BUK7L3R3-34BRC [NXP]

N-channel TrenchPLUS standard level FET; N沟道TrenchPLUS标准水平FET
BUK7L3R3-34BRC
型号: BUK7L3R3-34BRC
厂家: NXP    NXP
描述:

N-channel TrenchPLUS standard level FET
N沟道TrenchPLUS标准水平FET

文件: 总14页 (文件大小:105K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
BUK7L3R3-34BRC  
N-channel TrenchPLUS standard level FET  
Rev. 02 — 26 September 2007  
Product data sheet  
1. Product profile  
1.1 General description  
N-channel enhancement mode power Field-Effect Transistor (FET) in a plastic package  
using NXP High-Performance Automotive (HPA) TrenchMOS technology, featuring very  
low on-state resistance, internal gate resistor, ElectroStatic Discharge (ESD) protection  
diodes and clamping diodes that are guaranteed to prevent MOSFET avalanching.  
1.2 Features  
I Internal gate resistor  
I Q101 compliant  
I 175 °C rated  
I ESD and overvoltage protection  
1.3 Applications  
I Automotive systems  
I General purpose power switching  
I 12 V loads  
I Motors, lamps and solenoids  
1.4 Quick reference data  
I EDS(AL)S 1.9 J  
I ID 75 A  
I RDSon = 2.9 m(typ)  
I Ptot 298 W  
2. Pinning information  
Table 1.  
Pinning  
Pin  
1
Description  
Simplified outline  
Symbol  
gate (G)  
D
mb  
2
drain (D)  
3
source (S)  
mb  
mounting base; connected to drain (D)  
G
S
sym094  
1
2 3  
SOT78C (TO-220)  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
3. Ordering information  
Table 2.  
Ordering information  
Type number  
Package  
Name  
Description  
Version  
BUK7L3R3-34BRC TO-220  
plastic single-ended package; heatsink mounted; 1 mounting hole; 3 leads SOT78C  
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
2 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
4. Limiting values  
Table 3.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol Parameter  
Conditions  
Min  
Max Unit  
[1]  
[1]  
VDS  
VDGR  
VGS  
ID  
drain-source voltage  
-
34  
V
drain-gate voltage (DC)  
gate-source voltage  
drain current  
RGS = 20 kΩ  
-
34  
V
-
±20  
218  
75  
V
[2]  
[3][4]  
[3]  
Tmb = 25 °C; VGS = 10 V; see Figure 2 and 3  
-
A
-
A
Tmb = 100 °C; VGS = 10 V; see Figure 2  
Tmb = 25 °C; pulsed; tp 10 µs; see Figure 3  
Tmb = 25 °C; see Figure 1  
tp = 5 ms; δ = 0.01  
-
75  
A
IDM  
peak drain current  
-
872  
298  
50  
A
Ptot  
total power dissipation  
drain-gate clamping current  
gate-source clamping current  
-
W
mA  
mA  
mA  
IDG(CL)  
IGS(CL)  
-
continuous  
-
10  
tp = 5 ms; δ = 0.01  
-
50  
Tstg  
Tj  
storage temperature  
junction temperature  
55  
55  
+175 °C  
+175 °C  
Source-drain diode  
[2]  
IDR  
reverse drain current  
Tmb = 25 °C  
-
-
-
218  
75  
A
A
A
[3][4]  
IDRM  
peak reverse drain current  
Tmb = 25 °C; pulsed; tp 10 µs  
unclamped inductive load; ID = 75 A;  
872  
Avalanche ruggedness  
EDS(AL)S non-repetitive drain-source  
avalanche energy  
-
-
1.9  
-
J
J
VDS 34 V; RGS = 50 ; VGS = 10 V; starting at  
Tj = 25 °C  
[5]  
EDS(AL)R repetitive drain-source avalanche  
energy  
Vesd  
electrostatic discharge voltage  
all pins; human body model; R = 1.5 kΩ  
C = 100 pF  
-
-
8
8
kV  
kV  
C = 250 pF  
[1] Voltage is limited by clamping.  
