
back-up operation during power failure or power-down operation  
inthe non-selected mode.  
A write cycle is executed whenever the low level Woverlaps  
with the low level S. The address must be set upbefore the  
write cycle and must be stable during the entirecycle. The data  
is latched into a cell on the trailing edge of Wor S, whichever  
occurs first, requiring the set-up and holdtime relative to these  
edge to be maintained. The outputenable OE directly controls  
the output stage. Setting theOE at a high level, the output  
stage is in a high-impedancestate, and the data bus contention  
problem in the write cycleis eliminated.  
TRUTH TABLE  
S
H
L
L
L
W
X
L
OE  
X
Mode  
Non selection  
Write  
DQ  
Icc  
High-impedance  
Data input  
Stand-by  
Active  
Active  
Active  
X
H
H
L
Read  
Data output  
H
Read  
High-impedance  
MITSUBISHI  
ELECTRIC  
MITSUBISHI LSIs  
M5M5408AFP,TP,RT-55L, -70L,-10L  
-55LL,-70LL,-10LL  
4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM  
ABSOLUTE MAXIMUM RATINGS  
Symbol  
Parameter  
Supply voltage  
Conditions  
Ratings  
Unit  
Vcc  
Vi  
- 0.3 ~ 7  
- 0.3* ~ Vcc + 0.3  
0 ~ Vcc  
V
V
Input voltage  
With respect to GND  
Ta=25°C  
Vo  
Output voltage  
V
Pd  
Power dissipation  
Operating temperature  
Storage temperature  
700  
mW  
°C  
°C  
Topr  
Tstg  
0 ~ 70  
-65 ~ 150  
* -3.0V in case of AC ( Pulse width £ 50ns)  
DC ELECTRICAL CHARACTERISTICS (Ta=0 - 70°C, Vcc=5V±10%, unless otherwise noted)  
Symbol  
Parameter  
Test Conditions  
Limits  
Typ.  
Unit  
Min.  
2.2  
Max.  
VIH High-level input voltage  
VIL Low-level input voltage  
VOH High-level output voltage  
Vcc+0.3  
0.8  
V
V
-0.3*  
2.4  
IOH= - 1mA  
V
IOH= - 0.1mA  
IOL = 2 mA  
Vcc-0.5  
V
VOL Low-level output voltage  
0.4  
±1  
±1  
V
Ii  
Input leakage current  
Output leakage current  
Inputs = 0 ~ Vcc  
S = VIH  
µA  
µA  
Io  
OE= VIH, DQ=0 ~ Vcc  
minimum  
cycle  
S £ 0.2  
Other inputs £ 0.2V or ³ Vcc-0.2V  
Icc1 Active supply current (AC, MOS-lvel)  
50  
25  
60  
30  
80  
30  
mA  
mA  
mA  
mA  
µA  
DQ = open (duty 100%)  
1MHz  
minimum  
cycle  
S = VIL  
Icc2 Active supply current (AC, TTL-level) Other inputs = VIH or VIL  
DQ = open (duty 100%)  
90  
1MHz  
40  
-L  
Icc3 Stand-by current  
S Vcc - 0.2V,  
version  
-LL  
100  
Other inputs = 0 ~ Vcc  
version  
1
20  
3
µA  
Icc4 Stand-by current  
S = VIH, other inputs=0 ~ Vcc  
mA  
* -3.0V in case of AC ( Pulse width £ 50ns)  
CAPACITANCE (Ta=0 - 70°C, Vcc=5V±10%, unless otherwise noted)  
Symbol  
Parameter  
Test Conditions  
Limits  
Typ.  
Unit  
Min.  
Max.  
Ci  
Input capacitance  
Output capacitance  
Vi = GND, Vi = 25mV rms, f = 1MHz  
Vo = GND, Vo = 25mV rms, f = 1MHz  
6
8
pF  
pF  
Co  
Note1. Direction for current flowing into IC is indicated as positive value.  
2. Typical value is for Ta=25°C and Vcc=5.0V  
3. Ci and Co are random samples ,not production tested.  
MITSUBISHI  
ELECTRIC  
MITSUBISHI LSIs  
M5M5408AFP,TP,RT-55L, -70L,-10L  
-55LL,-70LL,-10LL  
4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM  
AC ELECTRICAL CHARACTERISTICS (Ta=0 - 70°C, Vcc=5V±10%, unless otherwise noted)  
(1) MEASUREMENT CONDITIONS  
Vcc  
Input pulse …………………VIH=2.4V, VIL=0.6V(AFP,TP,RT-70L,-10L,-70LL,-10LL)  
VIH=3.0V, VIL=0V(AFP,TP,RT-55L,-55LL)  
Input rise and fall time ……5ns  
1.8kW  
DQ  
Output reference level ……VOH=VOL=1.5V  
For ten and tdis, transition is measured ±500mV  
from steady state voltage  
990W  
C L  
Output loads Show in Fig. 1;  
CL=100pF(AFP,TP,RT-70L,-10L,-70LL,-10LL)  
CL=30pF(AFP,TP,RT-55L,-55LL)  
CL=5pF (for ten,tdis)  
CL Includes jig and scope capacitance  
Fig.1 Output load  
(2) READ CYCLE  
Limits  
M5M5408AFP,TP,RT  
M5M5408AFP,TP,RT  
M5M5408AFP,TP,RT  
Symbol  
Parameter  
Unit  
-55L, -55LL  
-70L, -70LL  
-10L, -10LL  
Min.  
