LMX2316TM [NSC]

PLLatinum⑩ Low Power Frequency Synthesizer for RF Personal Communications; 半导体PLLatinum ™低功耗频率合成射频个人通信
LMX2316TM
型号: LMX2316TM
厂家: National Semiconductor    National Semiconductor
描述:

PLLatinum⑩ Low Power Frequency Synthesizer for RF Personal Communications
半导体PLLatinum ™低功耗频率合成射频个人通信

半导体 射频 个人通信
文件: 总19页 (文件大小:304K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
April 2000  
LMX2306/LMX2316/LMX2326  
PLLatinum Low Power Frequency Synthesizer for RF  
Personal Communications  
LMX2306  
LMX2316  
LMX2326  
550 MHz  
1.2 GHz  
2.8 GHz  
General Description  
Features  
n 2.3V to 5.5V operation  
The LMX2306/16/26 are monolithic, integrated frequency  
synthesizers with prescalers that are designed to be used to  
generate a very stable low noise signal for controlling the lo-  
cal oscillator of an RF transceiver. They are fabricated using  
National’s ABiC V silicon BiCMOS 0.5µ process.  
n Ultra low current consumption  
n 2.5V VCC JEDEC standard compatible  
n Programmable or logical power down mode:  
— ICC = 1 µA typical at 3V  
The LMX2306 contains a 8/9 dual modulus prescaler while  
the LMX2316 and the LMX2326 have a 32/33 dual modulus  
prescaler. The LMX2306/16/26 employ a digital phase  
locked loop technique. When combined with a high quality  
reference oscillator and loop filter, the LMX2306/16/26 pro-  
vide the feedback tuning voltage for a voltage controlled os-  
cillator to generate a low phase noise local oscillator signal.  
Serial data is transferred into the LMX2306/16/26 via a three  
wire interface (Data, Enable, Clock). Supply voltage can  
range from 2.3V to 5.5V. The LMX2306/16/26 feature ultra  
n Dual modulus prescaler:  
— LMX2306  
— LMX2316/26  
8/9  
32/33  
n Selectable charge pump TRI-STATE® mode  
n Selectable FastLock mode with timeout counter  
n MICROWIRE Interface  
n Digital Lock Detect  
Applications  
n Portable wireless communications (PCS/PCN, cordless)  
n Wireless Local Area Networks (WLANs)  
n Cable TV tuners (CATV)  
low current consumption; LMX2306  
- 1.7 mA at 3V,  
LMX2316 - 2.5 mA at 3V, and LMX2326 - 4.0 mA at 3V.  
The LMX2306/16/26 synthesizers are available in a 16-pin  
TSSOP surface mount plastic package.  
n Pagers  
n Other wireless communication systems  
Functional Block Diagram  
DS100127-1  
TRI-STATE® is a registered trademark of National Semiconductor Corporation.  
FastLock , PLLatinum and MICROWIRE are trademarks of National Semiconductor Corporation.  
© 2000 National Semiconductor Corporation  
DS100127  
www.national.com  
Connection Diagrams  
LMX2306/16/26  
LMX2306/16/26  
DS100127-2  
DS100127-19  
16-Lead (0.173” Wide) Thin Shrink Small Outline  
Package(TM)  
16-pin Chip Scale Package  
Order Number LMX2306SLBX, LMX2316SLBX or  
LM2326SLBX  
Order Number LMX2306TM, LMX2306TMX,  
LMX2316TM, LMX2316TMX,  
See NS Package Number SLB16A  
LMX2326TM or LMX2326TMX  
See NS Package Number MTC16  
Pin Descriptions  
16-Pin 16-Pin  
TSSOP CSP  
Pin  
Name  
FLo  
I/O  
Description  
1
15  
O
FastLock Output. For connection of parallel resistor to the loop filter. (See Section 1.3.4  
FASTLOCK MODES description.)  
2
3
4
5
16  
1
CPo  
GND  
GND  
fIN  
O
Charge Pump Output. For connection to a loop filter for driving the input of an external VCO.  
Charge Pump Ground.  
Analog Ground.  
2
3
I
I
RF Prescaler Complementary Input. A bypass capacitor should be placed as close as possible to  
this pin and be connected directly to the ground plane. The complementary input can be left  
unbypassed, with some degradation in RF sensitivity.  
6
7
4
5
fIN  
RF Prescaler Input. Small signal input from the VCO.  
VCC1  
Analog Power Supply Voltage Input. Input may range from 2.3V to 5.5V. Bypass capacitors should  
be placed as close as possible to this pin and be connected directly to the ground plane. VCC1  
must equal VCC2  
.
8
6
OSCIN  
I
I
Oscillator Input. This input is a CMOS input with a threshold of approximately VCC/2 and an  
equivalent 100k input resistance. The oscillator input is driven from a reference oscillator.  
9
7
8
GND  
CE  
Digital Ground.  
10  
Chip Enable. A LOW on CE powers down the device and will TRI-STATE the charge pump output.  
Taking CE HIGH will power up the device depending on the status of the power down bit F2. (See  
Section 1.3.1 POWERDOWN OPERATION and Section 1.7.1 DEVICE PROGRAMMING AFTER  
FIRST APPLYING VCC.)  
