PCA2001U/10AB [NXP]

32 kHz watch circuit with programmable adaptive motor pulse; 32 kHz的时钟电路与可编程自适应电机脉冲
PCA2001U/10AB
型号: PCA2001U/10AB
厂家: NXP    NXP
描述:

32 kHz watch circuit with programmable adaptive motor pulse
32 kHz的时钟电路与可编程自适应电机脉冲

振荡器 电池 消费电路 时钟集成电路 商用集成电路 智能腕表 脉冲 电机
文件: 总28页 (文件大小:140K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PCA2000; PCA2001  
32 kHz watch circuit with programmable adaptive motor pulse  
Rev. 05 — 11 November 2008  
Product data sheet  
1. General description  
The PCA2000 and PCA2001 are CMOS integrated circuits for battery operated wrist  
watches with a 32 kHz quartz crystal as timing element and a bipolar 1 Hz stepping motor.  
The quartz crystal oscillator and the frequency divider are optimized for minimum power  
consumption. A timing accuracy of 1 ppm is achieved with a programmable, digital  
frequency adjustment.  
To obtain the minimum overall power consumption for the watch, an automatic motor  
pulse adaptation function is provided. The circuit supplies only the minimum drive current,  
which is necessary to ensure a correct motor step. Changing the drive current of the  
motor is achieved by chopping the motor pulse with a variable duty cycle. The pulse width  
and the range of the variable duty cycle can be programmed to suit different types of  
motors. The automatic pulse adaptation scheme is based on a safe dynamic detection of  
successful motor steps.  
A pad RESET is provided (used for stopping the motor) for accurate time setting and for  
accelerated testing of the watch.  
The PCA2000 has a battery End Of Life (EOL) warning function. If the battery voltage  
drops below the EOL threshold voltage (which can be programmed for silver oxide or  
lithium batteries), the motor steps change from one pulse per second to a burst of four  
pulses every 4 seconds.  
The PCA2001 uses the same circuit as the PCA2000, but without the EOL function.  
2. Features  
I Amplitude-regulated 32 kHz quartz crystal oscillator, with excellent frequency stability  
and high immunity to leakage currents  
I Electrically programmable time calibration with 1 ppm resolution stored in One Time  
Programmable (OTP) memory  
I The quartz crystal is the only external component connected  
I Very low power consumption, typical 90 nA  
I One second output pulses for bipolar stepping motor  
I Minimum power consumption for the entire watch, due to self adaptation of the motor  
drive according to the required torque  
I Reliable step detection circuit  
I Motor pulse width, pulse modulation, and pulse adaptation range programmable in a  
wide range, stored in OTP memory  
I Stop function for accurate time setting and power saving during shelf life  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
I End Of Life (EOL) indication for silver oxide or lithium battery (only the PCA2000 has  
the EOL feature)  
I Test mode for accelerated testing of the mechanical parts of the watch and the IC  
I Test bits for type recognition  
3. Applications  
I Driver circuits for bipolar stepping motors  
I High immunity motor drive circuits  
4. Ordering information  
Table 1.  
Ordering information  
Type number  
Package  
Name  
Description  
Delivery form  
Version  
PCA2000U/AB  
PCA2001U/AB  
PCA200xU  
wire bond die; 8 bonding pads;  
1.16 × 0.86 × 0.22 mm  
chip in tray  
PCA200xU  
PCA200xU  
wire bond die; 8 bonding pads;  
1.16 × 0.86 × 0.22 mm  
chip in tray  
PCA200xU  
PCA200xU  
PCA200xU  
PCA200xCX  
PCA200xCX  
PCA2000U/10AB PCA200xU  
PCA2001U/10AB PCA200xU  
wire bond die; 8 bonding pads;  
1.16 × 0.86 × 0.22 mm  
chip on film frame carrier  
chip on film frame carrier  
wire bond die; 8 bonding pads;  
1.16 × 0.86 × 0.22 mm  
PCA2000CX8/5 PCA200xCX wafer level chip-size package; 8 bumps;  
unsawn wafer with lead  
free solder bumps  
1.16 × 0.86 × 0.31 mm  
PCA2001CX8/5 PCA200xCX wafer level chip-size package; 8 bumps;  
unsawn wafer with lead  
free solder bumps  
1.16 × 0.86 × 0.31 mm  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
2 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
5. Block diagram  
32 Hz  
8 kHz  
3
OSCIN  
8
OSCILLATOR  
DIVIDER  
RESET  
reset  
÷4  
RESET  
4
OSCOUT  
TIMING ADJUSTMENT,  
INHIBITION  
5
V
DD  
VOLTAGE DETECTOR,  
OTP-CONTROLLER  
1 Hz  
OTP-MEMORY  
1
V
SS  
MOTOR CONTROL WITH  
ADAPTIVE PULSE MODULATION  
EOL  
PCA2000 only  
2
STEP  
DETECTION  
i.c.  
PCA2000  
PCA2001  
6
7
mgw567  
MOT1  
MOT2  
Fig 1. Block diagram  
6. Pinning information  
6.1 Pinning  
PCA200xCX  
PCA200xU  
V
1
2
8
7
RESET  
MOT2  
V
1
2
8
7
RESET  
MOT2  
SS  
SS  
i.c.  
i.c.  
x
x
0
0
y
0
0
y
OSCIN  
3
4
6
MOT1  
OSCIN  
3
4
6
MOT1  
OSCOUT  
5
V
OSCOUT  
5
V
DD  
DD  
001aai177  
001aai176  
Top view. For mechanical details, see  
Figure 13.  
Top view. For mechanical details, see  
Figure 14.  
Fig 2. Pad and bump configuration of PCA2000 and PCA2001  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
3 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
6.2 Pin description  
Table 2.  
Symbol  
VSS  
Pin description  
Pin  
1
Description  
ground  
i.c.  
2
internally connected  
oscillator input  
oscillator output  
supply voltage  
motor 1 output  
motor 2 output  
reset input  
OSCIN  
OSCOUT  
VDD  
3
4
5
MOT1  
MOT2  
RESET  
6
7
8
7. Functional description  
7.1 Motor pulse  
The motor output supplies pulses of different driving stages, depending on the torque  
required to turn on the motor. The number of different stages can be selected between  
three and six. With the exception of the highest driving stage, each motor pulse (tp in  
Figure 3 and Figure 6) is followed by a detection phase during which the motor movement  
is monitored, in order to check whether the motor has turned correctly or not.  
1.96 ms  
t
t
2t  
p
detection phase  
p
p
mgw350  
0.98 ms  
31.25 ms  
31.25 ms  
Fig 3. Correction sequence after failed motor step  
If a missing step is detected, a correction sequence is generated (see Figure 3) and the  
driving stage is switched to the next level. The correction sequence consists of two pulses:  
first a short pulse in the opposite direction (0.98 ms, modulated with the maximum duty  
cycle) to give the motor a defined position, followed by a motor pulse of the strongest  
