MSM512200-80SJ [OKI]

1,048,576-Word X 2-Bit DYNAMIC RAM : FAST PAGE MODE TYPE; 1,048,576字×2位的动态RAM :快速页面模式类型
MSM512200-80SJ
型号: MSM512200-80SJ
厂家: OKI ELECTRONIC COMPONETS    OKI ELECTRONIC COMPONETS
描述:

1,048,576-Word X 2-Bit DYNAMIC RAM : FAST PAGE MODE TYPE
1,048,576字×2位的动态RAM :快速页面模式类型

存储 内存集成电路 光电二极管 动态存储器
文件: 总17页 (文件大小:472K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
E2G0017-17-42  
This version: Jan. 1998  
Previous version: May 1997  
¡ Semiconductor  
MSM512200/L  
1,048,576-Word ¥ 2-Bit DYNAMIC RAM : FAST PAGE MODE TYPE  
DESCRIPTION  
TheMSM512200/Lisa1,048,576-word¥2-bitdynamicRAMfabricatedinOki'ssilicon-gateCMOS  
technology. The MSM512200/L achieves high integration, high-speed operation, and low-power  
consumption because Oki manufactures the device in a quadruple-layer polysilicon/single-layer  
metalCMOSprocess. TheMSM512200/Lisavailableina26/20-pinplasticSOJor26/20-pinplastic  
TSOP.TheMSM512200L(thelow-powerversion)isspeciallydesignedforlower-powerapplications.  
FEATURES  
• 1,048,576-word ¥ 2-bit configuration  
• Single 5 V power supply, ±10% tolerance  
• Input  
: TTL compatible, low input capacitance  
• Output : TTL compatible, 3-state  
• Refresh : 1024 cycles/16 ms, 1024 cycles/128 ms (L-version)  
• Fast page mode, read modify write capability  
CAS before RAS refresh, hidden refresh, RAS-only refresh capability  
• Multi-bit test mode capability  
• Package options:  
26/20-pin 300 mil plastic SOJ (SOJ26/20-P-300-1.27) (Product : MSM512200/L-xxSJ)  
26/20-pin 300 mil plastic TSOP (TSOPII26/20-P-300-1.27-K) (Product : MSM512200/L-xxTS-K)  
xx indicates speed rank.  
PRODUCT FAMILY  
Access Time (Max.)  
tRAC tAA tCAC tOEA  
60 ns 30 ns 15 ns 15 ns  
70 ns 35 ns 20 ns 20 ns  
80 ns 40 ns 20 ns 20 ns  
Cycle Time  
(Min.)  
Power Dissipation  
Family  
Standby (Max.)  
Operating (Max.)  
MSM512200/L-60  
MSM512200/L-70  
MSM512200/L-80  
110 ns  
130 ns  
150 ns  
440 mW  
385 mW  
330 mW  
5.5 mW/  
0.55 mW (L-version)  
1/17  
¡ Semiconductor  
MSM512200/L  
PIN CONFIGURATION (TOP VIEW)  
DQ1 1  
DQ2 2  
WE 3  
RAS 4  
A9 5  
26 VSS  
25 NC  
DQ1 1  
DQ2 2  
WE 3  
RAS 4  
A9 5  
26 VSS  
25 NC  
24 CAS1  
23 CAS2  
22 OE  
24 CAS1  
23 CAS2  
22 OE  
A0 9  
A1 10  
A2 11  
A3 12  
VCC 13  
18 A8  
17 A7  
16 A6  
15 A5  
14 A4  
A0 9  
A1 10  
A2 11  
A3 12  
VCC 13  
18 A8  
17 A7  
16 A6  
15 A5  
14 A4  
26/20-Pin Plastic TSOP  
(K Type)  
26/20-Pin Plastic SOJ  
Pin Name  
A0 - A9  
RAS  
Function  
Address Input  
Row Address Strobe  
Column Address Strobe  
Data Input/Data Output  
Output Enable  
CAS1, CAS2  
DQ1, DQ2  
OE  
WE  
Write Enable  
VCC  
Power Supply (5 V)  
Ground (0 V)  
VSS  
NC  
No Connection  
2/17  
