FDD5N50FTM-WS [ONSEMI]

N 沟道 UniFETTM FRFET® MOSFET;
FDD5N50FTM-WS
型号: FDD5N50FTM-WS
厂家: ONSEMI    ONSEMI
描述:

N 沟道 UniFETTM FRFET® MOSFET

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FDD5N50FTM-WS  
TM  
®
N-Channel UniFET FRFET MOSFET  
500 V, 3.5 A, 1.55 Ω  
Features  
Description  
UniFETTM MOSFET is ON Semiconductor’s high voltage  
MOSFET family based on planar stripe and DMOS technology.  
RDS(on) = 1.25Ω (Typ.) @ VGS = 10 V, ID = 1.75 A  
Low Gate Charge (Typ. 11 nC)  
Low Crss (Typ. 5 pF)  
This MOSFET is tailored to reduce on-state resistance, and to  
provide better switching performance and higher avalanche  
energy strength. The body diode’s reverse recovery performance  
of UniFET FRFET® MOSFET has been enhanced by lifetime  
control. Its trr is less than 100nsec and the reverse dv/dt  
immunity is 15V/ns while normal planar MOSFETs have over  
200nsec and 4.5V/nsec respectively. Therefore, it can remove  
additional component and improve system reliability in certain  
applications in which the performance of MOSFET’s body diode  
is significant. This device family is suitable for switching power  
converter applications such as power factor correction (PFC), flat  
panel display (FPD) TV power, ATX and electronic lamp ballasts.  
Fast Switching  
100% Avalanche Tested  
Improved dv/dt Capability  
RoHS Compliant  
Applications  
LCD/LED/PDP TV  
Lighting  
Uninterruptible Power Supply  
AC-DC Power Supply  
D
D
G
S
G
D-PAK  
S
MOSFET Maximum Ratings TC = 25oC unless otherwise noted.  
Symbol  
VDSS  
VGSS  
Parameter  
Ratings  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
500  
V
V
±30  
- Continuous (TC = 25oC)  
- Continuous (TC = 100oC)  
- Pulsed  
3.5  
ID  
Drain Current  
A
2.1  
IDM  
Drain Current  
(Note 1)  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
14  
A
mJ  
A
EAS  
IAR  
Single Pulsed Avalanche Energy  
Avalanche Current  
257  
3.5  
EAR  
dv/dt  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
4
4.5  
mJ  
V/ns  
W
W/oC  
oC  
(TC = 25oC)  
- Derate Above 25oC  
40  
PD  
Power Dissipation  
0.3  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
-55 to +150  
Maximum Lead Temperature for Soldering,  
1/8” from Case for 5 Seconds  
300  
oC  
Thermal Characteristics  
Symbol  
Parameter  
Ratings  
1.4  
Units  
RθJC  
RθJA  
Thermal Resistance, Junction to Case, Max.  
Thermal Resistance, Junction to Ambient, Max.  
oC/W  
110  
©2007 Semiconductor Components Industries, LLC.  
September-2017, Rev. 3  
1
Publication Order Number:  
FDD5N50FTM-WS/D  
Package Marking and Ordering Information  
Part Number  
Top Mark  
Package  
Packing Method  
Reel Size  
Tape Width  
Quantity  
FDD5N50FTM-WS  
FDD5N50F  
D-PAK  
Tape and Reel  
330 mm  
16 mm  
2500 units  
Electrical Characteristics TC = 25oC unless otherwise noted.  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 250 μA, VGS = 0 V, TJ = 25oC  
D = 250 μA, Referenced to 25oC  
DS = 500 V, VGS = 0 V  
500  
-
-
-
V
ΔBVDSS  
ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
I
0.6  
-
V/oC  
V
-
-
-
-
-
-
10  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Body Leakage Current  
μA  
VDS = 400 V, TC = 125oC  
100  
VGS = ±30 V, VDS = 0 V  
±100  
nA  
On Characteristics  
VGS(th)  
RDS(on)  
gFS  
Gate Threshold Voltage  
VGS = VDS, ID = 250 μA  
VGS = 10 V, ID = 1.75 A  
VDS = 20 V, ID = 1.75 A  
3.0  
-
5.0  
1.55  
-
V
Ω
S
Static Drain to Source On Resistance  
Forward Transconductance  
-
-
1.25  
4.3  
Dynamic Characteristics  
Ciss  
Input Capacitance  
-
-
-
-
-
490  
66  
5
650  
88  
7.5  
15  
-
pF  
pF  
pF  
nC  
nC  
VDS = 25 V, VGS = 0 V  
f = 1 MHz  
Coss  
Crss  
Qg(tot)  
Qgs  
Output Capacitance  
Reverse Transfer Capacitance  
Total Gate Charge at 10V  
Gate to Source Gate Charge  
11  
3
VDS = 400 V, ID = 5 A,  
V
GS = 10 V  
Qgd  
Gate to Drain “Miller” Charge  
-
5
-
nC  
(Note 4)  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
-
-
-
-
13  
22  
28  
20  
36  
54  
66  
50  
ns  
ns  
ns  
ns  