driving level. Every 4 minutes, the driving level is lowered again by one stage.  
The motor pulse has a constant pulse width. The driving level is regulated by chopping the  
driving pulse with a variable duty cycle. The driving level starts from the programmed  
minimum value and increases by 6.25 % after each failed motor step. The strongest  
driving stage, which is not followed by a detection phase, is programmed separately.  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
4 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
Therefore it is possible to program a larger energy gap between the pulses with step  
detection and the strongest, not monitored, pulse. This might be necessary to ensure a  
reliable and stable operation under adverse conditions (magnetic fields and vibrations). If  
the watch works in the highest driving stage, the driving level jumps after the 4-minute  
period directly to the lowest stage, and not just one stage lower.  
To optimize the performance for different motors, the following parameters can be  
programmed:  
Pulse width: 0.98 ms to 7.8 ms in steps of 0.98 ms  
Duty cycle of lowest driving level: 37.5 % to 56.25 % in steps of 6.25 %  
Number of driving levels (including the highest driving level): 3 to 6  
Duty cycle of the highest driving level: 75 % or 100 %  
Enlargement pulse for the highest driving level: on or off  
The enlargement pulse has a duty cycle of 25 % and a pulse width which is twice the  
programmed motor pulse width. The repetition period for the chopping pattern is 0.98 ms.  
Figure 4 shows an example of a 3.9 ms pulse.  
0.244 ms  
0.122 ms  
DUTY CYCLE  
37.5 %  
43.75 %  
50 %  
56.25 %  
62.5 %  
68.75 %  
75 %  
81.25 %  
100 %  
mgw351  
0.98 ms  
0.98 ms  
0.98 ms  
0.98 ms  
Fig 4. Possible modulations for a 3.9 ms motor pulse  
7.2 Step detection  
Figure 5 shows a simplified diagram of the motor driving and step detection circuit, and  
Figure 6 shows the step detection sequence and corresponding sampling current.  
Between the motor driving pulses, the switches P1 and P2 are closed, which means the  
motor is short-circuited. For a pulse in one direction, P1 and N2 are open, and P2 and N1  
are closed with the appropriate duty cycle; for a pulse in the opposite direction, P2 and N1  
are open, and P1 and N2 closed.  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
5 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
V
DD  
R
D
D1  
P2  
N2  
P1  
N1  
P3  
MOTOR  
P4  
MOT1  
MOT2  
V
SS  
mgw352  
Fig 5. Simplified diagram of motor driving and step detection circuit  
The step detection phase is initiated after the motor driving pulse. In phase 1 P1 and P2  
are first closed for 0.98 ms and then in phase 2 all four drive switches (P1, N1, P2 and N2)  
are opened for 0.98 ms. As a result, the energy stored in the motor inductance is reduced  
as fast as possible.  
The induced current caused by the residual motor movement is then sampled in phase 3  
(closing P3 and P2) and in phase 4 (closing P1 and P4). For step detection in the opposite  
direction P1 and P4 are closed during phase 3 and P2 and P3 during phase 4 (see  
Figure 6).  
I
motor  
positive detection level  
t
negative detection level  
t
p
0.98 ms  
(motor shorted)  
programmable time limit  
OTP C4 to C6  
t
= 0.98 ms  
sampling  
d
sampling  
voltage  
t
sampling  
voltage  
positive detection  
motor shorted  
negative detection  
sampling results  
t
sampling  
mgw569  
61 µs  
0.49 ms  
Fig 6. Step detection sequence and corresponding sampling voltage  
Rev. 05 — 11 November 2008  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
6 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
The condition for a successful motor step is a positive step detection pulse (current in the  
same direction as in the driving phase) followed by a negative detection pulse within a  
given time limit. This time limit can be programmed between 3.9 ms and 10.7 ms (in steps  
of 0.98 ms) in order to ensure a safe and correct step detection under all conditions (for  
instance magnetic fields). The step detection phase stops after the last 31.25 ms, after the  
start of the motor driving pulse.  
7.3 Time calibration  
The quartz crystal oscillator has an integrated capacitance of 5.2 pF, which is lower than  
the specified capacitance (CL) of 8.2 pF for the quartz crystal (see Table 10). Therefore,  
the oscillator frequency is typically 60 ppm higher than 32.768 kHz. This positive  
frequency offset is compensated by removing the appropriate number of 8192 Hz pulses  
in the divider chain (maximum 127 pulses), every 1 or 2 minutes. The time correction is  
given in Table 3.  
Table 3.  
Time calibration  
Correction per step (n = 1)  
Calibration  
period  
Correction per step (n = 127)  
seconds per day ppm seconds per day  
22.3  
11.15  
ppm  
2.03  
1 minute  
0.176  
0.088  
258  
129  
2 minutes  
1.017  
After measuring the effective oscillator frequency, the number of correction pulses must  
be calculated and stored together with the calibration period in the OTP memory (see  
Section 7.8).  
The oscillator frequency can be measured at pad RESET, where a square wave signal  
1
1024  
with the frequency of  
× f  
is provided.  
-----------  
osc  
This frequency shows a jitter every minute or every two minutes, depending on the  
programmed calibration period, which originates from the time calibration.  
Details on how to measure the oscillator frequency and the programmed inhibition time  
are given in Section 7.11.  
7.4 Reset  
1
At pad RESET an output signal with a frequency of  
× f  
= 32 Hz is provided.  
osc  
-----------  
1024  
Connecting pad RESET to VDD stops the motor drive and opens all four (P1, N1, P2 and  
N2) driver switches (see Figure 5). Connecting pad RESET to VSS activates the test  
mode. In this mode the motor output frequency is 32 Hz, which can be used to test the  
mechanical function of the watch.  
After releasing the pad RESET, the motor starts exactly one second later with the smallest  
duty cycle and with the opposite polarity to the last pulse before stopping.  
The debounce time for the RESET function is between 31 ms and 62 ms.  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
