BSH299 [NXP]

P-channel enhancement mode MOS transistor; P沟道增强型MOS晶体管
BSH299
型号: BSH299
厂家: NXP    NXP
描述:

P-channel enhancement mode MOS transistor
P沟道增强型MOS晶体管

晶体 小信号场效应晶体管 开关 光电二极管
文件: 总12页 (文件大小:97K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DISCRETE SEMICONDUCTORS  
DATA SHEET  
BSH299  
P-channel enhancement mode  
MOS transistor  
1998 Feb 18  
Objective specification  
File under Discrete Semiconductors, SC13b  
Philips Semiconductors  
Objective specification  
P-channel enhancement mode MOS transistor  
BSH299  
FEATURES  
PINNING - SOT363  
Low threshold voltage  
PIN  
SYMBOL  
DESCRIPTION  
High-speed switching  
1
2
3
4
5
6
d
d
g
s
d
d
drain  
No secondary breakdown  
Direct interface to C-MOS, TTL, etc.  
drain  
gate  
source  
drain  
drain  
APPLICATIONS  
Power management  
Battery powered applications e.g. cellular phones  
General purpose switch.  
d
s
handbook, halfpage  
6
1
5
2
4
3
DESCRIPTION  
P-channel enhancement mode MOS transistor in a  
SOT363 SMD package.  
g
CAUTION  
MAM396  
Top view  
The device is supplied in an antistatic package.  
The gate-source input must be protected against static  
discharge during transport or handling.  
Fig.1 Simplified outline and symbol.  
QUICK REFERENCE DATA  
SYMBOL  
VDS  
PARAMETER  
CONDITIONS  
MIN.  
MAX.  
50  
UNIT  
drain-source voltage (DC)  
gate-source voltage (DC)  
gate-source threshold voltage  
drain current (DC)  
V
V
V
A
W
VGSO  
VGSth  
ID  
open drain  
±20  
2  
ID = 1 mA; VDS = VGS  
Ts = 80 °C  
0.8  
0.2  
10  
RDSon  
Ptot  
drain-source on-state resistance  
total power dissipation  
ID = 0.13 A; VGS = 10 V  
Ts = 80 °C  
0.7  
1998 Feb 18  
2
Philips Semiconductors  
Objective specification  
P-channel enhancement mode MOS transistor  
BSH299  
LIMITING VALUES  
In accordance with the Absolute Maximum Rating System (IEC 134).  
SYMBOL  
PARAMETER  
drain-source voltage (DC)  
gate-source voltage (DC)  
drain current (DC)  
CONDITIONS  
MIN.  
MAX.  
50  
UNIT  
VDS  
VGSO  
ID  
V
V
A
A
open drain  
±20  
Ts = 80 °C; note 1  
note 2  
0.2  
0.8  
0.7  
IDM  
Ptot  
peak drain current  
total power dissipation  
Ts = 80 °C; see Fig.2  
W
W
W
°C  
°C  
T
amb = 25 °C; note 3; see Fig.2  
amb = 25 °C; note 4; see Fig.2  
0.98  
0.66  
+150  
150  
T
Tstg  
Tj  
storage temperature  
55  
55  
operating junction temperature  
Notes  
1. Ts is the temperature at the soldering point of the drain lead.  
2. Pulse width and duty cycle limited by maximum junction temperature.  
3. Device mounted on a printed-circuit board with an Rth a-tp (ambient to tie-point) of 27.5 K/W.  
4. Device mounted on a printed-circuit board with an Rth a-tp (ambient to tie-point) of 90 K/W.  
THERMAL CHARACTERISTICS  
SYMBOL  
PARAMETER  
VALUE  
UNIT  
Rth j-s  
thermal resistance from junction to soldering point; see Fig.4  
100  
K/W  
1998 Feb 18  
3
Philips Semiconductors  
Objective specification  
P-channel enhancement mode MOS transistor  
BSH299  
CHARACTERISTICS  
Tj = 25 °C unless otherwise specified.  
SYMBOL  
PARAMETER  
CONDITIONS  
MIN.  
50  
TYP.  