[2] Current is limited by power dissipation chip rating.  
[3] Continuous current is limited by package.  
[4] Refer to literature 9397 750 12572 for further information.  
[5] Maximum value not quoted. Refer to application note AN10273 for further information.  
a) Repetitive rating defined in Figure 14.  
b) Single-pulse avalanche rating limited by a Tj(max) of 175 °C.  
c) Repetitive avalanche rating limited by an average junction temperature of 170 °C.  
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
3 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
03aa16  
003aaa861  
120  
250  
200  
150  
100  
50  
ID  
Pder  
(%)  
(A)  
80  
40  
0
(1)  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
Tmb ( C)  
Tmb ( C)  
°
°
V
GS 10 V  
Ptot  
Pder  
=
× 100 %  
-----------------------  
(1) Capped at 75 A due to package  
Ptot(25°C)  
Fig 1. Normalized total power dissipation as a  
function of mounting base temperature  
Fig 2. Continuous drain current as a function of  
mounting base temperature  
003aaa862  
104  
ID  
(A)  
103  
Limit RDSon = VDS / ID  
tp = 10 µs  
100 µs  
102  
1 ms  
(1)  
DC  
10 ms  
100 ms  
10  
1
10-1  
1
10  
102  
VDS (V)  
Tmb = 25 °C; IDM is single pulse  
(1) Capped at 75 A due to package  
Fig 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage  
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
4 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
5. Thermal characteristics  
Table 4.  
Symbol  
Rth(j-a)  
Thermal characteristics  
Parameter  
Conditions  
Min  
Typ  
60  
-
Max Unit  
thermal resistance from junction to ambient  
thermal resistance from junction to mounting base  
-
-
-
K/W  
K/W  
Rth(j-mb)  
0.5  
003aaa863  
1
Zth(j-mb)  
(K/W)  
δ
= 0.5  
0.2  
0.1  
10-1  
10-2  
10-3  
0.05  
tp  
T
P
δ =  
0.02  
single shot  
t
tp  
T
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
1
tp (s)  
Fig 4. Transient thermal impedance from junction to mounting base as a function of pulse duration  
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
5 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
6. Characteristics  
Table 5.  
Characteristics  
Tj = 25 °C unless otherwise specified.  
Symbol Parameter  
Conditions  
Min  
Typ  
Max Unit  
Static characteristics  
V(BR)DG  
drain-gate breakdown voltage ID = 2 mA; VGS = 0 V  
Tj = 25 °C  
34  
34  
-
-
45  
45  
-
V
V
V
Tj = 55 °C  
-
VDS(CL)  
VGS(th)  
drain-source clamping  
voltage  
IGD(CL) = 2 mA; ID = 1 A; see Figure 17 and 18  
41  
gate-source threshold voltage ID = 1 mA; VDS = VGS; see Figure 9 and 10  
Tj = 25 °C  
Tj = 175 °C  
Tj = 55 °C  
2
1
-
3
-
4
V
V
V
-
-
4.4  
IDSS  
drain leakage current  
VDS = 16 V; VGS = 0 V  
Tj = 25 °C  
-
0.1  
5
0.6  
50  
250  
-
µA  
µA  
µA  
V
Tj = 150 °C  
-
Tj = 175 °C  
-
30  
22  
V(BR)GSS gate-source breakdown  
voltage  
IG = ±1 mA; 55 °C < Tj < +175 °C  
20  
IGSS  
gate leakage current  
VGS = ±10 V; VDS = 0 V  
Tj = 25 °C  
-
-
5
-
1000 nA  
Tj = 175 °C  
50  
µA  
VGS = ±16 V; VDS = 0 V  
Tj = 175 °C  
-
-
150  
µA  
RDSon  
drain-source on-state  
resistance  
VGS = 10 V; ID = 25 A; see Figure 7 and 8  
Tj = 25 °C  
[1]  
-
-
-
2.9  
-
3.3  
6.3  
-
mΩ  
mΩ  
Tj = 175 °C  
RG  
gate resistance  
11  
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
6 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
Table 5.  
