FCH085N80-F155 [ONSEMI]
功率 MOSFET,N 沟道,SUPERFET® II,800 V,46 A,85 mΩ,TO-247;型号: | FCH085N80-F155 |
厂家: | ONSEMI |
描述: | 功率 MOSFET,N 沟道,SUPERFET® II,800 V,46 A,85 mΩ,TO-247 |
文件: | 总10页 (文件大小:567K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
MOSFET – N-Channel,
SUPERFET) II
800 V, 46 A, 85 mW
FCH085N80
Description
SuperFET II MOSFET is ON Semiconductor’s brand−new high
voltage super−junction (SJ) MOSFET family that is utilizing charge
balance technology for outstanding low on−resistance and lower gate
charge performance. This technology is tailored to minimize
conduction loss, provide superior switching performance, dv/dt rate
and higher avalanche energy. Consequently, SuperFET II MOSFET is
very suitable for the switching power applications such as PFC,
server/telecom power, FPD TV power, ATX power and industrial
power applications.
www.onsemi.com
V
R
MAX
I MAX
D
DS
DS(ON)
800 V
85 mW @ 10 V
46 A
D
Features
• Typ. R
= 67 mW
• 850 V @ T = 150°C
DS(on)
J
G
• Ultra Low Gate Charge (Typ. Q = 196 nC)
g
• Low E
(Typ. 18 mJ @ 400 V)
OSS
S
• Low Effective Output Capacitance (Typ. C
• 100% Avalanche Tested
= 568 pF)
oss(eff.)
N-CHANNEL MOSFET
• These Devices are Pb−Free and are RoHS Compliant
Applications
• AC−DC Power Supply
• LED Lighting
TO−247−3LD
CASE 340CH
MARKING DIAGRAM
FCH085N80
AYWWG
FCH085N80 = Specific Device Code
A
Y
= Assembly Location
= Year
WW
G
= Work Week
= Pb−Free Package
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2016
1
Publication Order Number:
November, 2019 − Rev. 3
FCH085N80/D
FCH085N80
ABSOLUTE MAXIMUM RATINGS (T = 25°C unless otherwise noted)
C
Symbol
Parameter
Value
800
Unit
V
V
DSS
V
GSS
Drain to Source Voltage
Gate to Source Voltage
− DC
20
V
− AC (f > 1 Hz)
30
I
D
Drain Current:
− Continuous (T = 25°C)
46
A
C
− Continuous (T = 100°C)
29
C
I
Drain Current:
− Pulsed (Note 1)
138
A
mJ
A
DM
E
Single Pulsed Avalanche Energy (Note 2)
Avalanche Current (Note 2)
Repetitive Avalanche Energy (Note 1)
MOSFET dv/dt
1701
9.2
AS
AS
I
E
4.4
mJ
V/ns
AR
dv/dt
100
Peak Diode Recovery dv/dt (Note 3)
Power Dissipation
20
P
(T = 25°C)
446
W
W/°C
°C
D
C
Derate Above 25°C
3.5
T , T
Operating and Storage Temperature Range
−55 to + 150
300
J
STG
T
Maximum Lead Temperature for Soldering, 1/8″ from Case for 5 seconds
°C
L
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Repetitive rating: pulse−width limited by maximum junction temperature.
2. I = 9.2 A, V = 50 V, R = 25 W, starting T = 25 °C.
AS
DD
G
J
3. I ≤ 46 A, di/dt ≤ 200 A/ms, V ≤ BV
, starting T = 25 °C.
J
SD
DD
DSS
PACKAGE MARKING AND ORDERING INFORMATION
Part Number
Top Marking
Package
Packing Method
Reel Size
Tape Width
Quantity
FCH085N80−F155
FCH085N80
TO−247 G03
Tube
N/A
N/A
30 Units
THERMAL CHARACTERISTICS
Symbol
Parameter
FCH085N80−F155
Unit
Thermal Resistance, Junction to Case, Max.
Thermal Resistance, Junction to Ambient, Max.
0.28
40.0
°C/W
R
q
JC
JA
R
q
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2
FCH085N80
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise noted)
C
Symbol
Parameter
Test Condition
Min.
Typ.
Max.
Unit
OFF CHARACTERISTICS
BV
Drain to Source Breakdown Voltage
V
= 0 V, I = 1 mA, T = 25°C
800
−
−
−
V
DSS
GS
D
J
DBV
/DT
Breakdown Voltage Temperature
Coefficient
I
D
= 1 mA, Referenced to 25°C
−
0.8
V/°C
DSS
J
I
Zero Gate Voltage Drain Current
V
DS
V
DS
V
GS
= 800 V, V = 0 V
−
−
−
−
−
−
25
mA
DSS
GS
= 640 V, V = 0 V, T = 125 °C
250
100
GS
C
I
Gate to Body Leakage Current
=
20 V, V = 0 V
nA
GSS
DS
ON CHARACTERISTICS
V
Gate Threshold Voltage
V
GS
V
GS
V
DS
= V , I = 4.6 mA
2.5
−
−
4.5
85
−
V
mW
S
GS(th)
DS(on)
DS
D
R
Static Drain to Source On Resistance
Forward Transconductance
= 10 V, I = 23 A
67
55
D
g
FS
= 20 V, I = 23 A
−
D
DYNAMIC CHARACTERISTICS
C
Input Capacitance
V
= 100 V, V = 0 V, f = 1 MHz
−
−
−
−
−
−
−
−
−
8140
255
10
10825
pF
pF
pF
pF
pF
nC
nC
nC
W
iss
oss
rss
oss
DS
GS
C
C
C
Output Capacitance
340
−
Reverse Transfer Capacitance
Output Capacitance
V
DS
V
DS
V
DS
= 480 V, V = 0 V, f = 1 MHz
1000
728
196
40
−
GS
C
Effective Output Capacitance
Total Gate Charge at 10 V
Gate to Source Gate Charge
Gate to Drain “Miller” Charge
Equivalent Series Resistance
= 0 V to 480 V, V = 0 V
−
oss(eff.)
