KA7818ETU [ONSEMI]
3-Terminal 1A Positive Voltage Regulator, 1000-TUBE;
| 型号： | KA7818ETU |
| 厂家： | 
ONSEMI |
| 描述： | 3-Terminal 1A Positive Voltage Regulator, 1000-TUBE 局域网 输出元件 调节器 |
| 文件： | 总29页 (文件大小：547K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
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April 2015
KA78XXE / KA78XXAE
3-Terminal 1 A Positive Voltage Regulator
Features
Description
• Output Current up to 1 A
The KA78XXE / KA78XXAE series of three-terminal posi-
tive regulators is available in the TO-220 / D-PAK pack-
age with several fixed-output voltages, making them
useful in a wide range of applications. Each type employs
internal current limiting, thermal shut-down, and safe
operating area. If adequate heat sinking is provided, they
can deliver over 1 A output current. Although designed
primarily as fixed-voltage regulators, these devices can
be used with external components for adjustable voltages
and currents.
• Output Voltages of 5, 6, 8, 9, 10, 12, 15, 18, 24 V
• Thermal Overload Protection
• Short-Circuit Protection
• Output Transistor Safe Operating Area Protection
(Dual Gauge)
TO-220
D-PAK
GND
GND
1
1. Input
2. GND
3. Output
1
Block Diagram
OUTPUT
3
INPUT
1
SERIES
PASS
ELEMENT
CURRENT
GENERATOR
SOA
PROTECTION
REFERENCE
VOLTAGE
ERROR
AMPLIFIER
STARTING
CIRCUIT
THERMAL
PROTECTION
GND
2
Figure 1. Block Diagram
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
Ordering Information
Output Voltage
Operating
Temperature
Product Number
Package
Parking Method
Tolerance(1)
KA7805ETU
KA7806ETU
KA7808ETU
KA7809ETU
KA7810ETU
KA7812ETU
KA7815ETU
KA7818ETU
KA7824ETU
KA7805ERTF
KA7805ERTM
KA7808ERTM
KA7809ERTM
KA7812ERTM
KA7805AETU
KA7809AETU
KA7810AETU
KA7812AETU
KA7815AETU
KA7824AETU
TO-220 (Dual Gauge)
Rail
±4%
-40°C to +125°C
D-PAK(2)
Tape and Reel
±2%
TO-220 (Dual Gauge)
0°C to +125°C
Rail
Notes:
1. Above output voltage tolerance is available at 25°C.
2. Refer to below figure for TM / TF Suffix for DPAK.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
2
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be opera-
ble above the recommended operating conditions and stressing the parts to these levels is not recommended. In addi-
tion, extended exposure to stresses above the recommended operating conditions may affect device reliability. The
absolute maximum ratings are stress ratings only. Values are at TA = 25°C unless otherwise noted.
Symbol
Parameter
Value
Unit
V
VO = 5 V to 18 V
VO = 24 V
35
40
VI
Input Voltage
V
RθJC
RθJA
Thermal Resistance Junction-Case (TO-220)
Thermal Resistance Junction-Air (TO-220)
5
°C/W
°C/W
65
KA78XXE / KA78XXER
-40 to +125
0 to +125
-65 to +150
TOPR
TSTG
Operating Temperature Range
Storage Temperature Range
°C
°C
KA78XXAE
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
3
Electrical Characteristics (KA7805E / KA7805ER)
Refer to test circuit, -40°C < TJ < 125°C, IO = 500 mA, VI =10 V, CI= 0.33 μF, CO=0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
Min.
