LM5109BMAX [NSC]

High Voltage 1A Peak Half Bridge Gate Driver; 高电压1A峰值半桥栅极驱动器
LM5109BMAX
型号: LM5109BMAX
厂家: National Semiconductor    National Semiconductor
描述:

High Voltage 1A Peak Half Bridge Gate Driver
高电压1A峰值半桥栅极驱动器

驱动器 MOSFET驱动器 栅极 驱动程序和接口 接口集成电路 光电二极管 栅极驱动
文件: 总10页 (文件大小:272K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
February 2007  
LM5109B  
High Voltage 1A Peak Half Bridge Gate Driver  
Fast propagation times (30 ns typical)  
General Description  
Drives 1000 pF load with 15ns rise and fall times  
Excellent propagation delay matching (2 ns typical)  
Supply rail under-voltage lockout  
The LM5109B is a cost effective, high voltage gate driver de-  
signed to drive both the high-side and the low-side N-Channel  
MOSFETs in a synchronous buck or a half bridge configura-  
tion. The floating high-side driver is capable of working with  
rail voltages up to 90V. The outputs are independently con-  
trolled with TTL compatible input thresholds. The robust level  
shift technology operates at high speed while consuming low  
power and providing clean level transitions from the control  
input logic to the high-side gate driver. Under-voltage lockout  
is provided on both the low-side and the high-side power rails.  
The device is available in the SOIC-8 and the thermally en-  
hanced LLP-8 packages.  
Low power consumption  
Pin compatible with ISL6700  
Typical Applications  
Current Fed push-pull converters  
Half and Full Bridge power converters  
Solid state motor drives  
Two switch forward power converters  
Features  
Package  
Drives both a high-side and low-side N-Channel MOSFET  
SOIC-8  
1A peak output current (1.0A sink / 1.0A source)  
LLP-8 (4 mm x 4 mm)  
Independent TTL compatible inputs  
Bootstrap supply voltage to 108V DC  
Simplified Block Diagram  
20211901  
FIGURE 1.  
© 2007 National Semiconductor Corporation  
202119  
www.national.com  
Connection Diagrams  
20211902  
20211903  
FIGURE 2.  
Ordering Information  
Ordering Number  
LM5109BMA  
Package Type  
NSC Package Drawing  
Supplied As  
95 Units in anti static rails  
2500 Units on Tape & Reel  
1000 Units on Tape & Reel  
4500 Units on Tape & Reel  
SOIC-8  
SOIC-8  
LLP-8  
M08A  
M08A  
LM5109BMAX  
LM5109BSD  
LM5109BSDX  
SDC08A  
SDC08A  
LLP-8  
Pin Descriptions  
Pin #  
Name  
Description  
Application Information  
SO-8  
LLP-8  
1
1
VDD  
HI  
Positive gate drive supply  
Locally decouple to VSS using low ESR/ESL capacitor located as  
close to IC as possible.  
2
3
2
3
High side control input  
Low side control input  
The HI input is compatible with TTL input thresholds. Unused HI  
input should be tied to ground and not left open.  
LI  
The LI input is compatible with TTL input thresholds. Unused LI input  
should be tied to ground and not left open.  
4
5
6
4
5
6
VSS  
LO  
HS  
Ground reference  
All signals are referenced to this ground.  
Low side gate driver output  
High side source connection  
Connect to the gate of the low-side N-MOS device.  
Connect to the negative terminal of the bootstrap capacitor and to  
the source of the high-side N-MOS device.  
7
8
7
8
HO  
HB  
High side gate driver output  
Connect to the gate of the high-side N-MOS device.  
High side gate driver positive  
supply rail  
Connect the positive terminal of the bootstrap capacitor to HB and  
the negative terminal of the bootstrap capacitor to HS. The bootstrap  
capacitor should be placed as close to IC as possible.  
Note: For LLP-8 package it is recommended that the exposed pad on the bottom of the package be soldered to ground plane on the PCB and the  
ground plane should extend out from underneath the package to improve heat dissipation.  
www.national.com  
2
Junction Temperature  
Storage Temperature Range  
ESD Rating HBM (Note 2)  
-40°C to +150°C  
−55°C to +150°C  
1.5 kV  
Absolute Maximum Ratings (Note 1)  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
Recommended Operating  
VDD to VSS  
-0.3V to 18V  
−0.3V to 18V  
Conditions  
HB to HS  
VDD  
8V to 14V  
−1V to 90V  
VHS +8V to VHS +14V  
< 50 V/ns  
LI or HI to VSS  