11  
12  
13  
14  
15  
9
Clock  
Data  
LE  
I
I
High Impedance CMOS Clock Input. Data for the various counters is clocked in on the rising edge  
into the 21-bit shift register.  
10  
11  
12  
13  
Binary Serial Data Input. Data entered MSB first. The last two bits are the control bits. High  
impedance CMOS input.  
I
Load Enable CMOS Input. When LE goes HIGH, data stored in the shift registers is loaded into one  
of the 3 appropriate latches (control bit dependent).  
Fo/LD  
VCC2  
O
Multiplexed Output of the RF Programmable or Reference Dividers and Lock Detect. CMOS output.  
(See Table 4.)  
Digital Power Supply Voltage Input. Input may range from 2.3V to 5.5V. Bypass capacitors should  
be placed as close as possible to this pin and be connected directly to the ground plane. VCC1  
must equal VCC2  
.
16  
14  
VP  
Power Supply for Charge Pump. Must be VCC.  
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2
Absolute Maximum Ratings (Note 1)  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
Recommended Operating  
Conditions  
Min  
Max  
Units  
Power Supply Voltage  
Power Supply Voltage  
VCC1  
2.3  
VCC1  
VCC  
−40  
5.5  
VCC1  
5.5  
V
V
VCC1  
−0.3V to +6.5V  
−0.3V to +6.5V  
−0.3V to +6.5V  
VCC2  
VCC2  
Vp  
V
Vp  
Operating Temperature (TA)  
+85  
˚C  
Voltage on Any Pin  
with GND = 0V (VI)  
Storage Temperature Range (TS)  
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to  
the device may occur. Recommended operating conditions indicate condi-  
tions for which the device is intended to be functional, but do not guarantee  
specific performance limits. For guaranteed specifications and test condi-  
tions, see the Electrical Characteristics. The guaranteed specifications apply  
only for the test conditions listed.  
−0.3V to VCC + 0.3V  
−65˚C to +150˚C  
Lead Temperature (TL)  
(solder, 4 sec.)  
+260˚C  
Note 2: This device is a high performance RF integrated circuit with an ESD  
<
rating 2 keV and is ESD sensitive. Handling and assembly of this device  
should only be done at ESD protected work stations.  
Electrical Characteristics  
<
<
VCC = 3.0V, Vp = 3.0V; −40˚C TA 85˚C except as specified  
Symbol  
Parameter  
Conditions  
Values  
Typ  
1.7  
Units  
Min  
Max  
ICC  
Power Supply Current  
LMX2306  
LMX2316  
LMX2326  
VCC = 2.3V to 5.5 V  
VCC = 2.3V to 5.5V  
VCC = 2.3V to 5.5V  
VCC = 3.0V  
mA  
mA  
2.5  
4.0  
mA  
ICC-PWDN  
fIN  
Powerdown Current  
1
µA  
RF Input Operating  
Frequency  
LMX2306  
LMX2316  
LMX2326  
VCC = 2.3V to 5.5V  
VCC = 2.3V to 5.5V  
VCC = 2.3V to 5.5V  
VCC = 2.6V to 5.5V  
25  
0.1  
0.1  
0.1  
5
550  
1.2  
2.1  
2.8  
40  
MHz  
GHz  
GHz  
GHz  
MHz  
MHz  
dBm  
dBm  
dBm  
dBm  
V
fosc  
fφ  
Maximum Oscillator Frequency  
Maximum Phase Detector Frequency  
RF Input Sensitivity  
10  
PfIN  
VCC = 3.0V  
VCC = 5.0V  
VCC =2.3V to 5.5V  
OSCIN  
−15  
−10  
+0  
+0  
−10  
+0  
Posc  
VIH  
VIL  
Oscillator Sensitivity  
−5  
High-Level Input Voltage  
Low-Level Input Voltage  
(Note 4)  
0.8 x VCC  
(Note 4)  
0.2 x  
VCC  
V
IIH  
IIL  
High-Level Input Current  
Low-Level Input Current  
VIH = VCC = 5.5V (Note 4)  
−1.0  
−1.0  
1.0  
1.0  
µA  
µA  
VIL = 0V, VCC = 5.5V  
(Note 4)  
IIH  
Oscillator Input Current  
Oscillator Input Current  
Charge Pump Output Current  
VIH = VCC = 5.5V  
100  
µA  
µA  
µA  
IIL  
VIL = 0V, VCC = 5.5V  
−100  
ICPo-source  
VDo = Vp/2, ICPo = LOW  
(Note 3)  
−250  
250  
−1.0  
1.0  
ICPo-sink  
ICPo-source  
ICPo-sink  
ICPo-Tri  
VDo = Vp/2, ICPo = LOW  
(Note 3)  
µA  
mA  
mA  
nA  
VDo = Vp/2, ICPo = HIGH  
(Note 3)  
VCPo = Vp/2, ICPo = HIGH  
(Note 3)  
Charge Pump TRI-STATE Current  
CP Sink vs Source Mismatch  
0.5 VCPo Vp − 0.5  
−1.0  
1.0  
<
<
−40˚C TA 85˚C  
ICPo-sink vs  
ICPo-source  
VCPo = Vp/2  
5
%
TA = 25˚C  
3
www.national.com  
Electrical Characteristics (Continued)  
<
<
VCC = 3.0V, Vp = 3.0V; −40˚C TA 85˚C except as specified  
Symbol Parameter  
Conditions  
Values  
Typ  
5
Units  
%
Min  
Max  
ICPo vs VDo CP Current vs Voltage  
0.5 VCPo Vp − 0.5  
TA = 25˚C  
ICPo vs T  
CP Current vs Temperature  
VCPo = Vp/2  
5
%
<
<
−40˚C TA 85˚C  
VOH  
VOL  
tCS  
High-Level Output Voltage  
Low-Level Output Voltage  
Data to Clock Set Up Time  
Data to Clock Hold Time  
Clock Pulse Width High  
IOH = −500 µA  
VCC − 0.4  
V
IOL = 500 µA  
0.4  
V
See Data Input Timing  
See Data Input Timing  
See Data Input Timing  
See Data Input Timing  
See Data Input Timing  
See Data Input Timing  
50  
10  
50  
50  
50  
50  
ns  
ns  
ns  
ns  
ns  
ns  
tCH  
tCWH  
tCWL  
tES  
Clock Pulse Width Low  
Clock to Load Enable Set Up Time  
Load Enable Pulse Width  
tEW  
Note 3: See PROGRAMMABLE MODES for ICP description  
o
Note 4: Except f and OSC  
.
