M25P05-VMN6 [NUMONYX]

Flash, 64KX8, PDSO8, 0.150 INCH, PLASTIC, SO-8;
M25P05-VMN6
型号: M25P05-VMN6
厂家: NUMONYX B.V    NUMONYX B.V
描述:

Flash, 64KX8, PDSO8, 0.150 INCH, PLASTIC, SO-8

光电二极管
文件: 总32页 (文件大小:194K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
M25P05  
512 Kbit, Low Voltage, Serial Flash Memory  
With 20 MHz SPI Bus Interface  
NOT FOR NEW DESIGN  
FEATURES SUMMARY  
This device is now designated as “Not for New De-  
sign”. Please use the M25P05-A in all future de-  
signs (as described in application note AN1511).  
Figure 1. Packages  
512 Kbit of Flash Memory  
Page Program (up to 128 Bytes) in 3 ms  
(typical)  
Sector Erase (256 Kbit) in 1 s (typical)  
Bulk Erase (512 Kbit) in 2 s (typical)  
2.7 V to 3.6 V Single Supply Voltage  
SPI Bus Compatible Serial Interface  
20 MHz Clock Rate (maximum)  
Deep Power-down Mode 1 µA (typical)  
Electronic Signature  
8
1
SO8 (MN)  
150 mil width  
More than 100,000 Erase/Program Cycles per  
Sector  
More than 20 Year Data Retention  
February 2002  
1/32  
This is information on a product still in production but not recommended for new designs.  
M25P05  
SUMMARY DESCRIPTION  
The M25P05 is a 512 Kbit (64K x 8) Serial Flash  
Memory, with advanced write protection mecha-  
nisms, accessed by a high speed SPI-compatible  
bus.  
Figure 3. SO Connections  
The memory can be programmed 1 to 128 bytes at  
a time, using the Page Program instruction.  
The memory is organized as 2 sectors, each con-  
taining 256 pages. Each page is 128 bytes wide.  
Thus, the whole memory can be viewed as con-  
sisting of 512 pages, or 65536 bytes.  
The whole memory can be erased using the Bulk  
Erase instruction, or a sector at a time, using the  
Sector Erase instruction.  
M25P05  
S
Q
1
2
3
4
8
V
CC  
HOLD  
7
6
W
C
D
V
5
SS  
AI04038  
Figure 2. Logic Diagram  
V
CC  
D
C
S
Q
M25P05  
W
HOLD  
V
SS  
AI04037  
Table 1. Signal Names  
C
Serial Clock  
Serial Data Input  
Serial Data Output  
Chip Select  
Write Protect  
Hold  
D
Q
S
W
HOLD  
V
Supply Voltage  
Ground  
CC  
V
SS  
2/32  
M25P05  
SIGNAL DESCRIPTION  
Serial Data Output (Q). This output signal is  
used to transfer data serially out of the device.  
Data is shifted out on the falling edge of Serial  
Clock (C).  
Serial Data Input (D). This input signal is used to  
transfer data serially into the device. It receives in-  
structions, addresses, and the data to be pro-  
grammed. Values are latched on the rising edge of  
Serial Clock (C).  
Serial Clock (C). This input signal provides the  
timing of the serial interface. Instructions, address-  
es, or data present at Serial Data Input (D) are  
latched on the rising edge of Serial Clock (C). Data  
on Serial Data Output (Q) changes after the falling  
edge of Serial Clock (C).  
Chip Select (S). When this input signal is High,  
the device is deselected and Serial Data Output  
(Q) is at high impedance. Unless an internal Pro-  
gram, Erase or Write Status Register cycle is in  
progress, the device will be in the Standby mode  
(this is not the Deep Power-down mode). Driving  
Chip Select (S) Low enables the device, placing it  
in the active power mode.  
After Power-up, a falling edge on Chip Select (S)  
is required prior to the start of any instruction.  
Hold (HOLD). The Hold (HOLD) signal is used to  
pause any serial communications with the device  
without deselecting the device.  
During the Hold condition, the Serial Data Output  
(Q) is high impedance, and Serial Data Input (D)  
and Serial Clock (C) are Don’t Care.  
To start the Hold condition, the device must be se-  
lected, with Chip Select (S) driven Low.  
Write Protect (W). The main purpose of this in-  
put signal is to freeze the size of the area of mem-  
ory that is protected against program or erase  
instructions (as specified by the values in the BP1  
and BP0 bits of the Status Register).  
3/32  
M25P05  
SPI MODES  
These devices can be driven by a microcontroller  
with its SPI peripheral running in either of the two  
following modes:  
– CPOL=0, CPHA=0  
– CPOL=1, CPHA=1  
is available from the falling edge of Serial Clock  
(C).  
The difference between the two modes, as shown  
in Figure 5, is the clock polarity when the bus mas-  
ter is in Stand-by mode and not transferring data:  
– C remains at 0 for (CPOL=0, CPHA=0)  
– C remains at 1 for (CPOL=1, CPHA=1)  
For these two modes, input data is latched in on  
the rising edge of Serial Clock (C), and output data  
Figure 4. Bus Master and Memory Devices on the SPI Bus  
SDO  
SPI Interface with  
(CPOL, CPHA) =  
(0, 0) or (1, 1)  
SDI  
SCK  
C
Q
D
C
Q
D
C Q D  
Bus Master  
(ST6, ST7, ST9,  
ST10, Others)  
SPI Memory  
Device  
SPI Memory  
Device  
SPI Memory  
Device  
CS3 CS2 CS1  
S
S
S
W
HOLD  
W
HOLD  
HOLD  
W
AI03746C  
Note: 1. The Write Protect (W) and Hold (HOLD) signals should be driven, High or Low as appropriate.  
Figure 5. SPI Modes Supported  
CPOL  
0
CPHA  
0
C
1
1
C
D or Q  
MSB  
LSB  
AI01438  
4/32  
M25P05  
OPERATING FEATURES  
Page Programming  
Erase, Write Status Register). The device then  
goes in to the Stand-by Power mode. The device  
consumption drops to I  
.
CC1  
To program one data byte, two instructions are re-  
quired: Write Enable (WREN), which is one byte,  
and a Page Program (PP) sequence, which con-  
sists of four bytes plus data. This is followed by the  
The Deep Power-down mode is entered when the  
specific instruction (the Enter Deep Power-down  
Mode (DP) instruction) is executed. The device  
internal Program cycle (of duration t ).  
consumption drops further to I  
. The device re-  
PP  
CC2  
mains in this mode until another specific instruc-  
tion (the Release from Deep Power-down Mode  
and Read Electronic Signature (RES) instruction)  
is executed.  
