LPC11U14FBD48_技术文档

LPC11U1x

32-bit ARM Cortex-M0 microcontroller; up to 32 kB flash; 6 kB

SRAM; USB device; USART

Rev. 1 — 11 April 2011

Objective data sheet

1. General description

The LPC11U1x are a ARM Cortex-M0 based, low-cost 32-bit MCU family, designed for

8/16-bit microcontroller applications, offering performance, low power, simple instruction

set and memory addressing together with reduced code size compared to existing 8/16-bit

architectures.

The LPC11U1x operate at CPU frequencies of up to 50 MHz.

Equipped with a highly flexible and configurable Full Speed USB 2.0 device controller, the

LPC11U1x brings unparalleled design flexibility and seamless integration to today’s

demanding connectivity solutions.

The peripheral complement of the LPC11U1x includes up to 32 kB of flash memory, 6 kB

of SRAM data memory, one Fast-mode Plus I²C-bus interface, one RS-485/EIA-485

USART with support for synchronous mode and smart card interface, two SSP interfaces,

four general purpose counter/timers, a 10-bit ADC, and up to 40 general purpose I/O pins.

2. Features and benefits

System:

ARM Cortex-M0 processor, running at frequencies of up to 50 MHz.

ARM Cortex-M0 built-in Nested Vectored Interrupt Controller (NVIC).

Non Maskable Interrupt (NMI) input selectable from several input sources.

System tick timer.

Memory:

Up to 32 kB on-chip flash program memory.

Total of 6 kB SRAM data memory (4 kB main SRAM and 2 kB USB SRAM).

16 kB boot ROM.

In-System Programming (ISP) and In-Application Programming (IAP) via on-chip

bootloader software.

Debug options:

Standard JTAG test/debug interface.

Serial Wire Debug.

Boundary scan for simplified board testing.

Digital peripherals:

Up to 40 General Purpose I/O (GPIO) pins with configurable pull-up/pull-down

resistors, repeater mode, and open-drain mode.

Up to 8 GPIO pins can beselected as edge and level sensitive interrupt sources.

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

Two GPIO grouped interrupt modules enable an interrupt based on a

programmable pattern of input states of a group of GPIO pins.

High-current source output driver (20 mA) on one pin (P0_7).

High-current sink driver (20 mA) on true open-drain pins (P0_4 and P0_5).

Four general purpose counter/timers with a total of up to 5 capture inputs and 13

match outputs.

Programmable Windowed WatchDog Timer (WWDT) with a dedicated, internal

low-power WatchDog Oscillator (WDO).

Analog peripherals:

10-bit ADC with input multiplexing among eight pins.

Serial interfaces:

USB 2.0 full-speed device controller.

USART with fractional baud rate generation, internal FIFO, a full modem control

handshake interface, and support for RS-485/9-bit mode and synchronous mode.

USART supports an asynchronous smart card interface (ISO 7816-3).

Two SSP controllers with FIFO and multi-protocol capabilities.

I²C-bus interface supporting the full I²C-bus specification and Fast-mode Plus with

a data rate of up to 1 Mbit/s with multiple address recognition and monitor mode.

Clock generation:

Crystal Oscillator with an operating range of 1 MHz to 25 MHz (system oscillator).

12 MHz high-frequency Internal RC oscillator (IRC) that can optionally be used as

a system clock.

Internal low-power, low-frequency WatchDog Oscillator (WDO) with programmable

frequency output.

PLL allows CPU operation up to the maximum CPU rate with the system oscillator

or the IRC as clock sources.

A second, dedicated PLL is provided for USB.

Clock output function with divider that can reflect the crystal oscillator, the main

clock, the IRC, or the watchdog oscillator.

Power control:

Four reduced power modes: Sleep, Deep-sleep, Power-down, and Deep

power-down.

Power profiles residing in boot ROM allow optimized performance and minimized

power consumption for any given application through one simple function call.

Processor wake-up from Deep-sleep and Power-down modes via reset, selectable

GPIO pins, watchdog interrupt, or USB port activity.

Processor wake-up from Deep power-down mode using one special function pin.

Integrated PMU (Power Management Unit) to minimize power consumption during

Sleep, Deep-sleep, Power-down, and Deep power-down modes.

Power-On Reset (POR).

Brownout detect with four separate thresholds for interrupt and forced reset.

Unique device serial number for identification.

Single 3.3 V power supply (1.8 V to 3.6 V).

Temperature range −40 °C to +85 °C.

Available as 48-pin LQFP, 48-pin TFBGA, and 33-pin HVQFN package.

Pin compatible to the LPC134x series.

LPC11U1X

All information provided in this document is subject to legal disclaimers.

Objective data sheet

Rev. 1 — 11 April 2011

2 of 64

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

3. Applications

Consumer peripherals

Handheld scanners

USB audio devices

Medical

Industrial control

4. Ordering information

Table 1.

Ordering information

Type number

Package

Name

Description

Version

LPC11U12FHN33/201 HVQFN33

plastic thermal enhanced very thin quad flat package; no leads; 33

n/a

terminals; body 7 × 7 × 0.85 mm

LPC11U12FBD48/201 LQFP48

LPC11U13FBD48/201 LQFP48

LPC11U14FHN33/201 HVQFN33

plastic low profile quad flat package; 48 leads; body 7 × 7 × 1.4 mm SOT313-2

plastic thermal enhanced very thin quad flat package; no leads; 33

n/a

terminals; body 7 × 7 × 0.85 mm

LPC11U14FBD48/201 LQFP48

LPC11U14FET48/201 TFBGA48

plastic low profile quad flat package; 48 leads; body 7 × 7 × 1.4 mm SOT313-2

plastic thin fine-pitch ball grid array package; 48 balls; body 4.5 × 4.5 SOT1155-2

× 0.7 mm

4.1 Ordering options

Table 2.

Ordering options

Type number

Flash SRAM

USART

I²C-bus

FM+

SSP USB

ADC

GPIO

device channels pins

CPU

16 kB 4 kB

24 kB 4 kB

32 kB 4 kB

USB

2 kB

Total

6 kB

LPC11U12FHN33/201

LPC11U12FBD48/201

LPC11U13FBD48/201

LPC11U14FHN33/201

LPC11U14FBD48/201

LPC11U14FET48/201

1

2

1

8

26

40

26

40

LPC11U1X

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Objective data sheet

Rev. 1 — 11 April 2011

3 of 64

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

5. Block diagram

SWD, JTAG

XTALIN XTALOUT

RESET

LPC11U12/13/14

SYSTEM OSCILLATOR

CLOCK

GENERATION,

POWER CONTROL,

SYSTEM

IRC, WDO

BOD

TEST/DEBUG

INTERFACE

CLKOUT

FUNCTIONS

POR

ARM

CORTEX-M0

PLL0

USB PLL

FLASH

16/24/32 kB

SRAM

6 kB

ROM

16 kB

system bus

master

slave

USB_DP

USB_DM

USB_VBUS

slave

USB DEVICE

CONTROLLER

HIGH-SPEED

GPIO

AHB-LITE BUS

GPIO ports 0/1

USB_FTOGGLE,

USB_CONNECT

slave

AHB TO APB

BRIDGE

RXD

TXD

USART/

SMARTCARD INTERFACE

(1)

DCD , DSR , RI

AD[7:0]

10-bit ADC

CTS, RTS, DTR

SCLK

SCL, SDA

2

I C-BUS

CT16B0_MAT[1:0]

16-bit COUNTER/TIMER 0

CT16B0_CAP0

SCK0, SSEL0,

MISO0, MOSI0

SSP0

CT16B1_MAT[1:0]

CT16B1_CAP0

CT32B0_MAT[3:0]

CT32B0_CAP0

16-bit COUNTER/TIMER 1

32-bit COUNTER/TIMER 0

SCK1, SSEL1,

MISO1, MOSI1

SSP1

IOCON

CT32B1_MAT[3:0]

32-bit COUNTER/TIMER 1

(2)

CT32B1_CAP[1:0]

SYSTEM CONTROL

PMU

WINDOWED WATCHDOG

TIMER

GPIO pins

GPIO INTERRUPTS

GPIO pins

GPIO GROUP0 INTERRUPTS

GPIO GROUP1 INTERRUPTS

002aaf885

(1) Not available on HVQFN33 packages.

(2) CT32B1_CAP1 available in TFBGA48 only.

Fig 1. Block diagram

LPC11U1X

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Objective data sheet

Rev. 1 — 11 April 2011

4 of 64

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

6. Pinning information

6.1 Pinning

terminal 1

index area

1

2

3

4

5

6

7

8

24

23

22

21

20

19

18

17

PIO1_19/DTR/SSEL1

TRST/PIO0_14/AD3/CT32B1_MAT1

TDO/PIO0_13/AD2/CT32B1_MAT0

TMS/PIO0_12/AD1/CT32B1_CAP0

TDI/PIO0_11/AD0/CT32B0_MAT3

PIO0_22/AD6/CT16B1_MAT1/MISO1

SWCLK/PIO0_10/SCK0/CT16B0_MAT2

PIO0_9/MOSI0/CT16B0_MAT1

RESET/PIO0_0

PIO0_1/CLKOUT/CT32B0_MAT2/USB_FTOGGLE

XTALIN

LPC11U1x

XTALOUT

V

DD

PIO0_20/CT16B1_CAP0

33 V

SS

PIO0_2/SSEL0/CT16B0_CAP0

PIO0_8/MISO0/CT16B0_MAT0

002aaf888

Transparent top view

Fig 2. Pin configuration (HVQFN33)

LPC11U1X

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Objective data sheet

Rev. 1 — 11 April 2011

5 of 64

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

1

2

36

35

34

33

32

31

30

29

28

27

26

25

PIO1_25/CT32B0_MAT1

PIO1_13/DTR/CT16B0_MAT0/TXD

TRST/PIO0_14/AD3/CT32B1_MAT1

TDO/PIO0_13/AD2/CT32B1_MAT0

TMS/PIO0_12/AD1/CT32B1_CAP0

TDI/PIO0_11/AD0/CT32B0_MAT3

PIO1_29/SCK0/CT32B0_CAP1

PIO0_22/AD6/CT16B1_MAT1/MISO1

SWCLK/PIO0_10/SCK0/CT16B0_MAT2

PIO0_9/MOSI0/CT16B0_MAT1

PIO0_8/MISO0/CT16B0_MAT0

PIO1_21/DCD/MISO1

PIO1_19/DTR/SSEL1

RESET/PIO0_0

3

4

PIO0_1/CLKOUT/CT32B0_MAT2/USB_FTOGGLE

5

V

SS

6

XTALIN

LPC11U1x

7

XTALOUT

8

V

DD

9

PIO0_20/CT16B1_CAP0

PIO0_2/SSEL0/CT16B0_CAP0

PIO1_26/CT32B0_MAT2/RXD

PIO1_27/CT32B0_MAT3/TXD

10

11

12

PIO1_31

002aaf884

Fig 3. Pin configuration (LQFP48)

LPC11U1X

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Objective data sheet

Rev. 1 — 11 April 2011

6 of 64

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

ball A1

index area

LPC11U1x

1

2

3

4

5

6

7

8

A

B

C

D

E

F

G

H

002aag101

Transparent top view

Fig 4. Pin configuration (TFBGA48)

LPC11U1X

All information provided in this document is subject to legal disclaimers.

Objective data sheet

Rev. 1 — 11 April 2011

7 of 64

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

6.2 Pin description

Table 3 shows all pins and their assigned digital or analog functions ordered by GPIO port

number. The default function after reset is listed first. All port pins have internal pull-up

resistors enabled after reset with the exception of the true open-drain pins PIO0_4 and

PIO0_5.

Every port pin has a corresponding IOCON register through which the digital or analog

function, pull-up/pull-down configuration, repeater, and open-drain modes can be

programmed.

The USART, counter/timer, and SSP functions are available on more than one port pin.

Table 4 shows how peripheral functions are assigned to port pins.

Table 3.

Symbol

Pin description

Reset Type

Description

state

[1]

[2]

RESET/PIO0_0

2

3

C1

I; PU

I

RESET — External reset input with 20 ns glitch

filter. A LOW-going pulse as short as 50 ns on

this pin resets the device, causing I/O ports and

peripherals to take on their default states, and

processor execution to begin at address 0. This

pin also serves as the debug select input. LOW

level selects the JTAG boundary scan. HIGH

level selects the ARM SWD debug mode.

-

I/O

PIO0_0 — General purpose digital input/output

pin.

[3]

PIO0_1/CLKOUT/

CT32B0_MAT2/

USB_FTOGGLE

3

4

C2

I; PU

PIO0_1 — General purpose digital input/output

pin. A LOW level on this pin during reset starts

the ISP command handler or the USB device

enumeration.

-

O

CLKOUT — Clockout pin.

CT32B0_MAT2 — Match output 2 for 32-bit

timer 0.

-

O

USB_FTOGGLE — USB 1 ms Start-of-Frame

signal.

[3]

PIO0_2/SSEL0/

CT16B0_CAP0

8

9

10 F1

I; PU

I/O

PIO0_2 — General purpose digital input/output

pin.

-

I/O

I

SSEL0 — Slave select for SSP0.

CT16B0_CAP0 — Capture input 0 for 16-bit

timer 0.

PIO0_3/USB_VBUS

14 H2

I; PU

I/O

PIO0_3 — General purpose digital input/output

pin. A LOW level on this pin during reset starts

the ISP command handler, a HIGH level starts

the USB device enumeration.

-

I

USB_VBUS — Monitors the presence of USB

bus power.

LPC11U1X

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Objective data sheet

Rev. 1 — 11 April 2011

8 of 64

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

Table 3.

