FXMS3110DR1 [NXP]

SPECIALTY ANALOG CIRCUIT;
FXMS3110DR1
型号: FXMS3110DR1
厂家: NXP    NXP
描述:

SPECIALTY ANALOG CIRCUIT

光电二极管
文件: 总30页 (文件大小:326K)
中文:  中文翻译
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Freescale Semiconductor  
Data Sheet: Technical Data  
An Energy Efficient Solution by Freescale  
Document Number: FXMS3110  
Rev. 1, 02/2013  
Xtrinsic FXMS3110 Three-Axis,  
Digital Magnetometer  
FXMS3110  
Freescale’s FXMS3110 is a small, low-power, digital 3-axis magnetometer  
qualified for the industrial market.  
Top and Bottom View  
The device can be used in conjunction with a 3-axis accelerometer to realize an  
orientation independent electronic compass that can provide accurate heading  
information. It features a standard I2C serial interface output and smart embedded  
functions.  
The FXMS3110 is capable of measuring magnetic fields with an output data rate  
(ODR) up to 80 Hz; these output data rates correspond to sample intervals from  
12.5 ms to several seconds.  
The FXMS3110 is available in a plastic DFN package and it is guaranteed to  
operate over the extended temperature range of -40°C to +85°C.  
10-PIN DFN  
2 mm x 2 mm x 0.85 mm  
CASE 2154-02  
Features  
1.95 V to 3.6 V supply voltage (VDD)  
1.62 V to VDD IO voltage (VDDIO)  
Ultra small 2 mm x 2 mm x 0.85 mm, 0.4 mm pitch, 10-pin package  
Full-scale range ±1000 μT  
Sensitivity of 0.10 μT  
Noise down to 0.25 μT rms  
Output Data Rates (ODR) up to 80 Hz  
400 kHz Fast Mode compatible I2C interface  
Low-power, single-shot measurement mode  
RoHS compliant  
Top View  
GND  
INT1  
VDDIO  
SCL  
Cap-A  
VDD  
NC  
10  
9
1
2
3
4
5
8
7
Cap-R  
GND  
6
SDA  
Applications  
Pin Connections  
Ruggedized smart mobile devices  
Smart meters  
Torque control  
Safety applications  
Industrial automation  
Target markets  
Handheld devices, handheld scanners, tablets, personal navigation devices, robotics, UAVs, speed sensing and current  
sensing.  
Table 1. Ordering information  
I2C Address  
Part number  
Package description  
Shipping  
FXMS3110DR1  
0x0E  
DFN-10  
Tape and Reel (1000)  
© 2012-2013 Freescale Semiconductor, Inc. All rights reserved.  
Contents  
1
Block diagram and pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3  
1.1 Application circuit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4  
Operating and Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5  
2.1 Operating characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5  
2.2 Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
2.3 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
2.4 I2C Interface characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
2.5 I2C pullup resistor selection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
Functionality. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
4.1 Factory calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
4.2 Digital interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15  
5.1 Sensor Status . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
5.2 Device ID . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
5.3 User Offset Correction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
5.4 Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19  
5.5 Control Registers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19  
Geomagnetic Field Maps. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
PCB Guidelines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24  
7.1 Overview of Soldering Considerations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24  
7.2 Halogen Content . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24  
7.3 PCB Mounting Recommendations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24  
2
3
4
5
6
7
Related Documentation  
The FXMS3110 device features and operations are described in a variety of reference manuals, user guides, and application  
notes. To find the most-current versions of these documents:  
1. Go to the Freescale homepage at:  
http://www.freescale.com/  
2. In the Keyword search box at the top of the page, enter the device number FXMS3110.  
3. In the Refine Your Result pane on the left, click on the Documentation link.  
FXMS3110  
Sensors  
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Freescale Semiconductor, Inc.  
1
Block diagram and pin description  
SDA  
SCL  
X-axis  
Digital Signal  
Processing and  
Control  
Y-axis  
ADC  
MUX  
INT1  
Z-axis  
VDD  
Regulator  
+
Reference  
Clock Oscillator  
Trim Logic  
VDDIO  
Figure 1. Block diagram  
1
X
GND  
INT1  
VDDIO  
SCL  
Cap-A  
VDD  
NC  
10  
9
1
2
3
4
5
Y
8
7
Cap-R  
GND  
6
SDA  
Z
(TOP VIEW)  
(TOP VIEW)  
Figure 2. Pin connections and measurement coordinate system  
FXMS3110  
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Table 2. Pin descriptions  
Pin  
1
Name  
Cap-A  
VDD  
Function  
Bypass cap for internal regulator  
Power supply, 1.95 V – 3.6 V  
Do not connect  
2
3
NC  
4
Cap-R  
GND  
SDA  
Magnetic reset pulse circuit capacitor connection  
5
GND  
6
I2C Serial Data  
7
SCL  
I2C Serial Clock  
8
VDDIO  
INT1  
GND  
Digital interface supply, 1.65 V - VDD  
Interrupt - active high output  
GND  
9
10  
1.1  
Application circuit  
Device power is supplied through the VDD line. Power supply decoupling capacitors (100 nF ceramic) should be placed as near  
as possible to pins 1 and 2 of the device. Additionally a 1μF (or larger) capacitor should be used for bulk decoupling of the VDD  
supply rail as shown in Figure 3. VDDIO supplies power for the digital I/O pins SCL, SDA, and INT1.  
The control signals SCL and SDA, are not tolerant of voltages more than VDDIO + 0.3 volts. If VDDIO is removed, the control  
signals SCL and SDA will clamp any logic signals through their internal ESD protection diodes.  
1
Cap-A  
GND 10  
100 nF  
100 nF  
INT1  
2
3
4
VDD  
NC  
INT1  
VDDIO  
SCL  
9
8
7
VDDIO  
100 nF  
4.7 K  
4.7 K  
VDD  
Cap-R  
SCL  
SDA  
1 μF  
100 nF  
5
GND  
SDA  
6
(Top view)  
Figure 3. Electrical connection  
FXMS3110  
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2
Operating and Electrical Specifications  
2.1  
Operating characteristics  
Table 3. Operating characteristics @ VDD = 2.4 V, VDDIO = 1.8 V, T = 25°C unless otherwise noted.  
