NDT452AP [ONSEMI]

P 沟道增强型场效应晶体管 -30V,-5A,65mΩ;
NDT452AP
型号: NDT452AP
厂家: ONSEMI    ONSEMI
描述:

P 沟道增强型场效应晶体管 -30V,-5A,65mΩ

PC 开关 脉冲 光电二极管 晶体管 场效应晶体管
文件: 总9页 (文件大小:215K)
中文:  中文翻译
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is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.  
June 1996  
NDT452AP  
P-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
Power SOT P-Channel enhancement mode power field  
effect transistors are produced using Fairchild's proprietary,  
high cell density, DMOS technology. This very high density  
process is especially tailored to minimize on-state resistance  
and provide superior switching performance. These devices  
are particularly suited for low voltage applications such as  
notebook computer power management and DC motor  
control.  
-5A, -30V. RDS(ON) = 0.065W @ VGS = -10V  
RDS(ON) = 0.1W @ VGS = -4.5V.  
High density cell design for extremely low RDS(ON)  
.
High power and current handling capability in a widely used  
surface mount package.  
________________________________________________________________________________  
D
D
D
S
S
G
G
Absolute Maximum Ratings TA = 25°C unless otherwise noted  
Symbol Parameter  
NDT452AP  
-30  
Units  
VDSS  
VGSS  
ID  
Drain-Source Voltage  
Gate-Source Voltage  
Drain Current - Continuous  
- Pulsed  
V
V
A
±20  
(Note 1a)  
-5  
- 15  
Maximum Power Dissipation  
(Note 1a)  
(Note 1b)  
3
W
PD  
1.3  
(Note 1c)  
1.1  
TJ,TSTG  
Operating and Storage Temperature Range  
-65 to 150  
°C  
THERMAL CHARACTERISTICS  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
(Note 1a)  
(Note 1)  
42  
12  
°C/W  
°C/W  
R
JA  
q
R
JC  
q
* Order option J23Z for cropped center drain lead.  
© 1997 Fairchild Semiconductor Corporation  
NDT452AP Rev. B1  
Electrical Characteristics (TA = 25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
OFF CHARACTERISTICS  
BVDSS  
IDSS  
Drain-Source Breakdown Voltage  
VGS = 0 V, ID = -250 µA  
VDS = -24 V, VGS = 0 V  
-30  
V
Zero Gate Voltage Drain Current  
-1  
µA  
µA  
nA  
nA  
-10  
TJ = 55°C  
IGSSF  
IGSSR  
Gate - Body Leakage, Forward  
Gate - Body Leakage, Reverse  
VGS = 20 V, VDS = 0 V  
VGS = -20 V, VDS= 0 V  
100  
-100  
ON CHARACTERISTICS (Note 2)  
VGS(th)  
Gate Threshold Voltage  
VDS = VGS, ID = -250 µA  
VGS = -10 V, ID = -5.0 A  
-1  
-1.6  
-1.2  
-2.8  
-2.2  
V
-0.7  
TJ = 125°C  
TJ = 125°C  
Static Drain-Source On-Resistance  
0.052  
0.075  
0.085  
0.065  
0.13  
0.1  
RDS(ON)  
W
VGS = -4.5 V, ID = -4.3 A  
VGS = -10 V, VDS = -5 V  
VGS = -4.5 V, VDS = -5 V  
VDS = -10 V, ID = -5.0 A  
ID(on)  
On-State Drain Current  
-15  
-5  
A
S
gFS  
Forward Transconductance  
7
DYNAMIC CHARACTERISTICS  
Input Capacitance  
690  
430  
160  
pF  
pF  
pF  
Ciss  
Coss  
Crss  
VDS = -15 V, VGS = 0 V,  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
SWITCHING CHARACTERISTICS (Note 2)  
Turn - On Delay Time  
Turn - On Rise Time  
Turn - Off Delay Time  
Turn - Off Fall Time  
Total Gate Charge  
9
20  
30  
50  
40  
30  
ns  
ns  
tD(on)  
tr  
tD(off)  
tf  
VDD = -10 V, ID = -1 A,  
VGEN = -10 V, RGEN = 6 W  
20  
40  
19  
22  
3.2  
5.2  
ns  
ns  
nC  
nC  
nC  
Qg  
Qgs  
Qgd  
VDS = -10 V,  
ID = -5.0 A, VGS = -10 V  
Gate-Source Charge  
Gate-Drain Charge  
NDT452AP Rev. B1  
Electrical Characteristics (TA = 25°C unless otherwise noted)  
Symbol Parameter Conditions  
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS  
Min  
Typ  
Max  
Units  
IS  
Maximum Continuous Drain-Source Diode Forward Current  
-2.5  
-1.2  
100  
A
V
Drain-Source Diode Forward Voltage  
Reverse Recovery Time  
-0.85  
VSD  
VGS = 0 V, IS = -2.5 A (Note 2)  
trr  
VGS = 0 V, IF = -2.5 A, dIF/dt = 100 A/µs  
ns  
Notes:  
1. RqJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RqJC is guaranteed by  
design while RqCA is determined by the user's board design.  