IN  
IN  
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4
Charge Pump Current Specification Definitions  
DS100127-3  
I1 = CP sink current at VCPo = VpV  
I2 = CP sink current at VCPo = Vp/2  
I3 = CP sink current at VCPo = V  
I4 = CP source current at VCPo = VpV  
I5 = CP source current at VCPo = Vp/2  
I6 = CP source current at VCPo = V  
V = Voltage offset from positive and negative rails. Dependent on VCO tuning range relative to VCC and ground. Typical values  
are between 0.5V and 1.0V  
1.  
2.  
3.  
ICPo vs VCPo = Charge Pump Output Current magnitude variation vs Voltage =  
1
1
1
[1⁄  
2
{ |I1| − |I3|}]/[ ⁄  
2
{|I1| + |I3|}] 100% and [ ⁄  
2
{|I4| − |I6|}]/[ ⁄  
2
*
*
*
*
* *  
{|I4| + |I6|}] 100%  
ICPo-sink vs ICPo–source = Charge Pump Output Current Sink vs Source Mismatch =  
[|I2| − |I5|]/[1⁄  
ICPo vs T = Charge Pump Output Current magnitude variation vs Temperature =  
2
*
*
{|I2| + |I5|}] 100%  
@
@
@
*
@
@
@
*
[|I2 temp| − |I2 25˚C|]/|I2 25˚C| 100% and [|I5 temp| − |I5 25˚C|]/|I5 25˚C| 100%  
5
www.national.com  
RF Sensitivity Test Block Diagram  
DS100127-15  
Note 5: N=10,000 R=50 P=32  
Note 6: Sensitivity limit is reached when the error of the divided RF output, FoLD, is greater than or equal to 1 Hz.  
www.national.com  
6
1.0 Functional Description  
The simplified block diagram below shows the 21-bit data register, a 14-bit R Counter, an 18-bit N Counter, and a 18-bit Function  
Latch (intermediate latches are not shown). The data stream is shifted (on the rising edge of LE) into the DATA input, MSB first.  
The last two bits are the Control Bits. The DATA is transferred into the counters as follows:  
Control  
DATA Location  
C1  
C2  
0
0
1
0
1
R Counter  
0
N Counter  
1
Function Latch  
Initialization  
1
DS100127-4  
1.1 PROGRAMMABLEREFERENCE DIVIDER  
If the Control Bits are [C1, C2] = [0,0], data is transferred from the 21-bit shift register into a latch that sets the 14-bit R Counter.  
The 4 bits R15–R18 are for test modes, and should be set to 0 for normal use. The LD precision bit, R19, is described in the  
LOCK DETECT OUTPUT CHARACTERISTICS section. Serial data format is shown below.  
DS100127-5  
Note: R15 to R18 are test modes and should be zero for normal operation.  
Data is shifted in MSB first.  
1.1.1 14-BIT PROGRAMMABLE REFERENCE DIVIDER RATIO (R COUNTER)  
Divide  
R
14  
0
R
13  
0
R
12  
0
R
11  
0
R
10  
0
R
9
0
0
R
8
0
0
R
7
0
0
R
6
0
0
R
5
0
0
R
4
0
0
R
3
0
1
R
2
1
0
R
1
1
0
Ratio  
3
4
0
0
0
0
0
16383  
1
1
1
1
1
1
1
1
1
1
1
1
1
1
Notes: Divide ratios less than 3 are prohibited.  
Divide ratio: 3 to 16383  
R1 to R14: These bits select the divide ratio of the programmable reference divider.  
7
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1.0 Functional Description (Continued)  
1.2 PROGRAMMABLE DIVIDER (N COUNTER)  
The N counter consists of the 5-bit swallow counter (A counter) and the 13-bit programmable counter (B counter). If the Control  
Bits are [C1, C2] = [1,0], data is transferred from the 21-bit shift register into a 5-bit latch (which sets the Swallow (A) Counter),  
a 13-bit latch (which sets the 13-bit programmable (B) Counter), and the GO bit (See Section 1.3.4 FastLock MODES section)  
MSB first. For the LMX2306 the maximum N value is 65535 and the minimum N value is 56. For the LMX2316/26, the maximum  
N value is 262143 and the minimum N value is 992. Serial data format is shown below.  