Typ. Max. Unit
TJ = +25°C
4.80
5.00
5.20
VO
Output Voltage
V
5.0 mA ≤ IO ≤ 1.0 A, PO ≤ 15 W,
VI = 7 V to 20 V
4.75
5.00
5.25
VI = 7 V to 25 V
TJ = +25°C
4.0
1.6
9
100.0
50.0
100
50
Regline
Line Regulation(3)
mV
VI = 8 V to 12 V
IO = 5.0 mA to 1.5 A
Regload
IQ
Load Regulation(3)
TJ = +25°C
mV
mA
mA
I
O = 250 mA to 750 mA
4
Quiescent Current
TJ = +25°C
5
8
IO = 5 mA to 1.0 A
VI = 7 V to 25 V
0.03
0.30
-0.8
42
0.50
1.30
ΔIQ
Quiescent Current Change
ΔVO/ΔT
VN
Output Voltage Drift(4)
Output Noise Voltage
Ripple Rejection(4)
Dropout Voltage
Output Resistance(4)
Short-Circuit Current
Peak Current(4)
IO = 5 mA
mV/°C
μV
f = 10 Hz to 100 kHz, TA = +25°C
f = 120 Hz, VI = 8 V to 18 V
IO = 1 A, TJ = +25°C
f = 1 kHz
RR
62
73
dB
VDrop
RO
2
V
15
mΩ
mA
A
ISC
VI = 35 V, TA = +25°C
TJ = +25°C
230
2.2
IPK
Notes:
3. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
4. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
4
Electrical Characteristics (KA7806E)
Refer to test circuit, -40°C < TJ < 125°C, IO = 500 mA, VI = 11 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Unit
TJ = +25°C
5.75
6.00
6.25
VO
Output Voltage
V
5.0 mA ≤ IO ≤ 1.0 A, PO ≤ 15 W,
VI = 8.0 V to 21 V
5.70
6.00
6.30
VI = 8 V to 25 V
TJ = +25°C
5.0
1.5
9
120.0
60.0
120
60
Regline
Line Regulation(5)
mV
VI = 9 V to 13 V
IO = 5 mA to 1.5 A
Regload
IQ
Load Regulation(5)
Quiescent Current
TJ = +25°C
mV
mA
mA
I
O = 250 mA to 750 mA
3
TJ = +25°C
O = 5 mA to 1 A
5
8
I
0.5
1.3
Quiescent Current
Change
ΔIQ
VI = 8 V to 25 V
ΔVO/ΔT
VN
Output Voltage Drift(6)
Output Noise Voltage
Ripple Rejection(6)
Dropout Voltage
Output Resistance(6)
Short-Circuit Current
Peak Current(6)
IO = 5 mA
-0.8
45
mV/°C
μV
f = 10 Hz to 100 kHz, TA = +25°C
f = 120 Hz, VI = 9 V to 19 V
IO = 1 A, TJ = +25°C
f = 1 kHz
RR
59
75
dB
VDrop
RO
2
V
19
mΩ
mA
A
ISC
VI = 35 V, TA= +25°C
TJ = +25°C
250
2.2
IPK
Notes:
5. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
6. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
5
Electrical Characteristics (KA7808E / KA7808ER)
Refer to test circuit, -40°C < TJ < 125°C, IO = 500 mA, VI = 14 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Unit
TJ = +25°C
7.7
8.0
8.3
VO
Output Voltage
V
5.0 mA ≤ IO ≤ 1.0 A, PO ≤ 15 W,
VI = 10.5 V to 23 V
7.6
8.0
8.4
VI = 10.5 V to 25 V
TJ = +25°C
5
2
160
80
Regline
Line Regulation(7)
mV
VI = 11.5 V to 17 V
IO = 5.0 mA to 1.5 A
TJ = +25°C
10
5
160
80
Regload
IQ
Load Regulation(7)
Quiescent Current
mV
mA
mA
IO = 250 mA to 750 mA
TJ = +25°C
5
8
I
O = 5 mA to 1.0 A
0.05
0.50
-0.8
52
73
2
0.50
1.00
Quiescent Current
Change
ΔIQ
VI = 10.5 A to 25 V
IO = 5 mA
ΔVO/ΔT
VN
Output Voltage Drift(8)
Output Noise Voltage
Ripple Rejection(8)
Dropout Voltage
Output Resistance(8)
Short-Circuit Current
Peak Current(8)
mV/°C
μV
f = 10 Hz to 100 kHz, TA = +25°C
f = 120 Hz, VI= 11.5 V to 21.5 V
IO = 1 A, TJ = +25°C
f = 1 kHz
RR
56
dB
VDrop
RO
V
17
230
2.2
mΩ
mA
A
ISC
VI = 35 V, TA = +25°C
TJ = +25°C
IPK
Notes:
7. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
8. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
6
Electrical Characteristics (KA7809E / KA7809ER)
Refer to test circuit, -40°C < TJ < 125°C, IO = 500 mA, VI = 15 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Unit
TJ = +25°C
8.65
9.00
9.35
VO
Output Voltage
V
5.0 mA ≤ IO ≤ 1.0 A, PO ≤ 15 W,
VI = 11.5 V to 24 V
8.60
9.00
9.40
VI = 11.5 V to 25 V
TJ = +25°C
6
2
180
90
Regline
Line Regulation(9)
mV
VI = 12 V to 17 V
IO = 5 mA to 1.5 A
12
4
180
90
Regload
IQ
Load Regulation(9)
Quiescent Current
TJ = +25°C
mV
mA
mA
I
O = 250 mA to 750 mA
TJ = +25°C
O = 5 mA to 1.0 A
5
8
I
0.5
1.3
Quiescent Current
Change
ΔIQ
VI = 11.5 V to 26 V
IO = 5 mA
ΔVO/ΔT
VN
Output Voltage Drift(10)
Output Noise Voltage
Ripple Rejection(10)
Dropout Voltage
Output Resistance(10)
Short-Circuit Current