All other instructions are ignored while the device  
is in the Deep Power-down mode. This can be  
used as an extra software protection mechanism,  
when the device is not in active use, to protect the  
device from inadvertant Write, Program or Erase  
instructions.  
To spread this overhead, the Page Program (PP)  
instruction allows up to 128 bytes to be pro-  
grammed at a time (changing bits from 1 to 0), pro-  
vided that they lie in consecutive addresses on the  
same page of memory.  
Sector Erase and Bulk Erase  
The Page Program (PP) instruction allows bits to  
be reset from 1 to 0. Before this can be applied, the  
bytes of memory need to have been erased to all  
1s (FFh). This can be achieved either a sector at a  
time, using the Sector Erase (SE) instruction, or  
throughout the entire memory, using the Bulk  
Erase (BE) instruction.  
Status Register  
The Status Register contains a number of status  
and control bits, as shown in Table 5, that can be  
read or set (as appropriate) by specific instruc-  
tions.  
Polling During a Write, Program or Erase Cycle  
WIP bit. The Write In Progress (WIP) bit indicates  
whether the memory is busy with a Write Status  
Register, Program or Erase cycle.  
A further improvement in the time to Write Status  
Register (WRSR), Program (PP) or Erase (SE or  
BE) can be achieved by not waiting for the worst  
case delay (t , t , t , or t ). The Write In  
W
PP SE  
BE  
WEL bit. The Write Enable Latch (WEL) bit indi-  
Progress (WIP) bit is provided in the Status Regis-  
ter so that the application program can monitor its  
value, polling it to establish when the previous  
Write cycle, Program cycle or Erase cycle is com-  
plete.  
cates the status of the internal Write Enable Latch.  
BP1, BP0 bits. The Block Protect (BP1, BP0) bits  
are non-volatile. They define the size of the area to  
be software protected against Program and Erase  
instructions.  
SRWD bit. The Status Register Write Disable  
(SRWD) bit is operated in conjunction with the  
Write Protect (W) signal. The Status Register  
Write Disable (SRWD) bit and Write Protect (W)  
signal allow the device to be put in the Hardware  
Protected mode. In this mode, the non-volatile bits  
of the Status Register (SRWD, BP1, BP0) become  
read-only bits.  
Active Power, Stand-by Power and Deep  
Power-Down Modes  
When Chip Select (S) is Low, the device is en-  
abled, and in the Active Power mode.  
When Chip Select (S) is High, the device is dis-  
abled, but could remain in the Active Power mode  
until all internal cycles have completed (Program,  
5/32  
M25P05  
Table 2. Protected Area Sizes  
Status Register  
Content  
Memory Content  
BP1 Bit  
BP0 Bit  
Protected Area  
Unprotected Area  
0
0
1
1
0
1
0
1
none  
All sectors (Sectors 0 and 1)  
No protection against Page Program (PP) and Sector Erase (SE)  
All sectors (Sectors 0 and 1) protected against Bulk Erase (BE)  
All sectors (Sectors 0 and 1)  
none  
– Write Status Register (WRSR) instruction  
completion  
Protection Modes  
The environments where non-volatile memory de-  
vices are used can be very noisy. No SPI device  
can operate correctly in the presence of excessive  
noise. To help combat this, the M25P05 boasts the  
following data protection mechanisms:  
– Page Program (PP) instruction completion  
– Sector Erase (SE) instruction completion  
– Bulk Erase (BE) instruction completion  
The Block Protect (BP1, BP0) bits allow part of  
the memory to be configured as read-only. This  
is the Software Protected Mode (SPM).  
Power-On Reset and an internal timer (t  
)
PUW  
can provide protection against inadvertant  
changes while the power supply is outside the  
operating specification.  
The Write Protect (W) signal, in co-operation  
with the Status Register Write Disable (SRWD)  
bit, allows the Block Protect (BP1, BP0) bits and  
Status Register Write Disable (SRWD) bit to be  
write-protected. This is the Hardware Protected  
Mode (HPM).  
Program, Erase and Write Status Register  
instructions are checked that they consist of a  
number of clock pulses that is a multiple of  
eight, before they are accepted for execution.  
All instructions that modify data must be  
preceded by a Write Enable (WREN) instruction  
to set the Write Enable Latch (WEL) bit . This bit  
is returned to its reset state by the following  
events:  
In addition to the low power consumption  
feature, the Deep Power-down mode offers  
extra software protection from inadvertant  
Write, Program and Erase instructions, as all  
instructions are ignored except one particular  
instruction (the Release from Deep Power-  
down instruction).  
– Power-up  
– Write Disable (WRDI) instruction completion  
Figure 6. Hold Condition Activation  
C
HOLD  
Active  
Hold  
Active  
Hold  
Active  
AI02029C  
6/32  
M25P05  
the rising edge does not coincide with Serial Clock  
(C) being Low, the Hold condition ends when Se-  
rial Clock (C) next goes Low. (This is shown in Fig-  
ure 6).  
During the Hold condition, the Serial Data Output  
(Q) is high impedance, and Serial Data Input (D)  
and Serial Clock (C) are Don’t Care.  
Normally, the device is kept selected, with Chip  
Select (S) driven Low, for the whole duration of the  
Hold condition. This is to ensure that the state of  
the internal logic remains unchanged from the mo-  
ment of entering the Hold condition.  
If Chip Select (S) goes High while the device is in  
the Hold condition, this has the effect of resetting  
the internal logic of the device. To restart commu-  
nication with the device, it is necessary to drive  
Hold (HOLD) High, and then to drive Chip Select  
(S) Low. This prevents the device from going back  
to the Hold condition.  
Hold Condition  
The Hold (HOLD) signal is used to pause any se-  
rial communications with the device without reset-  
ting the clocking sequence. However, taking this  
signal Low does not terminate any Write Status  
Register, Program or Erase cycle that is currently  
in progress.  
To enter the Hold condition, the device must be  
selected, with Chip Select (S) Low.  
The Hold condition starts on the falling edge of the  
Hold (HOLD) signal, provided that this coincides  
with Serial Clock (C) being Low (as shown in Fig-  
ure 6).  
The Hold condition ends on the rising edge of the  
Hold (HOLD) signal, provided that this coincides  
with Serial Clock (C) being Low.  