7 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
7.5 Programming possibilities  
The programming data is stored in OTP cells (EPROM cells). At delivery, all memory cells  
are in state 0. The cells can be programmed to the state 1, but then there is no more set  
back to state 0.  
The programming data is organized in an array of four 8-bit words: word A contains the  
time calibration, words B and C contain the setting for the monitor pulses and word D  
contains the type recognition (see Table 4).  
Table 4.  
Word  
Words and bits  
Bit  
1
2
3
4
5
6
7
8
A
B
number of 8192 Hz pulses to be removed  
calibration  
period  
lowest stage: duty  
cycle  
number of driving  
stages  
highest stage:  
duty cycle and  
stretching  
factory test bits  
C
D
pulse width  
type  
maximum time delay between EOL  
factorytest  
positive and negative  
detection pulses  
voltage bit  
factory test bits  
Table 5.  
Bit  
Description of word A bits  
Value  
Description  
Inhibition time  
1 to 7  
-
adjust the number of the 8192 Hz pulses to be removed;  
bit 1 is the MSB and bit 7 is the LSB  
Calibration period  
8
0
1
1 minute  
2 minutes  
Table 6.  
Bit  
Description of word B bits  
Value  
Description  
Duty cycle lowest driving stage  
1 to 2  
00  
01  
10  
11  
37.5 %  
43.75 %  
50 %  
56.25 %  
Number of driving stages  
3 to 4  
00  
01  
10  
11  
3
4
5
6[1]  
Duty cycle highest driving stage  
5
0
1
75 %[2]  
100 %  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
8 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
Table 6.  
Description of word B bits …continued  
Bit  
Value  
Description  
Pulse stretching  
6
0
1
no pulse stretching  
pulse of 2 × tp and duty cycle of 25 % are added  
Factory test bits  
7 to 8  
-
-
[1] Including the highest driving stage, which one has no motor step detection.  
[2] If the maximum duty cycle of 75 % is selected, not all programming combinations are possible since the  
second highest level must be smaller than the highest driving level.  
Table 7.  
Bit  
Description of word C bits  
Value  
Description  
Pulse width tp  
1 to 3  
000  
001  
010  
011  
100  
101  
110  
111  
0.98 ms  
1.95 ms  
2.90 ms  
3.90 ms  
4.90 ms  
5.90 ms  
6.80 ms  
7.80 ms  
[1]  
Time delay td(max)  
4 to 6  
000  
001  
010  
011  
100  
101  
110  
111  
3.91 ms  
4.88 ms  
5.86 ms  
6.84 ms  
7.81 ms  
8.79 ms  
9.77 ms  
10.74 ms  
EOL voltage of the battery  
7
0
1
1.38 V (silver-oxide)  
2.5 V (lithium)  
Factory test bit  
8
-
-
[1] Between positive and negative detection pulses.  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
9 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
7.6 Type recognition  
Byte D is read to determine which type of the PCA200X family is used in a particular  
application.  
Table 8.  
Bit  
Description of word D bits  
Value  
Description  
Type recognition  
1 to 4  
0000  
1000  
0100  
1100  
PCA2002  
PCA2000  
PCA2001  
PCA2003  
7.7 Programming procedure  
For a watch it is essential that the timing calibration can be made after the watch is fully  
assembled. In this situation, the supply pads are often the only terminals which are still  
accessible.  
Writing to the OTP cells and performing the related functional checks is achieved in the  
PCA2000 and PCA2001 by modulating the supply voltage. The necessary control circuit  
consists basically of a voltage level detector, an instruction counter which determines the  
function to be performed, and an 8-bit shift register which allows writing to the OTP cells of  
an 8-bit word in one step and acts as a data pointer for checking the OTP content.  
There are six different instruction states (state 3 and state 5 are handled as state 4):  
State 1: measurement of the quartz crystal oscillator frequency (divided by 1024)  
State 2: measurement of the inhibition time  
State 3: write/check word A  
State 4: write/check word B  
State 5: write/check word C  
State 6: check word D (type recognition)  
Each instruction state is switched on with a pulse to VP(prog)(start). After this large pulse, an  
initial waiting time of t0 is required. The programming instructions are then entered by  
modulating the supply voltage with small pulses (amplitude VP(mod) and pulse width tmod).  
The first small pulse defines the start time, the following pulses perform three different  
functions, depending on the time delay (td) from the preceding pulse  
(see Figure 7, Figure 8, Figure 11 and Figure 12):  
td = t1 (0.7 ms); increments the instruction counter  
td = t2 (1.7 ms); clocks the shift register with data = logic 0  
td = t3 (2.7 ms); clocks the shift register with data = logic 1  
The programming procedure requires a stable oscillator. This means that a waiting time,  
determined by the start-up time of the oscillator is necessary after power-up of the circuit.  
After the VP(prog)(start) pulse, the instruction counter is in state 1 and the data shift register  
is cleared.  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
10 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
The instruction state ends with a second pulse to VP(prog)(stop) or with a pulse to Vstore  
.
In any case, the instruction states are terminated automatically 2 seconds after the last  
supply modulation pulse.  
7.8 Programming the memory cells  
Applying the two-stage programming pulse (see Figure 7) transfers the stored data in the  
shift register to the OTP cells.  
Perform the following to program a memory word:  
1. Starting with a VP(prog)(start) pulse wait for the time period t0 then set the instruction  
counter to the word to be written (td = t1).  
2. Enter the data to be stored in the shift register (td = t2 or t3). LSB first (bit 8) and the  
MSB last (bit 1).  
3. Applying the two-stage programming pulse Vprestore followed by Vstore stores the word.  
The delay between the last data bit and the prestore pulse Vprestore is td = t4. Store the  
word by raising the supply voltage to Vstore; the delay between the last data bit and the  
store pulse is td.  
The example shown in Figure 7 performs the following functions:  
Start  
Setting instruction counter to state 4 (word B)  
Entering data word 110101 into the shift register (sequence: LSB first and MSB last)  
Writing to the OTP cells for word B  