Peak Current(10)
-1
58
71
2
mV/°C
μV
f = 10 Hz to 100 kHz, TA = +25°C
f = 120 Hz, VI = 13 V to 23 V
IO = 1 A, TJ = +25°C
f = 1 kHz
RR
56
dB
VDrop
RO
V
17
250
2.2
mΩ
mA
A
ISC
VI = 35 V, TA = +25°C
TJ = +25°C
IPK
Notes:
9. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
10. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
7
Electrical Characteristics (KA7810E)
Refer to test circuit, -40°C < TJ < 125°C, IO = 500 mA, VI = 16 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Unit
TJ = +25°C
9.6
10.0
10.4
VO
Output Voltage
V
5.0 mA ≤ IO ≤ 1.0 A, PO ≤ 15 W,
VI = 12.5 V to 25 V
9.5
10.0
10.5
VI = 12.5 V to 25 V
TJ = +25°C
10
3
200
100
200
400
8.0
Regline
Line Regulation(11)
mV
VI = 13 V to 25 V
IO = 5 mA to 1.5 A
12
4
Regload
IQ
Load Regulation(11)
Quiescent Current
TJ = +25°C
mV
mA
mA
I
O = 250 mA to 750 mA
TJ = +25°C
O = 5 mA to 1.0 A
5.1
I
0.5
Quiescent Current
Change
ΔIQ
VI = 12.5 V to 29 V
IO = 5 mA
1.0
ΔVO/ΔT
VN
Output Voltage Drift(12)
Output Noise Voltage
Ripple Rejection(12)
Dropout Voltage
Output Resistance(12)
Short-Circuit Current
Peak Current(12)
-1
58
71
2
mV/°C
μV
f = 10 Hz to 100 kHz, TA = +25°C
f = 120 Hz, VI = 13 V to 23 V
IO = 1 A, TJ = +25°C
f = 1 kHz
RR
56
dB
VDrop
RO
V
17
250
2.2
mΩ
mA
A
ISC
VI = 35 V, TA = +25°C
TJ = +25°C
IPK
Notes:
11. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
12. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
8
Electrical Characteristics (KA7812E / KA7812ER)
Refer to test circuit, -40°C < TJ < 125°C, IO = 500 mA, VI = 19 V, CI = 0.33 μF, CO= 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
Min. Typ.
Max.
Unit
TJ = +25°C
11.5
12.0
12.5
VO
Output Voltage
V
5.0 mA ≤ IO ≤ 1.0 A, PO ≤ 15 W,
VI = 14.5 V to 27 V
11.4
12.0
12.6
VI = 14.5 V to 30 V
TJ = +25°C
10
3
240
120
240
120
8.0
Regline
Line Regulation(13)
mV
VI = 16 V to 22 V
IO = 5 mA to 1.5 A
11
5
Regload
IQ
Load Regulation(13)
Quiescent Current
TJ = +25°C
mV
mA
mA
I
O = 250 mA to 750 mA
TJ = +25°C
O = 5 mA to 1.0 A
5.1
0.1
0.5
-1
I
0.5
Quiescent Current
Change
ΔIQ
VI = 14.5 V to 30 V
IO = 5 mA
1.0
ΔVO/ΔT
VN
Output Voltage Drift(14)
Output Noise Voltage
Ripple Rejection(14)
Dropout Voltage
Output Resistance(14)
Short-Circuit Current
Peak Current(14)
mV/°C
μV
f = 10 Hz to 100 kHz, TA = +25°C
f = 120 Hz, VI = 15 V to 25 V
IO = 1 A, TJ= +25°C
f = 1 kHz
76
71
2
RR
55
dB
VDrop
RO
V
18
230
2.2
mΩ
mA
A
ISC
VI = 35 V, TA = +25°C
TJ = +25°C
IPK
Notes:
13. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
14. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
9
Electrical Characteristics (KA7815E)
Refer to test circuit, -40°C < TJ < 125°C, IO = 500 mA, VI = 23 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
Min.
Typ. Max.
Unit
TJ = +25°C
14.40 15.00 15.60
VO
Output Voltage
V
5.0 mA ≤ IO ≤ 1.0 A, PO ≤ 15 W,
VI = 17.5 V to 30 V
14.25 15.00 15.75
VI = 17.5 V to 30 V
TJ = +25°C
11
3
300
150
300
150
8.0
Regline
Line Regulation(15)
mV
VI = 20 V to 26 V
IO = 5 mA to 1.5 A
12
4
Regload
IQ
Load Regulation(15)
Quiescent Current
TJ = +25°C
mV
mA
mA
I
O = 250 mA to 750 mA
TJ = +25°C
5.2
IO = 5 mA to 1.0 A
VI = 17.5 V to 30 V
IO = 5 mA
0.5
ΔIQ
Quiescent Current Change
1.0
ΔVO/ΔT
VN
Output Voltage Drift(16)
Output Noise Voltage
Ripple Rejection(16)
Dropout Voltage
Output Resistance(16)
Short-Circuit Current
Peak Current(16)
-1
90
70
2
mV/°C
μV
f = 10 Hz to 100 kHz, TA = +25°C
f = 120 Hz, VI = 18.5 V to 28.5 V
IO = 1 A, TJ= +25°C
f = 1 kHz
RR
54
dB
VDrop
RO
V
19
250
2.2
mΩ
mA
A
ISC
VI = 35 V, TA= +25°C
TJ =+25°C
IPK
Notes:
15. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
16. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
10
Electrical Characteristics (KA7818E)
Refer to test circuit, -40°C < TJ < 125°C, IO = 500 mA, VI = 27 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
Min.
