BUK9540 [NXP]
TrenchMOS transistor Logic level FET; 的TrenchMOS晶体管逻辑电平场效应管型号: | BUK9540 |
厂家: | NXP |
描述: | TrenchMOS transistor Logic level FET |
文件: | 总9页 (文件大小:77K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
BUK9540-100A
BUK9640-100A
GENERAL DESCRIPTION
QUICK REFERENCE DATA
N-channel enhancement mode logic
level field-effect power transistor in a
plastic envelope available in
TO220AB and SOT404 . Using
’trench’ technology which features
very low on-state resistance. It is
intended for use in automotive and
SYMBOL
PARAMETER
MAX.
UNIT
VDS
ID
Ptot
Tj
Drain-source voltage
Drain current (DC)
Total power dissipation
Junction temperature
Drain-source on-state
100
37
138
175
V
A
W
˚C
RDS(ON)
general
purpose
switching
resistance
VGS = 5 V
VGS = 10 V
40
39
mΩ
mΩ
applications.
PINNING
TO220AB & SOT404
PIN CONFIGURATION
SYMBOL
PIN DESCRIPTION
tab
d
mb
1
2
3
gate
drain
source
2
g
1
2 3
1
3
TO220AB
SOT404
tab/mb drain
s
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
VDS
Drain-source voltage
Drain-gate voltage
Gate-source voltage
Non-repetitive gate-source voltage tp≤50µS
-
-
-
-
-
100
100
10
V
V
V
V
VDGR
±VGS
±VGSM
RGS = 20 kΩ
-
15
ID
ID
IDM
Ptot
Tstg, Tj
Drain current (DC)
Drain current (DC)
Drain current (pulse peak value)
Total power dissipation
Storage & operating temperature
Tmb = 25 ˚C
-
-
-
-
37
26
149
138
175
A
A
A
W
˚C
Tmb = 100 ˚C
Tmb = 25 ˚C
Tmb = 25 ˚C
-
- 55
THERMAL RESISTANCES
SYMBOL PARAMETER
CONDITIONS
TYP.
MAX.
UNIT
Rth j-mb
Rth j-a
Rth j-a
Thermal resistance junction to
mounting base
Thermal resistance junction to
ambient(TO220AB)
Thermal resistance junction to
ambient(SOT404)
-
-
1.1
K/W
in free air
60
50
-
-
K/W
K/W
Minimum footprint, FR4
board
December 1999
1
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
BUK9540-100A
BUK9640-100A
STATIC CHARACTERISTICS
Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
MIN. TYP. MAX. UNIT
V(BR)DSS
VGS(TO)
Drain-source breakdown
voltage
Gate threshold voltage
VGS = 0 V; ID = 0.25 mA;
100
89
1
0.5
-
-
-
-
-
-
-
-
-
-
-
-
V
V
V
V
V
µA
µA
nA
mΩ
mΩ
mΩ
mΩ
Tj = -55˚C
VDS = VGS; ID = 1 mA
1.5
-
-
0.05
-
2
30
-
29
31
2.0
-
Tj = 175˚C
Tj = -55˚C
2.3
10
500
100
40
100
39
43
IDSS
Zero gate voltage drain current VDS = 100 V; VGS = 0 V;
Tj = 175˚C
Tj = 175˚C
IGSS
RDS(ON)
Gate source leakage current
Drain-source on-state
resistance
VGS = ±10 V; VDS = 0 V
VGS = 5 V; ID = 25 A
VGS = 10 V; ID = 25 A
VGS = 4.5 V; ID = 25 A
DYNAMIC CHARACTERISTICS
Tmb = 25˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
MIN. TYP. MAX. UNIT
Ciss
Coss
Crss
Input capacitance
Output capacitance
Feedback capacitance
VGS = 0 V; VDS = 25 V; f = 1 MHz
-
-
-
2304 3072
pF
pF
pF
222
151
266
207
td on
tr
td off
tf
Turn-on delay time
Turn-on rise time
Turn-off delay time
Turn-off fall time
VDD = 30 V; Rload =1.2Ω;
VGS = 5 V; RG = 10 Ω
-
-
-
-
20
135
125
90
30
ns
ns
ns
ns
189
189
135
Ld
Ld
Ld
Ls
Internal drain inductance
Internal drain inductance
Internal drain inductance
Internal source inductance
Measured from drain lead 6 mm
from package to centre of die
