FCPF2250N80Z [ONSEMI]

N 沟道 SuperFET® II MOSFET 800 V, 2.6 A, 2.25 Ω;
FCPF2250N80Z
型号: FCPF2250N80Z
厂家: ONSEMI    ONSEMI
描述:

N 沟道 SuperFET® II MOSFET 800 V, 2.6 A, 2.25 Ω

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2015 8 月  
FCPF2250N80Z  
®
N- 沟道 SuperFET II MOSFET  
800 V, 3.5 A, 2.25  
特性  
描述  
SuperFET® II MOSFET 是飞兆利用电荷平衡技术实现出色的低  
导通电阻和更低栅极电荷性能的全新高压超级结 (SJ) MOSFET  
系列产品。这项技术专用于最小化导通损耗并提供卓越的开关性  
能、dv/dt 额定值和更高雪崩能量此,SuperFET II MOSFET  
非常适合开关电源应用音频记本电源适配器ATX  
电源及工业电源应用。  
RDS(on) = 1.8 (Typ.)  
超低栅极电荷 (典型值 Qg = 11 nC)  
Eoss (典型值 1.1 uJ @ 400 V)  
低有效输出电容 (典型值 Coss(eff.)= 51 pF)  
100% 经过雪崩测试  
符合 RoHS 标准  
增强的 ESD 能力  
应用  
AC-DC 电源  
LED 照明  
D
G
G
D
S
TO-220F  
S
最大绝对额定值 TC = 25°C 除非另有说明。  
FCPF2250N80Z  
符号  
参数  
单位  
VDSS  
VGSS  
800  
±20  
V
漏极-源极电压  
栅极-源极电压  
- DC  
V
A
- AC  
(f > 1 Hz)  
±30  
3.5*  
- 连续 (TC = 25°C)  
- 连续 (TC = 100°C)  
- 脉冲  
ID  
漏极电流  
2.2*  
IDM  
EAS  
IAR  
6.5*  
A
mJ  
A
漏极电流  
(注 1)  
(注 2)  
(注 1)  
(注 1)  
21.6  
0.52  
0.22  
100  
单脉冲雪崩能量  
雪崩电流  
EAR  
mJ  
重复雪崩能量  
MOSFET dv/dt  
dv/dt  
PD  
V/ns  
20  
二极管恢复 dv/dt 峰值  
(注 3)  
(TC = 25°C)  
21.9  
0.18  
-55 to +150  
300  
W/°C  
°C  
功耗  
- 高于 25°C 的功耗系数  
TJ, TSTG  
TL  
工作和存储温度范围  
°C  
用于焊接的最大引脚温度,距离外壳 1/8”,持续 5 秒  
* 漏极电流由最高结温的限制,与散热片  
热性能  
FCPF2250N80Z  
符号  
参数  
单位  
RθJC  
RθJA  
5.7  
结至外壳热阻最大值  
结至环境热阻最大值  
oC/W  
62.5  
www.fairchildsemi.com  
1
© 2014 飞兆半导体公司  
FCPF2250N80ZRev. 1.1  
封装标识与定购信息  
器件编号  
顶标  
FCPF2250N80Z  
封装  
包装方法  
塑料管  
卷尺寸  
不适用  
带宽  
数量  
FCPF2250N80Z  
TO-220F  
不适用  
50 个  
电气特性 TC = 25C 除非另有说明。  
符号  
参数  
测试条件  
最小值 典型值 最大值  
单位  
关断特性  
BVDSS  
VGS = 0 V, ID = 1 mA, TJ = 25°C  
800  
-
-
-
-
V
漏极-源极击穿电压  
BVDSS  
/ TJ  
击穿电压温度系数  
0.85  
V/°C  
ID=1 mA,参考 25°C 数值  
V
DS = 800 V, VGS = 0 V  
-
-
-
-
-
-
25  
IDSS  
IGSS  
μA  
μA  
零栅极电压漏极电流  
栅极-体漏电流  
VDS = 640 V, VGS = 0 V,TC = 125°C  
VGS = ±20 V, VDS = 0 V  
250  
±10  
导通特性  
VGS(th)  
RDS(on)  
gFS  
VGS = VDS, ID = 0.26 mA  
VGS = 10 V, ID = 1.3 A  
VDS = 20 V, ID = 1.3 A  
2.5  
-
4.5  
2.25  
-
V
S
栅极阈值电压  
-
-
1.8  
2.28  
漏极至源极静态导通电阻  
正向跨导  
动态特性  
Ciss  
-
-
-
-
-
-
-
-
-
440  
16  
585  
pF  
pF  
pF  
pF  
pF  
nC  
nC  
nC  
输入电容  
VDS = 100 V, VGS = 0 V,  
f = 1 MHz  
Coss  
22  
-
输出电容  
Crss  
0.75  
8.4  
51  
反向传输电容  
输出电容  
Coss  
VDS = 480 V, VGS = 0 V, f = 1 MHz  
VDS = 0 V 480 V, VGS = 0 V  
VDS = 640 V, ID = 2.6 A,  
-
Coss(eff.)  
