UPD16700N [NEC]

256-OUTPUT TFT-LCD GATE DRIVER; 256输出TFT -LCD栅极驱动器
UPD16700N
型号: UPD16700N
厂家: NEC    NEC
描述:

256-OUTPUT TFT-LCD GATE DRIVER
256输出TFT -LCD栅极驱动器

驱动器 栅极 输出元件 栅极驱动 CD
文件: 总12页 (文件大小:77K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DATA SHEET  
MOS INTEGRATED CIRCUIT  
µ
PD16700  
256-OUTPUT TFT-LCD GATE DRIVER  
DESCRIPTION  
The µ PD16700 is a TFT-LCD gate driver equipped with 256-output lines. It can output a high-gate scanning  
voltage in response to CMOS level input because it provided with a level-shift circuit inside the IC circuit. It can also  
drive the XGA/SXGA panel.  
FEATURES  
CMOS level input (3.3 V)  
256 outputs  
DD2  
EE2  
High-output voltage (V -V  
= amplitude: 40 V MAX.)  
Capable of All-on outputting (AO)  
ORDERING INFORMATION  
Part Number  
Package  
TCP (TAB package)  
µ PD16700N-xxx  
Remark The TCP’s external shape is customized. To order the required shape, please contact an one of our sales  
representatives.  
The information in this document is subject to change without notice. Before using this document, please  
confirm that this is the latest version.  
Not all devices/types available in every country. Please check with local NEC representative for  
availability and additional information.  
Document No. S14085EJ1V1DS00 (1st edition)  
Date Published July 2000 NS CP (K)  
The mark shows major revised points.  
1999  
©
Printed in Japan  
µ
PD16700  
1. BLOCK DIAGRAM  
LS1Note  
R,/L  
LS1Note  
CLK  
LS1Note  
LS1Note  
LS1Note  
STVL  
Note  
STVR  
LS1  
256-bit shift register  
SR1 SR2 SR3  
SR255 SR256  
SR254  
OE  
1
OE  
2
LS1Note  
LS1Note  
OE  
3
AO  
LS2Note  
LS2Note LS2Note  
LS2Note LS2Note LS2Note  
VEE2  
O
254  
O
255  
O
256  
O
2
O
3
O
1
Note LS1: shifts CMOS level and internal level, LS2: shifts interval level and output level (VDD2-VEE2).  
Remark /xxx indicates active low signal.  
2
Data Sheet S14085EJ1V1DS00  
µ
PD16700  
2. PIN CONFIGURATION (µ PD16700N-xxx)  
O1  
O2  
O3  
VEE2  
VEE1  
VSS  
STVR  
R,/L  
CLK  
OE1  
OE2  
OE3  
STVL  
AO  
Copper  
foil  
Surface  
VDD1  
VDD2  
O254  
O255  
O256  
Remark This figure does not specify the TCP package.  
3
Data Sheet S14085EJ1V1DS00  
µ
PD16700  
3. PIN FUNCTIONS  
Pin Symbol  
O1 to O256  
Pin Name  
Driver output  
Description  
These pins output scan signals that drive the vertical direction (gate lines) of a TFT-LCD.  
The output signals change in synchronization with the rising edge of shift clock CLK. The  
driver output amplitude is VDD2 - VEE2.  
R,/L  
Shift direction select R,/L = H (right shift) : STVR O1 O256 STVL  
input  
R,/L = L (left shift) : STVL O256 O1 STVR  
STVR,  
STVL  
Start pulse  
input/output  
This is the input of the internal shift register. The start pulse is read at the rising edge of shift  
clock CLK, and scan signals are output from the driver output pins. The input level is a  
CMOS (3.3 V) level. The start pulse is output at the falling edge of the 256th clock of shigt  
clock CLK, and is cleared at the falling edge of the 257th clock. The output level is VDD1 -  
VSS (logic level).  
CLK  
Shift clock input  
This pin inputs a shift clock to the internal shift register.  
The shift operation is performed in synchronization with the rising edge of this input.  
OE1,OE2,OE3 Output enable input When this pin goes H, the driver output is fixed to VEE2 level.  
