5962-87549 [NSC]
Quad 2-Input NAND Gate; 四路2输入与非门
| 型号： | 5962-87549 |
| 厂家： | 
National Semiconductor |
| 描述： | Quad 2-Input NAND Gate |
| 文件： | 总6页 (文件大小：130K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
July 2003
54AC00/54ACT00
Quad 2-Input NAND Gate
n Standard Microcircuit Drawing (SMD)
— ’AC00: 5962-87549
— ’ACT00: 5962-87699
General Description
The ’AC/’ACT00 contains four 2-input NAND gates.
n 54AC00 now qualified to 300Krad RHA designation,
refer to the SMD for more information
Features
n ICC reduced by 50%
n Outputs source/sink 24 mA
n ’ACT00 has TTL-compatible inputs
Logic Symbol
Pin Names
An, Bn
On
Description
Inputs
IEEE/IEC
Outputs
10025701
Connection Diagrams
Pin Assignment for
DIP and Flatpak
Pin Assignment
for LCC
10025703
10025702
FACT® is a registered trademark of Fairchild Semiconductor Corporation.
© 2003 National Semiconductor Corporation
DS100257
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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Recommended Operating
Conditions
Supply Voltage (VCC
)
’AC
2.0V to 6.0V
4.5V to 5.5V
0V to VCC
Supply Voltage (VCC
)
−0.5V to +7.0V
’ACT
DC Input Diode Current (IIK
VI = −0.5V
)
Input Voltage (VI)
Output Voltage (VO)
−20 mA
+20 mA
0V to VCC
VI = VCC + 0.5V
Operating Temperature (TA)
54AC/ACT
DC Input Voltage (VI)
−0.5V to VCC +
−55˚C to +125˚C
125 mV/ns
0.5V
Minimum Input Edge Rate (∆V/∆t)
’AC Devices
DC Output Diode Current (IOK
VO = −0.5V
)
−20 mA
+20 mA
VIN from 30% to 70% of VCC
VO = VCC + 0.5V
@
VCC 3.3V, 4.5V, 5.5V
DC Output Voltage (VO)
−0.5V to VCC
+
Minimum Input Edge Rate (∆V/∆t)
’ACT Devices
0.5V
DC Output Source
VIN from 0.8V to 2.0V
or Sink Current (IO)
50 mA
@
VCC 4.5V, 5.5V
125 mV/ns
DC VCC or Ground Current
per Output Pin (ICC or IGND
)
50 mA
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation of FACT® circuits outside databook specifications.
Storage Temperature (TSTG
Junction Temperature (TJ)
CDIP
)
−65˚C to +150˚C
175˚C
DC Characteristics for ’AC Family Devices
54AC
Symbol
Parameter
VCC
(V)
TA
=
Units
Conditions
−55˚C to +125˚C
Guaranteed Limits
VIH
Minimum High Level
Input Voltage
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
2.1
3.15
3.85
0.9
VOUT = 0.1V
V
V
V
or VCC − 0.1V
VIL
Maximum Low Level
Input Voltage
VOUT = 0.1V
1.35
1.65
2.9
or VCC − 0.1V
VOH
Minimum High Level
Output Voltage
IOUT = −50 µA
4.4
5.4
(Note 2)
VIN = VIL or VIH
IOH = −12 mA
IOH = −24 mA
IOH = −24 mA
IOUT = 50 µA
3.0
4.5
5.5
3.0
4.5
5.5
2.4
3.7
4.7
0.1
0.1
0.1
V
V
VOL
Maximum Low Level
Output Voltage
(Note 2)
VIN = VIL or VIH
IOL = 12 mA
IOL = 24 mA
IOL = 24 mA
VI = VCC, GND
3.0
4.5
5.5
5.5
0.5
0.5
0.5
1.0
V
IIN
Maximum Input
Leakage Current
µA
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2
DC Characteristics for ’AC Family Devices (Continued)
54AC
Symbol
Parameter
VCC
(V)
TA
=
Units
Conditions
−55˚C to +125˚C
Guaranteed Limits
IOLD
IOHD
ICC
Minimum Dynamic
5.5
5.5
5.5
50
mA
mA
µA
VOLD = 1.65V Max
VOHD = 3.85V Min
VIN = VCC
Output Current (Note 4)
−50
40.0
Maximum Quiescent
Supply Current
or GND
Note 2: All outputs loaded; thresholds on input associated with output under test.