Parameter  
Test Conditions  
Symbol  
Min  
Typ  
Max  
Unit  
µT  
Full-scale range  
FS  
±1000  
Output data range(1)  
Sensitivity  
-30000  
+30000  
LSB  
µT/LSB  
%/°C  
µT  
So  
0.10  
±0.1  
±100  
0.25  
Sensitivity change versus temperature  
Zero-flux offset accuracy  
Tcs  
Hysteresis(2)  
1
1
%
Non linearity  
Best fit straight line(3)  
NL  
Noise  
Top  
-1  
±0.3  
0.4  
%FS  
µT rms  
°C  
OS = 00(4)  
OS = 01  
OS = 10  
OS = 11  
Magnetometer output noise  
0.35  
0.3  
0.25  
Operating temperature range  
-40  
+85  
1. Output data range is the sum of ±10000 LSBs full-scale range, ±10000 LSBs user defined offset (provided that CTRL_REG2[RAW] = 0) and  
±10000 zero-flux offset.  
2. Hysteresis is measured from 0 μT to 1000 μT to 0 μT and from 0 μT to -1000 μT to 0 μT.  
3. Best-fit straight line over the 0 to ±1000 μT full-scale range.  
4. OS = Over Sampling Ratio.  
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2.2  
Absolute maximum ratings  
Stresses above those listed as “absolute maximum ratings” may cause permanent damage to the device. This is a stress rating  
only and functional operation of the device under these conditions is not implied. Exposure to maximum rating conditions for  
extended periods may affect device reliability.  
Table 4. Maximum ratings  
Rating  
Symbol  
VDD  
Vin  
Value  
-0.3 to +3.6  
-0.3 to VDDIO + 0.3  
100,000  
Unit  
V
Supply voltage  
Input voltage on any control pin (SCL, SDA)  
Maximum applied magnetic/field  
Operating temperature range  
V
BMAX  
Top  
µT  
°C  
°C  
-40 to +85  
Storage temperature range  
TSTG  
-40 to +125  
Table 5. ESD and latchup protection characteristics  
Rating  
Symbol  
HBM  
MM  
Value  
±2000  
±200  
±500  
±100  
Unit  
V
Human Body Model  
Machine Model  
V
Charge Device Model  
CDM  
ILU  
V
Latchup current at T = 85°C  
mA  
This device is sensitive to mechanical shock. Improper handling can cause permanent damage of the part or  
cause the part to otherwise fail.  
This device is sensitive to ESD, improper handling can cause permanent damage to the part.  
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2.3  
Electrical characteristics  
Table 6. Electrical characteristics @ VDD = 2.4 V, VDDIO = 1.8 V, T = 25°C unless otherwise noted  
Parameter  
Test Conditions  
Symbol  
VDD  
Min  
1.95  
1.62  
Typ  
Max  
3.6  
Unit  
V
Supply voltage  
2.4  
Interface supply voltage  
VDDIO  
VDD  
V
Supply current in ACTIVE mode  
ODR(1)(2) 80 Hz, OS(1) = 00  
ODR 40 Hz, OS(3) = 00  
ODR 20 Hz, OS(3) = 00  
ODR 10 Hz, OS(3) = 00  
ODR 5 Hz, OS(3) = 00  
ODR 2.5 Hz, OS(3) = 00  
ODR 1.25 Hz, OS(3) = 00  
ODR 0.63 Hz, OS = 00  
Measurement mode off  
900  
550  
275  
137.5  
68.8  
34.4  
17.2  
8.6  
Idd  
µA  
Supply current drain in STANDBY mode  
IddStby  
VIH  
2
µA  
V
Digital high level input voltage  
SCL, SDA  
0.75*VDDIO  
0.9*VDDIO  
Digital low level input voltage  
SCL, SDA  
V
V
V
V
VIL  
0.3* VDDIO  
High level output voltage  
INT1  
I
I
I
O = 500 µA  
O = 500 µA  
O = 500 µA  
VOH  
VOL  
Low level output voltage  
INT1  
0.1* VDDIO  
0.1* VDDIO  
1.2 *ODR  
Low level output voltage  
SDA  
VOLS  
ODR  
BW  
Output Data Rate (ODR)  
0.8*ODR  
ODR  
ODR/2  
1.7  
Hz  
Hz  
ms  
ms  
°C  
Signal bandwidth  
Boot time from power applied to boot complete  
BT  
Turn-on time(4)(5)  
CTRL_REG1[OS] = 2'b01  
Ton  
25  
Operating temperature range  
Top  
-40  
+85  
1. ODR = Output Data Rate; OS = Over Sampling Ratio.  
2. Please see Table 32 for all ODR and OSR setting combinations, as well as corresponding current consumption and noise levels.  
3. By design.  
4. Time to obtain valid data from STANDBY mode to ACTIVE Mode.  
5. In 80 Hz mode ODR.  
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2
2.4  
I C Interface characteristics  
Table 7. I2C slave timing values(1)  
I2C Fast Mode  
Parameter  
Symbol  
Unit  
Min  
Max  
SCL clock frequency  
fSCL  
Pullup = 1 kΩ, Cb = 20 pF  
0
1.3  
400  
kHz  
μs  
μs  
μs  
μs  
μs  
μs  
μs  
ns  
μs  
μs  
ns  
ns  
ns  
Bus free time between STOP and START condition  
Repeated START hold time  
tBUF  
tHD;STA  
tSU;STA  
tSU;STO  
tHD;DAT  
tVD;DAT  
tVD;ACK  
tSU;DAT  
tLOW  
0.6  
Repeated START setup time  
0.6  
STOP condition setup time  
0.6  
SDA data hold time(2)  
0.05(3)  
(4)  
SDA valid time(5)  
0.9(4)  
0.9(4)  
SDA valid acknowledge time(6)  
SDA setup time  
100(7)  
1.3  
SCL clock low time  
SCL clock high time  
tHIGH  
tr  
0.6  
(8)  
(8)  
SDA and SCL rise time  
20 + 0.1Cb  
20 + 0.1Cb  
1000  
300  
50  
SDA and SCL fall time(3) (8) (9) (10)  
Pulse width of spikes on SDA and SCL that must be suppressed by input filter  
1. All values are referred to VIH (min) and VIL (max) levels.  
tf  
tSP  
2. tHD;DAT is the data hold time that is measured from the falling edge of SCL; the hold time applies to data in transmission and the acknowledge.  
3. A device must internally provide a hold time of at least 300 ns for the SDA signal (with respect to the VIH (min) of the SCL signal) to bridge the  
undefined region of the falling edge of SCL.  
4. The maximum tHD;DAT could be must be less than the maximum of tVD;DAT or tVD;ACK by a transition time. This device may stretch the LOW  
period (tLOW) of the SCL signal.  
5. tVD;DAT = time for Data signal from SCL LOW to SDA output (HIGH or LOW, depending on which one is worse).  
