CD3207BB [NXP]

7-bit Futurebus transceiver; 7位FUTUREBUS收发
CD3207BB
型号: CD3207BB
厂家: NXP    NXP
描述:

7-bit Futurebus transceiver
7位FUTUREBUS收发

线路驱动器或接收器 驱动程序和接口 接口集成电路
文件: 总14页 (文件大小:151K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
INTEGRATED CIRCUITS  
FB2041  
7-bit Futurebus+ transceiver  
Product specification  
IC19 Data Handbook  
1995 May 25  
Philips  
Semiconductors  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
DESCRIPTION  
Allows incident wave switching in heavily loaded backplane buses  
The FB2041 is a 7-bit bidirectional BTL transceiver and is intended  
to provide the electrical interface to a high performance wired-OR  
bus. The FB2041 is an inverting transceiver.  
Reduced BTL voltage swing produces less noise and reduces  
power consumption  
Built-in precision band-gap reference provides accurate receiver  
The B-port drivers are Low-capacitance open collectors with  
controlled ramp and are designed to sink 100mA. Precision band  
gap references on the B-port insure very good noise margins by  
limiting the switching threshold to a narrow region centered at 1.55V.  
thresholds and improved noise immunity  
Compatible with IEEE Futurebus+ or proprietary BTL backplanes  
Controlled output ramp and multiple GND pins minimize ground  
bounce  
FEATURES  
Each BTL driver has a dedicated Bus GND for a signal return  
Glitch-free power up/power down operation  
7-bit BTL transceiver  
Separate I/O on TTL A-port  
Inverting  
Low I current  
CC  
Tight output skew  
Three separate pairs of driver enables in a 1 bit, 3 bit, 3 bit  
Supports live insertion  
arrangement  
Pins for the optional JTAG boundary scan function are provided  
High density packaging in plastic Quad Flatpack  
Drives heavily loaded backplanes with equivalent load  
impedances down to 10.  
High drive 100mA BTL open collector drivers on B-port  
QUICK REFERENCE DATA  
SYMBOL  
PARAMETER  
TYPICAL  
3.7  
2.7  
3.4  
3.2  
6
UNIT  
t
t
t
t
Propagation delay  
AIn to Bn  
PLH  
PHL  
PLH  
PHL  
ns  
Propagation delay  
Bn to AOn  
ns  
C
Output capacitance (B0 - B6 only)  
Output current (B0 - B6 only)  
pF  
OB  
I
OL  
100  
19  
mA  
Standby  
AIn to Bn (outputs Low or High)  
Bn to AOn (outputs Low)  
Bn to AOn (outputs High)  
40  
I
Supply Current  
mA  
CC  
22  
19  
ORDERING INFORMATION  
PACKAGE  
COMMERCIAL RANGE  
= 5V±10%; T = 0 to +70°C  
INDUSTRIAL RANGE  
DWG  
No.  
V
CC  
V
CC  
= 5V±10%; T = -40 to +85°C  
amb  
amb  
52-pin Plastic Quad Flatpack  
FB2041BB  
CD3207BB  
SOT379-1  
2
1995 May 25  
853-1561 15279  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
PIN CONFIGURATION  
52 51 50 49 48 47 46 45 44 43 42 41 40  
LOGIC GND  
AI1  
BUS GND  
1
2
3
4
5
6
7
39  
38 B1  
AI2  
37 BUS GND  
36 B2  
AO2  
7-Bit Transceiver  
FB2041  
35  
34  
33  
LOGIC GND  
BUS GND  
AO3  
B3  
LOGIC GND  
BUS GND  
AI3  
AI4  
B4  
8
32  
31  
30  
29  
28  
52-lead PQFP  
9
BUS GND  
B5  
10  
11  
12  
AO4  
LOGIC GND  
AO5  
BUS GND  
B6  
LOGIC GND 13  
27 BUS GND  
14 15 16 17 18 19 20 21 22 23 24 25 26  
The B-port interfaces to “Backplane Transceiver Logic” (See the  
IEEE 1194.1 BTL standard). BTL features low power consumption  
by reducing voltage swing (1Vp-p, between 1V and 2V) and reduced  
capacitive loading by placing an internal series diode on the drivers.  