DS100127-6  
Note: Data is shifted in MSB first.  
1.2.1 5-BIT SWALLOW COUNTER DIVIDE RATIO (A COUNTER)  
LMX2316/26  
LMX2306  
Divide  
N
5
0
0
N
4
0
0
N
3
0
0
N
2
0
0
N
1
0
1
Divide  
N
5
X
X
N
4
X
X
N
3
0
0
N
2
0
0
N
1
0
1
Ratio  
Ratio  
0
1
0
1
31  
1
1
1
1
1
7
X
X
1
1
1
Note: Divide ratio: 0 to 31  
B A  
Note: Divide ratio: 0 to 7  
B A  
X denotes a Don’t Care condition  
1.2.2 13-BIT PROGRAMMABLE COUNTER DIVIDE RATIO (B COUNTER)  
Divide  
N
18  
0
N
17  
0
N
16  
0
N
15  
0
N
14  
0
N
13  
0
N
12  
0
N
11  
0
N
10  
0
N
9
0
0
N
N
7
1
0
N
Ratio  
8
0
1
6
1
0
3
4
0
0
0
0
0
0
0
0
0
8191  
1
1
1
1
1
1
1
1
1
1
1
1
1
Divide ratio: 3 to 8191 (Divide ratios less than 3 are prohibited) BA  
1.2.3 PULSE SWALLOW FUNCTION  
fvco = [(P x B) + A] x fosc/R  
fvco  
B:  
:
Output frequency of external voltage controlled oscillator (VCO)  
Preset divide ratio of binary 13-bit programmable counter (3 to 8191)  
A:  
Preset divide ratio of binary 5-bit swallow counter (0 A 31; A B for LMX2316/26)  
or (0 A 7, A B for LMX2306)  
fosc  
R:  
:
Output frequency of the external reference frequency oscillator  
Preset divide ratio of binary 14-bit programmable reference counter (3 to 16383)  
Preset modulus of dual modulus prescaler  
P:  
for the LMX2306; P = 8 for the LMX2316/26; P = 32  
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8
1.0 Functional Description (Continued)  
1.3 FUNCTION AND INITIALIZATION LATCHES  
Both the function and initialization latches write to the same registers. (See Section 1.7.1 DEVICE PROGRAMMING AFTER  
FIRST APPLYING VCC section for initialization latch description.)  
DS100127-7  
TABLE 1. Programmable Modes  
C1  
C2  
F1  
F2  
F3–5  
FoLD  
F6  
PD  
F7  
CP  
F8  
0
1
COUNTER  
RESET  
POWER DOWN  
FASTLOCK  
ENABLE  
CONTROL  
POLARITY  
TRI-STATE  
F9  
F10  
F11–14  
TIMEOUT  
COUNTER  
VALUE  
F15–F17  
F18  
FAST-  
LOCK  
TIMEOUT  
COUNTER  
ENABLE  
TEST  
POWER  
MODES  
DOWN  
MODE  
CONTROL  
TABLE 2. Mode Select Truth Table  
POWER  
REGISTER  
LEVEL  
COUNTER  
PHASE  
CP  
RESET  
DOWN  
TRI-STATE  
DETECTOR  
POLARITY  
NEGATIVE  
0
1
RESET  
DISABLED  
RESET  
POWERED  
UP  
NORMAL  
OPERATION  
TRI-STATE  
POWERED  
DOWN  
POSITIVE  
ENABELED  
FUNCTION DESCRIPTION  
F1. The Counter Reset enable mode bit F1, when activated, allows the reset of both N and R counters. Upon powering up, the  
F1 bit needs to be disabled, then the N counter resumes counting in “close” alignment with the R counter. (The maximum error  
is one prescalar cycle).  
F2. Refer to Section 1.3.1 POWERDOWN OPERATION section.  
F3–5. Controls output of FoLD pin. See FoLD truth table. See Table 4.  
F6. Phase Detector Polarity. Depending upon VCO characteristics, F6 bit should be set accordingly. When VCO characteristics  
are positive F6 should be set HIGH; When VCO characteristics are negative F6 should be set LOW  
F7. Charge Pump TRI-STATE is set using bit F7. For normal operation this bit is set to zero.  
F8. When the FastLock Enable bit is set the part is forced into one of the four FastLock modes. See description in Table 5, Fast-  
Lock Decoding.  
F9. The FastLock Control bit determines the mode of operation when in FastLock (F8 = 1). When not in FastLock mode, FLo  
can be used as a general purpose output controlled by this bit. For F9 = 1, FLo is HIGH and for F9 = 0, FLo is LOW. See Table  
5 for truth table.  
F10. Timeout Counter Enable bit is set to 1 to enable the timeout counter. See Table 5 for truth table.  
F11–14. FastLock Timeout Counter is set using bits F11-14. Table 6 for counter values.  
F15–17. Function bits F15–F17 are for Test Modes, and should be set to 0 for normal use.  