The shift register is not cleared.  
OE1: O1, O4, ... O250, O253, O256  
OE1: O2, O5, ... O251, O254  
OE1: O3, O6, ... O252, O255  
AO  
All-on control  
When this pin goes L, the driver output is fixed to VDD2 level. The shift register is not cleared.  
This pin has priority over OE1 to OE3.  
VDD1  
VDD2  
Logic power supply 3.3 V ± 0.3 V  
Driver positive power 15 to 25 V  
supply  
The driver output : H level  
VSS  
Logic ground  
Connect this pin to the ground of the system.  
–15 to –5 V  
VEE1  
Negative Power  
supply for internal  
operation  
VEE2  
Driver negative  
power supply  
The driver output : L level (VEE2-VEE1 < 6.0 V)  
Cautions 1. To prevent latch up, turn on power to VDD1, VEE1/2, VDD2, and logic input in this order. Turn off  
power in the reverse order. These power up/down sequence must be observed also during  
transition period.  
2. Insert a capacitor of about 0.1 µF between each power line, as shown below, to secure noise  
margin such as VIH and VIL.  
V
DD2  
DD1  
V
0.1  
F
µ
µ
µ
0.1  
0.1  
F
VSS  
F
V
EE1/2  
4
Data Sheet S14085EJ1V1DS00  
µ
PD16700  
4. TIMING CHART (R,/L = H, AO = H)  
1
2
3
255  
256  
257  
258  
259  
CLK  
OE1  
OE  
2
3
OE  
STVR  
(STVL)  
O
1
(O256  
)
)
O
2
(O255  
O
3
(O254  
)
O255  
(O2)  
O256  
(O1)  
STVL  
(STVR)  
O1  
of next stage  
(O256 of next stage)  
O
2
of next stage  
(O255 of next stage)  
5
Data Sheet S14085EJ1V1DS00  
µ
PD16700  
5. ELECTRICAL SPECIFICATIONS  
Absolute Maximum Ratings (TA = 25°C, VSS = 0 V)  
Parameter  
Logic Supply Voltage  
Symbol  
Rating  
–0.5 to +7.0  
Unit  
V
VDD1  
Driver Positive Supply Voltage  
Power Supply Voltage  
VDD2  
–0.5 to +28  
V
VDD2-VEE1, VEE2  
–0.5 to +42  
V
Internal Operation Negative Supply Voltage  
Driver Negative Supply Voltage  
Input Voltage  
VEE1  
VEE2  
VI  
–16 to + 0.5  
V
VEE1 – 0.3 to VEE1 + 7.0  
–0.5 to VDD1 + 0.5  
–20 to +75  
V
V
Operating Ambient Temperature  
Storage Temperature  
TA  
°C  
°C  
Tstg  
–55 to +125  
Caution Product quality may suffer if the absolute maximum rating is exceeded even momentarily for any  
parameter. That is, the absolute maximum ratings are rated values at which the product is on the  
verge of suffering physical damage, and therefore the product must be used under conditions that  
ensure that the absolute maximum ratings are not exceeded.  
Recommended Operating Range (TA = –20 to +75°C, VSS = 0 V)  
Parameter  
Logic Supply Voltage  
Symbol  
VDD1  
MIN.  
3.0  
15  
TYP.  
3.3  
23  
MAX.  
3.6  
Unit  
V
Driver Positive Supply Voltage  
Internal Operation Negative Supply Voltage  
Power Supply Voltage  
VDD2  
25  
V
VEE1  
–15  
20  
–10  
33  
–5.0  
40  
V
VDD2-VEE1  
VEE2-VEE1  
fCLK  
V
0
6.0  
V
Clock Frequency  
100  
kHz  
Electrical Characteristics (TA = –20 to +75°C, VDD1 = 3.3 V ± 0.3 V, VDD2 = 23 V, VEE1 = VEE2 = –10 V, VSS = 0 V)  
Parameter  
High-level Input Voltage  
Low-level Input Voltage  
Symbol  
VIH  
Condition  
CLK, STVR (STVL), R,/L,  
OE1-OE3  
MIN.  