BTL also provides incident wave switching, a necessity for high  
performance backplanes.  
To support live insertion, OEB0 is held Low during power on/off  
cycles to insure glitch free B port drivers. Proper bias for B port  
drivers during live insertion is provided by the BIAS V pin when at a  
5V level while V is Low. If live insertion is not a requirement, the  
CC  
BIAS V pin should be tied to a V pin.  
CC  
The LOGIC GND and BUS GND pins are isolated in the package to  
minimize noise coupling between the BTL and TTL sides. These  
pins should be tied to a common ground external to the package.  
There are three separate pairs of driver enables in a 1 bit, 3 bit, 3 bit  
arrangement. The TTL/BTL output drivers for bit 0 are enabled with  
OEA1/OEB1, output drivers for bits 1–2–3 are enabled with  
OEA2/OEB2 and output drivers for bits 4–5–6 are enabled with  
OEA3/OEB3.  
Each BTL driver has an associated BUS GND pin that acts as a  
signal return path and these BUS GND pins are internally isolated  
from each other. In the event of a ground return fault, a “hard” signal  
failure occurs instead of a pattern dependent error that may be very  
infrequent and impossible to trouble-shoot.  
The A-port operates at TTL levels with separate I/O. The 3-state  
A-port drivers are enabled when OEAn goes High after an extra 6ns  
delay which is built in to provide a break-before-make function.  
When OEAn goes Low, A-port drivers become High impedance  
without any extra delay. During power on/off cycles, the A-port  
The LOGIC V and BUS V pins are also isolated internally to  
CC  
CC  
minimize noise and may be externally decoupled separately or  
simply tied together.  
drivers are held in a High impedance state when V is below 2.5V.  
CC  
JTAG boundary scan functionality is provided as an option with  
signals TMS, TCK, TDI and TDO. When this option is not present,  
TMS and TCK are no-connects (no bond wires) and TDI and TDO  
are shorted together internally.  
The B-port has an output enable, OEB0, which affects all seven  
drivers. When OEB0 is High and OEBn is Low the output driver will  
be enabled. When OEB0 is Low or if OEBn is High, the B-port  
drivers will be inactive and at the level of the backplane signal.  
3
1995 May 25  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
PIN DESCRIPTION  
SYMBOL  
AI0 – AI6  
AO0 – AO6  
B0 – B6  
OEB0  
PIN NUMBER  
TYPE  
Input  
Output  
I/O  
NAME AND FUNCTION  
51, 2, 3, 8, 9, 14, 18  
Data inputs (TTL)  
50, 52, 4, 6, 10, 12, 16  
3-state outputs (TTL)  
40, 38, 36, 34, 32, 30, 28  
Data inputs/Open Collector outputs, High current drive (BTL)  
Enables the Bn outputs when High  
Enables the B0 output when Low  
Enables the B1 – B3 outputs when Low  
Enables the B4 – B6 outputs when Low  
Enables the A0 outputs when High  
Enables the A1 – A3 outputs when High  
Enables the A4 – A6 outputs when High  
Bus ground (0V)  
46  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
GND  
GND  
Power  
Power  
Power  
Input  
Input  
Input  
Output  
OEB1  
45  
OEB2  
25  
OEB3  
26  
OEA1  
47  
OEA2  
20  
OEA3  
24  
BUS GND  
LOGIC GND  
41, 39, 37, 35, 33, 31, 29, 27  
1, 5, 7, 11, 13, 15, 19  
Logic ground (0V)  
BUS V  
23, 43  
17, 49  
48  
Positive supply voltage  
CC  
LOGIC V  
Positive supply voltage  
CC  
BIAS V  
TMS  
TCK  
Positive supply voltage  
42  
Test Mode Select (no-connect)  
Test Clock (no-connect)  
44  
TDI  
22  
Test Data In (shorted to TDO)  
Test Data Out (TDI)  
TDO  
21  
ABSOLUTE MAXIMUM RATINGS  
Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the  
operating free-air temperature range.  