6. tVD;ACK = time for Acknowledgement signal from SCL LOW to SDA output (HIGH or LOW, depending on which one is worse).  
7. A Fast mode I2C device can be used in a Standard mode I2C system, but the requirement tSU;DAT 250 ns must then be met. This will  
automatically be the case if the device does not stretch the LOW period of the SCL signal. If such a device does stretch the LOW period of the  
SCL signal, it must output the next data bit to the SDA line tr(max) + tSU;DAT = 1000 + 250 = 1250 ns (according to the Standard mode I2C  
specification) before the SCL line is released. Also the acknowledge timing must meet this setup time.  
8. Cb = total capacitance of one bus line in pF.  
9. The maximum tf for the SDA and SCL bus lines is specified at 300 ns. The maximum fall time for the SDA output stage tf is specified at 250 ns.  
This allows series protection resistors to be connected in between the SDA and the SCL pins and the SDA/SCL bus lines without exceeding  
the maximum specified tf.  
10.In Fast mode Plus, fall time is specified the same for both output stage and bus timing. If series resistors are used, designers should allow for  
this when considering bus timing.  
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Figure 4. I2C slave timing diagram  
2
2.5  
I C pullup resistor selection  
The SCL and SDA signals are driven by open-drain buffers and a pullup resistor is required to make the signals rise to the high  
state. The value of the pullup resistors depends on the system I2C clock rate and the total capacitive load on the I2C bus.  
Higher resistance pullups will conserve power, at the expense of a slower rise time on the SCL and SDA lines (due to the RC  
time constant between the bus capacitance and the pullup resistor), and will limit the maximum I2C clock frequency that can be  
achieved.  
Lower resistance value pullup resistors consume more power, but enable higher I2C clock operating frequencies.  
I2C bus capacitance consists of the sum of the parasitic device and trace capacitances present. In general, longer bus traces and  
an increased number of devices lead to higher total bus capacitance and will require lower value pullup resistors to enable a given  
frequency of operation.  
For Standard mode operation, pullup resistor values between 5 kΩ and 10 kΩ are recommended as a starting point, but may  
need to be lowered depending on the number of devices present on the bus and the total bus capacitance. For Fast mode  
operation, pullup resistor values of 1k (or lower) may be required.  
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3
Modes of Operation  
Table 8. Modes of operation description  
I2C Bus State  
Mode  
Function Description  
STANDBY  
ACTIVE  
I2C communication is possible.  
I2C communication is possible.  
Only POR and Digital blocks are enabled, the Analog subsystem is disabled.  
All blocks are enabled (POR, Digital, Analog).  
4
Functionality  
FXMS3110 is a small low-power, digital output, 3-axis linear magnetometer packaged in a 10-pin DFN. The device contains a  
magnetic transducer for sensing and an ASIC for control and digital I2C communications.  
4.1  
Factory calibration  
FXMS3110 is factory calibrated for sensitivity and temperature coefficient of sensitivity. All factory calibration coefficients are  
automatically applied by the ASIC before a measurement is taken and the result written to registers 0x01 to 0x06 (Section 5,  
“Register Descriptions,” on page 15).  
The magnetic offset registers in addresses 0x09 to 0x0E are not a factory calibration offset but allow the user to define a hard-  
iron offset which can be automatically subtracted from the magnetic field readings (see Section 4.2.4, “User offset corrections,”  
on page 12).  
4.2  
Digital interface  
Table 9. Serial interface pin description  
Pin name  
VDDIO  
SCL  
Pin description  
IO voltage  
I2C Serial Clock  
I2C Serial Data  
SDA  
INT  
Data ready interrupt pin  
There are two signals associated with the I2C bus: the Serial Clock Line (SCL) and the Serial Data line (SDA). External pullup  
resistors (connected to VDDIO) are needed for SDA and SCL. When the bus is free, both lines are high. The I2C interface is  
compliant with Fast mode (400 kHz), and Normal mode (100 kHz) I2C standards.  
4.2.1  
General I2C operation  
There are two signals associated with the I2C bus: the Serial Clock Line (SCL) and the Serial Data line (SDA). The latter is a  
bidirectional line used for sending and receiving the data to/from the interface. External pullup resistors connected to VDDIO are  
required for SDA and SCL. When the bus is free both the lines are high. The I2C interface is compliant with fast mode (400 kHz),  
and normal mode (100 kHz) I2C standards. Operation at frequencies higher than 400 kHz is possible, but depends on several  
factors including the pullup resistor values, and total bus capacitance (trace + device capacitance).  
A transaction on the bus is started with a start condition (ST) signal, which is defined as a HIGH-to-LOW transition on the data  
line while the SCL line is held HIGH. After the ST signal has been transmitted by the master, the bus is considered busy. The  
next byte of data transmitted contains the slave address in the first seven bits, and the eighth bit, the read/write bit, indicates  
whether the master is receiving data from the slave or transmitting data to the slave. When an address is sent, each device in  
the system compares the first seven bits after the ST condition with its own address. If they match, the device considers itself  
addressed by the master. The 9th clock pulse, following the slave address byte (and each subsequent byte) is the acknowledge  
(ACK). The transmitter must release the SDA line during the ACK period. The receiver must then pull the data line low so that it  
remains stable low during the high period of the acknowledge clock period.  
The number of bytes per transfer is unlimited. If a receiver can't receive another complete byte of data until it has performed some  
other function, it can hold the clock line, SCL low to force the transmitter into a wait state. Data transfer only continues when the  
receiver is ready for another byte and releases the data line. This delay action is called clock stretching. Not all receiver devices  
support clock stretching. Not all master devices recognize clock stretching. This part supports clock stretching.  
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A low to high transition on the SDA line while the SCL line is high is defined as a stop condition (SP) signal. A write or burst write  
is always terminated by the master issuing the SP signal. A master should properly terminate a read by not acknowledging a byte  
at the appropriate time in the protocol. A master may also issue a repeated start signal (SR) during a transfer.  
The 7-bit I2C slave address assigned to FXMS3110 is 0x0E.  
4.2.2  
I2C Read/Write operations  
Single byte read  
The master (or MCU) transmits a start condition (ST) to the FXMS3110, followed by the slave address, with the R/W bit set to “0”  
for a write, and the FXMS3110 sends an acknowledgement. Then the master (or MCU) transmits the address of the register to  
read and the FXMS3110 sends an acknowledgement. The master (or MCU) transmits a repeated start condition (SR), followed by  
the slave address with the R/W bit set to “1” for a read from the previously selected register. The FXMS3110 then acknowledges  
and transmits the data from the requested register. The master does not acknowledge (NAK) the transmitted data, but transmits  
a stop condition to end the data transfer.  