Symbol

Pin description

Reset Type

Description

state

[1]

[4]

[3]

PIO0_4/SCL

PIO0_5/SDA

10 15 G3

11 16 H3

15 22 H6

I; IA

-

I/O

PIO0_4 — General purpose digital input/output

pin (open-drain).

SCL — I²C-bus clock input/output (open-drain).

High-current sink only if I²C Fast-mode Plus is

selected in the I/O configuration register.

I; IA

-

I/O

PIO0_5 — General purpose digital input/output

pin (open-drain).

SDA — I²C-bus data input/output (open-drain).

High-current sink only if I²C Fast-mode Plus is

selected in the I/O configuration register.

PIO0_6/USB_CONNECT/

SCK0

I; PU

-

I/O

O

PIO0_6 — General purpose digital input/output

pin.

USB_CONNECT — Signal used to switch an

external 1.5 kΩ resistor under software control.

Used with the SoftConnect USB feature.

-

I/O

SCK0 — Serial clock for SSP0.

[5]

[3]

PIO0_7/CTS

16 23 G7

17 27 F8

I; PU

PIO0_7 — General purpose digital input/output

pin (high-current output driver).

-

I

CTS — Clear To Send input for USART.

PIO0_8/MISO0/

CT16B0_MAT0

I; PU

I/O

PIO0_8 — General purpose digital input/output

pin.

-

I/O

O

MISO0 — Master In Slave Out for SSP0.

CT16B0_MAT0 — Match output 0 for 16-bit

timer 0.

[3]

PIO0_9/MOSI0/

CT16B0_MAT1

18 28 F7

I; PU

I/O

PIO0_9 — General purpose digital input/output

pin.

-

I/O

O

MOSI0 — Master Out Slave In for SSP0.

CT16B0_MAT1 — Match output 1 for 16-bit

timer 0.

SWCLK/PIO0_10/SCK0/

CT16B0_MAT2

19 29 E7

I; PU

-

I

SWCLK — Serial wire clock and test clock TCK

for JTAG interface.

I/O

PIO0_10 — General purpose digital

input/output pin.

-

O

SCK0 — Serial clock for SSP0.

CT16B0_MAT2 — Match output 2 for 16-bit

timer 0.

[6]

TDI/PIO0_11/AD0/

CT32B0_MAT3

21 32 D8

I; PU

-

I

TDI — Test Data In for JTAG interface.

I/O

PIO0_11 — General purpose digital input/output

pin.

-

I

AD0 — A/D converter, input 0.

O

CT32B0_MAT3 — Match output 3 for 32-bit

timer 0.

LPC11U1X

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Objective data sheet

Rev. 1 — 11 April 2011

9 of 64

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

Table 3.

Symbol

Pin description

Reset Type

Description

state

[1]

[6]

TMS/PIO0_12/AD1/

CT32B1_CAP0

22 33 C7

23 34 C8

24 35 B7

25 39 B6

26 40 A6

I; PU

-

I

TMS — Test Mode Select for JTAG interface.

I/O

PIO_12 — General purpose digital input/output

pin.

-

I

AD1 — A/D converter, input 1.

CT32B1_CAP0 — Capture input 0 for 32-bit

timer 1.

TDO/PIO0_13/AD2/

CT32B1_MAT0

I; PU

-

O

TDO — Test Data Out for JTAG interface.

I/O

PIO0_13 — General purpose digital

input/output pin.

-

I

AD2 — A/D converter, input 2.

O

CT32B1_MAT0 — Match output 0 for 32-bit

timer 1.

TRST/PIO0_14/AD3/

CT32B1_MAT1

I; PU

-

I

TRST — Test Reset for JTAG interface.

I/O

PIO0_14 — General purpose digital

input/output pin.

-

I

AD3 — A/D converter, input 3.

O

CT32B1_MAT1 — Match output 1 for 32-bit

timer 1.

SWDIO/PIO0_15/AD4/

CT32B1_MAT2

I; PU

-

I/O

SWDIO — Serial wire debug input/output.

PIO0_15 — General purpose digital

input/output pin.

-

I

AD4 — A/D converter, input 4.

O

CT32B1_MAT2 — Match output 2 for 32-bit

timer 1.

PIO0_16/AD5/

I; PU

I/O

PIO0_16 — General purpose digital

CT32B1_MAT3/WAKEUP

input/output pin.

-

I

AD5 — A/D converter, input 5.

O

CT32B1_MAT3 — Match output 3 for 32-bit

timer 1.

-

I

WAKEUP — Deep power-down mode wake-up

pin with 20 ns glitch filter. This pin must be

pulled HIGH externally to enter Deep

power-down mode and pulled LOW to exit Deep

power-down mode. A LOW-going pulse as short

as 50 ns wakes up the part.

[3]

PIO0_17/RTS/

30 45 A3

I; PU

I/O

PIO0_17 — General purpose digital

CT32B0_CAP0/SCLK

input/output pin.

-

O

I

RTS — Request To Send output for USART.

CT32B0_CAP0 — Capture input 0 for 32-bit

timer 0.

-

I/O

SCLK — Serial clock input/output for USART in

synchronous mode.

LPC11U1X

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Objective data sheet

Rev. 1 — 11 April 2011

10 of 64

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

Table 3.

Symbol

Pin description

Reset Type

Description

state

[1]

[3]

PIO0_18/RXD/

CT32B0_MAT0

31 46 B3

I; PU

I/O

PIO0_18 — General purpose digital

input/output pin.

-

I

RXD — Receiver input for USART.

O

CT32B0_MAT0 — Match output 0 for 32-bit

timer 0.

PIO0_19/TXD/

CT32B0_MAT1

32 47 B2

I; PU

I/O

PIO0_19 — General purpose digital

input/output pin.

-

O

TXD — Transmitter output for USART.

CT32B0_MAT1 — Match output 1 for 32-bit

timer 0.

[3]

PIO0_20/CT16B1_CAP0

7

9

F2

I; PU

I/O

I

PIO0_20 — General purpose digital

input/output pin.

-

CT16B1_CAP0 — Capture input 0 for 16-bit

timer 1.

PIO0_21/CT16B1_MAT0/

MOSI1

12 17 G4

I; PU

-

I/O

O

PIO0_21 — General purpose digital

input/output pin.

CT16B1_MAT0 — Match output 0 for 16-bit

timer 1.

-

I/O

MOSI1 — Master Out Slave In for SSP1.

[6]

PIO0_22/AD6/

20 30 E8

I; PU

PIO0_22 — General purpose digital

CT16B1_MAT1/MISO1

input/output pin.

-

I

AD6 — A/D converter, input 6.

O

CT16B1_MAT1 — Match output 1 for 16-bit

timer 1.

-

I/O

MISO1 — Master In Slave Out for SSP1.

[6]

[3]

PIO0_23/AD7

27 42 A5

I; PU

PIO0_23 — General purpose digital

input/output pin.

-

I

AD7 — A/D converter, input 7.

PIO1_0/CT32B1_MAT0

-

I; PU

I/O

PIO1_0 — General purpose digital input/output

pin.

-

O

CT32B1_MAT0 — Match output 0 for 32-bit

timer 1.

[3]

PIO1_1/CT32B1_MAT1

PIO1_2/CT32B1_MAT2

I; PU

I/O

O

PIO1_1 — General purpose digital input/output

pin.

-

CT32B1_MAT1 — Match output 1 for 32-bit

timer 1.

I; PU

-

I/O

O

PIO1_2 — General purpose digital input/output

pin.

CT32B1_MAT2 — Match output 2 for 32-bit

timer 1.

LPC11U1X

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Objective data sheet

Rev. 1 — 11 April 2011

11 of 64

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

Table 3.

Symbol

Pin description

Reset Type

Description

state

[1]

[3]

PIO1_3/CT32B1_MAT3

PIO1_4/CT32B1_CAP0

PIO1_5/CT32B1_CAP1

-

I; PU

-

I/O

O

PIO1_3 — General purpose digital input/output

pin.

CT32B1_MAT3 — Match output 3 for 32-bit

timer 1.

-

I; PU

-

I/O

I

PIO1_4 — General purpose digital input/output

pin.

CT32B1_CAP0 — Capture input 0 for 32-bit

timer 1.

H8

I; PU

-

I/O

I

PIO1_5 — General purpose digital input/output

pin.

CT32B1_CAP1 — Capture input 1 for 32-bit

timer 1.

[3]

PIO1_6

PIO1_7

PIO1_8

PIO1_9

PIO1_10

PIO1_11

PIO1_12

-

I; PU

I/O

PIO1_6 — General purpose digital input/output

pin.

PIO1_7 — General purpose digital input/output

pin.

PIO1_8 — General purpose digital input/output

pin.

PIO1_9 — General purpose digital input/output

pin.

PIO1_10 — General purpose digital

input/output pin.

PIO1_11 — General purpose digital input/output

pin.

PIO1_12 — General purpose digital

input/output pin.

PIO1_13/DTR/

36 B8

PIO1_13 — General purpose digital

CT16B0_MAT0/TXD

input/output pin.

-

O

DTR — Data Terminal Ready output for USART.

CT16B0_MAT0 — Match output 0 for 16-bit

timer 0.

-

O

TXD — Transmitter output for USART.

[3]

PIO1_14/DSR/

-

37 A8

I; PU

I/O

PIO1_14 — General purpose digital

CT16B0_MAT1/RXD

input/output pin.

-

I

DSR — Data Set Ready input for USART.

O

CT16B0_MAT1 — Match output 1 for 16-bit

timer 0.

-

I

RXD — Receiver input for USART.

LPC11U1X

All information provided in this document is subject to legal disclaimers.

Objective data sheet

Rev. 1 — 11 April 2011

12 of 64

LPC11U1x

NXP Semiconductors

32-bit ARM Cortex-M0 microcontroller

Table 3.

Symbol

Pin description

Reset Type

Description

state

[1]

[3]

PIO1_15/DCD/

CT16B0_MAT2/SCK1

28 43 A4

I; PU

-

I/O

PIO1_15 — General purpose digital

input/output pin.

I

DCD — Data Carrier Detect input for USART.

O

CT16B0_MAT2 — Match output 2 for 16-bit

timer 0.

-

I/O

SCK1 — Serial clock for SSP1.

[3]

PIO1_16/RI/

CT16B0_CAP0

-

48 A2

I; PU

PIO1_16 — General purpose digital

input/output pin.

-

I

RI — Ring Indicator input for USART.

CT16B0_CAP0 — Capture input 0 for 16-bit

timer 0.

PIO1_17/CT16B0_CAP1/

RXD

-

I; PU

-

I/O

I

PIO1_17 — General purpose digital

input/output pin.

CT16B0_CAP1 — Capture input 1 for 16-bit

timer 0.

-

I

RXD — Receiver input for USART.

PIO1_18/CT16B1_CAP1/

TXD

-

I; PU

I/O

PIO1_18 — General purpose digital

input/output pin.

-

I

CT16B1_CAP1 — Capture input 1 for 16-bit

timer 1.

-

O

TXD — Transmitter output for USART.

[3]

PIO1_19/DTR/SSEL1

PIO1_20/DSR/SCK1

PIO1_21/DCD/MISO1

PIO1_22/RI/MOSI1

1

-

2

B1

I; PU

I/O

PIO1_19 — General purpose digital

input/output pin.

-

O

DTR — Data Terminal Ready output for USART.

SSEL1 — Slave select for SSP1.

-

I/O

13 H1

26 G8

38 A7

I; PU

PIO1_20 — General purpose digital

input/output pin.

-

I

DSR — Data Set Ready input for USART.

SCK1 — Serial clock for SSP1.

-

I/O

-

I; PU

PIO1_21 — General purpose digital

input/output pin.

-

I

DCD — Data Carrier Detect input for USART.

MISO1 — Master In Slave Out for SSP1.

-

I/O

-

I; PU

PIO1_22 — General purpose digital

input/output pin.

-

I

RI — Ring Indicator input for USART.

I/O

MOSI1 — Master Out Slave In for SSP1.

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Table 3.

Symbol

Pin description

Reset Type

Description

state

[1]

[3]

PIO1_23/CT16B1_MAT1/

SSEL1

-

18 H4

I; PU

-

I/O

O

PIO1_23 — General purpose digital

input/output pin.

CT16B1_MAT1 — Match output 1 for 16-bit

timer 1.

-

I/O

SSEL1 — Slave select for SSP1.

[3]

PIO1_24/CT32B0_MAT0

PIO1_25/CT32B0_MAT1

-

21 G6

I; PU

PIO1_24 — General purpose digital

input/output pin.

-

O

CT32B0_MAT0 — Match output 0 for 32-bit

timer 0.

1

A1

I; PU

I/O

O

PIO1_25 — General purpose digital

input/output pin.

-

CT32B0_MAT1 — Match output 1 for 32-bit

timer 0.

PIO1_26/CT32B0_MAT2/

RXD

11 G2

12 G1

24 H7

I; PU

-

I/O

O

PIO1_26 — General purpose digital

input/output pin.

CT32B0_MAT2 — Match output 2 for 32-bit

timer 0.

-

I

RXD — Receiver input for USART.

[3]

PIO1_27/CT32B0_MAT3/

TXD

-

I; PU

I/O

PIO1_27 — General purpose digital

input/output pin.

-

O

CT32B0_MAT3 — Match output 3 for 32-bit

timer 0.

-

O

TXD — Transmitter output for USART.

PIO1_28/CT32B0_CAP0/

SCLK

I; PU

I/O

PIO1_28 — General purpose digital

input/output pin.

-

I

CT32B0_CAP0 — Capture input 0 for 32-bit

timer 0.

-

I/O

SCLK — Serial clock input/output for USART in

synchronous mode.

