934068282135 [NXP]

3.5A, 55V, 0.08ohm, N-CHANNEL, Si, POWER, MOSFET, PLASTIC, SC-73, 4 PIN;
934068282135
型号: 934068282135
厂家: NXP    NXP
描述:

3.5A, 55V, 0.08ohm, N-CHANNEL, Si, POWER, MOSFET, PLASTIC, SC-73, 4 PIN

开关 脉冲 光电二极管 晶体管
文件: 总13页 (文件大小:161K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
BUK7880-55  
T223  
SO  
N-channel TrenchMOS standard level FET  
Rev. 3 — 21 April 2011  
Product data sheet  
1. Product profile  
1.1 General description  
Standard level N-channel enhancement mode Field-Effect Transistor (FET) in a plastic  
package using TrenchMOS technology. This product has been designed and qualified to  
the appropriate AEC standard for use in automotive critical applications.  
1.2 Features and benefits  
„ AEC Q101 compliant  
„ Low conduction losses due to low  
on-state resistance  
„ Electrostatically robust due to  
integrated protection diodes  
1.3 Applications  
„ Automotive and general purpose  
power switching  
1.4 Quick reference data  
Table 1.  
Symbol  
VDS  
Quick reference data  
Parameter  
Conditions  
Min Typ Max Unit  
drain-source voltage  
drain current  
Tj 25 °C; Tj 150 °C  
-
-
-
-
-
-
55  
V
ID  
Tsp = 25 °C  
7.5  
1.8  
A
Ptot  
total power dissipation Tsp = 25 °C; Tamb = 25 °C  
W
Static characteristics  
RDSon drain-source on-state  
resistance  
Avalanche ruggedness  
VGS = 10 V; ID = 5 A;  
Tj = 25 °C  
-
-
65  
-
80  
30  
mΩ  
EDS(AL)S  
non-repetitive  
drain-source  
ID = 2.5 A; Vsup 25 V;  
RGS = 50 ; VGS = 10 V;  
Tj(init) = 25 °C; unclamped  
mJ  
avalanche energy  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
2. Pinning information  
Table 2.  
Pinning information  
Symbol Description  
Pin  
1
Simplified outline  
Graphic symbol  
G
D
S
D
gate  
D
4
2
drain  
source  
3
G
4
mounting base;  
1
2
3
connected to drain  
SOT223 (SOT223)  
S
sym116  
3. Ordering information  
Table 3.  
Ordering information  
Type number  
Package  
Name  
Description  
Version  
BUK7880-55  
SOT223  
plastic surface-mounted package with increased heatsink;  
4 leads  
SOT223  
4. Limiting values  
Table 4.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
VDS  
Parameter  
Conditions  
Min  
Max  
55  
Unit  
V
drain-source voltage  
drain-gate voltage  
gate-source voltage  
drain current  
Tj 25 °C; Tj 150 °C  
RGS = 20 kΩ  
-
VDGR  
VGS  
-
55  
V
-16  
16  
V
ID  
Tamb = 25 °C  
-
3.5  
7.5  
2.2  
40  
A
Tsp = 25 °C  
-
A
Tamb = 100 °C  
-
A
IDM  
Ptot  
peak drain current  
Tsp = 25 °C; pulsed  
Tsp = 25 °C; Tamb = 25 °C  
Tsp = 25 °C  
-
A
total power dissipation  
-
1.8  
8.3  
150  
150  
W
W
°C  
°C  
-
Tstg  
Tj  
storage temperature  
junction temperature  
-55  
-55  
Source-drain diode  
IS  
source current  
peak source current  
Tsp = 25 °C  
-
-
7.5  
40  
A
A
ISM  
pulsed; Tsp = 25 °C  
Avalanche ruggedness  
EDS(AL)S non-repetitive drain-source  
avalanche energy  
Electrostatic discharge  
ID = 2.5 A; Vsup 25 V; RGS = 50 ;  
VGS = 10 V; Tj(init) = 25 °C; unclamped  
-
-
30  
mJ  
kV  
Vesd  
electrostatic discharge voltage HBM; C = 100 pF; R = 1.5 kΩ  
2
BUK7880-55  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 21 April 2011  
2 of 13  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
003aaf268  
003aaf269  
100  
100  
P
I
D
der  
(%)  
80  
(%)  
80  
60  
40  
20  
0
60  
40  
20  
0
0
40  
80  
120  
160  
0
40  
80  
120  
160  
T
mb  
(°C)  
T
mb  
(°C)  
Fig 1. Normalized total power dissipation as a  
function of solder point temperature  
Fig 2. Normalized continuous drain current as a  
function of solder point temperature  
003aaf270  
003aaf282  
2
10  
100  
WDSS  
(%)  
R
DS(on)  
= V / I  
DS D  
I
DM  
(A)  
80  
t
p
= 1 μs  
10  
10 μs  
100 μs  
1 ms  
60  
40  
20  
0
D.C.  
