MMBD701LT3G [ONSEMI]

Silicon Hot−Carrier Diodes Schottky Barrier Diodes; 硅热载流子二极管肖特基势垒二极管
MMBD701LT3G
型号: MMBD701LT3G
厂家: ONSEMI    ONSEMI
描述:

Silicon Hot−Carrier Diodes Schottky Barrier Diodes
硅热载流子二极管肖特基势垒二极管

二极管
文件: 总4页 (文件大小:65K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
MBD701, MMBD701LT1  
Preferred Device  
Silicon Hot−Carrier Diodes  
Schottky Barrier Diodes  
These devices are designed primarily for high−efficiency UHF and  
VHF detector applications. They are readily adaptable to many other  
fast switching RF and digital applications. They are supplied in an  
inexpensive plastic package for low−cost, high−volume consumer  
and industrial/commercial requirements. They are also available in a  
Surface Mount package.  
http://onsemi.com  
MARKING  
DIAGRAMS  
Features  
TO−92 2−Lead  
CASE 182  
STYLE 1  
Extremely Low Minority Carrier Lifetime − 15 ps (Typ)  
MBD  
701  
Very Low Capacitance − 1.0 pF @ V = 20 V  
R
AYWW G  
High Reverse Voltage − to 70 V  
Low Reverse Leakage − 200 nA (Max)  
Pb−Free Packages are Available  
1
G
2
2
1
CATHODE  
ANODE  
MAXIMUM RATINGS  
SOT−23 (TO−236)  
CASE 318  
Rating  
Reverse Voltage  
Symbol  
Value  
Unit  
3
STYLE 6  
V
R
70  
V
1
5H M G  
G
Forward Power Dissipation  
P
F
2
@ T = 25°C  
MBD701  
280  
200  
mW  
3
1
A
1
MMBD701LT  
CATHODE  
ANODE  
Derate above 25°C  
MBD701  
MMBD701LT  
2.8  
2.0  
mW/°C  
°C  
A
Y
= Assembly Location  
= Year  
Operating Junction Temperature  
Range  
T
J
−55 to +125  
WW = Work Week  
5H = Device Code (SOT−23)  
Storage Temperature Range  
T
stg  
−55 to +150  
°C  
M
= Date Code*  
Stresses exceeding Maximum Ratings may damage the device. Maximum  
Ratings are stress ratings only. Functional operation above the Recommended  
Operating Conditions is not implied. Extended exposure to stresses above the  
RecommendedOperating Conditions may affect device reliability.  
G
= Pb−Free Package  
(Note: Microdot may be in either location)  
*Date Code orientation and/or overbar may vary  
dependingupon manufacturing location.  
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise noted)  
A
ORDERING INFORMATION  
Characteristic  
Symbol Min Typ Max  
Unit  
Device  
MBD701  
Package  
Shipping  
Reverse Breakdown Voltage  
V
(BR)R  
70  
V
TO−92  
1,000 Units / Box  
1,000 Units / Box  
(I = 10 mAdc)  
R
MBD701G  
TO−92  
(Pb−Free)  
Total Capacitance  
C
T
0.5  
1.0  
pF  
nAdc  
Vdc  
Vdc  
(V = 20 V, f = 1.0 MHz) Figure 1  
R
MMBD701LT1  
SOT−23 3,000 / Tape & Reel  
Reverse Leakage  
I
9.0 200  
0.42 0.5  
R
MMBD701LT1G  
SOT−23 3,000 / Tape & Reel  
(Pb−Free)  
(V = 35 V) Figure 3  
R
Forward Voltage  
V
V
F
MMBD701LT3  
SOT−23 10,000/Tape & Reel  
(I = 1.0 mAdc) Figure 4  
F
MMBD701LT3G  
SOT−23 10,000/Tape & Reel  
(Pb−Free)  
Forward Voltage  
0.7  
1.0  
F
(I = 10 mAdc) Figure 4  
F
†For information on tape and reel specifications,  
including part orientation and tape sizes, please  
refer to our Tape and Reel Packaging Specifications  
Brochure, BRD8011/D.  
Preferred devices are recommended choices for future use  
and best overall value.  
©
Semiconductor Components Industries, LLC, 2006  
1
Publication Order Number:  
October, 2006 − Rev. 4  
MBD701/D  
MBD701, MMBD701LT1  
TYPICAL ELECTRICAL CHARACTERISTICS  
500  
2.0  
1.6  
1.2  
0.8  
0.4  
0
f = 1.0 MHz  
400  
KRAKAUER METHOD  
300  
200  
100  
0
0
5.0  
10  
15  
20  
25  
30  
35  
40  
45  
50  
0
10  
20  
30  
40  
50  
60  
70  
80  
90 100  
V , REVERSE VOLTAGE (VOLTS)  
R
I , FORWARD CURRENT (mA)  
F
Figure 1. Total Capacitance  
Figure 2. Minority Carrier Lifetime  
10  
100  
10  
T = 100°C  
A
1.0  