[3]

PIO1_29/SCK0/

CT32B0_CAP1

-

31 D7

I; PU

PIO1_29 — General purpose digital

input/output pin.

-

I/O

I

SCK0 — Serial clock for SSP0.

CT32B0_CAP1 — Capture input 1 for 32-bit

timer 0.

PIO1_31

25

-

I; PU

I/O

PIO1_31 — General purpose digital

input/output pin.

[7]

USB_DM

USB_DP

XTALIN

13 19 G5

14 20 H5

F

-

USB_DM — USB bidirectional D− line.

USB_DP — USB bidirectional D+ line.

[7]

[8][9]

4

6

D1

Input to the oscillator circuit and internal clock

generator circuits. Input voltage must not

exceed 1.8 V.

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Table 3.

Symbol

Pin description

Reset Type

Description

state

[1]

[8][9]

XTALOUT

V_DD

5

7

E1

-

Output from the oscillator amplifier.

6; 8;

29 44 E2

B4,

Supply voltage to the internal regulator, the

external rail, and the ADC. Also used as the

ADC reference voltage.

V_SS

33 5;

B5,

-

Ground.

41 D2

[1] Pin state at reset for default function: I = Input; O = Output; PU = internal pull-up enabled; IA = inactive, no pull-up/down enabled;

F = floating; floating pins, if not used, should be tied to ground or power to minimize power consumption.

[2] See Figure 31 for the reset pad configuration. RESET functionality is not available in Deep power-down mode. Use the WAKEUP pin to

reset the chip and wake up from Deep power-down mode. An external pull-up resistor is required on this pin for the Deep power-down

mode.

[3] 5 V tolerant pad providing digital I/O functions with configurable pull-up/pull-down resistors and configurable hysteresis (see Figure 30).

[4] I²C-bus pins compliant with the I²C-bus specification for I²C standard mode, I²C Fast-mode, and I²C Fast-mode Plus.

[5] 5 V tolerant pad providing digital I/O functions with configurable pull-up/pull-down resistors and configurable hysteresis (see Figure 30);

includes high-current output driver.

[6] 5 V tolerant pad providing digital I/O functions with configurable pull-up/pull-down resistors, configurable hysteresis, and analog input.

When configured as a ADC input, digital section of the pad is disabled and the pin is not 5 V tolerant (see Figure 30); includes digital

input glitch filter.

[7] Pad provides USB functions. It is designed in accordance with the USB specification, revision 2.0 (Full-speed and Low-speed mode

only). This pad is not 5 V tolerant.

[8] When the system oscillator is not used, connect XTALIN and XTALOUT as follows: XTALIN can be left floating or can be grounded

(grounding is preferred to reduce susceptibility to noise). XTALOUT should be left floating.

[9] When the system oscillator is not used, connect XTALIN and XTALOUT as follows: XTALIN can be left floating or can be grounded

(grounding is preferred to reduce susceptibility to noise). XTALOUT should be left floating.

To select a port pin for a peripheral function from Table 4, program the FUNC bits in the

port pin’s IOCON register with this function. The user must ensure that the assignment of

a function to a port pin is unambiguous. Only the debug functions for JTAG and SWD are

selected by default in their corresponding IOCON registers. All other functions must be

programmed in the IOCON block before they can be used. For details see the LPC11U1x

user manual.

Table 4.

Multiplexing of peripheral functions

Type Default Available on ports

Peripheral Function

USART

RXD

TXD

CTS

RTS

DTR

DSR

DCD

RI

I

no

PIO0_18

PIO0_19

PIO0_7

PIO1_14

PIO1_13

-

PIO1_17 PIO1_26

PIO1_18 PIO1_27

O

I

-

O

I

PIO0_17

PIO1_13

PIO1_14

PIO1_15

PIO1_16

PIO0_17

-

PIO1_19

PIO1_20

PIO1_21

PIO1_22

PIO1_28

I

SCLK

I/O

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Table 4.

Multiplexing of peripheral functions

Type Default Available on ports

Peripheral Function

SSP0

SCK0

I/O

I

no

PIO0_6

PIO0_10

PIO1_29

SSEL0

PIO0_2

-

MISO0

PIO0_8

-

MOSI0

PIO0_9

-

SSP1

SCK1

PIO1_15

PIO1_19

PIO0_22

PIO0_21

PIO0_2

PIO1_20

SSEL1

PIO1_23

MISO1

PIO1_21

MOSI1

PIO1_22

CT16B0

CT16B0_CAP0

CT16B0_CAP1

CT16B0_MAT0

CT16B0_MAT1

CT16B0_MAT2

CT16B1_CAP0

CT16B1_CAP1

CT16B1_MAT0

CT16B1_MAT1

CT32B0_CAP0

CT32B0_CAP1

CT32B0_MAT0

CT32B0_MAT1

CT32B0_MAT2

CT32B0_MAT3

CT32B1_CAP0

CT32B1_CAP1

CT32B1_MAT0

CT32B1_MAT1

CT32B1_MAT2

CT32B1_MAT3

AD0

PIO1_16

I

PIO1_17

PIO0_8

-

O

I

PIO1_13

PIO0_9

PIO1_14

PIO0_10

PIO0_20

PIO1_18

PIO0_21

PIO0_22

PIO0_17

PIO1_29

PIO0_18

PIO0_19

PIO0_1

PIO1_15

CT16B1

CT32B0

-

I

-

O

I

-

PIO1_23

PIO1_28

I

-

O

I

PIO1_24

PIO1_25

PIO1_26

PIO0_11

PIO0_12

PIO1_5

PIO1_27

CT32B1

PIO1_4

I

-

O

I

PIO0_13

PIO0_14

PIO0_15

PIO0_16

PIO0_11

PIO0_12

PIO0_13

PIO0_14

PIO0_15

PIO0_16

PIO0_22

PIO0_23

PIO0_3

PIO1_0

PIO1_1

PIO1_2

PIO1_3

ADC

-

AD1

I

AD2

I

AD3

I

AD4

I

AD5

I

AD6

I

AD7

I

USB

USB_VBUS

USB_FTOGGLE

USB_CONNECT

CLKOUT

I

O

PIO0_1

PIO0_6

CLKOUT

PIO0_1

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Table 4.

Multiplexing of peripheral functions

Type Default Available on ports

Peripheral Function

JTAG

SWD

TDI

I

yes

PIO0_11

PIO0_12

PIO0_13

PIO0_14

PIO0_10

PIO0_15

-

TMS

I

TDO

O

TRST

TCK

I

SWCLK

SWDIO

I

I/O

7. Functional description

7.1 Memory map

The LPC11U1x incorporates several distinct memory regions, shown in the following

figures. Figure 5 shows the overall map of the entire address space from the user

program viewpoint following reset. The interrupt vector area supports address remapping.

The AHB peripheral area is 2 MB in size and is divided to allow for up to 128 peripherals.

The APB peripheral area is 512 kB in size and is divided to allow for up to 32 peripherals.

Each peripheral of either type is allocated 16 kB of space. This allows simplifying the

address decoding for each peripheral.

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LPC11U12/13/14

4 GB

0xFFFF FFFF

reserved

0xE010 0000

0xE000 0000

private peripheral bus

reserved

APB peripherals

0x4008 0000

0x5000 4000

0x5000 0000

GPIO

25 - 31 reserved

0x4006 4000

GPIO GROUP0 INT

GPIO GROUP1 INT

24

23

22

0x4006 0000

0x4005 C000

reserved

0x4008 4000

SSP1

USB

0x4005 8000

0x4004 C000

0x4008 0000

0x4000 0000

20 - 21 reserved

APB peripherals

1 GB

GPIO interrupts

19

0x4004 C000

0x4004 8000

0x4004 4000

0x4004 0000

reserved

system control

IOCON

18

17

0x2000 4800

SSP0

2 kB USB RAM

reserved

16

15

0x2000 4000

0x2000 0000

flash controller

0x4003 C000

0x4003 8000

0.5 GB

14

PMU

reserved

10 - 13 reserved

0x1FFF 4000

0x1FFF 0000

0x4002 8000

0x4002 4000

0x4002 0000

16 kB boot ROM

reserved

9

8

7

6

5

4

3

2

reserved

ADC

0x4001 C000

0x4001 8000

32-bit counter/timer 1

32-bit counter/timer 0

16-bit counter/timer 1

16-bit counter/timer 0

USART/SMART CARD

WWDT

0x1000 1000

0x1000 0000

0x4001 4000

0x4001 0000

0x4000 C000

0x4000 8000

4 kB SRAM

reserved

0x0000 8000

0x0000 6000

1

0

0x4000 4000

0x4000 0000

32 kB on-chip flash (LPC11U14)

24 kB on-chip flash (LPC11U13)

2

I C-bus

0x0000 00C0

0x0000 4000

0x0000 0000

active interrupt vectors

16 kB on-chip flash (LPC11U12)

0x0000 0000

0 GB

002aaf891

Fig 5. LPC11U1x memory map

7.2 Nested Vectored Interrupt Controller (NVIC)

The Nested Vectored Interrupt Controller (NVIC) is an integral part of the Cortex-M0. The

tight coupling to the CPU allows for low interrupt latency and efficient processing of late

arriving interrupts.

7.2.1 Features

• Controls system exceptions and peripheral interrupts.

• In the LPC11U1x, the NVIC supports 24 vectored interrupts.

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• Four programmable interrupt priority levels, with hardware priority level masking.

• Software interrupt generation.

7.2.2 Interrupt sources

Each peripheral device has one interrupt line connected to the NVIC but may have several

interrupt flags. Individual interrupt flags may also represent more than one interrupt

source.

7.3 IOCON block

The IOCON block allows selected pins of the microcontroller to have more than one

function. Configuration registers control the multiplexers to allow connection between the

pin and the on-chip peripherals.

Peripherals should be connected to the appropriate pins prior to being activated and prior

to any related interrupt(s) being enabled. Activity of any enabled peripheral function that is

not mapped to a related pin should be considered undefined.

7.4 General Purpose Input/Output GPIO

Device pins that are not connected to a specific peripheral function are controlled by the

GPIO registers. Pins may be dynamically configured as inputs or outputs. Multiple outputs

can be set or cleared in one write operation.

LPC11U1x use accelerated GPIO functions:

• GPIO registers are a dedicated AHB peripheral so that the fastest possible I/O timing

can be achieved.

• Entire port value can be written in one instruction.

Any GPIO pin providing a digital function can be programmed to generate an interrupt on

a level, a rising or falling edge, or both.

7.4.1 Features

• GPIO pins can be configured as input or output by software.

• All GPIO pins default to inputs with interrupt disabled at reset.

• Pin registers allow pins to be sensed and set individually.

• Up to eight GPIO pins can be selected from all GPIO pins to create an edge- or

level-sensitive GPIO interrupt request.

• Port interrupts can be triggered by any pin or pins in each port.

7.5 USB interface

The Universal Serial Bus (USB) is a 4-wire bus that supports communication between a

host and one or more (up to 127) peripherals. The host controller allocates the USB

bandwidth to attached devices through a token-based protocol. The bus supports

hot-plugging and dynamic configuration of the devices. All transactions are initiated by the

host controller.

The LPC11U1x USB interface is a device controller with on-chip PHY for device functions.

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7.5.1 Full-speed USB device controller

The device controller enables 12 Mbit/s data exchange with a USB Host controller. It

consists of a register interface, serial interface engine, and endpoint buffer memory. The

serial interface engine decodes the USB data stream and writes data to the appropriate

endpoint buffer. The status of a completed USB transfer or error condition is indicated via

status registers. An interrupt is also generated if enabled.

7.5.1.1 Features

• Dedicated USB PLL available.

• Fully compliant with USB 2.0 specification (full speed).

• Supports 5 physical (10 logical) endpoints including one control endpoint.

• Single and double buffering supported.

• Each non-control endpoint supports bulk, interrupt, or isochronous endpoint types.

• Supports wake-up from Deep-sleep mode and Power-down mode on USB activity

and remote wake-up.

• Supports SoftConnect.

7.6 USART

The LPC11U1x contains one USART.

The USART includes full modem control, support for synchronous mode, and a smart

card interface. The RS-485/9-bit mode allows both software address detection and

automatic address detection using 9-bit mode.

The USART uses a fractional baud rate generator. Standard baud rates such as

115200 Bd can be achieved with any crystal frequency above 2 MHz.

7.6.1 Features

• Maximum USART data bit rate of 3.125 Mbit/s.

• 16-byte receive and transmit FIFOs.

• Register locations conform to 16C550 industry standard.

• Receiver FIFO trigger points at 1 B, 4 B, 8 B, and 14 B.

• Built-in fractional baud rate generator covering wide range of baud rates without a

need for external crystals of particular values.

• Fractional divider for baud rate control, auto baud capabilities and FIFO control

mechanism that enables software flow control implementation.

• Support for RS-485/9-bit mode.

• Support for modem control.

• Support for synchronous mode.

• Includes smart card interface.

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7.7 SSP serial I/O controller

The SSP controllers are capable of operation on a SSP, 4-wire SSI, or Microwire bus. It

can interact with multiple masters and slaves on the bus. Only a single master and a

single slave can communicate on the bus during a given data transfer. The SSP supports

full duplex transfers, with frames of 4 bits to 16 bits of data flowing from the master to the

slave and from the slave to the master. In practice, often only one of these data flows

carries meaningful data.

7.7.1 Features

• Maximum SSP speed of 25 Mbit/s (master) or 4.17 Mbit/s (slave) (in SSP mode)

• Compatible with Motorola SPI, 4-wire Texas Instruments SSI, and National

Semiconductor Microwire buses

• Synchronous serial communication

• Master or slave operation

• 8-frame FIFOs for both transmit and receive

• 4-bit to 16-bit frame

7.8 I²C-bus serial I/O controller

The LPC11U1x contain one I²C-bus controller.