¡ Semiconductor  
MSM512200/L  
BLOCK DIAGRAM  
Timing  
Generator  
RAS  
Timing  
CAS1  
CAS2  
Generator  
Write  
Clock  
Generator  
Column  
Address  
Buffers  
Column  
Decoders  
WE  
10  
10  
OE  
Output  
Buffers  
2
2
2
Internal  
Address  
Counter  
I/O  
Selector  
Refresh  
Control Clock  
Sense  
Amplifiers  
A0 - A9  
2
2
2
DQ1, DQ2  
Input  
Buffers  
2
Row  
Address  
Buffers  
Row  
De-  
10  
10  
Word  
Drivers  
Memory  
Cells  
coders  
VCC  
On Chip  
BB Generator  
V
VSS  
3/17  
¡ Semiconductor  
MSM512200/L  
ELECTRICAL CHARACTERISTICS  
Absolute Maximum Ratings  
Parameter  
Voltage on Any Pin Relative to VSS  
Short Circuit Output Current  
Power Dissipation  
Symbol  
VT  
Rating  
–1.0 to 7.0  
50  
Unit  
V
IOS  
mA  
W
PD  
*
1
Operating Temperature  
Storage Temperature  
Topr  
Tstg  
0 to 70  
–55 to 150  
°C  
°C  
*: Ta = 25°C  
Recommended Operating Conditions  
(Ta = 0°C to 70°C)  
Parameter  
Power Supply Voltage  
Symbol  
VCC  
Min.  
4.5  
0
Typ.  
5.0  
0
Max.  
5.5  
0
Unit  
V
V
V
V
VSS  
Input High Voltage  
Input Low Voltage  
VIH  
2.4  
–1.0  
6.5  
0.8  
VIL  
Capacitance  
(VCC = 5 V 10ꢀ, Ta = 25°C, f = 1 MHꢁ)  
Parameter  
Symbol  
Typ.  
Max.  
Unit  
Input Capacitance (A0 - A9)  
Input Capacitance  
CIN1  
6
pF  
CIN2  
CI/O  
7
7
pF  
pF  
(RAS, CAS1, CAS2, WE, OE)  
Output Capacitance (DQ1, DQ2)  
4/17  
¡ Semiconductor  
MSM512200/L  
DC Characteristics  
(VCC = 5 V 10ꢀ, Ta = 0°C to 70°C)  
MSM512200 MSM512200 MSM512200  
/L-60 /L-70 /L-80  
Parameter  
Symbol  
Condition  
Unit Note  
Min. Max. Min. Max. Min. Max.  
Output High Voltage  
Output Low Voltage  
VOH IOH = –5.0 mA  
VOL IOL = 4.2 mA  
0 V £ VI £ 6.5 V;  
ILI All other pins not  
under test = 0 V  
DQ disable  
2.4  
0
VCC  
0.4  
2.4  
0
VCC  
0.4  
2.4  
0
VCC  
0.4  
V
V
Input Leakage Current  
–10  
–10  
10  
10  
80  
–10  
–10  
10  
10  
70  
–10  
–10  
10  
10  
60  
mA  
Output Leakage Current ILO  
mA  
0 V £ VO £ 5.5 V  
RAS, CAS1, CAS2  
Average Power  
Supply Current  
(Operating)  
ICC1 cycling,  
mA 1, 2  
tRC = Min.  
RAS, CAS1, CAS2 = VIH  
ICC2 RAS, CAS1, CAS2  
VCC –0.2 V  
2
1
2
1
2
1
Power Supply  
mA  
1
Current (Standby)  
100  
100  
100 mA 1, 5  
Average Power  
RAS cycling,  
Supply Current  
ICC3 CAS1, CAS2 = VIH,  
tRC = Min.  
80  
5
70  
5
60  
5
mA 1, 2  
(RAS-only Refresh)  
RAS = VIH,  
Power Supply  
ICC5 CAS1, CAS2 = VIL,  
DQ = enable  
mA  
1
Current (Standby)  
Average Power  
RAS cycling,  
Supply Current  
ICC6 CAS1, CAS2  
before RAS  
80  
60  
70  
55  
60  
50  
mA 1, 2  
mA 1, 3  
1, 4,  
(CAS before RAS Refresh)  
Average Power  
RAS = VIL,  
Supply Current  
ICC7 CAS1, CAS2 cycling,  
tPC = Min.  
