BF245C,112 [NXP]

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BF245C,112
型号: BF245C,112
厂家: NXP    NXP
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DISCRETE SEMICONDUCTORS  
DATA SHEET  
BF245A; BF245B; BF245C  
N-channel silicon field-effect  
transistors  
Product specification  
1996 Jul 30  
Supersedes data of April 1995  
NXP Semiconductors  
Product specification  
BF245A; BF245B;  
BF245C  
N-channel silicon field-effect transistors  
FEATURES  
PINNING  
Interchangeability of drain and source connections  
Frequencies up to 700 MHz.  
PIN  
1
SYMBOL  
DESCRIPTION  
d
s
g
drain  
source  
gate  
2
APPLICATIONS  
3
LF, HF and DC amplifiers.  
DESCRIPTION  
1
handbook, halfpage  
2
General purpose N-channel symmetrical junction  
3
d
field-effect transistors in a plastic TO-92 variant package.  
g
s
MAM257  
CAUTION  
The device is supplied in an antistatic package. The  
gate-source input must be protected against static  
discharge during transport or handling.  
Fig.1 Simplified outline (TO-92 variant)  
and symbol.  
QUICK REFERENCE DATA  
SYMBOL  
VDS  
PARAMETER  
CONDITIONS  
MIN.  
TYP.  
MAX.  
30  
UNIT  
drain-source voltage  
gate-source cut-off voltage  
gate-source voltage  
drain current  
V
VGSoff  
VGSO  
IDSS  
ID = 10 nA; VDS = 15 V  
open drain  
0.25  
8  
V
V
30  
VDS = 15 V; VGS = 0  
BF245A  
2
6.5  
15  
mA  
mA  
mA  
mW  
mS  
BF245B  
6
BF245C  
12  
25  
Ptot  
total power dissipation  
forward transfer admittance  
Tamb = 75 C  
300  
6.5  
yfs  
VDS = 15 V; VGS = 0;  
3
f = 1 kHz; Tamb = 25 C  
Crs  
reverse transfer capacitance  
VDS = 20 V; VGS = 1 V;  
f = 1 MHz; Tamb = 25 C  
1.1  
pF  
1996 Jul 30  
2
NXP Semiconductors  
Product specification  
N-channel silicon field-effect transistors  
BF245A; BF245B; BF245C  
LIMITING VALUES  
In accordance with the Absolute Maximum Rating System (IEC 134).  
SYMBOL  
VDS  
PARAMETER  
drain-source voltage  
CONDITIONS  
MIN.  
MAX.  
30  
UNIT  
V
V
V
VGDO  
VGSO  
ID  
gate-drain voltage  
gate-source voltage  
drain current  
open source  
30  
30  
25  
open drain  
mA  
mA  
mW  
mW  
C  
IG  
gate current  
10  
Ptot  
total power dissipation  
up to Tamb = 75 C;  
300  
300  
+150  
150  
up to Tamb = 90 C; note 1  
Tstg  
Tj  
storage temperature  
65  
operating junction temperature  
C  
Note  
1. Device mounted on a printed-circuit board, minimum lead length 3 mm, mounting pad for drain lead minimum  
10 mm 10 mm.  
THERMAL CHARACTERISTICS  
SYMBOL  
PARAMETER  
CONDITIONS  
in free air  
VALUE  
UNIT  
Rth j-a  
thermal resistance from junction to ambient  
thermal resistance from junction to ambient  
250  
200  
K/W  
K/W  
STATIC CHARACTERISTICS  
Tj = 25 C; unless otherwise specified.  
SYMBOL  
V(BR)GSS  
VGSoff  
PARAMETER  
CONDITIONS  
IG = 1 A; VDS = 0  
MIN.  
30  
MAX.  
UNIT  
gate-source breakdown voltage  
gate-source cut-off voltage  
gate-source voltage  
BF245A  
V
V
ID = 10 nA; VDS = 15 V  
0.25  
8.0  
VGS  
ID = 200 A; VDS = 15 V  
0.4  
1.6  
3.2  
2.2  
3.8  
7.5  
V
V
V
BF245B  
BF245C  
IDSS  
drain current  
VDS = 15 V; VGS = 0; note 1  
BF245A  
2
6.5  
15  
mA  
mA  
mA  
nA  
BF245B  
6
BF245C  
12  
25  
IGSS  
gate cut-off current  
VGS = 20 V; VDS = 0  
5  
V
GS = 20 V; VDS = 0; Tj = 125 C  
0.5  
A  
Note  
1. Measured under pulse conditions: tp = 300 s;   0.02.  
1996 Jul 30  
3
 