The I²C-bus is bidirectional for inter-IC control using only two wires: a Serial Clock line

(SCL) and a Serial Data line (SDA). Each device is recognized by a unique address and

can operate as either a receiver-only device (e.g., an LCD driver) or a transmitter with the

capability to both receive and send information (such as memory). Transmitters and/or

receivers can operate in either master or slave mode, depending on whether the chip has

to initiate a data transfer or is only addressed. The I²C is a multi-master bus and can be

controlled by more than one bus master connected to it.

7.8.1 Features

• The I²C-interface is an I²C-bus compliant interface with open-drain pins. The I²C-bus

interface supports Fast-mode Plus with bit rates up to 1 Mbit/s.

• Easy to configure as master, slave, or master/slave.

• Programmable clocks allow versatile rate control.

• Bidirectional data transfer between masters and slaves.

• Multi-master bus (no central master).

• Arbitration between simultaneously transmitting masters without corruption of serial

data on the bus.

• Serial clock synchronization allows devices with different bit rates to communicate via

one serial bus.

• Serial clock synchronization can be used as a handshake mechanism to suspend and

resume serial transfer.

• The I²C-bus can be used for test and diagnostic purposes.

• The I²C-bus controller supports multiple address recognition and a bus monitor mode.

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7.9 10-bit ADC

The LPC11U1x contains one ADC. It is a single 10-bit successive approximation ADC with

eight channels.

7.9.1 Features

• 10-bit successive approximation ADC.

• Input multiplexing among 8 pins.

• Power-down mode.

• Measurement range 0 V to V_DD

.

• 10-bit conversion time ≥ 2.44 μs.

• Burst conversion mode for single or multiple inputs.

• Optional conversion on transition of input pin or timer match signal.

• Individual result registers for each ADC channel to reduce interrupt overhead.

7.10 General purpose external event counter/timers

The LPC11U1x includes two 32-bit counter/timers and two 16-bit counter/timers. The

counter/timer is designed to count cycles of the system derived clock. It can optionally

generate interrupts or perform other actions at specified timer values, based on four

match registers. Each counter/timer also includes one capture input to trap the timer value

when an input signal transitions, optionally generating an interrupt.

7.10.1 Features

• A 32-bit/16-bit timer/counter with a programmable 32-bit/16-bit prescaler.

• Counter or timer operation.

• One capture channel per timer, that can take a snapshot of the timer value when an

input signal transitions. A capture event may also generate an interrupt.

• Four match registers per timer that allow:

– Continuous operation with optional interrupt generation on match.

– Stop timer on match with optional interrupt generation.

– Reset timer on match with optional interrupt generation.

• Up to four external outputs corresponding to match registers, with the following

capabilities:

– Set LOW on match.

– Set HIGH on match.

– Toggle on match.

– Do nothing on match.

• The timer and prescaler may be configured to be cleared on a designated capture

event. This feature permits easy pulse-width measurement by clearing the timer on

the leading edge of an input pulse and capturing the timer value on the trailing edge.

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7.11 System tick timer

The ARM Cortex-M0 includes a system tick timer (SYSTICK) that is intended to generate

a dedicated SYSTICK exception at a fixed time interval (typically 10 ms).

7.12 Windowed WatchDog Timer (WWDT)

The purpose of the watchdog is to reset the controller if software fails to periodically

service it within a programmable time window.

7.12.1 Features

• Internally resets chip if not periodically reloaded during the programmable time-out

period.

• Optional windowed operation requires reload to occur between a minimum and

maximum time period, both programmable.

• Optional warning interrupt can be generated at a programmable time prior to

watchdog time-out.

• Enabled by software but requires a hardware reset or a watchdog reset/interrupt to be

disabled.

• Incorrect feed sequence causes reset or interrupt if enabled.

• Flag to indicate watchdog reset.

• Programmable 24-bit timer with internal prescaler.

• Selectable time period from (T_cy(WDCLK)× 256 × 4) to (T_cy(WDCLK)× 2²⁴× 4) in

multiples of T_cy(WDCLK)× 4.

• The Watchdog Clock (WDCLK) source can be selected from the IRC or the dedicated

watchdog oscillator (WDO). This gives a wide range of potential timing choices of

watchdog operation under different power conditions.

7.13 Clocking and power control

7.13.1 Integrated oscillators

The LPC11U1x include three independent oscillators. These are the system oscillator, the

Internal RC oscillator (IRC), and the watchdog oscillator. Each oscillator can be used for

more than one purpose as required in a particular application.

Following reset, the LPC11U1x will operate from the internal RC oscillator until switched

by software. This allows systems to operate without any external crystal and the

bootloader code to operate at a known frequency.

See Figure 6 for an overview of the LPC11U1x clock generation.

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CPU, system control,

PMU

system clock

n

SYSTEM CLOCK

DIVIDER

memories,

peripheral clocks

SYSAHBCLKCTRLn

(AHB clock enable)

IRC oscillator

main clock

SSP0 PERIPHERAL

CLOCK DIVIDER

SSP0

UART

SSP1

watchdog oscillator

USART PERIPHERAL

CLOCK DIVIDER

MAINCLKSEL

(main clock select)

SSP1 PERIPHERAL

CLOCK DIVIDER

IRC oscillator

SYSTEM PLL

system oscillator

SYSPLLCLKSEL

(system PLL clock select)

USB PLL

system oscillator

USB 48 MHz CLOCK

DIVIDER

USB

USBPLLCLKSEL

(USB clock select)

USBUEN

(USB clock update enable)

IRC oscillator

system oscillator

watchdog oscillator

CLKOUT PIN CLOCK

DIVIDER

CLKOUT pin

CLKOUTUEN

(CLKOUT update enable)

IRC oscillator

WDT

watchdog oscillator

WDCLKSEL

(WDT clock select)

002aaf892

Fig 6. LPC11U1x clocking generation block diagram

7.13.1.1 Internal RC oscillator

The IRC may be used as the clock source for the WDT, and/or as the clock that drives the

system PLL and subsequently the CPU. The nominal IRC frequency is 12 MHz.

Upon power-up, any chip reset, or wake-up from Deep power-down mode, the LPC11U1x

use the IRC as the clock source. Software may later switch to one of the other available

clock sources.

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7.13.1.2 System oscillator

The system oscillator can be used as the clock source for the CPU, with or without using

the PLL. On the LPC11U1x, the system oscillator must be used to provide the clock

source to USB.

The system oscillator operates at frequencies of 1 MHz to 25 MHz. This frequency can be

boosted to a higher frequency, up to the maximum CPU operating frequency, by the

system PLL.

7.13.1.3 Watchdog oscillator

The watchdog oscillator can be used as a clock source that directly drives the CPU, the

watchdog timer, or the CLKOUT pin. The watchdog oscillator nominal frequency is

programmable between 7.8 kHz and 1.7 MHz. The frequency spread over processing and

temperature is ±40 % (see also Table 13).

7.13.2 System PLL and USB PLL

The LPC11U1x contain a system PLL and a dedicated PLL for generating the 48 MHz

USB clock. The system and USB PLLs are identical.

The PLL accepts an input clock frequency in the range of 10 MHz to 25 MHz. The input

frequency is multiplied up to a high frequency with a Current Controlled Oscillator (CCO).

The multiplier can be an integer value from 1 to 32. The CCO operates in the range of

156 MHz to 320 MHz, so there is an additional divider in the loop to keep the CCO within

its frequency range while the PLL is providing the desired output frequency. The output

divider may be set to divide by 2, 4, 8, or 16 to produce the output clock. The PLL output

frequency must be lower than 100 MHz. Since the minimum output divider value is 2, it is

insured that the PLL output has a 50 % duty cycle. The PLL is turned off and bypassed

following a chip reset and may be enabled by software. The program must configure and

activate the PLL, wait for the PLL to lock, and then connect to the PLL as a clock source.

The PLL settling time is 100 μs.

7.13.3 Clock output

The LPC11U1x features a clock output function that routes the IRC oscillator, the system

oscillator, the watchdog oscillator, or the main clock to an output pin.

7.13.4 Wake-up process

The LPC11U1x begin operation at power-up and when awakened from Deep power-down

mode by using the 12 MHz IRC oscillator as the clock source. This allows chip operation

to resume quickly. If the main oscillator or the PLL is needed by the application, software

will need to enable these features and wait for them to stabilize before they are used as a

clock source.

7.13.5 Power control

The LPC11U1x support a variety of power control features. There are four special modes

of processor power reduction: Sleep mode, Deep-sleep mode, Power-down mode, and

Deep power-down mode. The CPU clock rate may also be controlled as needed by

changing clock sources, reconfiguring PLL values, and/or altering the CPU clock divider

value. This allows a trade-off of power versus processing speed based on application

requirements. In addition, a register is provided for shutting down the clocks to individual

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on-chip peripherals, allowing fine tuning of power consumption by eliminating all dynamic

power use in any peripherals that are not required for the application. Selected

peripherals have their own clock divider which provides even better power control.

7.13.5.1 Power profiles

The power consumption in Active and Sleep modes can be optimized for the application

through simple calls to the power profile. The power configuration routine configures the

LPC11U1x for one of the following power modes:

• Default mode corresponding to power configuration after reset.

• CPU performance mode corresponding to optimized processing capability.

• Efficiency mode corresponding to optimized balance of current consumption and CPU

performance.

• Low-current mode corresponding to lowest power consumption.

In addition, the power profile includes routines to select the optimal PLL settings for a

given system clock and PLL input clock.

7.13.5.2 Sleep mode

When Sleep mode is entered, the clock to the core is stopped. Resumption from the Sleep

mode does not need any special sequence but re-enabling the clock to the ARM core.

In Sleep mode, execution of instructions is suspended until either a reset or interrupt

occurs. Peripheral functions continue operation during Sleep mode and may generate

interrupts to cause the processor to resume execution. Sleep mode eliminates dynamic

power used by the processor itself, memory systems and related controllers, and internal

buses.

7.13.5.3 Deep-sleep mode

In Deep-sleep mode, the LPC11U1x is in Sleep-mode and all peripheral clocks and all

clock sources are off with the exception of the IRC. The IRC output is disabled unless the

IRC is selected as input to the watchdog timer. In addition all analog blocks are shut down

and the flash is in stand-by mode. In Deep-sleep mode, the user has the option to keep

the watchdog oscillator and the BOD circuit running for self-timed wake-up and BOD

protection.

The LPC11U1x can wake up from Deep-sleep mode via reset, selected GPIO pins, a

watchdog timer interrupt, or an interrupt generating USB port activity.

Deep-sleep mode saves power and allows for short wake-up times.

7.13.5.4 Power-down mode

In Power-down mode, the LPC11U1x is in Sleep-mode and all peripheral clocks and all

clock sources are off with the exception of watchdog oscillator if selected. In addition all

analog blocks and the flash are shut down. In Power-down mode, the user has the option

to keep the BOD circuit running for BOD protection.

The LPC11U1x can wake up from Power-down mode via reset, selected GPIO pins, a

watchdog timer interrupt, or an interrupt generating USB port activity.

Power-down mode reduces power consumption compared to Deep-sleep mode at the

expense of longer wake-up times.

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7.13.5.5 Deep power-down mode

In Deep power-down mode, power is shut off to the entire chip with the exception of the

WAKEUP pin. The LPC11U1x can wake up from Deep power-down mode via the

WAKEUP pin.

The LPC11U1x can be prevented from entering Deep power-down mode by setting a lock

bit in the PMU block. Locking out Deep power-down mode enables the user to always

keep the watchdog timer or the BOD running.

When entering Deep power-down mode, an external pull-up resistor is required on the

WAKEUP pin to hold it HIGH. The RESET pin must also be held HIGH to prevent it from

floating while in Deep power-down mode.

7.13.6 System control

7.13.6.1 Reset

Reset has four sources on the LPC11U1x: the RESET pin, the Watchdog reset, power-on

reset (POR), and the BrownOut Detection (BOD) circuit. The RESET pin is a Schmitt

trigger input pin. Assertion of chip reset by any source, once the operating voltage attains

a usable level, starts the IRC and initializes the flash controller.

A LOW-going pulse as short as 50 ns resets the part.

When the internal Reset is removed, the processor begins executing at address 0, which

is initially the Reset vector mapped from the boot block. At that point, all of the processor

and peripheral registers have been initialized to predetermined values.

An external pull-up resistor is required on the RESET pin if Deep power-down mode is

used.

7.13.6.2 Brownout detection

The LPC11U1x includes four levels for monitoring the voltage on the V_DDpin. If this

voltage falls below one of the four selected levels, the BOD asserts an interrupt signal to

the NVIC. This signal can be enabled for interrupt in the Interrupt Enable Register in the

NVIC in order to cause a CPU interrupt; if not, software can monitor the signal by reading

a dedicated status register. Four additional threshold levels can be selected to cause a

forced reset of the chip.

7.13.6.3 Code security (Code Read Protection - CRP)

This feature of the LPC11U1x allows user to enable different levels of security in the

system so that access to the on-chip flash and use of the Serial Wire Debugger (SWD)

and In-System Programming (ISP) can be restricted. When needed, CRP is invoked by

programming a specific pattern into a dedicated flash location. IAP commands are not

affected by the CRP.

In addition, ISP entry via the PIO0_1 pin can be disabled without enabling CRP. For

details see the LPC11U1x user manual.

There are three levels of Code Read Protection:

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1. CRP1 disables access to the chip via the SWD and allows partial flash update

(excluding flash sector 0) using a limited set of the ISP commands. This mode is

useful when CRP is required and flash field updates are needed but all sectors can

not be erased.