55  
Max.  
Min.  
70  
Max.  
Min.  
100  
Max.  
tCR  
ta(A)  
ta(S)  
Read cycle time  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address access time  
55  
55  
25  
20  
20  
70  
70  
35  
25  
25  
100  
100  
50  
Chip select access time  
ta(OE) Output enable access time  
tdis(S) Output disable time after S high  
tdis(OE) Output disable time after OE high  
ten(S) Output enable time after S low  
ten(OE) Output enable time after OE low  
35  
35  
10  
5
10  
5
10  
5
tv(A)  
Data valid time after address change  
10  
10  
10  
Limits  
M5M5408AFP,TP,RT  
M5M5408AFP,TP,RT  
M5M5408AFP,TP,RT  
Symbol  
Parameter  
Unit  
-55L, -55LL  
-70L, -70LL  
-10L, -10LL  
Min.  
Max.  
Min.  
Max.  
Min.  
Max.  
tCW  
tw(W)  
tsu(A)  
Write cycle time  
55  
40  
0
70  
50  
0
100  
60  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Write pulse width  
Address set up time  
tsu(A-WH) Address set up time with respect to W high  
50  
50  
25  
0
60  
60  
30  
0
80  
80  
35  
0
tsu(S)  
tsu(D)  
th(D)  
Chip select set up time  
Data set up time  
Data hold time  
trec(W) Write recovery time  
0
0
0
tdis(W) Output disable time after W low  
tdis(OE) Output disable time after OE high  
ten(W) Output enable time after W high  
ten(OE) Output enable time after OE low  
20  
20  
25  
25  
35  
35  
5
5
5
5
5
5
MITSUBISHI  
ELECTRIC  
MITSUBISHI LSIs  
M5M5408AFP,TP,RT-55L, -70L,-10L  
-55LL,-70LL,-10LL  
4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM  
(4) TIMING DIAGRAMS  
Read cycle  
tCR  
A0 ~ A18  
ta(A)  
ta(S)  
tv(A)  
( Note 4)  
( Note 4)  
( Note 4)  
( Note 4)  
S
tdis(S)  
ta(OE)  
OE  
ten(OE)  
ten(S)  
tdis(OE)  
DATA valid  
DQ1 ~ DQ8  
(Dout)  
Write cycle ( WE control mode )  
tCW  
A0 ~ A18  
tsu(S)  
( Note 4)  
( Note 4)  
S
tsu(A-WH)  
OE  
W
tsu(A)  
tw(W)  
trec(W)  
th(D)  
tsu(D)  
DQ1 ~ DQ8  
(Din)  
DATA valid  
tdis(W)  
ten(OE)  
ten(W)  
tdis(OE)  
DQ1 ~ DQ8  
(Dout)  
MITSUBISHI  
ELECTRIC  
MITSUBISHI LSIs  
M5M5408AFP,TP,RT-55L, -70L,-10L  
-55LL,-70LL,-10LL  
4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM  
Write cycle ( S control mode )  
tCW  
A0 ~ A18  
tsu(A)  
tsu(S)  
trec(W)  
S
tw(W)  
( Note 6)  
( Note 4)  
( Note 4)  
( Note 5)  
W
tsu(D)  
th(D)  
DQ1 ~ DQ8  
(Din)  
DATA valid  
Note 4: Hatching indicates the state is "don't care".  
5: A Write occurs during the overlap of a low S and a low W.  
6: If W goes low simultaneously with or prior to S, the output remains in the high-impedance state.  
7: Don't apply inverted phase signal externally when DQ pin is in output mode.  
MITSUBISHI  
ELECTRIC  
MITSUBISHI LSIs  
M5M5408AFP,TP,RT-55L, -70L,-10L  
-55LL,-70LL,-10LL  
4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM  
POWER DOWN CHARACTERISTICS  
(1) ELECTRICAL CHARACTERISTICS  
Symbol  
Parameter  
Test Conditions  
Limits  
Typ.  
Unit  
Min.  
Max.  
Vcc(PD) Power down supply voltage  
Vi(S) Chip select input S  
2
V
V
V
Vcc(PD) ³ 2.2V  
2.2  
2.2V ³ Vcc(PD) ³ 2.0V  
Vcc(PD)  
0.4  
-L  
50  
Icc(PD) Power down supply current  
Vcc=3V, S ³ Vcc-0.2V,  
version  
-LL  
µA  
µA  
other inputs = 0 ~ 3V  
version  
10*  
* Icc (PD) = 1µA at Ta=25°C  
(2) TIMING REQUIREMENTS (Ta=0 - 70°C, unless otherwise noted)  
Symbol  
Parameter  
Test Conditions  
Limits  
Typ.  
Unit  
Min.  
Max.  
tsu(PD) Power down set up time  
trec(PD) Power down recovery time  
0
5
ms  
ms  
(3) TIMING DIAGRAM  
S control mode  
Vcc  
4.5V  
4.5V  
trec(PD)  
tsu(PD)  
2.2V  
2.2V  
S ³ Vcc - 0.2V  
S
MITSUBISHI  
ELECTRIC  

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