934033430118 [NXP]

TRANSISTOR 3.4 A, 30 V, 0.1 ohm, 2 CHANNEL, N-CHANNEL, Si, POWER, MOSFET, MS-012AA, PLASTIC, SMD, SO-8, FET General Purpose Power;
934033430118
型号: 934033430118
厂家: NXP    NXP
描述:

TRANSISTOR 3.4 A, 30 V, 0.1 ohm, 2 CHANNEL, N-CHANNEL, Si, POWER, MOSFET, MS-012AA, PLASTIC, SMD, SO-8, FET General Purpose Power

开关 脉冲 光电二极管 晶体管
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Philips Semiconductors  
Product specification  
Dual N-channel enhancement mode  
TrenchMOSTM transistor  
PHN210  
FEATURES  
SYMBOL  
QUICK REFERENCE DATA  
• Dual device  
VDS = 30 V  
d1 d1  
d2 d2  
• Low threshold voltage  
• Fast switching  
ID = 3.4 A  
• Logic level compatible  
• Surface mount package  
RDS(ON) 100 m(VGS = 10 V)  
RDS(ON) 200 m(VGS = 4.5 V)  
s1  
g1  
s2  
g2  
GENERAL DESCRIPTION  
PINNING  
SOT96-1  
8
7
6
5
Dual N-channel enhancement  
mode field-effect transistor in a  
plastic envelope using ’trench’  
technology.  
PIN  
DESCRIPTION  
source 1  
gate 1  
1
2
Applications:-  
• Motor and relay drivers  
• d.c. to d.c. converters  
• Logic level translator  
3
source 2  
gate 2  
pin 1 index  
4
1
2
3
4
The PHN210 is supplied in the  
SOT96-1 (SO8) surface mounting  
package.  
5,6  
7,8  
drain 2  
drain 1  
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134)  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VDS  
Repetitive peak drain-source  
voltage  
Tj = 25 ˚C to 150˚C  
-
30  
V
VDS  
VDGR  
VGS  
ID  
Continuous drain-source voltage  
Drain-gate voltage  
-
-
-
-
-
-
-
-
30  
30  
V
V
V
A
A
A
A
A
RGS = 20 kΩ  
Gate-source voltage  
± 20  
3.4  
2.8  
2.4  
1.9  
14  
Drain current per MOSFET1  
Ta = 25 ˚C  
Ta = 70 ˚C  
Ta = 25 ˚C  
Ta = 70 ˚C  
Ta = 25 ˚C  
ID  
Drain current per MOSFET (both  
MOSFETs conducting)1  
Drain current per MOSFET (pulse  
peak value)  
IDM  
Ptot  
Total power dissipation (either or  
both MOSFETs conducting)1  
Storage & operating temperature  
Ta = 25 ˚C  
Ta = 70 ˚C  
-
-
2
1.3  
150  
W
W
˚C  
Tstg, Tj  
- 65  
1 Surface mounted on FR4 board, t 10 sec  
January 2002  
1
Rev 1.100  
Philips Semiconductors  
Product specification  
Dual N-channel enhancement mode  
TrenchMOSTM transistor  
PHN210  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
TYP.  
MAX.  
UNIT  
Rth j-a  
Thermal resistance junction Surface mounted, FR4 board, t 10 sec  
to ambient  
-
62.5  
K/W  
Rth j-a  
Thermal resistance junction Surface mounted, FR4 board  
to ambient  
150  
-
K/W  
AVALANCHE ENERGY LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134)  
SYMBOL PARAMETER  
EAS Non-repetitive avalanche  
CONDITIONS  
MIN.  
MAX.  