2. CRP2 disables access to the chip via the SWD and only allows full flash erase and

update using a reduced set of the ISP commands.

3. Running an application with level CRP3 selected fully disables any access to the chip

via the SWD pins and the ISP. This mode effectively disables ISP override using

PIO0_1 pin, too. It is up to the user’s application to provide (if needed) flash update

mechanism using IAP calls or call reinvoke ISP command to enable flash update via

the USART.

CAUTION

If level three Code Read Protection (CRP3) is selected, no future factory testing can be

performed on the device.

In addition to the three CRP levels, sampling of pin PIO0_1 for valid user code can be

disabled. For details see the LPC11U1x user manual.

7.13.6.4 APB interface

The APB peripherals are located on one APB bus.

7.13.6.5 AHBLite

The AHBLite connects the CPU bus of the ARM Cortex-M0 to the flash memory, the main

static RAM, and the ROM.

7.13.6.6 External interrupt inputs

All GPIO pins can be level or edge sensitive interrupt inputs.

7.14 Emulation and debugging

Debug functions are integrated into the ARM Cortex-M0. Serial wire debug functions are

supported in addition to a standard JTAG boundary scan. The ARM Cortex-M0 is

configured to support up to four breakpoints and two watch points.

The RESET pin selects between the JTAG boundary scan (RESET = LOW) and the ARM

SWD debug (RESET = HIGH). The ARM SWD debug port is disabled while the

LPC11U1x is in reset.

Remark: Boundary scan operations should not be started until 250 μs after POR, and the

test TAP should be reset after the boundary scan. Boundary scan is not affected by Code

Read Protection.

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8. Limiting values

Table 5.

Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).^[1]

Symbol

Parameter

Conditions

Min

Max

Unit

V_DD

supply voltage (core and

external rail)

1.8

3.6

V

[2]

V_I

input voltage

5 V tolerant I/O pins; only valid

when the V_DDsupply voltage is

present

−0.5

+5.5

V

[3]

I_DD

supply current

per supply pin

-

100

mA

I_SS

ground current

I/O latch-up current

per ground pin

I_latch

−(0.5V_DD) < V_I< (1.5V_DD);

T_j< 125 °C

[4]

[5]

T_stg

storage temperature

−65

+150

150

1.5

°C

W

T_j(max)

P_tot(pack)

maximum junction temperature

-

total power dissipation (per

package)

based on package heat transfer, not

device power consumption

V_ESD

electrostatic discharge voltage human body model; all pins

−6500

+6500

V

[1] The following applies to the limiting values:

a) This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of excessive

static charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater than the rated

maximum.

b) Parameters are valid over operating temperature range unless otherwise specified. All voltages are with respect to V_SSunless

otherwise noted.

[2] Including voltage on outputs in 3-state mode.

[3] The peak current is limited to 25 times the corresponding maximum current.

[4] Dependent on package type.

[5] Human body model: equivalent to discharging a 100 pF capacitor through a 1.5 kΩ series resistor.

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9. Static characteristics

Table 6.

Static characteristics

T_amb= −40 °C to +85 °C, unless otherwise specified.

Symbol Parameter

Conditions

Min

Typ^[1]

Max

Unit

V_DD

supply voltage (core

and external rail)

1.8

3.3

3.6

V

I_DD

supply current

Active mode; V_DD= 3.3 V;

T_amb= 25 °C; code

while(1){}

executed from flash;

system clock = 12 MHz

[2][3][4]

[5][6][7]

-

2

8

1

-

mA

[3][4][5]

[6][7][8]

system clock = 50 MHz

[2][3][4]

[5][6][7]

Sleep mode;

V_DD= 3.3 V; T_amb= 25 °C;

system clock = 12 MHz

[3][6]

Deep-sleep mode; V_DD= 3.3 V;

T_amb= 25 °C

-

360

2

-

μA

nA

Power-down mode; V_DD= 3.3 V;

T_amb= 25 °C

[9]

Deep power-down mode;

220

V_DD= 3.3 V; T_amb= 25 °C

Standard port pins, RESET

I_IL

LOW-level input current V_I= 0 V; on-chip pull-up resistor

disabled

-

0.5

-

10

5.0

nA

V

I_IH

I_OZ

V_I

HIGH-level input

current

V_I= V_DD; on-chip pull-down resistor

disabled

-

OFF-state output

current

V_O= 0 V; V_O= V_DD; on-chip

pull-up/down resistors disabled

-

[10][11]

[12]

input voltage

pin configured to provide a digital

function

0

V_O

output voltage

output active

0

-

V_DD

-

V

V_IH

HIGH-level input

voltage

0.7V_DD

V_IL

LOW-level input voltage

hysteresis voltage

-

0.3V_DD

V

V_hys

V_OH

-

0.4

-

V

HIGH-level output

voltage

2.0 V ≤ V_DD≤ 3.6 V; I_OH= −4 mA

1.8 V ≤ V_DD< 2.0 V; I_OH= −3 mA

2.0 V ≤ V_DD≤ 3.6 V; I_OL= 4 mA

1.8 V ≤ V_DD< 2.0 V; I_OL= 3 mA

V_OH= V_DD− 0.4 V;

V_DD− 0.4

-

V

V_DD− 0.4

-

V

V_OL

LOW-level output

voltage

-

0.4

-

V

-

V

I_OH

HIGH-level output

current

−4

mA

2.0 V ≤ V_DD≤ 3.6 V

1.8 V ≤ V_DD< 2.0 V

−3

-

mA

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Table 6.

Static characteristics …continued

T_amb= −40 °C to +85 °C, unless otherwise specified.

Symbol Parameter

Conditions

Min

Typ^[1]

Max

Unit

I_OL

LOW-level output

current

V_OL= 0.4 V

4

-

mA

2.0 V ≤ V_DD≤ 3.6 V

1.8 V ≤ V_DD< 2.0 V

3

-

mA

[13]

I_OHS

I_OLS

HIGH-level short-circuit V_OH= 0 V

output current

−45

LOW-level short-circuit V_OL= V_DD

output current

-

50

mA

I_pd

I_pu

pull-down current

pull-up current

V_I= 5 V

V_I= 0 V;

10

50

150

μA

−15

−50

−85

2.0 V ≤ V_DD≤ 3.6 V

1.8 V ≤ V_DD< 2.0 V

−10

−50

−85

μA

V_DD< V_I< 5 V

0

High-drive output pin (PIO0_7)

I_IL

LOW-level input current V_I= 0 V; on-chip pull-up resistor

disabled

-

0.5

-

10

5.0

nA

V

I_IH

I_OZ

V_I

HIGH-level input

current

V_I= V_DD; on-chip pull-down resistor

disabled

-

OFF-state output

current

V_O= 0 V; V_O= V_DD; on-chip

pull-up/down resistors disabled

-

[10][11]

[12]

input voltage

pin configured to provide a digital

function

0

V_O

output voltage

output active

0

-

V_DD

-

V

V_IH

HIGH-level input

voltage

0.7V_DD

V_IL

LOW-level input voltage

hysteresis voltage

-

0.3V_DD

V

V_hys

V_OH

0.4

-

V

HIGH-level output

voltage

2.5 V ≤ V_DD≤ 3.6 V; I_OH= −20 mA

1.8 V ≤ V_DD< 2.5 V; I_OH= −12 mA

2.0 V ≤ V_DD≤ 3.6 V; I_OL= 4 mA

1.8 V ≤ V_DD< 2.0 V; I_OL= 3 mA

V_DD− 0.4

-

V

V_DD− 0.4

-

V

V_OL

LOW-level output

voltage

-

0.4

-

V

-

V

I_OH

HIGH-level output

current

V_OH= V_DD− 0.4 V;

2.5 V ≤ V_DD≤ 3.6 V

20

mA

1.8 V ≤ V_DD< 2.5 V

V_OL= 0.4 V

12

4

-

mA

I_OL

LOW-level output

current

2.0 V ≤ V_DD≤ 3.6 V

1.8 V ≤ V_DD< 2.0 V

3

-

mA

[13]

I_OLS

LOW-level short-circuit V_OL= V_DD

output current

50

I_pd

I_pu

pull-down current

pull-up current

V_I= 5 V

V_I= 0 V

10

50

150

μA

−15

−50

−85

2.0 V ≤ V_DD≤ 3.6 V

1.8 V ≤ V_DD< 2.0 V

−10

−50

−85

μA

V_DD< V_I< 5 V

0

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Table 6.

Static characteristics …continued

T_amb= −40 °C to +85 °C, unless otherwise specified.

Symbol Parameter

Conditions

Min

Typ^[1]

Max

Unit

I²C-bus pins (PIO0_4 and PIO0_5)

V_IH

HIGH-level input

voltage

0.7V_DD

-

V

V_IL

LOW-level input voltage

hysteresis voltage

-

0.3V_DD

V

V_hys

I_OL

-

0.05V_DD

-

V

LOW-level output

current

V_OL= 0.4 V; I²C-bus pins configured

as standard mode pins

3.5

mA

2.0 V ≤ V_DD≤ 3.6 V

1.8 V ≤ V_DD< 2.0 V

V_OL= 0.4 V; I²C-bus pins configured

as Fast-mode Plus pins

3

-

I_OL

LOW-level output

current

20

mA

2.0 V ≤ V_DD≤ 3.6 V

1.8 V ≤ V_DD< 2.0 V

V_I= V_DD

16

-

[14]

I_LI

input leakage current

2

4

μA

V_I= 5 V

-

10

22

Oscillator pins

V_i(xtal)

crystal input voltage

−0.5

1.8

1.95

V

V_o(xtal)

USB pins

I_OZ

crystal output voltage

OFF-state output

current

0 V < V_I< 3.3 V

-

±10

μA

V_BUS

V_DI

bus supply voltage

-

5.25

-

V

differential input

|(D+) − (D−)|

0.2

sensitivity voltage

V_CM

differential common

mode voltage range

includes V_DIrange

0.8

-

2.5

2.0

V

V_th(rs)sesingle-ended receiver

switching threshold

voltage

V_OL

LOW-level output

voltage

for low-/full-speed;

R_Lof 1.5 kΩ to 3.6 V

-

0.18

3.5

V

V_OH

HIGH-level output

voltage

driven; for low-/full-speed;

R_Lof 15 kΩ to GND

2.8

C_trans

Z_DRV

transceiver capacitance pin to GND

-

20

pF

[15]

driver output

with 33 Ω series resistor; steady state

drive

36

44.1

Ω

impedance for driver

which is not high-speed

capable

[1] Typical ratings are not guaranteed. The values listed are at room temperature (25 °C), nominal supply voltages.

[2] IRC enabled; system oscillator disabled; system PLL disabled.

[3] I_DDmeasurements were performed with all pins configured as GPIO outputs driven LOW and pull-up resistors disabled.

[4] BOD disabled.

[5] All peripherals disabled in the AHBCLKCTRL register. Peripheral clocks to USART, SSP0/1 disabled in the syscon block.

[6] USB_DP and USB_DM pulled LOW externally.

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[7] Low-current mode PWR_LOW_CURRENT selected when running the set_power routine in the power profiles.

[8] IRC disabled; system oscillator enabled; system PLL enabled.

[9] WAKEUP pin pulled HIGH externally. An external pull-up resistor is required on the RESET pin for the Deep power-down mode.

[10] Including voltage on outputs in 3-state mode.

[11] V_DDsupply voltage must be present.

[12] 3-state outputs go into 3-state mode in Deep power-down mode.

[13] Allowed as long as the current limit does not exceed the maximum current allowed by the device.

[14] To V_SS

.

[15] Includes external resistors of 33 Ω ± 1 % on USB_DP and USB_DM.

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Table 7.

ADC static characteristics

T_amb= −40 °C to +85 °C unless otherwise specified; ADC frequency 4.5 MHz, V_DD= 2.5 V to 3.6 V.

Symbol

V_IA

Parameter

Conditions

Min

Typ

Max

V_DD

1

Unit

V

analog input voltage

analog input capacitance

differential linearity error

integral non-linearity

offset error

0

-

C_ia

pF

[1][2]

[3]

E_D

±1

LSB

%

E_L(adj)

E_O

±1.5

±3.5

0.6

±4

[4]

[5]

E_G

gain error

[6]

E_T

absolute error

LSB

kΩ

R_vsi

voltage source interface

resistance

40

[7][8]

R_i

input resistance

-

2.5

MΩ

[1] The ADC is monotonic, there are no missing codes.

[2] The differential linearity error (E_D) is the difference between the actual step width and the ideal step width. See Figure 7.

[3] The integral non-linearity (E_L(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after

appropriate adjustment of gain and offset errors. See Figure 7.

[4] The offset error (E_O) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the

ideal curve. See Figure 7.

[5] The gain error (E_G) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset

error, and the straight line which fits the ideal transfer curve. See Figure 7.

[6] The absolute error (E_T) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated

ADC and the ideal transfer curve. See Figure 7.

[7] T_amb= 25 °C; maximum sampling frequency f_s= 4.5 MHz and analog input capacitance C_ia= 1 pF.

[8] Input resistance R_idepends on the sampling frequency fs: R_i= 1 / (f_s× C_ia).

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offset

error

gain

error

E

O

G

1023

1022

1021

1020

1019

1018

(2)

7

code

out

(1)

6

5

4

3

2

1

0

(5)

(4)

(3)

1 LSB

(ideal)

1018 1019 1020 1021 1022 1023 1024

1

2

3

4

5

6

7

V

(LSB

)

ideal

IA

offset error

E

O

V

− V

DD SS

1024

1 LSB =

002aaf426

(1) Example of an actual transfer curve.

(2) The ideal transfer curve.

(3) Differential linearity error (E_D).

(4) Integral non-linearity (E_L(adj)).