F18. Refer to Section 1.3.1 POWERDOWN OPERATION section.  
9
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1.0 Functional Description (Continued)  
1.3.1 POWERDOWN OPERATION  
Bits F[2] and F[18] provide programmable powerdown modes when the CE pin is HIGH. When CE is LOW, the part is always im-  
mediately disabled regardless of powerdown bit status. Refer to Table 3.  
Synchronous and asynchronous powerdown modes are both available by MICROWIRE selection. Synchronous powerdown oc-  
curs if the F[18] bit (Powerdown Mode) is HIGH when F[2] bit (Powerdown) becomes HIGH. Asynchronous powerdown occurs  
if the F[18] bit is LOW when its F[2] bit becomes HIGH.  
In the synchronous powerdown mode (F[18] = HIGH), the powerdown function is gated by the charge pump to prevent unwanted  
frequency jumps. Once the powerdown program bit F[2] is loaded, the part will go into powerdown mode after the first successive  
charge pump event.  
In the asynchronous powerdown mode (F[18] = LOW), the device powers down immediately after latching LOW data into bit F[2].  
The device returns to an actively powered up condition in either synchronous or asynchronous mode immediately upon LE latch-  
ing LOW data into bit F[2].  
Activation of a powerdown condition in either synchronous or asynchronous mode including CE pin activated powerdown has the  
following effects:  
Removes all active DC current paths.  
Debiases the fIN input to a high impedance state.  
Disables the oscillator input buffer circuitry.  
Forces the R, N, and timeout counters to their load state  
conditions.  
The MICROWIRE control register remains active and ca-  
pable of loading the data.  
Will TRI-STATE the charge pump.  
Resets the digital lock detect circuitry.  
TABLE 3. Power Down Truth Table  
CE(Pin 10)  
F[2]  
F[18]  
Mode  
Asynchronous Power Down  
Normal Operation  
LOW  
HIGH  
HIGH  
HIGH  
X
0
1
1
X
X
0
1
Asynchronous Power Down  
Synchronous Power Down  
TABLE 4. The Fo/LD (pin 14) Output Truth Table  
F[5] Fo/LD Output State  
F[3]  
F[4]  
0
0
0
0
1
1
0
0
1
1
0
0
0
1
0
1
0
1
TRI-STATE  
R Divider Output (fr)  
N Divider Output (fp)  
Serial Data Output  
Digital Lock Detect (See 1.3.2 LOCK DETECT OUTPUT Section)  
n Channel Open Drain Lock Detect (See 1.3.2 LOCK DETECT OUTPUT  
Section)  
1
1
1
1
0
1
Active HIGH  
Active LOW  
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10  
1.0 Functional Description (Continued)  
1.3.2 LOCK DETECT OUTPUT CHARACTERISTICS  
Output provided to indicate when the VCO frequency is in “lock.” When the loop is locked and the open drain lock detect mode  
is selected, the pin’s output is HIGH, with narrow pulses LOW. When digital lock detect is selected, the output will be HIGH when  
<
the absolute phase error is 15 ns for three or five consecutive phase frequency detector reference cycles, depending on the  
value of R[19]. Once lock is detected the output stays HIGH unless the absolute phase error exceeds 30 ns for a single reference  
cycle. Setting the charge pump to TRI-STATE or power down (bits F2, F18) will reset the digital lock detect to the unlocked state.  
The LD precision bit, R[19], will select five consecutive reference cycles, instead of three, for entering the locked state when R[19]  
= HIGH.  
DS100127-13  
FIGURE 1. Typical Lock Detect Circuit  
1.3.3 LOCK DETECT FILTER CALCULATION  
The component values for the open drain lock detect filter can be determined after assessing the qualifications for an in-lock con-  
dition. The in-lock condition can be specified as being a particular number (N) of consecutive reference cycles or duration (D)  
wherein the phase detector phase error is some factor less than the reference period. In an example where the phase detector  
reference period is 10 kHz, one might select the threshold for in-lock as occurring when 5 consecutive phase comparisons have  
elapsed where the phase errors are a 1000 times shorter than the reference period (100 ns). Here, N = 5 and F = 1000.  
For the lock detect filter shown in Figure 1, when used in conjunction with a open drain (active sink only) lock detect output, the  
*
resistor value for R2 would be chosen to be a factor of F R1. Thus, if resistor R1 were pulled low for only 1/1000th of the ref-  
erence cycle period, its “effective” resistance would be on par with R2. The two resistors for that duty cycle condition on average  
appear to be two 1000x R1 resistors connected across the supply voltage with their common node voltage (Vc) at VCC/2. Phase  
errors larger than 1/1000th of the reference cycle period would drag the average voltage of node Vc below VCC/2 indicating an  
*
*
out-of-lock status. If the time constant of R2 C1 is now calculated to be N the reference period (500 µs), then the voltage of  
node Vc would fall below VCC/2 only after 5 consecutive phase errors whose average pulse width was greater than 100 ns.  
1.3.4 FastLock MODES  
FastLock enables the designer to achieve both fast frequency transitions and good phase noise performance by dynamically  
changing the PLL loop bandwidth. The FastLock modes allow wide band PLL fast locking with seemless transition to a low phase  
noise narrow band PLL. Consistent gain and phase margins are maintained by simultaneously changing charge pump current  
magnitude, counter values, and loop filter damping resistor. The four FastLock modes in Table 5 are similar to the technique used  
in National Semiconductor’s LMX 233X series Dual Phase Locked Loops and are selected by F9, F10, and N19 when F8 is HIGH.  
