N01S830HA_16 [ONSEMI]

1 Mb Ultra-Low Power Serial SRAM;
N01S830HA_16
型号: N01S830HA_16
厂家: ONSEMI    ONSEMI
描述:

1 Mb Ultra-Low Power Serial SRAM

静态存储器
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中文:  中文翻译
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N01S830HA, N01S830BA  
1 Mb Ultra-Low Power  
Serial SRAM  
Standard SPI Interface and Multiplex  
DUAL and QUAD Interface  
www.onsemi.com  
Overview  
The ON Semiconductor serial SRAM family includes several  
integrated memory devices including this 1 Mb serially accessed  
Static Random Access Memory, internally organized as 128 K words  
by 8 bits. The devices are designed and fabricated using  
ON Semiconductor’s advanced CMOS technology to provide both  
high-speed performance and low power. The devices operate with a  
single chip select (CS) input and use a simple Serial Peripheral  
Interface (SPI) protocol. In SPI mode, a single data-in (SI) and  
data-out (SO) line is used along with the clock (SCK) to access data  
within the device. In DUAL mode, two multiplexed data-in/data-out  
(SIO0-SIO1) lines are used and in QUAD mode, four multiplexed  
data-in/data-out (SIO0-SIO3) lines are used with the clock to access  
the memory. The devices can operate over a wide temperature range of  
−40°C to +85°C (+125°C for E−Temp) and are available in a 8-lead  
TSSOP package. The N01S830xA device has two different variations,  
a HOLD version that allows communication to the device to be paused  
and a battery back-up (BBU) version to be used with a battery to retain  
data when power is lost.  
TSSOP8 3x4.4  
CASE 948BH  
PACKAGE CONFIGURATION  
1
2
3
4
8
7
6
5
CS  
SO / SIO1  
NC / SIO2  
VSS  
VCC  
HOLD / SIO3  
SCK  
SI / SIO0  
HOLD Version  
1
2
3
4
8
7
6
5
CS  
SO / SIO1  
NC  
VCC  
VBAT  
SCK  
Features  
Power Supply Range: 2.5 to 5.5 V  
Very Low Typical Standby Current < 4 mA at +85°C  
Very Low Operating Current < 10 mA  
VSS  
SI / SIO0  
BBU Version  
Simple Serial Interface  
ORDERING INFORMATION  
Single-bit SPI Access  
DUAL-bit and QUAD-bit SPI-like Access  
Device  
Package  
Shipping  
Flexible Operating Modes  
N01S830HAT22I  
N01S830BAT22I  
N01S830HAT22IT  
N01S830BAT22IT  
N01S830HAT22E  
N01S830BAT22E  
N01S830HAT22ET  
N01S830BAT22ET  
TSSOP−8  
(Pb−Free)  
Word Mode  
100 Units / Tube  
Page Mode  
Burst Mode (Full Array)  
3000 / Tape  
& Reel  
TSSOP−8  
(Pb−Free)  
High Frequency Read and Write Operation  
Clock Frequency up to 20 MHz  
Functional Options  
TSSOP−8  
(Pb−Free)  
100 Units / Tube  
HOLD Pin for Pausing Operation  
VBAT Pin for Battery−Back up  
Built-in Write Protection (CS High)  
3000 / Tape  
& Reel  
TSSOP−8  
(Pb−Free)  
High Reliability  
†For information on tape and reel specifications,  
including part orientation and tape sizes, please  
refer to our Tape and Reel Packaging Specification  
Brochure, BRD8011/D.  
