BAW56W [NXP]

High-speed double diode; 高速双二极管
BAW56W
型号: BAW56W
厂家: NXP    NXP
描述:

High-speed double diode
高速双二极管

二极管
文件: 总12页 (文件大小:62K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DISCRETE SEMICONDUCTORS  
DATA SHEET  
book, halfpage  
BAW56W  
High-speed double diode  
1999 May 11  
Product specification  
Supersedes data of 1996 Sep 17  
Philips Semiconductors  
Product specification  
High-speed double diode  
BAW56W  
FEATURES  
DESCRIPTION  
PINNING  
PIN  
Very small plastic SMD package  
High switching speed: max. 4 ns  
The BAW56W consists of two  
high-speed switching diodes with  
common anodes, fabricated in planar  
technology, and encapsulated in the  
very small SOT323 plastic SMD  
package.  
DESCRIPTION  
1
2
3
cathode (k1)  
cathode (k2)  
common anode  
Continuous reverse voltage:  
max. 75 V  
Repetitive peak reverse voltage:  
max. 85 V  
Repetitive peak forward current:  
max. 500 mA.  
2
1
APPLICATIONS  
High-speed switching in e.g.  
2
1
surface mounted circuits.  
3
3
MAM092  
Top view  
Marking code: A1.  
Fig.1 Simplified outline (SOT323; SC-70) and symbol.  
LIMITING VALUES  
In accordance with the Absolute Maximum Rating System (IEC 134).  
SYMBOL  
Per diode  
PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VRRM  
VR  
repetitive peak reverse voltage  
continuous reverse voltage  
continuous forward current  
85  
V
V
75  
IF  
single diode loaded; note 1;  
see Fig.2  
150  
mA  
mA  
mA  
double diode loaded; note 1;  
see Fig.2  
130  
500  
IFRM  
IFSM  
repetitive peak forward current  
non-repetitive peak forward  
current  
square wave; Tj = 25 °C prior to  
surge; see Fig.4  
t = 1 µs  
4
A
t = 1 ms  
1
A
t = 1 s  
0.5  
200  
+150  
150  
A
Ptot  
Tstg  
Tj  
total power dissipation  
storage temperature  
junction temperature  
Tamb = 25 °C; note 1  
mW  
°C  
°C  
65  
Note  
1. Device mounted on an FR4 printed-circuit board.  
1999 May 11  
2
Philips Semiconductors  
Product specification  
High-speed double diode  
BAW56W  
ELECTRICAL CHARACTERISTICS  
Tj = 25 °C unless otherwise specified.  
SYMBOL  
PARAMETER  
CONDITIONS  
MAX.  
UNIT  
Per diode  
VF  
forward voltage  
see Fig.3  
IF = 1 mA  
715  
855  
1
mV  
mV  
V
IF = 10 mA  
IF = 50 mA  
IF = 150 mA  
1.25  
V
IR  
reverse current  
see Fig.5  
VR = 25 V  
30  
1
nA  
µA  
µA  
µA  
pF  
ns  
VR = 75 V  
VR = 25 V; Tj = 150 °C  
VR = 75 V; Tj = 150 °C  
f = 1 MHz; VR = 0; see Fig.6  
30  
50  
2
Cd  
trr  
diode capacitance  
reverse recovery time  
when switched from IF = 10 mA to  
IR = 10 mA; RL = 100 ;  
4
measured at IR = 1 mA; see Fig.7  
Vfr  
forward recovery voltage  
when switched from IF = 10 mA;  
tr = 20 ns; see Fig.8  
1.75  
V
THERMAL CHARACTERISTICS  
SYMBOL  
Rth j-tp  
PARAMETER  
thermal resistance from junction to tie-point  
thermal resistance from junction to ambient  
CONDITIONS  
VALUE  
UNIT  
300  
625  
K/W  
K/W  
Rth j-a  
note 1  
Note  
1. Device mounted on an FR4 printed-circuit board.  
1999 May 11  
3
Philips Semiconductors  
Product specification  
High-speed double diode  
BAW56W  
GRAPHICAL DATA  
MBG382  
MGA889  
300  
200  
handbook, halfpage  
I
F
(mA)  
single diode loaded  
I
F
(1)  
(2)  
(3)  
(mA)  
double diode loaded  
200  
100  
100  
0
0
0
1
2
V
(V)  
0
100  
200  
o
F
T
( C)  
amb  
(1) Tj = 150 °C; typical values.  
(2) Tj = 25 °C; typical values.  
Device mounted on an FR4 printed-circuit board.  
(3) Tj = 25 °C; maximum values.  
Fig.2 Maximum permissible continuous forward  
current as a function of ambient  
temperature.  
Fig.3 Forward current as a function of forward  
voltage.  
MBG704  
2
10  
I
FSM  
(A)  
10  
1
1  
10  