 
NXP Semiconductors  
Product specification  
N-channel silicon field-effect transistors  
BF245A; BF245B; BF245C  
DYNAMIC CHARACTERISTICS  
Common source; Tamb = 25 C; unless otherwise specified.  
SYMBOL  
Cis  
PARAMETER  
input capacitance  
reverse transfer capacitance VDS = 20 V; VGS = 1 V; f = 1 MHz  
CONDITIONS  
MIN. TYP. MAX. UNIT  
VDS = 20 V; VGS = 1 V; f = 1 MHz  
3
4
pF  
Crs  
Cos  
gis  
1.1  
1.6  
250  
40  
pF  
output capacitance  
VDS = 20 V; VGS = 1 V; f = 1 MHz  
VDS = 15 V; VGS = 0; f = 200 MHz  
VDS = 15 V; VGS = 0; f = 200 MHz  
VDS = 15 V; VGS = 0; f = 1 kHz  
VDS = 15 V; VGS = 0; f = 200 MHz  
VDS = 15 V; VGS = 0; f = 200 MHz  
VDS = 15 V; VGS = 0; f = 1 kHz  
pF  
input conductance  
S  
gos  
yfs  
output conductance  
forward transfer admittance  
S  
6.5  
mS  
mS  
mS  
S  
6
yrs  
yos  
fgfs  
reverse transfer admittance  
output admittance  
1.4  
25  
700  
cut-off frequency  
VDS = 15 V; VGS = 0; gfs = 0.7 of its  
value at 1 kHz  
MHz  
F
noise figure  
VDS = 15 V; VGS = 0; f = 100 MHz;  
1.5  
dB  
RG = 1 k(common source);  
input tuned to minimum noise  
MGE785  
MGE789  
6
10  
handbook, halfpage  
handbook, halfpage  
I
D
I
GSS  
(mA)  
5
(nA)  
1  
4
3
2
1
0
typ  
1  
10  
2  
10  
3  
10  
0
50  
100  
150  
4  
2  
0
V
(V)  
GS  
T (°C)  
j
VDS = 0; VGS = 20 V.  
VDS = 15 V; Tj = 25 C.  
Fig.2 Gate leakage current as a function of  
junction temperature; typical values.  
Fig.3 Transfer characteristics for BF245A;  
typical values.  
1996 Jul 30  
4
NXP Semiconductors  
Product specification  
N-channel silicon field-effect transistors  
BF245A; BF245B; BF245C  
MBH555  
MGE787  
6
15  
handbook, halfpage  
handbook, halfpage  
I
D
(mA)  
5
I
D
(mA)  
V
= 0 V  
GS  
4
3
2
1
0
10  
0.5 V  
5
1 V  
1.5 V  
0
4  
0
10  
20  
2  
0
V
(V)  
V
(V)  
DS  
GS  
VDS = 15 V; Tj = 25 C.  
VDS = 15 V; Tj = 25 C.  
Fig.4 OutputcharacteristicsforBF245A;  
typical values.  
Fig.5 Transfer characteristics for BF245B;  
typical values.  
MBH553  
MGE788  
15  
30  
handbook, halfpage  
handbook, halfpage  
I
I
D
D
(mA)  
(mA)  
V
= 0 V  
GS  
10  
20  
0.5 V  
1 V  
5
0
10  
1.5 V  
2 V  
2.5 V  
0
10  
0
10  
20  
5  
0
V
(V)  
V
(V)  
GS  
DS  
VDS = 15 V; Tj = 25 C.  
VDS = 15 V; Tj = 25 C.  
Fig.6 Output characteristics for BF245B;  
typical values.  
Fig.7 Transfer characteristics for BF245C;  
typical values.  
1996 Jul 30  
5
NXP Semiconductors  
Product specification  
N-channel silicon field-effect transistors  
BF245A; BF245B; BF245C  
MBH554  
MGE775  
30  
4
handbook, halfpage  
handbook, halfpage  
I
D
I
D
(mA)  
(mA)  
3
V
= 0 V  
GS  
20  
V
= 0 V  
GS  
0.5 V  
2
1
1 V  
2 V  
10  
1 V  
3 V  
4 V  
1.5 V  
0
0
0
0
10  
20  
50  
100  
150  
V
(V)  
DS  
T (°C)  
j
VDS = 15 V; Tj = 25 C.  
VDS = 15 V.  
Fig.8 Output characteristics for BF245C;  
typical values.  
Fig.9 Drain current as a function of junction  
temperature; typical values for BF245A.  
MGE776  
MGE779  
20  
15  
handbook, halfpage  
handbook, halfpage  
I
D
I
(mA)  
D
(mA)  
16  
10  
V
= 0 V  
GS  
12  
8
V
= 0 V  
GS  
5
0
2 V  
4 V  
1 V  
2 V  
4
0
0
50  
100  
150  
0
50  
100  
150  
T (°C)  
T (°C)  
j
j
VDS = 15 V.  
VDS = 15 V.  
Fig.10 Drain current as a function of junction  
temperature; typical values for BF245B.  
Fig.11 Drain current as a function of junction  
temperature; typical values for BF245C.  
1996 Jul 30  
6
NXP Semiconductors  
Product specification  
N-channel silicon field-effect transistors  
BF245A; BF245B; BF245C  
MGE780  
MGE778  
3
2
4
10  
10  
10  
10  
handbook, halfpage  
handbook, halfpage  
g
b
b
C
is  
is  
rs  
rs  
(μA/V)  
(mA/V)  
(μA/V)  
(pF)  
g
b
is  
C
rs  
2
3
10  
10  
10  
1
is  
b
rs  
2
1  
10  
1
10  
10  
2  
1  
10  
3
1
10  
10  