Unlimited Write Cycles  
Temperature Ranges Supported  
Industrial (I): T = −40°C to +85°C  
A
Automotive (E): T = −40°C to +125°C  
A
These Devices are Pb−Free and are RoHS Compliant  
Green TSSOP  
© Semiconductor Components Industries, LLC, 2016  
1
Publication Order Number:  
February, 2016 − Rev. 2  
N01S830HA/D  
N01S830HA, N01S830BA  
Table 1. DEVICE OPTIONS  
Device / Part Number  
Temperature  
Range  
Power Supply  
Speed  
Package  
Function  
N01S830HAT22  
HV 2.5 V − 5.5 V  
20 MHz for I−Temp,  
16 MHz E−Temp  
TSSOP−8  
I, E  
HOLD  
N01S830BAT22  
HV 2.5 V − 5.5 V  
20 MHz for I−Temp,  
16 MHz E−Temp  
TSSOP−8  
I, E  
BBU − Battery Back-up  
Table 2. PIN NAMES  
Pin Name  
Pin Function  
CS  
Chip Select  
Serial Clock  
SCK  
SI / SIO0  
Data Input − SPI mode  
Data Input/Output 0 − DUAL and QUAD mode  
SO / SIO1  
NC / SIO2  
HOLD / SIO3  
Data Output − SPI mode  
Data Input/Output 1 − DUAL and QUAD mode  
No Connect − SPI and DUAL mode  
Data Input/Output 2 − QUAD mode  
HOLD Version  
HOLD Input − SPI and DUAL mode  
Data Input/Output 3 − QUAD mode  
VBAT  
BBU Version  
Battery Supply − SPI and DUAL mode  
V
V
Power  
CC  
Ground  
SS  
Decode  
Logic  
SCK  
CS  
Interface  
Circuitry  
Control  
Logic  
SRAM  
Array  
SI / SIO0  
SO / SIO1  
Data Flow  
Circuitry  
SIO2  
HOLD / SIO3  
(HOLD Version)  
Battery Controls  
VBAT  
(BBU Version)  
Figure 1. Functional Block Diagram  
Table 3. CONTROL SIGNAL DESCRIPTIONS  
Mode  
Used  
Signal  
Name  
Description  
CS  
All  
Chip Select  
A low level selects the device and a high level puts the device in standby mode. If CS is brought  
high during a program cycle, the cycle will complete and then the device will enter standby mode.  
When CS is high, SO is in high-Z. CS must be driven low after power-up prior to any sequence  
being started.  
SCK  
All  
Serial Clock  
Synchronizes all activities between the memory and controller. All incoming addresses, data and  
instructions are latched on the rising edge of SCK. Data out is updated after the falling edge of  
SCK.  
SI  
SPI  
SPI  
Serial Data In  
Receives instructions, addresses and data on the rising edge of SCK.  
SO  
Serial Data Out Data is transferred out after the falling edge of SCK.  
www.onsemi.com  
2
 
N01S830HA, N01S830BA  
Table 3. CONTROL SIGNAL DESCRIPTIONS  
Mode  
Used  
Signal  
Name  
Description  
HOLD  
SPI and  
DUAL  
Hold  
A high level is required for normal operation. Once the device is selected and a serial sequence  
is started, this input may be taken low to pause serial communication without resetting the serial  
sequence. The pin must be brought low while SCK is low for immediate use. If SCK is not low,  
the HOLD function will not be invoked until the next SCK high to low transition. The device must  
remain selected during this sequence. SO is high-Z during the Hold time and SI and SCK are  
inputs are ignored. To resume operations, HOLD must be pulled high while the SCK pin is low.  
Lowering the HOLD input at any time will take to SO output to High-Z.  
VBAT  
SPI and Battery Voltage Provides the battery power connection to retain data in battery backed mode.  
DUAL  
SIO0 - 1  
DUAL  
Serial Data  
Input / Output  
Receives instructions, addresses and data on the rising edge of SCK. Data is transferred out  
after the falling edge of SCK. The instruction must be set after power-up to enable the DUAL  
access mode.  
SIO0 - 3  
QUAD  
Serial Data  
Input / Output  
Receives instructions, addresses and data on the rising edge of SCK. Data is transferred out  
after the falling edge of SCK. The instruction must be set after power-up to enable the QUAD  
access mode.  
Basic Operation  
The 1 Mb serial SRAM is designed to interface directly  
with a standard Serial Peripheral Interface (SPI) common on  
many standard micro-controllers in the default state. It may  
also interface with other non-SPI ports by programming  
discrete I/O lines to operate the device.  
The serial SRAM contains an 8-bit instruction register and  
is accessed via the SI pin. The CS pin must be low and the  
HOLD pin must be high for the entire operation. Data is  
sampled on the first rising edge of SCK after CS goes low.  
If the clock line is shared, the user can assert the HOLD input  
and place the device into a Hold mode. After releasing the  
HOLD pin, the operation will resume from the point where  
it was held. The Hold operation is only supported in SPI and  
DUAL modes.  
By programming the device through a command  
instruction, the dual and quad access modes may be initiated.  