SYMBOL  
PARAMETER  
RATING  
UNIT  
V
Supply voltage  
Input voltage  
-0.5 to +7.0  
-1.2 to +7.0  
-1.2 to +5.5  
-18 to +5.0  
V
V
CC  
AI0 – AI6, OEB0, OEBn, OEAn  
V
IN  
B0 – B6  
I
IN  
Input current  
mA  
V
V
OUT  
Voltage applied to output in High output state  
Current applied to output in  
Low output state  
-0.5 to +V  
48  
CC  
AO0 – AO6  
B0 – B6  
mA  
I
OUT  
200  
T
STG  
Storage temperature  
-65 to +150  
°C  
RECOMMENDED OPERATING CONDITIONS  
COMMERCIAL LIMITS  
INDUSTRIAL LIMITS  
V
CC  
= 5V±10%;  
V
CC  
= 5V±10%;  
PARAMETER  
SYMBOL  
UNIT  
T
amb  
= 0 to +70°C  
T
amb  
= -40 to +85°C  
MIN  
4.5  
TYP  
MAX  
MIN  
4.5  
TYP  
MAX  
V
Supply voltage  
5.0  
5.5  
5.0  
5.5  
V
V
CC  
Except B0–B6  
B0 – B6  
2.0  
2.0  
V
High-level input voltage  
IH  
1.62  
1.55  
1.62  
1.55  
Except B0–B6  
B0 – B6  
0.8  
1.47  
-18  
-3  
0.8  
1.47  
-18  
-3  
V
V
Low-level input voltage  
IL  
I
IK  
Input clamp current  
mA  
mA  
mA  
I
High-level output current  
AO0 – AO6  
AO0 – AO6  
B0 – B6  
OH  
24  
24  
I
OL  
Low-level output current  
100  
7
100  
7
C
Output capacitance on B port  
6
6
pF  
OB  
T
amb  
Operating free-air temperature range  
0
+70  
-40  
+85  
°C  
4
1995 May 25  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
FUNCTION TABLE  
MODE  
AIn  
L
INPUTS  
OUTPUTS  
Bn*  
X
OEB0 OEB1 OEB2 OEB3 OEA1 OEA2 OEA3  
AOn  
Z
Z
L
Bn*  
H**  
L
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
L
L
L
L
L
L
L
L
L
L
L
L
L
AIn to Bn  
H
L
L
L
L
H
H
L
H
H
L
H
H
L
H**  
L
H
L
L
L
L
H
Z
Z
L
L
X
X
X
X
L
X
X
X
X
X
X
X
X
L
H**  
L
AI0 to B0  
H
L
L
L
L
L
L
H
H
L
H
H
L
H
H
L
H**  
L
H
L
L
H
Z
Z
L
X
X
X
X
X
X
X
X
X
H
H
X
X
X
X
H
H
X
X
H
H
X
X
H
H
X
X
H
H
X
X
X
X
H**  
L
AI1 – AI3 to B1 – B3  
H
L
L
L
L
L
L
H
H
L
H
H
L
H
H
L
H**  
L
H
L
L
H
Z
Z
L
X
X
X
X
X
H
X
H
X
X
X
H
H
X
X
H
H
X
X
H
H
X
X
H
H
X
X
X
X
H**  
L
AI4 – AI6 to B4 – B6  
Disable Bn outputs  
H
L
L
L
L
L
L
H
H
X
X
X
X
X
H
H
H
H
H
H
H
H
X
X
X
X
X
X
X
X
L
H
H
X
X
X
X
X
H
H
H
H
X
X
X
X
H
H
H
H
X
X
X
X
L
H
H
X
X
X
X
X
H
H
H
H
X
X
X
X
X
X
X
X
H
H
H
H
L
H**  
L
H
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
L
H
X
X
X
X
X
H
L
X
H
X
X
H
X
X
H
H
X
X
H
H
X
X
H
H
X
X
H
H
X
X
X
X
H**  
H**  
H**  
H**  
H**  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
X
X
X
H
H
H
L
Disable B0 outputs  
X
Disable B1 – B3 outputs  
Disable B4 – B6 outputs  
X
X
L
Bn to AOn  
H
L
L
X
X
L
H
L
H
L
H
L
B0 to AO0  
H
L
L
X
X
L
H
L
H
L
H
L
B1 – B3 to AO1 – AO3  
B4 – B6 to AO4 – AO6  
H
L
L
X
X
L
H
L
H
L
H
L
H
L
L
X
X
X
X
X
X
H
L
H
Disable AOn outputs  
X
Z
Z
Z
Z
Disable AO0 outputs  
X
L
X
L
X
X
L
X
Disable AO1 – AO3 outputs  
Disable AO4 – AO6 outputs  
X
X
X
X
X
X
X
NOTES:  
H
L
X
Z
=
=
=
=
=
High voltage level  
Low voltage level  
Don’t care  
High-impedance (OFF) state  
Input not externally driven  
Z
=
=
High-impedance (OFF) state  
Input not externally driven  
H** = Goes to level of pull-up voltage  
B*  
=
Precaution should be taken to ensure B inputs do not float.  