MAX. UNIT  
V(BR)DSS drain-source breakdown voltage  
VGS = 0; ID = 10 µA  
VGS = VDS; ID = 1 mA  
VGS = 0; VDS = 40 V  
VGS = 0; VDS = 50 V  
V
VGSth  
IDSS  
gate-source threshold voltage  
drain-source leakage current  
0.8  
2  
V
100  
10  
60  
±10  
10  
nA  
µA  
µA  
nA  
V
GS = 0; VDS = 50 V; Tj = 125 °C −  
IGSS  
gate leakage current  
VGS = ±20 V; VDS = 0  
RDSon  
drain-source on-state resistance VGS = 10 V; ID = 0.13 A;  
see Fig.10  
yfs  
Ciss  
Coss  
Crss  
forward transfer admittance  
input capacitance  
VDS = 25 V; ID = 0.13 A  
50  
mS  
pF  
pF  
pF  
VGS = 0; VDS = 25 V; f = 1 MHz;  
see Fig.7  
25  
15  
3.5  
45  
25  
12  
output capacitance  
reverse transfer capacitance  
Switching times (see Figs 5 and 6)  
ton  
turn-on switching time  
VGS = 0 to 10 V; VDD = 40 V;  
ID = 0.2 A  
3
7
ns  
ns  
toff  
turn-off switching time  
VGS = 10 to 0 V; VDD = 40 V;  
ID = 0.2 A  
1998 Feb 18  
4
Philips Semiconductors  
Objective specification  
P-channel enhancement mode MOS transistor  
BSH299  
MGL382  
MGL383  
1  
1
handbook, halfpage  
handbook, halfpage  
P
tot  
(W)  
pulsed  
I
D
(A)  
0.8  
1  
10  
DC  
0.6  
0.4  
0.2  
2  
10  
3  
10  
0
0
1  
2
10  
1  
10  
10  
50  
100  
150  
200  
o
T
( C)  
V
(V)  
DS  
s
Fig.2 Power derating curve.  
Fig.3 SOAR.  
MGL384  
3
10  
R
th j-s  
(K/W)  
t
(s) =  
1.00  
0.75  
0.50  
p
2
10  
0.33  
0.20  
0.10  
0.05  
10  
1
0.02  
0.01  
t
p
P
=
δ
T
0.00  
t
t
p
T
1  
10  
6  
5  
4  
3  
2  
1  
10  
10  
10  
10  
10  
10  
1
t
(s)  
p
Fig.4 Transient thermal resistance from junction to soldering point as a function of pulse time; typical values.  
1998 Feb 18  
5
Philips Semiconductors  
Objective specification  
P-channel enhancement mode MOS transistor  
BSH299  
handbook, halfpage  
10 %  
INPUT  
handbook, halfpage  
V
= 40 V  
DD  
90 %  
10 %  
OUTPUT  
0 V  
I
D
90 %  
10 V  
50 Ω  
t
t
off  
on  
MLD189  
MBB690  
Fig.5 Switching time test circuit.  
Fig.6 Input and output waveforms.  
MLD191  
MLD197  
80  
600  
handbook, halfpage  
handbook, halfpage  
V
C
(pF)  
GS = 10 V 7.5 V  
6 V  
I
D
(mA)  
60  
40  
20  
400  
5 V  
4 V  
C
C
iss  
200  
oss  
3 V  
C
2.5 V  
rss  
0
0
0
10  
20  
30  
0
2  
4  
6  
8  
10  
V
12  
(V)  
V
(V)  
DS  
DS  
VGS = 0; Tj = 25 °C; f = 1 MHz.  
Tj = 25 °C.  
Fig.7 Capacitance as a function of  
drain-source voltage; typical values.  
Fig.8 Output characteristics; typical values.  
1998 Feb 18  
6
Philips Semiconductors  
Objective specification  
P-channel enhancement mode MOS transistor  
BSH299  
MLD196  
MLD198  
60  
600  
handbook, halfpage  
handbook, halfpage  
R
V
= 2.5 V 3 V 4 V  
5 V  
I
DSon  
()  
GS  
D
(mA)  
40  
400  
20  
200  
7.5 V  
10 V  
0
1  
0
0
2
3
10  
10  
10  
2  
4  
6  
8  
V
10  
(V)  
I
(mA)  
D
GS  
Tj = 25 °C; tp = 300 µs; δ = 0.  