In these modes, multiplexed I/O lines take the place of the  
SPI SI and SO pins and along with the CS and SCK control  
the device in a SPI-like, two bit (DUAL) and four bit  
(QUAD) wide serial manner. Once the device is put into  
either the DUAL or QUAD mode, the device will remain  
operating in that mode until powered down or the Reset  
Mode operation is programmed.  
The following table contains the possible instructions and  
formats. All instructions, addresses and data are transferred  
MSB first and LSB last.  
Table 4. INSTRUCTION SET  
Instruction  
READ  
Command  
03h  
Description  
Read data from memory starting at selected address  
WRITE  
EQIO  
02h  
Write (program) data to memory starting at selected address  
Enable QUAD I/O access  
38h  
EDIO  
3Bh  
Enable DUAL I/O access  
RSTQIO  
RDMR  
WRMR  
FFh  
Reset from QUAD and DUAL to SPI I/O access  
Read mode register  
05h  
01h  
Write mode register  
www.onsemi.com  
3
N01S830HA, N01S830BA  
DEVICE OPERATIONS  
Read Operation  
The serial SRAM Read operation is started by by enabling  
CS low. First, the 8-bit Read instruction is transmitted to the  
device through the SI (or SIO0-3) pin(s) followed by the  
24-bit address with the 7 MSBs of the address being “don’t  
care” bits and ignored. In SPI mode, after the READ  
instruction and address bits are sent, the data stored at that  
address in memory is shifted out on the SO pin after the  
output valid time. Additional “dummy” clock cycles (four in  
DUAL and two in QUAD) are required to follow the  
instruction and address inputs prior to the data being driven  
out on the SIO0-3 pins while operating in these two modes.  
By continuing to provide clock cycles to the device, data  
can continue to be read out of the memory array in  
sequentially. The internal address pointer is automatically  
incremented to the next higher address after each byte of  
data is read out until the highest memory address is reached.  
When the highest memory address is reached, 1FFFFh, the  
address pointer wraps to the address 00000h. This allows the  
read cycles to be continued indefinitely. All Read operations  
are terminated by pulling CS high.  
CS  
SCK  
0
1
2
3
4
5
6
7
8
9
10 11  
29 30 31 32 33 34 35 36 37 38 39  
Instruction  
24−bit address  
23 22 21 20  
SI  
0
0
0
0
0
0
1
1
2
1
0
Data Out  
High−Z  
7
6
5
4
3
2
1
0
SO  
Figure 2. SPI Read Sequence (Single Byte)  
CS  
SCK  
0
1
2
3
4
5
6
7
8
9
10 11  
29 30 31 32 33 34 35 36 37 38 39  
Instruction  
24−bit address  
SI  
0
0
0
0
0
0
1
1
23 22 21 20  
ADDR 1  
2
1
0
Don’t Care  
Data Out from ADDR 1  
High−Z  
7
6
5
4
3
2
1
0
SO  
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55  
Don’t Care  
Data Out from ADDR 3  
Data Out from ADDR 2  
Data Out from ADDR n  
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
...  
Figure 3. SPI Read Sequence (Sequential Bytes)  
www.onsemi.com  
4
N01S830HA, N01S830BA  
CS  
SCK  
0
1
2
3
4
5
12 13 14 15 16 17 18 19 20 21 22 23 24 25 26  
Instruction  
24−bit address  
Data out  
H0 H0 L0 L0 H1 H1 L1 L1  
MSB  
C3 C2 C1 C0 A11 A10  
A3 A2 A1 A0  
X
X
X
X
SIO[1:0]  
MSB  
Notes:  
C[3:0] = 03h  
H0 = 2 high order bits of data byte 0  
L0 = 2 low order bits of data byte 0  
H1 = 2 high order bits of data byte 1  
L1 = 2 low order bits of data byte 1  
Figure 4. DUAL Read Sequence  
CS  
SCK  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16  
Instruction  
24−bit address  
Data out  
H0 L0 H1 L1 H2 L2 H3 L3  
MSB  
SIO[3:0]  
C1 C0 A5 A4 A3 A2 A1 A0  
MSB  
X
X
Notes:  
C[1:0] = 03h  
H0 = 4 high order bits of data byte 0  
L0 = 4 low order bits of data byte 0  
H1 = 4 high order bits of data byte 1  
L1 = 4 low order bits of data byte 1  
Figure 5. QUAD Read Sequence  
Write Operation  
The serial SRAM WRITE is selected by enabling CS low.  