t
w(prestore)  
V
DD  
V
store  
t
p(start)  
V
P(prog)(start)  
V
prestore  
t
t
t
t
t
t
t
t
t
t
t
t
w(store)  
0
1
1
1
3
2
3
2
3
3
4
V
P(mod)  
V
DD(nom)  
V
SS  
mgw356  
The example shows the programming of B = 110101 (the sequence is LSB first and MSB last).  
Fig 7. Supply voltage modulation for programming  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
11 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
7.9 Checking memory content  
The stored data of the OTP array can be checked bit wise by measuring the supply  
current. The array word is selected by the instruction state and the bit is addressed by the  
shift register.  
To read a word, the word is first selected (td = t1), and a logic 1 is written into the first cell  
of the shift register (td = t3). This logic 1 is then shifted through the entire shift register  
(td = t2), so that it points with each clock pulse to the next bit.  
If the addressed OTP cell contains a logic 1, a 30 kresistor is connected between VDD  
and VSS, which increases the supply current accordingly.  
Figure 8 shows the supply voltage modulation for reading word B, with the corresponding  
supply current variation for word B = 110101 (sequence: first MSB and last LSB).  
V
DD  
t
p(start)  
t
p(stop)  
V
P(prog)(start)  
V
P(prog)(stop)  
t
t
t
t
t
t
t
t
t
t
2
0
1
1
1
3
2
2
2
2
V
P(mod)  
V
DD(nom)  
V
SS  
I
DD  
(1)  
mgw357  
VDD  
(1) IDD  
=
---------------  
30 kΩ  
Fig 8. Supply voltage modulation and corresponding supply current variation for  
reading word B  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
12 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
7.10 Frequency tuning of assembled watch  
Figure 9 shows the test set-up for frequency tuning the assembled watch.  
32 kHz  
M
PCA200x  
FREQUENCY  
COUNTER  
motor  
PROGRAMMABLE  
DC POWER SUPPLY  
battery  
PC INTERFACE  
PC  
mgw568  
Fig 9. Frequency tuning at assembled watch  
7.11 Measurement of oscillator frequency and inhibition time  
The output of the two measuring states can either be monitored directly at pad RESET or  
as a modulation of the supply voltage (a modulating resistor of 30 kis connected  
between VDD and VSS when the signal at pad RESET is at HIGH-level).  
The supply voltage modulation must be followed as shown in Figure 10 in order to  
guarantee the correct start-up of the circuit during production and testing.  
V
DD  
t
p(stop)  
V
P(prog)(stop)  
t
> 500 ms  
d(start)  
V
DD(nom)  
V
SS  
001aac503  
Fig 10. Supply voltage at start-up during production and testing  
Measuring states:  
State 1: quartz crystal oscillator frequency divided by 1024; state 1 starts with a pulse  
to Vp and ends with a second pulse to Vp  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
13 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
State 2: inhibition time has a value of n × 0.122 ms. A signal with periodicity of  
31.25 ms + n × 0.122 ms appears at pad RESET and as current modulation at  
pad VDD (see Figure 11 and Figure 12)  
31.25 ms + inhibition time  
V
DD  
V
O(dif)  
V
SS  
mgw355  
Fig 11. Output waveform at pad RESET for instruction state 2  
V
DD  
t
t
p(stop)  
p(start)  
V
V
P(prog)(stop)  
P(prog)(start)  
t
t
1
0
V
P(mod)  
V
DD(nom)  
V
SS  
mgu719  
Fig 12. Supply voltage modulation for starting and stopping of instruction state 2  
7.12 Customer testing  
Connecting pad RESET to VSS activates the test mode. In this test mode, the motor  
output frequency is 8 Hz; the duty cycle reduction and battery check occurs every second,  
instead of every 4 minutes. If the supply voltage drops below the EOL threshold voltage,  
the motor output frequency is 32 Hz with the highest driving level.  
7.13 EOL of battery  
The supply voltage is checked every 4 minutes. If it drops below the EOL threshold  
voltage (1.38 V for silver-oxide, 2.5 V for lithium batteries), the motor steps change from  
one pulse per second to a burst of four pulses every 4 seconds. The step detection is  
switched off, and the motor is driven with the highest pulse level.  
Only the PCA2000 has an EOL function.  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
14 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
8. Limiting values  
Table 9.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
VDD  
VI  
Parameter  
Conditions  
VSS = 0 V  
Min  
1.8  
0.5  
-
Max  
Unit  
V
[1][2]  
supply voltage  
+7.0  
input voltage  
on all supply pins  
output  
+7.5  
V
tsc  
short circuit duration time  
ambient temperature  
storage temperature  
electrostatic discharge voltage  
indefinite  
+60  
s
Tamb  
Tstg  
10  
30  
-
°C  
°C  
V
+100  
±2000  
±200  
100  
[3]  
[4]  
[5]  
Vesd  
HBM  
MM  
-
V
Ilu  
latch-up current  
-
mA  
[1] When writing to the OTP cells, the supply voltage (VDD) can be raised to a maximum of 12 V for a period of 1 s.  
[2] Connecting the battery with reversed polarity does not destroy the circuit, but in this condition a large current flows, which rapidly  
discharges the battery.  
[3] HBM: Human Body Model, according to JESD22-A114.  
[4] MM: Machine Model, according to JESD22-A115.  
[5] Latch-up testing, according to JESD78.  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
15 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
9. Characteristics  
Table 10. Characteristics  
VDD = 1.55 V; VSS = 0 V; fosc = 32.768 kHz; Tamb = 25 °C; quartz crystal: RS = 40 k, C1 = 2 fF to 3 fF, CL = 8.2 pF; unless  
otherwise specified.  
Symbol  
Supply  
VDD  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
supply voltage  
normal operating mode;  
1.1  
1.55  
3.60  
V
T
amb = 10 °C to +60 °C  
VDD  
supply voltage variation V/t = 1 V/µs  
-
-
-
-
0.25  
120  
180  
V
IDD  
supply current  
between motor pulses  
90  
120  
nA  
nA  
between motor pulses at  
VDD = 3.5 V  
Tamb = 10 °C to +60 °C  
-
-
-
200  
135  
nA  
nA  
stop mode;  
100  
pad RESET connected to  
VDD  
Motor output  
[1]  
Vsat  
saturation voltage  
Rmotor = 2 k;  
-
-
150  
200  
200  
300  
mV  
T
amb = 10 °C to +60 °C  
between motor pulses;  
motor < 1 mA  
Zo(sc)  
output impedance  
(short circuit)  
I
Oscillator  
Vstart  
start voltage  
1.1  
5
-
-
V
gm  
transconductance  
start-up time  
V
i(osc) 50 mV(p-p)  
10  
-