Multiple byte read  
When performing a multi-byte or “burst” read, the FXMS3110 automatically increments the register address read pointer after a  
read command is received. Therefore, after following the steps of a single byte read, multiple bytes of data can be read from  
sequential registers after each FXMS3110 acknowledgment (AK) is received until a no acknowledge (NAK) occurs from the  
master followed by a stop condition (SP) signaling the end of transmission.  
Single byte write  
To start a write command, the master transmits a start condition (ST) to the FXMS3110, followed by the slave address with the R/  
W bit set to “0” for a write, and the FXMS3110 sends an acknowledgement. Then the master (or MCU) transmits the address of  
the register to write to, and the FXMS3110 sends an acknowledgement. Then the master (or MCU) transmits the 8-bit data to  
write to the designated register and the FXMS3110 sends an acknowledgement that it has received the data. Since this  
transmission is complete, the master transmits a stop condition (SP) to end the data transfer. The data sent to the FXMS3110 is  
now stored in the appropriate register.  
Multiple byte write  
The FXMS3110 automatically increments the register address write pointer after a write command is received. Therefore, after  
following the steps of a single byte write, multiple bytes of data can be written to sequential registers after each FXMS3110  
acknowledgment (ACK) is received.  
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< Single Byte Read >  
ST Device Address[6:0]  
W
Register Address[7:0]  
SR Device Address[6:0]  
R
NAK SP  
Master  
AK  
AK  
AK  
Data[7:0]  
Slave  
< Multiple Byte Read >  
ST Device Address[6:0]  
W
Register Address[7:0]  
SR Device Address[6:0]  
R
AK  
Master  
AK  
AK  
AK  
Data[7:0]  
Slave  
AK  
AK  
NAK SP  
Master  
Data[7:0]  
Data[7:0]  
Data[7:0]  
Slave  
< Multiple Byte Write >  
ST Device Address[6:0]  
W
Register Address[7:0]  
Data[7:0]  
Data[7:0]  
SP  
Master  
AK  
AK  
AK  
AK  
Slave  
< Single Byte Write >  
ST Device Address[6:0]  
W
Register Address[7:0]  
Data[7:0]  
SP  
Master  
AK  
AK  
AK  
Slave  
Legend  
ST: Start Condition  
SP: Stop Condition  
AK: Acknowledge  
NAK: No Acknowledge  
R: Read = 1  
W: Write = 0  
SR: Repeated Start Condition  
Figure 5. I2C timing diagram  
4.2.3  
Fast Read mode  
When the Fast Read (FR) bit is set (CTRL_REG1, 0x10, bit 2), the MSB 8-bit data is read through the I2C bus. Auto-increment  
is set to skip over the LSB data. When FR bit is cleared, the complete 16-bit data is read accessing all 6 bytes sequentially  
(OUT_X_MSB, OUT_X_LSB, OUT_Y_MSB, OUT_Y_LSB, OUT_Z_MSB, OUT_Z_LSB).  
4.2.4  
User offset corrections  
The 2’s complement user offset correction register values are used to compensate for correcting the X, Y, and Z-axis after device  
board mount. These values may be used to compensate for hard-iron interference and zero-flux offset of the sensor.  
Depending on the setting of the CTRL_REG2[RAW] bit, the magnetic field sample data is corrected with the user offset values  
(CTRL_REG2[RAW] = 0), or can be read out uncorrected for user offset values (CTRL_REG2[RAW] = 1).  
The factory calibration for gain, offset and temperature compensation is always automatically applied irrespective of the setting  
of the CTRL_REG2[RAW] bit which only controls whether the user offset correction values stored in the OFF_X/Y/Z registers are  
applied to the output data. In order to not saturate the sensor output, user written offset values should be within the range of  
±10,000 counts.  
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4.2.5  
INT1  
The DR_STATUS register (see section 5.1.1) contains the ZYXDR bit which denotes the presence of new measurement data on  
one or more axes. Software polling can be used to detect the transition of the ZYXDR bit from 0 to 1 but, since the ZYXDR bit is  
also logically connected to the INT1 pin, a more efficient approach is to use INT1 to trigger a software interrupt when new  
measurement data is available as follows:  
1. Enable automatic resets by setting AUTO_MRST_EN bit in CTRL_REG2 (CTRL_REG2 = 0b1XXXXXX).  
2. Put FXMS3110 in ACTIVE mode (CTRL_REG1 = 0bXXXXXX01).  
3. Idle until INT1 goes HIGH and activates an interrupt service routine in the user software.  
4. Read magnetometer data as required from registers 0x01 to 0x06. INT1 is cleared when register 0x01 OUT_X_MSB is  
read.  
5. Return to idle in step 3.  
4.2.6  
Triggered Measurements  
Set the TM bit in CTRL_REG1 when you want the part to acquire only one sample on each axis. See table below for details.  
Table 10.  
AC  
TM  
Description  
ASIC is in low power standby mode.  
0
0
The ASIC will exit standby mode, perform one measurement cycle based on the  
programmed ODR and OSR setting, update the I2C data registers and re- enter  
standby mode.  
0
1
1
1
0
1
The ASIC will perform continuous measurements based on the current OSR and  
ODR settings.  
The ASIC will continue the current measurement at the fastest applicable ODR  
for the user programmed OSR. The ASIC will return back to the programmed  
ODR after completing the triggered measurement.  
The anti-aliasing filter in the A/D converter has a finite delay before the output “settles”. The output data for the first ODR period  
after getting out of Standby mode is expected to be slightly off. This effect will be more pronounced for the lower over-sampling  
settings since with higher settings the error of the first acquisition will be averaged over the total number of samples. Therefore,  
it is not recommended to use TRIGGER MODE (CTRL_REG1[AC] =0, CTRL_REG1[TM] =1) measurements for applications that  
require high accuracy, especially with low over-sampling settings.  
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4.2.7  
FXMS3110 Setup Examples  
Continuous measurements with ODR = 80 Hz, OSR = 1  
1. Enable automatic magnetic sensor resets by setting bit AUTO_MRST_EN in CTRL_REG2. (CTRL_REG2 = 0x80)  
2. Put FXMS3110 in active mode 80 Hz ODR with OSR = 1 by writing 0x01 to CTRL_REG1 (CTRL_REG1 = 0x01)  
3. At this point it is possible to sync with FXMS3110 utilizing INT1 pin or using polling of the DR_STATUS register as  
explained in section 4.2.5.  