If the falling edge does not coincide with Serial  
Clock (C) being Low, the Hold condition starts  
when Serial Clock (C) next goes Low. Similarly, if  
7/32  
M25P05  
MEMORY ORGANIZATION  
The memory is organized as:  
65536 bytes (8 bits each)  
or Bulk Erasable (bits are erased from 0 to 1) but  
not Page Erasable.  
2 sectors (256 Kbits, 32768 bytes each)  
512 pages (128 bytes each).  
Table 3. Memory Organization  
Sector  
Address Range  
Each page can be individually programmed (bits  
are programmed from 1 to 0). The device is Sector  
1
0
08000h  
0FFFFh  
07FFFh  
00000h  
Figure 7. Block Diagram  
HOLD  
High Voltage  
Generator  
W
S
Control Logic  
C
D
Q
I/O Shift Register  
Status  
Register  
Address Register  
and Counter  
128 Byte  
Data Buffer  
0FFFFh  
08000h  
00000h  
0007Fh  
128 Bytes (Page Size)  
X Decoder  
AI04039  
8/32  
M25P05  
INSTRUCTIONS  
All instructions, addresses and data are shifted in  
and out of the device, most significant bit first.  
At the end of a Page Program (PP), Sector Erase  
(SE), Bulk Erase (BE) or Write Status Register  
(WRSR) instruction, Chip Select (S) must be driv-  
en High exactly at a byte boundary, otherwise the  
instruction is rejected, and is not executed. That is,  
Chip Select (S) must driven High when the number  
of clock pulses after Chip Select (S) being driven  
Low is an exact multiple of eight.  
Serial Data Input (D) is sampled on the first rising  
edge of Serial Clock (C) after Chip Select (S) is  
driven Low. Then, the one-byte instruction code  
must be shifted in to the device, most significant bit  
first, on Serial Data Input (D), each bit being  
latched on the rising edges of Serial Clock (C).  
All attempts to access the memory array during a  
Write Status Register cycle, Program cycle or  
Erase cycle are ignored, and the internal Write  
Status Register cycle, Program cycle or Erase cy-  
cle continues unaffected.  
The instruction set is listed in Table 4.  
Depending on the instruction, the one-byte in-  
struction code is followed by address bytes, or by  
data bytes, or by both or none. Chip Select (S)  
must be driven High after the last bit of the instruc-  
tion sequence has been shifted in.  
Table 4. Instruction Set  
Instruction  
WREN  
WRDI  
RDSR  
WRSR  
READ  
PP  
Description  
One-byte Instruction Code  
0000 0110  
Write Enable  
Write Disable  
0000 0100  
Read Status Register  
Write Status Register  
Read Data Bytes  
Page Program  
0000 0101  
0000 0001  
0000 0011  
0000 0010  
SE  
Sector Erase  
1101 1000  
BE  
Bulk Erase  
1100 0111  
DP  
Deep Power-down  
1011 1001  
RES  
Release from Deep Power-down, and Read Electronic Signature  
1010 1011  
9/32  
M25P05  
Figure 8. Write Enable (WREN) Sequence  
S
0
1
2
3
4
5
6
7
C
Instruction  
D
High Impedance  
Q
AI02281D  
(SE), Bulk Erase (BE) and Write Status Register  
(WRSR) instruction.  
Write Enable (WREN)  
The Write Enable (WREN) instruction (Figure 8)  
sets the Write Enable Latch (WEL) bit.  
The Write Enable Latch (WEL) bit must be set pri-  
or to every Page Program (PP), Sector Erase  
The Write Enable (WREN) instruction is entered  
by driving Chip Select (S) Low, sending the in-  
struction code, and then driving Chip Select (S)  
High.  
Figure 9. Write Disable (WRDI) Sequence  
S
0
1
2
3
4
5
6
7
C
D
Q
Instruction  
High Impedance  
AI03750C  
– Power-up  
– Write Disable (WRDI) instruction completion  
Write Disable (WRDI)  
The Write Disable (WRDI) instruction (Figure 9)  
resets the Write Enable Latch (WEL) bit.  
– Write Status Register (WRSR) instruction com-  
pletion  
The Write Disable (WRDI) instruction is entered by  
driving Chip Select (S) Low, sending the instruc-  
tion code, and then driving Chip Select (S) High.  
The Write Enable Latch (WEL) bit is reset under  
the following conditions:  
– Page Program (PP) instruction completion  
– Sector Erase (SE) instruction completion  
– Bulk Erase (BE) instruction completion  
10/32  
M25P05  
Figure 10. Read Status Register (RDSR) Sequence  
S
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15  
C
D
Instruction  
Status Register Out  
Status Register Out  
High Impedance  
Q
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
7
MSB  
MSB  
AI02031C  
When set to 1 the internal Write Enable Latch is  
set, when set to 0 the internal Write Enable Latch  
is reset and no Write Status Register, Program or  
Erase instruction is accepted.  
Read Status Register (RDSR)  
The Read Status Register (RDSR) instruction al-  
lows the Status Register to be read. The Status  
Register may be read at any time, even while a  
Program, Erase or Write Status Register cycle is in  
progress. When one of these cycles is in progress,  
it is recommended to check the Write In Progress  
(WIP) bit before sending a new instruction to the  
device. It is also possible to read the Status Reg-  
ister continuously, as shown in Figure 10.  
BP1, BP0 bits. The Block Protect (BP1, BP0) bits  
are non-volatile. They define the size of the area to  
be software protected against Program and Erase  
instructions. These bits are written with the Write  
Status Register (WRSR) instruction. When both of  
the Block Protect (BP1, BP0) bits are set to 1, the  
whole memory is protected against Page Program  
(PP) and Sector Erase (SE) instructions. The Bulk  
Erase (BE) instruction is executed if, and only if,  
both Block Protect (BP1, BP0) bits are 0. This is  
summarized in Table 2. The Block Protect (BP1,  
BP0) bits can be written provided that the Hard-  
ware Protected mode has not been set.  
Table 5. Status Register Format  
b7  
b0  
SRWD  
0
0
0
BP1 BP0 WEL WIP  
SRWD bit. The Status Register Write Disable  
(SRWD) bit is operated in conjunction with the  
Write Protect (W) signal. The Status Register  
Write Disable (SRWD) bit and Write Protect (W)  
signal allow the device to be put in the Hardware  
Protected mode (when the Status Register Write  
Disable (SRWD) bit is set to 1, and Write Protect  
(W) is driven Low). In this mode, the non-volatile  
bits of the Status Register (SRWD, BP1, BP0) be-  
come read-only bits and the Write Status Register  
(WRSR) instruction is no longer accepted for exe-  
cution.  