UNIT  
Unclamped inductive load, IAS = 3.4 A;  
tp = 0.2 ms; Tj prior to avalanche = 25˚C;  
-
13  
mJ  
energy (per MOSFET)  
VDD 15 V; RGS = 50 ; VGS = 10 V  
IAS  
Non-repetitive avalanche  
current (per MOSFET)  
-
3.4  
A
ELECTRICAL CHARACTERISTICS  
Tj= 25˚C, per MOSFET unless otherwise specified  
SYMBOL PARAMETER CONDITIONS  
V(BR)DSS Drain-source breakdown  
MIN. TYP. MAX. UNIT  
VGS = 0 V; ID = 10 µA;  
30  
27  
1
0.4  
-
-
-
-
2
3.5  
2
-
-
2
-
-
-
V
V
V
V
V
mΩ  
mΩ  
mΩ  
S
voltage  
Gate threshold voltage  
Tj = -55˚C  
VGS(TO)  
VDS = VGS; ID = 1 mA  
2.8  
-
3.2  
100  
200  
170  
-
Tj = 150˚C  
Tj = -55˚C  
RDS(ON)  
Drain-source on-state  
resistance  
VGS = 10 V; ID = 2.2 A  
VGS = 4.5 V; ID = 1 A  
80  
120  
-
4.5  
-
VGS = 10 V; ID = 2.2 A; Tj = 150˚C  
VDS = 20 V; ID = 2.2 A  
VGS = 10 V; VDS = 1 V;  
gfs  
ID(ON)  
Forward transconductance  
On-state drain current  
-
A
VGS = 4.5 V; VDS = 5 V  
-
-
A
IDSS  
IGSS  
Zero gate voltage drain  
current  
Gate source leakage current VGS = ±20 V; VDS = 0 V  
VDS = 24 V; VGS = 0 V;  
VDS = 24 V; VGS = 0 V; Tj = 150˚C  
-
-
-
10  
0.6  
10  
100  
10  
100  
nA  
µA  
nA  
Qg(tot)  
Qgs  
Qgd  
Total gate charge  
Gate-source charge  
Gate-drain (Miller) charge  
ID = 2.3 A; VDD = 15 V; VGS = 10 V  
-
-
-
6
0.7  
0.7  
-
-
-
nC  
nC  
nC  
td on  
tr  
td off  
tf  
Turn-on delay time  
Turn-on rise time  
Turn-off delay time  
Turn-off fall time  
VDD = 20 V; RD = 18 ;  
VGS = 10 V; RG = 6 Ω  
Resistive load  
-
-
-
-
6
8
21  
15  
-
-
-
-
ns  
ns  
ns  
ns  
Ld  
Ls  
Internal drain inductance  
Internal source inductance  
Measured from drain lead to centre of die  
Measured from source lead to source  
bond pad  
-
-
2.5  
5
-
-
nH  
nH  
Ciss  
Coss  
Crss  
Input capacitance  
Output capacitance  
Feedback capacitance  
VGS = 0 V; VDS = 20 V; f = 1 MHz  
-
-
-
250  
88  
54  
-
-
-
pF  
pF  
pF  
January 2002  
2
Rev 1.100  
Philips Semiconductors  
Product specification  
Dual N-channel enhancement mode  
TrenchMOSTM transistor  
PHN210  
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS  
Tj = 25˚C, per MOSFET unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
IS  
Continuous source diode  
Ta = 25 ˚C  
-
-
-
-
-
2.2  
14  
A
A
V
current (per MOSFET)  
Pulsed source diode current  
(per MOSFET)  
ISM  
VSD  
Diode forward voltage  
IF = 1.25 A; VGS = 0 V  
0.82  
1.2  
trr  
Qrr  
Reverse recovery time  
Reverse recovery charge  
IF = 1.25 A; -dIF/dt = 100 A/µs;  
VGS = 0 V; VR = 25 V  
-
-
69  
55  
-
-
ns  
nC  
Normalised Power Derating  
PD%  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
PHN210  
Peak Pulsed Drain Current, IDM (A)  
RDS(on) = VDS/ ID  
100  
10  
tp = 10 us  
100 us  
1 ms  
1
10 ms  
100 ms  
0.1  
0.01  
10 s  
0
20  
40  
60  
80  
100  
120  
140  
0.1  
1
10  
100  
Drain-Source Voltage, VDS (V)  
Tamb /  
C
Fig.1. Normalised power dissipation.  
