FDT86256 [ONSEMI]

N 沟道,PowerTrench® MOSFET,150V,1.2A,845mΩ;
FDT86256
型号: FDT86256
厂家: ONSEMI    ONSEMI
描述:

N 沟道,PowerTrench® MOSFET,150V,1.2A,845mΩ

开关 脉冲 光电二极管 晶体管
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is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.  
August 2011  
FDT86256  
N-Channel PowerTrench® MOSFET  
150 V, 1.2 A, 845 mΩ  
Features  
General Description  
„ Max rDS(on) = 845 mΩ at VGS = 10 V, ID = 1.2 A  
This N-Channel MOSFET is produced using Fairchild  
Semiconductor’s advanced PowerTrench® process that has  
been especially tailored to minimize the on-state resistance and  
switching loss. G-S zener has been added to enhance ESD  
voltage level.  
„ Max rDS(on) = 1280 mΩ at VGS = 6.0 V, ID = 1.0 A  
„ Very low Qg and Qgd compared to competing trench  
technologies  
„ Fast switching speed  
„ 100% UIL Tested  
„ RoHS Compliant  
Applications  
„ DC-DC conversion  
„ Inverter  
„ Synchronous Rectifier  
D
D
S
D
G
SOT-223  
G
S
D
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted  
Symbol  
VDS  
VGS  
Parameter  
Ratings  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
150  
V
V
±20  
Drain Current -Continuous (Package limited)  
-Continuous (Silicon limited)  
-Continuous  
TC = 25 °C  
3
TC = 25 °C  
2.5  
ID  
A
TA = 25 °C  
(Note 1a)  
(Note 3)  
1.2  
-Pulsed  
2
EAS  
Single Pulse Avalanche Energy  
Power Dissipation  
1
10  
mJ  
W
TC = 25 °C  
TA = 25 °C  
PD  
Power Dissipation  
(Note 1a)  
2.3  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
RθJC  
RθJA  
Thermal Resistance, Junction to Case  
Thermal Resistance, Junction to Ambient  
12  
55  
°C/W  
(Note 1a)  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
13 ’’  
Tape Width  
Quantity  
86256  
FDT86256  
SOT-223  
12 mm  
2500 units  
©2011 Fairchild Semiconductor Corporation  
FDT86256 Rev. C  
1
www.fairchildsemi.com  
Electrical Characteristics TJ = 25 °C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 250 μA, VGS = 0 V  
150  
V
ΔBVDSS  
ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
I
D = 250 μA, referenced to 25 °C  
100  
mV/°C  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
VDS = 120 V, VGS = 0 V  
VGS = ±20 V, VDS = 0 V  
1
μA  
μA  
±10  
On Characteristics  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 250 μA  
2
3.5  
-8  
4
V
ΔVGS(th)  
ΔTJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
I
D = 250 μA, referenced to 25 °C  
mV/°C  
V
GS = 10 V, ID = 1.2 A  
695  
912  
1298  
0.3  
845  
1280  
1367  
rDS(on)  
gFS  
Static Drain to Source On Resistance  
Forward Transconductance  
VGS = 6 V, ID = 1.0 A  
mΩ  
VGS = 10 V, ID = 1.2 A, TJ = 125 °C  
VDS = 5 V, ID = 1.2 A  
S
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
55  
8
73  
11  
pF  
pF  
pF  
Ω
VDS = 75 V, VGS = 0 V,  
f = 1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
1
1.4  
1.3  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
2.7  
1.7  
4.8  
2.6  
1.2  
0.8  
0.4  
0.3  
10  
10  
ns  
ns  
ns  
ns  
nC  
VDD = 75 V, ID = 1.2 A,  
V
GS = 10 V, RGEN = 6 Ω  
Turn-Off Delay Time  
Fall Time  
10  
10  
Qg(TOT)  
Qg(TOT)  
Qgs  
Total Gate Charge  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain “Miller” Charge  
VGS = 0 V to 10 V  
VGS = 0 V to 6 V  
2.0  
1.0  
VDD = 75 V,  
D = 1.2 A  
I
nC  
nC  
Qgd  
Drain-Source Diode Characteristics  
V
GS = 0 V, IS = 1.2 A  
(Note 2)  
(Note 2)  
0.9  
0.8  
47  
1.3  
1.3  
75  
VSD  
Source to Drain Diode Forward Voltage  
V
VGS = 0 V, IS = 1.0 A  
trr  
Reverse Recovery Time  
ns  
IF = 1.2 A, di/dt = 100 A/μs  
Qrr  
Reverse Recovery Charge  
24  
38  
nC  
NOTES:  
2
1. R  
is determined with the device mounted on a 1 in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R is determined by  
θCA  
θJA  
θJC  
the user's board design.  
a)  
b) 118 °C/W when mounted on  
a minimum pad of 2 oz copper  
55 °C/W when mounted on a  
1 in pad of 2 oz copper  
2
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.  
3. Starting T = 25 °C, L = 3 mH, I = 1 A, V = 150 V, V = 10 V.  
J
AS  
DD  
GS  
4. The diode connected between gate and source serves only as protection against ESD. No gate overvoltage rating is implied.  
©2011 Fairchild Semiconductor Corporation  
FDT86256 Rev. C  
2
www.fairchildsemi.com  
Typical Characteristics TJ = 25 °C unless otherwise noted  
3.0  
4
3
2
1
0
VGS = 10 V  
VGS = 5.5 V  
VGS = 8 V  
VGS = 6 V  
2.5  
VGS = 7 V  
VGS = 7 V  
2.0  
VGS = 6 V  
VGS = 8 V  
1.5  
VGS = 5.5 V  
1.0  
VGS = 10 V  
0.5  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
0.0  
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0  
0
1
2
3
4
5
ID, DRAIN CURRENT (A)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs Drain Current and Gate Voltage  
4000  
2.4  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
ID = 1.2 A  
ID = 1.2 A  
2.1  
1.8  
1.5  
1.2  
0.9  
0.6  
0.3  
VGS = 10 V  
3000  
2000  
1000  
0
TJ = 125 o  
C
TJ = 25 oC  
5
6
7
8
9
10  
-75 -50 -25  
0
25 50 75 100 125 150  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
F ig u re 3. No rmal i zed O n-Re si stan ce  
vs Junction Temperature  
Figure4. On-Resistance vs Gate to  
Source Voltage  
2.0  
10  
PULSE DURATION = 80 μs  
VGS = 0 V  
DUTY CYCLE = 0.5% MAX  
1.5  
1.0  
0.5  
0.0  
VDS = 5 V  
1
0.1  
TJ = 150 o  
C
TJ = 25 oC  
TJ = 25 oC  
TJ = -55 oC  
TJ = 150 oC  
TJ = -55 oC  
0.01  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
2
3
4
5
6
7
8
VSD, BODY DIODE FORWARD VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs Source Current  
©2011 Fairchild Semiconductor Corporation  
FDT86256 Rev. C  
3
www.fairchildsemi.com  
Typical Characteristics TJ = 25 °C unless otherwise noted  
100  
10  
10  
ID = 1.2 A  
Ciss  
8
Coss  
VDD = 75 V  
VDD = 85 V  
VDD = 65 V  
6
4
2
0
Crss  
f = 1 MHz  
= 0 V  
1
V
GS  
0.5  
0.1  
1
10  
100  
0.0  
0.3  
0.6  
0.9  
1.2  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE (nC)  
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s D r a i n  
to Source Voltage  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
10  
RθJA = 55 oC/W  
1
TJ = 25 o  
C
VGS = 10 V  
TJ = 100 o  
C
VGS = 6 V  
0.1  
TJ = 125 oC  
0.01  
0.001  
0.01  
0.1  
1
10  
100  
1000  
25  
50  
75  
100  
125  
150  
TA, AMBIENT TEMPERATURE (oC)  
tAV, TIME IN AVALANCHE (ms)  
Figure9. U n c l a m p e d I n d u c t i v e  
Switching Capability  
Figure10. Maximum Continuous Drain  
Current vs Ambient Temperature  
3
100  
10  
THIS AREA IS  
LIMITED BY rDS(on)  
1
100 μs  
1 ms  
0.1  
10 ms  
SINGLEPULSE  
100 ms  
R
θJA= 118oC/W  
SINGLE PULSE  
TJ = MAX RATED  
1 s  
10 s  
DC  
T = 25 oC  
1
A
R
θJA = 118 oC/W  
0.5  
10  
0.01  
TA = 25 oC  
-3  
-2  
10  
-1  
10  
100  
1000  
1
10  
t, PULSEWIDTH(sec)  
0.005  
0.01  
0.1  
1
10  
100  
500  
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure 11. Forward Bias Safe  
Operating Area  
Figure 12. Single Pulse Maximum Power Dissipation  
©2011 Fairchild Semiconductor Corporation  
FDT86256 Rev. C  
4
www.fairchildsemi.com  
Typical Characteristics TJ = 25 °C unless otherwise noted  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
0.1  
0.05  
P
DM  
0.1  
0.02  
0.01  
t
1
SINGLE PULSE  
RθJA = 118 oC/W  
t
2
NOTES:  
DUTY FACTOR: D = t /t  
1
2
PEAK T = P  
J
x Z  
x R  
+ T  
DM  
θJA  
θJA A  
0.01  
10-4  
10-3  
10-2  
10-1  
t RECTANGULAR
 
