BLF7G15LS-200,112 [NXP]

BLF7G15LS-200;
BLF7G15LS-200,112
型号: BLF7G15LS-200,112
厂家: NXP    NXP
描述:

BLF7G15LS-200

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中文:  中文翻译
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BLF7G15LS-200  
Power LDMOS transistor  
Rev. 3 — 22 July 2011  
Product data sheet  
1. Product profile  
1.1 General description  
200 W LDMOS power transistor for base station applications at frequencies from  
1450 MHz to 1550 MHz.  
Table 1.  
Typical performance  
Typical RF performance at Tcase = 25 C in a common source class-AB production test circuit.  
Mode of operation  
f
IDq  
VDS  
(V)  
28  
PL(AV)  
(W)  
Gp  
D  
(%) (dBc)  
29  
35[1]  
ACPR  
(MHz)  
(mA)  
1600  
(dB)  
19.5  
2-carrier W-CDMA  
1476 to 1511  
50  
[1] Test signal: 3GPP; test model 1; 64 DPCH; PAR = 7.5 dB at 0.01 % probability on CCDF per carrier.  
Carrier spacing 5 MHz.  
1.2 Features and benefits  
Excellent ruggedness  
High efficiency  
Low Rth providing excellent thermal stability  
Designed for broadband operation (1450 MHz to 1550 MHz)  
Lower output capacitance for improved performance in Doherty applications  
Designed for low memory effects providing excellent pre-distortability  
Internally matched for ease of use  
Integrated ESD protection  
Compliant to Directive 2002/95/EC, regarding Restriction of Hazardous Substances  
(RoHS)  
1.3 Applications  
RF power amplifiers for W-CDMA base stations and multi carrier applications in the  
1450 MHz to 1550 MHz frequency range  
 
 
 
 
 
BLF7G15LS-200  
NXP Semiconductors  
Power LDMOS transistor  
2. Pinning information  
Table 2.  
Pinning  
Pin  
1
Description  
drain  
Simplified outline  
Symbol  
1
2
1
3
2
gate  
3
[1]  
3
source  
2
sym112  
[1] Connected to flange.  
3. Ordering information  
Table 3.  
Ordering information  
Type number  
Package  
Name Description  
Version  
SOT502B  
BLF7G15LS-200  
-
earless flanged LDMOST ceramic package; 2 leads  
4. Limiting values  
Table 4.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
VDS  
VGS  
ID  
Parameter  
Conditions  
Min  
Max  
65  
Unit  
V
drain-source voltage  
gate-source voltage  
drain current  
-
0.5 +13  
V
-
56  
A
Tstg  
Tj  
storage temperature  
junction temperature  
65  
+150 C  
200 C  
-
5. Thermal characteristics  
Table 5.  
Thermal characteristics  
Symbol Parameter  
Conditions  
Typ Unit  
Rth(j-c)  
thermal resistance from junction to case  
Tcase = 80 C; PL = 50 W;  
0.30 K/W  
VDS = 28 V; IDq = 1600 mA  
6. Characteristics  
Table 6.  
Characteristics  
Tj = 25 C unless otherwise specified.  
Symbol Parameter  
V(BR)DSS drain-source breakdown voltage VGS = 0 V; ID = 2.7 mA  
Conditions  
Min Typ  
Max Unit  
65  
VDS = 10 V; ID = 270 mA 1.5  
VGS = 0 V; VDS = 28 V  
67  
1.9  
-
-
V
VGS(th)  
IDSS  
gate-source threshold voltage  
drain leakage current  
2.3  
4.2  
V
-
A  
BLF7G15LS-200  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 22 July 2011  
2 of 11  
 
 
 
 
 