Modes 1 and 2 change loop bandwidth by a factor of two while modes 3 and 4 change the loop bandwidth by a factor of 4. Modes  
1 and 2 increase charge pump magnitude by a factor of 4 and should use R2’=R2 for consistent gain and phase margin. Modes  
1
3 and 4 increase charge pump magnitude and decrease the counter values by a factor of 4. R2’ = ⁄  
3
R2 should be used for con-  
sistent stability margin in modes 3 and 4. When F8 is LOW, the FastLock modes are disabled, F9 controls only the FLo output  
level (FLo = F9), and N19 determines the charge pump current magnitude (N19=LOW ICPo = 250 µA, N19=HIGH ICPo  
1 mA).  
=
11  
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1.0 Functional Description (Continued)  
DS100127-8  
TABLE 5. FastLock Decoding  
FastLock Status  
F[8]  
F[9]  
F[10]  
N[19]  
(Note 7)  
1 (Note 7)  
1
FastLock State  
#
#
#
#
FastLock Mode  
FastLock Mode  
FastLock Mode  
FastLock Mode  
1
2
3
4
1
1
1
1
0
0
1
1
0
1
0
1
No Timeout Counter - 1X Divider  
Timeout Counter - 1X Divider  
No Timeout Counter - 1/4X Divider  
Timeout Counter - 1/4X Divider  
1 (Note 7)  
1
Note 7: When the GO bit N[19] is set to one, the part is forced into the high gain mode. When the timeout counter is activated, termination of the counter cycle resets  
the GO bit to 0. If the timeout counter is not activated, N[19] must be reprogrammed to zero in order to remove the high gain state. See below for descriptions of each  
individual FastLock mode.  
There are two techniques of switching in and out of FastLock. To program the device into any of the FastLock modes, the GO bit  
N[19] must be set to one to begin FastLock operation. In the first approach, the timeout counter can be used (FastLock 2 and 4)  
to stay in FastLock mode for a programmable number of phase detector reference cycles (up to 63) and then reset the GO bit  
automatically. In the second approach (FastLock 1 and 3) without the timeout counter, the PLL will remain in FastLock mode until  
the user resets the GO bit via the MICROWIRE serial bus. Once the GO bit is set to zero by the timeout counter or by MICROW-  
IRE, the PLL will then return to normal operation. This transition does not effect the charge on the loop filter capacitors and is en-  
acted synchronous with the charge pump output. This creates a nearly seamless transition between FastLock and standard  
mode.  
FastLock Mode 1 In this mode, the output level of the FLo is programmed in a low state while the ICPo is in the 4x state. The  
device remains in this state until a command is received, resetting the N[19] bit to zero. Programming N[19]  
*
to zero will return the device to normal operation ., i.e., ICPo = 1x and FLo returned to TRI-STATE.  
FastLock Mode 2 Identical to mode 1, except the switching of the device out of FastLock is controlled by the Timeout counter.  
The device will remain in FastLock until the timeout counter has counted down the appropriate number of  
*
phase detector cycles, at which time the PLL returns to normal operation .  
FastLock Mode 3 This mode is similar to mode 1 in that the output level of the FLo is low and the ICPo is switched to the 4x state.  
Additionally, the R and N divide ratios are reduced by one fourth during the transient, resulting in a 16x im-  
proved gain. As in mode 1, the device remains in this state until a MICROWIRE command is received, reset-  
*
ting the N[19] bit to zero and returning the device to normal operation .  
FastLock Mode 4 Identical to mode 3, except the switching of the device out of FastLock is controlled by the Timeout counter.  
The device will remain in FastLock until the timeout counter has counted down the appropriate number of  
*
phase detector cycles, at which time the PLL returns to normal operation .  
*
Normal Operation FastLock Normal Operation is defined as the device being in low current mode and standard divider values.  
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12  
1.0 Functional Description (Continued)  
TABLE 6. FastLock Timeout Counter Value Programming  
Timeout  
PD Cycles)  
(Note 8)  
F11  
3
7
11  
15  
19  
23  
27  
31  
35  
59  
63  
#
(
0
0
0
0
1
0
0
0
0
1
0
0
1
1
0
0
0
0
1
0
1
0
1
0
0
1
1
0
1
1
1
0
0
0
0
1
0
1
1
1
1
1
1
1
(4)  
F12  
(8)  
F13  
(16)  
F14  
(32)  
Note 8: The timeout counter decrements after each phase detector comparison cycle.  
1.4 SERIAL DATA INPUT TIMING  
DS100127-9  
Notes: Parenthesis data indicates programmable reference divider data.  
Data shifted into register on clock rising edge.  
Data is shifted in MSB first.  
TEST CONDITIONS: The Serial Data Input Timing is tested using a symmetrical waveform around V  
. The test waveform has an edge rate of 0.6V/ns with  
CC/2  
@
@
V
CC  
amplitudes of 1.84V  
V
= 2.3V and 4.4V  
= 5.5V.  
