ADC12H034CIMSAX

更新时间:2024-09-18 06:22:50
品牌:NSC
描述:Self-Calibrating 12-Bit Plus Sign Serial I/O A/D Converters with MUX and Sample/Hold

ADC12H034CIMSAX 概述

Self-Calibrating 12-Bit Plus Sign Serial I/O A/D Converters with MUX and Sample/Hold 自校准12位加符号位串行I / OA / D转换器,带有MUX和采样/保持 模数转换器

ADC12H034CIMSAX 规格参数

是否Rohs认证:不符合生命周期:Transferred
包装说明:EIAJ, SSOP-24Reach Compliance Code:not_compliant
ECCN代码:EAR99HTS代码:8542.39.00.01
风险等级:5.44Is Samacsys:N
最大模拟输入电压:5.55 V最小模拟输入电压:-0.05 V
最长转换时间:5.5 µs转换器类型:ADC, SUCCESSIVE APPROXIMATION
JESD-30 代码:R-PDSO-G24JESD-609代码:e0
长度:8.2 mm最大线性误差 (EL):0.0244%
湿度敏感等级:1模拟输入通道数量:4
位数:12功能数量:1
端子数量:24最高工作温度:85 °C
最低工作温度:-40 °C输出位码:2'S COMPLEMENT BINARY
输出格式:SERIAL封装主体材料:PLASTIC/EPOXY
封装代码:SSOP封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, SHRINK PITCH峰值回流温度(摄氏度):235
认证状态:Not Qualified采样并保持/跟踪并保持:SAMPLE
座面最大高度:2 mm标称供电电压:5 V
表面贴装:YES温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn85Pb15)端子形式:GULL WING
端子节距:0.65 mm端子位置:DUAL
处于峰值回流温度下的最长时间:30宽度:5.3 mm
Base Number Matches:1

ADC12H034CIMSAX 数据手册

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April 2007  
ADC12H030/ADC12H032/ADC12H034/ADC12H038,  
ADC12030/ADC12032/ADC12034/ADC12038  
Self-Calibrating 12-Bit Plus Sign Serial I/O A/D Converters  
with MUX and Sample/Hold  
General Description  
Some device/package combinations are obsolete and  
shown for reference only.  
The ADC12030, and ADC12H030 families are 12-bit plus sign  
successive approximation A/D converters with serial I/O and  
configurable input multiplexers. The ADC12034/ADC12H034  
and ADC12038/ADC12H038 have 4 and 8 channel multiplex-  
ers, respectively. The differential multiplexer outputs and A/D  
inputs are available on the MUXOUT1, MUXOUT2, A/DIN1  
and A/DIN2 pins. The ADC12030/ADC12H030 has a two  
channel multiplexer with the multiplexer outputs and A/D in-  
puts internally connected. The ADC12030 family is tested  
with a 5 MHz clock, while the ADC12H030 family is tested  
with an 8 MHz clock. On request, these A/Ds go through a  
self calibration process that adjusts linearity, zero and full-  
scale errors to less than ±1 LSB each.  
Features  
Serial I/O (MICROWIRE Compatible)  
2, 4, or 8 chan differential or single-ended multiplexer  
Analog input sample/hold function  
Power down mode  
Variable resolution and conversion rate  
Programmable acquisition time  
Variable digital output word length and format  
No zero or full scale adjustment required  
Fully tested and guaranteed with a 4.096V reference  
0V to 5V analog input range with single 5V power supply  
No Missing Codes over temperature  
Key Specifications  
Resolution  
12-bit plus sign conversion time  
– ADC12H30 family  
The analog inputs can be configured to operate in various  
combinations of single-ended, differential, or pseudo-differ-  
ential modes. A fully differential unipolar analog input range  
(0V to +5V) can be accommodated with a single +5V supply.  
In the differential modes, valid outputs are obtained even  
when the negative inputs are greater than the positive be-  
cause of the 12-bit plus sign output data format.  
12-bit plus sign  
5.5 µs (max)  
8.8 µs (max)  
– ADC12030 family  
12-bit plus sign throughput time  
– ADC12H30 family  
The serial I/O is configured to comply with NSC MICROWIRE.  
For voltage references see the LM4040, LM4050 or LM4041.  
8.6 µs (max)  
14 µs (max)  
– ADC12030 family  
±1 LSB (max)  
Integral Linearity Error  
Single Supply  
Power consumption  
– Power down  
5V ±10%  
33 mW (max)  
100 µW (typ)  
Applications  
Medical instruments  
Process control systems  
Test equipment  
TRI-STATE® is a registered trademark of National Semiconductor Corporation.  
© 2007 National Semiconductor Corporation  
11354  
www.national.com  
ADC12038 Simplified Block Diagram  
1135401  
Connection Diagrams  
16-Pin Wide Body  
SO Packages  
20-Pin Wide Body  
SO Packages  
1135406  
Top View  
1135407  
Top View  
www.national.com  
2
24-Pin Wide Body  
SO, DIP, SSOP-EIAJ Packages  
28-Pin Wide Body  
SO Packages  
1135408  
Top View  
1135409  
Top View  
Ordering Information  
Industrial Temperature Range  
−40°C TA +85°C  
ADC12H030CIWM,  
ADC12030CIWM  
ADC12030CIWMX  
ADC12032CIWM  
ADC12034CIN  
Package  
M16B, Wide Body SO  
M16B, Wide Body SO - Tape & Reel  
M20B, Wide Body SO  
N24C, Dual-In-Line  
ADC12034CIWM  
ADC12H034CIMSA  
ADC12H034CIMSAX  
M24B, Wide Body SO  
MSA24, SSOP  
MSA24, SSOP - Tape & Reel  
ADC12H038CIWM,  
ADC12038CIWM  
M28B, Wide Body SO  
ADC12H038CIWMX,  
ADC12038CIWMX  
M28B, Wide Body SO - Tape & Reel  
* Some of these product/package combinations are on lifetime buy or are obsolete and shown here for reference only. Check our  
web site for product/package availability.  
3
www.national.com  
STATE. With CS low the falling edge  
of SCLK shifts the data resulting  
from the previous ADC conversion  
out on DO, with the exception of the  
first bit of data. When CS is low con-  
tinuously, the first bit of the data is  
clocked out on the rising edge of  
EOC (end of conversion). When CS  
is toggled the falling edge of CS al-  
ways clocks out the first bit of data.  
CS should be brought low when  
SCLK is low. The falling edge of CS  
resets a conversion in progress and  
starts the sequence for a new con-  
version. When CS is brought back  
low during a conversion, that con-  
version is prematurely terminated.  
The data in the output latches may  
be corrupted. Therefore, when CS is  
brought back low during a conver-  
sion in progress the data output at  
that time should be ignored. CS may  
also be left continuously low. In this  
case it is imperative that the correct  
number of SCLK pulses be applied  
to the ADC in order to remain syn-  
chronous. After the ADC supply  
power is applied it expects to see 13  
clock pulses for each I/O sequence.  
The number of clock pulses the ADC  
expects is the same as the digital  
output word length. This word length  
can be modified by the data shifted  
in on the DO pin. Table 5 details the  
data required.  
Pin Descriptions  
CCLK  
The clock applied to this input con-  
trols the successive approximation  
conversion time interval and the ac-  
quisition time. The rise and fall times  
of the clock edges should not exceed  
1 µs.  
SCLK  
This is the serial data clock input.  
The clock applied to this input con-  
trols the rate at which the serial data  
exchange occurs. The rising edge  
loads the information on the DI pin  
into the multiplexer address and  
mode select shift register. This ad-  
dress controls which channel of the  
analog input multiplexer (MUX) is  
selected and the mode of operation  
for the A/D. With CS low the falling  
edge of SCLK shifts the data result-  
ing from the previous ADC conver-  
sion out on DO, with the exception of  
the first bit of data. When CS is low  
continuously, the first bit of the data  
is clocked out on the rising edge of  
EOC (end of conversion). When CS  
is toggled the falling edge of CS al-  
ways clocks out the first bit of data.  
CS should be brought low when  
SCLK is low. The rise and fall times  
of the clock edges should not exceed  
1 µs.  
DI  
This is the serial data input pin. The  
data applied to this pin is shifted by  
the rising edge of SCLK into the mul-  
tiplexer address and mode select  
register. Table 2 through Table 5  
show the assignment of the multi-  
plexer address and the mode select  
data.  
DOR  
This is the data output ready pin.  
This pin is an active push/pull output.  
It is low when the conversion result  
is being shifted out and goes high to  
signal that all the data has been shift-  
ed out.  
DO  
The data output pin. This pin is an  
active push/pull output when CS is  
low. When CS is high, this output is  
TRI-STATE®. The A/D conversion  
result (D0–D12) and converter sta-  
tus data are clocked out by the falling  
edge of SCLK on this pin. The word  
length and format of this result can  
vary (see Table 1). The word length  
and format are controlled by the data  
shifted into the multiplexer address  
and mode select register (see Table  
5).  
CONV  
A logic low is required on this pin to  
program any mode or change the  
ADC's configuration as listed in the  
Mode Programming Table 5 such as  
12-bit conversion, 8-bit conversion,  
Auto-Cal, Auto Zero etc. When this  
pin is high the ADC is placed in the  
read data only mode. While in the  
read data only mode, bringing CS  
low and pulsing SCLK will only clock  
out on DO any data stored in the AD-  
Cs output shift register. The data on  
DI will be neglected. A new conver-  
sion will not be started and the ADC  
will remain in the mode and/or con-  
figuration previously programmed.  
Read data only cannot be performed  
while a conversion, Auto-Cal or Au-  
to-Zero are in progress.  
EOC  
This pin is an active push/pull output  
and indicates the status of the  
ADC12030/2/4/8. When low, it sig-  
nals that the A/D is busy with a con-  
version, auto-calibration, auto-zero  
or power down cycle. The rising  
edge of EOC signals the end of one  
of these cycles.  
PD  
This is the power down pin. When  
PD is high the A/D is powered down;  
when PD is low the A/D is powered  
up. The A/D takes a maximum of 250  
µs to power up after the command is  
given.  