µS  
s
tstartup  
f/f  
-
0.3  
0.05  
5.2  
0.9  
0.20  
6.3  
frequency stability  
VDD = 100 mV  
-
ppm  
pF  
CL(itg)  
integrated load  
capacitance  
4.3  
Rpar  
parasitic resistance  
allowed resistance between  
adjacent pads  
20  
-
-
MΩ  
Voltage level detector  
Vth(EOL) EOL threshold voltage silver-oxide battery  
1.30  
2.35  
-
1.38  
2.50  
0.07  
1.46  
2.65  
-
V
lithium battery  
V
TCEOL  
EOL temperature  
coefficient  
%/°C  
Pad RESET  
fo  
output frequency  
-
32  
-
-
-
Hz  
V
[2]  
VO(dif)  
differential output  
voltage  
RL = 1 M; CL = 10 pF  
1.4  
[2]  
[2]  
tr  
rise time  
RL = 1 M; CL = 10 pF  
RL = 1 M; CL = 10 pF  
pad RESET connected to  
-
-
-
1
-
µs  
µs  
nA  
tf  
fall time  
1
-
Ii(AV)  
average input current  
10  
20  
V
DD or VSS  
[1] P1 + ... + P4 + N1 + N2 (see Section 7.2).  
[2] RL and CL are a load resistor and load capacitor, externally connected to pad RESET.  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
16 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
10. OTP programming characteristics  
Table 11. Specifications for OTP programming  
See Figure 7, Figure 8 and Figure 12.  
Symbol  
Parameter[1]  
Conditions  
Min  
1.5  
6.6  
6.2  
320  
6.2  
9.9  
Typ  
Max  
3.0  
Unit  
V
VDD  
supply voltage  
during programming procedure  
-
VP(prog)(start) programming supply voltage (start)  
VP(prog)(stop) programming supply voltage (stop)  
-
6.8  
V
-
6.4  
V
VP(mod)  
Vprestore  
Vstore  
supply voltage modulation  
prestore voltage  
for entering instructions  
for prestore pulse  
350  
-
380  
6.4  
mV  
V
supply voltage for writing to the  
OTP cells  
10.0  
10.1  
V
Istore  
store current  
for writing to the OTP cells  
-
-
10  
mA  
ms  
ms  
µs  
tp(start)  
tp(stop)  
tmod  
pulse width of start pulse  
pulse width of stop pulse  
modulation pulse width  
prestore pulse width  
store pulse width  
time 0  
8
10  
-
12  
0.05  
25  
0.05  
95  
20  
0.6  
0.5  
40  
30  
-
tw(prestore)  
tw(store)  
t0  
0.5  
110  
30  
ms  
ms  
ms  
ms  
for writing to the OTP cells  
waiting time after start pulse  
100  
-
t1  
time 1  
pulse distance for incrementing  
the state counter  
0.7  
0.8  
t2  
time 2  
pulse distance for clocking the  
data register with data = logic 0  
1.6  
2.6  
0.1  
0.5  
18  
1.7  
2.7  
0.2  
-
1.8  
2.8  
0.3  
5.0  
45  
ms  
ms  
ms  
V/µs  
kΩ  
t3  
time 3  
pulse distance for clocking the  
data register with data = logic 1  
t4  
time 4  
waiting time for writing to OTP  
cells  
SR  
Rmod  
slew rate  
for modulation of the supply  
voltage  
modulation resistance  
supply current modulation  
read-out resistor  
30  
[1] Program each word once only.  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
17 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
11. Bare die outline  
Wire bond die; 8 bonding pads; 1.16 x 0.86 x 0.22 mm  
PCA200xU  
A
D
P
P
1
2
e
1
e
2
E
P
P
3
4
detail X  
X
e
D
DIMENSIONS (mm are the original dimensions)  
UNIT  
A
D
E
e
1
e
2
e
D
P
P
P
P
4
1
2
3
max 0.22  
nom 0.20 1.16 0.86 0.17 0.32 0.96 0.096 0.086 0.096 0.086  
min 0.18 0.093 0.083 0.093 0.083  
0.099 0.089 0.099 0.089  
0
0.5  
1 mm  
mm  
scale  
REFERENCES  
JEDEC JEITA  
OUTLINE  
VERSION  
EUROPEAN  
PROJECTION  
ISSUE DATE  
IEC  
08-05-09  
08-05-21  
PCA200xU  
Fig 13. Bare die outline PCA2000U and PCA2001U  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
18 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
WLCSP8: wafer level chip-size package; 8 bumps; 1.16 x 0.86 x 0.31 mm  
PCA200xCX  
D
b
e
1
A
2
e
2
A
E
A
1
detail X  
e
D
X
DIMENSIONS (mm are the original dimensions)  
UNIT  
max 0.310 0.090 0.22 0.12  
A
A
1
A
2
b
D
E
e
1
e
2
e
D
0
0.5  
scale  
1 mm  
mm  
nom 0.275 0.075 0.20 0.10 1.16 0.86 0.17 0.32 0.96  
min 0.240 0.060 0.18 0.08  
REFERENCES  
JEDEC JEITA  
OUTLINE  
VERSION  
EUROPEAN  
PROJECTION  
ISSUE DATE  
IEC  
08-05-09  
08-05-21  
PCA200xCX  
Fig 14. Bare die outline PCA2000CX and PCA2001CX  
Table 12. Bonding pad and solder bump locations  
Symbol  
Pad  
Coordinates[1]  
x
y
[2]  
VSS  
1
2
3
4
5
6
7
8
480  
+330  
+160  
160  
330  
330  
160  
+160  
+330  
i.c.[3]  
480  
OSCIN  
OSCOUT  
VDD  
480  
480  
+480  
MOT1  
MOT2  
RESET  
+480  
+480  
+480  
[1] All coordinates are referenced, in µm, to the center of the die (see Figure 2, Figure 13 and Figure 14).  
[2] The substrate (rear side of the chip) is connected to VSS. Therefore the die pad must be either floating or  
connected to VSS  
[3] Pad i.c. is used for factory tests; in normal operation it should be left open-circuit, and it has an internal  
pull-down resistance to VSS  
.
.
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
19 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
12. Packing information  
12.1 Tray information  
A
x
G
C
H
y
1,1 2,1 3,1  
1,2 2,2  
1,3  
x,1  
D
B
F
x,y  
1,y  
A
A
E
M
J
SECTION A-A  
mgu653  
Fig 15. Tray details  
mgu652  
The orientation of the IC in a pocket is indicated by the position of the IC type name on the surface  
of the die, with respect to the cut corner on the upper left of the tray.  
Fig 16. Tray alignment  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
20 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
Table 13. Tray dimensions  
Dimension  
Description  
Value  
A
B
C
D
E
F
pocket pitch; x direction  
pocket pitch; y direction  
pocket width; x direction  
pocket width; y direction  
tray width; x direction  
tray width; y direction  
2.15 mm  
2.43 mm  
1.01 mm  
1.39 mm  
50.67 mm  
50.67 mm  
4.86 mm  
G
distance from cut corner to pocket (1, 1)  
center  
H
distance from cut corner to pocket (1, 1)  
center  
4.66 mm  
J
tray thickness  
3.94 mm  
0.61 mm  
20  
M
x
pocket depth  
number of pockets in x direction  
number of pockets in y direction  
y
18  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
21 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
12.2 Unsawn wafer information  
(1)  
(1)  
~18 µm  
~18 µm  
84 µm  
84 µm  
(1)  
~18 µm  
Saw lane  
Saw lane  
84 µm  
detail X  
detail Y  
(1)  
1
8
1
8
4
1
5
8
4
1
5
8
Y
X
4
1
5
8
4
1
5
8
4
1
5
8
4
1
5
8
4
1
5
8
4
1
5
8
4
1
5
8
4
1
5
8
4
5
4
5
Straight edge of the wafer  
001aai236  
The die are grouped in arrays of 2 × 6 devices. Each array is edged with a metal path. All this metal  