0.8 VDD1  
VSS  
TYP.  
MAX.  
VDD1  
Unit  
V
VIL  
0.2 VDD1  
VDD1  
V
High-level Output Voltage  
Low-level Output Voltage  
LCD Driver Output ON Resistance  
VOH  
VOL  
STVR (STVL), IOH = –40 µA VDD1 – 0.4  
V
STVR (STVL), IOL = +40 µA  
VSS  
VSS + 0.4  
1.0  
V
RON  
VOUT = VEE2 + 1.0 V, or  
VDD2 – 1.0 V  
kΩ  
Input Leak Current  
IIL  
VI = 0 V or 3.6 V  
±1.0  
µA  
µA  
Static Current Dissipation  
IDD1  
VDD1, fCLK = 50 kHz,  
OE1 = OE2 = OE3 = L,  
fSTV = 60 Hz, no load  
VDD2, fCLK = 50 kHz,  
OE1 = OE2 = OE3 = L,  
fSTV = 60 Hz, no load  
VEE1, fCLK = 50 kHz,  
OE1 = OE2 = OE3 = L,  
fSTV = 60 Hz, no load  
500  
50  
1000  
IDD2  
100  
µA  
µA  
IEE  
–1100  
–550  
6
Data Sheet S14085EJ1V1DS00  
µ
PD16700  
Switching Characteristics (TA = –20 to +75 °C, VDD1 = 3.3 V ± 0.3 V, VDD2 = 23 V, VEE1 = VEE2 = –10 V, VSS = 0 V)  
Parameter  
Symbol  
tPHL1  
tPLH1  
tPHL2  
tPLH2  
tPHL3  
tPLH3  
tTLH  
Condition  
CL = 20 pF,  
MIN.  
TYP.  
MAX.  
800  
800  
800  
800  
800  
800  
350  
350  
15  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
pF  
Cascade Output Delay Time  
CLK STVL (STVR)  
CL = 300 pF, CLK On  
Driver Output Delay Time  
CL = 300 pF, OEn On  
CL = 300 pF  
Output Rise Time  
Output Fall Time  
Input Capacitance  
tTHL  
CI  
TA = 25 °C  
Timing Requirements (TA = –20 to +75°C, VDD1 = 3.3 V ± 0.3 V, VDD2 = 23 V, VEE1 = VEE2 = –10 V, VSS = 0 V)  
Parameter  
Clock Pulse High Width  
Clock Pulse Low Width  
Enable Pulse Width  
Data Setup Time  
Symbol  
PWCLK(H)  
PWCLK(L)  
PWOE  
Condition  
MIN.  
500  
500  
1.0  
TYP.  
MAX.  
Unit  
ns  
ns  
µs  
tSETUP  
STVR (STVL) ↑ → CLK ↑  
CLK ↑ → STVR(STVL) ↓  
200  
200  
ns  
Data Hold Time  
tHOLD  
ns  
Caution Keep the time and fall time of the logic input to tr = tf = 20 ns (10 to 90 % of the rated values).  
Remark Unless otherwise specified, the input level is defined to be VIH = 0.8 VDD1, VIL = 0.2 VDD1. For details, refer  
to 6. SWITCHING CHARACTERISTIC WAVEFORM.  
7
Data Sheet S14085EJ1V1DS00  
PWCLK(L)  
PWCLK(H)  
2
t
r
tf  
50 %  
256  
90%  
50 %  
1
3
4
5
6
7
CLK  
253  
254  
255  
10%  
t
SETUP  
t
HOLD  
50 %  
STVR  
t
PLH2  
tPHL2  
90 %  
O
1
10 %  
90%  
10%  
O
2
t
TLH  
tTHL  
O
255  
O
256  
t
PHL1  
t
PLH1  
50 %  
STVL  
OE  
PWOE  
50 %  
t
PHL3  
t
PLH3  
µ
µ
90 %  
O1-  
O256  
10 %  
µ
PD16700  
7. RECOMMENDED MOUNTING CONDITIONS  
The following conditions must be met for mounting conditions of the µ PD16700.  