T - T  
T - T  
J
A
J
A
PD  
=
=
= I2D (t) ´ RDS(ON )  
( )  
t
T
J
R
t
qJA( )  
R
qJC+RqCA(t)  
Typical RqJA using the board layouts shown below on 4.5"x5" FR-4 PCB in a still air environment:  
a. 42oC/W when mounted on a 1 in2 pad of 2oz copper.  
b. 95oC/W when mounted on a 0.066 in2 pad of 2oz copper.  
c. 110oC/W when mounted on a 0.0123 in2 pad of 2oz copper.  
1c  
1b  
1a  
Scale 1 : 1 on letter size paper  
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.  
NDT452AP Rev. B1  
Typical Electrical Characteristics  
-20  
3
2.5  
2
VGS = -10V  
VGS = -3.5V  
-6.0  
-5.0  
- 4.0  
-15  
-4.5  
-4.5  
-4.0  
-5.0  
-10  
1.5  
1
-6.0  
-10  
-3.5  
-5  
0
-3.0  
0.5  
0
-1  
V
-2  
-3  
-4  
0
-4  
-8  
-12  
-16  
-20  
, DRAIN-SOURCE VOLTAGE (V)  
I
, DRAIN CURRENT (A)  
DS  
D
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with Gate  
Voltage and Drain Current.  
1.6  
1.4  
1.2  
1
2
ID = -5.0A  
VGS = -10V  
V GS = -10V  
1.5  
T
= 125°C  
J
25°C  
1
0.8  
0.6  
-55°C  
0.5  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
0
-4  
-8  
-12  
-16  
-20  
T
, JUNCTION TEMPERATURE (°C)  
I
, DRAIN CURRENT (A)  
J
D
Figure 4. On-Resistance Variation with Drain  
Current and Temperature.  
Figure 3. On-Resistance Variation with  
Temperature.  
1.2  
-20  
-15  
-10  
-5  
T
= -55°C  
VDS = -10V  
VDS = VGS  
J
1.1  
125°C  
25°C  
I D = -250µA  
1
0.9  
0.8  
0.7  
0.6  
0
-50  
-25  
0
25  
50  
75  
100  
125  
150  
-1  
-2  
-3  
-4  
-5  
-6  
T
, JUNCTION TEMPERATURE (°C)  
V
, GATE TO SOURCE VOLTAGE (V)  
J
GS  
Figure 6. Gate Threshold Variation with  
Temperature.  
Figure 5. Transfer Characteristics.  
NDT452AP Rev. B1  
Typical Electrical Characteristics  
1.1  
20  
10  
5
VGS = 0V  
I D = -250µA  
1.08  
1.06  
1.04  
1.02  
1
T
= 125°C  
J
1
0.1  
25°C  
-55°C  
0.98  
0.96  
0.94  
0.01  
0.001  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
0
0.4  
0.8  
1.2  
1.6  
2
T
, JUNCTION TEMPERATURE (°C)  
J
-V  
, BODY DIODE FORWARD VOLTAGE (V)  
SD  
Figure 8. Body Diode Forward Voltage Variation  
Figure 7. Breakdown Voltage Variation with  
Temperature.  
with Current and Temperature.  