Characteristics …continued  
Tj = 25 °C unless otherwise specified.  
Symbol Parameter  
Conditions  
Min  
Typ  
Max Unit  
Dynamic characteristics  
QG(tot)  
QGS  
QGD  
Ciss  
Coss  
Crss  
td(on)  
tr  
total gate charge  
gate-source charge  
gate-drain charge  
input capacitance  
output capacitance  
reverse transfer capacitance  
turn-on delay time  
rise time  
ID = 25 A; VDS = 27 V; VGS = 10 V;  
see Figure 12  
-
-
-
-
-
-
-
-
-
-
-
109  
22  
-
-
-
nC  
nC  
nC  
55  
VGS = 0 V; VDS = 25 V; f = 1 MHz;  
see Figure 16  
5050 6730 pF  
1300 1560 pF  
510  
69  
690  
pF  
ns  
ns  
ns  
ns  
nH  
VDS = 30 V; RL = 1.2 ; VGS = 10 V; RG = 10 Ω  
-
-
-
-
-
150  
290  
210  
4.5  
td(off)  
tf  
turn-off delay time  
fall time  
LD  
internal drain inductance  
measure from drain lead 6 mm from package to  
center of die  
measure from contact screw on mounting base  
to center of die  
-
-
3.5  
7.5  
-
-
nH  
nH  
LS  
internal source inductance  
measure from source lead from package to  
source bonding pad  
Source-drain diode  
VSD  
trr  
source-drain voltage  
IS = 25 A; VGS = 0 V; see Figure 13  
-
-
-
0.85 1.2  
V
reverse recovery time  
recovered charge  
IS = 20 A; dIS/dt = 100 A/µs;  
93  
65  
-
-
ns  
nC  
VGS = 0 V; VR = 30 V  
Qr  
[1] RDSon measured at 1.5 mm away from the plastic body.  
003aaa869  
003aaa870  
300  
6
5
4
3
2
ID  
8
9
(A)  
RDSon  
7
10  
20  
(m)  
250  
200  
150  
100  
50  
6.5  
6
5
VGS (V) = 4.5  
0
0
2
4
6
8
10  
0
5
10  
15  
20  
V
DS (V)  
VGS (V)  
Tj = 25 °C  
Tj = 25 °C; ID = 25 A  
Fig 5. Output characteristics: drain current as a  
function of drain-source voltage; typical values  
Fig 6. Drain-source on-state resistance as a function  
of gate-source voltage; typical values  
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
7 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
03aa27  
003aaa873  
2
10  
RDSon  
a
(m)  
1.5  
1
8
6
4
2
5.5  
6
7
8
0.5  
VGS (V) = 10  
0
-60  
0
60  
120  
180  
0
40  
80  
120  
160  
200  
T ( C)  
°
j
ID (A)  
Tj = 25 °C  
RDSon  
a =  
-----------------------------  
RDSon(25°C )  
Fig 7. Drain-source on-state resistance as a function  
of drain current; typical values  
Fig 8. Normalized drain-source on-state resistance  
factor as a function of junction temperature  
03aa32  
03aa35  
1  
5
10  
V
I
D
(A)  
GS(th)  
(V)  
min  
typ  
max  
2  
3  
4  
5  
6  
4
3
2
1
0
10  
max  
typ  
10  
10  
10  
10  
min  
60  
0
60  
120  
180  
0
2
4
6
T (°C)  
j
V
(V)  
GS  
ID = 1 mA; VDS = VGS  
Tj = 25 °C; VDS = VGS  
Fig 9. Gate-source threshold voltage as a function of  
junction temperature  
Fig 10. Sub-threshold drain current as a function of  
gate-source voltage  
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
8 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
003aaa876  
003aaa877  
100  
ID  
10  
VGS  
(V)  
(A)  
80  
8
6
4
2
0
VDS = 14 V  
VDS = 27 V  
60  
40  
Tj = 175 °C  
Tj = 25 °C  
20  
0
0
2
4
6
0
50  
100  
150  
QG (nC)  
VGS (V)  
VDS = 25 V  
Tj = 25 °C; ID = 25 A  
Fig 11. Transfer characteristics: drain current as a  
function of gate-source voltage; typical values  
Fig 12. Gate-source voltage as a function of gate  
charge; typical values  
003aaa878  
003aaa868  
100  
102  
IS  
IAL  
(A)  
80  
(1)  
(A)  
10  
60  
40  
(2)  
(3)  
1
20  
Tj = 175 °C  
Tj = 25 °C  
0
0.0  
10-1  
0.2  
0.4  
0.6  
0.8 1.0  
VSD (V)  
10-3  
10-2  
10-1  
1
10  
tAL (ms)  
VGS = 0 V  
See Table note 5 of Table 3 “Limiting values”.  