2
3
4
1
10  
10  
10  
10  
t
(µs)  
p
Based on square wave currents.  
Tj = 25 °C prior to surge.  
Fig.4 Maximum permissible non-repetitive peak forward current as a function of pulse duration.  
1999 May 11  
4
Philips Semiconductors  
Product specification  
High-speed double diode  
BAW56W  
MGA884  
MBH191  
5
2.5  
10  
handbook, halfpage  
C
d
I
R
(pF)  
2.0  
(nA)  
V
= 75 V  
R
4
3
10  
1.5  
1.0  
max  
75 V  
25 V  
10  
2
10  
0.5  
typ  
typ  
0
0
10  
5
10  
15  
20  
25  
0
100  
200  
o
( C)  
T
V
(V)  
j
R
f = 1 MHz; Tj = 25 °C.  
Fig.5 Reverse current as a function of junction  
temperature.  
Fig.6 Diode capacitance as a function of reverse  
voltage; typical values.  
1999 May 11  
5
Philips Semiconductors  
Product specification  
High-speed double diode  
BAW56W  
t
t
p
r
t
D.U.T.  
I
10%  
I
t
R
= 50  
F
F
rr  
S
SAMPLING  
t
OSCILLOSCOPE  
R = 50 Ω  
V = V  
I x R  
F S  
R
i
(1)  
90%  
V
R
MGA881  
input signal  
output signal  
(1) IR = 1 mA.  
Fig.7 Reverse recovery voltage test circuit and waveforms.  
I
1 kΩ  
450 Ω  
I
V
90%  
R
= 50 Ω  
S
OSCILLOSCOPE  
V
fr  
D.U.T.  
R = 50 Ω  
i
10%  
MGA882  
t
t
t
t
p
r
input  
signal  
output  
signal  
Fig.8 Forward recovery voltage test circuit and waveforms.  
6
1999 May 11  
Philips Semiconductors  
Product specification  
High-speed double diode  
BAW56W  
PACKAGE OUTLINE  
Plastic surface mounted package; 3 leads  
SOT323  
D
B
E
A
X
H
y
v M  
A
E
3
Q
A
A
1
c
1
2
L
p
e
1
b
p
w
M B  
e
detail X  
0
1
2 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
A
1
max  
A
UNIT  
b
c
D
E
e
e
H
E
L
Q
v
w
p
p
1
1.1  
0.8  
0.4  
0.3  
0.25  
0.10  
2.2  
1.8  
1.35  
1.15  
2.2  
2.0  
0.45  
0.15  
0.23  
0.13  
mm  
0.1  
1.3  
0.65  
0.2  
0.2  
REFERENCES  
JEDEC  
EUROPEAN  
PROJECTION  
OUTLINE  
VERSION  
ISSUE DATE  
IEC  
EIAJ  
SOT323  
SC-70  
97-02-28  
1999 May 11  
7
Philips Semiconductors  
Product specification  
High-speed double diode  
BAW56W  
DEFINITIONS  
Data Sheet Status  
Objective specification  
Preliminary specification  
Product specification  
This data sheet contains target or goal specifications for product development.  
This data sheet contains preliminary data; supplementary data may be published later.  
This data sheet contains final product specifications.  
Limiting values  
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or  
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation  
of the device at these or at any other conditions above those given in the Characteristics sections of the specification  
is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices, or systems where malfunction of these  
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for  
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such  
improper use or sale.  
1999 May 11  
8
Philips Semiconductors  
Product specification  
High-speed double diode  
BAW56W  
NOTES  
1999 May 11  
9
Philips Semiconductors  
Product specification  
High-speed double diode  
BAW56W  
NOTES  
1999 May 11  
10  
Philips Semiconductors  
Product specification  
High-speed double diode  
BAW56W  
NOTES  
1999 May 11  
11  
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© Philips Electronics N.V. 1999  
SCA64  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.  
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed  
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license  
under patent- or other industrial or intellectual property rights.  
Printed in The Netherlands  
115002/00/04/pp12  
Date of release: 1999 May 11  
Document order number: 9397 750 05949  

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