paths have to be cut while dicing.  
Fig 17. Wafer layout of PCA2000CX and PCA2001CX  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
22 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
13. Soldering of SMD packages  
This text provides a very brief insight into a complex technology. A more in-depth account  
of soldering ICs can be found in Application Note AN10365 “Surface mount reflow  
soldering description”.  
13.1 Introduction to soldering  
Soldering is one of the most common methods through which packages are attached to  
Printed Circuit Boards (PCBs), to form electrical circuits. The soldered joint provides both  
the mechanical and the electrical connection. There is no single soldering method that is  
ideal for all IC packages. Wave soldering is often preferred when through-hole and  
Surface Mount Devices (SMDs) are mixed on one printed wiring board; however, it is not  
suitable for fine pitch SMDs. Reflow soldering is ideal for the small pitches and high  
densities that come with increased miniaturization.  
13.2 Wave and reflow soldering  
Wave soldering is a joining technology in which the joints are made by solder coming from  
a standing wave of liquid solder. The wave soldering process is suitable for the following:  
Through-hole components  
Leaded or leadless SMDs, which are glued to the surface of the printed circuit board  
Not all SMDs can be wave soldered. Packages with solder balls, and some leadless  
packages which have solder lands underneath the body, cannot be wave soldered. Also,  
leaded SMDs with leads having a pitch smaller than ~0.6 mm cannot be wave soldered,  
due to an increased probability of bridging.  
The reflow soldering process involves applying solder paste to a board, followed by  
component placement and exposure to a temperature profile. Leaded packages,  
packages with solder balls, and leadless packages are all reflow solderable.  
Key characteristics in both wave and reflow soldering are:  
Board specifications, including the board finish, solder masks and vias  
Package footprints, including solder thieves and orientation  
The moisture sensitivity level of the packages  
Package placement  
Inspection and repair  
Lead-free soldering versus SnPb soldering  
13.3 Wave soldering  
Key characteristics in wave soldering are:  
Process issues, such as application of adhesive and flux, clinching of leads, board  
transport, the solder wave parameters, and the time during which components are  
exposed to the wave  
Solder bath specifications, including temperature and impurities  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
23 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
13.4 Reflow soldering  
Key characteristics in reflow soldering are:  
Lead-free versus SnPb soldering; note that a lead-free reflow process usually leads to  
higher minimum peak temperatures (see Figure 18) than a SnPb process, thus  
reducing the process window  
Solder paste printing issues including smearing, release, and adjusting the process  
window for a mix of large and small components on one board  
Reflow temperature profile; this profile includes preheat, reflow (in which the board is  
heated to the peak temperature) and cooling down. It is imperative that the peak  
temperature is high enough for the solder to make reliable solder joints (a solder paste  
characteristic). In addition, the peak temperature must be low enough that the  
packages and/or boards are not damaged. The peak temperature of the package  
depends on package thickness and volume and is classified in accordance with  
Table 14 and 15  
Table 14. SnPb eutectic process (from J-STD-020C)  
Package thickness (mm) Package reflow temperature (°C)  
Volume (mm3)  
< 350  
235  
350  
220  
< 2.5  
2.5  
220  
220  
Table 15. Lead-free process (from J-STD-020C)  
Package thickness (mm) Package reflow temperature (°C)  
Volume (mm3)  
< 350  
260  
350 to 2000  
> 2000  
260  
< 1.6  
260  
250  
245  
1.6 to 2.5  
> 2.5  
260  
245  
250  
245  
Moisture sensitivity precautions, as indicated on the packing, must be respected at all  
times.  
Studies have shown that small packages reach higher temperatures during reflow  
soldering, see Figure 18.  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
24 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
maximum peak temperature  
= MSL limit, damage level  
temperature  
minimum peak temperature  
= minimum soldering temperature  
peak  
temperature  
time  
001aac844  
MSL: Moisture Sensitivity Level  
Fig 18. Temperature profiles for large and small components  
For further information on temperature profiles, refer to Application Note AN10365  
“Surface mount reflow soldering description”.  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
25 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
14. Revision history  
Table 16. Revision history  
Document ID  
Release date  
20081111  
Data sheet status  
Change notice  
Supersedes  
PCA2000_2001_5  
Modifications:  
Product data sheet  
-
PCA2000_2001_4  
The format of this data sheet has been redesigned to comply with the new presentation and  
information standard of NXP  
Implemented new drawings and wafer information  
Added new bare die outline drawing  
PCA2000_2001_4  
PCA2000_2001_3  
PCA2000_2001_2  
PCA2000_2001_1  
20050908  
20031217  
20030204  
20020517  
Product data sheet  
-
-
-
-
PCA2000_2001_3  
PCA2000_2001_2  
PCA2000_2001_1  
-
Product data sheet  
Objective specification  
Preliminary specification  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
26 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
15. Legal information  
15.1 Data sheet status  
Document status[1][2]  
Product status[3]  
Development  
Definition  
Objective [short] data sheet  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL http://www.nxp.com.  
Bare die — All die are tested on compliance with their related technical  
15.2 Definitions  
specifications as stated in this data sheet up to the point of wafer sawing and  
are handled in accordance with the NXP Semiconductors storage and  
transportation conditions. If there are data sheet limits not guaranteed, these  