1
10 ms  
100 ms  
1  
10  
2
1
10  
10  
20  
40  
60  
80  
100  
120  
140  
T
160  
(°C)  
V
DS  
(V)  
(mb)  
T
sp = 25 °C; IDM is single pulse  
ID = 2.5 A  
Fig 3. Safe operating area; continuous and peak drain  
currents as a function of drain-source voltage  
Fig 4. Normalised drain-source non-repetitive  
avalanche energy as a function of  
mounting-base temperature  
BUK7880-55  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 21 April 2011  
3 of 13  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
5. Thermal characteristics  
Table 5.  
Symbol  
Rth(j-sp)  
Thermal characteristics  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
thermal resistance from  
junction to solder point  
mounted on any printed-circuit  
board  
-
12  
15  
K/W  
Rth(j-a)  
thermal resistance from  
junction to ambient  
Mounted on FR4 PCB,  
mounting pad for drain 6.5 cm2  
-
-
70  
K/W  
003aaf271  
2
10  
Z
th(j-mb)  
(K/W)  
δ = 0.5  
10  
0.2  
0.1  
0.05  
0.02  
t
1
p
P
δ =  
T
1  
10  
0
t
t
p
T
2  
10  
10  
6  
5  
4  
3  
2  
1  
10  
10  
10  
10  
10  
1
10  
(s)  
t
p
Fig 5. Transient thermal impedance from junction to solder point as a function of pulse duration  
BUK7880-55  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 21 April 2011  
4 of 13  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
6. Characteristics  
Table 6.  
Symbol  
Characteristics  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
Static characteristics  
V(BR)DSS drain-source  
breakdown voltage  
ID = 0.25 mA; VGS = 0 V; Tj = 25 °C  
ID = 0.25 mA; VGS = 0 V; Tj = -55 °C  
55  
50  
1.2  
2
-
-
V
-
-
V
VGS(th)  
gate-source threshold ID = 1 mA; VDS = VGS; Tj = 150 °C  
-
-
V
voltage  
ID = 1 mA; VDS = VGS; Tj = 25 °C  
3
4
V
ID = 1 mA; VDS = VGS; Tj = -55 °C  
-
-
4.4  
10  
100  
1
V
IDSS  
drain leakage current  
gate leakage current  
VDS = 55 V; VGS = 0 V; Tj = 25 °C  
VDS = 55 V; VGS = 0 V; Tj = 150 °C  
VGS = 10 V; VDS = 0 V; Tj = 25 °C  
VGS = -10 V; VDS = 0 V; Tj = 25 °C  
VGS = 10 V; VDS = 0 V; Tj = 150 °C  
VGS = -10 V; VDS = 0 V; Tj = 150 °C  
VGS = 10 V; ID = 5 A; Tj = 150 °C  
VGS = 10 V; ID = 5 A; Tj = 25 °C  
VDS = 0 V; Tj = 25 °C; IG = 1 mA  
VDS = 0 V; Tj = 25 °C; IG = -1 mA  
-
0.05  
µA  
µA  
µA  
µA  
µA  
µA  
mΩ  
mΩ  
V
-
-
IGSS  
-
0.04  
-
0.04  
1
-
-
10  
10  
148  
80  
-
-
-
RDSon  
drain-source on-state  
resistance  
-
-
-
65  
-
V(BR)GSS  
gate-source  
16  
16  
breakdown voltage  
-
-
V
Dynamic characteristics  
Ciss  
Coss  
Crss  
input capacitance  
VGS = 0 V; VDS = 25 V; f = 1 MHz;  
Tj = 25 °C  
-
-
-
365  
110  
60  
500  
135  
85  
pF  
pF  
pF  
output capacitance  
reverse transfer  
capacitance  
td(on)  
tr  
td(off)  
tf  
turn-on delay time  
rise time  
VDS = 30 V; RL = 4.3 ; VGS = 10 V;  
RG(ext) = 10 ; Tmb = 25 °C; ID = 7 A  
-
9
14  
25  
27  
18  
-
ns  
ns  
ns  
ns  
S
-
15  
18  
12  
4
turn-off delay time  
fall time  
-
-
gfs  
transfer conductance  
VDS = 25 V; ID = 5 A; Tj = 25 °C  
1
Source-drain diode  
VSD  
source-drain voltage  
IS = 5 A; VGS = 0 V; Tj -55 °C;  
Tj 175 °C  
-
0.85  
1.1  
V
trr  
reverse recovery time IS = 5 A; dIS/dt = -100 A/µs;  
-
-
38  
-
-
ns  
VGS = -10 V; VDS = 30 V; Tj -55 °C;  
Qr  
recovered charge  
0.2  
µC  
Tj 175 °C  
BUK7880-55  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 21 April 2011  
5 of 13  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
003aaf272  
003aaf273  
40  
120  
9.5  
V
(V) = 16  
12  
10  
GS  
V