(1) Single-pulse; Tj = 25 °C  
(2) Single-pulse; Tj = 150 °C  
(3) Repetitive  
Fig 13. Source (diode forward) current as a function of  
source-drain (diode forward) voltage; typical  
values  
Fig 14. Single-pulse and repetitive avalanche rating;  
avalanche current as a function of avalanche  
time  
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
9 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
003aaa874  
003aaa875  
100  
gfs  
8000  
6000  
4000  
2000  
0
C
(pF)  
(S)  
80  
60  
40  
20  
0
Ciss  
Coss  
Crss  
0
20  
40  
60  
10-1  
1
10  
102  
ID (A)  
VDS (V)  
Tj = 25 °C; VDS = 25 V  
VGS = 0 V; f = 1 MHz  
Fig 15. Forward transconductance as a function of  
drain current; typical values  
Fig 16. Input, output and reverse transfer capacitances  
as a function of drain-source voltage; typical  
values  
003aaa727  
003aac051  
44  
43  
VDS(CL)  
(V)  
VDS(CL)  
(V)  
42  
42  
Tj = 175 °C  
Tj = 175 °C  
Tj = 25 °C  
Tj = 25 °C  
41  
40  
Tj = -55 °C  
Tj = -55 °C  
40  
38  
39  
36  
0
2
4
6
8
10  
-3  
-2  
-1  
0
IGD(CL) (mA)  
ID (A)  
IGD(CL) = 2 mA  
ID = 10 A  
Fig 17. Drain-source clamping voltage as a function of  
drain current; typical values  
Fig 18. Drain-source clamping voltage as a function of  
gate-drain clamping current; typical values  
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
10 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
7. Package outline  
Plastic single-ended package; heatsink mounted; 1 mounting hole; 3 leads  
SOT78C  
E
p
A
A
1
mounting  
base  
q
D
1
q
1
D
q
2
L
Q
1
L
b
1
1
2
3
b
c
e
e
1
H
0
5
10 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
b
e
L
A
b
D
E
L
D
e
H
A
c
UNIT  
mm  
p
Q
q
q
q
2
1
1
1
1
1
1
4.58  
4.31  
1.33  
1.21  
0.87  
0.76  
1.33  
1.21  
0.44 15.07 6.47 10.40 2.64  
0.33 14.80 6.22 10.00 2.44  
5.16 6.03 14.00 6.10 3.90  
5.00 5.76 13.50 5.58 3.78  
2.72  
2.40  
2.95  
2.69  
3.80 12.40  
3.42 12.00  
Notes  
1. Terminals in this zone are not tinned.  
REFERENCES  
EUROPEAN  
PROJECTION  
OUTLINE  
VERSION  
ISSUE DATE  
IEC  
JEDEC  
JEITA  
01-12-11  
03-01-21  
SOT78C  
3-lead TO-220  
Fig 19. Package outline SOT78C (TO-220)  
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
11 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
8. Revision history  
Table 6.  