Measured from contact screw on
tab to centre of die(TO220AB)
Measured from upper edge of drain
tab to centre of die(SOT404)
Measured from source lead to
source bond pad
-
-
-
-
4.5
3.5
2.5
7.5
-
-
-
-
nH
nH
nH
nH
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
MIN. TYP. MAX. UNIT
IDR
Continuous reverse drain
current
-
-
37
A
IDRM
VSD
Pulsed reverse drain current
Diode forward voltage
-
-
-
-
149
1.2
-
A
V
V
IF = 25 A; VGS = 0 V
IF = 37 A; VGS = 0 V
0.85
1.1
trr
Qrr
Reverse recovery time
Reverse recovery charge
IF = 37 A; -dIF/dt = 100 A/µs;
VGS = -10 V; VR = 30 V
-
-
60
0.24
-
-
ns
µC
December 1999
2
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
BUK9540-100A
BUK9640-100A
AVALANCHE LIMITING VALUE
SYMBOL PARAMETER
CONDITIONS
MIN. TYP. MAX. UNIT
1
WDSS
Drain-source non-repetitive
unclamped inductive turn-off
energy
ID = 25 A; VDD ≤ 25 V;
-
-
31
mJ
VGS = 5 V; RGS = 50 Ω; Tmb = 25 ˚C
Normalised Power Derating
1000
ID/A
PD%
120
110
100
90
80
70
60
50
40
30
20
10
0
RDS(ON)=VDS/ID
100
tp =
1us
10us
100us
10
1ms
DC
10ms
100ms
100
0
20
40
60
80
Tmb /
100 120 140 160 180
C
1
1000
10
1
VDS/V
Fig.1. Normalised power dissipation.
PD% = 100 PD/PD 25 ˚C = f(Tmb)
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter tp
Normalised Current Derating
ID%
10
120
110
100
90
80
70
60
50
40
30
20
10
0
Zth/(K/W)
1
0.5
0.2
0.1
0.01
0.1
0.05
0.02
0
0.001
1E-07
1E-05
1E-03
1E-01
1E+01
0
20
40
60
80
100 120 140 160 180
t/s
Tmb /
C
Fig.2. Normalised continuous drain current.
ID% = 100 ID/ID 25 ˚C = f(Tmb); conditions: VGS ≥ 5 V
Fig.4. Transient thermal impedance.
Zth j-mb = f(t); parameter D = tp/T
1 For maximum permissible repetive avanche current see fig.18.
December 1999
3
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
BUK9540-100A
BUK9640-100A
VGS/V =
120
Drain current, ID (A)
VDS > ID X RDS(ON)
5.0
40
35
30
25
20
15
10
5
10.0
4.0
3.8
3.6
3.4
ID/A
100
80
60
40
20
0
Tj = 25 C
3.2
3.0
175 C
2.8
2.6
2.4
0
0
1
2
3
4
5
6
7
8
9
10
0
2
4
6
8
10
Gate-source voltage, VGS (V)
VDS/V
Fig.5. Typical output characteristics, Tj = 25 ˚C.
ID = f(VDS); parameter VGS
Fig.8. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V; parameter Tj
50
70
gfs/S
3.0
ID/A
60
50
40
30
20
10
0
45
40
35
30
25
20
3.2
3.4
3.6
4.0
5.0
10
20
30
40
50
60
70
0
10
20
30
40
ID/A
VDS/V
Fig.6. Typical on-state resistance, Tj = 25 ˚C.
RDS(ON) = f(ID); parameter VGS
Fig.9. Typical transconductance, Tj = 25 ˚C.
gfs = f(ID); conditions: VDS = 25 V
Rds(on) normalised to 25degC
a
3
2.5
2
38
36
34
32
30
28
26
1.5
1
0.5
3
4
5
6
7
8
9
10
-100
-50
0
50
100
150
200
VGS/V
Tmb / degC
Fig.7. Typical on-state resistance, Tj = 25 ˚C.
RDS(ON) = f(VGS); conditions: ID = 25 A;
Fig.10. Normalised drain-source on-state resistance.
a = RDS(ON)/RDS(ON)25 ˚C = f(Tj); ID = 25 A; VGS = 5 V
December 1999
4
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
BUK9540-100A
BUK9640-100A
VGS(TO) / V
2.5
5
VGS / V
max.
2
4
3
2
1
0
VDS = 14V
VDS = 44V
typ.
1.5
min.
1
0.5
0
-100
-50
0
50
Tj / C
100
150
200
0
10
20
30
40
50
QG / nC
Fig.11. Gate threshold voltage.
VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
Fig.14. Typical turn-on gate-charge characteristics.
VGS = f(QG); conditions: ID = 25 A; parameter VDS
Sub-Threshold Conduction
Source-Drain Diode Current, IF (A)
VGS = 0 V
1E-01
50
45
40
35
30
25
20
15
10
5
1E-02
1E-03
1E-04
1E-05
1E-05
2%
typ
98%
175 C
Tj = 25 C
0
0
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9
1
1.1 1.2 1.3 1.4 1.5
Source-Drain Voltage, VSDS (V)
0
0.5
1
1.5
2
2.5
3
Fig.12. Sub-threshold drain current.
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS
Fig.15. Typical reverse diode current.
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj
WDSS%
120
110
100
90
80
70
60
50
40
30
20
10
0
5
4.5
4
3.5
3
2.5
Ciss
2
1.5
1
0.5
0
Coss
Crss
0.01
0.1
1
10
100
20
40
60
80
100
120
140
160
180
VDS/V
Tmb /
C
Fig.13. Typical capacitances, Ciss, Coss, Crss.
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
Fig.16. Normalised avalanche energy rating.
WDSS% = f(Tmb); conditions: ID = 75 A
December 1999
5
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
BUK9540-100A
BUK9640-100A
VDD
VDD
+
+
-
RD
L
VDS
VDS
-
VGS
0
VGS
0
-ID/100
RG
T.U.T.
T.U.T.
R 01
shunt
RGS
Fig.17. Avalanche energy test circuit.
Fig.19. Switching test circuit.
WDSS = 0.5 LID2 BVDSS/(BVDSS − VDD
)
100
25ºC
IAV
10
Tj prior to avanche 150ºC
1
0.001
0.01
0.1
1
10
Avalanche Time, tAV (ms)
Fig.18. Maximum permissible repetitive avalanche
current(IAV) versus avalanche time(tAV) for unclamped
inductive loads.
December 1999
6
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
BUK9540-100A
BUK9640-100A
MECHANICAL DATA
Dimensions in mm
Net Mass: 2 g
4,5
max
10,3
max
1,3
3,7
2,8
5,9
min
15,8
max
3,0 max
not tinned
3,0
13,5
min
1,3
1 2 3
max
(2x)
0,9 max (3x)
0,6
2,4
2,54 2,54
Fig.20. SOT78 (TO220AB); pin 2 connected to mounting base.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Refer to mounting instructions for SOT78 (TO220) envelopes.
3. Epoxy meets UL94 V0 at 1/8".
December 1999
7
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
BUK9540-100A
BUK9640-100A
MECHANICAL DATA
2
Plastic single-ended surface mounted package (Philips version of D -PAK); 3 leads
(one lead cropped)
SOT404
A
A
E
1
mounting
base
D
1
D
H
D
2
L
p
1
3
c
b
e
e
Q
0
2.5
5 mm
scale
DIMENSIONS (mm are the original dimensions)
D
E
A
A
b
UNIT
c
D
e
L
H
Q
1
1
p
D
max.
4.50
4.10
1.40
1.27
0.85
0.60
0.64
0.46
1.60
1.20
10.30
9.70
2.90 15.40 2.60
2.10 14.80 2.20
mm
11
2.54
REFERENCES
JEDEC
EUROPEAN
PROJECTION
OUTLINE
VERSION
ISSUE DATE
IEC
EIAJ
98-12-14
99-06-25
SOT404
Fig.21. SOT404 surface mounting package. Centre pin connected to mounting base.
Notes
1. This product is supplied in anti-static packaging. The gate-source input must be protected against static
discharge during transport or handling.
2. Refer to SMD Footprint Design and Soldering Guidelines, Data Handbook SC18.
3. Epoxy meets UL94 V0 at 1/8".
December 1999
8
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
BUK9540-100A
BUK9640-100A
MOUNTING INSTRUCTIONS
Dimensions in mm
11.5
9.0
17.5
2.0
3.8
5.08
Fig.22. SOT404 : soldering pattern for surface mounting.
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and
operation of the device at these or at any other conditions above those given in the Characteristics sections of
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1999
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the
copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any
consequence of its use. Publication thereof does not convey nor imply any license under patent or other
industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these
products can be reasonably expected to result in personal injury. Philips customers using or selling these products
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting
from such improper use or sale.
December 1999
9
Rev 1.000
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