BU1706AB [NXP]

Silicon Diffused Power Transistor; 硅扩散型功率晶体管
BU1706AB
型号: BU1706AB
厂家: NXP    NXP
描述:

Silicon Diffused Power Transistor
硅扩散型功率晶体管

晶体 晶体管 功率双极晶体管 开关
文件: 总7页 (文件大小:87K)
中文:  中文翻译
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Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BU1706AB  
GENERAL DESCRIPTION  
High-voltage, high-speed switching npn transistor in a plastic envelope suitable for surface mounting, intended for  
use in high frequency electronic lighting ballast applications.  
QUICK REFERENCE DATA  
SYMBOL PARAMETER  
CONDITIONS  
TYP. MAX. UNIT  
VCESM  
VCEO  
IC  
Collector-emitter voltage peak value  
VBE = 0 V  
-
1750  
850  
5
V
V
Collector-emitter voltage (open base)  
Collector current (DC)  
-
-
A
ICM  
Collector current peak value  
Total power dissipation  
Collector-emitter saturation voltage  
Collector saturation current  
Fall time  
-
-
8
A
Ptot  
T
mb 25 ˚C  
100  
1.0  
-
W
V
VCEsat  
ICsat  
tf  
IC = 1.5 A; IB = 0.3 A  
-
1.5  
0.25  
A
ICM = 1.5 A; IB(on) = 0.3 A  
0.6  
µs  
PINNING - SOT404  
PIN CONFIGURATION  
SYMBOL  
PIN  
1
DESCRIPTION  
c
mb  
base  
2
collector  
emitter  
b
3
2
mb collector  
e
1
3
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum Rating System (IEC 134)  
SYMBOL PARAMETER  
CONDITIONS  
MIN. MAX. UNIT  
VCESM  
VCEO  
IC  
Collector-emitter voltage peak value  
VBE = 0 V  
-
1750  
850  
5
V
V
Collector-emitter voltage (open base)  
Collector current (DC)  
-
-
A
ICM  
Collector current peak value  
Base current (DC)  
Base current peak value  
Reverse base current  
-
8
A
IB  
IBM  
-IB(AV)  
-IBM  
Ptot  
Tstg  
Tj  
-
3
5
100  
4
100  
150  
150  
A
-
A
average over any 20ms period  
-
mA  
A
Reverse base current peak value  
Total power dissipation  
Storage temperature  
-
-
Tmb 25 ˚C  
W
˚C  
˚C  
-65  
-
Junction temperature  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
TYP. MAX. UNIT  
Rth j-mb  
Thermal resistance junction to mounting  
base  
-
1.25  
K/W  
Rth j-a  
Thermal resistance junction to ambient  
minimum footprint, FR4 board  
55  
-
K/W  
February 1998  
1
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BU1706AB  
STATIC CHARACTERISTICS  
Tmb = 25 ˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
ICES  
ICES  
ICES  
Collector cut-off current 1  
VBE = 0 V; VCE = VCESMmax  
VBE = 0 V; VCE = 1500 V  
VBE = 0 V; VCE = VCESMmax  
Tj = 125 ˚C  
-
-
-
-
-
-
1.0  
20  
mA  
µA  
;
2.0  
mA  
IEBO  
VCEOsust  
Emitter cut-off current  
VEB = 12 V; IC = 0 A  
-
-
-
1
-
mA  
V
Collector-emitter sustaining voltage IB = 0 A; IC = 100 mA;  
L = 25 mH  
750  
VCEsat  
VBEsat  
hFE  
hFE  
hFE  
Collector-emitter saturation voltage IC = 1.5 A; IB = 0.3 A  
-
-
8
12  
5
-
-
-
18  
7
1.0  
1.3  
-
35  
-
V
V
Base-emitter saturation voltage  
DC current gain  
IC = 1.5 A; IB = 0.3 A  
IC = 5 mA; VCE = 10 V  
IC = 400 mA; VCE = 3 V  
IC = 1.5 A; VCE = 1 V  
DYNAMIC CHARACTERISTICS  
Tmb = 25 ˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
TYP. MAX. UNIT  
Switching times (resistive load)  
ICon = 1.5 A; IBon = -IBoff = 0.3 A  
ton  
ts  
tf  
Turn-on time  
1.1  
5
0.75  
1.5  
6.5  
1.0  
µs  
µs  
µs  
Turn-off storage time  
Turn-off fall time  
Switching times (inductive load)  
ICon = 1.5 A; IBon = 0.3 A; LB = 1 µH;  
-VBB = 5 V  
ts  
tf  
Turn-off storage time  
Turn-off fall time  
2.0  
0.25  
3.0  
0.6  
µs  
µs  
Switching times (inductive load)  
ICon = 1.5 A; IBon = 0.3 A; LB = 1 µH;  
-VBB = 5 V; Tj = 100 ˚C  
ts  
tf  
Turn-off storage time  
Turn-off fall time  
2.2  
0.2  
3.3  
0.7  
µs  
µs  
IC / mA  
+ 50v  
100-200R  
250  
200  
Horizontal  
Oscilloscope  
Vertical  
100  
0
1R  
300R  
6V  
min  
VCEOsust  
VCE / V  
30-60 Hz  
Fig.1. Test circuit for VCEOsust  
.
Fig.2. Oscilloscope display for VCEOsust.  
1 Measured with half sine-wave voltage (curve tracer).  
February 1998  
2