CS  
This is the chip select pin. When a  
logic low is applied to this pin, the  
rising edge of SCLK shifts the data  
on DI into the address register. This  
low also brings DO out of TRI-  
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4
+
CH0–CH7  
These are the analog inputs of the  
MUX. A channel input is selected by  
the address information at the DI pin,  
which is loaded on the rising edge of  
SCLK into the address register (See  
Tables 2, 3, 4).  
ceed VA or go below AGND (see  
Figure 6).  
VREF  
+
This is the positive analog voltage  
reference input. In order to maintain  
accuracy, the voltage range of VREF  
(VREF = VREF+ − VREF−) is 1 VDC to  
The voltage applied to these inputs  
should not exceed VA+ or go below  
GND. Exceeding this range on an  
unselected channel will corrupt the  
reading of a selected channel.  
5.0 VDC and the voltage at VREF+  
cannot exceed VA+. See Figure 5 for  
recommended bypassing.  
VREF  
The negative voltage reference in-  
put. In order to maintain accuracy,  
the voltage at this pin must not go  
below GND or exceed VA+. (See  
Figure 5).  
COM  
This pin is another analog input pin.  
It is used as a pseudo ground when  
the analog multiplexer is single-end-  
ed.  
VA+, VD+  
These are the analog and digital  
power supply pins. VA+ and VD+ are  
not connected together on the chip.  
These pins should be tied to the  
same power supply and bypassed  
separately (see Figure 5). The oper-  
ating voltage range of VA+ and VD+  
MUXOUT1,MUXOUT2  
A/DIN1, /DIN2  
These are the multiplexer output  
pins.  
These are the converter input pins.  
MUXOUT1 is usually tied to A/DIN1.  
MUXOUT2 is usually tied to A/DIN2.  
If external circuitry is placed be-  
tween MUXOUT1 and A/DIN1, or  
MUXOUT2 and A/DIN2 it may be  
necessary to protect these pins. The  
voltage at these pins should not ex-  
is 4.5 VDC to 5.5 VDC  
.
DGND  
AGND  
This is the digital ground pin (see  
Figure 5).  
This is the analog ground pin (see  
Figure 5).  
5
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Absolute Maximum Ratings  
(Notes 1, 2)  
Operating Ratings (Notes 1, 2)  
Operating Temperature Range  
TMIN TA TMAX  
−40°C TA +85°C  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
Supply Voltage (V+ = VA+ = VD+)  
|VA+ − VD+|  
+4.5V to +5.5V  
100 mV  
0V to VA+  
Positive Supply Voltage  
VREF  
+
(V+ = VA+ = VD+)  
6.5V  
−0.3V to (V+ +0.3V)  
GND −5V to (V+ +5V)  
VREF  
0V to (VREF+ −1V)  
1V to VA+  
Voltage at Inputs and Outputs  
except CH0–CH7 and COM  
Voltage at Analog Inputs  
CH0–CH7 and COM  
VREF (VREF+ − VREF−)  
VREF Common Mode Voltage Range  
[(VREF+) − (VREF−)] / 2  
0.1 VA+ to 0.6 VA+  
0V to VA+  
A/DIN1, A/DIN2, MUXOUT1 and  
MUXOUT2 Voltage Range A/D  
IN Common Mode Voltage Range  
[(VIN+) − (VIN−)] / 2  
|VA+ − VD+|  
300 mV  
±30 mA  
±120 mA  
Input Current at Any Pin (Note 3)  
Package Input Current (Note 3)  
Package Dissipation at  
TA = 25°C (Note 4)  
0V to VA+  
Package Thermal Resistance  
500 mW  
1500V  
260°C  
ESD Susceptibility (Note 5)  
Human Body Model  
Soldering Information  
N Packages (10 seconds)  
SO Package (Note 6):  
Vapor Phase (60 seconds)  
Infrared (15 seconds)  
Thermal Resistance  
Part Number  
(θJA  
)
ADC12(H)030CIWM  
70°C/W  
64°C/W  
42°C/W  
57°C/W  
97°C/W  
50°C/W  
ADC12032CIWM  
ADC12034CIN  
215°C  
220°C  
ADC12034CIWM  
ADC12H034CIMSA  
ADC12(H)038CIWM  
Storage Temperature  
−65°C to +150°C  
Some product/package combinations are obsolete or on life-  
time buy. These are shown for reference only. Please check  
our web site for availability.  
Converter Electrical Characteristics  
The following specifications apply for V+ = VA+ = VD+ = +5.0 VDC, VREF+ = +4.096 VDC, VREF− = 0 VDC, 12-bit + sign conversion  
mode, fCK = fSK = 8 MHz for the ADC12H030, ADC12H032, ADC12H034 and ADC12H038, fCK = fSK = 5 MHz for the ADC12030,  
ADC12032, ADC12034 and ADC12038, RS = 25Ω, source impedance for VREF+ and VREF25Ω, fully-differential input with fixed  
2.048V common-mode voltage, and 10(tCK) acquisition time unless otherwise specified. Boldface limits apply for TA = TJ =  
TMIN to TMAX; all other limits TA = TJ = 25°C. (Notes 7, 8, 9)  
Typical  
(Note 10)  
Limits  
(Note 11)  
Units  
(Limits)  
Symbol  
Parameter  
Conditions  
STATIC CONVERTER CHARACTERISTICS  
Resolution with No Missing Codes  
12 + sign  
±1  
Bits (min)  
LSB (max)  
LSB (max)  
LSB (max)  
LSB (max)  
ILE  
Integral Linearity Error  
Differential Non-Linearity  
Positive Full-Scale Error  
Negative Full-Scale Error  
After Auto-Cal (Notes 12, 18)  
After Auto-Cal  
±1/2  
DNL  
±1  
After Auto-Cal (Notes 12, 18)  
After Auto-Cal (Notes 12, 18)  
±1/2  
±1/2  
±3.0  
±3.0  
After Auto-Cal (Notes 5, 18)  
VIN(+) = VIN (−) = 2.048V  
Offset Error  
±1/2  
±2  
LSB (max)  
DC Common Mode Error  
Total Unadjusted Error  
After Auto-Cal (Note 15)  
±2  
±1  
±3.5  
LSB (max)  
LSB  
TUE  
After Auto-Cal (Notes 12, 13, 14)  
Resolution with No Missing Codes 8-bit + sign mode  
8 + sign  
±1/2  
Bits (min)  
LSB (max)  
LSB (max)  
LSB (max)  
LSB (max)  
INL  
Integral Linearity Error  
Differential Non-Linearity  
Positive Full-Scale Error  
Negative Full-Scale Error  
8-bit + sign mode (Note 12)  
DNL  
8-bit + sign mode  
±3/4  
8-bit + sign mode (Note 12)  
8-bit + sign mode (Note 12)  
±1/2  
±1/2  
8-bit + sign mode, after Auto-Zero  
VIN(+) = VIN(−) = + 2.048V (Note 13)  
Offset Error  
±1/2  
LSB (max)  
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6
Typical  
(Note 10)  
Limits  
(Note 11)  
Units  
(Limits)  
Symbol  
Parameter  
Conditions  
8-bit + sign mode after Auto-Zero  
(Notes 12, 13, 14)  
TUE  
Total Unadjusted Error  
±3/4  
LSB (max)  
LSB  
Multiplexer Chan-to-Chan  
Matching  
±0.05  
V+ = +5V ±10%, VREF = +4.096V  
Power Supply Sensitivity  
Offset Error  
+ Full-Scale Error  
− Full-Scale Error  
±0.5  
±0.5  
±0.5  
±0.5  
±1  
LSB (max)  
LSB (max)  
LSB (max)  
LSB  
±1.5  
±1.5  
Integral Linearity Error  
Output Data from “12-Bit  
Conversion of Offset”  
+10  
−10  
LSB (max)  
LSB (min)  
(see Table 5) (Note 20)  
(see Table 5) (Note 20)  
Output Data from “12-Bit  
Conversion of Full-Scale”  
4095  
4093  
LSB (max)  
LSB (min)  
UNIPOLAR DYNAMIC CONVERTER CHARACTERISTICS  
fIN = 1 kHz, VIN = 5 VP-P, VREF+ = 5.0V  
69.4  
68.3  
65.7  
31  
dB  
dB  
Signal-to-Noise Plus Distortion  
Ratio  
fIN = 20 kHz, VIN = 5 VP-P, VREF+ = 5.0V  
fIN = 40 kHz, VIN = 5 VP-P, VREF+ = 5.0V  
VIN = 5 VP-P, where S/(N+D) drops 3 dB  
S/(N+D)  
dB  
−3 dB Full Power Bandwidth  
kHz  
DIFFERENTIAL DYNAMIC CONVERTER CHARACTERISTICS  
fIN = 1 kHz, VIN = ±5V, VREF+ = 5.0V  
77.0  
73.9  
67.0  
40  
dB  
dB  
Signal-to-Noise Plus Distortion  
Ratio  
fIN = 20 kHz, VIN = ±5V, VREF+ = 5.0V  
fIN = 40 kHz, VIN = ±5V, VREF+ = 5.0V  
VIN = ±5V, where S/(N+D) drops 3 dB  
S/(N+D)  
dB  
−3 dB Full Power Bandwidth  
kHz  
REFERENCE INPUT, ANALOG INPUTS AND MULTIPLEXER CHARACTERISTICS  
CREF  
Reference Input Capacitance  
85  
75  
pF  
pF  
A/DIN1, A/DIN2 Analog Input  
Capacitance  
CA/D  
A/DIN1, A/DIN2 Analog Input  
Leakage Current  
VIN = +5.0V or VIN = 0V  
±0.1  
±1.0  
µA (max)  
GND − 0.05  
(VA+) + 0.05  
V (min)  
V (max)  
CH0–CH7 and COM Input Voltage  
CH0–CH7 and COM Input  
Capacitance  
CCH  
10  
pF  
CMUXOUT  
MUX Output Capacitance  
20  
pF  
On Channel = 5V and Off Channel = 0V  
On Channel = 0V and Off Channel = 5V  
On Channel = 5V and Off Channel = 0V  
On Channel = 0V and Off Channel = 5V  
−0.01  
0.01  
−0.3  
0.3  
µA (min)  
µA (max)  
µA (max)  
µA (min)  
Off Channel Leakage CH0–CH7  
and COM Pins (Note 16)  
0.01  
0.3  
On Channel Leakage CH0–CH7  
and COM Pins (Note 16)  
−0.01  
−0.3  
MUXOUT1 and MUXOUT2  