(5) Center of a step of the actual transfer curve.

Fig 7. ADC characteristics

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9.1 BOD static characteristics

Table 8.

BOD static characteristics^[1]

T_amb= 25 °C.

Symbol Parameter

Conditions

Min

Typ

Max

Unit

V_th

threshold voltage interrupt level 0

assertion

-

1.65

1.80

-

V

de-assertion

interrupt level 1

assertion

-

2.22

2.35

-

V

de-assertion

interrupt level 2

assertion

-

2.52

2.66

-

V

de-assertion

interrupt level 3

assertion

-

2.80

2.90

-

V

de-assertion

reset level 0

assertion

-

1.46

1.63

-

V

de-assertion

reset level 1

assertion

-

2.06

2.15

-

V

de-assertion

reset level 2

assertion

-

2.35

2.43

-

V

de-assertion

reset level 3

assertion

-

2.63

2.71

-

V

de-assertion

[1] Interrupt levels are selected by writing the level value to the BOD control register BODCTRL, see

LPC11U1x user manual.

9.2 Power consumption

Power measurements in Active, Sleep, and Deep-sleep modes were performed under the

following conditions (see LPC11U1x user manual):

• Configure all pins as GPIO with pull-up resistor disabled in the IOCON block.

• Configure GPIO pins as outputs using the GPIOnDIR registers.

• Write 0 to all GPIOnDATA registers to drive the outputs LOW.

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001aac984

X

(X)

<tbd>

X

X (X)

Conditions: T_amb= 25 °C; active mode entered executing code while(1){} from flash;

internal pull-up resistors disabled; system oscillator and system PLL enabled; IRC, BOD disabled;

all peripherals disabled in the SYSAHBCLKCTRL register (SYSAHBCLKCTRL = <tbd>); all

peripheral clocks disabled; USB_DP and USB_DM pulled LOW externally.

Fig 8. Typical supply current versus regulator supply voltage V_DDin active mode

001aac984

X

(X)

X

<tbd>

X

X (X)

Conditions: V_DD= 3.3 V; Active mode entered executing code while(1){} from flash; internal

pull-up resistors disabled; system oscillator and system PLL enabled; IRC, BOD disabled; all

peripherals disabled in the SYSAHBCLKCTRL register (SYSAHBCLKCTRL = <tbd>); all

peripheral clocks disabled; USB_DP and USB_DM pulled LOW externally.

Fig 9. Typical supply current versus temperature in Active mode

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001aac984

X

(X)

<tbd>

X

X (X)

Conditions: V_DD= 3.3 V; Sleep mode entered from flash; internal pull-up resistors disabled; system

oscillator and system PLL enabled; IRC, BOD disabled; all peripherals disabled in the

SYSAHBCLKCTRL register (SYSAHBCLKCTRL = <tbd>); all peripheral clocks disabled; USB_DP

and USB_DM pulled LOW externally.

Fig 10. Typical supply current versus temperature in Sleep mode

001aac984

X

(X)

X

<tbd>

X

X (X)

Conditions: BOD disabled; all oscillators and analog blocks turned off in the PDSLEEPCFG

register; PDSLEEPCFG = <tbd>; USB_DP and USB_DM pulled LOW externally.

Fig 11. Typical supply current versus temperature in Deep-sleep mode

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001aac984

X

(X)

<tbd>

X

X (X)

Conditions: BOD disabled; all oscillators and analog blocks turned off in the PDSLEEPCFG

register; PDSLEEPCFG = <tbd>; USB_DP and USB_DM pulled LOW externally.

Fig 12. Typical supply current versus temperature in Power-down mode

001aac984

X

(X)

<tbd>

X

X (X)

Fig 13. Typical supply current versus temperature in Deep power-down mode

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Table 9.

Power consumption for individual analog and digital blocks

The supply current per peripheral is measured as the difference in supply current between the peripheral block enabled and

the peripheral block disabled in the SYSAHBCLKCTRL or PDRUNCFG (for analog blocks) registers. All other blocks are

disabled in both registers and no code is executed. Measured on a typical sample at T_amb= 25 °C. Unless noted otherwise,

the system oscillator and PLL are running in both measurements.

Typical supply current per peripheral Notes

in mA for different system clock

frequencies

n/a

12 MHz <tbd>

MHz

<tbd>

MHz

IRC

<tbd>

-

System oscillator running; PLL off; independent of main clock

frequency.

System oscillator <tbd>

at 12 MHz

IRC running; PLL off; independent of main clock frequency.

Watchdog

oscillator at

500 kHz/2

<tbd>

System oscillator running; PLL off; independent of main clock

frequency.

BOD

<tbd>

-

Independent of main clock frequency.

Main PLL

USB PLL

ADC

-

<tbd>

-

<tbd>

CLKOUT

CT16B0

CT16B1

CT32B0

CT32B1

GPIO

Main clock divided by 4 in the CLKOUTDIV register.

GPIO pins configured as outputs and set to LOW. Direction

and pin state are maintained if the GPIO is disabled in the

SYSAHBCLKCFG register.

IOCON

I2C

-

<tbd>

-

<tbd>

-

ROM

SSP0

SSP1

USART

WDT

USB

Main clock selected as clock source for the WDT.

Main clock selected as clock source for the USB. USB_DP

and USB_DM pulled LOW externally.

USB

-

<tbd>

Dedicated USB PLL selected as cock source for the USB.

USB_DP and USB_DM pulled LOW externally.

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9.3 Electrical pin characteristics

002aae990

3.6

V

(V)

OH

T = 85 °C

25 °C

−40 °C

3.2

2.8

2.4

2

0

10

20

30

40

50

60

I

(mA)

OH

Conditions: V_DD= 3.3 V; on pin PIO0_7.

Fig 14. High-drive output: Typical HIGH-level output voltage V_OHversus HIGH-level

output current I_OH

.

002aaf019

60

I

T = 85 °C

25 °C

−40 °C

OL

(mA)

40

20

0

0.2

0.4

0.6

V

OL

(V)

Conditions: V_DD= 3.3 V; on pins PIO0_4 and PIO0_5.

Fig 15. I²C-bus pins (high current sink): Typical LOW-level output current I_OLversus

LOW-level output voltage V_OL

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002aae991

15

I

OL

T = 85 °C

25 °C

−40 °C

(mA)

10

5

0

0.2

0.4

0.6

V

OL

(V)

Conditions: V_DD= 3.3 V; standard port pins and PIO0_7.

Fig 16. Typical LOW-level output current I_OLversus LOW-level output voltage V_OL

002aae992

3.6

V

OH

(V)

T = 85 °C

25 °C

−40 °C

3.2

2.8

2.4

2

0

8

16

24

I

(mA)

OH

Conditions: V_DD= 3.3 V; standard port pins.

Fig 17. Typical HIGH-level output voltage V_OHversus HIGH-level output source current

I_OH

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002aae988

10

I

pu

(μA)

−10

−30

−50

−70

T = 85 °C

25 °C

−40 °C

0

1

2

3

4

5

V (V)

I

Conditions: V_DD= 3.3 V; standard port pins.

Fig 18. Typical pull-up current I_puversus input voltage V_I

002aae989

80

T = 85 °C

I

pd

25 °C

(μA)

−40 °C

60

40

20

0

1

2

3

4

5

V (V)

I

Conditions: V_DD= 3.3 V; standard port pins.

Fig 19. Typical pull-down current I_pdversus input voltage V_I

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10. Dynamic characteristics

10.1 Flash memory

Table 10. Flash characteristics

_amb= −40 °C to +85 °C, unless otherwise specified.

T

Symbol

N_endu

t_ret

Parameter

endurance

Conditions

Min

Typ

Max

Unit

[1]

10000 100000

-

cycles

years

ms

retention time

powered

10

20

95

-

unpowered

-

t_er

erase time

sector or multiple

100

105

consecutive sectors

[2]

t_prog

programming time

0.95

1

1.05

ms

[1] Number of program/erase cycles.

[2] Programming times are given for writing 256 bytes from RAM to the flash. Data must be written to the flash

in blocks of 256 bytes.

10.2 External clock

Table 11. Dynamic characteristic: external clock

T_amb= −40 °C to +85 °C; V_DDover specified ranges.^[1]

Symbol Parameter

Conditions

Min

Typ^[2]Max

Unit

MHz

ns

f_osc

oscillator frequency

1

-

25

T_cy(clk)

t_CHCX

t_CLCX

t_CLCH

t_CHCL

clock cycle time

clock HIGH time

clock LOW time

clock rise time

clock fall time

40

1000

T_cy(clk)× 0.4

-

ns

T_cy(clk)× 0.4

-

ns

-

5

ns

[1] Parameters are valid over operating temperature range unless otherwise specified.

[2] Typical ratings are not guaranteed. The values listed are at room temperature (25 °C), nominal supply

voltages.

t

CHCX

t

CHCL

CLCX

CLCH

T

cy(clk)

002aaa907

Fig 20. External clock timing (with an amplitude of at least V_i(RMS)= 200 mV)

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10.3 Internal oscillators

Table 12. Dynamic characteristics: IRC

T_amb= −40 °C to +85 °C; 2.7 V ≤ V_DD≤ 3.6 V^[1].

Symbol

Parameter

Conditions

Min

Typ^[2]

Max

Unit

f_osc(RC)

internal RC oscillator

frequency

-

<tbd>

12

<tbd>

MHz

[1] Parameters are valid over operating temperature range unless otherwise specified.

[2] Typical ratings are not guaranteed. The values listed are at room temperature (25 °C), nominal supply

voltages.

001aac984

X

(X)

X

<tbd>

X

X (X)

Conditions: Frequency values are typical values. 12 MHz ± <tbd> % accuracy is guaranteed for

2.7 V ≤ V_DD≤ 3.6 V and T_amb= −40 °C to +85 °C. Variations between parts may cause the IRC to

fall outside the 12 MHz ± <tbd> % accuracy specification for voltages below 2.7 V.

Fig 21. Internal RC oscillator frequency versus temperature

Table 13. Dynamic characteristics: Watchdog oscillator

Symbol

Parameter

Conditions

Min Typ^[1]Max Unit

[2][3]

f_osc(int)

internal oscillator DIVSEL = 0x1F, FREQSEL = 0x1

-

7.8

-

kHz

frequency

in the WDTOSCCTRL register;

DIVSEL = 0x00, FREQSEL = 0xF

in the WDTOSCCTRL register

-

1700

-

kHz

[1] Typical ratings are not guaranteed. The values listed are at nominal supply voltages.

[2] The typical frequency spread over processing and temperature (T_amb= −40 °C to +85 °C) is ±40 %.

[3] See the LPC11U1x user manual.

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10.4 I/O pins

Table 14. Dynamic characteristics: I/O pins^[1]

T_amb= −40 °C to +85 °C; 3.0 V ≤ V_DD≤ 3.6 V.

Symbol Parameter Conditions

Min

3.0

2.5

Typ

Max

5.0

Unit

ns

t_r

t_f

rise time

fall time

pin configured as output

-

5.0

ns

[1] Applies to standard port pins and RESET pin.

10.5 I²C-bus

Table 15. Dynamic characteristic: I²C-bus pins^[1]

T_amb= −40 °C to +85 °C.^[2]

Symbol

Parameter

Conditions

Min

Max

100

400

1

Unit

f_SCL

SCL clock

frequency

Standard-mode

Fast-mode

0

-

kHz

MHz

ns

Fast-mode Plus

[4][5][6][7]

t_f

fall time

of both SDA and SCL

signals

300

Standard-mode

Fast-mode

20 + 0.1 × C_b

300

ns

μs

ns

Fast-mode Plus

Standard-mode

Fast-mode

-

120

t_LOW

LOW period of the

SCL clock

4.7

1.3

0.5

4.0

0.6

0.26

0

-

Fast-mode Plus

Standard-mode

Fast-mode

t_HIGH

HIGH period of the

SCL clock

Fast-mode Plus

Standard-mode

Fast-mode

[3][4][8]

[9][10]

t_HD;DAT

data hold time

0

Fast-mode Plus

Standard-mode

Fast-mode

0

t_SU;DAT

data set-up time

250

100

50

Fast-mode Plus

[1] See the I²C-bus specification UM10204 for details.

[2] Parameters are valid over operating temperature range unless otherwise specified.

[3] tHD;DAT is the data hold time that is measured from the falling edge of SCL; applies to data in transmission and the acknowledge.

[4] A device must internally provide a hold time of at least 300 ns for the SDA signal (with respect to the V_IH(min) of the SCL signal) to

bridge the undefined region of the falling edge of SCL.

[5] C_b= total capacitance of one bus line in pF.

[6] The maximum t_ffor the SDA and SCL bus lines is specified at 300 ns. The maximum fall time for the SDA output stage t_fis specified at

250 ns. This allows series protection resistors to be connected in between the SDA and the SCL pins and the SDA/SCL bus lines

without exceeding the maximum specified t_f.

[7] In Fast-mode Plus, fall time is specified the same for both output stage and bus timing. If series resistors are used, designers should

allow for this when considering bus timing.

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[8] The maximum t_HD;DATcould be 3.45 μs and 0.9 μs for Standard-mode and Fast-mode but must be less than the maximum of t_VD;DATor

_VD;ACKby a transition time (see UM10204). This maximum must only be met if the device does not stretch the LOW period (t_LOW) of the

t

SCL signal. If the clock stretches the SCL, the data must be valid by the set-up time before it releases the clock.

[9] tSU;DAT is the data set-up time that is measured with respect to the rising edge of SCL; applies to data in transmission and the

acknowledge.

[10] A Fast-mode I²C-bus device can be used in a Standard-mode I²C-bus system but the requirement t_SU;DAT= 250 ns must then be met.