If they do, they are equal to Low state.  
H** = Goes to level of pull-up voltage  
B*  
=
Precaution should be taken to ensure B inputs do not float.  
If they do, they are equal to Low state.  
5
1995 May 25  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
LOGIC DIAGRAM  
46  
OEB0  
45  
OEB1  
47  
OEA1  
40  
B0  
51  
AI0  
50  
AO0  
25  
OEB2  
20  
OEA2  
38  
B1  
2
AI1  
52  
AO1  
36  
34  
B2  
B3  
3
AI2  
4
AO2  
TTL  
Levels  
BTL  
Levels  
8
AI3  
6
AO3  
26  
OEB3  
24  
OEA3  
32  
B4  
9
AI4  
10  
AO4  
30  
28  
B5  
B6  
14  
AI5  
12  
AO5  
18  
AI6  
16  
AO6  
42  
TMS  
44  
TCK  
TDI  
TDO  
(Future JTAG Boundary Scan option)  
22  
21  
LOGIC V  
=
=
=
=
=
17, 49  
1, 5, 7, 11, 13, 15, 19  
23, 43  
27, 29, 31, 33, 35, 37, 39, 41  
48  
CC  
LOGIC GND  
BUS V  
CC  
BUS GND  
BIAS V  
SG00071  
6
1995 May 25  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
LIVE INSERTION SPECIFICATIONS  
LIMITS  
TYP  
SYMBOL  
PARAMETER  
UNIT  
MAX  
MIN  
V
Bias pin voltage  
V
V
= 0 to 5.25V, Bn = 0 to 2.0V  
= 0 to 4.75V, Bn = 0 to 2.0V,  
4.5  
5.5  
V
BIASV  
CC  
CC  
1
mA  
Bias V = 4.5 to 5.5V  
I
Bias pin DC current  
BIASV  
V
CC  
= 4.5 to 5.5V, Bn = 0 to 2.0V,  
10  
µA  
Bias V = 4.5 to 5.5V  
V
Bus voltage during prebias  
Fall current during prebias  
Rise current during prebias  
B0 – B8 = 0V, Bias V = 5.0V  
B0 – B8 = 2V, Bias V = 4.5 to 5.5V  
B0 – B8 = 1V, Bias V = 4.5 to 5.5V  
1.62  
1
2.1  
V
Bn  
I
µA  
µA  
LM  
I
-1  
HM  
Peak bus current during  
insertion  
V
= 0 to 5.25V, B0 – B8 = 0 to 2.0V,  
CC  
I
Bn  
PEAK  
10  
mA  
Bias V = 4.5 to 5.5V, OEB0 = 0.8V, t = 2ns  
r
V
CC  
V
CC  
V
CC  
= 0 to 5.25V, OEB0 = 0.8V  
= 0 to 2.2V, OEB0 = 0 to 5V  
= 5.0V  
100  
100  
I
OFF  
Power up current  
µA  
OL  
t
Input glitch rejection  
1.0  
1.35  
ns  
GR  
DC ELECTRICAL CHARACTERISTICS  
Over recommended operating free-air temperature range unless otherwise noted.  