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BU1706AB  
VCC  
VCC  
R
L
LC  
VIM  
R
B
VCL  
0
T.U.T.  
IBon  
LB  
tp  
T.U.T.  
-VBB  
T
Fig.3. Test circuit resistive load. VIM = -6 to +8 V  
VCC = 250 V; tp = 20 µs; δ = tp / T = 0.01.  
RB and RL calculated from ICon and IBon requirements.  
Fig.6. Test Circuit RBSOA.  
VCC = 150 V; -VBB = 5 V; LC = 2 mH; VCL 1500 V;  
LB = 1 µH  
ICon  
ICon  
90 %  
90 %  
10 %  
90 %  
IC  
IC  
ts  
10 %  
tf  
ton  
toff  
tf  
ts  
t
IBon  
toff  
IB  
IBon  
IB  
10 %  
tr 30ns  
t
-IBoff  
-IBoff  
Fig.4. Switching times waveforms with resistive load.  
Fig.7. Switching times waveforms with inductive load.  
Normalised Power Derating  
PD%  
VCC  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
LC  
IBon  
LB  
T.U.T.  
-VBB  
0
20  
40  
60  
80  
Tmb /  
100  
120  
140  
C
Fig.5. Test circuit inductive load.  
VCC = 300 V; -VBE = 5 V; LB = 1 uH  
Fig.8. Normalised power dissipation.  
PD% = 100 PD/PD 25 ˚C = f (Tmb)  
February 1998  
3
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BU1706AB  
VBESAT / V  
Zth / (K/W)  
1.2  
1.1  
1
1E+01  
1E+00  
1E-01  
1E-02  
1E-03  
Tj = 25 C  
Tj = 125 C  
0.5  
0.2  
0.1  
0.05  
0.9  
0.8  
0.7  
0.6  
IC =  
3 A  
tp  
t
p
0.02  
P
D =  
D
T
2 A  
D=0  
t
1.5 A  
0.5 A  
T
1E-07  
1E-05  
1E-03  
t / s  
1E-01  
1E+01  
0
1
2
IB / A  
3
4
Fig.9. Transient thermal impedance.  
Zth j-mb = f(t); parameter D = tp/T  
Fig.12. Typical base-emitter saturation voltage.  
VBEsat = f(IB); parameter IC  
BU1706A  
VBESAT / V  
VCESAT / V  
1.2  
1.1  
1
10  
1
Tj = 25 C  
Tj = 125 C  
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
3A  
2A  
1.5 A  
IC/IB =  
4
5
6
IC = 0.5A  
0.1  
0.01  
Tj = 25 C  
Tj = 125 C  
0.1  
1
IC / A  
10  
0.01  
0.1  
1
10  
IB / A  
Fig.10. Typical base-emitter saturation voltage.  
VBEsat = f(IC); parameter IC/IB  
Fig.13. Typical collector-emitter saturation voltage.  
VCEsat = f(IB); parameter IC  
VCESAT / V  
0
h FE  
1
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0
100  
10  
1
IC/IB =  
5 V  
6
5
4
1 V  
Tj = 25 C  
Tj = 125 C  
Tj = 25 C  
Tj = 125 C  
0.1  
0.1  
1
IC / A  
10  
0.01  
0.1  
1
10  
IC / A  
Fig.11. Typical collector-emitter saturation voltage.  
VCEsat = f(IC); parameter IC/IB  
Fig.14. Typical DC current gain.  
hFE = f(IC); parameter VCE  
February 1998  
4
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BU1706AB  
IC / A  
IC / A  
6
5
4
3
2
1
0
10  
ICM  
ICDC  
Ptot  
1
0
400  
800  
1200  
1600  
2000  
VCE / V  
tp =  
Fig.16. Reverse bias safe operating area. Tj Tjmax  
0.1  
100 us  
1 ms  
10 ms  
DC  
0.01  
1
10  
100  
1000  
VCE / V  
Fig.15. Forward bias safe operating area. Tmb = 25 ˚C  
I
Region of permissible DC operation.  
Extension for repetitive pulse operation.  
Mounted with heatsink compound and  
30 ± 5 newton force on the centre of the  
envelope.  
II  
NB:  
February 1998  
5
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BU1706AB  
MECHANICAL DATA  
Dimensions in mm  
4.5 max  
1.4 max  
10.3 max  
Net Mass: 1.4 g  
11 max  
15.4  
2.5  
0.85 max  
(x2)  
0.5  
2.54 (x2)  
Fig.17. SOT404 : centre pin connected to mounting base.  
MOUNTING INSTRUCTIONS  
Dimensions in mm  
11.5  
9.0  
17.5  
2.0  
3.8  
5.08  
Fig.18. SOT404 : soldering pattern for surface mounting.  
Notes  
1. Plastic meets UL94 V0 at 1/8".  
February 1998  
6
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BU1706AB  
DEFINITIONS  
Data sheet status  
Objective specification  
This data sheet contains target or goal specifications for product development.  
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.  
Product specification  
This data sheet contains final product specifications.  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 1998  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
February 1998  
7
Rev 1.000  

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