Continuous measurements with ODR = 0.63 Hz, OSR = 2  
1. Enable automatic magnetic sensor resets by setting bit AUTO_MRST_EN in CTRL_REG2. (CTRL_REG2 = 0x80)  
2. Put FXMS3110 in active mode 0.63 Hz ODR with OSR = 2 by writing 0xC9 to CTRL_REG1 (CTRL_REG1 = 0xC9)  
3. At this point, it is possible to sync with FXMS3110 utilizing INT1 pin or using polling of the DR_STATUS register as  
explained in section 4.2.5.  
Triggered measurements with ODR = 10 Hz, OSR = 8  
1. Enable automatic magnetic sensor resets by setting bit AUTO_MRST_EN in CTRL_REG2. (CTRL_REG2 = 0x80)  
2. Initiate a triggered measurement with OSR = 128 by writing 0b00011010 to CTRL_REG1 (CTRL_REG1 =  
0b00011010).  
3. FXMS3110 will acquire the triggered measurement and go back into STANDBY mode. It is possible at this point to  
sync on INT1 or resort to polling of DR_STATUS register to read the acquired data out of FXMS3110.  
4. Go back to step 2 based on application needs.  
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5
Register Descriptions  
Table 11. Register Address Map  
Auto-Increment  
Address (Fast Read)(1)  
Register  
Address  
Name  
Type  
Default Value  
Comment  
DR_STATUS(2)  
OUT_X_MSB(2)  
OUT_X_LSB(2)  
OUT_Y_MSB(2)  
OUT_Y_LSB(2)  
OUT_Z_MSB(2)  
OUT_Z_LSB(2)  
WHO_AM_I(2)  
SYSMOD(2)  
R
R
0x00  
0x01  
0x02  
0x03  
0x04  
0x05  
0x06  
0x07  
0x08  
0x09  
0x0A  
0x0B  
0x0C  
0x0D  
0x0E  
0x0F  
0x10  
0x11  
0x01  
0x02 (0x03)  
0x03  
0000 0000  
data  
Data ready status per axis  
Bits [15:8] of X measurement  
Bits [7:0] of X measurement  
Bits [15:8] of Y measurement  
Bits [7:0] of Y measurement  
Bits [15:8] of Z measurement  
Bits [7:0] of Z measurement  
Device ID Number  
R
data  
R
0x04 (0x05)  
0x05  
data  
R
data  
R
0x06 (0x07)  
0x07  
data  
R
data  
R
0x08  
0xC4  
R
0x09  
data  
Current System Mode  
OFF_X_MSB  
OFF_X_LSB  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R
0x0A  
0000 0000  
0000 0000  
0000 0000  
0000 0000  
0000 0000  
0000 0000  
data  
Bits [14:7] of user X offset  
Bits [6:0] of user X offset  
Bits [14:7] of user Y offset  
Bits [6:0] of user Y offset  
Bits [14:7] of user Z offset  
Bits [6:0] of user Z offset  
Temperature, signed 8 bits in  
Operation modes  
0x0B  
OFF_Y_MSB  
OFF_Y_LSB  
0x0C  
0x0D  
OFF_Z_MSB  
OFF_Z_LSB  
0x0E  
0x0F  
DIE_TEMP(2)  
CTRL_REG1(3)  
CTRL_REG2(3)  
0x10  
C
R/W  
R/W  
0x11  
0000 0000  
0000 0000  
0x12  
Operation modes  
1. Fast Read mode for quickly reading the Most Significant Bytes (MSB) of the sampled data.  
2. Register contents are preserved when transitioning from “ACTIVE” to “STANDBY” mode.  
3. Modification of this register’s contents can only occur when device is “STANDBY” mode, except the TM and AC bit fields in CTRL_REG1  
register.  
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5.1  
Sensor Status  
5.1.1  
DR_STATUS (0x00)  
Data Ready Status  
This read-only status register provides the acquisition status information on a per-sample basis, and reflects real-time updates  
to the OUT_X, OUT_Y, and OUT_Z registers.  
Table 12. DR_STATUS Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
ZYXOW  
ZOW  
YOW  
XOW  
ZYXDR  
ZDR  
YDR  
XDR  
Table 13. DR_STATUS Descriptions  
X, Y, Z-axis Data Overwrite. Default value: 0.  
0: No data overwrite has occurred.  
ZYXOW  
ZOW  
YOW  
XOW  
ZYXDR  
ZDR  
1: Previous X or Y or Z data was overwritten by new X or Y or Z data before it was completely read.  
Z-axis Data Overwrite. Default value: 0.  
0: No data overwrite has occurred.  
1: Previous Z-axis data was overwritten by new Z-axis data before it was read.  
Y-axis Data Overwrite. Default value: 0.  
0: No data overwrite has occurred.  
1: Previous Y-axis data was overwritten by new Y-axis data before it was read.  
X-axis Data Overwrite. Default value: 0  
0: No data overwrite has occurred.  
1: Previous X-axis data was overwritten by new X-axis data before it was read.  
X or Y or Z-axis new Data Ready. Default value: 0.  
0: No new set of data ready.  
1: New set of data is ready.  
Z-axis new Data Available. Default value: 0.  
0: No new Z-axis data is ready.  
1: New Z-axis data is ready.  
Z-axis new Data Available. Default value: 0.  
0: No new Y-axis data is ready.  
YDR  
1: New Y-axis data is ready.  
Z-axis new Data Available. Default value: 0.  
0: No new X-axis data is ready.  
XDR  
1: New X-axis data is ready.  
ZYXOW is set to 1 whenever new data is acquired before completing the retrieval of the previous set. This event occurs when  
the content of at least one data register (i.e. OUT_X, OUT_Y, OUT_Z) has been overwritten. ZYXOW is cleared when the high-  
bytes of the data (OUT_X_MSB, OUT_Y_MSB, OUT_Z_MSB) of all active channels are read.  
ZOW is set to 1 whenever new Z-axis acquisition is completed before the retrieval of the previous data. When this occurs the  
previous data is overwritten. ZOW is cleared any time OUT_Z_MSB register is read.  
YOW is set to 1 whenever new Y-axis acquisition is completed before the retrieval of the previous data. When this occurs the  
previous data is overwritten. YOW is cleared any time OUT_Y_MSB register is read.  
XOW is set to 1 whenever new X-axis acquisition is completed before the retrieval of the previous data. When this occurs the  
previous data is overwritten. XOW is cleared any time OUT_X_MSB register is read.  
ZYXDR signals that new acquisition for any of the enabled channels is available. ZYXDR is cleared when the high-bytes of the  
data (OUT_X_MSB, OUT_Y_MSB, OUT_Z_MSB) of all the enabled channels are read.  
