BT138X-600E [NXP]

Triacs sensitive gate; 三端双向可控硅敏感栅
BT138X-600E
型号: BT138X-600E
厂家: NXP    NXP
描述:

Triacs sensitive gate
三端双向可控硅敏感栅

栅极 触发装置 可控硅 三端双向交流开关 局域网
文件: 总6页 (文件大小:55K)
中文:  中文翻译
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Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT138X series E  
GENERAL DESCRIPTION  
QUICK REFERENCE DATA  
Glass passivated, sensitive gate  
triacs in a full pack plastic envelope,  
intended for use in general purpose  
bidirectional switching and phase  
control applications, where high  
sensitivity is required in all four  
quadrants.  
SYMBOL PARAMETER  
MAX. MAX. MAX. UNIT  
BT138X- 500E 600E 800E  
VDRM  
Repetitive peak off-state  
voltages  
500  
600  
800  
V
IT(RMS)  
ITSM  
RMS on-state current  
Non-repetitive peak on-state  
current  
12  
95  
12  
95  
12  
95  
A
A
PINNING - SOT186A  
PIN CONFIGURATION  
SYMBOL  
PIN  
1
DESCRIPTION  
main terminal 1  
case  
T2  
T1  
2
main terminal 2  
gate  
3
G
1
2 3  
case isolated  
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134).  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
V
-500  
-600  
-800  
800  
VDRM  
Repetitive peak off-state  
voltages  
-
-
5001  
6001  
IT(RMS)  
ITSM  
RMS on-state current  
Non-repetitive peak  
on-state current  
full sine wave; Ths 56 ˚C  
full sine wave; Tj = 25 ˚C prior to  
surge  
12  
A
t = 20 ms  
-
-
-
95  
105  
45  
A
A
t = 16.7 ms  
I2t  
dIT/dt  
I2t for fusing  
Repetitive rate of rise of  
on-state current after  
triggering  
t = 10 ms  
A2s  
ITM = 20 A; IG = 0.2 A;  
dIG/dt = 0.2 A/µs  
T2+ G+  
-
50  
50  
50  
10  
2
5
5
0.5  
150  
125  
A/µs  
A/µs  
A/µs  
A/µs  
A
T2+ G-  
-
T2- G-  
-
T2- G+  
-
IGM  
Peak gate current  
Peak gate voltage  
Peak gate power  
Average gate power  
Storage temperature  
Operating junction  
temperature  
-
VGM  
PGM  
PG(AV)  
Tstg  
Tj  
-
V
-
-
W
over any 20 ms period  
W
-40  
-
˚C  
˚C  
1 Although not recommended, off-state voltages up to 800V may be applied without damage, but the triac may  
switch to the on-state. The rate of rise of current should not exceed 15 A/µs.  
September 1997  
1
Rev 1.200  
Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT138X series E  
ISOLATION LIMITING VALUE & CHARACTERISTIC  
Ths = 25 ˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
Visol  
Cisol  
R.M.S. isolation voltage from all f = 50-60 Hz; sinusoidal  
-
2500  
V
three terminals to external  
heatsink  
waveform;  
R.H. 65% ; clean and dustfree  
Capacitance from T2 to external f = 1 MHz  
heatsink  
-
10  
-
pF  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
Rth j-hs  
Rth j-a  
Thermal resistance  
junction to heatsink  
full or half cycle  
with heatsink compound  
without heatsink compound  
in free air  
-
-
-
-
-
55  
4.0  
5.5  
-
K/W  
K/W  
K/W  
Thermal resistance  
junction to ambient  
STATIC CHARACTERISTICS  
Tj = 25 ˚C unless otherwise stated  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
IGT  
Gate trigger current  
VD = 12 V; IT = 0.1 A  
T2+ G+  
T2+ G-  
T2- G-  
T2- G+  
-
-
-
-
2.5  
4.0  
5.0  
11  
10  
10  
10  
25  
mA  
mA  
mA  
mA  
IL  
Latching current  
VD = 12 V; IGT = 0.1 A  
T2+ G+  
T2+ G-  
T2- G-  
T2- G+  
-
3.2  
16  
30  
40  
mA  
mA  
mA  
mA  
mA  
V
-
-
4.0  
5.5  
4.0  
1.4  
0.7  
0.4  
0.1  
30  
-
40  
IH  
VT  
VGT  
Holding current  
On-state voltage  
Gate trigger voltage  
VD = 12 V; IGT = 0.1 A  
IT = 15 A  
-
30  
-
1.65  
1.5  
-
VD = 12 V; IT = 0.1 A  
-
0.25  
-
V
VD = 400 V; IT = 0.1 A; Tj = 125 ˚C  
V
ID  
Off-state leakage current VD = VDRM(max); Tj = 125 ˚C  
0.5  
mA  
DYNAMIC CHARACTERISTICS  
Tj = 25 ˚C unless otherwise stated  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
dVD/dt  
Critical rate of rise of  
off-state voltage  
Gate controlled turn-on  
time  
VDM = 67% VDRM(max); Tj = 125 ˚C;  
exponential waveform; gate open circuit  
ITM = 16 A; VD = VDRM(max); IG = 0.1 A;  
dIG/dt = 5 A/µs  
