ESDM1131MX4T5G [ONSEMI]
微型封装二极管,用于 ESD 防护;型号: | ESDM1131MX4T5G |
厂家: | ONSEMI |
描述: | 微型封装二极管,用于 ESD 防护 二极管 |
文件: | 总7页 (文件大小:312K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
ESDM1131
3.3 V ESD Protection
Diodes
Micro−packaged Diodes for ESD
Protection
www.onsemi.com
The ESD1131 is designed to protect voltage sensitive components
from ESD. Excellent clamping capability, low leakage, and fast
response time provide best in class protection on designs that are
exposed to ESD. Because of its small size, it is suited for use in
smartphone, smart-watch, or many other portable / wearable
applications where board space comes at a premium.
MARKING
DIAGRAM
X4DFN2
CASE 718AA
A
Features
A = Specific Device Code
• Low Capacitance (4 pF, I/O to GND)
• Small Body Outline Dimensions
♦ 01005 Size: 0.445 x 0.240 mm
• Protection for the Following IEC Standards:
IEC 61000−4−2 (Level 4)
PIN CONFIGURATION
AND SCHEMATIC
• Low ESD Clamping Voltage
1
2
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
=
Rating
Symbol
Value
−55 to +125
−55 to +150
260
Unit
°C
Operating Junction Temperature Range
Storage Temperature Range
T
J
T
stg
°C
Lead Solder Temperature −
Maximum (10 Seconds)
T
L
°C
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
IEC 61000−4−2 Contact (ESD)
IEC 61000−4−2 Air (ESD)
ESD
ESD
16
16
kV
kV
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
See Application Note AND8308/D for further description of
survivability specs.
© Semiconductor Components Industries, LLC, 2017
1
Publication Order Number:
March, 2018 − Rev. 1
ESDM1131/D
ESDM1131
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise specified)
A
Parameter
Symbol
Conditions
Min
Typ
Max
3.3
6.0
0.1
Unit
V
Reverse Working Voltage
Breakdown Voltage
V
RWM
I/O Pin to GND
I = 1 mA, I/O Pin to GND
V
BR
4.0
5.0
V
T
Reverse Leakage Current
Clamping Voltage
I
R
V
RWM
= 3.3 V, I/O Pin to GND
mA
V
V
C
I
= 4 A, (8x20 ms pulse)
5.6
5.5
PP
PP
Clamping Voltage
TLP (Note 1)
V
C
V
I
= 8 A
IEC 61000−4−2 Level 2 equivalent
( 4 kV Contact, 4 kV Air)
I
PP
= 16 A
7.0
IEC 61000−4−2 Level 2 equivalent
( 8 kV Contact, 15 kV Air)
Junction Capacitance
C
V
R
= 0 V, f = 1 MHz
4.0
pF
J
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
1. ANSI/ESD STM5.5.1 − Electrostatic Discharge Sensitivity Testing using Transmission Line Pulse (TLP) Model.
TLP conditions: Z = 50 W, t = 100 ns, t = 4 ns, averaging window; t = 30 ns to t = 60 ns.