@
@
Note 3: I and I
3.0V are guaranteed to be less than or equal to the respective limit 5.5V V
.
.
IN
CC
CC
@ @
for 54AC 25˚C is identical to 74AC 25˚C.
I
CC
Note 4: Maximum test duration 2.0 ms, one output loaded at a time.
@
CC
@
3.0V are guaranteed to be less than or equal to the respective limit 5.5V V
Note 5: I and I
IN
CC
@ @
for 54AC 25˚C is identical to 74AC 25˚C.
I
CC
DC Characteristics for ’ACT Family Devices
54ACT
Symbol
Parameter
VCC
(V)
TA
=
Units
Conditions
−55˚C to +125˚C
Guaranteed Limits
VIH
VIL
Minimum High Level
Input Voltage
4.5
5.5
4.5
5.5
4.5
5.5
2.0
2.0
0.8
0.8
4.4
5.4
V
V
V
VOUT = 0.1V
or VCC − 0.1V
VOUT = 0.1V
or VCC − 0.1V
IOUT = −50 µA
Maximum Low Level
Input Voltage
VOH
Minimum High Level
Output Voltage
(Note 6)
VIN = VIL or VIH
IOH = −24 mA
IOH = −24 mA
IOUT = 50 µA
4.5
5.5
4.5
5.5
3.70
4.70
0.1
V
V
VOL
Maximum Low Level
Output Voltage
0.1
(Note 6)
VIN = VIL or VIH
IOL = 24 mA
IOL = 24 mA
VI = VCC, GND
4.5
5.5
5.5
0.50
0.50
1.0
V
IIN
Maximum Input
Leakage Current
Maximum
µA
mA
ICCT
5.5
1.6
VI = VCC − 2.1V
I
CC/Input
IOLD
IOHD
ICC
Minimum Dynamic
5.5
5.5
5.5
50
mA
mA
µA
VOLD = 1.65V Max
VOHD = 3.85V Min
VIN = VCC
Output Current (Note 7)
−50
40.0
Maximum Quiescent
Supply Current
or GND
Note 6: All outputs loaded; thresholds on input associated with output under test.
Note 7: Maximum test duration 2.0 ms, one output loaded at a time.
@ @
for 54ACT 25˚C is identical to 74ACT 25˚C.
Note 8: I
CC
3
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AC Electrical Characteristics
54AC
VCC
(V)
TA = −55˚C
to +125˚C
CL = 50 pF
Fig.
No.
Symbol
Parameter
Units
(Note 9)
Min
1.0
1.5
1.0
1.5
Max
11.0
8.5
tPLH
tPHL
Propagation Delay
Propagation Delay
3.3
5.0
3.3
5.0
ns
ns
9.0
7.0
Note 9: Voltage Range 3.3 is 3.3V 0.3V
Voltage Range 5.0 is 5.0V 0.5V
AC Electrical Characteristics
54ACT
VCC
(V)
TA = −55˚C
to +125˚C
CL = 50 pF
Fig.
No.
Symbol
Parameter
Units
(Note 10)
Min
1.5
1.5
Max
9.5
tPLH
tPHL
Propagation Delay
Propagation Delay
5.0
5.0
ns
ns
8.0
Note 10: Voltage Range 5.0 is 5.0V 0.5V
Capacitance
Symbol
Parameter
Typ
4.5
Units
Conditions
CIN
Input Capacitance
Power Dissipation
Capacitance
pF
pF
VCC = Open
VCC = 5.0V
CPD
30.0
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4
Physical Dimensions inches (millimeters) unless otherwise noted
20 Terminal Ceramic Leadless Chip Carrier (L)
NS Package Number E20A
14 Lead Ceramic Dual-In-Line Package (D)
NS Package Number J14A
5
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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14 Lead Ceramic Flatpak (F)
NS Package Number W14B
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systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and
whose failure to perform when properly used in
accordance with instructions for use provided in the
labeling, can be reasonably expected to result in a
significant injury to the user.
2. A critical component is any component of a life
support device or system whose failure to perform
can be reasonably expected to cause the failure of
the life support device or system, or to affect its
safety or effectiveness.
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