HEF4534BN [NXP]

Real time 5-decade counter; 实时5十进制计数器
HEF4534BN
型号: HEF4534BN
厂家: NXP    NXP
描述:

Real time 5-decade counter
实时5十进制计数器

计数器
文件: 总10页 (文件大小:130K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
INTEGRATED CIRCUITS  
DATA SHEET  
For a complete data sheet, please also download:  
The IC04 LOCMOS HE4000B Logic  
Family Specifications HEF, HEC  
The IC04 LOCMOS HE4000B Logic  
Package Outlines/Information HEF, HEC  
HEF4534B  
LSI  
Real time 5-decade counter  
January 1995  
Product specification  
File under Integrated Circuits, IC04  
Philips Semiconductors  
Product specification  
HEF4534B  
LSI  
Real time 5-decade counter  
scanner is triggered by a LOW to HIGH transition on the  
scanner clock (CPS) and is reset (select ten thousand  
counter) by a HIGH level on the scanner reset (MRsc).  
DESCRIPTION  
The HEF4534B is a 5-decade ripple counter. The binary  
outputs of the decade counters are time-multiplexed by an  
internal scanner on four BCD outputs (O0 to O3). The  
selected decade is indicated by a logic HIGH on the  
appropriate digit select output (OS0: units, 1; OS1: tens,  
10; OS2: hundreds, 102; OS3: thousands, 103; OS4: ten  
thousands, 104).  
The counter can operate in four modes depending on the  
state of the mode select inputs (SA, SB). The error detector  
will detect an error when a positive edge on CPA is not  
accompanied by a negative edge on the error detector  
clock CPE or vice versa, within time limits adjusted by  
external capacitors connected to Cext 1 and Cext 2. Three or  
more detected errors result in a HIGH level on the error  
output (OER). The error detector is reset by a HIGH level  
on MR.  
The binary outputs (O0 to O3) and the select outputs  
(OS0 to OS4) are 3-state controlled via enable inputs  
EO and EOS respectively, allowing interface with other  
bus orientated devices. Cascading may be accomplished  
by using the carry out (TC). The counter is triggered by a  
LOW to HIGH transition on the decade clock (CPA) and is  
reset by a HIGH level on the master reset (MR). The  
Schmitt-trigger action in the clock inputs makes the circuit  
highly tolerant to slower clock rise and fall times.  
Fig.1 Pinning diagram.  
PINNING  
HEF4534BP(N): 24-lead DIL; plastic (SOT101-1)  
O1 to O3  
OS0 to OS3  
OER  
BCD outputs  
HEF4534BD(F):  
HEF4534BT(D):  
24-lead DIL; ceramic (cerdip) (SOT94)  
24-lead SO; plastic (SOT137-1)  
digit select outputs  
error output  
( ): Package Designator North America  
CPA  
decade clock input  
scanner clock input  
error detector clock input  
mode select inputs  
master reset input  
scanner reset input  
carry out  
CPS  
CPE  
SA, SB  
MR  
MRsc  
TC  
FAMILY DATA, IDD LIMITS category LSI  
See Family Specifications  
January 1995  
2
Philips Semiconductors  
Product specification  
HEF4534B  
LSI  
Real time 5-decade counter  
Fig.2 Functional block diagram.  
3
January 1995  
Philips Semiconductors  
Product specification  
HEF4534B  
LSI  
Real time 5-decade counter  
MODE CONTROL FUNCTION TABLE  
SELECT INPUTS 1ST DECADE CARRY TO 2ND STAGE CARRY TO 4TH STAGE  
OUTPUT  
MODE  
SA  
SB  
normal count  
and display  
at 9 to 0 transition  
of the 1st decade  
at 9 to 0 transition  
of the 3rd decade  
5-decade  
L
L
counter  
test purposes:  
clock directly into  
stages 1, 2 and 4  
4-decade counter  
with ÷ 10 and round-  
off at front end  
L
H
H
H
H
L
inhibited  
inhibited  
input clock  
input clock  
at 4 to 5 transition  
of the 1st decade  
at 9 to 0 transition  
of the 3rd decade  
display counts:  
3, 4, 5, 6, 7 = 5  
8, 9, 0, 1, 2 = 0  
at 7 to 8 transition  
of the 1st decade  
at 9 to 0 transition  
of the 3rd decade  
4-decade counter;  
12-pence capability  
Fig.3 Error detection timing diagram.  