First, the 8-bit WRITE instruction is transmitted to the  
device followed by the 24-bit address with the 7 MSBs being  
don’t care. After the WRITE instruction and addresses are  
sent, the data to be stored in memory is shifted in on the SI  
pin.  
If operating in page mode, after the initial word of data is  
shifted in, additional data words can be written as long as the  
address requested is sequential on the same page. Simply  
write the data on SI pin and continue to provide clock pulses.  
The internal address pointer is automatically incremented to  
the next higher address on the page after each word of data  
is written in. This can be continued for the entire page length  
of 32 words long. At the end of the page, the addresses  
pointer will be wrapped to the 0 word address within the  
page and the operation can be continuously looped over the  
32 words of the same page. The new data will replace data  
already stored in the memory locations.  
If operating in burst mode, after the initial word of data is  
shifted in, additional data words can be written to the next  
sequential memory locations by continuing to provide clock  
pulses. The internal address pointer is automatically  
incremented to the next higher address after each word of  
data is read out. This can be continued for the entire array  
and when the highest address is reached, 1FFFFh, the  
address counter wraps to the address 00000h. This allows  
the burst write cycle to be continued indefinitely. Again, the  
new data will replace data already stored in the memory  
locations.  
All WRITE operations are terminated by pulling CS high.  
www.onsemi.com  
5
N01S830HA, N01S830BA  
CS  
SCK  
0
1
2
3
4
5
6
7
8
9
10 11  
29 30 31 32 33 34 35 36 37 38 39  
Data In to ADDR 1  
Instruction  
24−bit address  
0
0
0
0
0
0
1
0
23 22 21 20  
2
1
0
7
6
5
4
3
2
1
0
SI  
ADDR 1  
High−Z  
SO  
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55  
Data In to ADDR 2 Data In to ADDR 3  
Data In to ADDR n  
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
...  
High−Z  
Figure 6. SPI Write Sequence  
CS  
SCK  
0
1
2
3
4
5
12 13 14 15 16 17 18 19 20 21  
Instruction  
24−bit address  
Data in  
A3 A2 A1 A0 H0 H0 L0 L0 H1 H1  
MSB  
C3 C2 C1 C0 A11 A10  
Ln Ln  
SIO1:0]  
MSB  
Notes:  
C[3:0] = 02h  
H0 = 2 high order bits of data byte 0  
L0 = 2 low order bits of data byte 0  
H1 = 2 high order bits of data byte 1  
L1 = 2 low order bits of data byte 1  
Figure 7. DUAL Write Sequence  
www.onsemi.com  
6
N01S830HA, N01S830BA  
CS  
SCK  
0
1
2
3
4
5
6
7
8
9
10  
11 12 13  
Data in  
Instruction  
24−bit address  
SIO[3:0]  
C1 C0 A5 A4 A3 A2 A1 A0 H0 L0 H1 L1 H2 L2  
MSB MSB  
Hn Ln  
Notes: C[1:0] = 02h  
H0 = 4 high order bits of data byte 0  
L0 = 4 low order bits of data byte 0  
H1 = 4 high order bits of data byte 1  
L1 = 4 low order bits of data byte 1  
Figure 8. QUAD Write Sequence  
READ Mode Register (RDMR)  
This instruction provides the ability to read the mode  
register. The register may be read at any time including  
during a Write operation. The Read Mode Register  
operation is executed by driving CS low, then sending the  
RDMR instruction to the device. Immediately after the  
instruction, the device outputs data on the SO (SIO0-3)  
pin(s). To complete the operation, drive CS high to terminate  
the register read.  
CS  
SCK  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15  
Instruction  
0
0
0
0
0
1
0
1
SI  
Mode Register Data Out  
High−Z  
7
6
5
4
3
2
1
0
SO  
Figure 9. SPI Read Mode Register Sequence (RDMR)  
CS  
SCK  
0
1
2
3
4
5
6
7
Instruction  
Mode Bits  
Notes: C[3:0] = 05h  
SIO[1:0]  
C3 C2 C1 C0  
H
H
L
L
MSB  
Figure 10. DUAL Read Mode Register Sequence (RDMR)  
www.onsemi.com  
7
N01S830HA, N01S830BA  
CS  
SCK  
0
1
2
3
Instruction Mode Bits  
Notes: C[1:0] = 05h  
SIO[3:0]  
C1 C0  
H
L
MSB  
Figure 11. QUAD Read Mode Register Sequence (RDMR)  
Write Mode Register (WRMR)  
This instruction provides the ability to write the mode  
register. The Write Mode Register operation is executed by  
driving CS low, then sending the WRMR instruction to the  
device. Immediately after the instruction, the data is driven  
to the device on the SO (SIO0-3) pin(s). To complete the  
operation, drive CS high to terminate the register write.  