0
p
r
1
2
ORDERING INFORMATION
Device
†
Package
Shipping
ESDM1131MX4T5G
X4DFN2
(Pb−Free)
10,000 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
www.onsemi.com
2
ESDM1131
TYPICAL CHARACTERISTICS
1E−03
1E−04
1E−05
1E−06
1E−07
1E−08
1E−09
1E−10
1E−11
10
9
8
7
6
5
4
3
2
1
0
1E−12
1E−13
−3.5 −2.5
−1.5
−0.5
0.5
(V)
1.5
2.5
3.5
−6 −5 −4 −3 −2 −1
0
1
2
3
4
5
6
V
BIAS
V (V)
R
Figure 1. CV Characteristics
Figure 2. Reverse Leakage Current
2
0
10
9
8
7
6
5
4
3
2
−2
−4
−6
−8
1
0
−10
1.E+07
1.E+08
1.E+09
0.5
1.0
1.5
2.0
2.5
3.0
FREQUENCY (Hz)
FREQUENCY (GHz)
Figure 4. Capacitance over Frequency
Figure 3. S21 Insertion Loss
www.onsemi.com
3
ESDM1131
TYPICAL CHARACTERISTICS
20
18
−20
−18
16
14
12
10
8
−16
−14
−12
−10
−8
6
−6
4
−4
2
0
−2
0
0
2
4
6
8
10 12 14 16 18 20
0
2
4
6
8
10 12 14 16 18 20
V , VOLTAGE (V)
C
V , VOLTAGE (V)
C
Figure 5. Positive TLP I−V Curve
Figure 6. Negative TLP I−V Curve
30
25
20
15
−30
−25
−20
−15
10
5
−10
−5
0
0
−10
10
30
50
70
90
110
130
150
−10
10
30
50
70
90
110
130
150
TIME (ns)
TIME (ns)
Figure 7. Positive 8 kV ESD Contact Discharge
Figure 8. Negative 8 kV ESD Contact Discharge
www.onsemi.com
4
ESDM1131
IEC61000−4−2 Waveform
IEC 61000−4−2 Spec.
I
peak
First Peak
Current
(A)
100%
90%
Test Volt-
age (kV)
Current at
30 ns (A)
Current at
60 ns (A)
Level
1
2
3
4
2
4
6
8
7.5
15
4
8
2
4
6
8
I @ 30 ns
22.5
30
12
16
I @ 60 ns
10%
t
P
= 0.7 ns to 1 ns
Figure 9. IEC61000−4−2 Spec
50 W Coax
Cable
Transmission Line Pulse (TLP) Measurement
L
Attenuator
S
Transmission Line Pulse (TLP) provides current versus
voltage (I−V) curves in which each data point is obtained
from a 100 ns long rectangular pulse from a charged
transmission line. A simplified schematic of a typical TLP
system is shown in Figure 10. TLP I−V curves of ESD
protection devices accurately demonstrate the product’s
ESD capability because the 10s of amps current levels and
under 100 ns time scale match those of an ESD event. This
is illustrated in Figure 11 where an 8 kV IEC 61000−4−2
current waveform is compared with TLP current pulses at
8 A and 16 A. A TLP I−V curve shows the voltage at which
the device turns on as well as how well the device clamps
voltage over a range of current levels.
÷
50 W Coax
Cable
I
M
V
M
10 MW
DUT
V
C
Oscilloscope
Figure 10. Simplified Schematic of a Typical TLP
System
Figure 11. Comparison Between 8 kV IEC 61000−4−2 and 8 A and 16 A TLP Waveforms
www.onsemi.com
5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
X4DFN2, 0.445x0.24, 0.27P
CASE 718AA
ISSUE A
DATE 21 MAR 2017
SCALE 10:1
A
B
D
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. EXPOSED COPPER ALLOWED AS SHOWN.
MILLIMETERS
PIN 1
REFERENCE
DIM MIN
NOM MAX
E
A
A1
b
D
E
e
0.15
−−−
0.18
0.21
0.03
TOP VIEW
−−−
0.170 0.185 0.200
0.415 0.445 0.475
0.210 0.240 0.270
0.270 BSC
A
0.03
0.03
C
C
L
0.105 0.120 0.135
A1
SEATING
PLANE
GENERIC
MARKING DIAGRAMS*
C
SIDE VIEW
X
X
e
e/2
2X b
2
X
= Specific Device Code
PIN 1
2X L
*This information is generic. Please refer to
device data sheet for actual part marking.
Some products may not follow the Generic
Marking.
0.10 C A B
NOTE 3
0.05 C
BOTTOM VIEW
RECOMMENDED
MOUNTING FOOTPRINT*
2X
0.21
0.27
PITCH
1
2X
0.13
DIMENSIONS: MILLIMETERS
See Application Note AND8398/D for more mounting details
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
DOCUMENT NUMBER:
DESCRIPTION:
98AON29067G
X4DFN2, 0.445X0.24, 0.27P
PAGE 1 OF 1
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