LO to VSS  
−0.3V to VDD +0.3V  
−0.3V to VDD +0.3V  
VHS −0.3V to VHB +0.3V  
HS (Note 6)  
HB  
HO to VSS  
HS Slew Rate  
Junction Temperature  
HS to VSS (Note 6)  
HB to VSS  
−5V to 90V  
108V  
−40°C to +125°C  
Electrical Characteristics  
Specifications in standard typeface are for TJ = +25°C, and those in boldface type apply over the full operating junction tem-  
perature range. Unless otherwise specified, VDD = VHB = 12V, VSS = VHS = 0V, No Load on LO or HO (Note 4).  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
SUPPLY CURRENTS  
IDD  
VDD Quiescent Current  
LI = HI = 0V  
f = 500 kHz  
LI = HI = 0V  
f = 500 kHz  
0.3  
1.8  
0.6  
2.9  
0.2  
2.8  
10  
mA  
mA  
mA  
mA  
µA  
IDDO  
IHB  
VDD Operating Current  
Total HB Quiescent Current  
Total HB Operating Current  
HB to VSS Current, Quiescent  
HB to VSS Current, Operating  
0.06  
1.4  
IHBO  
IHBS  
IHBSO  
VHS = VHB = 90V  
f = 500 kHz  
0.1  
0.5  
mA  
INPUT PINS LI and HI  
VIL  
VIH  
RI  
Low Level Input Voltage Threshold  
0.8  
100  
6.0  
5.7  
1.8  
1.8  
V
V
High Level Input Voltage Threshold  
Input Pulldown Resistance  
2.2  
200  
500  
kΩ  
UNDER VOLTAGE PROTECTION  
VDDR  
VDDH  
VHBR  
VHBH  
VDD Rising Threshold  
VDD Threshold Hysteresis  
HB Rising Threshold  
VDDR = VDD - VSS  
6.7  
0.5  
6.6  
0.4  
7.4  
7.1  
V
V
V
V
VHBR = VHB - VHS  
HB Threshold Hysteresis  
LO GATE DRIVER  
VOLL Low-Level Output Voltage  
ILO = 100 mA  
0.38  
0.72  
0.65  
1.20  
V
V
VOHL = VLO – VSS  
VOHL  
High-Level Output Voltage  
ILO = −100 mA,  
VOHL = VDD– VLO  
IOHL  
IOLL  
Peak Pullup Current  
VLO = 0V  
1.0  
1.0  
A
A
Peak Pulldown Current  
VLO = 12V  
HO GATE DRIVER  
VOLH Low-Level Output Voltage  
IHO = 100 mA  
0.38  
0.72  
0.65  
1.20  
V
V
VOLH = VHO– VHS  
VOHH  
High-Level Output Voltage  
IHO = −100 mA  
VOHH = VHB– VHO  
IOHH  
IOLH  
Peak Pullup Current  
VHO = 0V  
1.0  
1.0  
A
A
Peak Pulldown Current  
VHO = 12V  
THERMAL RESISTANCE  
Junction to Ambient  
SOIC-8 (Note 3), (Note 5)  
LLP-8 (Note 3), (Note 5)  
160  
40  
θJA  
°C/W  
3
www.national.com  
Switching Characteristics  
Specifications in standard typeface are for TJ = +25°C, and those in boldface type apply over the full operating junction tem-  
perature range. Unless otherwise specified, VDD = VHB = 12V, VSS = VHS = 0V, No Load on LO or HO.  
Symbol  
tLPHL  
Parameter  
Conditions  
Min  
Typ  
Max  
56  
Units  
Lower Turn-Off Propagation Delay (LI  
Falling to LO Falling)  
30  
ns  
tHPHL  
tLPLH  
tHPLH  
tMON  
tMOFF  
Upper Turn-Off Propagation Delay (HI  
Falling to HO Falling)  
30  
32  
32  
2
56  
56  
56  
15  
ns  
ns  
ns  
ns  
Lower Turn-On Propagation Delay (LI  
Rising to LO Rising)  
Upper Turn-On Propagation Delay (HI  
Rising to HO Rising)  
Delay Matching: Lower Turn-On and  
Upper Turn-Off  
Delay Matching: Lower Turn-Off and  
Upper Turn-On  
2
15  
ns  
ns  
ns  
tRC, tFC  
tPW  
Either Output Rise/Fall Time  
CL = 1000 pF  
15  
50  
-
Minimum Input Pulse Width that Changes  
the Output  
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the component may occur. Operating Ratings are conditions under which operation  
of the device is guaranteed. Operating Ratings do not imply guaranteed performance limits. For guaranteed performance limits and associated test conditions,  
see the Electrical Characteristics tables.  
Note 2: The human body model is a 100 pF capacitor discharged through a 1.5kresistor into each pin.  
Note 3: 4 layer board with Cu finished thickness 1.5/1/1/1.5 oz. Maximum die size used. 5x body length of Cu trace on PCB top. 50 x 50mm ground and power  
planes embedded in PCB. See Application Note AN-1187.  
Note 4: Min and Max limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlation using Statistical  
Quality Control (SQC) methods. Limits are used to calculate National’s Average Outgoing Quality Level (AOQL).  
Note 5: The θJA is not a constant for the package and depends on the printed circuit board design and the operating conditions.  
Note 6: In the application the HS node is clamped by the body diode of the external lower N-MOSFET, therefore the HS voltage will generally not exceed -1V.  