VDD = 250 V, ID = 5 A  
RG = 25 Ω  
(Note 4)  
Drain-Source Diode Characteristics  
IS  
Maximum Continuous Drain to Source Diode Forward Current  
Maximum Pulsed Drain to Source Diode Forward Current  
-
-
-
-
-
-
3.5  
14  
1.5  
-
A
A
ISM  
VSD  
trr  
-
-
Drain to Source Diode Forward Voltage  
Reverse Recovery Time  
VGS = 0 V, ISD = 3.5 A  
V
65  
ns  
μC  
VGS = 0 V, ISD = 5 A  
dIF/dt = 100 A/μs  
Qrr  
Reverse Recovery Charge  
0.120  
-
Notes:  
1: Repetitive rating: pulse-width limited by maximum junction temperature.  
2: L = 42 mH, I = 3.5 A, V = 50 V, R = 25 Ω, starting T = 25°C.  
AS  
DD  
G
J
3:  
I
3.5 A, di/dt 200 A/μs, V BV , starting T = 25°C.  
SD  
DD  
DSS J  
4: Essentially independent of operating temperature typical characteristics.  
www.onsemi.com  
2
Typical Performance Characteristics  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
10  
20  
VGS = 15.0V  
10.0V  
8.0 V  
7.0 V  
6.5 V  
6.0 V  
10  
5.5 V  
150oC  
1
25oC  
1
*Notes:  
1. 250μs Pulse Test  
2. TC = 25oC  
*Notes:  
1. VDS = 20V  
0.1  
2. 250μs Pulse Test  
0.04  
0.1  
0.1  
1
10  
4
5
6
7
8
VDS,Drain-Source Voltage[V]  
VGS,Gate-Source Voltage[V]  
Figure 3. On-Resistance Variation vs.  
Drain Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current  
and Temperature  
2.2  
2.0  
50  
10  
150oC  
1.8  
VGS = 10V  
25oC  
VGS = 20V  
1.6  
1
1.4  
*Notes:  
1. VGS = 0V  
*Note: TJ = 25oC  
2. 250μs Pulse Test  
1.2  
0.2  
0.0  
0
4
8
12  
16  
20  
0.4  
0.8  
1.2  
1.6  
ID, Drain Current [A]  
VSD, Body Diode Forward Voltage [V]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
1000  
10  
C
C
C
= C + C (C = shorted)  
gs gd ds  
iss  
VDS = 100V  
= C + C  
ds gd  
oss  
rss  
VDS = 250V  
= C  
gd  
8
6
4
2
0
VDS = 400V  
750  
500  
250  
0
*Note:  
1. VGS = 0V  
2. f = 1MHz  
Ciss  
Coss  
Crss  
*Note: ID = 5A  
9 12  
30  
0.1  
1
10  
0
3
6
Qg, Total Gate Charge [nC]  
VDS, Drain-Source Voltage [V]  
www.onsemi.com  
3
Typical Performance Characteristics (Continued)  
Figure 7. Breakdown Voltage Variation  
vs. Temperature  
Figure 8. Maximum Safe Operating Area  
1.2  
1.1  
1.0  
30  
40μs  
10  
100μs  
1ms  
10ms  
1
DC  
Operation in This Area  
is Limited by R DS(on)  
0.1  
*Notes:  
0.9  
1. TC = 25oC  
2. TJ = 150oC  
*Notes:  
1. VGS = 0V  
2. ID = 250μA  
3. Single Pulse  
0.01  
0.8  
-75  
1
10  
100  
1000  
-25  
25  
75  
125  
175  
o
TJ, Junction Temperature [ C]  
VDS, Drain-Source Voltage [V]  
Figure 9. Maximum Drain Current  
4
3
2
1
0
25  
50  
75  
100  
125  
150  
o
TC, Case Temperature [ C]  
Figure 10. Transient Thermal Response Curve  
3
1
0.5  
0.2  
0.1  
0.1  
PDM  
0.05  
t1  
t2  
0.02  
0.01  
*Notes:  
1. ZθJC(t) = 1.4oC/W Max.  
2. Duty Factor, D= t1/t2  
3. TJM - TC = PDM * ZθJC(t)  
0.01  
Single pulse  
0.003  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
102  
t , Rectangular Pulse Duration [sec]  
1
www.onsemi.com  
4
I
= const.  
G
Figure 11. Gate Charge Test Circuit & Waveform  
RL  
VDS  
90%  
VDS  
VDD  
VGS  
RG  
10%  
VGS  
DUT  
V
GS  
td(on)  
tr  
td(off)  
tf  
t on  
t off  
Figure 12. Resistive Switching Test Circuit & Waveforms  
VGS  
Figure 13. Unclamped Inductive Switching Test Circuit & Waveforms  
www.onsemi.com  
5
+
DUT  
VDS  
_
I SD  
L
Driver  
RG  
Same Type  
as DUT  
VDD  
VGS  
• dv/dt controlled by RG  
• ISD controlled by pulse period  
Gate Pulse Width  
--------------------------  
VGS  
D =  
Gate Pulse Period  
10V  
( Driver )  
IFM , Body Diode Forward Current  
I SD  
di/dt  
( DUT )  
IRM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
VSD  
VDS  
( DUT )  
VDD  
Body Diode  
Forward Voltage Drop  
Figure 14. Peak Diode Recovery dv/dt Test Circuit & Waveforms  
www.onsemi.com  
6
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized  
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This  
literature is subject to all applicable copyright laws and is not for resale in any manner.  
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