ZDR is set to 1 whenever new Z-axis data acquisition is completed. ZDR is cleared any time OUT_Z_MSB register is read.  
YDR is set to 1 whenever new Y-axis data acquisition is completed. YDR is cleared any time OUT_Y_MSB register is read.  
XDR is set to 1 whenever new X-axis data acquisition is completed. XDR is cleared any time OUT_X_MSB register is read.  
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5.1.2  
OUT_X_MSB (0x01), OUT_X_LSB (0x02), OUT_Y_MSB (0x03), OUT_Y_LSB (0x04),  
OUT_Z_MSB (0x05), OUT_Z_LSB (0x06)  
X-axis, Y-axis, and Z-axis 16-bit output sample data of the magnetic field strength expressed as signed 2's complement numbers.  
When RAW bit is set (CTRL_REG2[RAW] = 1), the output range is between -20,000 to 20,000 bit counts (the combination of the  
1000 μT full scale range and the zero-flux offset ranging up to 1000 μT).  
When RAW bit is clear (CTRL_REG2[RAW] = 0), the output range is between -30,000 to 30,000 bit counts when the user offset  
ranging between -10,000 to 10,000 bit counts are included.  
The DR_STATUS register, OUT_X_MSB, OUT_X_LSB, OUT_Y_MSB, OUT_Y_LSB, OUT_Z_MSB, and OUT_Z_LSB are stored  
in the auto-incrementing address range of 0x00 to 0x06. Data acquisition is a sequential read of 6 bytes.  
If the Fast Read (FR) bit is set in CTRL_REG1 (0x10), auto-increment will skip over LSB of the X, Y, Z sample registers. This will  
shorten the data acquisition from 6 bytes to 3 bytes. If the LSB registers are directly addressed, the LSB information can still be  
read regardless of FR bit setting.  
The preferred method for reading data registers is the burst-read method where the user application acquires data sequentially  
starting from register 0x01. If register 0x01 is not read first, the rest of the data registers (0x02 - 0x06) will not be updated with  
the most recent acquisition. It is still possible to address individual data registers, however register 0x01 must be read prior to  
ensure that the latest acquisition data is being read.  
Table 14. OUT_X_MSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
XD15  
XD14  
XD13  
XD12  
XD11  
XD10  
XD9  
XD8  
Table 15. OUT_X_LSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
XD7  
XD6  
XD5  
XD4  
XD3  
XD2  
XD1  
XD0  
Table 16. OUT_Y_MSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
YD15  
YD14  
YD13  
YD12  
YD11  
YD10  
YD9  
YD8  
Table 17. OUT_Y_LSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
YD7  
YD6  
YD5  
YD4  
YD3  
YD2  
YD1  
YD0  
Table 18. OUT_Z_MSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
ZD15  
ZD14  
ZD13  
ZD12  
ZD11  
ZD10  
ZD9  
ZD8  
Table 19. OUT_Z_LSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
ZD6  
ZD6  
ZD5  
ZD4  
ZD3  
ZD2  
ZD1  
ZD0  
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5.2  
Device ID  
5.2.1  
WHO_AM_I (0x07)  
Device identification register. This read-only register contains the device identifier which is set to 0xC4. This value is factory  
programmed.  
Table 20. WHO_AM_I Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
1
1
0
0
0
1
0
0
5.2.2  
SYSMOD (0x08)  
The read-only system mode register indicates the current device operating mode.  
Table 21. SYSMOD Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
0
0
0
0
0
0
SYSMOD1  
SYSMOD0  
Table 22. SYSMOD Description  
System Mode. Default value: 00.  
00: STANDBY mode.  
SYSMOD  
01: ACTIVE mode, RAW data.  
10: ACTIVE mode, non-RAW user-corrected data.  
5.3  
User Offset Correction  
5.3.1  
OFF_X_MSB (0x09), OFF_X_LSB (0x0A), OFF_Y_MSB (0x0B), OFF_Y_LSB (0x0C),  
OFF_Z_MSB (0x0D), OFF_Z_LSB (0x0E)  
These registers contain the X-axis, Y-axis, and Z-axis user defined offsets in 2's complement format which are used when  
CTRL_REG2[RAW] = 0 (see section 5.5.2) to correct for the FXMS3110 zero-flux offset and for hard-iron offsets on the PCB  
caused by external components. The maximum range for the user offsets is in the range -10,000 to 10,000 bit counts comprising  
the sum of the correction for the sensor zero-flux offset and the PCB hard-iron offset (range -1000 μT to 1000 μT or -10,000 to  
10,000 bit counts).  
The user offsets are automatically subtracted by the FXMS3110 logic when CTRL_REG2[RAW] = 0 before the magnetic field  
readings are written to the data measurement output registers OUT_X/Y/Z. The maximum range of the X, Y and Z data  
measurement registers when CTRL_REG2[RAW] = 0 is therefore -30,000 to 30,000 bit counts and is computed without clipping.  
The user offsets are not subtracted when CTRL_REG2[RAW] = 1. The least significant bit of the user defined X, Y and Z offsets  
is forced to be zero irrespective of the value written by the user.  
If the FXMS3110 zero-flux offset and PCB hard-iron offset corrections are performed by an external microprocessor (the most  
likely scenario) then the user offset registers can be ignored and the CTRL_REG2[RAW] bit should be set to 1.  
The user offset registers should not be confused with the factory calibration corrections which are not user accessible and are  
always applied to the measured magnetic data irrespective o the setting of CTRL_REG2[RAW].  
Table 23. OFF_X_MSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
XD14  
XD13  
XD12  
XD11  
XD10  
XD9  
XD8  
XD7  
Table 24. OFF_X_LSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
XD6  
XD5  
XD4  
XD3  
XD2  
XD1  
XD0  
0
Table 25. OFF_Y_MSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
YD14  
YD13  
YD12  
YD11  
YD10  
YD9  
YD8  
YD7  
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Table 26. OFF_Y_LSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
YD6  
YD5  
YD4  
YD3  
YD2  
YD1  
YD0  
0
Table 27. OFF_Z_MSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
ZD14  
ZD13  
ZD12  
ZD11  
ZD10  
ZD9  
ZD8  
ZD7  
Table 28. OFF_Z_LSB Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
ZD6  
ZD5  
ZD4  
ZD3  
ZD2  
ZD1  
ZD0  
0
5.4  
Temperature  
5.4.1  
DIE_TEMP (0x0F)  
The register contains the die temperature in °C expressed as an 8-bit 2's complement number. The sensitivity of the temperature  
sensor is factory trimmed to 1°C/LSB. The temperature sensor offset is not factory trimmed and must be calibrated by the user  
software if higher absolute accuracy is required. Note: The register allows for temperature measurements from -128°C to 127°C  
but the output range is limited to -40°C to 125°C. The temperature data is updated on every measurement cycle.  