Note: 1. SRWD, BP1 and BP0 are non-volatile read and write bits.  
2. WEL and WIP are volatile read-only bits (WEL is set and  
reset by specific instructions; WIP is automatically set  
and reset by the internal logic of the device).  
The status and control bits of the Status Register  
are as follows:  
WIP bit. The Write In Process (WIP) bit indicates  
whether the memory is busy with a Write Status  
Register, Program or Erase cycle. When set to 1,  
such a cycle is in progress, when reset to 0 no  
such cycle is in progress.  
WEL bit. The Write Enable Latch (WEL) bit indi-  
cates the status of the internal Write Enable Latch.  
11/32  
M25P05  
Figure 11. Write Status Register (WRSR) Sequence  
S
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15  
C
Instruction  
Status  
Register In  
7
6
5
4
3
2
0
1
D
Q
High Impedance  
MSB  
AI02282C  
(whose duration is t ) is initiated. While the Write  
W
Write Status Register (WRSR)  
Status Register cycle is in progress, the Status  
Register may still be read to check the value of the  
Write In Progress (WIP) bit. The Write In Progress  
(WIP) bit is 1 during the self-timed Write Status  
Register cycle, and is 0 when it is completed. At  
some unspecified time before the cycle is complet-  
ed, the Write Enable Latch (WEL) is reset.  
The Write Status Register (WRSR) instruction al-  
lows the user to change the values of the Block  
Protect (BP1, BP0) bits, to define the size of the  
area that is to be treated as read-only, as defined  
in Table 2. The Write Status Register (WRSR) in-  
struction also allows the user to set or reset the  
Status Register Write Disable (SRWD) bit in ac-  
cordance with the Write Protect (W) signal. The  
Status Register Write Disable (SRWD) bit and  
Write Protect (W) signal allow the device to be put  
in the Hardware Protected Mode (HPM). The Write  
Status Register (WRSR) instruction is not execut-  
ed once the Hardware Protected Mode (HPM) is  
entered.  
The Write Status Register (WRSR) instruction al-  
lows new values to be written to the Status Regis-  
ter. Before it can be accepted, a Write Enable  
(WREN) instruction must previously have been ex-  
ecuted. After the Write Enable (WREN) instruction  
has been decoded and executed, the device sets  
the Write Enable Latch (WEL).  
The Write Status Register (WRSR) instruction is  
entered by driving Chip Select (S) Low, followed  
by the instruction code and the data byte on Serial  
Data Input (D).  
The instruction sequence is shown in Figure 11.  
The Write Status Register (WRSR) instruction has  
no effect on b6, b5, b4, b1 and b0 of the Status  
Register. b6, b5 and b4 are always read as 0.  
Chip Select (S) must be driven High after the  
eighth bit of the data byte has been latched in. If  
not, the Write Status Register (WRSR) instruction  
is not executed. As soon as Chip Select (S) is driv-  
en High, the self-timed Write Status Register cycle  
12/32  
M25P05  
Table 6. Protection Modes  
Memory Content  
W
Signal  
SRWD  
Bit  
Write Protection of the  
Status Register  
Mode  
1
1
Protected Area  
Unprotected Area  
1
0
0
0
Status Register is  
Writable (if the WREN  
Software instruction has set the  
Protected WEL bit)  
Protected against Page  
Program and Sector  
Erase  
Ready to accept Page  
Program and Sector  
Erase instructions  
(SPM)  
The values in the BP1  
and BP0 bits can be  
changed  
1
0
1
1
Status Register is  
Hardware Hardware write protected  
Protected The values in the BP1  
Protected against Page  
Program and Sector  
Erase  
Ready to accept Page  
Program and Sector  
Erase instructions  
(HPM)  
and BP0 bits cannot be  
changed  
Note: 1. As defined by the values in the Block Protect (BP1, BP0) bits of the Status Register, as shown in Table 2.  
(Attempts to write to the Status Register are re-  
The protection features of the device are summa-  
rized in Table 6.  
jected, and are not accepted for execution). As  
a consequence, all the data bytes in the memo-  
ry area that are software protected (SPM) by the  
Block Protect (BP1, BP0) bits of the Status Reg-  
ister, are also hardware protected against data  
modification.  
When the Status Register Write Disable (SRWD)  
bit of the Status Register is 0 (its initial delivery  
state), it is possible to write to the Status Register  
provided that the Write Enable Latch (WEL) bit has  
previously been set by a Write Enable (WREN) in-  
struction, regardless of the whether Write Protect  
(W) is driven High or Low.  
When the Status Register Write Disable (SRWD)  
bit of the Status Register is set to 1, two cases  
need to be considered, depending on the state of  
Write Protect (W):  
– If Write Protect (W) is driven High, it is possible  
to write to the Status Register provided that the  
Write Enable Latch (WEL) bit has previously  
been set by a Write Enable (WREN) instruction.  
– If Write Protect (W) is driven Low, it is not pos-  
sible to write to the Status Register even if the  
Write Enable Latch (WEL) bit has previously  
been set by a Write Enable (WREN) instruction.  
Regardless of the order of the two events, the  
Hardware Protected Mode (HPM) can be entered:  
– by setting the Status Register Write Disable  
(SRWD) bit after driving Write Protect (W) Low  
– or by driving Write Protect (W) Low after setting  
the Status Register Write Disable (SRWD) bit.  
The only way to exit the Hardware Protected Mode  
(HPM) once entered is to pull Write Protect (W)  
High.  
If Write Protect (W) is permanently tied High, the  
Hardware Protected Mode (HPM) can never be  
activated, and only the Software Protected Mode  
(SPM), using the Block Protect (BP1, BP0) bits of  
the Status Register, can be used.  
13/32  
M25P05  
Figure 12. Read Data Bytes (READ) Sequence  
S
0
1
2
3
4
5
6
7
8
9
10  
28 29 30 31 32 33 34 35 36 37 38 39  
C
Instruction  
24-Bit Address  
23 22 21  
MSB  
3
2
1
0
D
Q
Data Out 1  
Data Out 2  
High Impedance  
2
7
6
5
4
3
1
7
0
MSB  
AI03748C  
Note: 1. Address bits A23 to A16 must be set to 00h.  
next higher address after each byte of data is shift-  
ed out. The whole memory can, therefore, be read  
with a single Read Data Bytes (READ) instruction.  
There is no address roll-over; when the highest  
address (0FFFFh) is reached, the instruction  
should be terminated.  
