BUT12XI [NXP]

Silicon Diffused Power Transistor; 硅扩散型功率晶体管
BUT12XI
型号: BUT12XI
厂家: NXP    NXP
描述:

Silicon Diffused Power Transistor
硅扩散型功率晶体管

晶体 晶体管
文件: 总7页 (文件大小:61K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT12XI  
GENERAL DESCRIPTION  
Improved high-voltage, high-speed glass-passivated npn power transistor in a plastic full-pack envelope specially  
suited for overhead/high frequency lighting ballast applications and converters, inverters, switching regulators,  
motor control systems, etc.  
QUICK REFERENCE DATA  
SYMBOL PARAMETER  
CONDITIONS  
TYP. MAX. UNIT  
VCESM  
VCEO  
IC  
Collector-emitter voltage peak value  
VBE = 0 V  
-
-
-
-
-
-
1000  
450  
8
V
V
Collector-emitter voltage (open base)  
Collector current (DC)  
A
ICM  
Collector current peak value  
Total power dissipation  
Collector-emitter saturation voltage  
20  
A
W
V
Ptot  
VCEsat  
Ths 25 ˚C  
33  
1.5  
IC = 5.0 A;IB = 0.86 A  
ICsat  
tf  
Collector saturation current  
Inductive fall time  
5
-
-
A
ns  
ICon = 5.0A;IBon = 1.0A,Tj 100˚C  
300  
PINNING - SOT186A  
PIN CONFIGURATION  
SYMBOL  
PIN  
1
DESCRIPTION  
c
case  
base  
2
collector  
emitter  
b
3
case isolated  
1
2 3  
e
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum Rating System (IEC 134)  
SYMBOL PARAMETER  
CONDITIONS  
MIN. MAX. UNIT  
VCESM  
VCEO  
IC  
Collector-emitter voltage peak value  
VBE = 0 V  
-
1000  
450  
8
V
V
Collector-emitter voltage (open base)  
Collector current (DC)  
-
-
A
ICM  
IB  
Collector current peak value  
Base current (DC)  
-
20  
A
-
4
6
33  
150  
150  
A
IBM  
Ptot  
Tstg  
Tj  
Base current peak value  
Total power dissipation  
Storage temperature  
-
-
A
Ths 25 ˚C  
W
˚C  
˚C  
-65  
-
Junction temperature  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
TYP. MAX. UNIT  
Rth j-hs  
Rth j-a  
Junction to heatsink  
Junction to ambient  
with heatsink compound  
in free air  
-
3.65  
-
K/W  
K/W  
55  
June 1997  
1
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT12XI  
ISOLATION LIMITING VALUE & CHARACTERISTIC  
Ths = 25 ˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
Visol  
Cisol  
R.M.S. isolation voltage from all f = 50-60 Hz; sinusoidal  
-
2500  
V
three terminals to external  
heatsink  
waveform;  
R.H. 65% ; clean and dustfree  
Capacitance from T2 to external f = 1 MHz  
heatsink  
-
10  
-
pF  
STATIC CHARACTERISTICS  
Ths = 25 ˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
ICES  
ICES  
Collector cut-off current 1  
VBE = 0 V; VCE = VCESMmax  
VBE = 0 V; VCE = VCESMmax  
Tj = 125 ˚C  
-
-
-
-
1.0  
3.0  
mA  
mA  
;
IEBO  
VCEOsust  
Emitter cut-off current  
Collector-emitter sustaining voltage IB = 0 A; IC = 100 mA;  
L = 25 mH  
Collector-emitter saturation voltages IC = 5 A; IB = 0.86 A  
Base-emitter saturation voltage  
DC current gain  
VEB = 9 V; IC = 0 A  
-
-
-
10  
-
mA  
V
450  
VCEsat  
VBEsat  
hFE  
-
-
10  
14  
-
-
18  
20  
1.5  
1.3  
35  
V
V
IC = 5 A; IB = 0.86 A  
IC = 10 mA; VCE = 5 V  
IC = 1 A; VCE = 5 V  
hFE  
35  
hFEsat  
IC = 5 A; VCE = 1.5 V  
5.8  
10  
12.5  
DYNAMIC CHARACTERISTICS  
Ths = 25 ˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
TYP. MAX. UNIT  
Switching times (resistive load)  
ICon = 5.0 A; IBon = -IBoff = 1.0 A  
ton  
ts  
tf  
Turn-on time  
-
-
-
1.0  
4.0  
0.8  
µs  
µs  
µs  
Turn-off storage time  
Turn-off fall time  
Switching times (inductive load)  
I
Con = 5.0 A; IBon = 1.0 A; LB = 1 µH;  
-VBB = 5 V; Tj = 100 ˚C  
ts  
tf  
Turn-off storage time  
Turn-off fall time  
1.9  
150  
2.5  
300  
µs  
ns  
1 Measured with half sine-wave voltage (curve tracer).  
June 1997  
2
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT12XI  
ICon  
90 %  
90 %  
+ 50v  
100-200R  
IC  
10 %  
ts  
Horizontal  
Oscilloscope  
Vertical  
tf  
ton  
toff  
IBon  
IB  
10 %  
1R  
300R  
tr 30ns  
6V  
30-60 Hz  
-IBoff  
Fig.1. Test circuit for VCEOsust  
.