However in some applications, board resistance and inductance may result in the HS node exceeding this stated voltage transiently.  
If negative transients occur on HS, the HS voltage must never be more negative than VDD - 15V. For example, if VDD = 10V, the negative transients at HS must  
not exceed -5V.  
www.national.com  
4
Typical Performance Characteristics  
VDD Operating Current vs Frequency  
HB Operating Current vs Frequency  
20211905  
20211904  
Operating Current vs Temperature  
Quiescent Current vs Temperature  
20211906  
20211907  
Quiescent Current vs Voltage  
Propagation Delay vs Temperature  
20211909  
20211908  
5
www.national.com  
LO and HO High Level Output Voltage vs Temperature  
LO and HO Low Level Output Voltage vs Temperature  
20211910  
20211911  
Undervoltage Rising Thresholds vs Temperature  
Undervoltage Hysteresis vs Temperature  
20211914  
20211915  
Input Thresholds vs Temperature  
Input Thresholds vs Supply Voltage  
20211917  
20211916  
www.national.com  
6
Timing Diagram  
20211918  
FIGURE 3.  
and involves high peak current. Minimizing this loop  
length and area on the circuit board is important to ensure  
reliable operation.  
Layout Considerations  
Optimum performance of high and low-side gate drivers can-  
not be achieved without taking due considerations during  
circuit board layout. The following points are emphasized:  
HS Transient Voltages Below  
Ground  
The HS node will always be clamped by the body diode of the  
lower external FET. In some situations, board resistances and  
inductances can cause the HS node to transiently swing sev-  
eral volts below ground. The HS node can swing below  
ground provided:  
1. HS must always be at a lower potential than HO. Pulling  
HO more than -0.3V below HS can activate parasitic  
transistors resulting in excessive current flow from the  
HB supply, possibly resulting in damage to the IC. The  
same relationship is true with LO and VSS. If necessary,  
a Schottky diode can be placed externally between HO  
and HS or LO and GND to protect the IC from this type  
of transient. The diode must be placed as close to the IC  
pins as possible in order to be effective.  
1. Low ESR / ESL capacitors must be connected close to  
the IC between VDD and VSS pins and between HB and  
HS pins to support high peak currents being drawn from  
VDD and HB during the turn-on of the external  
MOSFETs.  
2. To prevent large voltage transients at the drain of the top  
MOSFET, a low ESR electrolytic capacitor and a good  
quality ceramic capacitor must be connected between  
the MOSFET drain and ground (VSS).  
3. In order to avoid large negative transients on the switch  
node (HS) pin, the parasitic inductances between the  
source of the top MOSFET and the drain of the bottom  
MOSFET (synchronous rectifier) must be minimized.  
4. Grounding considerations:  
a) The first priority in designing grounding connections is  
to confine the high peak currents that charge and  
discharge the MOSFET gates to a minimal physical area.  
This will decrease the loop inductance and minimize  
noise issues on the gate terminals of the MOSFETs. The  
gate driver should be placed as close as possible to the  
MOSFETs.  
b) The second consideration is the high current path that  
includes the bootstrap capacitor, the bootstrap diode, the  
local ground referenced bypass capacitor, and the low-  
side MOSFET body diode. The bootstrap capacitor is  
recharged on a cycle-by-cycle basis through the  
bootstrap diode from the ground referenced VDD bypass  
capacitor. The recharging occurs in a short time interval  
2. HB to HS operating voltage should be 15V or less.  
Hence, if the HS pin transient voltage is -5V, VDD should  
be ideally limited to 10V to keep HB to HS below 15V.  
3. Low ESR bypass capacitors from HB to HS and from  
VDD to VSS are essential for proper operation. The  
capacitor should be located at the leads of the IC to  
minimize series inductance. The peak currents from LO  