will be separately indicated in the data sheet. There are no post-packing tests  
performed on individual die or wafers.  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
NXP Semiconductors has no control of third party procedures in the sawing,  
handling, packing or assembly of the die. Accordingly, NXP Semiconductors  
assumes no liability for device functionality or performance of the die or  
systems after third party sawing, handling, packing or assembly of the die. It  
is the responsibility of the customer to test and qualify their application in  
which the die is used.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
All die sales are conditioned upon and subject to the customer entering into a  
written die sale agreement with NXP Semiconductors through its legal  
department.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) may cause permanent  
damage to the device. Limiting values are stress ratings only and operation of  
the device at these or any other conditions above those given in the  
Characteristics sections of this document is not implied. Exposure to limiting  
values for extended periods may affect device reliability.  
15.3 Disclaimers  
General — Information in this document is believed to be accurate and  
reliable. However, NXP Semiconductors does not give any representations or  
warranties, expressed or implied, as to the accuracy or completeness of such  
information and shall have no liability for the consequences of use of such  
information.  
Terms and conditions of sale — NXP Semiconductors products are sold  
subject to the general terms and conditions of commercial sale, as published  
at http://www.nxp.com/profile/terms, including those pertaining to warranty,  
intellectual property rights infringement and limitation of liability, unless  
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of  
any inconsistency or conflict between information in this document and such  
terms and conditions, the latter will prevail.  
Right to make changes — NXP Semiconductors reserves the right to make  
changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
No offer to sell or license — Nothing in this document may be interpreted  
or construed as an offer to sell products that is open for acceptance or the  
grant, conveyance or implication of any license under any copyrights, patents  
or other industrial or intellectual property rights.  
Suitability for use — NXP Semiconductors products are not designed,  
authorized or warranted to be suitable for use in medical, military, aircraft,  
space or life support equipment, nor in applications where failure or  
malfunction of an NXP Semiconductors product can reasonably be expected  
to result in personal injury, death or severe property or environmental  
damage. NXP Semiconductors accepts no liability for inclusion and/or use of  
NXP Semiconductors products in such equipment or applications and  
therefore such inclusion and/or use is at the customer’s own risk.  
15.4 Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
16. Contact information  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
PCA2000_2001_5  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 05 — 11 November 2008  
27 of 28  
PCA2000; PCA2001  
NXP Semiconductors  
32 kHz watch circuit with programmable adaptive motor pulse  
17. Contents  
1
2
3
4
5
General description . . . . . . . . . . . . . . . . . . . . . . 1  
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2  
Ordering information. . . . . . . . . . . . . . . . . . . . . 2  
Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 3  
6
6.1  
6.2  
Pinning information. . . . . . . . . . . . . . . . . . . . . . 3  
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3  
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4  
7
Functional description . . . . . . . . . . . . . . . . . . . 4  
Motor pulse. . . . . . . . . . . . . . . . . . . . . . . . . . . . 4  
Step detection. . . . . . . . . . . . . . . . . . . . . . . . . . 5  
Time calibration . . . . . . . . . . . . . . . . . . . . . . . . 7  
Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
Programming possibilities. . . . . . . . . . . . . . . . . 8  
Type recognition . . . . . . . . . . . . . . . . . . . . . . . 10  
Programming procedure. . . . . . . . . . . . . . . . . 10  
Programming the memory cells . . . . . . . . . . . 11  
Checking memory content . . . . . . . . . . . . . . . 12  
Frequency tuning of assembled watch . . . . . . 13  
Measurement of oscillator frequency and  
7.1  
7.2  
7.3  
7.4  
7.5  
7.6  
7.7  
7.8  
7.9  
7.10  
7.11  
inhibition time . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Customer testing. . . . . . . . . . . . . . . . . . . . . . . 14  
EOL of battery . . . . . . . . . . . . . . . . . . . . . . . . 14  
7.12  
7.13  
8
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . 15  
Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . 16  
OTP programming characteristics . . . . . . . . . 17  
Bare die outline . . . . . . . . . . . . . . . . . . . . . . . . 18  
9
10  
11  
12  
12.1  
12.2  
Packing information. . . . . . . . . . . . . . . . . . . . . 20  
Tray information . . . . . . . . . . . . . . . . . . . . . . . 20  
Unsawn wafer information . . . . . . . . . . . . . . . 22  
13  
Soldering of SMD packages . . . . . . . . . . . . . . 23  
Introduction to soldering . . . . . . . . . . . . . . . . . 23  
Wave and reflow soldering . . . . . . . . . . . . . . . 23  
Wave soldering . . . . . . . . . . . . . . . . . . . . . . . . 23  
Reflow soldering . . . . . . . . . . . . . . . . . . . . . . . 24  
13.1  
13.2  
13.3  
13.4  
14  
Revision history. . . . . . . . . . . . . . . . . . . . . . . . 26  
15  
Legal information. . . . . . . . . . . . . . . . . . . . . . . 27  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 27  
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 27  
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 27  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 27  
15.1  
15.2  
15.3  
15.4  
16  
17  
Contact information. . . . . . . . . . . . . . . . . . . . . 27  
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2008.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 11 November 2008  
Document identifier: PCA2000_2001_5  