Read Data Bytes (READ)  
The device is first selected by driving Chip Select  
(S) Low. The instruction code for the Read Data  
Bytes (READ) instruction is followed by a 3-byte  
address (A23-A0), each bit being latched-in during  
the rising edge of Serial Clock (C). Then the mem-  
ory contents, at that address, is shifted out on Se-  
rial Data Output (Q), each bit being shifted out, at  
The Read Data Bytes (READ) instruction is termi-  
nated by driving Chip Select (S) High. Chip Select  
(S) can be driven High at any time during data out-  
put. Any Read Data Bytes (READ) instruction,  
while an Erase, Program or Write cycle is in  
progress, is rejected without having any effects on  
the cycle that is in progress.  
a maximum frequency f , during the falling edge of  
R
Serial Clock (C).  
The instruction sequence is shown in Figure 12.  
The first byte addressed can be at any location.  
The address is automatically incremented to the  
14/32  
M25P05  
Figure 13. Page Program (PP) Sequence  
S
0
1
2
3
4
5
6
7
8
9
10  
28 29 30 31 32 33 34 35 36 37 38 39  
C
D
Instruction  
24-Bit Address  
Data Byte 1  
23 22 21  
MSB  
3
2
1
0
7
6
5
4
3
2
0
1
MSB  
S
C
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55  
Data Byte 2  
Data Byte 3  
Data Byte 128  
7
6
5
4
3
2
0
7
6
5
4
3
2
0
7
6
5
4
3
2
0
1
1
1
D
MSB  
MSB  
MSB  
AI03749C  
Note: 1. Address bits A23 to A16 must be set to 00h.  
data bytes are guaranteed to be programmed cor-  
rectly within the same page. If less than 128 Data  
bytes are sent to device, they are correctly pro-  
grammed at the requested addresses without hav-  
ing any effects on the other bytes of the same  
page.  
Chip Select (S) must be driven High after the  
eighth bit of the last data byte has been latched in,  
otherwise the Page Program (PP) instruction is not  
executed.  
Page Program (PP)  
The Page Program (PP) instruction allows bytes to  
be programmed in the memory (changing bits from  
1 to 0). Before it can be accepted, a Write Enable  
(WREN) instruction must previously have been ex-  
ecuted. After the Write Enable (WREN) instruction  
has been decoded, the device sets the Write En-  
able Latch (WEL).  
The Page Program (PP) instruction is entered by  
driving Chip Select (S) Low, followed by the in-  
struction code, three address bytes (of which the  
most significant byte, A23-A16, must be 00h) and  
at least one data byte on Serial Data Input (D). If  
the 7 least significant address bits (A6-A0) are not  
all zero, all transmitted data exceeding the ad-  
dressed page boundary roll over, and are pro-  
grammed from the start address of the same page  
(the one whose 7 least significant address bits  
(A6-A0) are all zero). Chip Select (S) must be driv-  
en Low for the entire duration of the sequence.  
As soon as Chip Select (S) is driven High, the self-  
timed Page Program cycle (whose duration is t  
)
PP  
is initiated. While the Page Program cycle is in  
progress, the Status Register may be read to  
check the value of the Write In Progress (WIP) bit.  
The Write In Progress (WIP) bit is 1 during the self-  
timed Page Program cycle, and is 0 when it is  
completed. When the cycle is completed, the Write  
Enable Latch (WEL) bit is reset.  
A Page Program (PP) instruction applied to a page  
which is protected by the Block Protect (BP0, BP1)  
bits (see Table 2) is not executed.  
The instruction sequence is shown in Figure 13.  
If more than 128 bytes are sent to the device, pre-  
viously latched data are discarded and the last 128  
15/32  
M25P05  
Figure 14. Sector Erase (SE) Sequence  
S
0
1
2
3
4
5
6
7
8
9
29 30 31  
C
D
Instruction  
24 Bit Address  
23 22  
MSB  
2
0
1
AI03751C  
Note: 1. Address bits A23 to A16 must be set to 00h.  
Chip Select (S) must be driven High after the  
eighth bit of the last address byte has been latched  
in, otherwise the Sector Erase (SE) instruction is  
not executed. As soon as Chip Select (S) is driven  
High, the self-timed Sector Erase cycle (whose du-  
Sector Erase (SE)  
The Sector Erase (SE) instruction sets to 1 (FFh)  
all bits inside the chosen sector. Before it can be  
accepted, a Write Enable (WREN) instruction  
must previously have been executed. After the  
Write Enable (WREN) instruction has been decod-  
ed, the device sets the Write Enable Latch (WEL).  
The Sector Erase (SE) instruction is entered by  
driving Chip Select (S) Low, followed by the in-  
struction code, and three address bytes on Serial  
Data Input (D). Any address inside the Sector (see  
Table 3) is a valid address for the Sector Erase  
(SE) instruction. Chip Select (S) must be driven  
Low for the entire duration of the sequence.  
ration is t ) is initiated. While the Sector Erase cy-  
SE  
cle is in progress, the Status Register may be read  
to check the value of the Write In Progress (WIP)  
bit. The Write In Progress (WIP) bit is 1 during the  
self-timed Sector Erase cycle, and is 0 when it is  
completed. At some unspecified time before the  
cycle is completed, the Write Enable Latch (WEL)  
bit is reset.  
A Sector Erase (SE) instruction applied to a page  
which is protected by the Block Protect (BP1, BP0)  
bits (see Table 2) is not executed.  
The instruction sequence is shown in Figure 14.  
16/32  
M25P05  
Figure 15. Bulk Erase (BE) Sequence  
S
C
D
0
1
2
3
4
5
6
7
Instruction  
AI03752C  
in, otherwise the Bulk Erase instruction is not exe-  
cuted. As soon as Chip Select (S) is driven High,  
the self-timed Bulk Erase cycle (whose duration is  
Bulk Erase (BE)  
The Bulk Erase (BE) instruction sets all bits to 1  
(FFh). Before it can be accepted, a Write Enable  
(WREN) instruction must previously have been ex-  
ecuted. After the Write Enable (WREN) instruction  
has been decoded, the device sets the Write En-  
able Latch (WEL).  
The Bulk Erase (BE) instruction is entered by driv-  
ing Chip Select (S) Low, followed by the instruction  
code on Serial Data Input (D). Chip Select (S)  
must be driven Low for the entire duration of the  
sequence.  
t
) is initiated. While the Bulk Erase cycle is in  
BE  
progress, the Status Register may be read to  
check the value of the Write In Progress (WIP) bit.  