10  
2
3
2
10  
10  
10  
10  
10  
f (MHz)  
f (MHz)  
VDS = 15 V; VGS = 0; Tamb = 25 C.  
VDS = 15 V; VGS = 0; Tamb = 25 C.  
Fig.13 Common source reverse admittance as a  
function of frequency; typical values.  
Fig.12 Input admittance; typical values.  
MGE783  
MGE782  
3
10  
10  
10  
handbook, halfpage  
handbook, halfpage  
g
,
fs  
b  
(mA/V)  
fs  
g
b
os  
os  
(mA/V)  
(μA/V)  
8
6
4
b
g
os  
2
10  
1
g
fs  
os  
1  
2  
10  
10  
2
0
b  
fs  
1
10  
2
3
2
3
10  
10  
10  
10  
10  
10  
f (MHz)  
f (MHz)  
VDS = 15 V; VGS = 0; Tamb = 25 C.  
VDS = 15 V; VGS = 0; Tamb = 25 C.  
Fig.14 Common-source forward transfer admittance  
as a function of frequency; typical values.  
Fig.15 Common-source output admittance as a  
function of frequency; typical values.  
1996 Jul 30  
7
NXP Semiconductors  
Product specification  
N-channel silicon field-effect transistors  
BF245A; BF245B; BF245C  
MGE777  
MGE781  
6
1.5  
handbook, halfpage  
handbook, halfpage  
C
is  
(pF)  
C
rs  
(pF)  
4
typ  
typ  
1
2
0
0.5  
0
2  
4  
6  
8  
V
10  
(V)  
0
2  
4  
6  
8  
V
10  
(V)  
GS  
GS  
VDS = 20 V; f = 1 MHz; Tamb = 25 C.  
VDS = 20 V; f = 1 MHz; Tamb = 25 C.  
Fig.16 Input capacitance as a function of  
gate-source voltage; typical values.  
Fig.17 Reverse transfer capacitance as a function  
of gate-source voltage; typical values.  
MGE791  
MGE784  
8
10  
handbook, halfpage  
handbook, halfpage  
V
GSoff  
|y  
|
fs  
at I = 10 nA  
D
(mA/V)  
(V)  
BF245C  
8  
BF245B  
6
BF245A  
6  
4  
4
2
0
BF245C  
2  
BF245B  
BF245A  
0  
20  
0
5
10  
15  
0
10  
20  
30  
I
(mA)  
D
I
at V  
= 0 (mA)  
GS  
DSS  
VDS = 15 V; f = 1 kHz; Tamb = 25 C.  
VDS = 15 V; Tj = 25 C.  
Fig.18 Forward transfer admittance as a function of  
drain current; typical values.  
Fig.19 Gate-source cut-off voltage as a function of  
drain current; typical values.  
1996 Jul 30  
8
NXP Semiconductors  
Product specification  
N-channel silicon field-effect transistors  
BF245A; BF245B; BF245C  
MGE790  
MGE786  
3
3
10  
handbook, halfpage  
handbook, halfpage  
R
DSon  
F
(dB)  
(kΩ)  
2
10  
2
1
typ  
10  
BF245A  
1
BF245B  
BF245C  
1  
0
1
10  
2
3
10  
10  
10  
0
1  
2  
3  
4  
f (MHz)  
V
(V)  
GS  
VDS = 0; f = 1 kHz; Tamb = 25 C.  
VDS = 15 V; VGS = 0; RG = 1 k; Tamb = 25 C.  
Input tuned to minimum noise.  
Fig.20 Drain-source on-state resistance as a  
function of gate-source voltage;  
typical values.  
Fig.21 Noise figure as a function of frequency;  
typical values.  
1996 Jul 30  
9
NXP Semiconductors  
Product specification  
N-channel silicon field-effect transistors  
BF245A; BF245B; BF245C  
PACKAGE OUTLINE  
Plastic single-ended leaded (through hole) package; 3 leads (on-circle)  
SOT54 variant  
c
e
1
L
2
E
d
A
L
b
1
2
e
1
e
D
3
b
1
L
1
0
2.5  
5 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
(1)  
L
L
2
1
UNIT  
A
b
b
c
D
d
E
e
e
L
1
1
max  
max  
5.2  
5.0  
0.48  
0.40  
0.66  
0.55  
0.45  
0.38  
4.8  
4.4  
1.7  
1.4  
4.2  
3.6  
14.5  
12.7  
mm  
2.54  
1.27  
2.5  
2.5  
Note  
1. Terminal dimensions within this zone are uncontrolled to allow for flow of plastic and terminal irregularities.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
JEITA  
04-06-28  
05-01-10  
SOT54 variant  
1996 Jul 30  
10  
NXP Semiconductors  
Product specification  
N-channel silicon field-effect transistors  
BF245A; BF245B; BF245C  
DATA SHEET STATUS  
DOCUMENT  
STATUS(1)  
PRODUCT  
STATUS(2)  
DEFINITION  
Objective data sheet  
Development  
This document contains data from the objective specification for product  
development.  
Preliminary data sheet  
Product data sheet  
Qualification  
Production  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Notes  