Leakage Current  
VMUXOUT = 5.0V or VMUXOUT = 0V  
0.01  
0.3  
µA (max)  
RON  
MUX On Resistance  
RON Matching Chan-to-Chan  
Chan-to-Chan Crosstalk  
MUX Bandwidth  
VIN = 2.5V and VMUXOUT = 2.4V  
VIN = 2.5V and VMUXOUT = 2.4V  
VIN = 5 VP-P, fIN = 40 kHz  
850  
5
1150  
Ω (max)  
%
dB  
−72  
90  
kHz  
7
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DC and Logic Electrical Characteristics  
The following specifications apply for V+ = VA+ = VD+ = +5.0 VDC, VREF+ = +4.096 VDC, VREF− = 0 VDC, 12-bit + sign conversion  
mode, fCK = fSK = 8 MHz for the ADC12H030, ADC12H032, ADC12H034 and ADC12H038, fCK = fSK = 5 MHz for the ADC12030,  
ADC12032, ADC12034 and ADC12038, RS = 25Ω, source impedance for VREF+ and VREF25Ω, fully-differential input with fixed  
2.048V common-mode voltage, and 10(tCK) acquisition time unless otherwise specified. Boldface limits apply for TA = TJ =  
TMIN to TMAX; all other limits TA = TJ = 25°C. (Notes 7, 8, 9)  
Symbo  
l
Typical  
(Note 10)  
Limits  
(Note 11)  
Units  
(Limits)  
Parameter  
Conditions  
CCLK, CS, CONV, DI, PD AND SCLK INPUT CHARACTERISTICS  
VIN(1)  
VIN(0)  
IIN(1)  
V+ = 5.5V  
V+ = 4.5V  
VIN = 5.0V  
VIN = 0V  
Logical “1” Input Voltage  
Logical “0” Input Voltage  
Logical “1” Input Current  
Logical “0” Input Current  
2.0  
0.8  
V (min)  
V (max)  
µA (max)  
µA (min)  
0.005  
1.0  
IIN(0)  
−0.005  
−1.0  
DO, EOC AND DOR DIGITAL OUTPUT CHARACTERISTICS  
V+ = 4.5V, IOUT = −360 µA  
2.4  
4.25  
0.4  
V (min)  
V (min)  
VOUT(1)  
VOUT(0)  
IOUT  
Logical “1” Output Voltage  
Logical “0” Output Voltage  
TRI-STATE Output Current  
V+ = 4.5V, IOUT = − 10 µA  
V+ = 4.5V, IOUT = 1.6 mA  
VOUT = 0V  
V (max)  
µA (max)  
µA (max)  
mA (min)  
mA (min)  
−0.1  
0.1  
14  
−3.0  
3.0  
VOUT = 5V  
+ISC  
−ISC  
VOUT = 0V  
Output Short Circuit Source Current  
Output Short Circuit Sink Current  
6.5  
VOUT = VD+  
16  
8.0  
POWER SUPPLY CHARACTERISTICS  
Digital Supply Current  
ADC12030, ADC12032, ADC12034 and CS = HIGH, Powered Down, CCLK on  
ADC12038  
Awake  
1.6  
600  
20  
2.5  
3.2  
4.0  
mA (max)  
µA  
CS = HIGH, Powered Down, CCLK off  
Awake  
µA  
ID+  
Digital Supply Current  
ADC12H030, ADC12H032, ADC12H034 CS = HIGH, Powered Down, CCLK on  
and ADC12H038  
2.3  
0.9  
20  
mA  
mA  
µA  
CS = HIGH, Powered Down, CCLK off  
Awake  
2.7  
10  
0.1  
mA (max)  
µA  
IA+  
Positive Analog Supply Current  
CS = HIGH, Powered Down, CCLK on  
CS = HIGH, Powered Down, CCLK off  
µA  
Awake  
70  
0.1  
µA  
µA  
IREF  
Reference Input Current  
CS = HIGH, Powered Down  
AC Electrical Characteristics  
The following specifications apply for V+ = VA+ = VD+ = +5.0 VDC, VREF+ = +4.096 VDC, VREF− = 0 VDC, 12-bit + sign conversion  
mode, tr = tf = 3 ns, fCK = fSK = 8 MHz for the ADC12H030, ADC12H032, ADC12H034 and ADC12H038, fCK = fSK = 5 MHz for the  
ADC12030, ADC12032, ADC12034 and ADC12038, RS = 25Ω, source impedance for VREF+ and VREF25Ω, fully-differential  
input with fixed 2.048V common-mode voltage, and 10(tCK) acquisition time unless otherwise specified. Boldface limits apply for  
TA = TJ = TMIN to TMAX; all other limits TA = TJ = 25°C. (Note 17)  
ADC12H030/2/4/8 ADC12030/2/4/8  
Units  
(Limits)  
Symb  
ol  
Typical  
(Note 10)  
Parameter  
Conditions  
Limits  
Limits  
(Note 11)  
(Note 11)  
fCK  
Conversion Clock (CCLK)  
Frequency  
10  
1
8
8
5
5
MHz (max)  
MHz (min)  
Serial Data Clock SCLK  
Frequency  
10  
0
MHz (max)  
Hz (min)  
fSK  
40  
60  
40  
60  
% (min)  
% (max)  
Conversion Clock Duty Cycle  
Serial Data Clock Duty Cycle  
40  
60  
40  
60  
% (min)  
% (max)  
www.national.com  
8
ADC12H030/2/4/8 ADC12030/2/4/8  
Units  
(Limits)  
Symb  
ol  
Typical  
(Note 10)  
Parameter  
Conditions  
Limits  
Limits  
(Note 11)  
(Note 11)  
44(tCK  
21(tCK  
)
)
44(tCK  
5.5  
)
)
44(tCK  
8.8  
)
)
(max)  
µs (max)  
12-Bit + Sign or 12-Bit  
8-Bit + Sign or 8-Bit  
tC  
Conversion Time  
21(tCK  
2.625  
21(tCK  
4.2  
(max)  
µs (max)  
6(tCK  
7(tCK  
0.75  
)
6(tCK  
7(tCK  
)
(min)  
6(tCK  
10(tCK  
18(tCK  
34(tCK  
)
)
)
(max)  
6 Cycles Programmed  
10 Cycles Programmed  
18 Cycles Programmed  
34 Cycles Programmed  
1.2  
1.4  
µs (min)  
µs (max)  
(min)  
0.875  
10(tCK  
11(tCK  
)
)
10(tCK  
11(tCK  
)
)
)
)
)
(max)  
1.25  
1.375  
18(tCK  
19(tCK  
2.0  
2.2  
µs (min)  
µs (max)  
(min)  
tA  
Acquisition Time (Note 19)  
)
)
18(tCK  
19(tCK  
)
)
(max)  
2.25  
2.375  
34(tCK  
35(tCK  
3.6  
3.8  
µs (min)  
µs (max)  
(min)  
)
)
34(tCK  
35(tCK  
)
)
(max)  
4.25  
6.8  
7.0  
µs (min)  
µs (max)  
(max)  
4.375  
4944(tCK  
76(tCK  
)
4944(tCK  
618.0  
)
4944(tCK  
988.8  
)
tCKAL  
tAZ  
Self-Calibration Time  
Auto-Zero Time  
µs (max)  
(max)  
)
76(tCK  
9.5  
)
76(tCK  
15.2  
)
µs (max)  
(min)  
2(tCK  
)
2(tCK  
3(tCK  
)
2(tCK  
3(tCK  
)
Self-Calibration or Auto-Zero  
Synchronization Time from  
DOR  
)
)
(max)  
tSYNC  
0.250  
0.375  
0.40  
0.60  
µs (min)  
µs (max)  
DOR High Time when CS is  
Low Continuously for Read  
Data and Software Power Up/  
Down  
9(tSK  
9(tSK  
9(tSK  
(max)  
µs (max)  
)
)
)
)
)
tDOR  
1.125  
1.8  
8(tSK  
8(tSK  
1.0  
)
8(tSK  
1.6  
(max)  
tCONV  
CONV Valid Data Time  
µs (max)  
Timing Characteristics  
The following specifications apply for V+ = VA+ = VD+ = +5.0 VDC, VREF+ = +4.096 VDC, VREF− = 0 VDC, 12-bit + sign conversion  
mode, tr = tf = 3 ns, fCK = fSK = 8 MHz for the ADC12H030, ADC12H032, ADC12H034 and ADC12H03, fCK = fSK = 5 MHz for the  
ADC12030, ADC12032, ADC12034 and ADC12038, RS = 25Ω, source impedance for VREF+ and VREF25Ω, fully-differential  
input with fixed 2.048V common-mode voltage, and 10(tCK) acquisition time unless otherwise specified. Boldface limits apply for  
TA = TJ = TMIN to TMAX; all other limits TA = TJ = 25°C. (Note 17)  
Typical  
(Note 10) (Note 11)  
Limits  
Units  
(Limits)  
Symbol  
Parameter  
Conditions  
Hardware Power-Up Time, Time from PD Falling Edge to  
EOC Rising Edge  
tHPU  
140  
250  
µs (max)  
Software Power-Up Time, Time from Serial Data Clock  
Falling Edge to EOC Rising Edge  
tSPU  
140  
20  
250  
50  
µs (max)  
ns (max)  
ns (min)  
tACC  
Access Time Delay from CS Falling Edge to DO Data Valid  
Set-Up Time of CS Falling Edge to Serial Data Clock Rising  
Edge  
tSET-UP  
30  
9
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Typical  
(Note 10) (Note 11)  
Limits  
Units  
(Limits)  
Symbol  
Parameter  
Conditions  
tDELAY  
t1H, t0H  
tHDI  
Delay from SCLK Falling Edge to CS Falling Edge  
Delay from CS Rising Edge to DO TRI-STATE  
DI Hold Time from Serial Data Clock Rising Edge  
DI Set-Up Time from Serial Data Clock Rising Edge  
0
40  
5
5
ns (min)  
ns (max)  
ns (min)  
ns (min)  
RL = 3k, CL = 100 pF  
100  
15  
tSDI  
5
10  
50  
5
ns (max)  
ns (min)  
tHDO  
tDDO  
tRDO  
RL = 3k, CL = 100 pF  
DO Hold Time from Serial Data Clock Falling Edge  
25  
Delay from Serial Data Clock Falling Edge to DO Data Valid  
DO Rise Time, TRI-STATE to High  
DO Rise Time, Low to High  
35  
10  
10  
12  
12  
25  
50  
30  
30  
30  
30  
45  
ns (max)  
ns (max)  
ns (max)  
ns (max)  
ns (max)  
ns (max)  
RL = 3k, CL = 100 pF  
RL = 3k, CL = 100 pF  
RL = 3k, CL = 100 pF  
RL = 3k, CL = 100 pF  
DO Fall Time, TRI-STATE to Low  
tFDO  
tCD  
tSD  
DO Fall Time, High to Low  
Delay from CS Falling Edge to DOR Falling Edge  
Delay from Serial Data Clock Falling Edge to DOR Rising  
Edge  
25  
45  
ns (max)  
CIN  
Capacitance of Logic Inputs  
Capacitance of Logic Outputs  
10  
20  
pF  
pF  
COUT  
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is  
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed  
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test  
conditions.  