This will automatically be the case if the device does not stretch the LOW period of the SCL signal. If such a device does stretch the

LOW period of the SCL signal, it must output the next data bit to the SDA line t_r(max)+ t_SU;DAT= 1000 + 250 = 1250 ns (according to the

Standard-mode I²C-bus specification) before the SCL line is released. Also the acknowledge timing must meet this set-up time.

t

f

t

SU;DAT

70 %

30 %

70 %

30 %

SDA

SCL

t

HD;DAT

VD;DAT

t

f

t

HIGH

70 %

30 %

70 %

30 %

70 %

30 %

70 %

30 %

t

LOW

1 / f

S

SCL

002aaf425

Fig 22. I²C-bus pins clock timing

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10.6 SSP interface

Table 16. Dynamic characteristics: SSP pins in SPI mode

Symbol

Parameter

Conditions

Min

Max

Unit

SSP master

T_cy(clk)

[1]

[2]

clock cycle time

data set-up time

when only receiving

when only transmitting

in SPI mode;

<tbd>

-

ns

t_DS

2.4 V ≤ V_DD≤ 3.6 V

2.0 V ≤ V_DD< 2.4 V

in SPI mode

[2]

<tbd>

-

ns

t_DH

data hold time

-

t_v(Q)

data output valid time

data output hold time

in SPI mode

<tbd>

-

t_h(Q)

in SPI mode

<tbd>

SSP slave

T_cy(PCLK)

t_DS

PCLK cycle time

data set-up time

data hold time

<tbd>

-

ns

[3][4]

in SPI mode

t_DH

<tbd> × T_cy(PCLK)+

<tbd>

[3][4]

t_v(Q)

t_h(Q)

data output valid time

data output hold time

in SPI mode

-

<tbd> × T_cy(PCLK)

<tbd>

+

ns

<tbd> × T_cy(PCLK)

<tbd>

[1] T_cy(clk)= (SSPCLKDIV × (1 + SCR) × CPSDVSR) / f_main. The clock cycle time derived from the SPI bit rate T_cy(clk)is a function of the

main clock frequency f_main, the SSP peripheral clock divider (SSPCLKDIV), the SSP SCR parameter (specified in the SSP0CR0

register), and the SSP CPSDVSR parameter (specified in the SSP clock prescale register).

[2]

T_amb= −40 °C to 85 °C.

[3] T_cy(clk)= 12 × T_cy(PCLK)

.

[4] T_amb= 25 °C; V_DD= 3.3 V.

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T

t

clk(L)

cy(clk)

clk(H)

SCK (CPOL = 0)

SCK (CPOL = 1)

MOSI

t

h(Q)

v(Q)

DATA VALID

CPHA = 1

t

DH

DS

DATA VALID

MISO

t

h(Q)

v(Q)

DATA VALID

t

MOSI

MISO

t

CPHA = 0

DS

DH

DATA VALID

002aae829

Fig 23. SSP master timing in SPI mode

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T

t

clk(L)

cy(clk)

clk(H)

SCK (CPOL = 0)

SCK (CPOL = 1)

t

DH

DS

MOSI

MISO

DATA VALID

t

h(Q)

v(Q)

CPHA = 1

DATA VALID

t

DH

DS

MOSI

MISO

DATA VALID

t

h(Q)

CPHA = 0

v(Q)

DATA VALID

002aae830

Fig 24. SSP slave timing in SPI mode

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10.7 USB interface

Table 17. Dynamic characteristics: USB pins (full-speed)

C_L= 50 pF; R_pu= 1.5 kΩ on D+ to V_DD, unless otherwise specified.

Symbol

Parameter

rise time

fall time

Conditions

10 % to 90 %

t_r/ t_f

Min

<tbd>

-

Typ

Max

Unit

ns

t_r

-

<tbd>

t_f

ns

t_FRFM

differential rise and fall time

matching

%

V_CRS

output signal crossover voltage

source SE0 interval of EOP

<tbd>

-

<tbd>

V

t_FEOPT

t_FDEOP

see Figure 25

ns

source jitter for differential transition see Figure 25

to SE0 transition

t_JR1

receiver jitter to next transition

<tbd>

-

<tbd>

-

ns

t_JR2

receiver jitter for paired transitions

EOP width at receiver

10 % to 90 %

[1]

t_EOPR1

must reject as

EOP; see

Figure 25

t_EOPR2

EOP width at receiver

must accept as

EOP; see

<tbd>

-

ns

Figure 25

[1] Characterized but not implemented as production test. Guaranteed by design.

T

PERIOD

crossover point

extended

crossover point

differential

data lines

source EOP width: t

FEOPT

differential data to

SE0/EOP skew

n × T

+ t

FDEOP

PERIOD

receiver EOP width: t

, t

EOPR1 EOPR2

002aab561

Fig 25. Differential data-to-EOP transition skew and EOP width

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11. Application information

11.1 Suggested USB interface solutions

V

DD

USB_CONNECT

USB_VBUS

LPC11U1x

soft-connect switch

R1

1.5 kΩ

R

= 33 Ω

S

USB-B

connector

USB_DP

USB_DM

R

= 33 Ω

V

SS

002aaf893

Fig 26. USB interface on a self-powered device

V

DD

LPC11U1x

R1

1.5 kΩ

USB_VBUS

USB-B

connector

R

= 33 Ω

S

USB_DP

R

USB_DM

V

SS

002aaf894

Fig 27. USB interface on a bus-powered device

11.2 XTAL input

The input voltage to the on-chip oscillators is limited to 1.8 V. If the oscillator is driven by a

clock in slave mode, it is recommended that the input be coupled through a capacitor with

C_i= 100 pF. To limit the input voltage to the specified range, choose an additional

capacitor to ground C_gwhich attenuates the input voltage by a factor C_i/(C_i+ C_g). In slave

mode, a minimum of 200 mV(RMS) is needed.

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LPC1xxx

XTALIN

C

i

C

g

100 pF

002aae788

Fig 28. Slave mode operation of the on-chip oscillator

In slave mode the input clock signal should be coupled by means of a capacitor of 100 pF

(Figure 28), with an amplitude between 200 mV(RMS) and 1000 mV(RMS). This

corresponds to a square wave signal with a signal swing of between 280 mV and 1.4 V.

The XTALOUT pin in this configuration can be left unconnected.

External components and models used in oscillation mode are shown in Figure 29 and in

Table 18 and Table 19. Since the feedback resistance is integrated on chip, only a crystal

and the capacitances C_X1and C_X2need to be connected externally in case of

fundamental mode oscillation (the fundamental frequency is represented by L, C_Land

R_S). Capacitance C_Pin Figure 29 represents the parallel package capacitance and should

not be larger than 7 pF. Parameters F_OSC, C_L, R_Sand C_Pare supplied by the crystal

manufacturer.

LPC1xxx

L

XTALIN

XTALOUT

C

P

=

L

XTAL

R

S

C

X2

X1

002aaf424

Fig 29. Oscillator modes and models: oscillation mode of operation and external crystal

model used for C_X1/C_X2evaluation

Table 18. Recommended values for C_X1/C_X2in oscillation mode (crystal and external

components parameters) low frequency mode

Fundamental oscillation Crystal load

Maximum crystal

External load

frequency F_OSC

capacitance C_L

series resistance R_S

capacitors C_X1, C_X2

1 MHz - 5 MHz

10 pF

< 300 Ω

18 pF, 18 pF

39 pF, 39 pF

57 pF, 57 pF

20 pF

30 pF

LPC11U1X

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Table 18. Recommended values for C_X1/C_X2in oscillation mode (crystal and external

components parameters) low frequency mode

Fundamental oscillation Crystal load

Maximum crystal

External load

frequency F_OSC

capacitance C_L

series resistance R_S

capacitors C_X1, C_X2

5 MHz - 10 MHz

10 pF

< 300 Ω

< 200 Ω

< 100 Ω

< 160 Ω

< 60 Ω

18 pF, 18 pF

39 pF, 39 pF

57 pF, 57 pF

18 pF, 18 pF

39 pF, 39 pF

18 pF, 18 pF

20 pF

30 pF

10 MHz - 15 MHz

15 MHz - 20 MHz

10 pF

20 pF

10 pF

< 80 Ω

Table 19. Recommended values for C_X1/C_X2in oscillation mode (crystal and external

components parameters) high frequency mode

Fundamental oscillation Crystal load

Maximum crystal

External load

frequency F_OSC

capacitance C_L

series resistance R_S

capacitors C_X1, C_X2

15 MHz - 20 MHz

10 pF

< 180 Ω

< 100 Ω

< 160 Ω

< 80 Ω

18 pF, 18 pF

39 pF, 39 pF

18 pF, 18 pF

39 pF, 39 pF

20 pF

20 MHz - 25 MHz

10 pF

20 pF

11.3 XTAL Printed-Circuit Board (PCB) layout guidelines

The crystal should be connected on the PCB as close as possible to the oscillator input

and output pins of the chip. Take care that the load capacitors C_x1, C_x2, and C_x3in case of

third overtone crystal usage have a common ground plane. The external components

must also be connected to the ground plain. Loops must be made as small as possible in

order to keep the noise coupled in via the PCB as small as possible. Also parasitics

should stay as small as possible. Values of C_x1and C_x2should be chosen smaller

accordingly to the increase in parasitics of the PCB layout.

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11.4 Standard I/O pad configuration

Figure 30 shows the possible pin modes for standard I/O pins with analog input function:

• Digital output driver

• Digital input: Pull-up enabled/disabled

• Digital input: Pull-down enabled/disabled

• Digital input: Repeater mode enabled/disabled

• Analog input

V

DD

ESD

output enable

pin configured

as digital output

driver

output

ESD

V

DD

V

SS

weak

pull-up

pull-up enable

weak

pull-down

repeater mode

enable

pin configured

as digital input

pull-down enable

data input

select analog input

pin configured

as analog input

analog input

002aaf304

Fig 30. Standard I/O pad configuration

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11.5 Reset pad configuration

V

DD

V

DD

V

DD

R

pu

ESD

20 ns RC

GLITCH FILTER

reset

ESD

V

SS

002aaf274

Fig 31. Reset pad configuration

11.6 ADC usage notes

The following guidelines show how to increase the performance of the ADC in a noisy

environment beyond the ADC specifications listed in Table 7:

• The ADC input trace must be short and as close as possible to the LPC11U1x chip.

• The ADC input traces must be shielded from fast switching digital signals and noisy

power supply lines.

• Because the ADC and the digital core share the same power supply, the power supply

line must be adequately filtered.

• To improve the ADC performance in a very noisy environment, put the device in Sleep

mode during the ADC conversion.

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12. Package outline

HVQFN33: plastic thermal enhanced very thin quad flat package; no leads;

33 terminals; body 7 x 7 x 0.85 mm

D

B

A

terminal 1

index area

E

A

1

c

detail X

e

1

C

v

w

C

A

B

e

b

y

1

y

C

9

16

L

8

17

e

E

h

e

2

33

1

24

X

terminal 1

index area

32

25

0

D

h

2.5

scale

5 mm

v

Dimensions

Unit

(1)

A

1

b

c

D

E

h

e

1

e

2

L

w

y

1

h

max 1.00 0.05 0.35

mm nom 0.85 0.02 0.28 0.2 7.0 4.70 7.0 4.70 0.65 4.55 4.55 0.60 0.1 0.05 0.08 0.1

min 0.80 0.00 0.23 6.9 4.55 6.9 4.55 0.45

7.1 4.85 7.1 4.85

0.75

Note

1. Plastic or metal protrusions of 0.075 mm maximum per side are not included.

hvqfn33_po

References

Outline

version

European

projection

Issue date

IEC

JEDEC

JEITA

- - -

09-03-17

09-03-23

Fig 32. Package outline HVQFN33

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LQFP48: plastic low profile quad flat package; 48 leads; body 7 x 7 x 1.4 mm

SOT313-2

c

y

X

36

25

A

E

37

24

Z

E

e

H

E

A

2

A

(A )

3

A

1

w M

p

θ

pin 1 index

b

L

p

L

13

48

detail X

1

12

Z

v M

D

A

e

w M

b

p

D

B

H

v

M

B

D

0

2.5

5 mm

scale

DIMENSIONS (mm are the original dimensions)

A

(1)

UNIT

A

b

c

D

E

e

H

D

H

L

v

w

y

Z

E

θ

1

2

3

p

E

p

D

max.

7^o

0^o

0.20 1.45

0.05 1.35

0.27 0.18 7.1

0.17 0.12 6.9

7.1

6.9

9.15 9.15

8.85 8.85

0.75

0.45

0.95 0.95

0.55 0.55

1.6

mm

0.25

0.5

1

0.2 0.12 0.1

Note

1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.