GS
Q
= 640 V, I = 46 A V = 10 V
255
−
g(tot)
D
,
GS
(Note 4)
Q
gs
Q
72
−
gd
ESR
f = 1 MHz
0.8
−
SWITCHING CHARACTERISTICS
t
Turn-On Delay Time
Turn−On Rise Time
Turn-Off Delay Time
Turn−Off Fall Time
V
V
= 400 V, I = 46 A,
−
−
−
−
45
55
100
120
330
80
ns
ns
ns
ns
d(on)
DD
GS
D
= 10 V, R = 4.7 W
g
t
r
(Note 4)
t
160
35
d(off)
t
f
DRAIN-SOURCE DIODE CHARACTERISTICS
I
Maximum Continuous Source to Drain Diode Forward Current
Maximum Pulsed Drain to Source Diode Forward Current
−
−
−
−
−
−
−
46
138
1.2
−
A
A
S
I
SM
V
SD
Drain to Source Diode Forward Voltage
Reverse Recovery Time
V
V
= 0 V, I = 46 A
−
V
GS
SD
t
rr
= 0 V, I = 46 A,
800
32
ns
mC
GS
SD
di /dt = 100 A/ms
F
Q
Reverse Recovery Charge
−
rr
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
4. Essentially independent of operating temperature typical characteristics.
www.onsemi.com
3
FCH085N80
TYPICAL CHARACTERISTICS
Figure 2. Transfer Characteristics
Figure 1. On−Region Characteristics
Figure 4. Body Diode Forward Voltage Variation
vs. Source Current and Temperature
Figure 3. On−Resistance Variation vs. Drain
Current and Gate Voltage
Figure 6. Gate Charge Characteristics
Figure 5. Capacitance Characteristics
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4
FCH085N80
TYPICAL CHARACTERISTICS
Figure 7. Breakdown Voltage Variation vs.
Figure 8. On−Resistance Variation vs.
Temperature
Temperature
Figure 10. Maximum Drain Current vs. Case
Temperature
Figure 9. Maximum Safe Operating Area
Figure 11. Eoss vs. Drain to Source Voltage
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5
FCH085N80
TYPICAL CHARACTERISTICS
Figure 12. Transient Thermal Response Curve
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6
FCH085N80
V
GS
R
Q
g
L
V
DS
Q
Q
gs
gd
V
GS
DUT
I
G
= Const.
Charge
Figure 13. Gate Charge Test Circuit & Waveform
R
L
V
DS
GS
90%
90%
10%
90%
V
DS
V
DD
V
GS
R
G
10%
V
DUT
V
GS
t
r
t
f
t
t
d(off)
d(on)
t
on
t
off
Figure 14. Resistive Switching Test Circuit & Waveforms
L
2
1
2
EAS
+
@ LIAS
V
DS
BV
DSS
I
D
I
AS
R
G
V
DD
I (t)
D
DUT
V
DD
V
GS
V
DS
(t)
t
p
Time
t
p
Figure 15. Unclamped Inductive Switching Test Circuit & Waveforms
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7
FCH085N80
+
DUT
V
SD
−
I
SD
L
Driver
R
G
Same Type
as DUT
V
DD
V
GS
− dv/dt controlled by R
G
− I controlled by pulse period
SD
Gate Pulse Width
D +
Gate Pulse Period
V
GS
10 V
(Driver)
I
, Body Diode Forward Current
FM
I
di/dt
SD
(DUT)
I
RM
Body Diode Reverse Current
Body Diode Recovery dv/dt
V
DS
V
DD
V
SD
(DUT)
Body Diode
Forward Voltage Drop
Figure 16. Peak Diode Recovery dv/dt Test Circuit & Waveforms
SUPERFET is a registered trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or
other countries.
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8
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
TO−247−3LD
CASE 340CH
ISSUE A
DATE 09 OCT 2019
GENERIC
MARKING DIAGRAM*
XXXXXXXXX
AYWWG
XXXX = Specific Device Code
A
Y
= Assembly Location
= Year
WW = Work Week
G
= Pb−Free Package
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “G”, may
or may not be present. Some products may
not follow the Generic Marking.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
DOCUMENT NUMBER:
DESCRIPTION:
98AON13853G
TO−247−3LD
PAGE 1 OF 1
ON Semiconductor and
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