UPD16700N [NEC]
256-OUTPUT TFT-LCD GATE DRIVER; 256输出TFT -LCD栅极驱动器型号: | UPD16700N |
厂家: | NEC |
描述: | 256-OUTPUT TFT-LCD GATE DRIVER |
文件: | 总12页 (文件大小:77K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
DATA SHEET
MOS INTEGRATED CIRCUIT
µ
PD16700
256-OUTPUT TFT-LCD GATE DRIVER
DESCRIPTION
The µ PD16700 is a TFT-LCD gate driver equipped with 256-output lines. It can output a high-gate scanning
voltage in response to CMOS level input because it provided with a level-shift circuit inside the IC circuit. It can also
drive the XGA/SXGA panel.
FEATURES
• CMOS level input (3.3 V)
• 256 outputs
DD2
EE2
• High-output voltage (V -V
= amplitude: 40 V MAX.)
• Capable of All-on outputting (AO)
ORDERING INFORMATION
Part Number
Package
TCP (TAB package)
µ PD16700N-xxx
Remark The TCP’s external shape is customized. To order the required shape, please contact an one of our sales
representatives.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. S14085EJ1V1DS00 (1st edition)
Date Published July 2000 NS CP (K)
The mark • shows major revised points.
1999
©
Printed in Japan
µ
PD16700
1. BLOCK DIAGRAM
LS1Note
R,/L
LS1Note
CLK
LS1Note
LS1Note
LS1Note
STVL
Note
STVR
LS1
256-bit shift register
SR1 SR2 SR3
SR255 SR256
SR254
OE
1
OE
2
LS1Note
LS1Note
OE
3
AO
LS2Note
LS2Note LS2Note
LS2Note LS2Note LS2Note
VEE2
O
254
O
255
O
256
O
2
O
3
O
1
Note LS1: shifts CMOS level and internal level, LS2: shifts interval level and output level (VDD2-VEE2).
Remark /xxx indicates active low signal.
2
Data Sheet S14085EJ1V1DS00
µ
PD16700
2. PIN CONFIGURATION (µ PD16700N-xxx)
O1
O2
O3
VEE2
VEE1
VSS
STVR
R,/L
CLK
OE1
OE2
OE3
STVL
AO
Copper
foil
Surface
VDD1
VDD2
O254
O255
O256
Remark This figure does not specify the TCP package.
3
Data Sheet S14085EJ1V1DS00
µ
PD16700
3. PIN FUNCTIONS
Pin Symbol
O1 to O256
Pin Name
Driver output
Description
These pins output scan signals that drive the vertical direction (gate lines) of a TFT-LCD.
The output signals change in synchronization with the rising edge of shift clock CLK. The
driver output amplitude is VDD2 - VEE2.
R,/L
Shift direction select R,/L = H (right shift) : STVR → O1 → O256 → STVL
input
R,/L = L (left shift) : STVL → O256 → O1 → STVR
STVR,
STVL
Start pulse
input/output
This is the input of the internal shift register. The start pulse is read at the rising edge of shift
clock CLK, and scan signals are output from the driver output pins. The input level is a
CMOS (3.3 V) level. The start pulse is output at the falling edge of the 256th clock of shigt
clock CLK, and is cleared at the falling edge of the 257th clock. The output level is VDD1 -
VSS (logic level).
CLK
Shift clock input
This pin inputs a shift clock to the internal shift register.
The shift operation is performed in synchronization with the rising edge of this input.
OE1,OE2,OE3 Output enable input When this pin goes H, the driver output is fixed to VEE2 level.
The shift register is not cleared.
OE1: O1, O4, ... O250, O253, O256
OE1: O2, O5, ... O251, O254
OE1: O3, O6, ... O252, O255
•
AO
All-on control
When this pin goes L, the driver output is fixed to VDD2 level. The shift register is not cleared.
This pin has priority over OE1 to OE3.
VDD1
VDD2
Logic power supply 3.3 V ± 0.3 V
Driver positive power 15 to 25 V
supply
The driver output : H level
VSS
Logic ground
Connect this pin to the ground of the system.
–15 to –5 V
VEE1
Negative Power
supply for internal
operation
VEE2
Driver negative
power supply
The driver output : L level (VEE2-VEE1 < 6.0 V)
Cautions 1. To prevent latch up, turn on power to VDD1, VEE1/2, VDD2, and logic input in this order. Turn off
power in the reverse order. These power up/down sequence must be observed also during
transition period.