and HO can be quite large. Any series inductances with  
the bypass capacitor will cause voltage ringing at the  
leads of the IC which must be avoided for reliable  
operation.  
7
www.national.com  
Physical Dimensions inches (millimeters) unless otherwise noted  
Controlling dimension is inch. Values in [] are millimeters.  
Notes: Unless otherwise specified.  
Standard lead finish to be 200 microinches/5.08 micrometers minimum lead/tin (solder) on copper.  
1.  
Dimension does not include mold flash.  
2.  
Reference JEDEC registration MS-012, Variation AA, dated May 1990.  
3.  
SOIC-8 Outline Drawing  
NS Package Number M08A  
www.national.com  
8
Notes: Unless otherwise specified.  
For solder thickness and composition, see “Solder Information” in the packaging section of the National Semiconductor web page (www.national.com).  
1.  
Maximum allowable metal burr on lead tips at the package edges is 76 microns.  
2.  
No JEDEC registration as of May 2003.  
3.  
LLP-8 Outline Drawing  
NS Package Number SDC08A  
9
www.national.com  
Notes  
THE CONTENTS OF THIS DOCUMENT ARE PROVIDED IN CONNECTION WITH NATIONAL SEMICONDUCTOR CORPORATION  
(“NATIONAL”) PRODUCTS. NATIONAL MAKES NO REPRESENTATIONS OR WARRANTIES WITH RESPECT TO THE ACCURACY  
OR COMPLETENESS OF THE CONTENTS OF THIS PUBLICATION AND RESERVES THE RIGHT TO MAKE CHANGES TO  
SPECIFICATIONS AND PRODUCT DESCRIPTIONS AT ANY TIME WITHOUT NOTICE. NO LICENSE, WHETHER EXPRESS,  
IMPLIED, ARISING BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS  
DOCUMENT.  
TESTING AND OTHER QUALITY CONTROLS ARE USED TO THE EXTENT NATIONAL DEEMS NECESSARY TO SUPPORT  
NATIONAL’S PRODUCT WARRANTY. EXCEPT WHERE MANDATED BY GOVERNMENT REQUIREMENTS, TESTING OF ALL  
PARAMETERS OF EACH PRODUCT IS NOT NECESSARILY PERFORMED. NATIONAL ASSUMES NO LIABILITY FOR  
APPLICATIONS ASSISTANCE OR BUYER PRODUCT DESIGN. BUYERS ARE RESPONSIBLE FOR THEIR PRODUCTS AND  
APPLICATIONS USING NATIONAL COMPONENTS. PRIOR TO USING OR DISTRIBUTING ANY PRODUCTS THAT INCLUDE  
NATIONAL COMPONENTS, BUYERS SHOULD PROVIDE ADEQUATE DESIGN, TESTING AND OPERATING SAFEGUARDS.  
EXCEPT AS PROVIDED IN NATIONAL’S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, NATIONAL ASSUMES NO  
LIABILITY WHATSOEVER, AND NATIONAL DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY RELATING TO THE SALE  
AND/OR USE OF NATIONAL PRODUCTS INCLUDING LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A PARTICULAR  
PURPOSE, MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY  
RIGHT.  
LIFE SUPPORT POLICY  
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR  
SYSTEMS WITHOUT THE EXPRESS PRIOR WRITTEN APPROVAL OF THE CHIEF EXECUTIVE OFFICER AND GENERAL  
COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:  
Life support devices or systems are devices which (a) are intended for surgical implant into the body, or (b) support or sustain life and  
whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected  
to result in a significant injury to the user. A critical component is any component in a life support device or system whose failure to perform  
can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness.  
National Semiconductor and the National Semiconductor logo are registered trademarks of National Semiconductor Corporation. All other  
brand or product names may be trademarks or registered trademarks of their respective holders.  
Copyright© 2007 National Semiconductor Corporation  
For the most current product information visit us at www.national.com  
National Semiconductor  
Americas Customer  
Support Center  
National Semiconductor Europe  
Customer Support Center  
Fax: +49 (0) 180-530-85-86  
National Semiconductor Asia  
Pacific Customer Support Center  
Email: ap.support@nsc.com  
National Semiconductor Japan  
Customer Support Center  
Fax: 81-3-5639-7507  
Email:  
new.feedback@nsc.com  
Tel: 1-800-272-9959  
Email: europe.support@nsc.com  
Deutsch Tel: +49 (0) 69 9508 6208  
English Tel: +49 (0) 870 24 0 2171  
Français Tel: +33 (0) 1 41 91 8790  
Email: jpn.feedback@nsc.com  
Tel: 81-3-5639-7560  
www.national.com  