Note 2: All voltages are measured with respect to GND, unless otherwise specified.  
Note 3: When the input voltage (VIN) at any pin exceeds the power supplies (VIN < GND or VIN > VA+ or VD+), the current at that pin should be limited to 30 mA.  
The 120 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 30 mA to four.  
Note 4: The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax, θJA and the ambient temperature, TA. The maximum  
allowable power dissipation at any temperature is PD = (TJmax − TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower.  
Note 5: The human body model is a 100 pF capacitor discharged through a 1.5 kΩ resistor into each pin.  
Note 6: See AN450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in any post 1986 National  
Semiconductor Linear Data Book for other methods of soldering surface mount devices.  
Note 7: Two on-chip diodes are tied to each analog input through a series resistor as shown below. Input voltage magnitude up to 5V above VA+ or 5V below  
GND will not damage this device. However, errors in the A/D conversion can occur (if these diodes are forward biased by more than 50 mV) if the input voltage  
magnitude of selected or unselected analog input go above VA+ or below GND by more than 50 mV. As an example, if VA+ is 4.5 VDC, full-scale input voltage  
must be 4.55 VDC to ensure accurate conversions.  
1135402  
Note 8: To guarantee accuracy, it is required that the VA+ and VD+ be connected together to the same power supply with separate bypass capacitors at each V  
+ pin.  
Note 9: With the test condition for VREF (VREF+ − VREF−) given as +4.096V, the 12-bit LSB is 1.0 mV and the 8-bit LSB is 16.0 mV.  
Note 10: Typical figures are at TJ = TA = 25°C and represent most likely parametric norm.  
Note 11: Tested limits are guaranteed to National's AOQL (Average Outgoing Quality Level).  
Note 12: Positive integral linearity error is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through positive full-  
scale and zero. For negative integral linearity error, the straight line passes through negative full-scale and zero (see Figures 2, 3).  
Note 13: Zero error is a measure of the deviation from the mid-scale voltage (a code of zero), expressed in LSB. It is the worst-case value of the code transitions  
between 1 to 0 and 0 to +1 (see Figure 4).  
Note 14: Total unadjusted error includes offset, full-scale, linearity and multiplexer errors.  
Note 15: The DC common-mode error is measured in the differential multiplexer mode with the assigned positive and negative input channels shorted together.  
Note 16: Channel leakage current is measured after the channel selection.  
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10  
Note 17: Timing specifications are tested at the TTL logic levels, VIL = 0.4V for a falling edge and VIH = 2.4V for a rising edge. TRI-STATE output voltage is forced  
to 1.4V.  
Note 18: The ADC12030 family's self-calibration technique ensures linearity and offset errors as specified, but noise inherent in the self-calibration process will  
result in a maximum repeatability uncertainty of 0.2 LSB.  
Note 19: If SCLK and CCLK are driven from the same clock source, then tA is 6, 10, 18 or 34 clock periods minimum and maximum.  
Note 20: The “12-Bit Conversion of Offset” and “12-Bit Conversion of Full-Scale” modes are intended to test the functionality of the device. Therefore, the output  
data from these modes are not an indication of the accuracy of a conversion result.  
1135410  
FIGURE 1. Transfer Characteristic  
1135411  
FIGURE 2. Simplified Error Curve vs. Output Code without Auto-Calibration or Auto-Zero Cycles  
11  
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1135412  
FIGURE 3. Simplified Error Curve vs. Output Code after Auto-Calibration Cycle  
1135413  
FIGURE 4. Offset or Zero Error Voltage  
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12  
Typical Performance Characteristics The following curves apply for 12-bit + sign mode after auto-  
calibration unless otherwise specified. The performance for 8-bit + sign mode is equal to or better than shown. (Note 9)  
Linearity Error Change  
vs. Clock Frequency  
Linearity Error Change  
vs. Temperature  
1135453  
1135455  
1135457  
1135454  
1135456  
1135458  
Linearity Error Change  
vs. Reference Voltage  
Linearity Error Change  
vs. Supply Voltage  
Full-Scale Error Change  
vs. Clock Frequency  
Full-Scale Error Change  
vs. Temperature  
13  
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Full-Scale Error Change  
vs. Reference Voltage  
Full-Scale Error Change  
vs. Supply Voltage  
1135460  
1135459  
Zero Error Change  
vs. Clock Frequency  
Zero Error Change  
vs. Temperature  
1135461  
1135462  
Zero Error Change  
vs. Reference Voltage  
Zero Error Change  
vs. Supply Voltage  
1135464  
1135463  
www.national.com  
14  
Analog Supply Current  
vs. Temperature  
Digital Supply Current  
vs. Clock Frequency  
1135465  
1135466  
Digital Supply Current  
vs. Temperature  
1135467  
15  
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Typical Dynamic Performance Characteristics The following curves apply for 12-bit + sign mode  
after auto-calibration unless otherwise specified.  
Bipolar Spectral Response  
with 1 kHz Sine Wave Input  
Bipolar Spectral Response  
with 10 kHz Sine Wave Input  
1135468  
1135470  
1135472  
1135469  
1135471  
1135473  
Bipolar Spectral Response  
with 20 kHz Sine Wave Input  
Bipolar Spectral Response  
with 30 kHz Sine Wave Input  
Bipolar Spectral Response  
with 40 kHz Sine Wave Input  
Bipolar Spectral Response  
with 50 kHz Sine Wave Input  
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16  
Bipolar Spurious Free  
Dynamic Range  
Unipolar Signal-to-Noise Ratio  
vs. Input Frequency  
1135474  
1135475  
Unipolar Signal-to-Noise  
+ Distortion Ratio  
vs. Input Frequency  
Unipolar Signal-to-Noise  
+ Distortion Ratio  
vs. Input Signal Level  
1135476  
1135477  
Unipolar Spectral Response  
with 1 kHz Sine Wave Input  
Unipolar Spectral Response  
with 10 kHz Sine Wave Input  
1135478  
1135479  
17  
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Unipolar Spectral Response  
with 20 kHz Sine Wave Input  
Unipolar Spectral Response  
with 30 kHz Sine Wave Input  
1135480  
1135481  
Unipolar Spectral Response  
with 40 kHz Sine Wave Input  
Unipolar Spectral Response  
with 50 kHz Sine Wave Input  
1135482  
1135483  
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18  
Test Circuits  
DO “TRI-STATE” (t1H, tOH  
)
DO except “TRI-STATE”  
1135403  
1135404  
Leakage Current  
1135405  
Timing Diagrams  
DO Falling and Rising Edge  
DO “TRI-STATE” Falling and Rising Edge  
1135418  
1135419  
DI Data Input Timing  
1135420  
19  
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DO Data Output Timing Using CS  
1135421  
DO Data Output Timing with CS Continuously Low  
1135422  
ADC12038 Auto Cal or Auto Zero  
1135423  
Note: DO output data is not valid during this cycle.  
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20  
ADC12038 Read Data without Starting a Conversion Using CS  
1135424  
ADC12038 Read Data without Starting a Conversion with CS Continuously Low  
1135425  
21  
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ADC12038 Conversion Using CS with 8-Bit Digital Output Format  
1135426  
ADC12038 Conversion Using CS with 16-Bit Digital Output Format  
1135451  
www.national.com  
22  
ADC12038 Conversion with CS Continuously Low and 8-Bit Digital Output Format  
1135428  
ADC12038 Conversion with CS Continuously Low and 16-Bit Digital Output Format  
1135429  
23  
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ADC12038 Software Power Up/Down Using CS with 16-Bit Digital Output Format  
1135452  
ADC12038 Software Power Up/Down with CS Continuously Low and 16-Bit Digital Output Format  
1135431  
www.national.com  
24  
ADC12038 Hardware Power Up/Down  
1135432  
Note: Hardware power up/down may occur at any time. If PD is high while a conversion is in progress that conversion will be corrupted and erroneous data will  
be stored in the output shift register.  
ADC12038 Configuration Modification—Example of a Status Read  
1135433  
Note: In order for all 9 bits of Status Information to be accessible, the last conversion programmed before Cycle N needs to have a resolution of 8 bits plus sign,  
12 bits, 12 bits plus sign, or greater.  
