GMA05X [MURATA]
CAPACITOR, CERAMIC, MULTILAYER, 10; 16; 50V, SURFACE MOUNT, 0202, CHIP;
| 型号： | GMA05X |
| 厂家： | 
muRata |
| 描述： | CAPACITOR, CERAMIC, MULTILAYER, 10; 16; 50V, SURFACE MOUNT, 0202, CHIP 电容器 |
| 文件： | 总3页 (文件大小：59K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this PDF catalog to prevent smoking and/or burning, etc.
This catalog has only typical specifications. Therefore, you are requested to approve our product specifications or to transact the approval sheet for product specificaions before ordering.
!Note
C02E10.pdf 04.1.20
Chip Monolithic Ceramic Capacitors
Microchips
L
W
■ Features
1. Better microwave characteristics
2. Suitable for by-passing
3. High density mounting
■ Applications
1. Optical device for telecommunication
2. IC, IC packaging built-in
Dimensions (mm)
W
Part Number
L
T
3. Measuring equipment
0.5 ±0.05
0.8 ±0.05
0.5 ±0.05
0.8 ±0.05
0.35 ±0.05
0.5 ±0.1
GMA05X
GMA085
7
TC Cod
(Standard)
Rated Voltage
(Vdc)
Length L
(mm)
Width W
(mm)
Thickness T
(mm)
Part Number
Capacitance
GMA05XR71H471MD01
GMA05XR71C102MD01
GMA05XR71C152MD01
GMA05XR71C222MD01
GMA085R71C103MD01
GMA05XF51C472ZD01
GMA05XF51C682ZD01
GMA085F51C473ZD01
GMA05XF51A153ZD01
GMA085F51A104ZD01
X7R (EIA)
X7R (EIA)
X7R (EIA)
X7R (EIA)
X7R (EIA)
Y5V (EIA)
Y5V (EIA)
Y5V (EIA)
Y5V (EIA)
Y5V (EIA)
50
16
16
16
16
16
16
16
10
10
470pF ±20%
1000pF ±20%
0.5
0.5
0.5
0.5
0.8
0.5
0.5
0.8
0.5
0.8
0.5
0.5
0.5
0.5
0.8
0.5
0.5
0.8
0.5
0.8
0.35
0.35
0.35
0.35
0.5
1500pF ±20%
2200pF ±20%
10000pF ±20%
4700pF +80/-20%
6800pF +80/-20%
47000pF +80/-20%
15000pF +80/-20%
0.10µF +80/-20%
0.35
0.35
0.5
0.35
0.5
39
Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this PDF catalog to prevent smoking and/or burning, etc.
This catalog has only typical specifications. Therefore, you are requested to approve our product specifications or to transact the approval sheet for product specificaions before ordering.
!Note
C02E10.pdf 04.1.20
Specifications and Test Methods
Specifications
No.
1
Item
Operating
Test Method
R7 : Y55D to W125D
F5 : Y30D to W85D
Temperature
The rated voltage is defined as the maximum voltage which
may be applied continuously to the capacitor.
P-P
O-P
2
Rated Voltage
See the previous pages.
When AC voltage is superimposed on DC voltage, V or V ,
whichever is larger, should be maintained within the rated volt-
age range.
Visual inspection
Visual inspection
3
4
Appearance
Dimensions
No defects or abnormalities
See the previous pages.
No failure should be observed when a voltage of 250% of the rated
voltage is applied between the both terminations for 1 to 5 seconds,
provided the charge/discharge current is less than 50mA.
5
Dielectric Strength No defects or abnormalities
The insulation resistance should be measured with a DC volt-
age not exceeding the rated voltage at normal temperature and
humidity and within 2 minutes of charging.
Insulation Resistance
10,000MΩ min.
(I.R.)
6
7
8
7
The capacitance should be measured at 25D with 1T0.1kHz in
frequency and 1T0.2Vr.m.s. in voltage.
Capacitance
Within the specified tolerance
R7 : 0.035 max.
F5 : 0.09 max. (for 16V)
F5 : 0.125 max. (for 10V)
Dissipation Factor
(D.F.)
D.F. should be measured under the same conditions at the
capacitance.
The range of capacitance change in reference to 25D within
the temperature range shown in the table should be within the
specified ranges.
The capacitance change should be measured after 5 min. at
each specified temperature stage.
Temp. Range Reference Temp. Cap. Change Rate
Capacitance
Temperature
Characteristics
Char.
R7
F5
Y55 to W125D
Y30 to W85D
25D
25D
WithinT15%
9
22
WithinT %
82
MIL-STD-883 Method 2011 Condition D
Mount the capacitor on a gold metallized alumina substrate with
Au-Sn (80/20) and bond a 20µm (0.0008 inch) gold wire to the
capacitor terminal using an ultrasonic wedge bond. Then, pull
wire.