1. Please consult the most recently issued document before initiating or completing a design.  
2. The product status of device(s) described in this document may have changed since this document was published  
and may differ in case of multiple devices. The latest product status information is available on the Internet at  
URL http://www.nxp.com.  
DEFINITIONS  
Right to make changes NXP Semiconductors  
reserves the right to make changes to information  
published in this document, including without limitation  
specifications and product descriptions, at any time and  
without notice. This document supersedes and replaces all  
information supplied prior to the publication hereof.  
Product specification The information and data  
provided in a Product data sheet shall define the  
specification of the product as agreed between NXP  
Semiconductors and its customer, unless NXP  
Semiconductors and customer have explicitly agreed  
otherwise in writing. In no event however, shall an  
agreement be valid in which the NXP Semiconductors  
product is deemed to offer functions and qualities beyond  
those described in the Product data sheet.  
Suitability for use NXP Semiconductors products are  
not designed, authorized or warranted to be suitable for  
use in life support, life-critical or safety-critical systems or  
equipment, nor in applications where failure or malfunction  
of an NXP Semiconductors product can reasonably be  
expected to result in personal injury, death or severe  
property or environmental damage. NXP Semiconductors  
accepts no liability for inclusion and/or use of NXP  
Semiconductors products in such equipment or  
applications and therefore such inclusion and/or use is at  
the customer’s own risk.  
DISCLAIMERS  
Limited warranty and liability Information in this  
document is believed to be accurate and reliable.  
However, NXP Semiconductors does not give any  
representations or warranties, expressed or implied, as to  
the accuracy or completeness of such information and  
shall have no liability for the consequences of use of such  
information.  
Applications Applications that are described herein for  
any of these products are for illustrative purposes only.  
NXP Semiconductors makes no representation or  
warranty that such applications will be suitable for the  
specified use without further testing or modification.  
In no event shall NXP Semiconductors be liable for any  
indirect, incidental, punitive, special or consequential  
damages (including - without limitation - lost profits, lost  
savings, business interruption, costs related to the  
removal or replacement of any products or rework  
charges) whether or not such damages are based on tort  
(including negligence), warranty, breach of contract or any  
other legal theory.  
Customers are responsible for the design and operation of  
their applications and products using NXP  
Semiconductors products, and NXP Semiconductors  
accepts no liability for any assistance with applications or  
customer product design. It is customer’s sole  
responsibility to determine whether the NXP  
Notwithstanding any damages that customer might incur  
for any reason whatsoever, NXP Semiconductors’  
aggregate and cumulative liability towards customer for  
the products described herein shall be limited in  
accordance with the Terms and conditions of commercial  
sale of NXP Semiconductors.  
Semiconductors product is suitable and fit for the  
customer’s applications and products planned, as well as  
for the planned application and use of customer’s third  
party customer(s). Customers should provide appropriate  
design and operating safeguards to minimize the risks  
associated with their applications and products.  
1996 Jul 30  
11  
 