25  
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1135435  
*Tantalum  
**Monolithic Ceramic or better  
FIGURE 5. Recommended Power Supply Bypassing and Grounding  
1135434  
FIGURE 6. Protecting the MUXOUT1, MUXOUT2, A/DIN1 and A/DIN2 Analog Pins  
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26  
Format and Set-Up Tables  
TABLE 1. Data Out Formats  
DO Formats  
DB0 DB1 DB2 DB3 DB4 DB5 DB6 DB7 DB8 DB9 DB1 DB1 DB1 DB1 DB1 DB1 DB16  
0
1
2
3
4
5
17  
Bits  
X
X
X
X
9
5
3
3
3
0
8
4
3
3
3
Sign MSB 10  
9
5
1
7
7
8
4
7
3
6
5
4
3
2
1
LSB  
MSB 13  
First Bits  
Sign MSB 10  
Sign MSB  
8
4
4
4
4
7
3
5
5
5
6
2
6
6
6
9
5
1
6
6
6
2
1
LSB  
9
Bits  
6
2
2
2
0
9
5
2
2
2
LSB  
8
with  
Sign  
17  
Bits  
LSB  
LSB  
LSB  
0
1
1
1
0
9
9
10 MSB Sign  
10 MSB Sign  
X
2
0
X
1
0
X
X
LSB 13  
First Bits  
8
9
Bits  
MSB Sign  
16  
Bits  
MSB 10  
8
4
7
3
6
2
5
1
4
3
0
LSB  
MSB 12  
First Bits  
MSB 10  
7
3
4
4
4
6
2
5
5
5
LSB  
8
Bits  
MSB  
LSB  
LSB  
LSB  
6
1
1
1
LSB  
7
without  
sign  
16  
Bits  
8
8
9
9
10 MSB  
10 MSB  
LSB 12  
First Bits  
7
8
Bits  
MSB  
X = High or Low state.  
27  
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TABLE 2. ADC12038 Multiplexer Addressing  
Analog Channel Addressed  
A/D Input  
Polarity  
Assignment  
Multiplexer Output  
Channel  
and Assignment  
with A/DIN1 tied to MUXOUT1  
and A/DIN2 tied to MUXOUT2  
MUX Address  
Assignment  
Mode  
DI0 DI1 DI2 DI3 CH0 CH1 CH2 CH3 CH4 CH5 CH6 CH7 CO A/DIN1 A/DIN2 MUXOUT MUXOUT  
M
1
2
L
L
L
L
L
L
L
H
L
+
+
+
+
+
+
+
+
+
+
+
+
+
+
CH0  
CH2  
CH4  
CH6  
CH0  
CH2  
CH4  
CH6  
CH0  
CH2  
CH4  
CH6  
CH1  
CH3  
CH5  
CH7  
CH1  
CH3  
CH5  
CH7  
CH1  
CH3  
CH5  
CH7  
COM  
COM  
COM  
COM  
COM  
COM  
COM  
COM  
+
+
+
+
+
+
L
L
H
H
L
+
+
L
L
H
L
+
+
Differential  
L
H
H
H
H
L
+
L
L
H
L
+
L
H
H
L
+
L
H
L
+
H
H
H
H
H
H
H
H
L
L
H
L
L
H
H
L
L
H
L
Single-Ended  
H
H
H
H
+
L
H
L
+
H
H
+
H
+
TABLE 3. ADC12034 Multiplexer Addressing  
Analog Channel Addressed  
and Assignment  
with A/DIN1 tied to MUXOUT1  
and A/DIN2 tied to MUXOUT2  
A/D Input Polarity  
Assignment  
Multiplexer Output  
Channel Assignment  
MUX Address  
Mode  
DI0  
DI1  
L
DI2  
CH0  
CH1  
CH2  
CH3 COM  
A/DIN1  
A/DIN2  
MUXOUT1  
CH0  
MUXOUT2  
CH1  
L
L
L
H
L
+
+
+
+
+
+
+
+
+
L
+
+
CH2  
CH3  
Differential  
L
H
H
L
+
+
CH0  
CH1  
L
H
L
+
CH2  
CH3  
H
H
H
H
+
CH0  
COM  
COM  
COM  
COM  
L
H
L
CH2  
Single-Ended  
H
H
CH1  
H
+
CH3  
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28  
TABLE 4. ADC12032 and ADC12030 Multiplexer Addressing  
Analog Channel Addressed  
and Assignment  
with A/DIN1 tied to MUXOUT1  
and A/DIN2 tied to MUXOUT2  
A/D Input Polarity  
Assignment  
Multiplexer Output  
Channel Assignment  
MUX Address  
Mode  
DI0  
L
DI1  
L
CH0  
CH1  
COM  
A/DIN1  
A/DIN2  
MUXOUT1 MUXOUT2  
+
+
+
+
+
CH0  
CH0  
CH0  
CH1  
CH1  
CH1  
+
+
Differential  
L
H
H
L
COM  
COM  
Single-Ended  
H
H
+
Note:  
ADC12030 and ADC12H030 do not have A/DIN1, A/DIN2, MUX-  
OUT1 and MUXOUT2 pins.  
TABLE 5. Mode Programming  
DI3 DI4 DI5 DI6 DI7  
ADC12038  
ADC12034  
DI0  
DI0  
DI1  
DI1  
DI2  
DI2  
DI3 DI4 DI5 DI6  
DO Format  
(next Conversion  
Cycle)  
Mode Selected  
(Current)  
ADC12030  
and  
DI0  
DI1  
DI2 DI3 DI4 DI5  
ADC12032  
See Tables 2, 3 or Table 4  
See Tables 2, 3 or Table 4  
See Tables 2, 3 or Table 4  
L
L
L
L
L
L
L
H
L
12 Bit Conversion  
12 Bit Conversion  
12 or 13 Bit MSB First  
16 or 17 Bit MSB First  
8 or 9 Bit MSB First  
12 or 13 Bit MSB First  
12 or 13 Bit LSB First  
16 or 17 Bit LSB First  
8 or 9 Bit LSB First  
12 or 13 Bit LSB First  
No Change  
L
L
H
H
L
8 Bit Conversion  
L
L
L
L
L
L
H
L
12 Bit Conversion of Full-Scale  
12 Bit Conversion  
See Tables 2, 3 or Table 4  
See Tables 2, 3 or Table 4  
See Tables 2, 3 or Table 4  
L
H
H
H
H
L
L
L
H
L
12 Bit Conversion  
L
H
H
L
8 Bit Conversion  
L
L
L
L
L
L
L
H
L
L
H
H
L
L
L
L
L
L
L
L
L
L
H
L
H
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
H
L
12 Bit Conversion of Offset  
Auto Cal  
H
H
H
H
H
H
H
H
H
H
H
H
L
L
H
L
Auto Zero  
No Change  
L
H
H
L
Power Up  
No Change  
L
H
L
Power Down  
No Change  
H
H
H
H
H
H
H
H
Read Status Register  
Data Out without Sign  
Data Out with Sign  
No Change  
L
H
H
L
No Change  
L
No Change  
H
H
H
H
H
Acquisition Time—6 CCLK Cycles  
Acquisition Time—10 CCLK Cycles  
Acquisition Time—18 CCLK Cycles  
Acquisition Time—34 CCLK Cycles  
User Mode  
No Change  
L
No Change  
L
No Change  
L
No Change  
H
No Change  
Test Mode  
(CH1–CH7 become Active Outputs)  
H
X
X
X
H
H
H
H
No Change  
Note: The A/D powers up with no Auto Cal, no Auto Zero, 10 CCLK acquisition time, 12-bit + sign conversion, power up, 12- or 13-bit MSB first, and user mode.  
X = Don't Care  
TABLE 6. Conversion/Read Data Only Mode Programming  
CS  
L
CONV  
PD  
L
Mode  
L
H
X
X
See Table 5 for Mode  
L
L
Read Only (Previous DO Format). No Conversion.  
H
X
L
Idle  
H
Power Down  
X = Don't Care  
29  
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TABLE 7. Status Register  
Status Bit  
Location  
DB0  
PU  
DB1  
DB2  
Cal  
DB3  
DB4  
DB5  
DB6  
Sign  
DB7  
DB8  
Status Bit  
PD  
8 or 9  
12 or 13  
16 or 17  
Justification Test Mode  
Device Status  
DO Output Format Status  
When “High” When “High”  
High”  
High”  
High”  
High”  
indicates  
an 8 or 9 bit 12 or 13 bit 16 or 17 bit that the  
High”  
High”  
High”  
the  
conversion  
the device is  
in test mode.  
indicates a indicates a indicates  
indicates a indicates a indicates  
Power Up Power  
Sequence Down  
an Auto-  
Cal  
result will be When “Low”  
output MSB the device is  
format  
format  
format  
sign bit is  
included.  
When  
“Low” the  
sign bit is  
not  
is in  
progress  
Sequence Sequence  
Function  
first. When  
“Low” the  
result will be  
output LSB  
first.  
in user mode.  
is in  
is in  
progress  
progress  
included.  
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30  
events necessary for a Data Out without Sign, Data Out with  
Sign, or 6/10/18/34 CCLK Acquisition time mode selection.  
Table 5 describes the actual data necessary to be input to the  
ADC to accomplish this configuration modification. The next  
instruction, shown in Figure 8, issued to the A/D starts con-  
version N+1 with 8 bits of resolution formatted MSB first.  
Again the data output during this I/O cycle is the data from  
conversion N.  
Applications Information  
Some of the device/package combinations are obsolete  
and are described here for reference only. Please see our  
web site for availability.  
1.0 DIGITAL INTERFACE  
1.1 Interface Concepts  
The number of SCLKs applied to the A/D during any conver-  
sion I/O sequence should vary in accord with the data out  
word format chosen during the previous conversion I/O se-  
quence. The various formats and resolutions available are  
shown in Table 1. In Figure 8, since 8-bit, without sign, MSB  
first format was chosen during I/O sequence 4, the number of  
SCLKs required during I/O sequence 5 is 8. In the following  
I/O sequence the format changes to 12-bit without sign MSB  
first; therefore the number of SCLKs required during I/O se-  
quence 6 changes accordingly to 12.  