相关型号:

LM5109BMAX/NOPB

1-A, 100-V half bridge gate driver with 8-V UVLO and high noise immunity 8-SOIC -40 to 125
TI

LM5109BQNGTRQ1

High Voltage 1-A Peak Half Bridge Gate Driver
TI

LM5109BQNGTTQ1

High Voltage 1-A Peak Half Bridge Gate Driver
TI

LM5109BSD

High Voltage 1A Peak Half Bridge Gate Driver
NSC

LM5109BSD/NOPB

1-A, 100-V half bridge gate driver with 8-V UVLO and high noise immunity 8-WSON -40 to 125
TI

LM5109BSDX

High Voltage 1A Peak Half Bridge Gate Driver
NSC

LM5109BSDX/NOPB

具有 8V UVLO 和高噪声抗扰度的 1A、100V 半桥栅极驱动器 | NGT | 8 | -40 to 125
TI

LM5109MA

100V / 1A Peak Half Bridge Gate Driver
NSC

LM5109MA/NOPB

IC 1 A HALF BRDG BASED MOSFET DRIVER, PDSO8, MS-012AA, SOIC-8, MOSFET Driver
NSC

LM5109MA/NOPB

High Voltage 1-A Peak Half-Bridge Gate Driver
TI

LM5109MAX

100V / 1A Peak Half Bridge Gate Driver
NSC

LM5109MAX/NOPB

100V / 1A peak half bridge gate driver 8-SOIC
TI