Typ. Max.
Unit
TJ =+25°C
17.3
18.0
18.7
VO
Output Voltage
V
5.0 mA ≤ IO ≤ 1.0 A, PO ≤ 15 W,
VI = 21 V to 33 V
17.1
18.0
18.9
VI = 21 V to 33 V
TJ = +25°C
15
5
360
180
360
180
8.0
Regline
Line Regulation(17)
mV
VI = 24 V to 30 V
IO = 5 mA to 1.5 A
15
5
Regload
IQ
Load Regulation(17)
Quiescent Current
TJ = +25°C
mV
mA
mA
I
O = 250 mA to 750 mA
TJ =+25°C
O = 5 mA to 1.0 A
5.2
I
0.5
Quiescent Current
Change
ΔIQ
VI = 21 V to 33 V
IO = 5 mA
1.0
ΔVO/ΔT
VN
Output Voltage Drift(18)
Output Noise Voltage
Ripple Rejection(18)
Dropout Voltage
Output Resistance(18)
Short-Circuit Current
Peak Current(18)
-1
110
69
mV/°C
μV
f = 10 Hz to 100 kHz, TA = +25°C
f = 120 Hz, VI = 22 V to 32 V
IO = 1 A, TJ= +25°C
f = 1 kHz
RR
53
dB
VDrop
RO
2
V
22
mΩ
mA
A
ISC
VI = 35 V, TA = +25°C
TJ = +25°C
250
2.2
IPK
Notes:
17. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
18. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
11
Electrical Characteristics (KA7824E)
Refer to test circuit, -40°C < TJ < 125°C, IO = 500 mA, VI = 33 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
Min.
Typ. Max.
Unit
TJ = +25°C
23.00 24.00 25.00
VO
Output Voltage
V
5.0 mA ≤ IO ≤ 1.0 A, PO ≤ 15 W,
VI = 27 V to 38 V
22.80 24.00 25.25
VI = 27 V to 38 V
TJ = +25°C
17
6
480
240
480
240
8.0
Regline
Line Regulation(19)
mV
VI = 30 V to 36 V
IO = 5 mA to 1.5 A
15
5
Regload
IQ
Load Regulation(19)
Quiescent Current
TJ = +25°C
mV
mA
mA
I
O = 250 mA to 750 mA
TJ = +25°C
O = 5 mA to 1.0 A
5.2
0.1
0.5
-1.5
120
67
2
I
0.5
Quiescent Current
Change
ΔIQ
VI = 27 V to 38 V
IO = 5mA
1.0
ΔVO/ΔT
VN
Output Voltage Drift(20)
Output Noise Voltage
Ripple Rejection(20)
Dropout Voltage
Output Resistance(20)
Short-Circuit Current
Peak Current(20)
mV/°C
μV
f = 10 Hz to 100 kHz, TA = +25°C
f = 120 Hz, VI = 28 V to 38 V
IO = 1 A, TJ= +25°C
f = 1 kHz
RR
50
dB
VDrop
RO
V
28
230
2.2
mΩ
mA
A
ISC
VI = 35 V, TA= +25°C
TJ = +25°C
IPK
Notes:
19. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
20. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
12
Electrical Characteristics (KA7805AE)
Refer to the test circuit, 0°C < TJ < +125°C, Io = 1 A, VI = 10 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
Min.
Typ. Max.