PULSE DURATION (sec)  
1
10  
100  
1000  
Figure 13. Junction-to-Ambient Transient Thermal Response Curve  
©2011 Fairchild Semiconductor Corporation  
FDT86256 Rev. C  
5
www.fairchildsemi.com  
6.70  
6.20  
B
0.10  
C B  
3.10  
2.90  
3.25  
4
1.90  
A
3.70  
3.30  
6.10  
1.90  
1
3
0.84  
0.60  
2.30  
2.30  
0.95  
4.60  
0.10  
C B  
LAND PATTERN RECOMMENDATION  
SEE DETAIL A  
1.80 MAX  
7.30  
6.70  
0.08  
C
C
0.10  
0.00  
NOTES: UNLESS OTHERWISE SPECIFIED  
A) DRAWING BASED ON JEDEC REGISTRATION  
TO-261C, VARIATION AA.  
B) ALL DIMENSIONS ARE IN MILLIMETERS.  
C) DIMENSIONS DO NOT INCLUDE BURRS  
OR MOLD FLASH. MOLD FLASH OR BURRS  
DOES NOT EXCEED 0.10MM.  
D) DIMENSIONING AND TOLERANCING PER  
ASME Y14.5M-2009.  
R0.15±0.05  
R0.15±0.05  
10°  
5°  
GAGE  
PLANE  
0.35  
0.20  
E) LANDPATTERN NAME: SOT230P700X180-4BN  
F) DRAWING FILENAME: MKT-MA04AREV3  
10°  
0°  
TYP  
0.25  
10°  
5°  
0.60 MIN  
SEATING  
PLANE  
1.70  
DETAIL A  
SCALE: 2:1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized  
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This  
literature is subject to all applicable copyright laws and is not for resale in any manner.  
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