 
BLF7G15LS-200  
NXP Semiconductors  
Power LDMOS transistor  
Table 6.  
Characteristics …continued  
Tj = 25 C unless otherwise specified.  
Symbol Parameter  
Conditions  
Min Typ  
Max Unit  
IDSX  
drain cut-off current  
VGS = VGS(th) + 3.75 V;  
VDS = 10 V  
42  
49  
-
A
IGSS  
gfs  
gate leakage current  
VGS = 11 V; VDS = 0 V  
VDS = 10 V; ID = 13.5 A  
-
-
420  
nA  
S
forward transconductance  
17  
19.3 19.7  
RDS(on) drain-source on-state resistance VGS = VGS(th) + 3.75 V;  
ID = 9.45 A  
0.012 0.048 0.093   
7. Test information  
Table 7.  
Functional test information  
Mode of operation: 2-carrier W-CDMA; PAR = 7.5 dB at 0.01 % probability on the CCDF; 3GPP test  
model 1; 64 DPCH; f1 = 1473.5 MHz; f2 = 1478.5 MHz; f3 = 1508.5 MHz; f4 = 1513.5 MHz;  
RF performance at VDS = 28 V; IDq = 1600 mA; Tcase = 25 C; unless otherwise specified; in a  
class-AB production test circuit.  
Symbol  
PL(AV)  
Gp  
Parameter  
Conditions  
Min Typ  
50  
18.3 19.5  
Max Unit  
average output power  
power gain  
-
-
-
W
PL(AV) = 50 W  
PL(AV) = 50 W  
PL(AV) = 50 W  
PL(AV) = 50 W  
dB  
RLin  
input return loss  
drain efficiency  
-
8  
5.5 dB  
D  
27  
-
29  
-
%
ACPR  
adjacent channel power ratio  
35  
33  
dBc  
Table 8.  
PAR performance  
Mode of operation: 1-carrier W-CDMA; PAR = 7.5 dB at 0.01 % probability on the CCDF; 3GPP test  
model 1; 64 DPCH; f1 = 1511 MHz; RF performance at VDS = 28 V; IDq = 1600 mA; Tcase = 25 C;  
unless otherwise specified; in a class-AB production test circuit.  
Symbol Parameter  
PARO output peak-to-average ratio  
Conditions  
Min Typ Max Unit  
PL(AV) = 100 W at 0.01 %  
probability on CCDF  
4.2 4.6  
-
dB  
7.1 Ruggedness in class-AB operation  
The BLF7G15LS-200 is capable of withstanding a load mismatch corresponding to  
VSWR = 10 : 1 through all phases under the following conditions: VDS = 28 V;  
IDq = 1600 mA; PL = 150 W (CW); f = 1476 MHz to 1511 MHz.  
7.2 Impedance information  
Table 9.  
Dq = 1600 mA; main transistor VDS = 28 V.  
ZS and ZL defined in Figure 1.  
Typical impedance information  
I
f
ZS  
ZL  
(MHz)  
()  
()  
1410  
1480  
1560  
0.74 j1.52  
0.65 j1.7  
0.61 j1.74  
3.5 j1.7  
4.0 j0.74  
3.8 + j0.5  
BLF7G15LS-200  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 22 July 2011  
3 of 11  
 
 
 
BLF7G15LS-200  
NXP Semiconductors  
Power LDMOS transistor  
drain  
Z
L
gate  
Z
S
001aaf059  
Fig 1. Definition of transistor impedance  
7.3 Graphs  
014aab253  
22  
60  
(1)  
(2)  
Gain  
(dB)  
η
(%)  
16  
40  
20  
10  
4
0
0
100  
200  
300  
P
(W)  
L
VDS = 28 V; IDq = 1600 mA; f = 1511 MHz.  
(1) gain  
(2) efficiency  
Fig 2. One-tone CW power gain and drain efficiency as function of load power;  
typical values  
BLF7G15LS-200  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 22 July 2011  
4 of 11  
 