Bond
Strength
Pull force : 3.0g min.
Mechanical
Strength
10
MIL-STD-883 Method 2019
Mount the capacitor on a gold metallized alumina substrate
with Au-Sn (80/20). Apply the force parallel to the substrate.
Die Shear
Strength
Die Shear force : 200g min.
Appearance
No defects or abnormalities
Within the specified tolerance
Ramp frequency from 10 to 55Hz then return to 10Hz all within
1 minute. Amplitude : 1.5 mm (0.06 inch) max. total excursion.
Apply this motion for a period of 2 hours in each of 3 mutually
perpendicular directions (total 6 hours).
Capacitance
Vibration
Resistance
D.F.
11
R7 : 0.035 max.
F5 : 0.09 max. (for 16V)
F5 : 0.125 max. (for 10V)
The capacitor should be set for 48T4 hours at room tempera-
W0
The measured values should satisfy the values in the following
table.
ture after one hour heat of treatment at 150
D, then mea-
Y10
sure for the initial measurement. Fix the capacitor to the sup-
porting jig in the same manner and under the same conditions
as (11) and conduct the five cycles according to the tempera-
tures and time shown in the following table. Set it for 48T4
hours at room temperature, then measure.
Item
Appearance
Specifications
No marked defect
WithinT7.5%
WithinT20%
More than 10,000MΩ
.......
.......
R7
F5
Capacitance Change
I.R.
12 Temperature Cycle
.......
.......
.......
Step
1
2
3
4
R7
F5
F5
0.035 max.
0.09 max.(for 16V)
0.125 max.(for 10V)
Min. Operating
Temp.
Max. Operating
Temp.
Room
Temp.
Room
Temp.
D.F.
Temp.(D)
W0
Y3
W3
Y0
Dielectric Strength
No failure
30T3
30T3
Time(min.)
2 to 3
2 to 3
The measured values should satisfy the values in the following
table.
Item
Specifications
Appearance
No marked defect
Set the capacitor for 500T12 hours at 40T20D, in 90 to 95%
humidity.
Take it out and set it for 48T4 hours at room temperature, then
measure.
.......
.......
R7
F5
WithinT12.5%
WithinT30%
Capacitance Change
I.R.
Humidity
13
(Steady State)
More than 1,000MΩ
.......
.......
.......
R7
F5
F5
0.05 max.
0.125 max.(for 16V)
0.15 max.(for 10V)
D.F.
Dielectric Strength
No failure
Continued on the following page.
40
Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this PDF catalog to prevent smoking and/or burning, etc.
This catalog has only typical specifications. Therefore, you are requested to approve our product specifications or to transact the approval sheet for product specificaions before ordering.
!Note
C02E10.pdf 04.1.20
Specifications and Test Methods
Continued from the preceding page.
Specifications
No.
Item
Test Method
The measured values should satisfy the values in the following
table.
Apply the rated voltage for 500T12 hours at 40T20D, in 90 to
95% humidity and set it for 48T4 hours at room temperature,
then measure. The charge/discharge current is less than
50mA.
Item
Specifications
Appearance
No marked defect
.......
.......
R7
F5
WithinT12.5%
30
WithinT
40
Capacitance Change
I.R.
%
14 Humidity Load
# Initial measurement for Y5V
Perform a heat treatment at 150
More than 500MΩ
W0
Y10
D for one hour and then
.......
.......
.......
R7
F5
F5
0.05 max.
0.125 max.(for 16V)
0.15 max.(for 10V)
let sit for 48T4 hours at room temperature. Perform the initial
measurement.
D.F.
Dielectric Strength
No failure
The measured values should satisfy the values in the following
table.
A voltage treatment should be given to the capacitor, in which a
DC voltage of 200% the rated voltage is applied for one hour at
the maximum operating temperature T3D then it should be set
for 48T4 hours at room temperature and the initial measurement
should be conducted.
Then apply the above mentioned voltage continuously for
1000T12 hours at the same temperature, remove it from the
bath, and set it for 48T4 hours at room temperature, then
measure. The charge/discharge current is less than 50mA.
Item
Specifications
Appearance
No marked defect
.......
.......
R7
F5
WithinT12.5%
30
WithinT
40
Capacitance Change
I.R.
High Temperature
Load
%
15
7
More than 1,000MΩ
.......
.......
.......
R7
F5
F5
0.05 max.
0.125 max.(for 16V)
0.15 max.(for 10V)
D.F.
Dielectric Strength
No failure
Mounting for testing : The capacitors should be mounted on the substrate as shown below using die bonding and wire bonding when tests No. 11 to 15 are performed.
Capacitor
Gold wire
Die bond
Gold land
Alumina substrate
Alumina substrate
Gold land
41
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