CC  
1.5 PHASE COMPARATOR AND INTERNAL CHARGE PUMP CHARACTERISTICS  
DS100127-10  
Notes: Phase difference detection range: −2π to +2π  
The Phase Detector Polarity F[6] = HIGH  
The minimum width pump up and pump down current pulses occur at the ICP pin when the loop is locked.  
o
13  
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1.0 Functional Description (Continued)  
1.6 Typical Application Example  
DS100127-11  
OPERATIONAL NOTES:  
*
VCO is assumed AC coupled.  
**  
R1 increases impedance so that VCO output power is provided to the load rather than the PLL. Typical values are 10to 200depending on the VCO  
power level. f RF impedance ranges from 40to 100.  
IN  
**  
50termination is often used on test boards to allow use of external reference oscillator. For most typical products a CMOS clock is used and no terminating  
resistor is required. OSC may be AC or DC coupled. AC coupling is recommended because the input circuit provides its own bias. (See Figure below.)  
IN  
DS100127-12  
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14  
1.7.4 COUNTER RESET METHOD  
1.7 Application Information  
This MICROWIRE programming method consists of a func-  
tion latch load, [C1, C2] = [0, 1], enabling the counter reset  
bit, F[1]. The R and N counter latches are then loaded fol-  
lowed by a final function latch load that disables the counter  
reset. This provides the same close phase alignment as the  
initialization sequence method with direct control over the in-  
ternal reset. Note that counter reset holds the counters at  
load point and will TRI-STATE the charge pump, but does  
not trigger synchronous powerdown. The counter reset  
method requires an extra function latch load compared to the  
initialization sequence method.  
1.7.1 DEVICE PROGRAMMING AFTER FIRST  
APPLYING VCC  
Three MICROWIRE programming methods can be used to  
change the function latch, R counter latch, and N counter  
latch contents with close phase alignment of R and N  
counters to minimize lock up time after the cold power up.  
1.7.2 INITIALIZATION SEQUENCE METHOD  
Loading the function latch with [C1, C2] = [1, 1] immediately  
followed by an R counter load, then an N counter load, effi-  
ciently programs the MICROWIRE. Loading the function  
latch with [C1, C2] = [1, 1] programs the same function latch  
as a load with [C1, C2] = [0, 1] and additionally provides an  
internal reset pulse described below. This program se-  
quence insures that the counters are at load point when the  
N counter data is latched in and the part will begin counting  
in close phase alignment.  
1.7.5 DEVICE PROGRAMMING  
When programming the LMX2306, LMX2316, and  
LMX2326, first determine the frequencies and mode of op-  
eration desired. Data register is programmed with a 21-bit  
data stream shifted into the R counter, N counter, or the F  
latch. The Functional Description section shows the bits for  
the R counter, and the corresponding information for the N  
counter. The FLo programming information is given in the  
FUNCTION AND INITIALIZATION LATCHES section. Typi-  
cal numbers for a GSM application example are given. In the  
example, the RF output is locking at 950 MHz (fvco) with a  
200 kHz channel spacing (fcomparison). The crystal oscillator  
reference input is 10 MHz (fosc) and the prescaler value (P)  
is 32. An example of both methods of FastLock will be  
shown.  
The following results from latching the MICROWIRE with an  
F latch word, [C1, C2] = [1, 1]:  
The function latch contents are loaded.  
An internal pulse resets the R, N, and timeout counters to  
load state conditions and will TRI-STATE the charge  
pump. If the function latch is programmed for the syn-  
chronous powerdown case; CE = HIGH, F[2] = HIGH,  
F[18] = HIGH, this internal pulse triggers powerdown.  
Refer to Section 1.3.1 POWERDOWN OPERATION sec-  
tion for a synchronous powerdown description. Note that  
the prescaler bandgap reference and the oscillator input  
buffer are unaffected by the internal reset pulse, allowing  
close phase alignment when counting resumes.  
The last two bits (control bits C1 and C2) of each bit stream  
identify which counter or FLo mode will be programmed. For  
example, to program the R counter, C1 and C2 will be 0,0.  
Immediately proceeding these two bits is the N, R, or F bits  
providing the divide ratios and FastLock mode information.  
Latching the first N counter data after the initialization  
word will activate the same internal reset pulse. Succes-  
sive N counter data loads without an initialization load will  
not trigger the internal reset pulse.  
Control Bits  
DATA Location  
C1  
C2  
0
0
1
0
1
R Counter  
0
N Counter  
1.7.3 CE METHOD  
1
Function Latch  
Initialization  
Programming the function latch, R counter latch and N  
counter latch while the part is being held in a powerdown  
state by CE allows lowest possible power dissipation. After  
the MICROWIRE contents have been programmed and the  
part is enabled, the R and N counter contents will resume  
counting in close phase alignment. Note that after CE transi-  
tions from LOW to HIGH, a duration of 1 µs may be required  
for the prescaler bandgap voltage and oscillator input buffer  
bias to reach steady state.  
1
For example, to load the N counter, the last two bits C1 and  
C2 must be 10.  
Once the control bits have been determined, the frequency  
information must be determined. To begin, determine the N  
and R counter values as follows:  
N = fvco/fcomparison  
and  
R = fosc/fcomparison  
CE can be used to power the part up and down by pin control  
in order to check for channel activity. The MICROWIRE does  
not need to be reprogrammed each time the part is enabled  
and disabled as long as it has been programmed at least  
once after VCC was applied.  