The example in Figure 7 shows a typical sequence of events  
after the power is applied to the ADC12030/2/4/8:  
1135436  
FIGURE 7. Typical Power Supply Power Up Sequence  
1.3 CS Low Continuously Considerations  
When CS is continuously low, it is important to transmit the  
exact number of SCLK pulses that the ADC expects. Not do-  
ing so will desynchronize the serial communications to the  
ADC. When the supply power is first applied to the ADC, it will  
expect to see 13 SCLK pulses for each I/O transmission. The  
number of SCLK pulses that the ADC expects to see is the  
same as the digital output word length. The digital output word  
length is controlled by the Data Out (DO) format. The DO for-  
mat maybe changed any time a conversion is started or when  
the sign bit is turned on or off. The table below details out the  
number of clock periods required for different DO formats:  
The first instruction input to the A/D via DI initiates Auto-Cal.  
The data output on DO at that time is meaningless and is  
completely random. To determine whether the Auto Cal has  
been completed, a read status instruction is issued to the A/  
D. Again the data output at that time has no significance since  
the Auto Cal procedure modifies the data in the output shift  
register. To retrieve the status information, an additional read  
status instruction is issued to the A/D. At this time the status  
data is available on DO. If the Cal signal in the status word,  
is low Auto Cal has been completed. Therefore, the next in-  
struction issued can start a conversion. The data output at this  
time is again status information. To keep noise from corrupt-  
ing the A/D conversion, status can not be read during a  
conversion. If CS is strobed and is brought low during a con-  
version, that conversion is prematurely ended. EOC can be  
used to determine the end of a conversion or the A/D con-  
troller can keep track in software of when it would be appro-  
priate to communicate to the A/D again. Once it has been  
determined that the A/D has completed a conversion, another  
instruction can be transmitted to the A/D. The data from this  
conversion can be accessed when the next instruction is is-  
sued to the A/D.  
Number of  
DO Format  
SCLKs  
Expected  
SIGN OFF  
SIGN ON  
SIGN OFF  
SIGN ON  
SIGN OFF  
SIGN ON  
8
8-Bit MSB or LSB First  
9
12  
13  
16  
17  
12-Bit MSB or LSB First  
16-Bit MSB or LSB first  
Note, when CS is low continuously it is important to transmit  
the exact number of SCLK cycles, as shown in the timing di-  
agrams. Not doing so will desynchronize the serial commu-  
nication to the A/D. (See Section 1.3.)  
If erroneous SCLK pulses desynchronize communications,  
the simplest way to recover is by cycling the power supply to  
the device. Not being able to easily resynchronize the device  
is a shortcoming of leaving CS low continuously.  
1.2 Changing Configuration  
The number of clock pulses required for an I/O exchange may  
be different for the case when CS is left low continuously vs.  
the case when CS is cycled. Take the I/O sequence detailed  
in Figure 7 (Typical Power Supply Sequence) as an example.  
The table below lists the number of SCLK pulses required for  
each instruction:  
The configuration of the ADC12030/2/4/8 on power up de-  
faults to 12-bit plus sign resolution, 12- or 13-bit MSB First,  
10 CCLK acquisition time, user mode, no Auto Cal, no Auto  
Zero, and power up mode. Changing the acquisition time and  
turning the sign bit on and off requires an 8-bit instruction to  
be issued to the ADC. This instruction will not start a conver-  
sion. The instructions that select a multiplexer address and  
format the output data do start a conversion. Figure 8 de-  
scribes an example of changing the configuration of the  
ADC12030/2/4/8.  
CS Low  
Instruction  
Auto Cal  
CS Strobed  
Continuously  
13 SCLKs  
13 SCLKs  
13 SCLKs  
13 SCLKs  
13 SCLKs  
8 SCLKs  
8 SCLKs  
8 SCLKs  
8 SCLKs  
13 SCLKs  
Read Status  
During I/O sequence 1, the instruction on DI configures the  
ADC12030/2/4/8 to do a conversion with 12-bit +sign resolu-  
tion. Notice that when the 6 CCLK Acquisition and Data Out  
without Sign instructions are issued to the ADC, I/O se-  
quences 2 and 3, a new conversion is not started. The data  
output during these instructions is from conversion N which  
was started during I/O sequence 1. The Configuration Modi-  
fication timing diagram describes in detail the sequence of  
Read Status  
12-Bit + Sign Conv 1  
12-Bit + Sign Conv 2  
1.4 Analog Input Channel Selection  
The data input on DI also selects the channel configuration  
(see Tables 2, 3, 4, 5). In Figure 8 the only times when the  
31  
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channel configuration could be modified is during I/O se-  
quences 1, 4, 5 and 6. Input channels are reselected before  
the start of each new conversion. Shown below is the data bit  
stream required on DI, during I/O sequence number 4 in Fig-  
ure 8, to set CH1 as the positive input and CH0 as the  
negative input for the different versions of ADCs:  
1.5 Power Up/Down  
The ADC may be powered down by taking the PD pin HIGH  
or by the instruction input on DI (see Table 5 and Table 6, and  
the Power Up/Down timing diagrams). When the ADC is pow-  
ered down in this way, the A/D conversion circuitry is deacti-  
vated but the digital I/O circuitry is kept active. Hardware  
power up/down is controlled by the state of the PD pin. Soft-  
ware power-up/down is controlled by the instruction issued to  
the ADC. If a software power up instruction is issued to the  
ADC while a hardware power down is in effect (PD pin high)  
the device will remain in the power-down state. If a software  
power down instruction is issued to the ADC while a hardware  
power up is in effect (PD pin low), the device will power down.  
When the device is powered down by software, it may be  
powered up by either issuing a software power up instruction  
or by taking PD pin high and then low. If the power down  
command is issued during an A/D conversion, that conversion  
is interrupted, so the data output after power up cannot be  
relied upon.  
DI Data  
Part  
Number  
DI0 DI1 DI2 DI3 DI4 DI5 DI6 DI7  
ADC12H030  
ADC12030  
L
L
L
L
H
H
H
H
L
L
L
L
L
L
L
L
H
H
L
L
L
X
X
L
X
X
X
L
ADC12H032  
ADC12032  
ADC12H034  
ADC12034  
H
L
ADC12H038  
ADC12038  
L
H
Where X can be a logic high (H) or low (L).  
1135437  
FIGURE 8. Changing the ADC's Conversion Configuration  
Instruction  
1.6 User Mode and Test Mode  
DI Data  
An instruction may be issued to the ADC to put it into test  
mode, which is used by the manufacturer to verify complete  
functionality of the device. During test mode CH0–CH7 be-  
come active outputs. If the device is inadvertently put into the  
test mode with CS continuously low, the serial communica-  
tions may be desynchronized. Synchronization may be re-  
gained by cycling the power supply voltage to the device.  
Cycling the power supply voltage will also set the device into  
user mode. If CS is used in the serial interface, the ADC may  
be queried to see what mode it is in. This is done by issuing  
a “read STATUS register” instruction to the ADC. When bit 9  
of the status register is high, the ADC is in test mode; when  
bit 9 is low the ADC, is in user mode. As an alternative to  
cycling the power supply, an instruction sequence may be  
used to return the device to user mode. This instruction se-  
quence must be issued to the ADC using CS. The following  
table lists the instructions required to return the device to user  
mode. Note that this entire sequence, including both Test  
Mode and User Mode values, should be sent to recover from  
the test mode.  
DI0 DI1 DI2 DI3 DI4 DI5 DI6 D17  
TEST MODE  
H
L
L
L
L
L
H
X
L
L
L
L
L
X
L
L
L
L
L
X
L
L
L
L
L
H
H
H
H
H
H
H
H
L
H
H
H
H
H
H
H
L
Reset  
Test Mode  
Instructions  
L
L
H
H
L
USER MODE  
Power Up  
H
L
Set DO with or  
without Sign or L  
L
L
L
H
H
L
H
L
H
Set  
H
H or  
L
Acquisition  
or L  
L
L
H
H
L
Time  
Start a  
Conversion or L  
H
H or  
L
H
or L  
H or  
L
H
or L  
H or H or  
L
L
X = Don't Care  
The power up, data with or without sign, and acquisition time  
instructions should be resent after returning to the user mode.  
This is to ensure that the ADC is in the required state before  
a conversion is started.  
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32  
1.7 Reading the Data Without Starting a Conversion  
with the COM input as the zero reference or any combination  
thereof (see Figure 9). The difference between the voltages  
The data from a particular conversion may be accessed with-  
out starting a new conversion by ensuring that the CONV line  
is taken high during the I/O sequence. See the Read Data  
timing diagrams. Table 6 describes the operation of the  
CONV pin.  
+
on the VREF and VREF pins determines the input voltage  
span (VREF). The analog input voltage range is 0 to VA+. Neg-  
ative digital output codes result when VIN> VIN+. The actual  
voltage at VINor VIN+ cannot go below AGND.  
2.0 THE ANALOG MULTIPLEXER  
For the ADC12038, the analog input multiplexer can be con-  
figured with 4 differential channels or 8 single ended channels  
4 Differential  
Channels  
8 Single-Ended Channels  
with COM  
as Zero Reference  
1135438  
1135439  
FIGURE 9.  
Differential  
Configuration  
Single-Ended  
Configuration  
1135440  
1135441  
A/DIN1 and A/DIN2 can be assigned as the + or − input  
A/DIN1 is + input  
A/DIN2 is − input  
FIGURE 10.  
CH0, CH2, CH4, and CH6 can be assigned to the MUXOUT1  
pin in the differential configuration, while CH1, CH3, CH5, and  
CH7 can be assigned to the MUXOUT2 pin. In the differential  
configuration, the analog inputs are paired as follows: CH0  
with CH1, CH2 with CH3, CH4 with CH5 and CH6 with CH7.  
The A/DIN1 and A/DIN2 pins can be assigned positive or  
negative polarity.  
The Multiplexer assignment tables for the ADC12030,2,4,8  
(Tables 2, 3, 4) summarize the aforementioned functions for  
the different versions of A/Ds.  
