MCM6229BBEJ20 [MOTOROLA]

256K x 4 Bit Static Random Access Memory; 256K ×4位静态随机存取存储器
MCM6229BBEJ20
型号: MCM6229BBEJ20
厂家: MOTOROLA    MOTOROLA
描述:

256K x 4 Bit Static Random Access Memory
256K ×4位静态随机存取存储器

存储
文件: 总8页 (文件大小:130K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Order this document  
by MCM6229BB/D  
SEMICONDUCTOR TECHNICAL DATA  
MCM6229BB  
Product Preview  
256K x 4 Bit Static Random  
Access Memory  
XJ PACKAGE  
400 MIL SOJ  
CASE 810–03  
EJ PACKAGE  
300 MIL SOJ  
CASE 810B–03  
The MCM6229BB is a 1,048,576 bit static random access memory organized  
as 262,144 words of 4 bits. Static design eliminates the need for external clocks  
ortimingstrobeswhileCMOScircuitryreducespowerconsumptionandprovides  
for greater reliability.  
The MCM6229BB is equipped with both chip enable (E) and output enable (G)  
pins, allowing for greater system flexibility and eliminating bus contention problems.  
The MCM6229BB is available in 300 mil and 400 mil, 28 lead surface–mount  
SOJ packages.  
PIN ASSIGNMENTS  
Single 5 V ± 10% Power Supply  
Fast Access Times: 15/17/20/25/35 ns  
Equal Address and Chip Enable Access Times  
All Inputs and Outputs are TTL Compatible and LVTTL Compatible  
Three State Outputs  
V
A
28  
27  
26  
25  
24  
23  
22  
21  
A
A
1
2
3
4
5
6
CC  
A
A
A
A
Low Power Operation: 155/150/135/130/110 mA Maximum, Active AC  
A
A
A
A
BLOCK DIAGRAM  
A
A
A
7
A
A
A
A
8
A
A
A
NC*  
20  
19  
18  
17  
16  
15  
9
10  
11  
12  
13  
14  
DQ  
DQ  
DQ  
MEMORY MATRIX  
ROW  
DECODER  
A
E
512 ROWS x  
2048 COLUMNS  
A
A
DQ  
W
G
V
A
A
A
SS  
PIN NAMES  
DQ  
DQ  
COLUMN I/O  
COLUMN DECODER  
A . . . . . . . . . . . . . . . . . . . . Address Inputs  
W . . . . . . . . . . . . . . . . . . . . . Write Enable  
G . . . . . . . . . . . . . . . . . . . Output Enable  
E . . . . . . . . . . . . . . . . . . . . . . Chip Enable  
DQ . . . . . . . . . . . . . Data Inputs/Outputs  
. . . . . . . . . . . . . + 5 V Power Supply  
. . . . . . . . . . . . . . . . . . . . . . . Ground  
NC* . . . . . . . . . . . . . . . . . No Connection  
INPUT  
DATA  
CONTROL  
A
A
A
A
A
A
A
A
A
V
CC  
V
SS  
E
*Ifnotusedfornoconnect, thendonotex-  
ceed voltages of – 0.5 to V  
CC  
+ 0.5 V.  
This pin is used for manufacturing diag-  
nostics.  
W
G
This document contains information on a new product under development. Motorola reserves the right to change or discontinue this product without notice.  
11/7/96  
Motorola, Inc. 1995  
TRUTH TABLE  
E
H
L
G
X
H
L
W
X
H
H
L
Mode  
Not Selected  
Output Disabled  
Read  
I/O Pin  
High–Z  
High–Z  
Cycle  
Current  
, I  
I
SB1 SB2  
I
I
I
CCA  
CCA  
CCA  
L
D
Read  
Write  
out  
L
X
Write  
D
in  
H = High, L = Low, X = Don’t Care  
ABSOLUTE MAXIMUM RATINGS (See Note)  
This device contains circuitry to protect the  
inputs against damage due to high static volt-  
ages or electric fields; however, it is advised  
that normal precautions be taken to avoid  
application of any voltage higher than maxi-  
mum rated voltages to these high–impedance  
circuits.  