The Write In Progress (WIP) bit is 1 during the self-  
timed Bulk Erase cycle, and is 0 when it is com-  
pleted. At some unspecified time before the cycle  
is completed, the Write Enable Latch (WEL) bit is  
reset.  
The Bulk Erase (BE) instruction is executed only if  
both Block Protect (BP1, BP0) bits are 0. The Bulk  
Erase (BE) instruction is ignored if one, or more,  
sectors are protected.  
The instruction sequence is shown in Figure 15.  
Chip Select (S) must be driven High after the  
eighth bit of the instruction code has been latched  
17/32  
M25P05  
Figure 16. Deep Power-down (DP) Sequence  
S
t
DP  
0
1
2
3
4
5
6
7
C
D
Instruction  
Stand-by Mode  
Deep Power-down Mode  
AI03753C  
ture of the device to be output on Serial Data Out-  
put (Q).  
Deep Power-down (DP)  
Executing the Deep Power-down (DP) instruction  
is the only way to put the device in the lowest con-  
sumption mode (the Deep Power-down mode). It  
can also be used as an extra software protection  
mechanism, while the device is not in active use,  
since in this mode, the device ignores all Write,  
Program and Erase instructions.  
Driving Chip Select (S) High deselects the device,  
and puts the device in the Standby mode (if there  
is no internal cycle currently in progress). But this  
mode is not the Deep Power-down mode. The  
Deep Power-down mode can only be entered by  
executing the Deep Power-down (DP) instruction,  
The Deep Power-down mode automatically stops  
at Power-down, and the device always Powers-up  
in the Standby mode.  
The Deep Power-down (DP) instruction is entered  
by driving Chip Select (S) Low, followed by the in-  
struction code on Serial Data Input (D). Chip Se-  
lect (S) must be driven Low for the entire duration  
of the sequence.  
The instruction sequence is shown in Figure 16.  
Chip Select (S) must be driven High after the  
eighth bit of the instruction code has been latched  
in, otherwise the Deep Power-down (DP) instruc-  
tion is not executed. As soon as Chip Select (S) is  
to reduce the standby current (from I  
to I  
,
CC1  
CC2  
driven High, it requires a delay of t  
before the  
DP  
as specified in Table 13).  
supply current is reduced to I  
and the Deep  
CC2  
Once the device has entered the Deep Power-  
down mode, all instructions are ignored except the  
Release from Deep Power-down and Read Elec-  
tronic Signature (RES) instruction. This releases  
the device from this mode. The Release from  
Deep Power-down and Read Electronic Signature  
(RES) instruction also allows the Electronic Signa-  
Power-down mode is entered.  
Any Deep Power-down (DP) instruction, while an  
Erase, Program or Write cycle is in progress, is re-  
jected without having any effects on the cycle that  
is in progress.  
18/32  
M25P05  
Figure 17. Release from Deep Power-down and Read Electronic Signature (RES) Sequence  
S
C
0
1
2
3
4
5
6
7
8
9
10  
28 29 30 31 32 33 34 35 36 37 38  
Instruction  
24-Bit Address  
23 22 21  
MSB  
3
2
1
0
D
Q
Electronic Signature Out  
High Impedance  
7
6
5
4
3
2
0
1
MSB  
Deep Power-down Mode  
Stand-by Mode  
AI03755C  
value for the M25P05 is 10h. This can be read us-  
ing the Release from Deep Power-down and Read  
Electronic Signature (RES) instruction.  
Release from Deep Power-down and Read  
Electronic Signature (RES)  
Once the device has entered the Deep Power-  
down mode, all instructions are ignored except the  
Release from Deep Power-down and Read Elec-  
tronic Signature (RES) instruction. Executing this  
instruction takes the device out of the Deep Pow-  
er-down mode. The instruction can also be used to  
read, on Serial Data Output (Q), the 8-bit Electron-  
ic Signature of the device.  
The device is first selected by driving Chip Select  
(S) Low. The instruction code is followed by a  
dummy 3-byte address (A23-A0), each bit being  
latched-in on Serial Data Input (D) during the rising  
edge of Serial Clock (C). Then, the 8-bit Electronic  
Signature, stored in the memory, is shifted out on  
Serial Data Output (Q), each bit being shifted out  
during the falling edge of Serial Clock (C).  
Except while an Erase, Program or Write Status  
Register cycle is in progress, the Release from  
Deep Power-down and Read Electronic Signature  
(RES) instruction always provides access to the  
Electronic Signature of the device, and can be ap-  
plied even if the Deep Power-down mode has not  
been entered.  
Any Release from Deep Power-down and Read  
Electronic Signature (RES) instruction while an  
Erase, Program or Write Status Register cycle is in  
progress, is not decoded, and has no effect on the  
cycle that is in progress.  
The instruction sequence is shown in Figure 17.  
The Release from Deep Power-down and Read  
Electronic Signature (RES) instruction is terminat-  
ed by driving Chip Select (S) High after the Elec-  
tronic Signature has been read at least once.  
Sending additional clock cycles on Serial Clock  
(C), while Chip Select (S) is driven Low, cause the  
Electronic Signature to be output repeatedly.  
Once Chip Select (S) is driven High, the device is  
put in the Standby mode. The device waits to be  
selected, so that it can receive, decode and exe-  
cute instructions.  
This instruction serves a second purpose. The de-  
vice features an 8-bit Electronic Signature, whose  
19/32  
M25P05  
Figure 18. Release from Deep Power-down (RES) Sequence  
S
t
RES  
0
1
2
3
4
5
6
7
C
D
Instruction  
High Impedance  
Q
Deep Power-down Mode  
Stand-by Mode  
AI03754C  
ure 18), still insures that the device is taken out of  
the Deep Power-down mode, but incurs a delay  
Driving Chip Select (S) High after the 8-bit instruc-  
tion byte has been received by the device, but be-  
fore the whole of the 8-bit Electronic Signature has  
been transmitted for the first time (as shown in Fig-  
(t  
) before the device is put in Standby mode.  
Chip Select (S) must remain High for at least  
(max), as specified in Table 14.  
