BAS45A [NEXPERIA]

Low-leakage diodeProduction;
BAS45A
型号: BAS45A
厂家: Nexperia    Nexperia
描述:

Low-leakage diodeProduction

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DISCRETE SEMICONDUCTORS  
DATA SHEET  
book, halfpage  
BAS45A  
Low-leakage diode  
Product data sheet  
1996 Mar 13  
Supersedes data of June 1994  
NXP Semiconductors  
Product data sheet  
Low-leakage diode  
BAS45A  
FEATURES  
DESCRIPTION  
Continuous reverse voltage:  
max. 125 V  
Epitaxial medium-speed switching diode with a low leakage current in a  
hermetically-sealed glass SOD68 (DO-34) package.  
Repetitive peak forward current:  
max. 625 mA  
Low reverse current: max. 1 nA  
Switching time: typ. 1.5 μs.  
k
a
handbook, halfpage  
MAM156  
APPLICATION  
Fig.1 Simplified outline (SOD68; DO-34) and symbol.  
Low leakage current applications.  
LIMITING VALUES  
In accordance with the Absolute Maximum Rating System (IEC 134).  
SYMBOL  
PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VRRM  
VR  
repetitive peak reverse voltage  
continuous reverse voltage  
continuous forward current  
repetitive peak forward current  
125  
125  
250  
625  
V
V
IF  
see Fig.2; note 1  
mA  
mA  
IFRM  
IFSM  
non-repetitive peak forward current square wave; Tj = 25 °C prior to  
surge; see Fig.4  
tp = 1 μs  
tp = 1 ms  
tp = 1 s  
4
1
A
A
0.5  
A
Ptot  
Tstg  
Tj  
total power dissipation  
storage temperature  
junction temperature  
Tamb = 25 °C  
300  
+175  
175  
mW  
°C  
°C  
65  
Note  
1. Device mounted on a printed-circuit board without metallization pad.  
1996 Mar 13  
2
NXP Semiconductors  
Product data sheet  
Low-leakage diode  
BAS45A  
ELECTRICAL CHARACTERISTICS  
Tj = 25 °C unless otherwise specified.  
SYMBOL  
PARAMETER  
forward voltage  
CONDITIONS  
TYP.  
MAX.  
UNIT  
VF  
see Fig.3  
IF = 1 mA  
IF = 10 mA  
780 mV  
860 mV  
IF = 100 mA  
1000 mV  
IR  
reverse current  
see Fig.5  
VR = 125 V; Emax = 100 lx  
VR = 30 V; Tj = 125 °C; Emax = 100 lx  
VR = 125 V; Tj = 125 °C; Emax = 100 lx  
VR = 125 V; Tj = 150 °C; Emax = 100 lx  
f = 1 MHz; VR = 0; see Fig.6  
1
nA  
300 nA  
500 nA  
2
4
μA  
pF  
μs  
Cd  
trr  
diode capacitance  
reverse recovery time  
when switched from IF = 10 mA to  
IR = 10 mA; RL = 100 Ω; measured at  
IR = 1 mA; see Fig.7  
1.5  
THERMAL CHARACTERISTICS  
SYMBOL  
Rth j-tp  
PARAMETER  
CONDITIONS  
thermal resistance from junction to tie-point 8 mm from the body  
thermal resistance from junction to ambient lead length 10 mm; note 1  
VALUE  
300  
UNIT  
K/W  
K/W  
Rth j-a  
500  
Note  
1. Device mounted on a printed-circuit board without metallization pad.  
1996 Mar 13  
3
NXP Semiconductors  
Product data sheet  
Low-leakage diode  
BAS45A  
GRAPHICAL DATA  
MBG523  
MBG522  
300  
300  
handbook, halfpage  
handbook, halfpage  
I
I
F
F
(mA)  
(mA)  
(1)  
(2) (3)  
200  
200  
100  
100  
0
0
0
o
0
100  
200  
0.5  
1.0  
1.5  
T
( C)  
V
(V)  
amb  
F
(1) Tj = 150 °C; typical values.  
(2) Tj = 25 °C; typical values.  
(3) Tj = 25 °C; maximum values.  
Device mounted on a printed-circuit board without metallization pad.  
Fig.2 Maximum permissible continuous forward  
current as a function of ambient temperature.  
Fig.3 Forward current as a function of forward  
voltage.  
MBG704  
2
10  
I
FSM  
(A)  
10  
1
1  
10  
2
3
4
1
10  
10  
10  
10  
t
(μs)  
p
Based on square wave currents;Tj = 25 °C prior to surge.  
Fig.4 Maximum permissible non-repetitive peak forward current as a function of pulse duration.  
1996 Mar 13  
4
NXP Semiconductors  
Product data sheet  
Low-leakage diode  
BAS45A  
MBG524  
MBD456  
3
4
10  
handbook, halfpage  
handbook, halfpage  
I
C
R
(nA)  
d
(pF)  
2
3
10  
max  
2
10  
typ  
10  
1
1
1
10  
0
0
0
50  
100  
150  
o
5
10  
15  
20  
T
( C)  
j
V
(V)  
R
VR = 125 V.  
f = 1 MHz; Tj = 25 °C.  
Fig.5 Reverse current as a function of junction  
temperature.  
Fig.6 Diode capacitance as a function of reverse  
voltage; typical values.  
t
t
p
r
t
D.U.T.  
I
10%  
I
t
R
= 50 Ω  
F
F
rr  
S
SAMPLING  
t
OSCILLOSCOPE  
R = 50 Ω  
V = V  
I x R  
F S  
R
i
(1)  
90%  
V
R
MGA881  
input signal  
output signal  
Fig.7 Reverse recovery time test circuit and waveforms.  
1996 Mar 13  
5
NXP Semiconductors  
Product data sheet  
Low-leakage diode  
BAS45A  
PACKAGE OUTLINE  
0.55  
max  
1.6  
max  
3.04  
max  
25.4 min  
25.4 min  
MSA212 - 1  
Dimensions in mm.  
The black marking band indicates the cathode.  
Fig.8 SOD68 (DO-34).  
1996 Mar 13  
6
NXP Semiconductors  
Product data sheet  
Low-leakage diode  
BAS45A  