LIMITS  
1
SYMBOL  
PARAMETER  
TEST CONDITIONS  
UNIT  
2
MIN  
TYP  
MAX  
100  
I
High level output current B0 – B6  
Power-off output current B0 – B6  
High-level output  
V
V
= MAX, V = MAX, V = MIN, V = 2.1V  
µA  
µA  
OH  
CC  
IL  
IH  
OH  
I
= 0.0V, V = MAX, V = MIN, V = 2.1V  
100  
OFF  
CC  
IL  
IH  
OH  
3
3
V
OH  
AO0 – AO6  
V
CC  
= MIN, V = MAX, V = MIN, I = -3mA  
2.5  
.75  
2.85  
V
IL  
IH  
OH  
voltage  
AO0 – AO6  
V
CC  
V
CC  
V
CC  
V
CC  
= MIN, V = MAX, V = MIN, I = 24mA  
0.33  
1.0  
0.5  
1.10  
1.15  
-1.2  
IL  
IH  
OL  
V
OL  
Low-level output voltage B0 – B6  
= MIN, V = MAX, V = MIN, I = 80mA  
IL IH OL  
V
= MIN, V = MAX, V = MIN, I = 100mA  
IL  
IH  
OL  
V
IK  
Input clamp voltage  
= MIN, I = I  
IK  
V
I
Input current at  
maximum input voltage  
OEB0, OEBn,  
OEAn, AI0 – AI6  
I
I
V
CC  
= MAX, V = GND or 5.5V  
±50  
µA  
I
OEB0, OEBn,  
OEAn, AI0 – AI6  
V
V
= MAX, V = 2.7V  
20  
I
High-level input current  
Low-level input current  
CC  
I
µA  
µA  
IH  
B0 – B6  
= MAX, V = 2.1V  
100  
CC  
I
OEB0, OEBn,  
OEAn, AI0 – AI6  
-20  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
= MAX, V = 0.5V  
I
I
IL  
B0 – B6  
= MAX, V = 0.75V  
-100  
50  
I
I
Off-state output current  
Off-state output current  
Output current  
AO0 – AO6  
AO0 – AO6  
AO0 – AO6 only  
= MAX, V = 2.7V  
µA  
µA  
OZH  
O
I
= MAX, V = 0.5V  
-50  
-150  
30  
OZL  
O
I
= MAX  
-30  
-55  
19  
40  
22  
19  
mA  
O
I
I
I
I
(standby)  
AIn to Bn  
Bn to AOn  
Bn to AOn  
= MAX  
CCZ  
= MAX, outputs Low or High  
= MAX, outputs Low  
= MAX, outputs High  
60  
CCB,  
CCA,  
CCA,  
I
Supply current (total)  
mA  
CC  
35  
35  
NOTES:  
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operation conditions for the applicable type.  
2. All typical values are at V = 5V, T = 25°C.  
CC  
A
3. Due to test equipment limitations, actual test conditions are V = 1.8V and V = 1.3V for the B side.  
IH  
IL  
7
1995 May 25  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
AC ELECTRICAL CHARACTERISTICS (Commercial)  
TEST  
A PORT LIMITS  
T
V
= 0 to 70°C,  
= 5V±10%,  
amb  
CC  
T
= +25°C, V = 5V,  
SYMBOL  
PARAMETER  
UNIT  
amb  
L
CC  
CONDITION  
C = 50pF, R = 500Ω  
C = 50pF, R = 500Ω  
L
L L  
MIN  
TYP  
MAX  
MIN  
MAX  
t
t
Propagation delay,  
Bn to AOn  
1.8  
1.6  
3.4  
3.2  
5.0  
4.9  
1.6  
1.6  
5.5  
5.0  
PLH  
PHL  
Waveform 1, 2  
Waveform 4, 5  
Waveform 4, 5  
ns  
ns  
ns  
ns  
ns  
t
Output enable time,  
OEA to AOn  
2.2  
2.0  
5.0  
4.0  
6.5  
6.5  
2.0  
1.8  
10.0  
8.0  
PZH  
t
PZL  
t
Output disable time,  
OEA to AOn  
1.5  
1.8  
3.3  
3.0  
4.8  
5.0  
1.2  
1.5  
5.0  
5.5  
PHZ  
t
PLZ  
t
t
Transition time, AOn Port  
(10% to 90% or 90% to 10%)  
Test Circuit and  