Fig.4. Switching times waveforms with resistive load.  
IC / mA  
VCC  
LC  
250  
200  
IBon  
LB  
100  
0
T.U.T.  
-VBB  
min  
VCE / V  
VCEOsust  
Fig.2. Oscilloscope display for VCEOsust  
.
Fig.5. Test circuit inductive load.  
VCC = 300 V; -VBE = 5 V;LB = 1 uH  
ICon  
90 %  
VCC  
IC  
R
L
VIM  
10 %  
R
B
tf  
ts  
t
0
T.U.T.  
toff  
tp  
IBon  
IB  
T
t
-IBoff  
Fig.3. Test circuit resistive load. VIM = -6 to +8 V  
Fig.6. Switching times waveforms with inductive load.  
VCC = 250 V; tp = 20 µs; δ = tp / T = 0.01.  
RB and RL calculated from ICon and IBon requirements.  
June 1997  
3
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT12XI  
VCEsat / V  
VCC  
1
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0
IC/IB=  
12  
10  
8
LC  
5
VCL  
Tj = 25 C  
Tj = 125 C  
IBend  
-VBB  
LB  
CFB  
T.U.T.  
0.1  
1
10  
IC / A  
Fig.7. Test circuit RBSOA. VCC = 150 V; -VBB = 5 V  
Fig.10. Typical collector-emitter saturation voltage.  
VCEsat = f(IC); parameter IC/IB  
LC = 200 µH; VCL 850 V; LB = 1 µH  
VBEsat / V  
1.2  
Tj = 25 C  
Tj = 125 C  
1.1  
Normalised Power Derating  
PD%  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
1
0.9  
IC =  
0.8  
0.7  
6A  
3A  
2A  
0.6  
0
0.4  
0.8  
1.2  
1.6  
2
2.4  
0
20  
40  
60  
80  
Tmb /  
100  
120  
140  
C
IB / A  
Fig.8. Normalised power dissipation.  
PD% = 100 PD/PD 25˚C = f (Tmb)  
Fig.11. Typical base-emitter saturation voltage.  
VBEsat = f(IB); parameter IC  
VBEsat / V  
VCEsat / V  
10  
1.2  
1.1  
1
Tj = 25 C  
Tj = 125 C  
Tj = 25 C  
Tj = 125 C  
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
6A  
1
4A  
IC/IB=  
8
10  
IC=2A  
12  
0.1  
0.1  
1
IC / A  
10  
0.1  
1
IB / A  
10  
Fig.9. Typical base-emitter saturation voltage.  
VBEsat = f(IC); parameter IC/IB  
Fig.12. Typical collector-emitter saturation voltage.  
VCEsat = f(IB); parameter IC  
June 1997  
4
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT12XI  
hFE  
IC / A  
100  
100  
10  
1
5V  
ICMmax  
10  
1V  
Tj = 25 C  
Tj = 125 C  
ICmax  
II  
0.01  
0.1  
10  
1
1
IC / A  
Fig.14. Typical DC current gain. hFE = f(IC)  
parameter VCE  
I
IC / A  
0.1  
8
7
6
5
DC  
0.01  
4
3
2
1
1
10  
100  
1000  
VCE / V  
Fig.13. Forward bias safe operating area. Tmb = 25˚C  
I
Region of permissible DC operation.  
Extension for repetitive pulse operation.  
Mounted with heatsink compound and  
30 ± 5 newton force on the centre of the  
envelope.  
0
0
200  
400  
600  
800  
1000  
II  
VCE / V  
NB:  
Fig.15. Reverse bias safe operating area. Tj Tj max  
Zth / (K/W)  
BUX100  
1E+01  
1E+00  
1E-01  
1E-02  
1.0  
0.5  
0.2  
0.1  
0.05  
tp  
t
p
P
D
D =  
0.02  
D=0  
T
t
T
1E-05  
1E-03  
t / s  
1E-01  
1E+01  
Fig.16. Transient thermal impedance. Zth j-mb = f(t); parameter D= tp/T  
June 1997  
5
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT12XI  
MECHANICAL DATA  
Dimensions in mm  
Net Mass: 2 g  
10.3  
max  
4.6  
max  
3.2  
3.0  
2.9 max  
2.8  
Recesses (2x)  
2.5  
6.4  
0.8 max. depth  
15.8  
max  
seating  
plane  
15.8  
max.  
19  
max.  
3 max.  
not tinned  
3
2.5  
13.5  
min.  
1
2
3
M
0.4  
1.0 (2x)  
0.6  
2.5  
0.9  
0.7  
2.54  
0.5  
5.08  
1.3  
Fig.17. SOT186A; The seating plane is electrically isolated from all terminals.  
Notes  
1. Refer to mounting instructions for F-pack envelopes.  
2. Epoxy meets UL94 V0 at 1/8".  
June 1997  
6
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT12XI  
DEFINITIONS  
Data sheet status  
Objective specification  
This data sheet contains target or goal specifications for product development.  
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.  
Product specification  
This data sheet contains final product specifications.  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 1997  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
June 1997  
7
Rev 1.000  

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