BLF7G15LS-200  
NXP Semiconductors  
Power LDMOS transistor  
014aab254  
014aab255  
22  
60  
0
(1)  
IMD  
(dBc)  
Gain  
(dB)  
η
(%)  
20  
(1)  
(2)  
16  
40  
(2)  
40  
60  
80  
(3)  
10  
20  
4
0
0
50  
100  
150  
0
50  
100  
150  
P
L(AV)  
(W)  
P
(W)  
L(AV)  
VDS = 28 V; IDq = 1600 mA; f = 1511 MHz;  
tone spacing 0.1 MHz.  
VDS = 28 V; IDq = 1600 mA; f = 1511 MHz;  
tone spacing 0.1 MHz.  
(1) gain  
(2) efficiency  
(1) IMD3  
(2) IMD5  
(3) IMD7  
Fig 3. Two-tone CW power gain and drain efficiency  
as function of average load power;  
typical values  
Fig 4. Two-tone intermodulation distortion as a  
function of average load power; typical values  
014aab256  
014aab257  
21  
50  
15  
Gain  
(dB)  
η
(%)  
ACPR  
(dBc)  
20  
40  
25  
35  
45  
(1)  
(2)  
19  
18  
17  
30  
20  
10  
0
50  
100  
150  
0
50  
100  
150  
P
(W)  
P (W)  
L
L
VDS = 28 V; IDq = 1600 mA; f = 1511 MHz;  
carrier spacing 5 MHz.  
VDS = 28 V; IDq = 1600 mA; f = 1511 MHz;  
carrier spacing 5 MHz.  
(1) gain  
(2) efficiency  
Fig 5. 2-carrier W-CDMA power gain and drain  
efficiency as function of load power;  
typical values  
Fig 6. 2-carrier W-CDMA adjacent channel power  
ratio as function of load power 5 MHz  
frequency offset; typical values  
BLF7G15LS-200  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 22 July 2011  
5 of 11  
BLF7G15LS-200  
NXP Semiconductors  
Power LDMOS transistor  
7.4 Test circuit  
BLF7G15L(S)-200  
Input Circuit  
RO4350 30 Mil  
NXP  
C8  
R1  
C3  
+
C11  
(1)  
C5  
C10  
BLF7G15L-200  
Output Circuit  
RO4350 30 Mil  
NXP  
C2  
C1  
BLF7G15L-200  
Output Circuit  
RO4350 30 Mil  
NXP  
C7  
BLF7G15L(S)-200  
Input Circuit  
C6  
RO4350 30 Mil  
NXP  
C9  
C4  
014aab258  
(1) C5 should be mounted under C11.  
Rogers RO4350 Printed-Circuit Board (PCB) with r = 3.48 and thickness = 0.765 mm (30 mil).  
See Table 10 for list of components. The drawing is not to scale.  
The vias can be as a reference to place components.  
The above layout shows the test circuit used to measure devices in production. The RF Power and Bas-Station group can  
provide a more appropriate application demonstration for specific customer needs.  
Fig 7. Component layout  
Table 10. List of components  
See Figure 7 for test circuit.  
Component  
C1  
Description  
Value  
Remarks  
ATC 800B  
ATC 800A  
Murata  
multi layer ceramic chip capacitor  
multi layer ceramic chip capacitor  
multi layer ceramic chip capacitor  
multi layer ceramic chip capacitor  
electrolytic capacitor  
10 pF  
C2, C7, C10  
C3, C4, C5, C6  
C8, C9  
47 pF  
10 F  
36 pF  
ATC 800B  
C11  
470 F; 63 V  
15   
R1  
chip resistor  
Philips 1206  
BLF7G15LS-200  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 22 July 2011  
6 of 11  
 
 
 
BLF7G15LS-200  
NXP Semiconductors  
Power LDMOS transistor  
8. Package outline  
Earless flanged LDMOST ceramic package; 2 leads  
SOT502B  
D
A
F
3
D
D
1
c
U
1
1
L
E
E
H
U
1
2
2
w
5
b
M
M
D
Q
2
0
10 mm  
scale  
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)  
c
A
b
D
D
E
E
F
H
L
Q
U
U
w
2
UNIT  
1
1
1
2
12.83  
12.57  
1.70  
1.45  
4.72  
3.43  
20.02 19.96 9.50  
19.61 19.66 9.30  
9.53  
9.25  
1.14 19.94 5.33  
0.89 18.92 4.32  
20.70 9.91  
20.45 9.65  
0.15  
0.08  
0.25  
mm  
0.505  
0.495  
0.067  
0.057  
0.186  
0.135  
0.788 0.786 0.374 0.375 0.045 0.785 0.210  
0.772 0.774 0.366 0.364 0.035 0.745 0.170  
0.815 0.390  
0.805 0.380  
0.006  
0.003  
0.010  
inches  
REFERENCES  
EUROPEAN  
PROJECTION  
OUTLINE  
VERSION  
ISSUE DATE  
IEC  
JEDEC  
JEITA  
03-01-10  
07-05-09  
SOT502B  
Fig 8. Package outline SOT502B  
BLF7G15LS-200  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 22 July 2011  
7 of 11  
 