Table 29. TEMP Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
T7  
T6  
T5  
T4  
T3  
T2  
T1  
T0  
5.5  
Control Registers  
CTRL_REG1 (0x10)  
5.5.1  
Note: Except for STANDBY mode selection (Bit 0, AC), the device must be in STANDBY mode to change any of the fields within  
CTRL_REG1 (0x10).  
Table 30. CTRL_REG1 Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
DR2  
DR1  
DR0  
OS1  
OS0  
FR  
TM  
AC  
Table 31. CTRL_REG1 Description  
Output data rate selection. Default value: 000.  
See Table 32 for more information.  
DR[2:0]  
This register configures the over sampling ratio for the measurement. The selected number of samples is collected and  
averaged before being placed in the output data registers. The oversampling setting made here applies to both the triggered  
OS [1:0]  
and active modes of operation.  
Default value: 00.  
See Table 32 for more information.  
Fast Read selection. Default value: 0.  
FR  
TM  
0: The full 16-bit values are read.  
1: Fast Read, 8-bit values read from the MSB registers (Auto-increment skips over the LSB register in burst-read mode).  
Trigger immediate measurement. Default value: 0  
0: Normal operation based on AC condition.  
1: Trigger measurement.  
If part is in ACTIVE mode, any measurement in progress will continue with the highest ODR possible for the selected OSR.  
In STANDBY mode triggered measurement will occur immediately and part will return to STANDBY mode as soon as the  
measurement is complete.  
Operating mode selection. Note: see section 4.2.6 for details. Default value: 0.  
0: STANDBY mode.  
AC  
1: ACTIVE mode.  
ACTIVE mode will make periodic measurements based on values programmed in the Data Rate (DR) and Over Sampling  
Ratio bits (OS).  
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Table 32. Over-Sampling Ratio and Data Rate Description  
Over  
Sample  
Ratio  
Current Typ Noise Typ  
OutputRate  
(Hz)  
ADC Rate  
(Hz)  
DR2  
DR1  
DR0  
OS1  
OS0  
μA  
μT rms  
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
80.00  
40.00  
20.00  
10.00  
40.00  
20.00  
10.00  
5.00  
20.00  
10.00  
5.00  
2.50  
10.00  
5.00  
2.50  
1.25  
5.00  
2.50  
1.25  
0.63  
2.50  
1.25  
0.63  
0.31  
1.25  
0.63  
0.31  
0.16  
0.63  
0.31  
0.16  
0.08  
16  
32  
1280  
1280  
1280  
1280  
640  
640  
640  
640  
320  
320  
320  
320  
160  
160  
160  
160  
80  
900.0  
900.0  
900.0  
900.0  
550.0  
550.0  
550.0  
550.0  
275.0  
275.0  
275.0  
275.0  
137.5  
137.5  
137.5  
137.5  
68.8  
0.4  
0.35  
0.3  
64  
128  
16  
0.25  
0.4  
32  
0.35  
0.3  
64  
128  
16  
0.25  
0.4  
32  
0.35  
0.3  
64  
128  
16  
0.25  
0.4  
32  
0.35  
0.3  
64  
128  
16  
0.25  
0.4  
32  
80  
68.8  
0.35  
0.3  
64  
80  
68.8  
128  
16  
80  
68.8  
0.25  
0.4  
80  
34.4  
32  
80  
34.4  
0.35  
0.3  
64  
80  
34.4  
128  
16  
80  
34.4  
0.25  
0.4  
80  
17.2  
32  
80  
17.2  
0.35  
0.3  
64  
80  
17.2  
128  
16  
80  
17.2  
0.25  
0.4  
80  
8.6  
32  
80  
8.6  
0.35  
0.3  
64  
80  
8.6  
128  
80  
8.6  
0.25  
FXMS3110  
Sensors  
20  
Freescale Semiconductor, Inc.  
5.5.2  
CTRL_REG2 (0x11)  
Table 33. CTRL_REG2 Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
AUTO_MRST_EN  
RAW  
Mag_RST  
Table 34. CTRL_REG2 Description  
Automatic Magnetic Sensor Reset. Default value: 0.  
0: Automatic magnetic sensor resets disabled.  
1: Automatic magnetic sensor resets enabled.  
AUTO_MRST_EN  
Similar to Mag_RST, however, the resets occur automatically before each data acquisition.  
This bit is recommended to be always explicitly enabled by the host application. This a WRITE ONLY bit and always reads  
back as 0.  
Data output correction. Default value: 0.  
0: Normal mode: data values are corrected by the user offset register values.  
1: Raw mode: data values are not corrected by the user offset register values.  
Note: The factory calibration is always applied to the measured data stored in registers 0x01 to 0x06 irrespective of the  
setting of the RAW bit.  
RAW  
Magnetic Sensor Reset (One-Shot). Default value: 0.  
0: Reset cycle not active.  
1: Reset cycle initiate or Reset cycle busy/active.  
Mag_RST  
When asserted, initiates a magnetic sensor reset cycle that will restore correct operation after exposure to an excessive  
magnetic field which exceeds the Full Scale Range (see Table 3) but is less than the Maximum Applied Magnetic Field  
(see Table 4).  
When the cycle is finished, value returns to 0.  
FXMS3110  
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Freescale Semiconductor, Inc.  
21  
6
Geomagnetic Field Maps  
The magnitude of the geomagnetic field varies from 25 μT in South America to about 60 μT over Northern China. The horizontal  
component of the field varies from zero at the magnetic poles to 40 μT.  
These web sites have further information:  
http://wdc.kugi.kyoto-u.ac.jp/igrf/  
http://geomag.usgs.gov/  
FXMS3110  
Sensors  
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Freescale Semiconductor, Inc.  
Geomagnetic Field  
FXMS3110  
Sensitivity  
(0.1 μT)  
FXMS3110  
Full-Scale  
Range  
(1000 μT)  
FXMS3110  
Sensors  
Freescale Semiconductor, Inc.  
23  
7
PCB Guidelines  
Surface mount Printed Circuit Board (PCB) layout is a critical portion of the total design. The footprint for the surface mount  
packages must be the correct size to ensure proper solder connection interface between the PCB and the package. With the  
correct footprint, the packages will self-align when subjected to a solder reflow process. These guidelines are for soldering and  
mounting the Dual Flat No-Lead (DFN) package inertial sensors to PCBs. The purpose is to minimize the stress on the package  
after board mounting. The FXMS3110 digital output magnetometers use the DFN package platform. This section describes  
suggested methods of soldering these devices to the PCB for consumer applications.  