(V) = 6.0  
GS  
I
D
9.0  
8.5  
8.0  
R
DS(on)  
(mΩ)  
(A)  
6.5  
30  
7.0  
8.0  
9.0  
100  
7.5  
7.0  
6.5  
6.0  
20  
10  
0
10  
80  
60  
5.5  
5.0  
4.5 4.0  
0
2
4
6
8
10  
(V)  
0
5
10  
15  
20  
25  
V
DS  
I (A)  
D
Tj = 25 °C  
Tj = 25 °C  
Fig 6. Output characteristics: drain current as a  
function of drain-source voltage; typical values  
Fig 7. Drain-source on-state resistance as a function  
of drain current; typical values  
003aaf274  
003aaf275  
20  
8
I
D
g
(S)  
fs  
(A)  
15  
6
4
2
10  
5
T = 150 °C  
T = 25 °C  
j
j
0
0
2
4
6
8
0
4
8
12  
16  
20  
V
(V)  
I (A)  
D
GS  
VDS > ID x RDSon  
VDS > ID x RDSon  
Fig 8. Transfer characteristics: drain current as a  
function of gate-source voltage; typical values  
Fig 9. Forward transconductance as a function of  
drain current; typical values  
BUK7880-55  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 21 April 2011  
6 of 13  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
003aaf276  
003aaf277  
2.0  
a
5
V
GS(th)  
(V)  
maximum  
4
3
2
1
1.5  
1.0  
0.5  
typical  
minimum  
100  
0
100  
200  
100  
0
100  
200  
T (°C)  
j
T
mb  
(°C)  
ID = 1 mA; VDS = VGS  
ID = 5 A; VGS = 10 V  
Fig 10. Normalized drain-source on-state resistance  
factor as a function of junction temperature  
Fig 11. Gate-source threshold voltage as a function of  
junction temperature  
003aaf278  
003aaf279  
1  
10  
D
(A)  
1.0  
C
(nF)  
0.8  
I
C
iss  
2  
10  
C
oss  
3  
10  
0.6  
0.4  
0.2  
0
C
rss  
2 %  
typical  
98 %  
4  
5  
6  
10  
10  
10  
2  
1  
2
1
2
3
4
5
10  
10  
1
10  
10  
V
(V)  
V
DS  
(V)  
GS  
Tj = 25 °C; VDS = VGS  
VGS = 0 V; f = 1 MHz  
Fig 12. Sub-threshold drain current as a function of  
gate-source voltage  
Fig 13. Input, output and reverse transfer capacitances  
as a function of drain-source voltage; typical  
values  
BUK7880-55  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 21 April 2011  
7 of 13  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
003aaf280  
003aaf281  
12  
40  
I
F
V
(V)  
GS  
(A)  
30  
8
4
0
V
= 14 V  
V
= 44 V  
DS  
DS  
20  
10  
0
T = 150 °C  
T = 25 °C  
j
j
0
5
10  
15  
0
0.5  
1.0  
1.5  
2.0  
Q
(nC)  
V
SDS  
(V)  
G
Tj = 25 °C; ID = 7 A  
VGS = 0 V  
Fig 14. Gate-source voltage as a function of gate  
charge; typical values  
Fig 15. Source (diode forward) current as a function of  
source-drain (diode forward) voltage; typical  
values  
BUK7880-55  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 21 April 2011  
8 of 13  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
7. Package outline  
Plastic surface-mounted package with increased heatsink; 4 leads  
SOT223  
D
B
E
A
X
c
y
H
v
M
A
E
b
1
4
Q
A
A
1
L
1
2
3
p
e
b
p
w
M
B
detail X  
1
e
0
2
4 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
A
UNIT  
A
b
b
c
D
E
e
e
H
L
p
Q
v
w
y
p
1
1
1
E
1.8  
1.5  
0.10 0.80  
0.01 0.60  
3.1  
2.9  
0.32  
0.22  
6.7  
6.3  
3.7  
3.3  
7.3  
6.7  
1.1  
0.7  
0.95  
0.85  
mm  
4.6  
2.3  
0.2  
0.1  
0.1  
REFERENCES  
JEDEC JEITA  
EUROPEAN  
PROJECTION  
OUTLINE  
VERSION  
ISSUE DATE  
IEC  
04-11-10  
06-03-16  
SOT223  
SC-73  
Fig 16. Package outline SOT223 (SOT223)  
BUK7880-55  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 21 April 2011  
9 of 13  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
8. Revision history  
Table 7.  
Revision history  
Document ID  
BUK7880-55 v.3  
Modifications:  
Release date  
Data sheet status  
Change notice  