DATA SHEET STATUS  
DOCUMENT  
STATUS(1)  
PRODUCT  
STATUS(2)  
DEFINITION  
Objective data sheet  
Development  
This document contains data from the objective specification for product  
development.  
Preliminary data sheet  
Product data sheet  
Qualification  
Production  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Notes  
1. Please consult the most recently issued document before initiating or completing a design.  
2. The product status of device(s) described in this document may have changed since this document was published  
and may differ in case of multiple devices. The latest product status information is available on the Internet at  
URL http://www.nxp.com.  
DISCLAIMERS  
above those given in the Characteristics sections of this  
document is not implied. Exposure to limiting values for  
extended periods may affect device reliability.  
General Information in this document is believed to be  
accurate and reliable. However, NXP Semiconductors  
does not give any representations or warranties,  
expressed or implied, as to the accuracy or completeness  
of such information and shall have no liability for the  
consequences of use of such information.  
Terms and conditions of sale NXP Semiconductors  
products are sold subject to the general terms and  
conditions of commercial sale, as published at  
http://www.nxp.com/profile/terms, including those  
pertaining to warranty, intellectual property rights  
infringement and limitation of liability, unless explicitly  
otherwise agreed to in writing by NXP Semiconductors. In  
case of any inconsistency or conflict between information  
in this document and such terms and conditions, the latter  
will prevail.  
Right to make changes NXP Semiconductors  
reserves the right to make changes to information  
published in this document, including without limitation  
specifications and product descriptions, at any time and  
without notice. This document supersedes and replaces all  
information supplied prior to the publication hereof.  
No offer to sell or license Nothing in this document  
may be interpreted or construed as an offer to sell products  
that is open for acceptance or the grant, conveyance or  
implication of any license under any copyrights, patents or  
other industrial or intellectual property rights.  
Suitability for use NXP Semiconductors products are  
not designed, authorized or warranted to be suitable for  
use in medical, military, aircraft, space or life support  
equipment, nor in applications where failure or malfunction  
of an NXP Semiconductors product can reasonably be  
expected to result in personal injury, death or severe  
property or environmental damage. NXP Semiconductors  
accepts no liability for inclusion and/or use of NXP  
Semiconductors products in such equipment or  
applications and therefore such inclusion and/or use is at  
the customer’s own risk.  
Export control This document as well as the item(s)  
described herein may be subject to export control  
regulations. Export might require a prior authorization from  
national authorities.  
Quick reference data The Quick reference data is an  
extract of the product data given in the Limiting values and  
Characteristics sections of this document, and as such is  
not complete, exhaustive or legally binding.  
Applications Applications that are described herein for  
any of these products are for illustrative purposes only.  
NXP Semiconductors makes no representation or  
warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Limiting values Stress above one or more limiting  
values (as defined in the Absolute Maximum Ratings  
System of IEC 60134) may cause permanent damage to  
the device. Limiting values are stress ratings only and  
operation of the device at these or any other conditions  
1996 Mar 13  
7
NXP Semiconductors  
Customer notification  
This data sheet was changed to reflect the new company name NXP Semiconductors. No changes were  
made to the content, except for the legal definitions and disclaimers.  
Contact information  
For additional information please visit: http://www.nxp.com  
For sales offices addresses send e-mail to: salesaddresses@nxp.com  
© NXP B.V. 2009  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.  
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed  
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license  
under patent- or other industrial or intellectual property rights.  
Printed in The Netherlands  
1996 Mar 13  

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