The skew time is the time difference between the LOW to  
HIGH transition of CPA and the HIGH to LOW transition of  
CPE or vice versa (see Fig.4). The skew time is typically  
proportional to the external capacitor (Cext) connected  
from Cext1 and Cext2 (pins 1 and 22) to VSS. The error  
detector will count an error when a positive edge on the  
counter clock CPA is not succeeded by a negative edge on  
the error detector clock CPE within a skew time  
tSK1 (adjustable by Cext1 at pin 1). The same holds for a  
negative edge at CPE succeeded by a positive on CPA  
within a skew time tSK2 (adjustable by Cext2 at pin 22). If  
error detection is not needed, CPE must be either HIGH or  
LOW and no Cext is applied. For further information see  
Fig.5.  
Fig.4 Skew times  
timing diagram;  
t
WCPA > tSK1  
;
.
t
WCPE > tSK2  
January 1995  
4
Philips Semiconductors  
Product specification  
HEF4534B  
LSI  
Real time 5-decade counter  
Note 1: Skew in this area results in counted error.  
Note 2: Skew in the area between max. and min. curves may or may not result in counted error.  
Note 3: Skew in this area results in no error counted.  
Fig.5 Typical clock skew as a function of the supply voltage. This graph is accurate for Cext 100 pF and  
amb = 25 °C.  
T
Fig.6 Carry timing diagram.  
5
January 1995  
Philips Semiconductors  
Product specification  
HEF4534B  
LSI  
Real time 5-decade counter  
Note: If SB = H, the 1st decade is inhibited and the cycle will be shortened to four stages (see dotted lines).  
Fig.7 Scanner timing diagram.  
Fig.8 Counter timing diagram.  
January 1995  
6
Philips Semiconductors  
Product specification  
HEF4534B  
LSI  
Real time 5-decade counter  
AC CHARACTERISTICS  
VSS = 0 V; Tamb = 25 °C; CL = 50 pF; input transition times 20 ns  
VDD  
V
TYPICAL EXTRAPOLATION  
FORMULA  
SYMBOL  
MIN.  
TYP. MAX.  
Propagation delays  
CPA On  
D1 selected  
5
300  
130  
95  
600 ns  
283 ns + (0,55 ns/pF) CL  
119 ns + (0,23 ns/pF) CL  
87 ns + (0,16 ns/pF) CL  
213 ns + (0,55 ns/pF) CL  
89 ns + (0,23 ns/pF) CL  
67 ns + (0,16 ns/pF) CL  
523 ns + (0,55 ns/pF) CL  
219 ns + (0,23 ns/pF) CL  
162 ns + (0,16 ns/pF) CL  
523 ns + (0,55 ns/pF) CL  
219 ns + (0,23 ns/pF) CL  
162 ns + (0,16 ns/pF) CL  
393 ns + (0,55 ns/pF) CL  
179 ns + (0,23 ns/pF) CL  
132 ns + (0,16 ns/pF) CL  
173 ns + (0,55 ns/pF) CL  
74 ns + (0,23 ns/pF) CL  
52 ns + (0,16 ns/pF) CL  
113 ns + (0,55 ns/pF) CL  
54 ns + (0,23 ns/pF) CL  
42 ns + (0,16 ns/pF) CL  
198 ns + (0,55 ns/pF) CL  
84 ns + (0,23 ns/pF) CL  
62 ns + (0,16 ns/pF) CL  
198 ns + (0,55 ns/pF) CL  
84 ns + (0,23 ns/pF) CL  
62 ns + (0,16 ns/pF) CL  
143 ns + (0,55 ns/pF) CL  
59 ns + (0,23 ns/pF) CL  
42 ns + (0,16 ns/pF) CL  
143 ns + (0,55 ns/pF) CL  
59 ns + (0,23 ns/pF) CL  
42 ns + (0,16 ns/pF) CL  
10  
15  
5
tPHL  
tPLH  
tPHL  
tPLH  
tPLH  
tPHL  
tPHL  
tPHL  
tPLH  
tPHL  
tPLH  
260 ns  
190 ns  
480 ns  
200 ns  
150 ns  
HIGH to LOW  
240  
100  
75  
LOW to HIGH  
10  
15  
5
CPA On  
550 1100 ns  
D5 selected  
10  
15  
5
230  
170  
460 ns  
340 ns  
HIGH to LOW  
550 1100 ns  
LOW to HIGH  
10  
15  
5
230  
170  
420  
190  
140  
200  
85  
460 ns  
340 ns  
840 ns  
380 ns  
280 ns  
400 ns  
170 ns  
120 ns  
280 ns  
130 ns  
100 ns  
450 ns  
190 ns  
140 ns  
450 ns  
190 ns  
140 ns  
340 ns  
140 ns  
100 ns  
340 ns  
140 ns  
100 ns  
CPA TC  
LOW to HIGH  
10  
15  
5
MR On  
HIGH to LOW  
10  
15  
5
60  
MR OER  
140  
65  
HIGH to LOW  
10  
15  
5
50  
CPS On  
225  
95  
HIGH to LOW  
10  
15  
5
70  
225  
95  
LOW to HIGH  
10  
15  
5
70  
CPS OSn  
170  
70  
HIGH to LOW  
10  
15  
5
50  
CPS OSn  
170  
70  
LOW to HIGH  
10  
15  
50  
January 1995  
7
Philips Semiconductors  
Product specification  
HEF4534B  
LSI  
Real time 5-decade counter  
VDD  
V
TYPICAL EXTRAPOLATION  
FORMULA  
SYMBOL  
MIN.  