Unit
TJ =+25°C
4.9
5.0
5.1
VO
Output Voltage
V
IO = 5 mA to 1 A, PO ≤ 15 W,
VI = 7.5 V to 20 V
4.8
5.0
5.2
VI = 7.5 V to 25 V, IO = 500 mA
VI = 8 V to 12 V
5.0
3.0
5.0
1.5
9
50.0
50.0
50.0
25.0
100
100
50
Line Regulation(21)
Regline
mV
VI= 7.3 V to 20 V
TJ = +25°C
VI= 8 V to 12 V
TJ =+25°C, IO = 5 mA to 1.5 A
IO = 5 mA to 1 A
Regload
IQ
Load Regulation(21)
Quiescent Current
9
mV
mA
mA
IO = 250 mA to 750 mA
TJ = +25°C
4
5
6
IO = 5 mA to 1 A
0.5
ΔIQ
Quiescent Current Change VI = 8 V to 25 V, IO = 500 mA
0.8
VI = 7.5 V to 20 V, TJ = +25°C
0.8
ΔV/ΔT
Output Voltage Drift(22)
Output Noise Voltage
IO = 5 mA
-0.8
42
mV/°C
μV
VN
f = 10 Hz to 100 kHz, TA =+25°C
f = 120 Hz, IO = 500 mA,
VI = 8 V to 18 V
RR
Ripple Rejection(22)
68
dB
VDrop
RO
Dropout Voltage
IO = 1 A, TJ = +25°C
f = 1 kHz
2
V
mΩ
mA
A
Output Resistance(22)
Short-Circuit Current
Peak Current(22)
17
ISC
VI = 35 V, TA = +25°C
TJ = +25°C
250
2.2
IPK
Notes:
21. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
22. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
13
Electrical Characteristics (KA7809AE)
Refer to the test circuit, 0°C < TJ < +125 °C, IO = 1 A, VI = 15 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
TJ = +25°C
Min.
Typ. Max.
Unit
8.82
9.00
9.18
VO
Output Voltage
V
IO = 5 mA to 1 A, PO ≤ 15 W,
VI = 11.2 V to 24 V
8.65
9.00
9.35
VI = 11.7 V to 25 V, IO = 500 mA
VI = 12.5 V to 19 V
6
4
90
45
Line Regulation(23)
Load Regulation(23)
Regline
mV
VI = 11.5 V to 24 V
TJ = +25°C
6
90
VI = 12.5 V to 19 V
2
45
TJ = +25°C, IO = 5 mA to 1.0 A
IO = 5 mA to 1.0 A
12
12
5
100
100
50
Regload
IQ
mV
mA
mA
IO = 250 mA to 750 mA
TJ = +25°C
Quiescent Current
5
6
VI = 11.7 V to 25 V, TJ = +25°C
VI = 12 V to 25 V, IO = 500 mA
IO = 5 mA to 1.0 A
0.8
0.8
0.5
ΔIQ
Quiescent Current Change
ΔV/ΔT
Output Voltage Drift(24)
Output Noise Voltage
IO = 5 mA
-1
mV/°C
μV
VN
f = 10 Hz to 100 kHz, TA = +25°C
58
f = 120 Hz, IO = 500 mA,
VI = 12 V to 22 V
RR
Ripple Rejection(24)
62
dB
VDrop
RO
Dropout Voltage
IO = 1 A, TJ = +25°C
f = 1 kHz
2
V
mΩ
mA
A
Output Resistance(24)
Short-Circuit Current
Peak Current(24)
17
ISC
VI= 35 V, TA = +25°C
TJ = +25°C
250
2.2
IPK
Notes:
23. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
24. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
14
Electrical Characteristics (KA7810AE)
Refer to the test circuit, 0°C < TJ < +125 °C, IO = 1 A, VI = 16 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
TJ =+25°C
Min.
Typ. Max.
Unit
9.8
10.0
10.2
VO
Output Voltage
V
IO = 5 mA to 1 A, PO ≤ 15 W,
VI = 12.8 V to 25 V
9.6
10.0
10.4
VI = 12.8 V to 26 V, IO = 500 mA
VI = 13 V to 20 V
8
4
100
50
Line Regulation(25)
Load Regulation(25)
Regline
mV
VI = 12.5 V to 25 V
TJ = +25°C
8
100
50
VI = 13 V to 20 V
3
TJ = +25°C, IO = 5 mA to 1.5 A
IO = 5 mA to 1 mA
12
12
5
100
100
50
Regload
IQ
mV
mA
mA
IO = 250 mA to 750 mA
TJ = +25°C
Quiescent Current
5
6
I
O = 5 mA to 1.0 A
0.5
0.8
0.5
ΔIQ
Quiescent Current Change
VI = 12.8 V to 25 V, IO = 500 mA
VI = 13 V to 26 V, TJ = +25°C
IO = 5 mA
ΔV/ΔT
Output Voltage Drift(26)
Output Noise Voltage
-1
mV/°C
μV
VN
f = 10 Hz to 100 kHz, TA = +25°C
58
f = 120 Hz, IO = 500 mA,
VI = 14 V to 24 V
RR
Ripple Rejection(26)
62
dB
VDrop
RO
Dropout Voltage
IO = 1 A, TJ = +25°C
f = 1 kHz
2
V
mΩ
mA
A
Output Resistance(26)
Short-Circuit Current
Peak Current(26)
17
ISC
VI = 35 V, TA = +25°C
TJ = +25°C
250
2.2
IPK
Notes:
25. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
26. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
15
Electrical Characteristics (KA7812AE)
Refer to the test circuit, 0°C < TJ < +125°C, IO = 1 A, VI = 19 V, CI= 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
TJ = +25°C
Min.