2.1 Biasing for Various Multiplexer Configurations  
Figure 11 is an example of biasing the device for single-ended  
operation. The sign bit is always low. The digital output range  
is 0 0000 0000 0000 to 0 1111 1111 1111. One LSB is equal  
to 1 mV (4.1V/4096 LSBs).  
With the single-ended multiplexer configuration CH0 through  
CH7 can be assigned to the MUXOUT1 pin. The COM pin is  
always assigned to the MUXOUT2 pin. A/DIN1 is assigned as  
the positive input; A/DIN2 is assigned as the negative input.  
(See Figure 10).  
33  
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1135446  
FIGURE 11. Single-Ended Biasing  
For pseudo-differential signed operation, the biasing circuit  
shown in Figure 12 shows a signal AC coupled to the ADC.  
This gives a digital output range of −4096 to +4095. With a  
2.5V reference, 1 LSB is equal to 610 µV. Although, the ADC  
is not production tested with a 2.5V reference, when VA+ and  
VD are +5.0V linearity error typically will not change more  
than 0.1 LSB (see the curves in the Typical Electrical Char-  
acteristics Section). With the ADC set to an acquisition time  
of 10 clock periods, the input biasing resistor needs to be  
600Ω or less. Notice though that the input coupling capacitor  
needs to be made fairly large to bring down the high pass  
corner. Increasing the acquisition time to 34 clock periods  
(with a 5 MHz CCLK frequency) would allow the 600Ω to in-  
crease to 6k, which with a 1 µF coupling capacitor would set  
the high pass corner at 26 Hz. Increasing R, to 6k would allow  
R2 to be 2k.  
+
1135447  
FIGURE 12. Pseudo-Differential Biasing with the Signal Source AC Coupled Directly into the ADC  
An alternative method for biasing pseudo-differential opera-  
tion is to use the +2.5V from the LM4040 to bias any amplifier  
circuits driving the ADC as shown in Figure 13. The value of  
the resistor pull-up biasing the LM4040-2.5 will depend upon  
the current required by the op amp biasing circuitry.  
to set the full scale voltage at exactly 2.048V and a lower  
grade LM4040D-2.5 to bias up everything to 2.5V as shown  
in Figure 14 will allow the use of all the ADC's digital output  
range of −4096 to +4095 while leaving plenty of head room  
for the amplifier.  
In the circuit of Figure 13 some voltage range is lost since the  
amplifier will not be able to swing to +5V and GND with a  
single +5V supply. Using an adjustable version of the LM4041  
Fully differential operation is shown in Figure 15. One LSB for  
this case is equal to (4.1V/4096) = 1 mV.  
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34  
1135448  
FIGURE 13. Alternative Pseudo-Differential Biasing  
1135449  
FIGURE 14. Pseudo-Differential Biasing without the Loss of Digital Output Range  
35  
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1135450  
FIGURE 15. Fully Differential Biasing  
3.0 REFERENCE VOLTAGE  
an initial adjustment to null reference voltage induced full-  
scale errors.  
The difference in the voltages applied to the VREF+ and VREF  
defines the analog input span (the difference between the  
voltage applied between two multiplexer inputs or the voltage  
applied to one of the multiplexer inputs and analog ground),  
over which 4095 positive and 4096 negative codes exist. The  
Below are recommended references along with some key  
specifications.  
Output  
Voltage  
Tolerance  
Temperature  
Coefficient  
Part Number  
LM4041CI-Adj  
+
voltage sources driving VREF or VREF must have very low  
output impedance and noise. The circuit in Figure 16 is an  
example of a very stable reference appropriate for use with  
the device.  
±0.5%  
±0.1%  
±100ppm/°C  
±100ppm/°C  
±50ppm/°C  
±50ppm/°C  
±50ppm/°C  
±10ppm/°C  
±3.0ppm/°C  
±2ppm/°C  
LM4040AI-4.1  
LM4120AI-4.1  
LM4121AI-4.1  
LM4050AI-4.1  
LM4030AI-4.1  
LM4140AC-4.1  
Circuit of Figure 16  
±0.2%  
±0.2%  
±0.1%  
±0.05%  
±0.1%  
Adjustable  
The reference voltage inputs are not fully differential. The  
ADC12030/2/4/8 will not generate correct conversions or  
1135442  
comparisons if VREF is taken below VREF. Correct conver-  
+
*Tantalum  
sions result when VREF+ and VREFdiffer by 1V and remain,  
at all times, between ground and VA+. The VREF common  
mode range, (VREF+ + VREF)/2 is restricted to (0.1 × VA+) to  
(0.6 × VA+). Therefore, with VA+ = 5V the center of the refer-  
ence ladder should not go below 0.5V or above 3.0V. Figure  
FIGURE 16. Low Drift Extremely  
Stable Reference Circuit  
The ADC12030/2/4/8 can be used in either ratiometric or ab-  
solute reference applications. In ratiometric systems, the ana-  
log input voltage is proportional to the voltage used for the  
ADC's reference voltage. When this voltage is the system  
power supply, the VREF+ pin is connected to VA+ and VREFis  
connected to ground. This technique relaxes the system ref-  
erence stability requirements because the analog input volt-  
age and the ADC reference voltage move together. This  
maintains the same output code for given input conditions.  
For absolute accuracy, where the analog input voltage varies  
between very specific voltage limits, a time and temperature  
stable voltage source can be connected to the reference in-  
puts. Typically, the reference voltage's magnitude will require  
17 is a graphic representation of the voltage restrictions on  
VREF+ and VREF  
.
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36  
6.0 INPUT SOURCE RESISTANCE  
For low impedance voltage sources (<600Ω), the input charg-  
ing current will decay, before the end of the S/H's acquisition  
time of 2 µs (10 CCLK periods with fC = 5 MHz), to a value  
that will not introduce any conversion errors. For high source  
impedances, the S/H's acquisition time can be increased to  
18 or 34 CCLK periods. For less ADC resolution and/or slower  
CCLK frequencies the S/H's acquisition time may be de-  
creased to 6 CCLK periods. To determine the number of clock  
periods (Nc) required for the acquisition time with a specific  
source impedance for the various resolutions the following  
equations can be used:  
12 Bit + Sign NC = [RS + 2.3] × fC × 0.824  
8 Bit + Sign NC = [RS + 2.3] × fC × 0.57  
Where fC is the conversion clock (CCLK) frequency in MHz  
and RS is the external source resistance in kΩ. As an exam-  
ple, operating with a resolution of 12 Bits+sign, a 5 MHz clock  
frequency and maximum acquisition time of 34 conversion  
clock periods the ADC's analog inputs can handle a source  
impedance as high as 6 kΩ. The acquisition time may also be  
extended to compensate for the settling or response time of  
external circuitry connected between the MUXOUT and A/  
DIN pins.  
1135445  
FIGURE 17. VREF Operating Range  
An acquisition is started by a falling edge of SCLK and ended  
by a rising edge of CCLK (see timing diagrams). If SCLK and  
CCLK are asynchronous one extra CCLK clock period may  
be inserted into the programmed acquisition time for synchro-  
nization. Therefore with asynchronous SCLK and CCLKs the  
acquisition time will change from conversion to conversion.  
4.0 ANALOG INPUT VOLTAGE RANGE  
The ADC12030/2/4/8's fully differential ADC generate a two's  
complement output that is found by using the equations  
shown below:  
for (12-bit) resolution the Output Code =  
7.0 INPUT BYPASS CAPACITANCE  
External capacitors (0.01 µF–0.1 µF) can be connected be-  
tween the analog input pins, CH0–CH7, and analog ground  
to filter any noise caused by inductive pickup associated with  
long input leads. These capacitors will not degrade the con-  
version accuracy.  
for (8-bit) resolution the Output Code =  
8.0 NOISE  
The leads to each of the analog multiplexer input pins should  
be kept as short as possible. This will minimize input noise  
and clock frequency coupling that can cause conversion er-  
rors. Input filtering can be used to reduce the effects of the  
noise sources.  
Round off to the nearest integer value between −4096 to 4095  
for 12-bit resolution and between −256 to 255 for 8-bit reso-  
lution if the result of the above equation is not a whole number.  
Examples are shown in the table below:  
9.0 POWER SUPPLIES  
Digital Output  
Noise spikes on the VA+ and VD+ supply lines can cause con-  
version errors; the comparator will respond to the noise. The  
ADC is especially sensitive to any power supply spikes that  
occur during the auto-zero or linearity correction. The mini-  
mum power supply bypassing capacitors recommended are  
low inductance tantalum capacitors of 10 µF or greater par-  
alleled with 0.1 µF monolithic ceramic capacitors. More or  
different bypassing may be necessary depending on the over-  
all system requirements. Separate bypass capacitors should  
be used for the VA+ and VD+ supplies and placed as close as  
possible to these pins.  
+
+
VREF  
VREF  
VIN  
VIN  
Code  
+2.5V  
+1V  
0V  
+1.5V  
+3V  
0V  
0V  
0,1111,1111,1111  
0,1011,1011,1000  
+4.096V  
+4.096V  
+4.096V  
0V  
+2.499V +2.500V 1,1111,1111,1111  
0V +4.096V 1,0000,0000,0000  
0V  
5.0 INPUT CURRENT  
At the start of the acquisition window (tA) a charging current  
flows into or out of the analog input pins (A/DIN1 and A/DIN2)  
depending on the input voltage polarity. The analog input pins  
are CH0–CH7 and COM when A/DIN1 is tied to MUXOUT1  
and A/DIN2 is tied to MUXOUT2. The peak value of this input  
current will depend on the actual input voltage applied, the  
source impedance and the internal multiplexer switch on re-  
sistance. With MUXOUT1 tied to A/DIN1 and MUXOUT2 tied  
to A/DIN2 the internal multiplexer switch on resistance is typ-  
ically 1.6 kΩ. The A/DIN1 and A/DIN2 mux on resistance is  
typically 750Ω.  