Waveforms  
1.5  
1.5  
2.2  
2.4  
3.0  
3.0  
1.5  
1.5  
3.5  
3.5  
TLH  
THL  
Output skew between receivers  
t
(o)  
Waveform 3  
0.4  
1.0  
1.0  
SK  
1
in same package  
B PORT LIMITS  
T
= 0 to 70°C,  
= 5V±10%,  
amb  
CC  
SYMBOL  
T
= +25°C, V = 5V,  
CC  
amb  
V
PARAMETER  
TEST CONDITION  
UNIT  
C
= 30pF, R = 9Ω  
D
U
C
= 30pF, R = 9Ω  
D
U
t
t
Propagation delay,  
AIn to Bn  
2.4  
1.5  
3.7  
2.7  
4.9  
4.4  
1.9  
1.5  
5.7  
5.0  
PLH  
PHL  
Waveform 1, 2  
Waveform 2  
Waveform 1  
ns  
ns  
ns  
ns  
t
t
Enable/disable time,  
OEB0 to Bn  
2.4  
1.9  
3.7  
3.5  
4.9  
4.9  
1.9  
1.8  
6.4  
5.4  
PLH  
PHL  
t
t
Enable/disable time,  
OEB1 to Bn  
2.4  
1.9  
4.0  
3.6  
5.5  
5.5  
1.9  
2.5  
5.9  
5.9  
PLH  
PHL  
t
t
Transition time, Bn Port  
(1.3V to 1.8V)  
Test Circuit and  
Waveforms  
1.0  
0.5  
1.4  
1.1  
3.0  
3.0  
1.0  
0.5  
3.0  
3.0  
TLH  
THL  
Output skew between drivers in  
same package  
t
(o)  
Waveform 3  
TEST CONDITION  
Waveform 1, 2  
0.3  
1.0  
1.0  
ns  
UNIT  
ns  
SK  
1
SYMBOL  
PARAMETER  
R
= 16.5Ω  
R = 16.5Ω  
U
U
t
t
Propagation delay,  
AIn to Bn  
2.5  
1.6  
3.8  
2.8  
5.0  
4.5  
2.0  
1.6  
5.8  
5.1  
PLH  
PHL  
t
t
Enable/disable time,  
OEB0 to Bn  
2.5  
2.0  
3.8  
3.6  
5.0  
5.0  
2.0  
1.9  
6.5  
5.5  
PLH  
PHL  
Waveform 2  
Waveform 1  
ns  
ns  
ns  
ns  
t
t
Enable/disable time,  
OEB1 to Bn  
2.5  
2.0  
4.1  
3.7  
5.6  
5.6  
2.0  
2.6  
6.0  
6.0  
PLH  
PHL  
t
t
Transition time, Bn Port  
(1.3V to 1.8V)  
Test Circuit and  
Waveforms  
1.0  
0.5  
1.5  
1.1  
3.0  
3.0  
1.0  
0.5  
3.0  
3.0  
TLH  
THL  
Output skew between drivers in  
t
(o)  
Waveform 3  
0.3  
1.0  
1.0  
SK  
1
same package  
NOTES:  
1.  
t
actual – t actual for any data input to output path compared to any other data input to output path where N and M are either LH or  
PN PM  
HL. Skew times are valid only under same test conditions (temperature, V , loading, etc.).  
CC  
8
1995 May 25  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
AC ELECTRICAL CHARACTERISTICS (Industrial)  
TEST  
A PORT LIMITS  
T
amb  
= -40 to +85°C,  
T
= +25°C, V = 5V,  
CC  
amb  
L L  
V
= 5V±10%,  
SYMBOL  
PARAMETER  
UNIT  
CC  
CONDITION  
C = 50pF, R = 500Ω  
C = 50pF, R = 500Ω  
L
L
MIN  
TYP  
MAX  
MIN  
MAX  
t
t
Propagation delay,  
Bn to AOn  
1.8  
1.6  
3.4  
3.2  
5.0  
4.9  
1.6  
1.6  
5.5  
5.5  
PLH  
PHL  
Waveform 1, 2  
Waveform 4, 5  
Waveform 4, 5  
ns  
ns  
ns  
ns  
ns  
t
Output enable time,  
OEA to AOn  
2.2  
2.0  
5.0  
4.0  
6.5  
6.5  
1.5  
1.5  
8.0  
8.0  
PZH  
t
PZL  
t
Output disable time,  
OEA to AOn  
1.5  
1.5  
3.3  
3.0  
4.8  
5.0  
0.8  
1.2  
6.0  
6.0  
PHZ  
t
PLZ  
t
t
Transition time, AOn Port  
(10% to 90% or 90% to 10%)  