Supersedes  
20110421  
Product data sheet  
-
BUK7880-55_2  
The format of this data sheet has been redesigned to comply with the new identity guidelines  
of NXP Semiconductors.  
Legal texts have been adapted to the new company name where appropriate.  
BUK7880-55_2  
19980401  
Product specification  
-
-
BUK7880-55  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 21 April 2011  
10 of 13  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
9. Legal information  
9.1 Data sheet status  
Document status [1] [2]  
Product status [3]  
Development  
Definition  
Objective [short] data sheet  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term 'short data sheet' is explained in section "Definitions".  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product  
status information is available on the Internet at URL http://www.nxp.com.  
Right to make changes — NXP Semiconductors reserves the right to make  
9.2 Definitions  
changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
Preview — The document is a preview version only. The document is still  
subject to formal approval, which may result in modifications or additions.  
NXP Semiconductors does not give any representations or warranties as to  
the accuracy or completeness of information included herein and shall have  
no liability for the consequences of use of such information.  
Suitability for use in automotive applications — This NXP  
Semiconductors product has been qualified for use in automotive  
applications. The product is not designed, authorized or warranted to be  
suitable for use in medical, military, aircraft, space or life support equipment,  
nor in applications where failure or malfunction of an NXP Semiconductors  
product can reasonably be expected to result in personal injury, death or  
severe property or environmental damage. NXP Semiconductors accepts no  
liability for inclusion and/or use of NXP Semiconductors products in such  
equipment or applications and therefore such inclusion and/or use is at the  
customer’s own risk.  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
Quick reference data — The Quick reference data is an extract of the  
product data given in the Limiting values and Characteristics sections of this  
document, and as such is not complete, exhaustive or legally binding.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Product specification — The information and data provided in a Product  
data sheet shall define the specification of the product as agreed between  
NXP Semiconductors and its customer, unless NXP Semiconductors and  
customer have explicitly agreed otherwise in writing. In no event however,  
shall an agreement be valid in which the NXP Semiconductors product is  
deemed to offer functions and qualities beyond those described in the  
Product data sheet.  
Customers are responsible for the design and operation of their applications  
and products using NXP Semiconductors products, and NXP Semiconductors  
accepts no liability for any assistance with applications or customer product  
design. It is customer’s sole responsibility to determine whether the NXP  
Semiconductors product is suitable and fit for the customer’s applications and  
products planned, as well as for the planned application and use of  
customer’s third party customer(s). Customers should provide appropriate  
design and operating safeguards to minimize the risks associated with their  
applications and products.  