10.0 GROUNDING  
The ADC12030/2/4/8's performance can be maximized  
through proper grounding techniques. These include the use  
of separate analog and digital areas of the board with analog  
and digital components and traces located only in their re-  
spective areas. Bypass capacitors of 0.01 µF and 0.1 µF  
surface mount capacitors and a 10 µF are recommended at  
each of the power supply pins for best performance. These  
37  
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capacitors should be located as close to the bypassed pin as  
practical, especially the smaller value capacitors.  
to digitize AC signals without significant spectral errors and  
without adding noise to the digitized signal. Dynamic charac-  
teristics such as signal-to-noise (S/N), signal-to-noise + dis-  
tortion ratio (S/(N + D)), effective bits, full power bandwidth,  
aperture time and aperture jitter are quantitative measures of  
the A/D converter's capability.  
11.0 CLOCK SIGNAL LINE ISOLATION  
The ADC12030/2/4/8's performance is optimized by routing  
the analog input/output and reference signal conductors as  
far as possible from the conductors that carry the clock signals  
to the CCLK and SCLK pins. Maintaining a separation of at  
least 7 to 10 times the height of the clock trace above its ref-  
erence plane is recommended.  
An A/D converter's AC performance can be measured using  
Fast Fourier Transform (FFT) methods. A sinusoidal wave-  
form is applied to the A/D converter's input, and the transform  
is then performed on the digitized waveform. S/(N + D) and  
S/N are calculated from the resulting FFT data, and a spectral  
plot may also be obtained. Typical values for S/N are shown  
in the table of Electrical Characteristics, and spectral plots of  
S/(N + D) are included in the typical performance curves.  
12.0 THE CALIBRATION CYCLE  
A calibration cycle needs to be started after the power sup-  
plies, reference, and clock have been given enough time to  
stabilize after initial turn-on. During the calibration cycle, cor-  
rection values are determined for the offset voltage of the  
sampled data comparator and any linearity and gain errors.  
These values are stored in internal RAM and used during an  
analog-to-digital conversion to bring the overall full-scale, off-  
set, and linearity errors down to the specified limits. Full-scale  
error typically changes ±0.4 LSB over temperature and lin-  
earity error changes even less; therefore it should be neces-  
sary to go through the calibration cycle only once after power  
up if the Power Supply Voltage and the ambient temperature  
do not change significantly (see the curves in the Typical Per-  
formance Characteristics).  
The A/D converter's noise and distortion levels will change  
with the frequency of the input signal, with more distortion and  
noise occurring at higher signal frequencies. This can be seen  
in the S/(N + D) versus frequency curves.  
Effective number of bits can also be useful in describing the  
A/D's noise and distortion performance. An ideal A/D con-  
verter will have some amount of quantization noise, deter-  
mined by its resolution, and no distortion, which will yield an  
optimum S/(N + D) ratio given by the following equation:  
S/(N + D) = (6.02 × n + 1.76) dB  
where "n" is the A/D's resolution in bits.  
13.0 THE AUTO-ZERO CYCLE  
Since the ideal A/D converter has no distortion, the effective  
bits of a real A/D converter, therefore, can be found by:  
To correct for any change in the zero (offset) error of the A/D,  
the auto-zero cycle can be used. It may be necessary to do  
an auto-zero cycle whenever the ambient temperature or the  
power supply voltage change significantly. (See the curves  
titled “Zero Error Change vs. Ambient Temperature” and “Ze-  
ro Error Change vs. Supply Voltage” in the Typical Perfor-  
mance Characteristics.)  
n(effective) = ENOB = (S/(N + D) - 1.76 / 6.02  
As an example, this device with a differential signed 5V, 1 kHz  
sine wave input signal will typically have a S/(N + D) of 77 dB,  
which is equivalent to 12.5 effective bits.  
15.0 AN RS232 SERIAL INTERFACE  
Shown on the following page is a schematic for an RS232  
interface to any IBM and compatible PCs. The DTR, RTS, and  
CTS RS232 signal lines are buffered via level translators and  
connected to the ADC12038's DI, SCLK, and DO pins, re-  
spectively. The D flip flop drives the CS control line.  
14.0 DYNAMIC PERFORMANCE  
Many applications require the A/D converter to digitize AC  
signals, but the standard DC integral and differential nonlin-  
earity specifications will not accurately predict the A/D  
converter's performance with AC input signals. The important  
specifications for AC applications reflect the converter's ability  
1135444  
Note: VA+, VD+, and VREF+ on the ADC12038 each have 0.01 µF and 0.1 µF chip caps, and 10 µF tantalum caps. All logic devices are bypassed with 0.1 µF caps.  
The assignment of the RS232 port is shown below  
B7  
X
B6  
X
B5  
X
B4  
CTS  
0
B3  
X
B2  
X
B1  
B0  
Input Address  
3FE  
3FC  
X
X
COM1  
Output Address  
X
X
X
X
X
RTS DTR  
www.national.com  
38  
A sample program, written in Microsoft QuickBasic, is shown  
on the next page. The program prompts for data mode select  
instruction to be sent to the A/D. This can be found from the  
Mode Programming table shown earlier. The data should be  
entered in “1”s and “0”s as shown in the table with DI0 first.  
Next the program prompts for the number of SCLKs required  
for the programmed mode select instruction. For instance, to  
send all “0”s to the A/D, selects CH0 as the +input, CH1 as  
the −input, 12-bit conversion, and 13-bit MSB first data output  
format (if the sign bit was not turned off by a previous instruc-  
tion). This would require 13 SCLK periods since the output  
data format is 13 bits.  
power up, 12- or 13-bit MSB first, and user mode. Auto Cal,  
Auto Zero, Power Up and Power Down instructions do not  
change these default settings. The following power up se-  
quence should be followed:  
1. Run the program  
2. Prior to responding to the prompt apply the power to the  
ADC12038  
3. Respond to the program prompts  
It is recommended that the first instruction issued to the  
ADC12038 be Auto Cal (see Section 1.1).  
The ADC powers up with No Auto Cal, No Auto Zero, 10  
CCLK Acquisition Time, 12-bit conversion, data out with sign,  
39  
www.national.com  
Code Listing:  
'variables DOL=Data Out word length, DI=Data string for A/D DI input,  
'
DO=A/D result string  
'SET CS# HIGH  
OUT  
OUT  
OUT  
OUT  
10  
&H3FC, (&H2 OR INP (&H3FC))  
'set RTS HIGH  
'set DTR LOW  
'set RTS LOW  
'set B4 low  
&H3FC, (&HFE AND INP(&H3FC))  
&H3FC, (&HFD AND INP(&H3FC))  
&H3FC, (&HEF AND INP(&H3FC))  
LINE INPUT “DI data for ADC12038 (see Mode Table on data sheet)”; DI$  
INPUT “ADC12038 output word length (8,9,12,13,16 or 17)”; DOL  
20  
'SET CS# HIGH  
OUT  
OUT  
OUT  
&H3FC, (&H2 OR INP (&H3FC))  
&H3FC, (&HFE AND INP(&H3FC))  
&H3FC, (&HFD AND INP(&H3FC))  
'set RTS HIGH  
'set DTR LOW  
'set RTS LOW  
'SET CS# LOW  
OUT  
OUT  
OUT  
DO$=  
&H3FC, (&H2 OR INP (&H3FC))  
'set RTS HIGH  
'set DTR HIGH  
'set RTS LOW  
'reset DO variable  
'SET DTR HIGH  
'SCLK low  
&H3FC, (&H1 OR INP(&H3FC))  
&H3FC, (&HFD AND INP(&H3FC))  
“ ”  
OUT &H3FC, (&H1 OR INP(&H3FC))  
OUT &H3FC, (&HFD AND INP(&H3FC))  
FOR N=1 TO 8  
Temp$=MID$(DI$,N,1)  
IF Temp$=“0” THEN  
OUT &H3FC,(&H1 OR INP(&H3FC))  
ELSE OUT &H3FC, (&HFE AND INP(&H3FC))  
END IF  
'out DI  
OUT &H3FC, (&H2 OR INP(&H3FC))  
IF (INP(&H3FE) AND 16)=16 THEN  
DO$=DO$+“0”  
'SCLK high  
ELSE  
DO$=DO$+“1”  
END IF  
'input DO  
OUT &H3FC, (&H1 OR INP(&H3FC))  
OUT &H3FC, (&HFD AND INP(&H3FC))  
NEXT N  
'SET DTR HIGH  
'SCLK low  
IF DOL>8 THEN  
FOR N=9 TO DOL  
OUT &H3FC, (&H1 OR INP(&H3FC))  
OUT &H3FC, (&HFD AND INP(&H3FC))  
OUT &H3FC, (&H2 OR INP(&H3FC))  
IF (INP(&H3FE) AND &H10)=&H10 THEN  
DO$=DO$+“0”  
'SET DTR HIGH  
'SCLK low  
'SCLK high  
ELSE  
DO$=DO$+“1”  
END IF  
NEXT N  
END IF  
OUT  
&H3FC, (&HFA AND INP(&H3FC))  
'SCLK low and DI high  
FOR N=1 TO 500  
NEXT N  
PRINT DO$  
INPUT “Enter “C” to convert else “RETURN” to alter DI data”; s$  
IF s$=“C” OR s$=“c” THEN  
GOTO 20  
ELSE  
GOTO 10  
END IF  
END  
www.national.com  
40  
Physical Dimensions inches (millimeters) unless otherwise noted  
Order Number ADC12030CIWM or ADC12H030CIWM  
NS Package Number M16B  
Order Number ADC12032CIWM  
NS Package Number M20B  
41  
www.national.com  
Order Number ADC12034CIWM  
NS Package Number M24B  
Order Number ADC12H034CIMSA  
NS Package Number MSA24  
www.national.com  
42  
Order Number ADC12038CIWM or ADC12H038CIWM  
NS Package Number M28B  
Order Number ADC12034CIN  
NS Package Number N24C  
43  
www.national.com  
Notes  
THE CONTENTS OF THIS DOCUMENT ARE PROVIDED IN CONNECTION WITH NATIONAL SEMICONDUCTOR CORPORATION  
(“NATIONAL”) PRODUCTS. NATIONAL MAKES NO REPRESENTATIONS OR WARRANTIES WITH RESPECT TO THE ACCURACY  
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