Typ. Max.
Unit
11.75
12.00 12.25
VO
Output Voltage
V
IO = 5 mA to 1 A, PO ≤ 15 W,
VI = 14.8 V to 27 V
11.50
12.00 12.50
VI = 14.8 V to 30 V, IO = 500 mA
VI= 16 V to 22 V
10
4
120
120
120
60
Regline
Line Regulation(27)
Load Regulation(27)
mV
VI= 14.5 V to 27 V
TJ = +25°C
10
3
VI= 16 V to 22 V
TJ = +25°C, IO = 5 mA to 1.5 A
IO = 5 mA to 1.0 A
12
12
5
100
100
50
Regload
IQ
mV
mA
mA
IO = 250 mA to 750 mA
TJ = +25°C
Quiescent Current
5.1
6.0
0.8
0.8
0.5
VI = 15 V to 30 V, TJ = +25°C
VI = 14 V to 27 V, IO = 500 mA
IO = 5 mA to 1.0 A
ΔIQ
Quiescent Current Change
ΔV/ΔT
Output Voltage Drift(28)
Output Noise Voltage
IO = 5 mA
-1
mV/°C
μV
VN
f = 10 Hz to 100 kHz, TA = +25°C
76
f = 120 Hz, IO = 500 mA,
VI = 14 V to 24 V
RR
Ripple Rejection(28)
60
dB
VDrop
RO
Dropout Voltage
IO = 1 A, TJ = +25°C
f = 1 kHz
2
V
mΩ
mA
A
Output Resistance(28)
Short-Circuit Current
Peak Current(28)
18
ISC
VI = 35 V, TA = +25°C
TJ = +25°C
250
2.2
IPK
Notes:
27. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
28. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
16
Electrical Characteristics (KA7815AE)
Refer to the test circuit, 0°C < TJ < +125°C, IO = 1 A, VI = 23 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
TJ = +25°C
Min.
Typ. Max.
Unit
14.7
15.0
15.3
VO
Output Voltage
V
IO = 5 mA to 1 A, PO ≤ 15 W,
VI = 17.7 V to 30 V
14.4
15.0
15.6
VI = 17.9 V to 30 V, IO = 500 mA
VI = 20 V to 26 V
10
5
150
150
150
75
Line Regulation(29)
Load Regulation(29)
Regline
mV
VI = 17.5 V to 30 V
TJ = +25°C
11
3
VI = 20 V to 26 V
TJ = +25°C, IO = 5 mA to 1.5 A
IO = 5 mA to 1.0 A
12
12
5
100
100
50
Regload
IQ
mV
mA
mA
IO = 250 mA to 750 mA
TJ = +25°C
Quiescent Current
5.2
6.0
0.8
0.8
0.5
VI = 17.5 V to 30 V, TJ = +25°C
VI = 17.5 V to 30 V, IO = 500 mA
IO = 5 mA to 1.0 A
ΔIQ
Quiescent Current Change
ΔV/ΔT
Output Voltage Drift(30)
Output Noise Voltage
IO = 5 mA
-1
mV/°C
μV
VN
f = 10 Hz to 100 kHz, TA = +25°C
90
f = 120 Hz, IO = 500 mA,
VI = 18.5 V to 28.5 V
RR
Ripple Rejection(30)
58
dB
VDrop
RO
Dropout Voltage
IO = 1 A, TJ = +25°C
f = 1 kHz
2
V
mΩ
mA
A
Output Resistance(30)
Short-Circuit Current
Peak Current(30)
19
ISC
VI = 35 V, TA = +25°C
TJ = +25°C
250
2.2
IPK
Notes:
29. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
30. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
17
Electrical Characteristics (KA7824AE)
Refer to the test circuit, 0°C < TJ < +125°C, IO =1 A, VI = 33 V, CI = 0.33 μF, CO = 0.1 μF, unless otherwise specified.
Symbol
Parameter
Conditions
TJ = +25°C
Min.
Typ. Max.