This CMOS memory circuit has been de-  
signed to meet the dc and ac specifications  
shown in the tables, after thermal equilibrium  
has been established. The circuit is in a test  
socket or mounted on a printed circuit board  
andtransverse air flow of at least500linearfeet  
per minute is maintained.  
Rating  
Symbol  
Value  
Unit  
V
Power Supply Voltage Relative to V  
V
CC  
– 0.5 to 7.0  
SS  
Voltage Relative to V  
for Any Pin  
V , V  
in out  
– 0.5 to V  
CC  
+ 0.5  
V
SS  
Except V  
CC  
Output Current (per I/O)  
I
mA  
± 20  
1.0  
out  
Power Dissipation  
P
D
W
°C  
°C  
°C  
Temperature Under Bias  
Operating Temperature  
Storage Temperature  
T
bias  
– 10 to + 85  
0 to + 70  
T
A
T
stg  
– 55 to + 150  
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are  
exceeded. Functional operation should be restricted to RECOMMENDED OPER-  
ATING CONDITIONS. Exposure to higher than recommended voltages for  
extended periods of time could affect device reliability.  
DC OPERATING CONDITIONS AND CHARACTERISTICS  
(V  
= 5.0 V ± 10%, T = 0 to 70°C, Unless Otherwise Noted)  
CC  
A
RECOMMENDED OPERATING CONDITIONS  
Parameter  
Symbol  
Min  
4.5  
Max  
Unit  
V
Supply Voltage (Operating Voltage Range)  
Input High Voltage  
V
CC  
5.5  
V
IH  
2.2  
V
+ 0.3**  
V
CC  
Input Low Voltage  
V
IL  
– 0.5*  
0.8  
V
*V (min) = – 0.5 V dc; V (min) = – 2.0 V ac (pulse width 20 ns).  
IL IL  
**V (max) = V  
+ 0.3 V dc; V (max) = V  
+ 2 V ac (pulse width 20 ns).  
CC  
IH IH  
CC  
DC CHARACTERISTICS AND SUPPLY CURRENTS  
Parameter  
Symbol  
Min  
Max  
± 1  
Unit  
µA  
Input Leakage Current (All Inputs, V = 0 to V  
)
I
lkg(I)  
in  
CC  
Output Leakage Current (E = V , V  
IH out  
= 0 to V  
)
I
± 1  
µA  
CC  
lkg(O)  
AC Active Supply Current (I  
= 0 mA, all inputs =  
MCM6229BB–15: t  
= 15 ns  
= 17 ns  
= 20 ns  
= 25 ns  
= 35 ns  
I
CCA  
155  
150  
135  
130  
110  
mA  
out  
AVAV  
AVAV  
AVAV  
AVAV  
AVAV  
V
V
or V , V = 0, V 3 V, cycle time t  
= max)  
min, MCM6229BB–17: t  
MCM6229BB–20: t  
MCM6229BB–25: t  
MCM6229BB–35: t  
IL  
IH IL IH AVAV  
CC  
AC Standby Current (V  
CC  
= max, E = V , f = f  
IH max  
)
MCM6229BB–15: t  
MCM6229BB–17: t  
MCM6229BB–20: t  
MCM6229BB–25: t  
MCM6229BB–35: t  
= 15 ns  
= 17 ns  
= 20 ns  
= 25 ns  
= 35 ns  
I
45  
40  
35  
30  
25  
mA  
mA  
AVAV  
AVAV  
AVAV  
AVAV  
AVAV  
SB1  
CMOS Standby Current (E V  
– 0.2 V, V V  
in  
+ 0.2 V  
SS  
I
5
CC  
= max, f = 0 MHz)  
SB2  
or V  
– 0.2 V, V  
CC  
CC  
OL  
Output Low Voltage (I  
= + 8.0 mA)  
= – 4.0 mA)  
V
0.4  
V
V
OL  
Output High Voltage (I  
V
2.4  
OH  
OH  
MCM6229BB  
2
MOTOROLA FAST SRAM  
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T = 25°C, Periodically Sampled Rather Than 100% Tested)  