Qg(tot)  
Qgs  
-
有效输出电容  
10 V 的栅极电荷总量  
栅极-源极栅极电荷  
栅极-漏极 米勒 电荷  
等效串联电阻  
11  
14  
-
2.2  
4.3  
2.8  
V
GS = 10 V  
(注 4)  
Qgd  
-
ESR  
f = 1 MHz  
-
开关特性  
td(on)  
tr  
td(off)  
tf  
-
-
-
-
11  
6.7  
26  
32  
23  
62  
27  
ns  
ns  
ns  
ns  
导通延迟时间  
开通上升时间  
关断延迟时间  
关断下降时间  
VDD = 400 V, ID = 2.6 A,  
VGS = 10 V, Rg = 4.7 Ω  
8.7  
(注 4)  
漏极-源极二极管特性  
IS  
-
-
-
-
-
-
-
3.5  
6.5  
1.2  
-
A
A
漏极-源极二极管最大正向连续电流  
漏极-源极二极管最大正向脉冲电流  
漏极-源极二极管正向电压  
反向恢复时间  
ISM  
VSD  
trr  
VGS = 0 V, ISD = 2.6 A  
-
V
260  
2.2  
ns  
μC  
VGS = 0 V, ISD = 2.6 A,  
dIF/dt = 100 A/μs  
Qrr  
注:  
-
反向恢复电荷  
1. 重复额定值:脉冲宽度受限于最大结温。  
2. I = 0.52 A, R = 25 , starting T = 25°C  
AS  
G
J
3. I 3.5 A, di/dt 200 A/μs, V BV  
, 开始于 T = 25°C  
J
SD  
DD  
DSS  
4. 本质上独立于工作温度的典型特性。  
www.fairchildsemi.com  
2
© 2014 飞兆半导体公司  
FCPF2250N80ZRev. 1.1  
典型性能特征  
1. 导通区域特性  
2. 传输特性  
10  
10  
VGS = 10.0V  
*Notes:  
1. VDS = 20V  
8.0V  
7.0V  
6.5V  
6.0V  
5.5V  
5.0V  
2. 250s Pulse Test  
150oC  
1
1
-55oC  
25oC  
*Notes:  
1. 250s Pulse Test  
2. TC = 25oC  
0.1  
0.1  
2
3
4
5
6
7
1
10  
VGS, Gate-Source Voltage[V]  
VDS, Drain-Source Voltage[V]  
3. 导通电阻变化与漏极电流和栅极电压的关系  
4. 体二极管正向电压变化与源极电流的关系  
和温度的关系  
100  
3.6  
*Note: TC = 25oC  
*Notes:  
1. VGS = 0V  
2. 250s Pulse Test  
10  
3.0  
25oC  
1
2.4  
VGS = 10V  
150oC  
0.1  
1.8  
VGS = 20V  
0.01  
1.2  
0.0  
0.3  
0.6  
0.9  
1.2  
1.5  
0.0  
1.2  
2.4  
3.6  
4.8  
6.0  
VSD, Body Diode Forward Voltage [V]  
ID, Drain Current [A]  
5. 电容特性  
6. 栅极电荷特性  
10000  
10  
*Note: ID = 2.6A  
VDS = 160V  
VDS = 400V  
1000  
100  
10  
8
Ciss  
VDS = 640V  
6
4
2
0
*Note:  
1. VGS = 0V  
2. f = 1MHz  
Coss  
1
C
C
C
= C + C (C = shorted)  
gs gd ds  
iss  
= C + C  
ds gd  
Crss  
oss  
rss  
= C  
gd  
0.1  
0.1  
0
3
6
9
12  
1
10  
100  
1000  
Qg, Total Gate Charge [nC]  
VDS, Drain-Source Voltage [V]  
www.fairchildsemi.com  
3
© 2014 飞兆半导体公司  
FCPF2250N80ZRev. 1.1  
典型性能特征 (接上页)  
7. 击穿电压变化与温度的关系  
1.2  
8. 导通电阻变化与温度的关系  
3.0  
*Notes:  
1. VGS = 10V  
*Notes:  
1. VGS = 0V  
2. ID = 1.3A  
2.4  
2. ID = 1mA  
1.1  
1.8  
1.2  
0.6  
0.0  
1.0  
0.9  
0.8  
-100  
-50  
0
50  
100  
150  
200  
-100  
-50  
0
50  
100  
150  
200  
TJ, Junction Temperature [oC]  
TJ, Junction Temperature [oC]  
9. 最大安全工作区  
10. 最大漏极电流与壳温的关系  
10  
3.5  
10s  
100us  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
1
1ms  
Operation in This Area  
is Limited by R DS(on)  
10ms  
DC  
0.1  
TC = 25oC  
TJ = 150oC  
SINGLE PULSE  