T = ꢀ40°C  
A
T = 85°C  
A
T = 75°C  
A
0.1  
1.0  
0.1  
T = 25°C  
A
0.01  
T = 25°C  
A
0.001  
0
10  
20  
30  
40  
50  
0
0.2  
0.4  
0.8  
1.2  
1.6  
2.0  
V , REVERSE VOLTAGE (VOLTS)  
R
V , FORWARD VOLTAGE (VOLTS)  
F
Figure 3. Reverse Leakage  
Figure 4. Forward Voltage  
I
F(PEAK)  
CAPACITIVE  
CONDUCTION  
I
R(PEAK)  
FORWARD  
STORAGE  
CONDUCTION  
CONDUCTION  
BALLAST  
NETWORK  
(PADS)  
SAMPLING  
OSCILLOSCOPE  
(50 W INPUT)  
SINUSOIDAL  
GENERATOR  
PADS  
DUT  
Figure 5. Krakauer Method of Measuring Lifetime  
http://onsemi.com  
2
MBD701, MMBD701LT1  
PACKAGE DIMENSIONS  
TO−92 (TO−226AC)  
CASE 182−06  
ISSUE L  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
A
B
2. CONTROLLING DIMENSION: INCH.  
3. CONTOUR OF PACKAGE BEYOND ZONE R IS  
UNCONTROLLED.  
R
4. LEAD DIMENSION IS UNCONTROLLED IN P AND  
BEYOND DIMENSION K MINIMUM.  
SEATING  
PLANE  
D
INCHES  
DIM MIN MAX  
MILLIMETERS  
L
P
MIN  
4.45  
4.32  
3.18  
0.407  
MAX  
5.21  
5.33  
4.19  
0.533  
A
B
C
D
G
H
J
0.175  
0.170  
0.125  
0.016  
0.205  
0.210  
0.165  
0.021  
J
K
0.050 BSC  
0.100 BSC  
1.27 BSC  
2.54 BSC  
0.36  
SECTION X−X  
X X  
0.014  
0.016  
−−−  
−−−  
0.41  
−−−  
−−−  
2.66  
1.27  
−−−  
−−−  
D
K
L
0.500  
0.250  
0.080  
−−−  
12.70  
6.35  
2.03  
−−−  
G
N
P
R
V
0.105  
0.050  
−−−  
H
0.115  
0.135  
2.93  
3.43  
−−−  
V
C
STYLE 1:  
PIN 1. ANODE  
2. CATHODE  
1
2
N
N
http://onsemi.com  
3
MBD701, MMBD701LT1  
PACKAGE DIMENSIONS  
SOT−23 (TO−236)  
CASE 318−08  
ISSUE AN  
NOTES:  
D
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
SEE VIEW C  
2. CONTROLLING DIMENSION: INCH.  
3. MAXIMUM LEAD THICKNESS INCLUDES LEAD  
FINISH THICKNESS. MINIMUM LEAD  
THICKNESS IS THE MINIMUM THICKNESS OF  
BASE MATERIAL.  
4. 318−01 THRU −07 AND −09 OBSOLETE, NEW  
STANDARD 318−08.  
3
H
E
E
c
1
2
MILLIMETERS  
INCHES  
DIM  
A
A1  
b
c
D
E
e
L
L1  
MIN  
0.89  
0.01  
0.37  
0.09  
2.80  
1.20  
1.78  
0.10  
0.35  
NOM  
1.00  
0.06  
0.44  
0.13  
2.90  
1.30  
1.90  
0.20  
0.54  
MAX  
1.11  
0.10  
0.50  
0.18  
3.04  
1.40  
2.04  
0.30  
0.69  
MIN  
NOM  
0.040  
0.002  
0.018  
0.005  
0.114  
0.051  
0.075  
0.008  
0.021  
MAX  
0.044  
0.004  
0.020  
0.007  
0.120  
0.055  
0.081  
0.012  
0.029  
b
0.25  
0.035  
0.001  
0.015  
0.003  
0.110  
0.047  
0.070  
0.004  
0.014  
e
q
A
L
A1  
L1  
VIEW C  
H
E
2.10  
2.40  
2.64  
0.083  
0.094  
0.104  
STYLE 6:  
PIN 1. BASE  
2. EMITTER  
3. COLLECTOR  
SOLDERING FOOTPRINT*  
0.95  
0.037  
0.95  
0.037  
2.0  
0.079  
0.9  
0.035  
mm  
inches  
ǒ
Ǔ
SCALE 10:1  
0.8  
0.031  
*For additional information on our Pb−Free strategy and soldering  
details, please download the ON Semiconductor Soldering and  
MountingTechniques Reference Manual, SOLDERRM/D.  
ON Semiconductor and  
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice  
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any  
liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental  
damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over  
time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under  
its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body,  
or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death  
may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees,  
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personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part.  
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For additional information, please contact your local  
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MBD701/D  

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