A
Characteristic  
Symbol  
Typ  
Max  
Unit  
Input Capacitance  
I/O Capacitance  
All Inputs Except Clocks and DQs  
E, G, and W  
C
4
5
6
8
pF  
in  
C
ck  
DQ  
C
5
8
pF  
I/O  
AC OPERATING CONDITIONS AND CHARACTERISTICS  
(V  
= 5.0 V ± 10%, T = 0 to + 70°C, Unless Otherwise Noted)  
CC  
A
Input Pulse Levels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to 3.0 V  
Input Rise/Fall Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 ns  
Input Timing Measurement Reference Level . . . . . . . . . . . . . . . 1.5 V  
Output Timing Measurement Reference Level . . . . . . . . . . . . . 1.5 V  
Output Load . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See Figure 1a  
READ CYCLE TIMING (See Notes 1, 2, and 3)  
6229BB–15  
6229BB–17  
6229BB–20  
6229BB–25  
6229BB–35  
Parameter  
Read Cycle Time  
Symbol  
Min  
15  
3
Max  
Min  
17  
3
Max  
Min  
20  
3
Max  
Min  
25  
3
Max  
Min  
35  
3
Max  
Unit  
ns  
Notes  
t
3
AVAV  
Address Access Time  
Enable Access Time  
t
15  
15  
6
17  
17  
7
20  
20  
7
25  
25  
8
35  
35  
8
ns  
AVQV  
t
ns  
4
ELQV  
GLQV  
AXQX  
Output Enable Access Time  
t
t
ns  
Output Hold from Address  
Change  
ns  
Enable Low to Output Active  
t
5
0
5
0
5
0
5
0
5
0
ns  
ns  
5, 6, 7  
5, 6, 7  
ELQX  
Output Enable Low to Output  
Active  
t
GLQX  
Enable High to Output High–Z  
t
0
0
6
6
0
0
7
7
0
0
7
7
0
0
8
8
0
0
8
8
ns  
ns  
5, 6, 7  
5, 6, 7  
EHQZ  
GHQZ  
Output Enable High to Output  
High–Z  
t
NOTES:  
1. W is high for read cycle.  
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus con-  
tention conditions during read and write cycles.  
3. All timings are referenced from the last valid address to the first transitioning address.  
4. Addresses valid prior to or coincident with E going low.  
5. At any given voltage and temperature, t  
and from device to device.  
max is less than t  
ELQX  
min, and t  
GHQZ  
max is less than t  
min, both for a given device  
GLQX  
EHQZ  
6. Transition is measured ± 500 mV from steady–state voltage with load of Figure 1b.  
7. This parameter is sampled and not 100% tested.  
8. Device is continuously selected (E V , G V ).  
IL  
IL  
TIMING LIMITS  
+5 V  
The table of timing values shows either a  
minimum or a maximum limit for each param-  
eter. Input requirements are specified from  
the external system point of view. Thus, ad-  
dress setup time is shown as a minimum  
since the system must supply at least that  
much time. On the other hand, responses  
from the memory are specified from the de-  
vice point of view. Thus, the access time is  
shown as a maximum since the device never  
provides data later than that time.  