BLF7G15LS-200  
NXP Semiconductors  
Power LDMOS transistor  
9. Abbreviations  
Table 11. Abbreviations  
Acronym  
3GPP  
CCDF  
CW  
Description  
Third Generation Partnership Project  
Complementary Cumulative Distribution Function  
Continuous Wave  
DPCH  
ESD  
Dedicated Physical CHannel  
ElectroStatic Discharge  
LDMOS  
LDMOST  
PAR  
Laterally Diffused Metal Oxide Semiconductor  
Laterally Diffused Metal Oxide Semiconductor Transistor  
Peak-to-Average power Ratio  
RF  
Radio Frequency  
VSWR  
W-CDMA  
Voltage Standing Wave Ratio  
Wideband Code Division Multiple Access  
10. Revision history  
Table 12. Revision history  
Document ID  
Release date  
20110722  
Data sheet status  
Change notice  
Supersedes  
BLF7G15LS-200 v.3  
Modifications:  
Product data sheet  
-
BLF7G15LS-200 v.2  
The status of this data sheet has been changed to Product data sheet  
BLF7G15LS-200 v.2  
BLF7G15LS-200 v.1  
20110301  
Preliminary data sheet  
-
BLF7G15LS-200 v.1  
20100913  
Preliminary data sheet  
-
-
BLF7G15LS-200  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 22 July 2011  
8 of 11  
 
 
BLF7G15LS-200  
NXP Semiconductors  
Power LDMOS transistor  
11. Legal information  
11.1 Data sheet status  
Document status[1][2]  
Product status[3]  
Development  
Definition  
Objective [short] data sheet  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL http://www.nxp.com.  
malfunction of an NXP Semiconductors product can reasonably be expected  
11.2 Definitions  
to result in personal injury, death or severe property or environmental  
damage. NXP Semiconductors accepts no liability for inclusion and/or use of  
NXP Semiconductors products in such equipment or applications and  
therefore such inclusion and/or use is at the customer’s own risk.  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
Customers are responsible for the design and operation of their applications  
and products using NXP Semiconductors products, and NXP Semiconductors  
accepts no liability for any assistance with applications or customer product  
design. It is customer’s sole responsibility to determine whether the NXP  
Semiconductors product is suitable and fit for the customer’s applications and  
products planned, as well as for the planned application and use of  
customer’s third party customer(s). Customers should provide appropriate  
design and operating safeguards to minimize the risks associated with their  
applications and products.  
Product specification — The information and data provided in a Product  
data sheet shall define the specification of the product as agreed between  
NXP Semiconductors and its customer, unless NXP Semiconductors and  
customer have explicitly agreed otherwise in writing. In no event however,  
shall an agreement be valid in which the NXP Semiconductors product is  
deemed to offer functions and qualities beyond those described in the  
Product data sheet.  
NXP Semiconductors does not accept any liability related to any default,  
damage, costs or problem which is based on any weakness or default in the  
customer’s applications or products, or the application or use by customer’s  
third party customer(s). Customer is responsible for doing all necessary  
testing for the customer’s applications and products using NXP  
Semiconductors products in order to avoid a default of the applications and  
the products or of the application or use by customer’s third party  
customer(s). NXP does not accept any liability in this respect.  
11.3 Disclaimers  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) will cause permanent  
damage to the device. Limiting values are stress ratings only and (proper)  
operation of the device at these or any other conditions above those given in  
the Recommended operating conditions section (if present) or the  
Characteristics sections of this document is not warranted. Constant or  
repeated exposure to limiting values will permanently and irreversibly affect  
the quality and reliability of the device.  
Limited warranty and liability — Information in this document is believed to  
be accurate and reliable. However, NXP Semiconductors does not give any  
representations or warranties, expressed or implied, as to the accuracy or  
completeness of such information and shall have no liability for the  
consequences of use of such information.  
In no event shall NXP Semiconductors be liable for any indirect, incidental,  
punitive, special or consequential damages (including - without limitation - lost  
profits, lost savings, business interruption, costs related to the removal or  
replacement of any products or rework charges) whether or not such  
damages are based on tort (including negligence), warranty, breach of  
contract or any other legal theory.  
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products are sold subject to the general terms and conditions of commercial  
sale, as published at http://www.nxp.com/profile/terms, unless otherwise  
agreed in a valid written individual agreement. In case an individual  
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applying the customer’s general terms and conditions with regard to the  
purchase of NXP Semiconductors products by customer.  
Notwithstanding any damages that customer might incur for any reason  
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards  
customer for the products described herein shall be limited in accordance  
with the Terms and conditions of commercial sale of NXP Semiconductors.  
Right to make changes — NXP Semiconductors reserves the right to make  
changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
No offer to sell or license — Nothing in this document may be interpreted or  
construed as an offer to sell products that is open for acceptance or the grant,  
conveyance or implication of any license under any copyrights, patents or  
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Export control — This document as well as the item(s) described herein  
may be subject to export control regulations. Export might require a prior  
authorization from national authorities.  
Suitability for use — NXP Semiconductors products are not designed,  
authorized or warranted to be suitable for use in life support, life-critical or  
safety-critical systems or equipment, nor in applications where failure or  
BLF7G15LS-200  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 22 July 2011  
9 of 11  
 