(Fast Page Mode)  
tRC = 125 ms,  
Average Power  
Supply Current  
(Battery Backup)  
CAS1, CAS2  
before RAS,  
tRAS £ 1 ms  
ICC10  
200  
200  
200 mA  
5
Notes : 1. I Max. is specified as I for output open condition.  
CC  
CC  
2. The address can be changed once or less while RAS = V .  
IL  
3. The address can be changed once or less while CAS1, CAS2 = V  
4. V – 0.2 V £ V £ 6.5 V, –1.0 V £ V £ 0.2 V.  
.
IH  
CC  
IH  
IL  
5. L-version.  
5/17  
¡ Semiconductor  
MSM512200/L  
AC Characteristics (1/2)  
(VCC = 5 V 10ꢀ, Ta = 0°C to 70°C) Note 1, 2, 3, 11, 12  
MSM512200 MSM512200 MSM512200  
/L-60  
/L-70  
/L-80  
Parameter  
Symbol  
Unit Note  
Min. Max. Min. Max. Min. Max.  
Random Read or Write Cycle Time  
Read Modify Write Cycle Time  
Fast Page Mode Cycle Time  
Fast Page Mode Read Modify Write  
Cycle Time  
tRC  
tRWC  
tPC  
110  
150  
40  
130  
180  
45  
150  
200  
50  
ns  
ns  
ns  
tPRWC  
80  
95  
100  
ns  
Access Time from RAS  
tRAC  
tCAC  
tAA  
0
60  
15  
30  
35  
15  
15  
15  
50  
16  
128  
0
70  
20  
35  
40  
20  
20  
20  
50  
16  
128  
0
80  
20  
40  
45  
20  
20  
20  
50  
16  
128  
ns 4, 5, 6  
Access Time from CAS  
ns  
ns  
4, 5  
4, 6  
Access Time from Column Address  
Access Time from CAS Precharge  
Access Time from OE  
tCPA  
tOEA  
tCLZ  
ns 4, 14  
ns  
ns  
ns  
ns  
ns  
ms  
ms  
ns  
4
4
7
7
3
Output Low Impedance Time from CAS  
CAS to Data Output Buffer Turn-off Delay Time tOFF  
OE to Data Output Buffer Turn-off Delay Time tOEZ  
0
0
0
0
0
0
Transition Time  
tT  
3
3
3
Refresh Period  
tREF  
tREF  
tRP  
40  
50  
60  
80  
80  
20  
20  
10  
20  
80  
5
Refresh Period (L-version)  
RAS Precharge Time  
RAS Pulse Width  
tRAS  
tRASP  
tRSH  
tROH  
tCP  
60 10,000 70 10,000  
60 100,000 70 100,000  
10,000 ns  
100,000 ns  
RAS Pulse Width (Fast Page Mode)  
RAS Hold Time  
15  
15  
10  
20  
20  
10  
ns  
ns  
ns  
RAS Hold Time referenced to OE  
CAS Precharge Time (Fast Page Mode)  
CAS Pulse Width  
16  
14  
tCAS  
tCSH  
tCRP  
tRHCP  
tRCD  
tRAD  
tASR  
tRAH  
tASC  
tCAH  
tAR  
15 10,000 20 10,000  
10,000 ns  
CAS Hold Time  
60  
5
45  
30  
70  
5
50  
35  
60  
40  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
CAS to RAS Precharge Time  
RAS Hold Time from CAS Precharge  
RAS to CAS Delay Time  
35  
20  
15  
0
40  
20  
15  
0
45  
20  
15  
0
5
6
RAS to Column Address Delay Time  
Row Address Set-up Time  
Row Address Hold Time  
Column Address Set-up Time  
Column Address Hold Time  
Column Address Hold Time from RAS  
Column Address to RAS Lead Time  
10  
0
10  
0
10  
0
13  
13  
15  
50  
30  
15  
55  
35  
15  
60  
40  
tRAL  
6/17  
¡ Semiconductor  
MSM512200/L  
AC Characteristics (2/2)  
(VCC = 5 V 10ꢀ, Ta = 0°C to 70°C) Note 1, 2, 3, 11, 12  
MSM512200 MSM512200 MSM512200  
/L-60  
/L-70  
/L-80  
Parameter  
Symbol  
Unit Note  
Min. Max. Min. Max. Min. Max.  