480  
OUTPUT  
OUTPUT  
255  
Z
= 50 Ω  
R
= 50 Ω  
0
L
5 pF  
V
= 1.5 V  
L
(a)  
(b)  
Figure 1. AC Test Loads  
MCM6229BB  
3
MOTOROLA FAST SRAM  
READ CYCLE 1 (See Notes 1, 2, 3, and 9)  
t
AVAV  
A (ADDRESS)  
Q (DATA OUT)  
t
AXQX  
PREVIOUS DATA VALID  
DATA VALID  
t
AVQV  
READ CYCLE 2 (See Notes 3 and 5)  
t
AVAV  
A (ADDRESS)  
t
ELQV  
E (CHIP ENABLE)  
t
t
EHQZ  
ELQX  
G (OUTPUT ENABLE)  
t
t
GHQZ  
GLQV  
t
GLQX  
HIGH–Z  
Q (DATA OUT)  
DATA VALID  
t
AVQV  
t
t
EHICCL  
ELICCH  
I
CC  
SUPPLY CURRENT  
I
SB  
MCM6229BB  
4
MOTOROLA FAST SRAM  
WRITE CYCLE 1 (W Controlled, See Notes 1, 2, 3, and 4)  
6229BB–15  
6229BB–17  
6229BB–20  
6229BB–25  
6229BB–35  
Parameter  
Write Cycle Time  
Symbol  
Min  
15  
0
Max  
Min  
17  
0
Max  
Min  
20  
0
Max  
Min  
25  
0
Max  
Min  
35  
0
Max  
Unit  
ns  
Notes  
t
4
AVAV  
Address Setup Time  
t
ns  
AVWL  
Address Valid to End of Write  
Write Pulse Width  
t
12  
12  
14  
14  
15  
15  
17  
17  
20  
20  
ns  
AVWH  
t
ns  
WLWH,  
t
WLEH  
Data Valid to End of Write  
Data Hold TIme  
t
t
7
0
6
8
0
7
9
0
7
10  
0
8
11  
0
8
ns  
ns  
ns  
ns  
ns  
DVWH  
WHDX  
Write Low to Data High–Z  
Write High to Output Active  
t
5
5
5
5
5
5, 6, 7  
5, 6, 7  
WLQZ  
t
WHQX  
Write Recovery Time  
NOTES:  
t
0
0
0
0
0
WHAX  
1. A write occurs during the overlap of E low and W low.  
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus con-  
tention conditions during read and write cycles.  
3. If G goes low coincident with or after W goes low, the output will remain in a high–impedance state.  
4. All timings are referenced from the last valid address to the first transitioning address.  
5. Transition is measured ± 500 mV from steady–state voltage with load of Figure 1b.  
6. This parameter is sampled and not 100% tested.  
7. At any given voltage and temperature, t  
max is less than t  
min both for a given device and from device to device.  
WHQX  
WLQZ  
WRITE CYCLE 1 (W Controlled See Notes 1, 2, 3, and 4)  
t
AVAV  
A (ADDRESS)  
t
t
WHAX  
AVWH  
E (CHIP ENABLE)  
t
WLWH  
t
WLEH  
W (WRITE ENABLE)  
t
t
t
WHDX  
AVWL  
DVWH  
D (DATA IN)  
DATA VALID  
t
t
WHQX  
WLQZ  
HIGH–Z  
HIGH–Z  
Q (DATA OUT)  
MCM6229BB  
MOTOROLA FAST SRAM  
5
WRITE CYCLE 2 (E Controlled, See Notes 1, 2, and 3)  
6229BB–15  
6229BB–17  
6229BB–20  
6229BB–25  
6229BB–35  
Parameter  
Write Cycle Time  
Symbol  
Min  
15  
0
Max  
Min  
17  
0
Max  
Min  
20  
0
Max  
Min  
25  
0
Max  
Min  
35  
0
Max  
Unit  
ns  
Notes  
t
4
AVAV  
Address Setup Time  
t
ns  
AVEL  
Address Valid to End of Write  
Enable to End of Write  
t
12  
12  
14  
14  
15  
15  
17  
17  
20  
20  
ns  
AVEH  
t
t
ns  
5, 6  
ELEH,  
ELWH  
Write Pulse Width  
t
12  
7
14  
8
15  
9
17  
10  
0
20  
11  
0
ns  
ns  
ns  
ns  
WLEH  
Data Valid to End of Write  
Data Hold Time  
t
t
DVEH  
0
0
0
EHDX  
Write Recovery Time  
NOTES:  
t
0
0
0
0
0
EHAX  
1. A write occurs during the overlap of E low and W low.  
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus con-  
tention conditions during read and write cycles.  