 
 
 
BLF7G15LS-200  
NXP Semiconductors  
Power LDMOS transistor  
Non-automotive qualified products — Unless this data sheet expressly  
states that this specific NXP Semiconductors product is automotive qualified,  
the product is not suitable for automotive use. It is neither qualified nor tested  
in accordance with automotive testing or application requirements. NXP  
Semiconductors accepts no liability for inclusion and/or use of  
NXP Semiconductors’ specifications such use shall be solely at customer’s  
own risk, and (c) customer fully indemnifies NXP Semiconductors for any  
liability, damages or failed product claims resulting from customer design and  
use of the product for automotive applications beyond NXP Semiconductors’  
standard warranty and NXP Semiconductors’ product specifications.  
non-automotive qualified products in automotive equipment or applications.  
In the event that customer uses the product for design-in and use in  
automotive applications to automotive specifications and standards, customer  
(a) shall use the product without NXP Semiconductors’ warranty of the  
product for such automotive applications, use and specifications, and (b)  
whenever customer uses the product for automotive applications beyond  
11.4 Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
12. Contact information  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
BLF7G15LS-200  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 22 July 2011  
10 of 11  
 
 
BLF7G15LS-200  
NXP Semiconductors  
Power LDMOS transistor  
13. Contents  
1
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
1.1  
1.2  
1.3  
General description . . . . . . . . . . . . . . . . . . . . . 1  
Features and benefits. . . . . . . . . . . . . . . . . . . . 1  
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
2
3
4
5
6
Pinning information. . . . . . . . . . . . . . . . . . . . . . 2  
Ordering information. . . . . . . . . . . . . . . . . . . . . 2  
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2  
Thermal characteristics . . . . . . . . . . . . . . . . . . 2  
Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 2  
7
Test information. . . . . . . . . . . . . . . . . . . . . . . . . 3  
Ruggedness in class-AB operation . . . . . . . . . 3  
Impedance information. . . . . . . . . . . . . . . . . . . 3  
Graphs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4  
Test circuit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
7.1  
7.2  
7.3  
7.4  
8
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 7  
Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Revision history. . . . . . . . . . . . . . . . . . . . . . . . . 8  
9
10  
11  
Legal information. . . . . . . . . . . . . . . . . . . . . . . . 9  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . . 9  
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
11.1  
11.2  
11.3  
11.4  
12  
13  
Contact information. . . . . . . . . . . . . . . . . . . . . 10  
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2011.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 22 July 2011  
Document identifier: BLF7G15LS-200  
 

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