RES  
t
RES  
20/32  
M25P05  
POWER-UP, POWER-DOWN AND DELIVERY STATE  
Moreover, the device ignores all Page Program  
(PP), Sector Erase (SE), Bulk Erase (BE) and  
Write Status Register (WRSR) instructions until a  
Power-up  
At Power-up, the device must not be selected (that  
time delay of t  
has elapsed after the moment  
PUW  
is Chip Select (S) must follow the voltage supplied  
on until the supply voltage reaches  
(min), and a further t delay has elapsed.  
that V  
rises above the V threshold. However,  
CC  
WI  
V
)
CC  
the correct operation of the device is not  
guaranteed if, by this time, V is still below  
V
CC  
VSL  
CC  
To avoid data corruption and inadvertent write  
operations during power up, a Power On Reset  
(POR) circuit is included. The logic inside the  
device is held reset while V is less than the POR  
threshold value, V – all operations are disabled,  
and the device will not respond to any instruction.  
Similarly, when V  
V
(min). No Write Status Register, Program or  
CC  
Erase instructions should be sent until the later of:  
– t  
– t  
after V passed the V threshold  
CC WI  
PUW  
VSL  
CC  
afterV passed the V (min) level  
WI  
CC  
CC  
These values are specified in Table 7.  
drops from the operating  
CC  
voltage, to below the POR threshold value, V , all  
operations are disabled and the device will not  
respond to any instruction.  
No instructions (including Read, Write Status  
Register, Program or Erase instructions) should  
WI  
At Power-up, the device is in the following state:  
– The device is in the Standby mode (not the  
Deep Power-down mode).  
– The Write Enable Latch (WEL) bit is reset.  
be sent to the device until a time delay of t  
after  
VSL  
V
has risen above the V (min) level.  
CC  
CC  
Figure 19. Power-up Timing  
V
CC  
Program, Erase and Write Commands are Rejected by the Device  
Chip Selection Not Allowed  
V
(min)  
CC  
tVSL  
Read Access allowed  
Device fully  
accessible  
Reset State  
of the  
Device  
V
WI  
tPUW  
time  
AI04009B  
Table 7. Power-Up Timing and V Threshold  
WI  
Symbol  
Parameter  
Min.  
Max.  
Unit  
1
V
(min) to S low  
10  
µs  
ms  
V
tVSL  
CC  
1
Time delay to Write instruction  
Write Inhibit Voltage  
15  
tPUW  
1
1.5  
2.5  
VWI  
Note: 1. These parameters are characterized only.  
21/32  
M25P05  
INITIAL DELIVERY STATE  
Power-down  
At Power-up and Power-down, the device must  
not be selected (that is Chip Select (S) must follow  
the voltage applied on V ) until V  
correct value:  
The device is delivered with the memory array  
erased: all bits are set to 1 (each byte contains  
FFh). The Status Register contains 00h (all Status  
Register bits are 0).  
reaches the  
CC  
CC  
– V (min) at Power-up  
CC  
Table 8. Initial Status Register Format  
– V at Power-down  
SS  
b7  
0
b0  
0
A simple pull-up resistor on Chip Select (S) can be  
used to insure safe and proper Power-up and  
Power-down.  
0
0
0
0
0
0
22/32  
M25P05  
MAXIMUM RATING  
Stressing the device above the rating listed in the  
Absolute Maximum Ratings" table may cause per-  
manent damage to the device. These are stress  
ratings only and operation of the device at these or  
any other conditions above those indicated in the  
Operating sections of this specification is not im-  
plied. Exposure to Absolute Maximum Rating con-  
ditions for extended periods may affect device  
reliability. Refer also to the STMicroelectronics  
SURE Program and other relevant quality docu-  
ments.  
Table 9. Absolute Maximum Ratings  
Symbol  
Parameter  
Min.  
Max.  
150  
235  
4.0  
Unit  
°C  
°C  
V
T
STG  
Storage Temperature  
–65  
1
TLEAD  
VIO  
Lead Temperature during Soldering (20 seconds max.)  
Input and Output Voltage (with respect to Ground)  
Supply Voltage  
–0.6  
–0.6  
V
4.0  
V
CC  
2
VESD  
–2000  
2000  
V
Electrostatic Discharge Voltage (Human Body model)  
Note: 1. IPC/JEDEC J-STD-020A  
2. JEDEC Std JESD22-A114A (C1=100 pF, R1=1500 , R2=500 )  
23/32  
M25P05  
DC AND AC PARAMETERS  
This section summarizes the operating and mea-  
surement conditions, and the DC and AC charac-  
teristics of the device. The parameters in the DC  
and AC Characteristic tables that follow are de-  
rived from tests performed under the Measure-  
ment Conditions summarized in the relevant  
tables. Designers should check that the operating  
conditions in their circuit match the measurement  
conditions when relying on the quoted parame-  
ters.  
Table 10. Operating Conditions  
Symbol  
Parameter  
Min.  
2.7  
Max.  
3.6  
Unit  
V
V
CC  
Supply Voltage  
Ambient Operating Temperature  
TA  
–40  
85  
°C  
Table 11. AC Measurement Conditions  
Symbol  
Parameter  
Min.  
Max.  
Unit  
pF  
ns  
V
C
Load Capacitance  
30  
L
Input Rise and Fall Times  
5
0.2V to 0.8V  
Input Pulse Voltages  
CC  
CC  
CC  
0.3V to 0.7V  
Input and Output Timing Reference Voltages  
V
CC  
Note: 1. Output Hi-Z is defined as the point where data out is no longer driven.  
Figure 20. AC Measurement I/O Waveform  
0.8V  
CC  
0.7V  
CC  
0.3V  
CC  
0.2V  
CC  
AI00825  
Table 12. Capacitance  
Symbol  
COUT  
Parameter  
Test Condition  
= 0V  
Min.  
Max.  
Unit  
pF  
Output Capacitance (Q)  
Input Capacitance (other pins)  
V
8
6
OUT  
CIN  
V
IN  
= 0V  
pF  
Note: Sampled only, not 100% tested, at T =25°C and a frequency of 20 MHz.  
A
24/32  
M25P05  
Table 13. DC Characteristics  
Test Condition  
(in addition to those in Table 10)  
Symbol  
Parameter  
Min.  
Max.  