-
50  
-
V/µs  
tgt  
-
2
-
µs  
September 1997  
2
Rev 1.200  
Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT138X series E  
Ths(max) / C  
IT(RMS) / A  
Ptot / W  
20  
45  
15  
10  
5
= 180  
120  
56 C  
1
65  
15  
90  
60  
85  
10  
5
30  
105  
125  
15  
0
0
-50  
0
50  
Ths / C  
100  
150  
0
5
10  
IT(RMS) / A  
Fig.1. Maximum on-state dissipation, Ptot, versus rms  
on-state current, IT(RMS), where α = conduction angle.  
Fig.4. Maximum permissible rms current IT(RMS)  
versus heatsink temperature Ths.  
,
ITSM / A  
IT(RMS) / A  
1000  
100  
10  
25  
20  
15  
10  
5
dIT/dt limit  
I
TSM  
time  
I
T
T2- G+ quadrant  
T
Tj initial = 25 C max  
10ms 100ms  
0
10us  
100us  
1ms  
T / s  
0.01  
0.1  
surge duration / s  
1
10  
Fig.2. Maximum permissible non-repetitive peak  
on-state current ITSM, versus pulse width tp, for  
sinusoidal currents, tp 20ms.  
Fig.5. Maximum permissible repetitive rms on-state  
current IT(RMS), versus surge duration, for sinusoidal  
currents, f = 50 Hz; Ths 56˚C.  
VGT(Tj)  
VGT(25 C)  
ITSM / A  
100  
80  
60  
40  
20  
0
1.6  
1.4  
1.2  
1
I
TSM  
time  
I
T
T
Tj initial = 25 C max  
0.8  
0.6  
0.4  
1
10  
100  
1000  
-50  
0
50  
Tj / C  
100  
150  
Number of cycles at 50Hz  
Fig.3. Maximum permissible non-repetitive peak  
on-state current ITSM, versus number of cycles, for  
sinusoidal currents, f = 50 Hz.  
Fig.6. Normalised gate trigger voltage  
VGT(Tj)/ VGT(25˚C), versus junction temperature Tj.  
September 1997  
3
Rev 1.200  
Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT138X series E  
IGT(Tj)  
IGT(25 C)  
IT / A  
40  
30  
20  
10  
0
Tj = 125 C  
Tj = 25 C  
typ  
max  
3
T2+ G+  
T2+ G-  
T2- G-  
T2- G+  
2.5  
2
Vo = 1.175 V  
Rs = 0.0316 Ohms  
1.5  
1
0.5  
0
0
0.5  
1
1.5  
VT / V  
2
2.5  
3
-50  
0
50  
100  
150  
Tj / C  
Fig.7. Normalised gate trigger current  
IGT(Tj)/ IGT(25˚C), versus junction temperature Tj.  
Fig.10. Typical and maximum on-state characteristic.  
IL(Tj)  
IL(25 C)  
Zth j-hs (K/W)  
10  
1
3
2.5  
2
with heatsink compound  
without heatsink compound  
unidirectional  
bidirectional  
0.1  
1.5  
1
t
P
p
D
0.01  
t
0.5  
0
0.001  
10us  
0.1ms  
1ms  
10ms  
tp / s  
0.1s  
1s  
10s  
-50  
0
50  
Tj / C  
100  
150  
Fig.8. Normalised latching current IL(Tj)/ IL(25˚C),  
versus junction temperature Tj.  
Fig.11. Transient thermal impedance Zth j-hs, versus  
pulse width tp.  
dVD/dt (V/us)  
1000  
IH(Tj)  
IH(25C)  
3
2.5  
2
100  
10  
1
1.5  
1
0.5  
0
-50  
0
50  
100  
150  
0
50  
100  
150  
Tj / C  
Tj / C  
Fig.9. Normalised holding current IH(Tj)/ IH(25˚C),  
versus junction temperature Tj.  
Fig.12. Typical, critical rate of rise of off-state voltage,  
dVD/dt versus junction temperature Tj.  
September 1997  
4
Rev 1.200  
Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT138X series E  
MECHANICAL DATA  
Dimensions in mm  
Net Mass: 2 g  
10.3  
max  
4.6  
max  
3.2  
3.0  
2.9 max  
2.8  
Recesses (2x)  
6.4  
2.5  
0.8 max. depth  
15.8  
max  
seating  
plane  
15.8  
max.  
19  
max.  
3 max.  
not tinned  
3
2.5  
13.5  
min.  
1
2
3
M
0.4  
1.0 (2x)  
0.6  
2.5  
0.9  
0.7  
2.54  
0.5  
5.08  
1.3  
Fig.13. SOT186A; The seating plane is electrically isolated from all terminals.  
Notes  
1. Refer to mounting instructions for F-pack envelopes.  
2. Epoxy meets UL94 V0 at 1/8".  
September 1997  
5
Rev 1.200  
Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT138X series E  
DEFINITIONS  
Data sheet status  
Objective specification  
This data sheet contains target or goal specifications for product development.  
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.  
Product specification  
This data sheet contains final product specifications.  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 1997  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
September 1997  
6
Rev 1.200  

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