 
NXP Semiconductors  
Product specification  
N-channel silicon field-effect transistors  
BF245A; BF245B; BF245C  
NXP Semiconductors does not accept any liability related  
to any default, damage, costs or problem which is based  
on any weakness or default in the customer’s applications  
or products, or the application or use by customer’s third  
party customer(s). Customer is responsible for doing all  
necessary testing for the customer’s applications and  
products using NXP Semiconductors products in order to  
avoid a default of the applications and the products or of  
the application or use by customer’s third party  
customer(s). NXP does not accept any liability in this  
respect.  
Export control This document as well as the item(s)  
described herein may be subject to export control  
regulations. Export might require a prior authorization from  
national authorities.  
Quick reference data The Quick reference data is an  
extract of the product data given in the Limiting values and  
Characteristics sections of this document, and as such is  
not complete, exhaustive or legally binding.  
Non-automotive qualified products Unless this data  
sheet expressly states that this specific NXP  
Semiconductors product is automotive qualified, the  
product is not suitable for automotive use. It is neither  
qualified nor tested in accordance with automotive testing  
or application requirements. NXP Semiconductors accepts  
no liability for inclusion and/or use of non-automotive  
qualified products in automotive equipment or  
applications.  
Limiting values Stress above one or more limiting  
values (as defined in the Absolute Maximum Ratings  
System of IEC 60134) will cause permanent damage to  
the device. Limiting values are stress ratings only and  
(proper) operation of the device at these or any other  
conditions above those given in the Recommended  
operating conditions section (if present) or the  
Characteristics sections of this document is not warranted.  
Constant or repeated exposure to limiting values will  
permanently and irreversibly affect the quality and  
reliability of the device.  
In the event that customer uses the product for design-in  
and use in automotive applications to automotive  
specifications and standards, customer (a) shall use the  
product without NXP Semiconductors’ warranty of the  
product for such automotive applications, use and  
specifications, and (b) whenever customer uses the  
product for automotive applications beyond NXP  
Semiconductors’ specifications such use shall be solely at  
customer’s own risk, and (c) customer fully indemnifies  
NXP Semiconductors for any liability, damages or failed  
product claims resulting from customer design and use of  
the product for automotive applications beyond NXP  
Semiconductors’ standard warranty and NXP  
Terms and conditions of commercial sale NXP  
Semiconductors products are sold subject to the general  
terms and conditions of commercial sale, as published at  
http://www.nxp.com/profile/terms, unless otherwise  
agreed in a valid written individual agreement. In case an  
individual agreement is concluded only the terms and  
conditions of the respective agreement shall apply. NXP  
Semiconductors hereby expressly objects to applying the  
customer’s general terms and conditions with regard to the  
purchase of NXP Semiconductors products by customer.  
Semiconductors’ product specifications.  
No offer to sell or license Nothing in this document  
may be interpreted or construed as an offer to sell products  
that is open for acceptance or the grant, conveyance or  
implication of any license under any copyrights, patents or  
other industrial or intellectual property rights.  
1996 Jul 30  
12  
NXP Semiconductors  
provides High Performance Mixed Signal and Standard Product  
solutions that leverage its leading RF, Analog, Power Management,  
Interface, Security and Digital Processing expertise  
Customer notification  
This data sheet was changed to reflect the new company name NXP Semiconductors, including new legal  
definitions and disclaimers. No changes were made to the technical content, except for package outline  
drawings which were updated to the latest version.  
Contact information  
For additional information please visit: http://www.nxp.com  
For sales offices addresses send e-mail to: salesaddresses@nxp.com  
© NXP B.V. 2010  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.  
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed  
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license  
under patent- or other industrial or intellectual property rights.  
Printed in The Netherlands  
R77/02/pp13  
Date of release:1996 Jul 30  

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TI

BF245C/D10Z{L34Z}

N-CHANNEL, Si, SMALL SIGNAL, JFET, TO-92
TI

BF245C/D11Z

N-CHANNEL, Si, SMALL SIGNAL, JFET, TO-92
TI

BF245C/D11Z(L34Z)

Small Signal Field-Effect Transistor, 1-Element, N-Channel, Silicon, Junction FET, TO-92
TI

BF245C/D11Z{L34Z}

N-CHANNEL, Si, SMALL SIGNAL, JFET, TO-92
TI

BF245C/D26Z

N-CHANNEL, Si, SMALL SIGNAL, JFET, TO-92
TI