For more details, refer to the Semiconductor Device Mounting Technology Manual (C10535E).  
Please consult with our sales offices in case other mounting process is used, or in case the mounting is done under  
different conditions.  
µ PD16700N-xxx : TCP (TAB Package)  
Mounting Condition  
Thermocompression  
Mounting Method  
Soldering  
Condition  
Heating tool 300 to 350°C, heating for 2 to 3 seconds : pressure 100g  
(per solder)  
ACF  
Temporary bonding 70 to 100°C: pressure 3 to 8 kg/cm2: time 3 to 5 sec.  
Real bonding 165 to 180°C: pressure 25 to 45 kg/cm2: time 30 to 40 sec.  
(When using the anisotropy conductive film SUMIZAC1003 of  
Sumitomo Bakelite,Ltd).  
(Adhesive  
Conductive Film)  
Caution To find out the detailed conditions for mounting the ACF part, please contact the ACF  
manufacturing company. Be sure to avoid using two or more mounting methods at a time.  
9
Data Sheet S14085EJ1V1DS00  
µ
PD16700  
[MEMO]  
10  
Data Sheet S14085EJ1V1DS00  
µ
PD16700  
NOTES FOR CMOS DEVICES  
1
PRECAUTION AGAINST ESD FOR SEMICONDUCTORS  
Note:  
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and  
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity  
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control  
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using  
insulators that easily build static electricity. Semiconductor devices must be stored and transported  
in an anti-static container, static shielding bag or conductive material. All test and measurement  
tools including work bench and floor should be grounded. The operator should be grounded using  
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need  
to be taken for PW boards with semiconductor devices on it.  
2
HANDLING OF UNUSED INPUT PINS FOR CMOS  
Note:  
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided  
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence  
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels  
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused  
pin should be connected to VDD or GND with a resistor, if it is considered to have a possibility of  
being an output pin. All handling related to the unused pins must be judged device by device and  
related specifications governing the devices.  
3
STATUS BEFORE INITIALIZATION OF MOS DEVICES  
Note:  
Power-on does not necessarily define initial status of MOS device. Production process of MOS  
does not define the initial operation status of the device. Immediately after the power source is  
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does  
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the  
reset signal is received. Reset operation must be executed immediately after power-on for devices  
having reset function.  
11  
Data Sheet S14085EJ1V1DS00  
µ
PD16700  
Reference Documents  
NEC Semiconductor Device Reliability/Quality Control System(C10983E)  
Quality Grades to NEC’s Semiconductor Devices(C11531E)  
The information in this document is current as of July, 2000. The information is subject to change  
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data  
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products  
and/or types are available in every country. Please check with an NEC sales representative for  
availability and additional information.  
No part of this document may be copied or reproduced in any form or by any means without prior  
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.  
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of  
third parties by or arising from the use of NEC semiconductor products listed in this document or any other  
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any  
patents, copyrights or other intellectual property rights of NEC or others.  
Descriptions of circuits, software and other related information in this document are provided for illustrative  
purposes in semiconductor product operation and application examples. The incorporation of these  
circuits, software and information in the design of customer's equipment shall be done under the full  
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third  
parties arising from the use of these circuits, software and information.  
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers  
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize  
risks of damage to property or injury (including death) to persons arising from defects in NEC  
semiconductor products, customers must incorporate sufficient safety measures in their design, such as  
redundancy, fire-containment, and anti-failure features.  
NEC semiconductor products are classified into the following three quality grades:  
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products  
developed based on a customer-designated "quality assurance program" for a specific application. The  
recommended applications of a semiconductor product depend on its quality grade, as indicated below.  
Customers must check the quality grade of each semiconductor product before using it in a particular  
application.  
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio  
and visual equipment, home electronic appliances, machine tools, personal electronic equipment  
and industrial robots  
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster  
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed  
for life support)  
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life  
support systems and medical equipment for life support, etc.  
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's  
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not  
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness  
to support a given application.  
(Note)  
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.  
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for  
NEC (as defined above).  
M8E 00. 4  

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