PD% = 100 PD/PD 25 ˚C = f(Ta)  
Fig.3. Safe operating area. Ta = 25 ˚C  
ID & IDM = f(VDS); IDM single pulse; parameter tp  
Normalised Current Derating  
ID%  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
PHN210  
Zth j-a (K/W)  
100  
D = 0.5  
0.2  
10  
1
0.1  
0.05  
0.02  
P
D = tp/T  
D
tp  
0.1  
0.01  
single pulse  
T
1E-06 1E-05 1E-04 1E-03 1E-02 1E-01 1E+00 1E+01  
Pulse width, tp (s)  
0
20  
40  
60  
80  
100  
120  
140  
Ambient temperature, Tamb (C)  
Fig.2. Normalised continuous drain current.  
ID% = 100 ID/ID 25 ˚C = f(Ta); conditions: VGS 10 V  
Fig.4. Transient thermal impedance.  
Zth j-a = f(t); parameter D = tp/T  
January 2002  
3
Rev 1.100  
Philips Semiconductors  
Product specification  
Dual N-channel enhancement mode  
TrenchMOSTM transistor  
PHN210  
Transconductance, gfs (S)  
6
5
4
3
2
1
0
Drain Current, ID (A)  
10  
5V  
VGS = 20 V  
10 V  
9
8
7
6
5
4
3
2
1
0
Tj = 25 C  
150 C  
Tj = 25 C  
4.2 V  
4 V  
3.8 V  
3.6 V  
3.4 V  
3.2 V  
0
1
2
3
4
5
6
7
8
9
10  
0
0.2 0.4 0.6 0.8  
1
1.2 1.4 1.6 1.8  
2
Drain-Source Voltage, VDS (V)  
Drain current, ID (A)  
Fig.5. Typical output characteristics, Tj = 25 ˚C.  
Fig.8. Typical transconductance, Tj = 25 ˚C.  
ID = f(VDS); parameter VGS  
gfs = f(ID) ; parameter Tj  
a
Normalised RDS(ON) = f(Tj)  
Drain-Source On Resistance, RDS(on) (Ohms)  
0.5  
2
3.6 V  
3.8V 4 V  
3.2 V  
3.4 V  
4.2 V  
Tj = 25 C  
0.4  
0.3  
0.2  
0.1  
0
1.5  
1
VGS =5 V  
10V  
20V  
0.5  
0
-50  
0
50  
Tj / C  
100  
150  
0
1
2
3
4
5
6
7
8
9
10  
Drain Current, ID (A)  
Fig.6. Typical on-state resistance, Tj = 25 ˚C.  
Fig.9. Normalised drain-source on-state resistance.  
a = RDS(ON)/RDS(ON)25 ˚C = f(Tj)  
RDS(ON) = f(ID); parameter VGS  
VGS(TO) / V  
4
Drain current, ID (A)  
10  
VDS > ID X RDS(ON)  
9
8
7
6
5
4
3
2
1
0
3
2
1
0
max.  
typ.  
Tj = 25 C  
150 C  
min.  
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
5.5  
6
-60 -40 -20  
0
20 40 60 80 100 120 140  
Gate-source voltage, VGS (V)  
Tj /  
C
Fig.7. Typical transfer characteristics.  
ID = f(VGS); parameter Tj  
Fig.10. Gate threshold voltage.  
VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS  
January 2002  
4
Rev 1.100  
Philips Semiconductors  
Product specification  
Dual N-channel enhancement mode  
TrenchMOSTM transistor  
PHN210  
Sub-Threshold Conduction  
1E-01  
Source-Drain Diode Current, IF (A)  
VGS = 0 V  
10  
9
8
7
6
5
4
3
2
1
0
1E-02  
min  
typ  
max  
150 C  
1E-03  
1E-04  
1E-05  
1E-06  
Tj = 25 C  
0
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2 1.3 1.4 1.5  
Drain-Source Voltage, VSDS (V)  
0
1
2
3
4
5
Fig.11. Sub-threshold drain current.  
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS  
Fig.14. Typical reverse diode current.  