9.3 Disclaimers  
Limited warranty and liability — Information in this document is believed to  
be accurate and reliable. However, NXP Semiconductors does not give any  
representations or warranties, expressed or implied, as to the accuracy or  
completeness of such information and shall have no liability for the  
consequences of use of such information.  
NXP Semiconductors does not accept any liability related to any default,  
damage, costs or problem which is based on any weakness or default in the  
customer’s applications or products, or the application or use by customer’s  
third party customer(s). Customer is responsible for doing all necessary  
testing for the customer’s applications and products using NXP  
Semiconductors products in order to avoid a default of the applications and  
the products or of the application or use by customer’s third party  
customer(s). NXP does not accept any liability in this respect.  
In no event shall NXP Semiconductors be liable for any indirect, incidental,  
punitive, special or consequential damages (including - without limitation - lost  
profits, lost savings, business interruption, costs related to the removal or  
replacement of any products or rework charges) whether or not such  
damages are based on tort (including negligence), warranty, breach of  
contract or any other legal theory.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) will cause permanent  
damage to the device. Limiting values are stress ratings only and (proper)  
operation of the device at these or any other conditions above those given in  
the Recommended operating conditions section (if present) or the  
Notwithstanding any damages that customer might incur for any reason  
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards  
customer for the products described herein shall be limited in accordance  
with the Terms and conditions of commercial sale of NXP Semiconductors.  
BUK7880-55  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 21 April 2011  
11 of 13  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
Characteristics sections of this document is not warranted. Constant or  
repeated exposure to limiting values will permanently and irreversibly affect  
the quality and reliability of the device.  
Export control — This document as well as the item(s) described herein may  
be subject to export control regulations. Export might require a prior  
authorization from national authorities.  
Terms and conditions of commercial sale — NXP Semiconductors  
products are sold subject to the general terms and conditions of commercial  
sale, as published at http://www.nxp.com/profile/terms, unless otherwise  
agreed in a valid written individual agreement. In case an individual  
agreement is concluded only the terms and conditions of the respective  
agreement shall apply. NXP Semiconductors hereby expressly objects to  
applying the customer’s general terms and conditions with regard to the  
purchase of NXP Semiconductors products by customer.  
9.4 Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
Adelante, Bitport, Bitsound, CoolFlux, CoReUse, DESFire, EZ-HV,  
FabKey, GreenChip, HiPerSmart, HITAG, I²C-bus logo, ICODE, I-CODE,  
ITEC, Labelution, MIFARE, MIFARE Plus, MIFARE Ultralight, MoReUse,  
QLPAK, Silicon Tuner, SiliconMAX, SmartXA, STARplug, TOPFET,  
TrenchMOS, TriMedia and UCODE — are trademarks of NXP B.V.  
No offer to sell or license — Nothing in this document may be interpreted or  
construed as an offer to sell products that is open for acceptance or the grant,  
conveyance or implication of any license under any copyrights, patents or  
other industrial or intellectual property rights.  
HD Radio and HD Radio logo — are trademarks of iBiquity Digital  
Corporation.  
10. Contact information  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
BUK7880-55  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 21 April 2011  
12 of 13  
BUK7880-55  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
11. Contents  
1
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . .1  
1.1  
1.2  
1.3  
1.4  
General description . . . . . . . . . . . . . . . . . . . . . .1  
Features and benefits. . . . . . . . . . . . . . . . . . . . .1  
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . .1  
Quick reference data . . . . . . . . . . . . . . . . . . . . .1  
2
3
4
5
6
7
8
Pinning information. . . . . . . . . . . . . . . . . . . . . . .2  
Ordering information. . . . . . . . . . . . . . . . . . . . . .2  
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . .2  
Thermal characteristics . . . . . . . . . . . . . . . . . . .4  
Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . .5  
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . .9  
Revision history. . . . . . . . . . . . . . . . . . . . . . . . .10  
9
Legal information. . . . . . . . . . . . . . . . . . . . . . . .11  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . .11  
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . .11  
Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . .11  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . .12  
9.1  
9.2  
9.3  
9.4  
10  
Contact information. . . . . . . . . . . . . . . . . . . . . .12  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2011.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 21 April 2011  
Document identifier: BUK7880-55  

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