3. If G goes low coincident with or after W goes low, the output will remain in a high–impedance state.  
4. All timings are referenced from the last valid address to the first transitioning address.  
5. If E goes low coincident with or after W goes low, the output will remain in a high–impedance state.  
6. If E goes high coincident with or before W goes high, the output will remain in a high–impedance state.  
WRITE CYCLE 2 (E Controlled See Notes 1, 2, 3, and 4)  
t
AVAV  
A (ADDRESS)  
t
AVEH  
t
ELEH  
E (CHIP ENABLE)  
t
t
t
EHAX  
AVEL  
ELWH  
t
WLEH  
W (WRITE ENABLE)  
t
DVEH  
D (DATA IN)  
DATA VALID  
t
EHDX  
HIGH–Z  
Q (DATA OUT)  
ORDERING INFORMATION  
(Order by Full Part Number)  
MCM 6229BB XX XX XX  
Motorola Memory Prefix  
Part Number  
Shipping Method (R2 = Tape and Reel, Blank = Rails)  
Speed (15 = 15 ns, 17 = 17 ns, 20 = 20 ns, 25 = 25 ns,  
35 = 35 ns)  
Package (XJ = 400 mil SOJ, EJ = 300 mil SOJ)  
Full Part Numbers — MCM6229BBXJ15 MCM6229BBXJ15R2  
MCM6229BBXJ17 MCM6229BBXJ17R2  
MCM6229BBEJ15  
MCM6229BBEJ15R2  
MCM6229BBEJ17R2  
MCM6229BBEJ20R2  
MCM6229BBEJ25R2  
MCM6229BBEJ35R2  
MCM6229BBEJ17  
MCM6229BBEJ20  
MCM6229BBEJ25  
MCM6229BBEJ35  
MCM6229BBXJ20 MCM6229BBXJ20R2  
MCM6229BBXJ25 MCM6229BBXJ25R2  
MCM6229BBXJ35 MCM6229BBXJ35R2  
MCM6229BB  
MOTOROLA FAST SRAM  
6
PACKAGE DIMENSIONS  
28 LEAD  
400 MIL SOJ  
CASE 810–03  
F
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
DETAIL Z  
28  
1
15  
14  
N
2. CONTROLLING DIMENSION: INCH.  
3. DIMENSION A AND B DO NOT INCLUDE MOLD  
PROTRUSION. MOLD PROTRUSION SHALL NOT  
EXCEED 0.15 (0.006) PER SIDE.  
4. DIMENSION R TO BE DETERMINED AT DATUM  
–T–.  
D 28 PL  
M
S
0.18 (0.007)  
T
A
INCHES  
MILLIMETERS  
DIM  
A
B
C
D
E
MIN  
MAX  
0.730  
0.405  
0.148  
0.020  
0.098  
0.032  
MIN  
18.29  
10.04  
3.26  
0.39  
2.24  
0.67  
1.27 BSC  
–––  
0.89  
MAX  
18.54  
10.28  
3.75  
0.50  
2.48  
H BRK  
0.720  
0.395  
0.128  
0.015  
0.088  
0.026  
0.050 BSC  
–––  
0.035  
0.025 BSC  
S
S
0.18 (0.007)  
T B  
–A–  
P
L
G
–B–  
F
0.81  
G
H
K
L
M
M
0.020  
0.045  
0.50  
1.14  
C
E
0.64 BSC  
M
N
P
R
S
0
5
0
0.76  
11.05  
9.15  
0.77  
5
1.14  
11.30  
9.65  
1.01  
0.10 (0.004)  
–T– SEATING  
0.030  
0.435  
0.360  
0.030  
0.045  
0.445  
0.380  
0.040  
DETAIL Z  
K
R
S RADIUS  
PLANE  
S
S
0.25 (0.010)  