TYP. MAX.  
Output transition times  
HIGH to LOW  
5
60  
30  
20  
60  
30  
20  
120 ns  
10 ns + (1,0 ns/pF) CL  
9 ns + (0,42 ns/pF) CL  
6 ns + (0,28 ns/pF) CL  
10 ns + (1,0 ns/pF) CL  
9 ns + (0,42 ns/pF) CL  
6 ns + (0,28 ns/pF) CL  
10  
15  
5
tTHL  
60 ns  
40 ns  
120 ns  
60 ns  
40 ns  
LOW to HIGH  
10  
15  
tTLH  
AC CHARACTERISTICS  
VSS = 0 V; Tamb = 25 °C; CL = 50 pF; input transition times 20 ns  
VDD  
V
SYMBOL  
MIN. TYP. MAX.  
3-state propagation delays  
Output disable times  
EO On;  
5
30  
25  
20  
40  
25  
20  
60  
50  
40  
80  
50  
40  
ns  
ns  
ns  
ns  
ns  
ns  
EOS OSn  
HIGH  
10  
15  
5
tPHZ  
LOW  
10  
15  
tPLZ  
Output enable times  
EO On;  
5
10  
15  
5
35  
20  
15  
50  
25  
15  
35  
20  
15  
45  
30  
20  
60  
30  
25  
30  
20  
15  
70  
40  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
EOS OSn  
HIGH  
tPZH  
30  
100  
50  
LOW  
10  
15  
5
tPZL  
30  
Minimum clock pulse  
width; CPA, CPS  
HIGH  
70  
40  
30  
90  
60  
40  
120  
60  
50  
60  
40  
30  
10  
15  
5
tWCPH  
tWMRH  
tRMR  
tRMR  
Minimum reset pulse  
width; MR, MRsc  
HIGH  
10  
15  
5
Recovery time  
for MR  
10  
15  
5
Recovery time  
for MRsc  
10  
15  
January 1995  
8
Philips Semiconductors  
Product specification  
HEF4534B  
LSI  
Real time 5-decade counter  
VDD  
V
SYMBOL  
MIN. TYP. MAX.  
Maximum clock  
pulse frequency  
CPA and CPS  
5
2,5  
6
5
12  
16  
MHz  
MHz  
MHz  
10  
15  
fmax  
8
VDD  
V
TYPICAL FORMULA FOR P (µW)  
2
Dynamic power  
dissipation per  
package (P)(1)  
5
10  
15  
1 100 fi + ∑ (foCL) × VDD  
where  
2
4 800 fi + ∑ (foCL) × VDD  
fi = input freq. (MHz)  
fo = output freq. (MHz)  
CL = load cap. (pF)  
2
12 000 fi + ∑ (foCL) × VDD  
(foCL) = sum of outputs  
V
DD = supply voltage (V)  
Note  
1. Cext = 0.  
January 1995  
9
Philips Semiconductors  
Product specification  
HEF4534B  
LSI  
Real time 5-decade counter  
APPLICATION INFORMATION  
Fig.9 Two HEF4534B ICs connected for cascade operation. TC is HIGH for a single clock period when all five  
BCD decades go to zero. TC also goes HIGH when MR is applied.  
Fig.10 Forcing a decade to the On outputs. When the On outputs of a given decade are required, this  
configuration will lock-up the selected decade within four clock cycles. The select line feed back may be  
hardwired or switched.  
January 1995  
10  

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