Test Circuit and  
Waveforms  
1.5  
1.5  
2.2  
2.4  
3.0  
3.0  
1.5  
1.5  
3.5  
3.5  
TLH  
THL  
Output skew between receivers  
t
(o)  
Waveform 3  
0.4  
1.0  
1.0  
SK  
1
in same package  
B PORT LIMITS  
T
= -40 to +85°C,  
amb  
V
D
SYMBOL  
PARAMETER  
TEST CONDITION  
UNIT  
T
= +25°C, V = 5V,  
CC  
amb  
= 5V±10%,  
CC  
C
= 30pF, R = 9Ω  
D
U
C
= 30pF, R = 9Ω  
U
t
t
Propagation delay,  
AIn to Bn  
2.4  
1.5  
3.7  
2.7  
4.9  
4.4  
1.9  
1.5  
5.9  
5.0  
PLH  
PHL  
Waveform 1, 2  
Waveform 2  
Waveform 1  
ns  
ns  
ns  
ns  
t
t
Enable/disable time,  
OEB0 to Bn  
2.4  
1.9  
3.7  
3.5  
4.9  
4.9  
1.9  
1.8  
6.4  
5.9  
PLH  
PHL  
t
t
Enable/disable time,  
OEB1 to Bn  
2.4  
1.9  
4.0  
3.6  
5.5  
5.5  
1.9  
1.5  
6.8  
6.8  
PLH  
PHL  
t
t
Transition time, Bn Port  
(1.3V to 1.8V)  
Test Circuit and  
Waveforms  
1.0  
0.5  
1.4  
1.1  
3.0  
3.0  
1.0  
0.5  
3.0  
3.0  
TLH  
THL  
Output skew between drivers in  
same package  
t
(o)  
Waveform 3  
TEST CONDITION  
Waveform 1, 2  
0.3  
1.0  
1.0  
ns  
UNIT  
ns  
SK  
1
SYMBOL  
PARAMETER  
R
= 16.5Ω  
R = 16.5Ω  
U
U
t
t
Propagation delay,  
AIn to Bn  
2.5  
1.6  
3.8  
2.8  
5.0  
4.5  
2.0  
1.6  
6.0  
5.1  
PLH  
PHL  
t
t
Enable/disable time,  
OEB0 to Bn  
2.5  
2.0  
3.8  
3.6  
5.0  
5.0  
2.0  
1.9  
6.5  
6.0  
PLH  
PHL  
Waveform 2  
Waveform 1  
ns  
ns  
ns  
ns  
t
t
Enable/disable time,  
OEB1 to Bn  
2.5  
2.0  
4.1  
3.7  
5.5  
5.5  
2.0  
1.6  
6.9  
6.9  
PLH  
PHL  
t
t
Transition time, Bn Port  
(1.3V to 1.8V)  
Test Circuit and  
Waveforms  
1.0  
0.5  
1.5  
1.1  
3.0  
3.0  
1.0  
0.5  
3.0  
3.0  
TLH  
THL  
Output skew between drivers in  
t
(o)  
Waveform 3  
0.3  
1.0  
1.0  
SK  
1
same package  
NOTES:  
1.  
t
actual – t actual for any data input to output path compared to any other data input to output path where N and M are either LH or  
PN PM  
HL. Skew times are valid only under same test conditions (temperature, V , loading, etc.).  
CC  
9
1995 May 25  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
AC WAVEFORMS  
AIn, Bn  
OEB0  
V
t
V
V
V
M
AIn, Bn or Bn  
OEBn  
M
M
M
t
t
PHL  
PLH  
PHL  
t
PLH  
V
V
M
AOn, Bn  
V
V
M
M
M
AOn or Bn  
Waveform 1. Propagation Delay for Data  
or Output Enable to Output  
Waveform 2. Propagation Delay for Data  
or Output Enable to Output  
V
t
AIn, Bn  
M
(o)  
SK  
AOn, Bn  
V
M
V
t
V
M
Waveform 3. Output Skews  
M
OEAn  
AOn  
V
V
OEA  
AOn  
M
M
PZL  
t
t
t
PLZ  
PZH  
PHZ  
V
-0.3V  
OV  
OH  
V
M
V
V
+0.3V  
M
OL  
Waveform 4. 3-State Output Enable Time to High Level  
and Output Disable Time from High Level  
Waveform 5. 3-State Output Enable Time to Low Level  
and Output Disable Time from Low Level  
NOTE: V = 1.55V for Bn, V = 1.5V for all others.  