T B  
MCM6229BB  
7
MOTOROLA FAST SRAM  
28 LEAD  
300 MIL SOJ  
CASE 810B–03  
F
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
DETAIL Z  
N
28  
1
15  
14  
2. CONTROLLING DIMENSION: INCH.  
3. DIMENSION A AND B DO NOT INCLUDE MOLD  
PROTRUSION. MOLD PROTRUSION SHALL NOT  
EXCEED 0.15 (0.006) PER SIDE.  
4. DIMENSION R TO BE DETERMINED AT DATUM  
–T–.  
D 24 PL  
M
S
0.18 (0.007)  
T A  
INCHES  
MILLIMETERS  
S
S
0.18 (0.007)  
T
B
DIM  
A
B
C
D
E
MIN  
MAX  
0.730  
0.305  
0.148  
0.020  
0.098  
0.032  
MIN  
18.29  
7.50  
3.26  
0.39  
2.24  
0.67  
1.27 BSC  
–––  
0.89  
0.64 BSC  
MAX  
18.54  
7.74  
3.75  
0.50  
2.48  
0.81  
H BRK  
–A–  
0.720  
0.295  
0.128  
0.015  
0.088  
0.026  
0.050 BSC  
–––  
0.035  
0.025 BSC  
P
–B–  
L
G
M
M
F
C
G
H
K
L
M
N
P
E
0.020  
0.045  
0.50  
1.14  
0.10 (0.004)  
K
DETAIL Z  
–T– SEATING  
PLANE  
S RADIUS  
R
0
10  
0
10  
0.030  
0.330  
0.260  
0.030  
0.045  
0.340  
0.270  
0.040  
0.76  
8.38  
6.60  
0.77  
1.14  
8.64  
6.86  
1.01  
S
S
0.25 (0.010)  
T B  
R
S
Motorola reserves the right to make changes without further notice to any products herein. Motorola makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and  
specificallydisclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters which may be provided in Motorola  
datasheetsand/orspecificationscananddovaryindifferentapplicationsandactualperformancemayvaryovertime. Alloperatingparameters,includingTypicals”  
must be validated for each customer application by customer’s technical experts. Motorola does not convey any license under its patent rights nor the rights of  
others. Motorola products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other  
applicationsintended to support or sustain life, or for any other application in which the failure of the Motorola product could create a situation where personal injury  
ordeathmayoccur. ShouldBuyerpurchaseoruseMotorolaproductsforanysuchunintendedorunauthorizedapplication,BuyershallindemnifyandholdMotorola  
and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees  
arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that  
Motorola was negligent regarding the design or manufacture of the part. Motorola and  
Opportunity/Affirmative Action Employer.  
are registered trademarks of Motorola, Inc. Motorola, Inc. is an Equal  
Mfax is a trademark of Motorola, Inc.  
How to reach us:  
USA/EUROPE/Locations Not Listed: Motorola Literature Distribution;  
P.O. Box 5405, Denver, Colorado 80217. 303–675–2140 or 1–800–441–2447  
JAPAN: Nippon Motorola Ltd.: SPD, Strategic Planning Office, 4–32–1,  
Nishi–Gotanda, Shinagawa–ku, Tokyo 141, Japan. 81–3–5487–8488  
Mfax : RMFAX0@email.sps.mot.com – TOUCHTONE 602–244–6609  
ASIA/PACIFIC: Motorola Semiconductors H.K. Ltd.; 8B Tai Ping Industrial Park,  
– US & Canada ONLY 1–800–774–1848 51 Ting Kok Road, Tai Po, N.T., Hong Kong. 852–26629298  
INTERNET: http://motorola.com/sps  
MCM6229BB/D  

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