FDG6301N-F085P [ONSEMI]

双 N 沟道,数字 FET,25V,0.22A,4Ω;
FDG6301N-F085P
型号: FDG6301N-F085P
厂家: ONSEMI    ONSEMI
描述:

双 N 沟道,数字 FET,25V,0.22A,4Ω

文件: 总6页 (文件大小:637K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Dual N-Channel, Digital FET  
FDG6301N-F085  
Features  
25 V, 0.22 A Continuous, 0.65 A Peak  
R  
R  
= 4 Ω @ V = 4.5 V,  
DS(ON)  
GS  
= 5 Ω @ V = 2.7 V.  
DS(ON)  
GS  
www.onsemi.com  
Very Low Level Gate Drive Requirements allowing Directop−  
Eration in 3 V Circuits (V  
< 1.5 V)  
GS(th)  
Gate−Source Zener for ESD Ruggedness ( >6 kV Human Body  
Model)  
Compact Industry Standard SC70−6 Surface Mount Package.  
AEC−Q101 Qualified and PPAP Capable  
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS  
Compliant  
Applications  
SC−88 (SC−70 6 Lead), 1.25x2  
CASE 419AD  
Low Voltage Applications as a Replacement for Bipolar Digital  
Transistors and Small Signal MOSFETs  
MOSFET MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
A
Symbol  
VDSS  
VGS  
Parameter  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current Continuous  
Pulsed  
Ratings  
25  
Units  
V
V
A
8
ID  
0.22  
0.65  
0.3  
PD  
Power Dissipation  
W
TJ, TSTG Operating and Storage Temperature  
−55 to 150  
6.0  
°C  
ESD  
Electrostatic Discharge Rating  
MIL−STD−883D Human Body Model  
(100 pF / 1500 W)  
kV  
Thermal Resistance, Junction to Ambient  
415  
°C/W  
R
q
JA  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
1. R  
is the sum of the junction−to−case and case−to−ambient thermal  
θ
JA  
resistance, where the case thermal reference is defined as the Solder  
mounting surface of the drain pins. R is guaranteed by design, while R  
is determined by the board design. R  
mounting on FR−4 board in still air.  
θ
θ
JA  
JC  
= 415 °C/W on minimum pad  
θ
JA  
2. A suffix as “...F085P” has been temporarily introduced in order to manage a  
double source strategy as ON Semiconductor has officially announced in  
August 2014.  
3. Pulse Test: Pulse Width < 300 ms, Duty Cycle < 2.0%  
ORDERING INFORMATION  
Device  
Device Marking  
Package  
Shipping  
FDG6301N−F085  
FDG6301N  
SC−88 (SC−70 6 Lead)  
(Pb−Free, Halogen Free)  
3,000 units / Tape & Reel  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging  
Specifications Brochure, BRD8011/D  
© Semiconductor Components Industries, LLC, 2019  
1
Publication Order Number:  
September, 2019 − Rev. 3  
FDG6301N−F085/D  
FDG6301N−F085  
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise noted)  
A
Parameter  
Off Characteristics  
Symbol  
Test Conditions  
Min  
Typ  
Max  
Units  
Drain to Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
BVDSS  
IDSS  
I
= 250 mA, V = 0 V  
25  
V
D
GS  
1
mA  
V
= 20 V, V = 0 V  
GS  
DS  
GS  
T = 55°C  
J
10  
100  
Gate to Source Leakage Current  
IGSS  
V
=
8 V  
nA  
On Characteristics  
Gate to Source Threshold Voltage  
Drain to Source On Resistance  
VGS(th)  
rDS(on)  
V
= V  
I = 250 mA  
0.65  
0.22  
0.85  
2.6  
1.5  
4
V
GS  
DS, D  
W
I
D
= 0.22 A, V = 4.5 V  
GS  
I
I
= 0.19 A, V = 2.7 V  
3.7  
5.3  
5
7
D
GS  
= 0.22 A, V = 4.5 V, T = 125°C  
D
GS  
J
On−State Drain Current  
Forward Transconductance  
Dynamic Characteristics  
Input Capacitance  
ID(on)  
gFS  
V
GS  
= 4.5 V, V = 5 V  
DS  
s
I
D
= 0.22 A, V = 5 V  
0.2  
DS  
V
DS  
= 10 V, V = 0 V, f = 1 MHz  
GS  
Ciss  
9.5  
6
pF  
pF  
Output Capacitance  
Coss  
Reverse Transfer Capacitance  
Total Gate Charge at −4.5 V  
Crss  
4.5  
pF  
nC  
Qg(TOT)  
0.4  
V
V
= 0 to 4.5 V; V = 5 V, I = 0.22 A  
0.29  
0.12  
0.03  
GS  
DD  
D
= 5 V I = 0.22 A  
,
DD  
D
Gate to Source Gate Charge  
Qgs  
Qgd  
Gate to Drain “Miller” Charge  
Switching Characteristics  
V
R
= 5 V, I = 0.5 A, V = 4.5 V,  
DD  
D
GS  
10  
10  
8
Turn−On Delay Time  
Rise Time  
td(on)  
5
ns  
ns  
ns  
ns  
= 50 W  
GEN  
t
r
4.5  
4
Turn−Off Delay Time  
td(off)  
7
Fall Time  
t
f
3.2  
Drain−Source Diode Characteristics  
Maximum Continuous Source Current  
Source to Drain Diode Voltage  
0.25  
1.2  
IS  
A
V
VSD  
I
= 0.25 A, V = 0 V  
0.8  
SD  
GS  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
www.onsemi.com  
2
FDG6301N−F085  
TYPICAL CHARACTERISTICS  
Figure 2. On−Resistance Variation with Drain Current  
Figure 1. On−Region Characteristics  
and Gate Voltage  
Figure 3. On−Resistance Variation with Temperature  
Figure 4. On−Resistance Variation with  
Gate−to−Source Voltage  
Figure 6. Body Diode Forward Voltage Variation with  
Source Current and Temperature  
Figure 5. Transfer Characteristics  
www.onsemi.com  
3
FDG6301N−F085  
TYPICAL CHARACTERISTICS  
Figure 8. Capacitance Characteristics  
Figure 7. Gate Charge Characteristics  
Figure 10. Single Pulse Maximum Power Dissipation  
Figure 9. Maximum Safe Operating Area  
Figure 11. Transient Thermal Response Curve  
www.onsemi.com  
4
MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
SC88 (SC70 6 Lead), 1.25x2  
CASE 419AD  
ISSUE A  
DATE 07 JUL 2010  
1
SYMBOL  
MIN  
NOM  
MAX  
D
0.80  
A
1.10  
e
e
A1  
A2  
0.00  
0.80  
0.10  
1.00  
b
c
0.15  
0.10  
1.80  
1.80  
1.15  
0.30  
0.18  
2.20  
2.40  
1.35  
D
2.00  
2.10  
E1  
E
E
E1  
e
1.25  
0.65 BSC  
0.36  
L
0.26  
0.46  
L1  
L2  
0.42 REF  
0.15 BSC  
TOP VIEW  
0º  
4º  
8º  
θ
10º  
θ1  
q1  
A2  
A1  
A
q
L
b
L1  
q1  
c
L2  
SIDE VIEW  
END VIEW  
Notes:  
(1) All dimensions are in millimeters. Angles in degrees.  
(2) Complies with JEDEC MO-203.  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON34266E  
SC88 (SC70 6 LEAD), 1.25X2  
PAGE 1 OF 1  
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© Semiconductor Components Industries, LLC, 2019  
www.onsemi.com  
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