Unit
23.5
24.0
24.5
VO
Output Voltage
V
IO = 5 mA to 1 A, PO ≤15 W,
VI = 27.3 V to 38 V
23.0
24.0
25.0
VI = 27 V to 38 V, IO = 500 mA
VI = 21 V to 33 V
18
6
240
240
240
120
100
100
50
Line Regulation(31)
Load Regulation(31)
Regline
mV
VI = 26.7 V to 38 V
TJ = +25°C
18
6
VI = 30 V to 36 V
TJ = +25°C, IO = 5 mA to 1.5 A
IO = 5 mA to 1.0 A
15
15
7
Regload
IQ
mV
mA
mA
IO = 250 mA to 750 mA
TJ = +25°C
Quiescent Current
5.2
6.0
0.8
0.8
0.5
VI = 27.3 V to 38 V, TJ = +25°C
VI = 27.3 V to 38 V, IO = 500 mA
IO = 5 mA to 1.0 A
ΔIQ
Quiescent Current Change
ΔV/ΔT
Output Voltage Drift(32)
Output Noise Voltage
IO = 5 mA
-1.5
120
mV/°C
μV
VN
f = 10 Hz to 100 kHz, TA = +25°C
f = 120 Hz, IO = 500 mA,
VI = 28 V to 38 V
RR
Ripple Rejection(32)
54
dB
VDrop
RO
Dropout Voltage
IO = 1 A, TJ = +25°C
f = 1 kHz
2
V
mΩ
mA
A
Output Resistance(32)
Short-Circuit Current
Peak Current(32)
20
ISC
VI = 35 V, TA = +25°C
TJ = +25°C
250
2.2
IPK
Notes:
31. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must
be taken into account separately. Pulse testing with low duty is used.
32. These parameters, although guaranteed, are not 100% tested in production.
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
18
Typical Performance Characteristics
6
3
2.5
2
VI = 10V
VO = 5V
IO = 5mA
TJ = 25°C
ΔVO = 100mV
5.75
5.5
5.25
5
1.5
1
4.75
.5
4.5
0
-50
-25
0
25
50
75
100 125
0
5
10
15
20
25
30
35
JUNCTION TEMPERATURE (°C)
INPUT-OUTPUT DIFFERENTIAL (V)
Figure 3. Peak Output Current
Figure 2. Quiescent Current
1.02
7
VI – VO = 5V
IO = 5mA
TJ = 25°C
VO = 5V
IO = 10mA
6.5
1.01
1
6
5.5
5
0.99
0.98
4.5
4
-50
-25
0
25
50
75
100 125
5
10
15
20
25
30
35
JUNCTION TEMPERATURE (°C)
INPUT VOLTAGE (V)
Figure 4. Output Voltage
Figure 5. Quiescent Current
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
19
Typical Applications
3
1
KA78XXE
Output
Input
2
CO
CI
0.1 μF
0.33 μF
Figure 6. DC Parameters
1
3
KA78XXE
Input
Output
270 pF
RL
2
VO
OV
30 μS
2N6121
OR EQ
VO
0.33 μF
100 Ω
Figure 7. Load Regulation
5.1 Ω
1
3
KA78XXE
Input
Output
RL
2
0.33 μF
470 μF
120 Hz
+
Figure 8. Ripple Rejection
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
20
Typical Applications (Continued)
3
1
KA78XXE
Output
Input
2
CO
CI
0.1μF
0.33μF
Figure 9. Fixed Output Regulator
3
1
Output
KA78XXE
Input
CI
2
CO
Vxx
0.1 μF
0.33 μF
R1
IQ
IO
RL
Vxx
R1
IO =
+
IQ
Figure 10. Constant Current Regulator
Notes:
33. To specify an output voltage, substitute voltage value for “XX”. A common ground is required between the input and
the output voltage. The input voltage must remain typically 2.0 V above the output voltage even during the low
point on the input ripple voltage.
34. CI is required if regulator is located an appreciable distance from power supply filter.
35. CO improves stability and transient response.
Output
3
1
KA78XXE
Input
Vxx
2
CO
R1
R2
CI
0.1 μF
0.33 μF
IQ
IRI ≥ 5IQ
VO = VXX(1+R2/R1) + IQR2
Figure 11. Circuit for Increasing Output Voltage
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
21
Typical Applications (Continued)
Output
Input
1
3
KA7805E
2
CO
0.1μF
-
CI
2
3
0.33μF
6
KA741
10KΩ
+
4
IRI ≥ 5 IQ
VO = VXX(1+R2/R1) + IQR2
Figure 12. Adjustable Output Regulator (7 V to 30 V)
Input
VI
IQ1
Output
Vo
R1
1
3
KA78XXE
3 Ω
Io
IREG
0.33 μF
2
0.1 μF
IO = IREG + BQ1 (IREG-VBEQ1/R1)
Figure 13. High-Current Voltage Regulator
Q1
Input
VI
Q2
Vo
R1
1
3
KA78XXE
Output
3 Ω
2
0.1 μF
0.33 μF
Q1 = TIP42
Q2 = TIP42
VBEQ2
RSC =
ISC
Figure 14. High Output Current with Short-Circuit Protection
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
22
Typical Applications (Continued)
3
1
KA78XXE
VO
VI
2
0.33 μF
0.1 μF
4.7 kΩ
COMMON
7
2
_
COMMON
6
KA741
+
3
4.7 kΩ
4
-VIN
-VO
TIP42
Figure 15. Tracking Voltage Regulator
1
3
KA7815E
+20 V
+15 V
2
0.1 μF
μ
1N4001
1N4001
0.33 F
2.2 μF
+
1 μF
+
1
KA7915E
2
3
-20 V
-15 V
Figure 16. Split-Power Supply (±15 V - 1 A)
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
23
Typical Applications (Continued)
Output
Input
+
0.1 μF
2
1
KA78XXE
Figure 17. Negative Output Voltage Circuit
D45H11
1mH
Output
Input
470 Ω
4.7 Ω
Z1
3
1
KA78XXE
+
2
0.33 μF
10 μF
+
0.5 Ω
2000 μF
Figure 18. Switching Regulator
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
24
Physical Dimensions
Figure 19. TO-220, MOLDED, 3-LEAD, NON-JEDEC, VARIATION AB (DUAL GUAGE)
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
25
Physical Dimensions (Continued)
)
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Figure 20. 3-LEAD, TO-252, NOT COMPLIANT TO JEDEC TO-252 VAR. AB, SURFACE MOUNT (DPAK)
© 2006 Fairchild Semiconductor Corporation
KA78XXE / KA78XXAE Rev. 1.9
www.fairchildsemi.com
26
TRADEMARKS
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not
intended to be an exhaustive list of all such trademarks.