Unit  
ILI  
Input Leakage Current  
Output Leakage Current  
Standby Current  
± 2  
± 2  
50  
5
µA  
µA  
µA  
µA  
ILO  
ICC1  
ICC2  
S = VCC, VIN = VSS or VCC  
S = VCC, VIN = VSS or VCC  
Deep Power-down Current  
C = 0.1VCC / 0.9.VCC at 20 MHz,  
Q = open  
ICC3  
Operating Current (READ)  
3
mA  
ICC4  
ICC5  
ICC6  
ICC7  
VIL  
Operating Current (PP)  
Operating Current (WRSR)  
Operating Current (SE)  
Operating Current (BE)  
Input Low Voltage  
S = VCC  
S = VCC  
S = VCC  
S = VCC  
15  
15  
mA  
mA  
mA  
mA  
V
15  
15  
0.3VCC  
VCC+1  
– 0.5  
VIH  
0.7VCC  
Input High Voltage  
V
Output Low Voltage  
IOL = 1.6 mA  
0.4  
V
VOL  
VOH  
I
OH = –100 µA  
VCC–0.2  
Output High Voltage  
V
25/32  
M25P05  
Table 14. AC Characteristics  
Test conditions specified in Table 10 and Table 11  
Symbol  
Alt.  
Parameter  
Min.  
D.C.  
10  
Max.  
Unit  
MHz  
ns  
f
f
C
Clock Frequency  
20  
C
t
t
S Active Setup Time (relative to C)  
S Not Active Hold Time (relative to C)  
Clock High Time  
SLCH  
CSS  
t
10  
ns  
CHSL  
1
t
22  
ns  
t
CLH  
CH  
1
t
Clock Low Time  
22  
5
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
t
CLL  
CL  
t
t
Data In Setup Time  
DVCH  
DSU  
t
t
Data In Hold Time  
5
CHDX  
DH  
t
S Active Hold Time (relative to C)  
S Not Active Setup Time (relative to C)  
S Deselect Time  
10  
10  
50  
CHSH  
t
SHCH  
t
t
CSH  
SHSL  
2
t
Output Disable Time  
20  
20  
t
DIS  
SHQZ  
t
t
V
Clock Low to Output Valid  
Output Hold Time  
CLQV  
t
t
HO  
0
CLQX  
t
HOLD Setup Time (relative to C)  
HOLD Hold Time (relative to C)  
HOLD Setup Time (relative to C)  
HOLD Hold Time (relative to C)  
HOLD to Output Low-Z  
10  
10  
10  
10  
HLCH  
t
CHHH  
t
HHCH  
t
CHHL  
2
t
20  
20  
t
LZ  
HHQX  
2
t
HOLD to Output High-Z  
ns  
µs  
µs  
t
HZ  
HLQZ  
2
S High to Deep Power-down Mode  
S High to Standby Mode  
1.6  
1.6  
t
DP  
2
t
RES  
t
Write Status Register Cycle Time  
Page Program Cycle Time  
Sector Erase Cycle Time  
Bulk Erase Cycle Time  
5
5
2
4
ms  
ms  
s
W
t
PP  
t
SE  
t
BE  
s
Note: 1. t + t must be greater than or equal to 1/ f  
C
CH  
CL  
2. Value guaranteed by characterization, not 100% tested in production.  
26/32  
M25P05  
Figure 21. Serial Input Timing  
tSHSL  
S
tCHSL  
tSLCH  
tCHSH  
tSHCH  
C
tDVCH  
tCHCL  
tCHDX  
tCLCH  
MSB IN  
LSB IN  
D
Q
High Impedance  
AI01447C  
Figure 22. Hold Timing  
S
tHLCH  
tCHHL  
tHHCH  
C
tCHHH  
tHLQZ  
tHHQX  
Q
D
HOLD  
AI02032  
27/32  
M25P05  
Figure 23. Output Timing  
S
C
tCH  
tCLQV  
tCL  
tSHQZ  
tCLQX  
LSB OUT  
Q
tQLQH  
tQHQL  
ADDR.LSB IN  
D
AI01449C  
28/32  
M25P05  
PACKAGE MECHANICAL  
SO8 narrow – 8 lead Plastic Small Outline, 150 mils body width  
h x 45˚  
C
A
B
CP  
e
D
N
E
H
1
A1  
α
L
SO-a  
Note: Drawing is not to scale.  
SO8 narrow – 8 lead Plastic Small Outline, 150 mils body width  
mm  
inches  
Min.  
0.053  
0.004  
0.013  
0.007  
0.189  
0.150  
Symb.  
Typ.  
Min.  
1.35  
0.10  
0.33  
0.19  
4.80  
3.80  
Max.  
1.75  
0.25  
0.51  
0.25  
5.00  
4.00  
Typ.  
Max.  
0.069  
0.010  
0.020  
0.010  
0.197  
0.157  
A
A1  
B
C
D
E
e
1.27  
0.050  
H
h
5.80  
0.25  
0.40  
0°  
6.20  
0.50  
0.90  
8°  
0.228  
0.010  
0.016  
0°  
0.244  
0.020  
0.035  
8°  
L
α
N
CP  
8
8
0.10  
0.004  
29/32  
M25P05  
PART NUMBERING  
Table 15. Ordering Information Scheme  
Example:  
M25P05  
V
MN  
6
T
Device Type  
M25P  
Device Function  
05 = 512 Kbit (64K x 8)  
Operating Voltage  
V = V = 2.7 to 3.6V  
CC  
Package  
MN = SO8 (150 mil width)  
Temperature Range  
6 = –40 to 85 °C  
Option  
T = Tape & Reel Packing  
For a list of available options (speed, package,  
etc.) or for further information on any aspect of this  
device, please contact your nearest ST Sales Of-  
fice.  
30/32  
M25P05  
REVISION HISTORY  
Table 16. Document Revision History  
Date  
Description of Revision  
09-Feb-2001 1.0  
26-Mar-2001 1.1  
12-Apr-2001 1.2  
25-May-2001 1.3  
Document written  
Correction to descriptions on Hold condition and Power up: no parameters changed  
Descriptions of Page Programming made more precise  
Serial Paged Flash Memory renamed as Serial Flash Memory  
Changes to text: Signal Description/Chip Select; Hold Condition/1st para; Protection modes;  
Release from Power-down and Read Electronic Signature (RES); Power-up  
Repositioning of several tables and illustrations without changing their contents  
Power-up timing illustration; SO8W package removed  
11-Sep-2001 1.4  
25-Feb-2002 1.5  
Changes to tables: Abs Max Ratings/V ; DC Characteristics/V  
IO  
IL  
Product is “Not for New Design”  
31/32  
M25P05  
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences  
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted  
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject  
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not  
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.  
The ST logo is registered trademark of STMicroelectronics  
All other names are the property of their respective owners  
© 2002 STMicroelectronics - All Rights Reserved  
STMicroelectronics group of companies Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong -  
India - Israel - Italy - Japan - Malaysia - Malta - Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States.  
www.st.com  
32/32  

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