Read Command Set-up Time  
Read Command Hold Time  
tRCS  
tRCH  
0
0
0
0
ns  
ns 8, 13  
ns  
ns 9, 13  
13  
0
0
Read Command Hold Time referenced to RAS tRRH  
0
0
0
8
Write Command Set-up Time  
Write Command Hold Time  
Write Command Hold Time from RAS  
Write Command Pulse Width  
OE Command Hold Time  
tWCS  
tWCH  
tWCR  
tWP  
0
0
0
13  
10  
45  
10  
15  
15  
15  
0
10  
50  
10  
20  
20  
20  
0
10  
60  
10  
20  
20  
20  
0
ns  
ns  
ns  
ns  
ns  
ns  
tOEH  
tRWL  
tCWL  
tDS  
Write Command to RAS Lead Time  
Write Command to CAS Lead Time  
Data-in Set-up Time  
15  
ns 10, 13  
Data-in Hold Time  
tDH  
15  
50  
15  
35  
50  
80  
55  
5
15  
55  
20  
45  
60  
95  
65  
5
15  
60  
20  
45  
65  
105  
70  
5
ns 10, 13  
Data-in Hold Time from RAS  
OE to Data-in Delay Time  
tDHR  
tOED  
tCWD  
tAWD  
tRWD  
tCPWD  
ns  
ns  
CAS to WE Delay Time  
ns  
ns  
ns  
9
9
9
Column Address to WE Delay Time  
RAS to WE Delay Time  
CAS Precharge WE Delay Time  
ns 9, 14  
13  
13  
14  
CAS Active Delay Time from RAS Precharge tRPC  
RAS to CAS Set-up Time (CAS before RAS) tCSR  
RAS to CAS Hold Time (CAS before RAS) tCHR  
WE to RAS Precharge Time (CAS before RAS) tWRP  
WE Hold Time from RAS (CAS before RAS) tWRH  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
5
5
5
10  
10  
10  
10  
10  
10  
10  
10  
10  
10  
10  
10  
10  
10  
10  
RAS to WE Set-up Time (Test Mode)  
RAS to WE Hold Time (Test Mode)  
tWTS  
tWTH  
7/17  
¡ Semiconductor  
MSM512200/L  
Notes: 1. Astart-up delay of 200 µs is required after power-up, followed by a minimum of eight  
initialization cycles (RAS-only refresh or CAS before RAS refresh) before proper device  
operation is achieved.  
2. The AC characteristics assume t = 5 ns.  
T
3. V (Min.) and V (Max.) are reference levels for measuring input timing signals.  
IH  
IL  
Transition times (t ) are measured between V and V .  
T
IH  
IL  
4. This parameter is measured with a load circuit equivalent to 2 TTL loads and 100 pF.  
5. Operation within the t (Max.) limit ensures that t (Max.) can be met.  
RCD  
RAC  
t
t
(Max.) is specified as a reference point only. If t  
(Max.) limit, then the access time is controlled by t  
is greater than the specified  
RCD  
RCD  
.
RCD  
CAC  
6. Operation within the t  
(Max.) limit ensures that t  
(Max.) can be met.  
RAD  
RAC  
t
t
(Max.) is specified as a reference point only. If t  
(Max.) limit, then the access time is controlled by t  
is greater than the specified  
RAD  
RAD  
OFF  
RAD  
.
AA  
7. t  
(Max.) and t  
(Max.) define the time at which the output achieves the open  
OEZ  
circuit condition and are not referenced to output voltage levels.  
8. t  
9. t  
or t  
must be satisfied for a read cycle.  
RCH  
RRH  
, t  
, t  
, t  
and t  
are not restrictive operating parameters. They are  
WCS CWD RWD AWD  
CPWD  
included in the data sheet as electrical characteristics only. If t  
t  
(Min.), then  
WCS WCS  
the cycle is an early write cycle and the data out will remain open circuit (high  
impedance)throughouttheentirecycle. Ift t (Min.), t t (Min.),  
CWD CWD  
RWD RWD  
t
t  
(Min.) and t  
t  
(Min.), then the cycle is a read modify write  
AWD AWD  
CPWD CPWD  
cycle and data out will contain data read from the selected cell; if neither of the above  
sets of conditions is satisfied, then the condition of the data out (at access time) is  
indeterminate.  