Please see Freescale application note AN4247,”Layout Recommendation for PCBs Using a magnetometer Sensor” for a  
technical discussion on hard and soft-iron magnetic interference and general guidelines on layout and component selection  
applicable to any PCB using a magnetometer sensor.  
Freescale application note AN1902, “Quad Flat Pack No-Lead (QFN) Micro Dual Flat Pack No-Lead (μDFN)” discusses the DFN  
package used by the FXMS3110, PCB design guidelines for using DFN packages and temperature profiles for reflow soldering.  
7.1  
Overview of Soldering Considerations  
Information provided here is based on experiments executed on DFN devices. They do not represent exact conditions present  
at a customer site. Hence, information herein should be used as guidance only and process and design optimizations are  
recommended to develop an application specific solution. It should be noted that with the proper PCB footprint and solder stencil  
designs, the package will self-align during the solder reflow process.  
7.2  
Halogen Content  
This package is designed to be Halogen Free, exceeding most industry and customer standards. Halogen Free means that no  
homogeneous material within the assembly package shall contain chlorine (Cl) in excess of 700 ppm or 0.07% weight/weight or  
bromine (Br) in excess of 900 ppm or 0.09% weight/weight.  
7.3  
PCB Mounting Recommendations  
1. The PCB land should be designed as Non Solder Mask Defined (NSMD) as shown in Figure 6.  
2. No additional via pattern underneath package.  
3. PCB land pad is 0.6 mm x 0.225 mm as shown in Figure 6.  
4. Solder mask opening = PCB land pad edge + 0.125 mm larger all around = 0.725 mm x 1.950 mm  
5. Stencil opening = PCB land pad -0.05 mm smaller all around = 0.55 mm x 0.175 mm.  
6. Stencil thickness is 100 or 125 mm.  
7. Do not place any components or vias at a distance less than 2 mm from the package land area. This may cause  
additional package stress if it is too close to the package land area.  
8. Signal traces connected to pads are as symmetric as possible. Put dummy traces on NC pads in order to have same  
length of exposed trace for all pads.  
9. Use a standard pick and place process and equipment. Do not use a hand soldering process.  
10. Assemble PCB when in an enclosure. Using caution, determine the position of screw down holes and any press fit. It is  
important that the assembled PCB remain flat after assembly to keep electronic operation of the device optimal.  
11. The PCB should be rated for the multiple lead-free reflow condition with max 260°C temperature.  
12. No copper traces on top layer of PCB under the package. This will cause planarity issues with board mount. Freescale  
DFN sensors are compliant with Restrictions on Hazardous Substances (RoHS), having halide free molding compound  
(green) and lead-free terminations. These terminations are compatible with tin-lead (Sn-Pb) as well as tin-silver-copper  
(Sn-Ag-Cu) solder paste soldering processes. Reflow profiles applicable to those processes can be used successfully for  
soldering the devices.  
FXMS3110  
Sensors  
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Freescale Semiconductor, Inc.  
0.200  
0.400  
0.200  
0.225  
0.600  
0.400  
Package Footprint  
PCB Cu Footprint  
0.725  
0.550  
1.950  
0.175  
Stencil Opening  
Solder Mask Opening  
Figure 6. Footprints and Soldering Masks (dimensions in mm)  
FXMS3110  
Sensors  
Freescale Semiconductor, Inc.  
25  
PACKAGE DIMENSIONS  
CASE 2154-02  
ISSUE A  
10-PIN DFN  
FXMS3110  
Sensors  
26  
Freescale Semiconductor, Inc.  
PACKAGE DIMENSIONS  
CASE 2154-02  
ISSUE A  
10-PIN DFN  
FXMS3110  
Sensors  
Freescale Semiconductor, Inc.  
27  
PACKAGE DIMENSIONS  
CASE 2154-02  
ISSUE A  
10-PIN DFN  
FXMS3110  
Sensors  
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Freescale Semiconductor, Inc.  
Table 35. Revision history  
Revision  
number  
Revision  
date  
Description of changes  
0
07/2012  
• Initiated new data sheet.  
• Deleted section 4.1. Updated I2C sections 4.3.1 and 4.3.2 (replaced Pullup section).  
• Updated case outline from 2154-01 to 2154-02.  
0.5  
10/2012  
• Fully qualified.  
• Updated ordering table.  
1
02/2013  
• Table title for Table 2 and Table 5: Updated VDD = 1.8 V to VDD = 2.4 V and added VDDIO = 1.8 V.  
• Updated second paragraph in Section 5.3.1 “The user offsets are automatically added by the FXMS3110... “ to  
“The user offsets are automatically subtracted by the FXMS3110... “  
FXMS3110  
Sensors  
Freescale Semiconductor, Inc.  
29  
Information in this document is provided solely to enable system and software  
implementers to use Freescale products. There are no express or implied copyright  
licenses granted hereunder to design or fabricate any integrated circuits based on the  
information in this document.  
How to Reach Us:  
Home Page:  
freescale.com  
Web Support:  
freescale.com/support  
Freescale reserves the right to make changes without further notice to any products  
herein. Freescale makes no warranty, representation, or guarantee regarding the  
suitability of its products for any particular purpose, nor does Freescale assume any  
liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation consequential or incidental  
damages. “Typical” parameters that may be provided in Freescale data sheets and/or  
specifications can and do vary in different applications, and actual performance may  
vary over time. All operating parameters, including “typicals,must be validated for each  
customer application by customer’s technical experts. Freescale does not convey any  
license under its patent rights nor the rights of others. Freescale sells products pursuant  
to standard terms and conditions of sale, which can be found at the following address:  
freescale.com/SalesTermsandConditions.  
Freescale, the Freescale logo, AltiVec, C-5, CodeTest, CodeWarrior, ColdFire, C-Ware,  
Energy Efficient Solutions logo, Kinetis, mobileGT, PowerQUICC, Processor Expert,  
QorIQ, Qorivva, StarCore, Symphony, and VortiQa are trademarks of Freescale  
Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. Airfast, BeeKit, BeeStack, ColdFire+,  
CoreNet, Flexis, MagniV, MXC, Platform in a Package, QorIQ Qonverge, QUICC  
Engine, Ready Play, SafeAssure, SMARTMOS, TurboLink, Vybrid, and Xtrinsic are  
trademarks of Freescale Semiconductor, Inc. All other product or service names are  
the property of their respective owners.  
© 2013 Freescale Semiconductor, Inc.  
Document Number: FXMS3110  
Rev. 1  
02/2013  

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