REFERENCES

OUTLINE

EUROPEAN

PROJECTION

ISSUE DATE

VERSION

IEC

JEDEC

JEITA

00-01-19

03-02-25

SOT313-2

136E05

MS-026

Fig 33. Package outline LQFP48 (SOT313-2)

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TFBGA48: plastic thin fine-pitch ball grid array package; 48 balls; body 4.5 x 4.5 x 0.7 mm

SOT1155-2

D

B

A

ball A1

index area

A

2

E

A

1

detail X

e

1

C

Ø v

Ø w

C

A

B

e

1/2 e

b

y

1

y

C

H

e

G

F

E

D

C

B

A

e

2

1/2 e

ball A1

index area

1

2

3

4

5

6

7

8

X

0

5 mm

scale

v

Dimensions

Unit

A

1

A

2

b

D

E

e

1

e

w

y

1

2

max 1.10 0.30 0.80 0.35 4.6 4.6

mm nom 0.95 0.25 0.70 0.30 4.5 4.5 0.5 3.5 3.5 0.15 0.05 0.08 0.1

min 0.85 0.20 0.65 0.25 4.4 4.4

sot1155-2_po

References

Outline

version

European

projection

Issue date

IEC

JEDEC

- - -

JEITA

11-01-18

11-03-01

SOT1155-2

Fig 34. Package outline TFBGA48 (SOT1155-2)

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13. Abbreviations

Table 20. Abbreviations

Acronym

A/D

Description

Analog-to-Digital

ADC

AHB

APB

Analog-to-Digital Converter

Advanced High-performance Bus

Advanced Peripheral Bus

BrownOut Detection

BOD

GPIO

JTAG

PLL

General Purpose Input/Output

Joint Action Test Group

Phase-Locked Loop

RC

Resistor-Capacitor

SPI

Serial Peripheral Interface

Serial Synchronous Interface

Synchronous Serial Port

Test Access Port

SSI

SSP

TAP

USART

Universal Synchronous Asynchronous Receiver/Transmitter

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14. Revision history

Table 21. Revision history

Document ID

Release date

20110411

Data sheet status

Change notice

Supersedes

LPC11U1X v.1

Objective data sheet

-

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15. Legal information

15.1 Data sheet status

Document status^[1][2]

Product status^[3]

Development

Definition

Objective [short] data sheet

This document contains data from the objective specification for product development.

This document contains data from the preliminary specification.

This document contains the product specification.

Preliminary [short] data sheet Qualification

Product [short] data sheet Production

[1]

[2]

[3]

Please consult the most recently issued document before initiating or completing a design.

The term ‘short data sheet’ is explained in section “Definitions”.

The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status

information is available on the Internet at URL http://www.nxp.com.

malfunction of an NXP Semiconductors product can reasonably be expected

15.2 Definitions

to result in personal injury, death or severe property or environmental

damage. NXP Semiconductors accepts no liability for inclusion and/or use of

NXP Semiconductors products in such equipment or applications and

therefore such inclusion and/or use is at the customer’s own risk.

Draft — The document is a draft version only. The content is still under

internal review and subject to formal approval, which may result in

modifications or additions. NXP Semiconductors does not give any

representations or warranties as to the accuracy or completeness of

information included herein and shall have no liability for the consequences of

use of such information.

Applications — Applications that are described herein for any of these

products are for illustrative purposes only. NXP Semiconductors makes no

representation or warranty that such applications will be suitable for the

specified use without further testing or modification.

Short data sheet — A short data sheet is an extract from a full data sheet

with the same product type number(s) and title. A short data sheet is intended

for quick reference only and should not be relied upon to contain detailed and

full information. For detailed and full information see the relevant full data

sheet, which is available on request via the local NXP Semiconductors sales

office. In case of any inconsistency or conflict with the short data sheet, the

full data sheet shall prevail.

Customers are responsible for the design and operation of their applications

and products using NXP Semiconductors products, and NXP Semiconductors

accepts no liability for any assistance with applications or customer product

design. It is customer’s sole responsibility to determine whether the NXP

Semiconductors product is suitable and fit for the customer’s applications and

products planned, as well as for the planned application and use of

customer’s third party customer(s). Customers should provide appropriate

design and operating safeguards to minimize the risks associated with their

applications and products.

Product specification — The information and data provided in a Product

data sheet shall define the specification of the product as agreed between

NXP Semiconductors and its customer, unless NXP Semiconductors and

customer have explicitly agreed otherwise in writing. In no event however,

shall an agreement be valid in which the NXP Semiconductors product is

deemed to offer functions and qualities beyond those described in the

Product data sheet.

NXP Semiconductors does not accept any liability related to any default,

damage, costs or problem which is based on any weakness or default in the

customer’s applications or products, or the application or use by customer’s

third party customer(s). Customer is responsible for doing all necessary

testing for the customer’s applications and products using NXP

Semiconductors products in order to avoid a default of the applications and

the products or of the application or use by customer’s third party

customer(s). NXP does not accept any liability in this respect.

15.3 Disclaimers

Limiting values — Stress above one or more limiting values (as defined in

the Absolute Maximum Ratings System of IEC 60134) will cause permanent

damage to the device. Limiting values are stress ratings only and (proper)

operation of the device at these or any other conditions above those given in

the Recommended operating conditions section (if present) or the

Characteristics sections of this document is not warranted. Constant or

repeated exposure to limiting values will permanently and irreversibly affect

the quality and reliability of the device.

Limited warranty and liability — Information in this document is believed to

be accurate and reliable. However, NXP Semiconductors does not give any

representations or warranties, expressed or implied, as to the accuracy or

completeness of such information and shall have no liability for the

consequences of use of such information.

In no event shall NXP Semiconductors be liable for any indirect, incidental,

punitive, special or consequential damages (including - without limitation - lost

profits, lost savings, business interruption, costs related to the removal or

replacement of any products or rework charges) whether or not such

damages are based on tort (including negligence), warranty, breach of

contract or any other legal theory.

Terms and conditions of commercial sale — NXP Semiconductors

products are sold subject to the general terms and conditions of commercial

sale, as published at http://www.nxp.com/profile/terms, unless otherwise

agreed in a valid written individual agreement. In case an individual

agreement is concluded only the terms and conditions of the respective

agreement shall apply. NXP Semiconductors hereby expressly objects to

applying the customer’s general terms and conditions with regard to the

purchase of NXP Semiconductors products by customer.

Notwithstanding any damages that customer might incur for any reason

whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards

customer for the products described herein shall be limited in accordance

with the Terms and conditions of commercial sale of NXP Semiconductors.

Right to make changes — NXP Semiconductors reserves the right to make

changes to information published in this document, including without

limitation specifications and product descriptions, at any time and without

notice. This document supersedes and replaces all information supplied prior

to the publication hereof.

No offer to sell or license — Nothing in this document may be interpreted or

construed as an offer to sell products that is open for acceptance or the grant,

conveyance or implication of any license under any copyrights, patents or

other industrial or intellectual property rights.

Export control — This document as well as the item(s) described herein

may be subject to export control regulations. Export might require a prior

authorization from national authorities.

Suitability for use — NXP Semiconductors products are not designed,

authorized or warranted to be suitable for use in life support, life-critical or

safety-critical systems or equipment, nor in applications where failure or

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Non-automotive qualified products — Unless this data sheet expressly

states that this specific NXP Semiconductors product is automotive qualified,

the product is not suitable for automotive use. It is neither qualified nor tested

in accordance with automotive testing or application requirements. NXP

Semiconductors accepts no liability for inclusion and/or use of

own risk, and (c) customer fully indemnifies NXP Semiconductors for any

liability, damages or failed product claims resulting from customer design and

use of the product for automotive applications beyond NXP Semiconductors’

standard warranty and NXP Semiconductors’ product specifications.

non-automotive qualified products in automotive equipment or applications.

15.4 Trademarks

Notice: All referenced brands, product names, service names and trademarks

are the property of their respective owners.

In the event that customer uses the product for design-in and use in

automotive applications to automotive specifications and standards, customer

(a) shall use the product without NXP Semiconductors’ warranty of the

product for such automotive applications, use and specifications, and (b)

whenever customer uses the product for automotive applications beyond

NXP Semiconductors’ specifications such use shall be solely at customer’s

I²C-bus — logo is a trademark of NXP B.V.

16. Contact information

For more information, please visit: http://www.nxp.com

For sales office addresses, please send an email to: salesaddresses@nxp.com

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17. Contents

1

General description. . . . . . . . . . . . . . . . . . . . . . 1

7.13.5.3 Deep-sleep mode. . . . . . . . . . . . . . . . . . . . . . 26

7.13.5.4 Power-down mode. . . . . . . . . . . . . . . . . . . . . 26

7.13.5.5 Deep power-down mode . . . . . . . . . . . . . . . . 27

2

Features and benefits . . . . . . . . . . . . . . . . . . . . 1

Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

Ordering information. . . . . . . . . . . . . . . . . . . . . 3

Ordering options. . . . . . . . . . . . . . . . . . . . . . . . 3

Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 4

3

7.13.6

System control . . . . . . . . . . . . . . . . . . . . . . . . 27

4

4.1

5

7.13.6.1 Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

7.13.6.2 Brownout detection . . . . . . . . . . . . . . . . . . . . 27

7.13.6.3 Code security

6

6.1

6.2

Pinning information. . . . . . . . . . . . . . . . . . . . . . 5

Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 8

(Code Read Protection - CRP) . . . . . . . . . . . 27

7.13.6.4 APB interface. . . . . . . . . . . . . . . . . . . . . . . . . 28

7.13.6.5 AHBLite . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

7.13.6.6 External interrupt inputs. . . . . . . . . . . . . . . . . 28

7

7.1

7.2

Functional description . . . . . . . . . . . . . . . . . . 17

Memory map. . . . . . . . . . . . . . . . . . . . . . . . . . 17

Nested Vectored Interrupt Controller

7.14

Emulation and debugging . . . . . . . . . . . . . . . 28

8

Limiting values . . . . . . . . . . . . . . . . . . . . . . . . 29

(NVIC). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18

Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18

Interrupt sources. . . . . . . . . . . . . . . . . . . . . . . 19

IOCON block . . . . . . . . . . . . . . . . . . . . . . . . . 19

General Purpose Input/Output GPIO . . . . . . . 19

Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

USB interface . . . . . . . . . . . . . . . . . . . . . . . . 19

Full-speed USB device controller . . . . . . . . . . 20

Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

USART . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

SSP serial I/O controller . . . . . . . . . . . . . . . . . 21

Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

I²C-bus serial I/O controller . . . . . . . . . . . . . . 21

Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

10-bit ADC . . . . . . . . . . . . . . . . . . . . . . . . . . . 22

Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22

General purpose external event

counter/timers. . . . . . . . . . . . . . . . . . . . . . . . . 22

Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22

System tick timer . . . . . . . . . . . . . . . . . . . . . . 23

Windowed WatchDog Timer

(WWDT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

Clocking and power control . . . . . . . . . . . . . . 23

Integrated oscillators . . . . . . . . . . . . . . . . . . . 23

9

Static characteristics . . . . . . . . . . . . . . . . . . . 30

BOD static characteristics . . . . . . . . . . . . . . . 36

Power consumption . . . . . . . . . . . . . . . . . . . 36

Electrical pin characteristics. . . . . . . . . . . . . . 41

7.2.1

7.2.2

7.3

7.4

7.4.1

7.5

7.5.1

7.5.1.1

7.6

7.6.1

7.7

7.7.1

7.8

7.8.1

7.9

9.1

9.2

9.3

10

Dynamic characteristics. . . . . . . . . . . . . . . . . 44

Flash memory . . . . . . . . . . . . . . . . . . . . . . . . 44

External clock. . . . . . . . . . . . . . . . . . . . . . . . . 44

Internal oscillators . . . . . . . . . . . . . . . . . . . . . 45

I/O pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46

I²C-bus. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46

SSP interface. . . . . . . . . . . . . . . . . . . . . . . . . 48

USB interface. . . . . . . . . . . . . . . . . . . . . . . . . 51

10.1

10.2

10.3

10.4

10.5

10.6

10.7

11

Application information . . . . . . . . . . . . . . . . . 52

Suggested USB interface solutions . . . . . . . . 52

XTAL input . . . . . . . . . . . . . . . . . . . . . . . . . . . 52

XTAL Printed-Circuit Board (PCB) layout

guidelines. . . . . . . . . . . . . . . . . . . . . . . . . . . . 54

Standard I/O pad configuration . . . . . . . . . . . 55

Reset pad configuration. . . . . . . . . . . . . . . . . 56

ADC usage notes. . . . . . . . . . . . . . . . . . . . . . 56

11.1

11.2

11.3

7.9.1

7.10

11.4

11.5

11.6

7.10.1

7.11

7.12

12

13

14

Package outline. . . . . . . . . . . . . . . . . . . . . . . . 57

Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . 60

Revision history . . . . . . . . . . . . . . . . . . . . . . . 61

7.12.1

7.13

7.13.1

15

Legal information . . . . . . . . . . . . . . . . . . . . . . 62

Data sheet status . . . . . . . . . . . . . . . . . . . . . . 62

Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . 62

Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . 62

Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . 63

15.1

15.2

15.3

15.4

7.13.1.1 Internal RC oscillator . . . . . . . . . . . . . . . . . . . 24

7.13.1.2 System oscillator . . . . . . . . . . . . . . . . . . . . . . 25

7.13.1.3 Watchdog oscillator . . . . . . . . . . . . . . . . . . . . 25

7.13.2

7.13.3

7.13.4

7.13.5

System PLL and USB PLL . . . . . . . . . . . . . . . 25

Clock output . . . . . . . . . . . . . . . . . . . . . . . . . . 25

Wake-up process . . . . . . . . . . . . . . . . . . . . . . 25

Power control . . . . . . . . . . . . . . . . . . . . . . . . . 25

16

17

Contact information . . . . . . . . . . . . . . . . . . . . 63

Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64

7.13.5.1 Power profiles. . . . . . . . . . . . . . . . . . . . . . . . . 26

7.13.5.2 Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . 26

Please be aware that important notices concerning this document and the product(s)

described herein, have been included in section ‘Legal information’.

For more information, please visit: http://www.nxp.com

For sales office addresses, please send an email to: salesaddresses@nxp.com

Date of release: 11 April 2011

Document identifier: LPC11U1X


型号：	LPC11U14FBD48
厂家：	NXP
描述：	32-bit ARM Cortex-M0 microcontroller; up to 32 kB flash; 6 kB SRAM; USB device; USART 32位ARM Cortex -M0微控制器;高达32 KB的闪存; 6 KB的SRAM ; USB设备; USART 闪存微控制器静态存储器
文件：	总64页 (文件大小：898K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

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