10. These parameters are referenced to the CAS leading edge in an early write cycle, and  
to the WE leading edge in an OE control write cycle, or a read modify write cycle.  
11. The test mode is initiated by performing a WE and CAS before RAS refresh cycle.  
This mode is latched and remains in effect until the exit cycle is generated.  
The test mode specified in this data sheet is a 2-bit parallel test function. CA0 is not  
used. In a read cycle, if all internal bits are equal, the DQ pin will indicate a high  
level. If any internal bits are not equal, the DQ pin will indicate a low level.  
The test mode is cleared and the memory device returned to its normal operating  
state by performing a RAS-only refresh cycle or a CAS before RAS refresh cycle.  
12. In a test mode read cycle, the value of access time parameters is delayed for 5 ns for the  
specifiedvalue.Theseparametersshouldbespecifiedintestmodecyclebyaddingthe  
above value to the specified value in this data sheet.  
13. These parameters are determined by the falling edge of either CAS1 or CAS2,  
whichever is earlier.  
14. These parameters are determined by the rising edge of either CAS1 or CAS2,  
whichever is later.  
15. t  
, t  
and t should be satisfied by both CAS1 and CAS2.  
CWL DH DS  
16. t is determined by the time both CAS1 and CAS2 are high.  
CP  
8/17  
¡ Semiconductor  
MSM512200/L  
Notes concerning CAS1 and CAS2 control  
Overlap the active-low timings of CAS1 and CAS2. Skew between CAS1 and CAS2 is allowed  
under the following conditions:  
(1) The timing specification for CAS1 and CAS2 should be met individually.  
(2) Different operation modes for CAS1/CAS2 are not allowed (as shown below).  
RAS  
CAS1  
CAS2  
WE  
Delayed write  
Early write  
(3) Closely separated CAS1/CAS2 control is not allowed. However, when the condition  
(t t ) is satisfied, fast page mode can be performed.  
CP  
UL  
RAS  
CAS1  
CAS2  
tUL  
9/17  
E2G0094-17-41G  
¡ Semiconductor  
MSM512200/L  
TIMING WAVEFORM  
Read Cycle  
tRC  
tRP  
tRAS  
VIH  
VIL  
tAR  
tCRP  
RAS  
tCSH  
tCRP  
tRCD  
tRSH  
tCAS  
VIH  
VIL  
CAS  
tRAD  
tASC  
tASR  
Row  
tRAH  
tRAL  
tCAH  
Column  
VIH  
VIL  
Address  
tRCH  
tRCS  
tRRH  
VIH  
VIL  
tAA  
WE  
OE  
tROH  
tOEA  
VIH  
VIL  
tOFF  
tCAC  
tRAC  
tOEZ  
VOH  
VOL  
DQ  
Open  
Valid Data-out  
tCLZ  
"H" or "L"  
Write Cycle (Early Write)  
tRC  
tRP  
tRAS  
VIH  
VIL  
tAR  
tCRP  
RAS  
CAS  
tCSH  
tCRP  
tRCD  
tRAD  
tRAH  
tASC  
tRSH  
tCAS  
VIH  
VIL  
tRAL  
tASR  
Row  
tCAH  
Column  
tWCH  
VIH  
VIL  
Address  
tWCS  
tCWL  
VIH  
VIL  
tWP  
WE  
tRWL  
tWCR  
VIH  
VIL  
OE  
tDHR  
tDS  
tDH  
VIH  
VIL  
DQ  
Open  