CS  
SCK  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15  
Instruction  
Mode Register Data In  
SI  
0
0
0
0
0
0
0
1
7
6
5
4
3
2
1
0
High−Z  
SO  
Figure 12. SPI Write Mode Register Sequence  
CS  
SCK  
0
1
2
3
4
5
6
7
Notes: C[3:0] = 01h  
Instruction  
Mode Bits  
SIO[1:0]  
C3 C2 C1 C0  
H
H
L
L
MSB  
Figure 13. DUAL Write Mode Register Sequence  
CS  
SCK  
0
1
2
3
Instruction Mode Bits  
Notes: C[1:0] = 01h  
C1 C0  
H
L
SIO[3:0]  
MSB  
Figure 14. QUAD Write Mode Register Sequence  
www.onsemi.com  
8
N01S830HA, N01S830BA  
Battery Back-Up Operation  
Table 5. MODE REGISTER  
Bit  
The Battery Back-Up function is available on the BBU  
version of the serial SRAM. This version of the SRAM  
cannot operate in the QUAD mode since the SIO3 input is  
used for the VBAT connection. A standard coin cell battery  
should be connected to the VBAT pin. On chip circuitry  
Function  
0
Hold Function  
1 = Hold function disabled  
0 = Hold function enabled (Default)  
monitors the V pin and when it is determined that the main  
1
2
3
4
5
6
Reserved  
CC  
V
CC  
power supply is turning off, the device automatically  
Reserved  
switches the memory array to VBAT power input. When in  
battery back-up mode and 3.0 to 3.4 V power supplied to the  
VBAT input, memory data is retained in the SRAM array  
and all existing interface and operating mode information is  
retained.  
Reserved  
Reserved  
Reserved  
Operating Mode  
Bit 7  
Bit 6  
VCC  
0
1
0
1
0 = Word Mode  
0 = Page Mode  
1 = Burst Mode (Default)  
1 = Reserved  
CS  
VBAT  
7
SO  
Serial  
SRAM  
NC  
SCK  
SI  
Coin Cell Battery  
3.0 to 3.4 V  
Power-Up State  
VSS  
The serial SRAM enters a know state at power-up time.  
The device is in low-power standby state with CS = 1. A low  
level on CS is required to enter a active state.  
Figure 15. Battery Back-Up Version Schematics  
Table 6. ABSOLUTE MAXIMUM RATINGS  
Item  
Symbol  
Rating  
Units  
V
Voltage on any pin relative to V  
V
–0.3 to V + 0.3  
SS  
IN,OUT  
CC  
Voltage on V Supply Relative to V  
V
CC  
–0.3 to 5.5  
500  
V
CC  
SS  
Power Dissipation  
P
D
mW  
°C  
Storage Temperature  
T
STG  
−40°C to 125°C  
−40°C to +125°C  
260°C, 10 sec  
Ambient Temperature Under Bias  
Soldering Temperature and Time  
T
A
°C  
T
°C  
SOLDER  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
Table 7. OPERATING CHARACTERISTICS (Industrial (I): T = −40°C to +85°C, Automotive (E): T = −40°C to +125°C)  
A
A
Item  
Symbol  
Test Conditions  
Min  
2.5  
1.0  
Typ (Note 1)  
