NNCD3.3G [NEC]
ELECTROSTATIC DISCHARGE NOISE CLIPPING DIODES QUARTO TYPE : COMMON ANODE 5 PIN MINI MOLD; 静电放电噪声，限幅二极管QUARTO类型：共阳极5针mini模具
| 型号： | NNCD3.3G |
| 厂家： | 
NEC |
| 描述： | ELECTROSTATIC DISCHARGE NOISE CLIPPING DIODES QUARTO TYPE : COMMON ANODE 5 PIN MINI MOLD |
| 文件： | 总8页 (文件大小：41K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
DATA SHEET
E.S.D NOISE CLIPPING DIODES
NNCD3.3G to NNCD7.5G, NNCD27G
ELECTROSTATIC DISCHARGE NOISE CLIPPING DIODES
(QUARTO TYPE : COMMON ANODE)
5 PIN MINI MOLD
This product series is a diode developed for E.S.D (Electrostatic
Discharge) noise protection. Based on the IEC1000-4-2 test on
electromagnetic interference (EMI), the diode assures an endur-
ance of no less than 30 KV, thus making itself most suitable for
external interface circuit protection.
PACKAGE DIMENSIONS
(in millimeters)
2.8 ± 0.2
+0.1
1.5
0.65
–0.15
With four elements mounted in the 5 PIN Mini Mold Package, the
product can cope with high density and automatic packaging.
1
2
3
5
4
FEATURES
•
•
•
Based on the electrostatic discharge immunity test (IEC1000-4-
2), the product assures the minimum endurance of 30 KV.
Based on the reference supply of the set, the product achieves
a series over a wide range (11 product name lined up).
With 4 elements mounted (common anode) mounted in the 5 PIN
MINI MOLD package, the product can achieve a high density and
automatic packaging.
APPLICATIONS
•
•
External interface circuit E.S.D protection.
Circuits for Waveform clipper, Surge absorber.
(5 PIN mini MOLD)
(SC-74A)
MAXIMUM RATINGS (TA = 25 ˚C)
PIN CONNECTION
Power Dissipation
P
200 mW
(Total)
Fig. 5
Surge Reverse Power
Junction Temperature
Storage Temperature
PRSM
Tj
85 W (t = 10 µs 1 pulse)
150 ˚C
5
4
Tstg
–55 ˚C to +150 ˚C
1
2
3
4
5
:
:
:
:
:
K1 Cathode 1
A
Anode (common)
K2 Cathode 2
K3 Cathode 3
K4 Cathode 4
1
2
3
Document No. D11645EJ1V1DS00 (1st edition)
Date Published February 1998 N CP(K)
Printed in Japan
1996
©
NNCD3.3G to NNCD7.5G, NNCD27G
ELECTRICAL CHARACTERISTICS (TA = 25 ˚C) (A-K1, A-K2, A-K3, A-K4)
Dynamic**
Impedance
Zz (Ω)
Reverse
Leakage
IR (µA)
Breakdown Voltage*
Capacitance
Ct (pF)
E.S.D Voltage
(KV)
VBR (V)
Parameter
Test
Test
MIN.
MAX.
IT (mA)
MAX.
IT (mA)
MAX.
VR (V)
TYP.
MIN.
Condition
Condition
NNCD3.3G
NNCD3.6G
NNCD3.9G
NNCD4.3G
NNCD4.7G
NNCD5.1G
NNCD5.6G
NNCD6.2G
NNCD6.8G
NNCD7.5G
NNCD27G
3.10
3.40
3.70
4.01
4.42
4.84
5.31
5.86
6.47
7.06
25.10
3.50
3.80
4.10
4.48
4.90
5.37
5.92
6.53
7.14
7.84
28.90
5
5
5
5
5
5
5
5
5
5
2
130
130
130
130
130
130
80
5
5
5
5
5
5
5
5
5
5
2
20
10
10
10
10
5
1.0
1.0
1.0
1.0
1.0
1.5
2.5
3.0
3.5
4.0
21
220
210
200
180
170
160
140
120
110
90
30
30
30
30
30
30
30
30
30
30
30
C = 150 pF
R = 330 Ω
(IEC1000
-4-2)
VR = 0 V
f = 1 MHz
5
50
2
30
2
30
2
70
2
25
*
Tested with pulse (40 ms)
** Zz is measured at IT give a small A.C. signal.
2
NNCD3.3G to NNCD7.5G, NNCD27G
TYPICAL CHARACTERISTICS (TA = 25 ˚C)
Fig. 2
I - VBR CHARACTERISTICS
(A-K1, A-K2, A-K3, A-K4)
t
Fig. 1 P - T RATING
A
250
200
150
100
50
NNCD6.8G
NNCD7.5G
100 m
10 m
1 m
NNCD3.3G
NNCD3.6G
NNCD3.9G
100 µ
10 µ
1 µ
0
25
50
75
100
125
150
100 n
T
A
- Ambient Temperature - ˚C
NNCD4.3G
NNCD4.7G
NNCD5.1G
NNCD5.6G
10 n
NNCD6.2G
1 n
0
1
2
3
4
5
6
7
8
9
10
VBR - Breakdown Voltage - V
Fig. 3 Z
T
- I
T
CHARACTERISTICS
NNCD3.9G
1 000
TYP.
100
10
1
NNCD5.6G
NNCD4.7G
NNCD5.1G
NNCD7.5G
0.1
1
10
100
IT
- On state Current - A
3
NNCD3.3G to NNCD7.5G, NNCD27G
Fig. 4 TRANSIENT THERMAL IMPEDANCE
1 000
100
10
625 ˚C/W
NNCD [ ] G
1
0.1
1 m
10 m
100 m
1
t - Time - Sec
10
100
Fig. 5 SURGE REVERSE POWER RATING
10 000
1 000
100
T
A
= 25 ˚C
Non-Repetive
t
T
NNCD [ ] G
10
1
1 µ
10 µ
100 µ
1 m
10 m
100 m
t
T
- Pulse Width - Sec
4
NNCD3.3G to NNCD7.5G, NNCD27G
Sample Application Circuits
* Set
Conecter
Micro
com.
PC
(CD ROM)
Palallel
Interface
Di
Di
Imterface Cable
* Set
Printer, P.D.C, T.V Game etc
5
NNCD3.3G to NNCD7.5G, NNCD27G
REFERENCE
Document Name
Document No.
C11745E
NEC semiconductor device reliability/quality control system
NEC semiconductor device reliability/quality control system
Quality grade on NEC semiconductor devices
MEI-1201
C11531E
Semiconductor device mounting technology manual
C10535E
Guide to quality assurance for semiconductor device
MEI-1202
6
NNCD3.3G to NNCD7.5G, NNCD27G
[MEMO]
7
NNCD3.3G to NNCD7.5G, NNCD27G
[MEMO]
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
M4 96.5
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