0.01  
1
10  
100  
1000  
25  
50  
75  
100  
125  
150  
TC, Case Temperature [oC]  
VDS, Drain-Source Voltage [V]  
11. Eoss 与漏源极电压的关系  
3.0  
2.4  
1.8  
1.2  
0.6  
0
0
160  
320  
480  
640  
800  
VDS, Drain to Source Voltage [V]  
www.fairchildsemi.com  
4
© 2014 飞兆半导体公司  
FCPF2250N80ZRev. 1.1  
典型性能特征 (接上页)  
12. 瞬态热响应曲线  
10  
1
0.5  
0.2  
0.1  
PDM  
0.05  
t1  
0.02  
0.01  
t2  
0.1  
*Notes:  
1. ZJC(t) = 5.7oC/W Max.  
2. Duty Factor, D= t1/t2  
3. TJM - TC = PDM * ZJC(t)  
Single pulse  
0.01  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
t1, Rectangular Pulse Duration [sec]  
www.fairchildsemi.com  
5
© 2014 飞兆半导体公司  
FCPF2250N80ZRev. 1.1  
I = 常量  
G
13. 栅极电荷测试电路与波形  
RL  
VDS  
90%  
VDS  
VDD  
VGS  
RG  
10%  
VGS  
DUT  
V
GS  
td(on)  
tr  
td(off)  
tf  
t on  
t off  
14. 阻性开关测试电路与波形  
VGS  
15. 非箝位电感开关测试电路与波形  
www.fairchildsemi.com  
6
© 2014 飞兆半导体公司  
FCPF2250N80ZRev. 1.1  
+
DUT  
VDS  
_
I SD  
L
Driver  
RG  
Same Type  
as DUT  
VDD  
VGS  
• dv/dt controlled by RG  
• ISD controlled by pulse period  
Gate Pulse Width  
--------------------------  
VGS  
D =  
Gate Pulse Period  
10V  
( Driver )  
IFM , Body Diode Forward Current  
I SD  
di/dt  
( DUT )  
IRM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
VSD  
VDS  
( DUT )  
VDD  
Body Diode  
Forward Voltage Drop  
16. 二极管恢复 dv/dt 峰值测试电路与波形  
www.fairchildsemi.com  
7
© 2014 飞兆半导体公司  
FCPF2250N80ZRev. 1.1  
10.36  
9.96  
2.66  
2.42  
B
A
B
3.28  
3.08  
7.00  
3.40  
3.20  
0.70  
SEE NOTE "F"  
SEE NOTE "F"  
6.88  
6.48  
1 X 45°  
16.07  
15.67  
B
16.00  
15.60  
B
(3.23)  
3
1
1.47  
1.24  
2.96  
2.56  
2.14  
0.90  
0.70  
0.50  
10.05  
9.45  
M
A
30°  
0.45  
0.25  
0.60  
0.45  
B
2.54  
2.54  
4.90  
4.50  
B
NOTES:  
A. EXCEPT WHERE NOTED CONFORMS TO  
EIAJ SC91A.  
B
DOES NOT COMPLY EIAJ STD. VALUE.  
C. ALL DIMENSIONS ARE IN MILLIMETERS.  
D. DIMENSIONS ARE EXCLUSIVE OF BURRS,  
MOLD FLASH AND TIE BAR PROTRUSIONS.  
E. DIMENSION AND TOLERANCE AS PER ASME  
Y14.5-1994.  
F. OPTION 1 - WITH SUPPORT PIN HOLE.  
OPTION 2 - NO SUPPORT PIN HOLE.  
G. DRAWING FILE NAME: TO220M03REV5  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
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application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
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literature is subject to all applicable copyright laws and is not for resale in any manner.  
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