2000  
10  
ID = -5.0A  
VDS= -5V  
-10V  
-20V  
8
6
4
2
0
1000  
500  
C
C
iss  
oss  
300  
200  
f = 1 MHz  
VGS = 0V  
C
rss  
100  
0.1  
0.2  
0.5  
1
2
5
10  
30  
0
5
10  
, GATE CHARGE (nC)  
g
15  
20  
25  
-V  
, DRAIN TO SOURCE VOLTAGE (V)  
Q
DS  
Figure 10. Gate Charge Characteristics.  
Figure 9. Capacitance Characteristics.  
-VDD  
ton  
toff  
td(off)  
t d(on)  
tr  
tf  
RL  
90%  
VIN  
90%  
D
VOUT  
V
OUT  
VGS  
10%  
10%  
90%  
RGEN  
DUT  
G
V
50%  
50%  
IN  
S
10%  
INVERTED  
PULSE WIDTH  
Figure 11. Switching Test Circuit.  
Figure 12. Switching Waveforms.  
NDT452AP Rev. B1  
Typical Thermal Characteristics  
12  
3.5  
3
T
= -55°C  
J
VDS = -10V  
1a  
9
6
3
0
25°C  
2.5  
2
125°C  
1.5  
1
1b  
1c  
4.5"x5" FR-4 Board  
TA  
25o  
Still Air  
=
C
0.5  
0
-4  
-8  
-12  
-16  
-20  
0
0.2  
0.4  
0.6  
0.8  
1
I
, DRAIN CURRENT (A)  
2
D
2oz COPPER MOUNTING PAD AREA (in  
)
Figure 14. SOT-223 Maximum Steady- tate  
Power Dissipation versus Copper  
Mounting Pad Area.  
Figure 13. Transconductance Variation with Drain  
Current and Temperature.  
6
50  
20  
10  
5
1a  
5
4
3
2
1
0.5  
1b  
VGS = -10V  
1c  
SINGLE PULSE  
0.1  
4.5"x5" FR-4 Board  
TA  
25o  
Still Air  
R
= See Note 1c  
JA  
=
C
0.05  
q
TA = 25°C  
VGS  
=
-10V  
0.01  
0
0.2  
0.4  
0.6  
0.8  
1
0.1  
0.2  
0.5  
1
2
5
10  
30  
50  
2
2oz COPPER MOUNTING PAD AREA (in  
)
- V  
, DRAIN-SOURCE CURRENT (V)  
DS  
Figure 16. Maximum Safe Operating Area.  
Figure 15. Maximum Steady-State Drain  
Current versus Copper Mounting Pad  
Area.  
1
0.5  
D = 0.5  
0.2  
0.2  
0.1  
R
(t) = r(t) * R  
JA  
JA  
q
q
0.1  
R
= See Note 1 c  
JA  
q
0.05  
0.05  
P(pk)  
0.02  
0.01  
0.02  
0.01  
t1  
t2  
0.005  
T
- T = P * R  
(t)  
J
A
JA  
Single Pulse  
q
Duty Cycle, D = t1 / t2  
0.002  
0.001  
0.0001  
0.001  
0.01  
0.1  
, TIME (sec)  
1
10  
100  
300  
t
1
Figure 17. Transient Thermal Response Curve.  
Note: Thermal characterization performed using the conditions described in note 1c. Transient thermal response will change  
depending on the circuit board design.  
NDT452AP Rev. B1  
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The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
â
SMART START™  
STAR*POWER™  
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VCX™  
FAST  
ACEx™  
Bottomless™  
CoolFET™  
OPTOLOGIC™  
OPTOPLANAR™  
PACMAN™  
FASTr™  
FRFET™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
GlobalOptoisolator™  
GTO™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MicroPak™  
MICROWIRE™  
CROSSVOLT™  
DenseTrench™  
DOME™  
POP™  
Power247™  
PowerTrenchâ  
QFET™  
EcoSPARK™  
E2CMOSTM  
TinyLogic™  
QS™  
EnSignaTM  
TruTranslation™  
UHC™  
QT Optoelectronics™  
Quiet Series™  
SILENTSWITCHERâ  
FACT™  
FACT Quiet Series™  
UltraFETâ  
STAR*POWER is used under license  
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effectiveness.  
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Definition of Terms  
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This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
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This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
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Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
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This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
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regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
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application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
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