Max  
Units  
V
Supply Voltage  
V
5.5  
CC  
DR  
Data Retention Voltage  
Input High Voltage  
Input Low Voltage  
Output High Voltage  
Output Low Voltage  
Input Leakage Current  
Output Leakage Current  
Operating Current  
V
V
V
IH  
0.7 V  
V + 0.3  
CC  
V
CC  
V
IL  
−0.3  
V − 0.2  
CC  
0.1 V  
V
CC  
V
OH  
I
= −0.4 mA  
V
OH  
V
OL  
I
LI  
I
OL  
= 1 mA  
0.2  
1.0  
1.0  
10  
V
CS = V , V = 0 to V  
mA  
mA  
mA  
CC  
IN  
CC  
I
CS = V , V  
= 0 to V  
OUT CC  
LO  
CC  
CC  
I
f = 20 MHz, I  
= 0, SPI / DUAL  
OUT  
f = 20 MHz, I  
= 0, QUAD  
20  
OUT  
Standby Current  
I
SB  
CS = V , V = V or V , I−Temp  
4
10  
mA  
CC  
IN  
SS  
CC  
CS = V , V = V or V , E−Temp  
20  
CC  
IN  
SS  
CC  
1. Typical values are measured at V = V Typ., T = 25°C and are not 100% tested.  
CC  
CC  
A
www.onsemi.com  
9
 
N01S830HA, N01S830BA  
Table 8. CAPACITANCE (Note 2)  
Item  
Input Capacitance  
I/O Capacitance  
Symbol  
Test Conditions  
Min  
Max  
7
Units  
pF  
C
V
V
= 0 V, f = 1 MHz, T = 25°C  
IN  
IN  
A
C
= 0 V, f = 1 MHz, T = 25°C  
7
pF  
I/O  
IN  
A
2. These parameters are verified in device characterization and are not 100% tested.  
Table 9. TIMING TEST CONDITIONS  
Item  
Input Pulse Level  
Value  
0.1 V to 0.9 V  
CC  
CC  
Input Rise and Fall Time  
Input and Output Timing Reference Levels  
Output Load  
5 ns  
0.5 V  
CC  
CL = 30 pF  
Industrial (I): −40°C to +85°C  
Operating Temperature  
Automotive (E): −40°C to +125°C  
Table 10. TIMING  
I−Temp  
E−Temp  
Min  
Max  
20  
Min  
Max  
16  
Characteristic  
Clock Frequency  
Symbol  
Units  
MHz  
ns  
f
CLK  
Clock Rise Time  
t
R
20  
20  
Clock Fall Time  
t
F
20  
20  
ns  
Clock High Time  
t
25  
25  
25  
25  
50  
25  
5
32  
32  
32  
32  
50  
32  
5
ns  
HI  
Clock Low Time  
t
LO  
ns  
Clock Delay Time  
CS Setup Time  
t
ns  
CLD  
CSS  
CSH  
CSD  
t
ns  
CS Hold Time  
t
t
ns  
CS Disable Time  
SCK to CS  
ns  
t
ns  
SCS  
Data Setup Time  
Data Hold Time  
t
10  
10  
10  
10  
ns  
SU  
t
ns  
HD  
Output Valid From Clock Low  
Output Hold Time  
Output Disable Time  
HOLD Setup Time  
HOLD Hold Time  
HOLD Low to Output High−Z  
HOLD High to Output Valid  
t
25  
20  
32  
20  
ns  
V
t
0
0
ns  
HO  
t
ns  
RDIS  
t
10  
10  
10  
10  
10  
10  
ns  
HS  
t
ns  
HH  
t
HZ  
ns  
t
50  
50  
ns  
HV  
www.onsemi.com  
10  
 
N01S830HA, N01S830BA  
tCSD  
tCLD  
CS  
tR  
tF  
tCSH  
tSCS  
tCSS  
SCK  
tSU  
tHD  
MSB in  
LSB in  
SI  
High−Z  
SO  
Figure 16. SPI Input Timing  
CS  
tLO tHI  
tCSH  
SCK  
tV  
MSB out  
tDIS  
SO  
SI  
LSB out  
Don’t Care  
Figure 17. SPI Output Timing  
CS  
tHS  
tHH  
tHS  
SCK  
SO  
tHH  
n
tHV  
High−Z  
n+2  
n+1  
tHZ  
n
n−1  
tSU  
Don’t Care  
n
n−1  
SI  
n+2  
n+1  
n
HOLD  
Figure 18. SPI Hold Timing  
www.onsemi.com  
11  
N01S830HA, N01S830BA  
tCSD  
tCLD  
CS  
SCK  
SI0  
tR  
tF  
tCSH  
tSCS  
tCSS  
tSU  
tHD  
MSB in  
LSB in  
Figure 19. QUAD Input Timing  
CS  
tLO tHI  
tCSH  
SCK  
SIO  
tV  
MSB out  
tDIS  
LSB out  
Figure 20. QUAD Output Timing  
www.onsemi.com  
12  
N01S830HA, N01S830BA  
PACKAGE DIMENSIONS  
TSSOP8 3x4.4 / TSSOP8 (225 mil)  
CASE 948BH  
ISSUE O  
ON Semiconductor and the  
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N01S830HA/D  

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