Document ID  
BUK7L3R3-34BRC_2 20070926  
Revision history  
Release date  
Data sheet status  
Change notice  
Supersedes  
Product data sheet  
-
BUK7L3R3-34BRC_1  
Modifications:  
Table 5: updated maximum value of drain leakage current  
Table 5: added Table note 1  
BUK7L3R3-34BRC_1 20070515  
Product data sheet  
-
-
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
12 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
9. Legal information  
9.1  
Data sheet status  
Document status[1][2]  
Product status[3]  
Definition  
Objective [short] data sheet  
Development  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL http://www.nxp.com.  
result in personal injury, death or severe property or environmental damage.  
NXP Semiconductors accepts no liability for inclusion and/or use of NXP  
Semiconductors products in such equipment or applications and therefore  
9.2  
Definitions  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
such inclusion and/or use is at the customer’s own risk.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) may cause permanent  
damage to the device. Limiting values are stress ratings only and operation of  
the device at these or any other conditions above those given in the  
Characteristics sections of this document is not implied. Exposure to limiting  
values for extended periods may affect device reliability.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
Terms and conditions of sale — NXP Semiconductors products are sold  
subject to the general terms and conditions of commercial sale, as published  
at http://www.nxp.com/profile/terms, including those pertaining to warranty,  
intellectual property rights infringement and limitation of liability, unless  
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of  
any inconsistency or conflict between information in this document and such  
terms and conditions, the latter will prevail.  
9.3  
Disclaimers  
General — Information in this document is believed to be accurate and  
reliable. However, NXP Semiconductors does not give any representations or  
warranties, expressed or implied, as to the accuracy or completeness of such  
information and shall have no liability for the consequences of use of such  
information.  
No offer to sell or license — Nothing in this document may be interpreted  
or construed as an offer to sell products that is open for acceptance or the  
grant, conveyance or implication of any license under any copyrights, patents  
or other industrial or intellectual property rights.  
Right to make changes — NXP Semiconductors reserves the right to make  
changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
9.4  
Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
Suitability for use — NXP Semiconductors products are not designed,  
authorized or warranted to be suitable for use in medical, military, aircraft,  
space or life support equipment, nor in applications where failure or  
malfunction of a NXP Semiconductors product can reasonably be expected to  
TrenchMOS — is a trademark of NXP B.V.  
10. Contact information  
For additional information, please visit: http://www.nxp.com  
For sales office addresses, send an email to: salesaddresses@nxp.com  
BUK7L3R3-34BRC_2  
© NXP B.V. 2007. All rights reserved.  
Product data sheet  
Rev. 02 — 26 September 2007  
13 of 14  
BUK7L3R3-34BRC  
NXP Semiconductors  
N-channel TrenchPLUS standard level FET  
11. Contents  
1
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
1.1  
1.2  
1.3  
1.4  
General description. . . . . . . . . . . . . . . . . . . . . . 1  
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Quick reference data. . . . . . . . . . . . . . . . . . . . . 1  
2
3
4
5
6
7
8
Pinning information. . . . . . . . . . . . . . . . . . . . . . 1  
Ordering information. . . . . . . . . . . . . . . . . . . . . 2  
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 3  
Thermal characteristics. . . . . . . . . . . . . . . . . . . 5  
Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Package outline . . . . . . . . . . . . . . . . . . . . . . . . 11  
Revision history. . . . . . . . . . . . . . . . . . . . . . . . 12  
9
Legal information. . . . . . . . . . . . . . . . . . . . . . . 13  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 13  
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
9.1  
9.2  
9.3  
9.4  
10  
11  
Contact information. . . . . . . . . . . . . . . . . . . . . 13  
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2007.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 26 September 2007  
Document identifier: BUK7L3R3-34BRC_2  

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