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj  
Non-repetitive Avalanche current, IAS (A)  
PHN210  
25 C  
10  
Capacitances, Ciss, Coss, Crss (pF)  
1000  
Ciss  
Tj prior to avalanche =125 C  
VDS  
1
100  
10  
Coss  
Crss  
tp  
ID  
0.1  
1E-06  
1E-05  
1E-04  
1E-03  
1E-02  
0.1  
1
10  
100  
Avalanche time, tp (s)  
Drain-Source Voltage, VDS (V)  
Fig.12. Typical capacitances, Ciss, Coss, Crss.  
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz  
Fig.15. Maximum permissible non-repetitive  
avalanche current (IAS) versus avalanche time (tp);  
unclamped inductive load  
Gate-source voltage, VGS (V)  
15  
14 ID = 2.3A  
13  
12  
Tj = 25 C  
VDD = 15 V  
11  
10  
9
8
7
6
5
4
3
2
1
0
0
1
2
3
4
5
6
7
8
9
10  
Gate charge, QG (nC)  
Fig.13. Typical turn-on gate-charge characteristics.  
VGS = f(QG); parameter VDS  
January 2002  
5
Rev 1.100  
Philips Semiconductors  
Product specification  
Dual N-channel enhancement mode  
TrenchMOSTM transistor  
PHN210  
MECHANICAL DATA  
SO8: plastic small outline package; 8 leads; body width 3.9 mm  
SOT96-1  
D
E
A
X
v
c
y
H
M
A
E
Z
5
8
Q
A
2
A
(A  
)
3
A
1
pin 1 index  
θ
L
p
L
1
4
e
w
M
detail X  
b
p
0
2.5  
5 mm  
scale  
DIMENSIONS (inch dimensions are derived from the original mm dimensions)  
A
(1)  
(1)  
(2)  
UNIT  
A
A
A
b
c
D
E
e
H
L
L
p
Q
v
w
y
Z
θ
1
2
3
p
E
max.  
0.25  
0.10  
1.45  
1.25  
0.49  
0.36  
0.25  
0.19  
5.0  
4.8  
4.0  
3.8  
6.2  
5.8  
1.0  
0.4  
0.7  
0.6  
0.7  
0.3  
mm  
1.27  
0.050  
1.05  
0.041  
0.25  
0.01  
0.25  
0.1  
1.75  
0.25  
0.01  
8o  
0o  
0.010 0.057  
0.004 0.049  
0.019 0.0100 0.20  
0.014 0.0075 0.19  
0.16  
0.15  
0.244  
0.228  
0.039 0.028  
0.016 0.024  
0.028  
0.012  
inches 0.069  
0.01 0.004  
Notes  
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.  
2. Plastic or metal protrusions of 0.25 mm maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
EIAJ  
95-02-04  
97-05-22  
SOT96-1  
076E03S  
MS-012AA  
Fig.16. SOT96 surface mounting package.  
Notes  
1. This product is supplied in anti-static packaging. The gate-source input must be protected against static  
discharge during transport or handling.  
2. Refer to Integrated Circuit Packages, Data Handbook IC26.  
3. Epoxy meets UL94 V0 at 1/8".  
January 2002  
6
Rev 1.100  
Philips Semiconductors  
Product specification  
Dual N-channel enhancement mode  
TrenchMOSTM transistor  
PHN210  
DEFINITIONS  
DATA SHEET STATUS  
DATA SHEET  
STATUS2  
PRODUCT  
STATUS3  
DEFINITIONS  
Objective data  
Development  
This data sheet contains data from the objective specification for  
product development. Philips Semiconductors reserves the right to  
change the specification in any manner without notice  
Preliminary data  
Qualification  
This data sheet contains data from the preliminary specification.  
Supplementary data will be published at a later date. Philips  
Semiconductors reserves the right to change the specification without  
notice, in order to improve the design and supply the best possible  
product  
Product data  
Production  
This data sheet contains data from the product specification. Philips  
Semiconductors reserves the right to make changes at any time in  
order to improve the design, manufacturing and supply. Changes will  
be communicated according to the Customer Product/Process  
Change Notification (CPCN) procedure SNW-SQ-650A  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 2002  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
2 Please consult the most recently issued datasheet before initiating or completing a design.  
3 The product status of the device(s) described in this datasheet may have changed since this datasheet was  
published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com.  
January 2002  
7
Rev 1.100  

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