VDS = 10 V; Tj = 25 °C.  
Fig.10 Drain-source on-state resistance as a  
Fig.9 Transfer characteristics; typical values.  
function of drain current; typical values.  
MLD194  
MLD195  
1.8  
1.2  
handbook, halfpage  
handbook, halfpage  
(1)  
k
k
(2)  
1.4  
1.0  
1.0  
0.8  
0.6  
50  
0.6  
0
50  
100  
150  
50  
0
50  
100  
150  
T (°C)  
T (°C)  
j
j
k = (RDSon at Tj)/(RDSon at 25 °C).  
(1) ID = 130 mA; VGS = 10 V.  
(2) ID = 20 mA; VGS = 2.4 V.  
k = (VGSth at Tj)/(VGSth at 25 °C).  
ID = 1 mA; VDS = VGS  
.
Fig.11 Temperature coefficient of gate-source  
threshold voltage as a function of junction  
temperature; typical values.  
Fig.12 Temperature coefficient of drain-source  
on-resistance as a function of junction  
temperature; typical values.  
1998 Feb 18  
7
Philips Semiconductors  
Objective specification  
P-channel enhancement mode MOS transistor  
BSH299  
PACKAGE OUTLINE  
Plastic surface mounted package; 6 leads  
SOT363  
D
B
E
A
X
y
H
v
M
A
E
6
5
4
Q
pin 1  
index  
A
A
1
1
2
3
c
e
1
b
p
L
p
w
M B  
e
detail X  
0
1
2 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
A
1
UNIT  
A
b
c
D
E
e
e
H
L
Q
v
w
y
p
p
1
E
max  
0.30  
0.20  
1.1  
0.8  
0.25  
0.10  
2.2  
1.8  
1.35  
1.15  
2.2  
2.0  
0.45  
0.15  
0.25  
0.15  
mm  
0.1  
1.3  
0.65  
0.2  
0.2  
0.1  
REFERENCES  
JEDEC  
EUROPEAN  
PROJECTION  
OUTLINE  
VERSION  
ISSUE DATE  
IEC  
EIAJ  
97-02-28  
SOT363  
SC-88  
1998 Feb 18  
8
Philips Semiconductors  
Objective specification  
P-channel enhancement mode MOS transistor  
BSH299  
DEFINITIONS  
Data Sheet Status  
Objective specification  
Preliminary specification  
Product specification  
This data sheet contains target or goal specifications for product development.  
This data sheet contains preliminary data; supplementary data may be published later.  
This data sheet contains final product specifications.  
Limiting values  
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or  
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation  
of the device at these or at any other conditions above those given in the Characteristics sections of the specification  
is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices, or systems where malfunction of these  
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for  
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such  
improper use or sale.  
1998 Feb 18  
9
Philips Semiconductors  
Objective specification  
P-channel enhancement mode MOS transistor  
BSH299  
NOTES  
1998 Feb 18  
10  
Philips Semiconductors  
Objective specification  
P-channel enhancement mode MOS transistor  
BSH299  
NOTES  
1998 Feb 18  
11  
Philips Semiconductors – a worldwide company  
Argentina: see South America  
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Tel. +31 40 27 82785, Fax. +31 40 27 88399  
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Tel. +359 2 689 211, Fax. +359 2 689 102  
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Romania: see Italy  
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Indonesia: see Singapore  
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Uruguay: see South America  
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Mexico: 5900 Gateway East, Suite 200, EL PASO, TEXAS 79905,  
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Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,  
Tel. +381 11 625 344, Fax.+381 11 635 777  
Middle East: see Italy  
For all other countries apply to: Philips Semiconductors, Marketing & Sales Communications,  
Internet: http://www.semiconductors.philips.com  
Building BE-p, P.O. Box 218, 5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825  
© Philips Electronics N.V. 1997  
SCA54  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.  
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed  
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license  
under patent- or other industrial or intellectual property rights.  
Printed in The Netherlands  
135108/00/01/pp12  
Date of release: 1998 Feb 18  
Document order number: 9397 750 03223  

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