Valid Data-in  
"H" or "L"  
10/17  
¡ Semiconductor  
MSM512200/L  
Read Modify Write Cycle  
tRWC  
tRAS  
tRP  
VIH  
VIL  
tAR  
RAS  
CAS  
tCRP  
tCSH  
tCRP  
tRCD  
tRSH  
tCAS  
VIH  
VIL  
tRAH  
tASC  
tASR  
tCAH  
Column  
VIH  
VIL  
Row  
Address  
tCWL  
tRWL  
tWP  
tCWD  
tAWD  
tRAD  
tRWD  
tOEA  
VIH  
VIL  
tAA  
WE  
OE  
tRCS  
VIH  
VIL  
tOED  
tOEZ  
tOEH  
tDH  
tCAC  
tDS  
tRAC  
VI/OH  
Valid  
Data-out  
Valid  
Data-in  
DQ  
tCLZ  
VI/OL  
"H" or "L"  
11/17  
¡ Semiconductor  
MSM512200/L  
Fast Page Mode Read Cycle  
tRASP  
tRP  
tAR  
tRCD  
tRAD  
tRAH tASC  
tRHCP  
VIH  
VIL  
RAS  
CAS  
tCRP  
tPC  
tRSH  
tCRP  
tCP  
tCP  
tCAS  
tCAS  
tCAS  
tRAL  
VIH  
VIL  
tCSH  
tCAH  
tASR  
Row  
tASC  
tCAH  
tASC tCAH  
VIH  
VIL  
Column  
Column  
Column  
tRCS  
Address  
tRCH  
tRCS  
tRCS  
tRCH  
tRCH  
VIH  
VIL  
WE  
tAA  
tAA  
tAA  
tRRH  
tCPA  
tCPA  
tOEA  
tOEA  
tOEA  
VIH  
VIL  
OE  
tOFF  
tOEZ  
tOFF  
tOEZ  
tCAC  
tCLZ  
tCAC  
tCLZ  
tOFF  
tCAC  
tRAC  
tOEZ  
VOH  
VOL  
Valid  
Data-out  
Valid  
Data-out  
Valid  
Data-out  
DQ  
tCLZ  
"H" or "L"  
Fast Page Mode Write Cycle (Early Write)  
tRASP  
tPC  
tRP  
tAR  
tRHCP  
VIH  
VIL  
RAS  
CAS  
tCRP  
tRSH  
tCAS  
tRAL  
tCRP  
tRCD  
tCP  
tCP  
tCAS  
tCAS  
tCAH  
Column  
VIH  
VIL  
tCSH  
tCAH  
tASR  
Row  
tASC  
tASC  
tASC  
tRAH  
tCAH  
VIH  
VIL  
Column  
tCWL  
tWCH  
tWP  
Column  
Address  
tRAD  
tWCS  
tCWL  
tWCH  
tWP  
tRWL  
tCWL  
tWCH  
tWP  
tWCS  
tWCS  
VIH  
VIL  
WE  
tWCR  
tDS  
tDS  
tDS  
tDH  
tDH  
tDH  
VIH  
VIL  
Valid  
Data-in  
Valid  
Data-in  
Valid Data-in  
tDHR  
DQ  
Note: OE = "H" or "L"  
"H" or "L"  
12/17  
¡ Semiconductor  
MSM512200/L  
Fast Page Mode Read Modify Write Cycle  
tRASP  
VIH  
VIL  
tAR  
RAS  
CAS  
tRP  
tCSH  
tPRWC  
tCAS  
tRSH  
tCAS  
tCRP  
tCP  
tCP  
tRCD  
tCAS  
VIH  
VIL  
tRAD  
tRAH  
tASC  
tCAH  
tASC  
tRAL  
tCAH  
tCAH  
tASR  
tASC  
VIH  
VIL  
Column  
tRWD  
Column  
tRCS  
Column  
Address  
Row  
tRCS  
tCPWD  
tCPWD  
tCWD  
tRWL  
tCWL  
tCWD  
tCWD  
tRCS  
tCWL  
tCWL  
VIH  
VIL  
WE  
tAWD  
tAWD  
tAWD  
tROH  
tWP  
tWP  
tDH  
tWP  
tDH  
tDH  
tDS  
tDS  
tDS  
tRAC  
tCPA  
tAA  
tCPA  
tAA  
tAA  
tOEA  
tOEA  
tOEA  
tOED  
tOED  
tOED  
VIH  
VIL  
OE  
tOEZ  
tOEZ  
tOEZ  
tCAC  
tCAC  
tCAC  
VI/OH  
DQ  
Out  
In  
Out  
In  
Out  
In  
VI/OL  
tCLZ  
tCLZ  
tCLZ  
"H" or "L"  
RAS-Only Refresh Cycle  
tRC  
tRP  
tRAS  
VIH  
VIL  
RAS  
CAS  
tCRP  
tRPC  
VIH  
VIL  
tASR tRAH  
VIH  
VIL  
Address  
DQ  
Row  
tOFF  
VOH  
VOL  
Open  
Note: WE, OE = "H" or "L"  
"H" or "L"  
13/17  
¡ Semiconductor  
MSM512200/L  
CAS before RAS Refresh Cycle  