相关型号:

PCA2001U/10AB/1,00

PCA2000; PCA2001 - 32 kHz watch circuit with programmable adaptive motor pulse
NXP

PCA2001U/10AC/1

IC STEPPING MOTOR WATCH, UUC8, DIE-8, Clock IC
NXP

PCA2001U/10AC/1,00

PCA2000; PCA2001 - 32 kHz watch circuit with programmable adaptive motor pulse
NXP

PCA2001U/AA

IC STEPPING MOTOR WATCH, UUC8, DIE-8, Clock IC
NXP

PCA2001U/AB

32 kHz watch circuit with programmable adaptive motor pulse
NXP

PCA2001U/AB/1,026

PCA2000; PCA2001 - 32 kHz watch circuit with programmable adaptive motor pulse
NXP

PCA2001U/AC/1

IC STEPPING MOTOR WATCH, UUC8, DIE-8, Clock IC
NXP

PCA2001U/AC/1,026

PCA2000; PCA2001 - 32 kHz watch circuit with programmable adaptive motor pulse
NXP

PCA2001U1

32 kHz watch circuit with programmable adaptive motor pulse
NXP

PCA2001U10AC

32 kHz watch circuit with programmable adaptive motor pulse
NXP

PCA2001UAC

32 kHz watch circuit with programmable adaptive motor pulse
NXP

PCA2002

32 kHz watch circuit with programmable output period and pulse width
NXP