2. Insert a capacitor of about 0.1 µF between each power line, as shown below, to secure noise
margin such as VIH and VIL.
V
DD2
DD1
V
0.1
F
µ
µ
µ
0.1
0.1
F
VSS
F
V
EE1/2
4
Data Sheet S14085EJ1V1DS00
µ
PD16700
•
4. TIMING CHART (R,/L = H, AO = H)
1
2
3
255
256
257
258
259
CLK
OE1
OE
2
3
OE
STVR
(STVL)
O
1
(O256
)
)
O
2
(O255
O
3
(O254
)
O255
(O2)
O256
(O1)
STVL
(STVR)
O1
of next stage
(O256 of next stage)
O
2
of next stage
(O255 of next stage)
5
Data Sheet S14085EJ1V1DS00
µ
PD16700
5. ELECTRICAL SPECIFICATIONS
Absolute Maximum Ratings (TA = 25°C, VSS = 0 V)
Parameter
Logic Supply Voltage
Symbol
Rating
–0.5 to +7.0
Unit
V
VDD1
Driver Positive Supply Voltage
Power Supply Voltage
VDD2
–0.5 to +28
V
VDD2-VEE1, VEE2
–0.5 to +42
V
Internal Operation Negative Supply Voltage
Driver Negative Supply Voltage
Input Voltage
VEE1
VEE2
VI
–16 to + 0.5
V
VEE1 – 0.3 to VEE1 + 7.0
–0.5 to VDD1 + 0.5
–20 to +75
V
V
Operating Ambient Temperature
Storage Temperature
TA
°C
°C
Tstg
–55 to +125
•
Caution Product quality may suffer if the absolute maximum rating is exceeded even momentarily for any
parameter. That is, the absolute maximum ratings are rated values at which the product is on the
verge of suffering physical damage, and therefore the product must be used under conditions that
ensure that the absolute maximum ratings are not exceeded.
Recommended Operating Range (TA = –20 to +75°C, VSS = 0 V)
Parameter
Logic Supply Voltage
Symbol
VDD1
MIN.
3.0
15
TYP.
3.3
23
MAX.
3.6
Unit
V
Driver Positive Supply Voltage
Internal Operation Negative Supply Voltage
Power Supply Voltage
VDD2
25
V
VEE1
–15
20
–10
33
–5.0
40
V
VDD2-VEE1
VEE2-VEE1
fCLK
V
0
6.0
V
Clock Frequency
100
kHz
Electrical Characteristics (TA = –20 to +75°C, VDD1 = 3.3 V ± 0.3 V, VDD2 = 23 V, VEE1 = VEE2 = –10 V, VSS = 0 V)
Parameter
High-level Input Voltage
Low-level Input Voltage
Symbol
VIH
Condition
CLK, STVR (STVL), R,/L,
OE1-OE3
MIN.
0.8 VDD1
VSS
TYP.
MAX.
VDD1
Unit
V
VIL
0.2 VDD1
VDD1
V
High-level Output Voltage
Low-level Output Voltage
LCD Driver Output ON Resistance
VOH
VOL
STVR (STVL), IOH = –40 µA VDD1 – 0.4
V
STVR (STVL), IOL = +40 µA
VSS
VSS + 0.4
1.0
V
RON
VOUT = VEE2 + 1.0 V, or
VDD2 – 1.0 V
kΩ
Input Leak Current
IIL
VI = 0 V or 3.6 V
±1.0
µA
µA
Static Current Dissipation
IDD1
VDD1, fCLK = 50 kHz,
OE1 = OE2 = OE3 = L,
fSTV = 60 Hz, no load
VDD2, fCLK = 50 kHz,
OE1 = OE2 = OE3 = L,
fSTV = 60 Hz, no load
VEE1, fCLK = 50 kHz,
OE1 = OE2 = OE3 = L,
fSTV = 60 Hz, no load
500
50
1000
IDD2
100
µA
µA
IEE
–1100
–550
6
Data Sheet S14085EJ1V1DS00
µ
PD16700
Switching Characteristics (TA = –20 to +75 °C, VDD1 = 3.3 V ± 0.3 V, VDD2 = 23 V, VEE1 = VEE2 = –10 V, VSS = 0 V)
Parameter
Symbol
tPHL1
tPLH1
tPHL2
tPLH2
tPHL3
tPLH3
tTLH
Condition
CL = 20 pF,
MIN.
TYP.