tRC  
tRP  
tRP  
tRAS  
VIH  
VIL  
RAS  
CAS  
tRPC  
tRPC  
tCP  
tCSR  
tCHR  
VIH  
VIL  
tWRP  
tWRP  
tWRH  
VIH  
VIL  
WE  
tOFF  
VOH  
VOL  
DQ  
Open  
Note: OE, Address = "H" or "L"  
"H" or "L"  
Hidden Refresh Read Cycle  
tRC  
tRC  
tRAS  
tRAS  
tRP  
tRP  
VIH  
VIL  
tAR  
tRCD  
RAS  
tCRP  
tRSH  
tCHR  
VIH  
VIL  
tRAD  
tASC  
tRAH  
CAS  
tCAH  
tASR  
VIH  
VIL  
Address  
Row  
Column  
tRCS  
tRRH  
tRAL  
VIH  
VIL  
tAA  
WE  
OE  
tROH  
tOEA  
VIH  
VIL  
tCAC  
tCLZ  
tOFF  
tRAC  
tOEZ  
VOH  
VOL  
DQ  
Valid Data-out  
"H" or "L"  
14/17  
¡ Semiconductor  
MSM512200/L  
Hidden Refresh Write Cycle  
tRC  
tRC  
tRAS  
tRAS  
tRP  
tRP  
tAR  
tRCD  
VIH  
VIL  
RAS  
tCRP  
tRSH  
tCHR  
VIH  
VIL  
tRAD  
tASC  
CAS  
tCAH  
Column  
tASR  
Row  
tRAH  
tRAL  
VIH  
VIL  
Address  
tWRP  
tWRH  
tWCS  
tWCH  
tWP  
VIH  
VIL  
WE  
OE  
VIH  
VIL  
tDS  
tDH  
VIH  
VIL  
Valid Data-in  
tDHR  
DQ  
"H" or "L"  
Test Mode Initiate Cycle  
tRC  
tRAS  
tRP  
VIH  
VIL  
RAS  
tRPC  
tCP  
tCSR  
tCHR  
VIH  
VIL  
CAS  
WE  
tWTS  
tWTH  
VIH  
VIL  
tOFF  
VOH  
VOL  
DQ  
Open  
Note: OE, Address = "H" or "L"  
"H" or "L"  
15/17  
¡ Semiconductor  
PACKAGE DIMENSIONS  
SOJ26/20-P-300-1.27  
MSM512200/L  
(Unit : mm)  
Mirror finish  
Package material  
Lead frame material  
Pin treatment  
Solder plate thickness  
Package weight (g)  
Epoxy resin  
42 alloy  
Solder plating  
5 mm or more  
0.80 TYP.  
Notes for Mounting the Surface Mount Type Package  
The SOP, QFP, TSOP, SOJ, QFJ (PLCC), SHP and BGA are surface mount type packages, which  
are very susceptible to heat in reflow mounting and humidity absorbed in storage.  
Therefore, before you perform reflow mounting, contact Oki’s responsible sales person for the  
product name, package name, pin number, package code and desired mounting conditions  
(reflow method, temperature and times).  
16/17  
¡ Semiconductor  
MSM512200/L  
(Unit : mm)  
TSOPII26/20-P-300-1.27-K  
Mirror finish  
Package material  
Lead frame material  
Pin treatment  
Solder plate thickness  
Package weight (g)  
Epoxy resin  
42 alloy  
Solder plating  
5 mm or more  
0.38 TYP.  
Notes for Mounting the Surface Mount Type Package  
The SOP, QFP, TSOP, SOJ, QFJ (PLCC), SHP and BGA are surface mount type packages, which  
are very susceptible to heat in reflow mounting and humidity absorbed in storage.  
Therefore, before you perform reflow mounting, contact Oki’s responsible sales person for the  
product name, package name, pin number, package code and desired mounting conditions  
(reflow method, temperature and times).  
17/17  

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