For this example R and N are determined as follows:  
R = 10 MHz/200 kHz = 50  
and  
N = 950 MHz/200 kHz = 4750  
15  
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1.7 Application Information (Continued)  
1.7.6 N COUNTER  
The calculated value of N, and the value of P are now used to determine the values of A and B where A and B are both integer  
values:  
*
N = P B + A  
where B is the divisor and A is the remainder. Therefore:  
B = div (N/P)  
and  
*
A = N − (B P)  
For this example, B and A are calculated as follows:  
B = div (4750/32) = 148 = 0000010010100  
and  
*
A = 4750 − (148 32) = 14 = 01110  
To load the N counter with these values, the programming bit stream would be as follows. The first bit, the GO bit, (MSB) N[19]  
is used for FastLock operation and will be discussed in the F Latch section. The next 13 bits, (N[18]–N[6]) shifted in, are the B  
*
counter value, 0000010010100b . Bits N[5]–N[1] are the A counter and are 01110b in this example. The final two bits (the control  
bits) are 1,0 identifying the N counter. In programming the N counter, the value of B must be greater than or equal to A, and the  
value of B must be greater than or equal to 3.  
*
Note: In programming the counter, data is shifted in MSB first.  
DS100127-14  
1.7.7 R COUNTER  
Programming the R counter is done by shifting in the binary value of R calculated previously (50d = 110010b). The first bit shifted  
in is R[19] the LD precision bit. The next 4 bits (R[18]–R[15]) shifted in, are used for testing and should always be loaded with  
zeros. The R[14]–R[1] bits are used to program the reference divider ratio and should be 00000000110010b for this example. The  
final two bits, C[1] and C[2] denote the R counter and should be 0, 0. The resulting bit stream looks as follows:  
DS100127-16  
1.7.8 F LATCH  
To program the device for any of the FastLock modes, C[1] = 0 and C[2] = 1 which direct data to the F latch. The Section 1.3  
FUNCTION AND INITIALIZATION LATCH section discusses the 4 modes of FastLock operation. The user must first determine  
which FastLock mode will be used. When using any of the FastLock modes, the programmer needs to experimentally determine  
the length of time to stay in high gain mode. This is done by looking at the transient response and determining the time at which  
the device has settled to within the appropriate frequency tolerance. FastLock mode should be terminated just prior to “lock” to  
place the switching phase glitch within the transient settling time. The counter reset mode (F[1] bit) holds both the N and R  
counters at load point when F[1] = HIGH. Upon setting F[1] = LOW, the N and R counters will resume counting in close phase  
alignment. Other functions of the F latch such as FoLD output control, Phase detector polarity, and charge pump TRI-STATE are  
defined in the 1.3 FUNCTION AND INITIALIZATION LATCH section also.  
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16  
1.7 Application Information (Continued)  
1.7.9 FastLock MODE 1 PROGRAMMING  
*
The F[1]–F[7] bits will be denoted as ( ) and are dependent on the desired modes of the applicable functions. To program the de-  
vice for mode 1 FastLock, the F[8]–F[10] bits are programmed 100, while the N[19] bit is set to 1. The device will stay in the 4X  
current mode until another N bit stream is sent with the N[19] bit reset to 0. This gives a bit stream as follows:  
DS100127-17  
1.7.10 FastLock MODE 2 PROGRAMMING  
*
Again, the F[1]–F[7] bits will be denoted as don’t care ( ) but are dependent on the desired modes of the applicable functions.  
To program the device for mode 2 FastLock, the F[8]–F[10] bits are programmed 101, while the N[19] bit is set to 1. The device  
will stay in the 4X current mode for the programmed number of phase detector cycles. Bits F[11]–F[14] program this number of  
cycles and are shown in Table 6. For our example, we will use 27 phase detector cycles, i.e. bits F[11]–F[14] will be 0110b. After  
27 phase detector cycles, the N[19] bit returns to zero, bringing the device back to low current mode. The resulting bit stream is  
as follows:  
DS100127-18  
FastLock modes 3 and 4 are programmed in the same manner and give the added 4X gain increase as discussed in Section 1.3.4  
FastLock modes.  
17  
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Physical Dimensions inches (millimeters) unless otherwise noted  
16-Lead (0.173" Wide) Thin Shrink Small Outline Package (TM)  
Order Number LMX2306TM, LMX2316TM or LMX2326TM  
For Tape and Reel (2500 Units Per Reel)  
Order Number LMX2306TMX, LMX2316TMXor LMX2326TMX  
NS Package Number MTC16  
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18  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
Order Number LMX2306SLBX, LM2316SLBX or LM2326SLBX  
NS Package Number SLB16A  
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL  
COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant  
into the body, or (b) support or sustain life, and  
whose failure to perform when properly used in  
accordance with instructions for use provided in the  
labeling, can be reasonably expected to result in a  
significant injury to the user.  
2. A critical component is any component of a life  
support device or system whose failure to perform  
can be reasonably expected to cause the failure of  
the life support device or system, or to affect its  
safety or effectiveness.  
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Corporation  
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Tel: 1-800-272-9959  
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