SG00079  
M
M
10  
1995 May 25  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
TEST CIRCUIT AND WAVEFORMS  
V
CC  
t
W
V
IN  
BIAS  
V
90%  
90%  
7.0V  
NEGATIVE  
PULSE  
V
V
M
M
R
L
10%  
10%  
V
V
OUT  
IN  
LOW V  
PULSE  
GENERATOR  
D.U.T.  
t
t
(t )  
r
t
(t )  
f
TLH  
THL  
TLH  
R
C
R
L
T
L
(t )  
t
(t )  
r
THL  
f
V
IN  
90%  
90%  
POSITIVE  
PULSE  
V
V
M
M
10%  
10%  
LOW V  
t
W
Test Circuit for 3-State Outputs on A Port  
SWITCH POSITION  
V
= 1.55V for Bn, V = 1.5V for all others.  
M
M
Input Pulse Definitions  
TEST  
SWITCH  
t
t
closed  
open  
PLZ, PZL  
All other  
INPUT PULSE REQUIREMENTS  
Family  
FB+  
Amplitude Low V  
Rep. Rate  
t
t
t
THL  
W
TLH  
2.0V (for R = 9 )  
V
U
CC  
500ns 2.5ns 2.5ns  
500ns 2.5ns 2.5ns  
A Port  
B Port  
3.0V  
2.0V  
0.0V  
1.0V  
1MHz  
1MHz  
2.1V (for R = 16.5 )  
BIAS  
V
U
R
U
V
V
IN  
OUT  
PULSE  
GENERATOR  
D.U.T.  
R
T
C
D
DEFINITIONS:  
R
C
=
=
Load Resistor; see AC CHARACTERISTICS for value.  
Load capacitance includes jig and probe capacitance; see AC  
CHARACTERISTICS for value.  
L
L
Test Circuit for Outputs on B Port  
R
C
=
=
Termination resistance should be equal to Z  
Load capacitance includes jig and probe capacitance; see AC  
CHARACTERISTICS for value.  
of pulse generators.  
T
D
OUT  
R
=
Pull up resistor; see AC CHARACTERISTICS for value.  
U
SG00059  
11  
1995 May 25  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
QFP52: plastic quad flat package; 52 leads (lead length 1.6 mm); body 10 x 10 x 2.0 mm  
SOT379-1  
12  
1995 May 25  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
NOTES  
13  
1995 May 25  
Philips Semiconductors  
Product specification  
7-bit Futurebus+ transceiver  
FB2041  
Data sheet status  
[1]  
Data sheet  
status  
Product  
status  
Definition  
Objective  
specification  
Development  
This data sheet contains the design target or goal specifications for product development.  
Specification may change in any manner without notice.  
Preliminary  
specification  
Qualification  
This data sheet contains preliminary data, and supplementary data will be published at a later date.  
Philips Semiconductors reserves the right to make chages at any time without notice in order to  
improve design and supply the best possible product.  
Product  
specification  
Production  
This data sheet contains final specifications. Philips Semiconductors reserves the right to make  
changes at any time without notice in order to improve design and supply the best possible product.  
[1] Please consult the most recently issued datasheet before initiating or completing a design.  
Definitions  
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For  
detailed information see the relevant data sheet or data handbook.  
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or  
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended  
periods may affect device reliability.  
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips  
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or  
modification.  
Disclaimers  
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can  
reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications  
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.  
RighttomakechangesPhilipsSemiconductorsreservestherighttomakechanges, withoutnotice, intheproducts, includingcircuits,standard  
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no  
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these  
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless  
otherwise specified.  
Philips Semiconductors  
811 East Arques Avenue  
P.O. Box 3409  
Copyright Philips Electronics North America Corporation 1998  
All rights reserved. Printed in U.S.A.  
Sunnyvale, California 94088–3409  
Telephone 800-234-7381  
print code  
Date of release: 08-98  
Document order number:  
Philips  
Semiconductors  

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