MAX.
800
800
800
800
800
800
350
350
15
Unit
ns
ns
ns
ns
ns
ns
ns
ns
pF
Cascade Output Delay Time
CLK → STVL (STVR)
CL = 300 pF, CLK → On
Driver Output Delay Time
CL = 300 pF, OEn → On
CL = 300 pF
Output Rise Time
Output Fall Time
Input Capacitance
tTHL
CI
TA = 25 °C
Timing Requirements (TA = –20 to +75°C, VDD1 = 3.3 V ± 0.3 V, VDD2 = 23 V, VEE1 = VEE2 = –10 V, VSS = 0 V)
Parameter
Clock Pulse High Width
Clock Pulse Low Width
Enable Pulse Width
Data Setup Time
Symbol
PWCLK(H)
PWCLK(L)
PWOE
Condition
MIN.
500
500
1.0
TYP.
MAX.
Unit
ns
ns
µs
tSETUP
STVR (STVL) ↑ → CLK ↑
CLK ↑ → STVR(STVL) ↓
200
200
ns
Data Hold Time
tHOLD
ns
Caution Keep the time and fall time of the logic input to tr = tf = 20 ns (10 to 90 % of the rated values).
Remark Unless otherwise specified, the input level is defined to be VIH = 0.8 VDD1, VIL = 0.2 VDD1. For details, refer
to 6. SWITCHING CHARACTERISTIC WAVEFORM.
7
Data Sheet S14085EJ1V1DS00
PWCLK(L)
PWCLK(H)
2
t
r
tf
50 %
256
90%
50 %
1
3
4
5
6
7
CLK
253
254
255
10%
t
SETUP
t
HOLD
50 %
STVR
t
PLH2
tPHL2
90 %
O
1
10 %
90%
10%
O
2
t
TLH
tTHL
•
•
•
O
255
O
256
t
PHL1
t
PLH1
50 %
STVL
OE
PWOE
50 %
t
PHL3
t
PLH3
µ
µ
90 %
O1-
O256
10 %
µ
PD16700
7. RECOMMENDED MOUNTING CONDITIONS
The following conditions must be met for mounting conditions of the µ PD16700.
For more details, refer to the Semiconductor Device Mounting Technology Manual (C10535E).
Please consult with our sales offices in case other mounting process is used, or in case the mounting is done under
different conditions.
µ PD16700N-xxx : TCP (TAB Package)
Mounting Condition
Thermocompression
Mounting Method
Soldering
Condition
Heating tool 300 to 350°C, heating for 2 to 3 seconds : pressure 100g
(per solder)
ACF
Temporary bonding 70 to 100°C: pressure 3 to 8 kg/cm2: time 3 to 5 sec.
Real bonding 165 to 180°C: pressure 25 to 45 kg/cm2: time 30 to 40 sec.
(When using the anisotropy conductive film SUMIZAC1003 of
Sumitomo Bakelite,Ltd).
(Adhesive
Conductive Film)
Caution To find out the detailed conditions for mounting the ACF part, please contact the ACF
manufacturing company. Be sure to avoid using two or more mounting methods at a time.
9
Data Sheet S14085EJ1V1DS00
µ
PD16700
[MEMO]
10
Data Sheet S14085EJ1V1DS00
µ
PD16700
NOTES FOR CMOS DEVICES
1
PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note:
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using
insulators that easily build static electricity. Semiconductor devices must be stored and transported
in an anti-static container, static shielding bag or conductive material. All test and measurement
tools including work bench and floor should be grounded. The operator should be grounded using
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need
to be taken for PW boards with semiconductor devices on it.
2
HANDLING OF UNUSED INPUT PINS FOR CMOS
Note:
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
pin should be connected to VDD or GND with a resistor, if it is considered to have a possibility of
being an output pin. All handling related to the unused pins must be judged device by device and
related specifications governing the devices.
3
STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note:
Power-on does not necessarily define initial status of MOS device. Production process of MOS
does not define the initial operation status of the device. Immediately after the power source is
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after power-on for devices
having reset function.
11
Data Sheet S14085EJ1V1DS00
µ
PD16700
Reference Documents
NEC Semiconductor Device Reliability/Quality Control System(C10983E)
Quality Grades to NEC’s Semiconductor Devices(C11531E)
•
The information in this document is current as of July, 2000. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
•
•
No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
•
•
•
Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
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responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
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While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
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semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
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(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
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M8E 00. 4
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