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F-PFS¥
®*
FRFET®
Global Power ResourceSM
GreenBridge¥
Green FPS¥
Green FPS¥ e-Series¥
Gmax¥
TinyBoost®
TinyBuck®
TinyCalc¥
TinyLogic®
TINYOPTO¥
TinyPower¥
TinyPWM¥
TinyWire¥
TranSiC¥
®
AX-CAP®*
Power Supply WebDesigner¥
PowerTrench®
PowerXS™
BitSiC¥
Build it Now¥
CorePLUS¥
CorePOWER¥
CROSSVOLT¥
CTL¥
Programmable Active Droop¥
GTO¥
IntelliMAX¥
QFET®
QS¥
ISOPLANAR¥
Making Small Speakers Sound Louder
and Better™
MegaBuck¥
MICROCOUPLER¥
MicroFET¥
Quiet Series¥
RapidConfigure¥
¥
Current Transfer Logic¥
DEUXPEED®
Dual Cool™
EcoSPARK®
EfficientMax¥
TriFault Detect¥
TRUECURRENT®*
μSerDes¥
Saving our world, 1mW/W/kW at a time™
SignalWise¥
SmartMax¥
ESBC¥
MicroPak¥
SMART START¥
Solutions for Your Success¥
SPM®
®
UHC®
MicroPak2¥
MillerDrive¥
MotionMax¥
MotionGrid®
Ultra FRFET¥
UniFET¥
VCX¥
VisualMax¥
VoltagePlus¥
XS™
Fairchild®
Fairchild Semiconductor®
FACT Quiet Series¥
FACT®
STEALTH¥
SuperFET®
MTi®
SuperSOT¥-3
MTx®
FAST®
SuperSOT¥-6
SuperSOT¥-8
SupreMOS®
MVN®
FastvCore¥
FETBench¥
FPS¥
mWSaver®
Xsens™
OptoHiT¥
❺
™
SyncFET¥
Sync-Lock™
OPTOLOGIC®
* Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE
RELIABILITY, FUNCTION, OR DESIGN. TO OBTAIN THE LATEST, MOST UP-TO-DATE DATASHEET AND PRODUCT INFORMATION, VISIT OUR WEBSITE
AT HTTP://WWW.FAIRCHILDSEMI.COM. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY
THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE
EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are
intended for surgical implant into the body or (b) support or sustain
life, and (c) whose failure to perform when properly used in
accordance with instructions for use provided in the labeling, can be
reasonably expected to result in a significant injury of the user.
2. A critical component in any component of a life support, device, or
system whose failure to perform can be reasonably expected to
cause the failure of the life support device or system, or to affect its
safety or effectiveness.
ANTI-COUNTERFEITING POLICY
Fairchild Semiconductor Corporation's Anti-Counterfeiting Policy. Fairchild's Anti-Counterfeiting Policy is also stated on our external website, www.fairchildsemi.com,
under Sales Support.
Counterfeiting of semiconductor parts is a growing problem in the industry. All manufacturers of semiconductor products are experiencing counterfeiting of their
parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed
applications, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the
proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild
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are genuine parts, have full traceability, meet Fairchild's quality standards for handling and storage and provide access to Fairchild's full range of up-to-date technical
and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address any warranty issues that may arise.
Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is committed to combat this global
problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Datasheet contains the design specifications for product development. Specifications may change
in any manner without notice.
Advance Information
Formative / In Design
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild
Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make
changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor.
The datasheet is for reference information only.
Preliminary
No Identification Needed
Obsolete
First Production
Full Production
Not In Production
Rev. I74
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